Probe switching device and switching method for measuring instrument

Abstract

The invention discloses a probe switching device and a probe switching method for a measuring instrument. The device comprises a measuring instrument body, a probe bin, a working platform, a transfer mechanism and a control part, the measuring instrument body is provided with a supporting column and a lifting mechanism, and the probe connector is driven to vertically ascend and descend so as to complete installation and release of the probe. The probe bin is used for storing a plurality of probes, the side wall is provided with a magnetic adsorption structure, and the bottom is provided with an inverted T-shaped plug; the working platform is movable, is provided with a butt joint groove and a guide notch, and is in butt joint with the probe bin; the transfer mechanism comprises a swing arm, the swing arm is installed on the supporting column through a rotating shaft, and the free end of the swing arm is provided with a butt joint part of a magnetic adsorption and limiting structure. A protective cover is arranged on the butt joint groove, and automatic opening and closing are achieved through a sliding groove and a spring; and the control part coordinates the actions of all the parts to complete the automatic replacement of the probe. The probe replacement efficiency and stability are improved, the service life of equipment is prolonged, operation is easy and convenient, and the method is suitable for complex measurement scenes.

Description

Technical Field

[0001] The present invention relates to the technical field of probe switching, and in particular to a probe switching device and a switching method for a measuring instrument. Background Art

[0002] During the use of measuring instruments, different styles of probes need to be replaced according to different workpieces being measured. The earliest method was to replace the probes manually, which was inefficient, time-consuming and labor-intensive. There was also a high risk of probe damage caused by manual operation. With the development of technology, it has gradually developed into a solution for automatic probe replacement. By setting up a probe holder or a probe storage bin, the spare probe is placed on the probe storage bin. When it needs to be replaced, the existing probe on the probe connector is first detached and placed in the probe storage bin, and then the target probe is selected for automatic installation. It is common to fix the probe storage bin. In large-space application scenarios, there is enough space to install the probe storage bin, but it is not suitable for small-space scenarios and lacks a suitable installation location. Another method is to use a robotic arm to move the probe storage bin to the probe connector to achieve probe replacement, but some automated probe replacement devices have poor stability and adaptability during the replacement process and cannot meet the application requirements of multiple scenarios and high precision. Summary of the invention

[0003] Technical purpose: In view of the shortcomings of existing probe replacement devices, the present invention discloses a probe switching device and switching method for a measuring instrument. Through the coordinated work of multiple components, the automatic transfer of the probe bin from the storage position to the docking position is realized, and the complete probe is installed and released after docking, which has the advantages of high efficiency and stability.

[0004] Technical solution: To achieve the above technical objectives, the present invention adopts the following technical solution: A probe switching device for a measuring instrument comprises a measuring instrument body, a probe bin, a working platform, a transfer mechanism and a control unit, wherein the measuring instrument body comprises a support column and a probe connector mounted on the support column, the probe connector being used to install and release the probe; the probe bin being used to store the probe; a docking position for receiving the probe bin being provided on the working platform; a transfer mechanism being installed on the support column, and being provided with a swinging structure capable of transferring the probe bin from the transfer mechanism to the docking position on the working platform; and a control unit being used to control the rotation of the transfer mechanism to realize automatic switching of the probe.

[0005] Preferably, the swing structure of the transfer mechanism includes a swing arm, one end of which is mounted on a support column of the measuring instrument body via a rotating shaft, the free end of the swing arm is connected to a docking portion, and the docking portion and the probe chamber are detachably connected via a docking structure.

[0006] Preferably, two position sensors are arranged on the support shaft around the rotating shaft, and the position sensors are used to detect the rotation angle and position state of the swing arm to provide feedback information to the control unit.

[0007] Preferably, the docking structure includes a magnetic adsorption component and a limiting support component, the magnetic adsorption component includes a first magnet arranged on the side wall of the probe chamber and a second magnet arranged on the docking part, and the detachable connection between the probe chamber and the docking part is achieved through magnetic adsorption.

[0008] Preferably, the limiting support assembly includes a protrusion arranged at the upper and lower sides of the side wall of the probe bin and a V-shaped groove arranged on the docking portion, and the protrusion cooperates with the V-shaped groove to ensure the stable position of the probe bin during transportation.

[0009] Preferably, the docking position on the working platform includes a docking groove, the docking groove is provided with a notch, the notch is provided on the side of the working platform, the docking groove is used to guide and receive the probe chamber, an extension portion is provided in the docking groove, a slide is provided in the extension portion, a plug matching the slide is provided at the bottom of the probe chamber, and the plug finally moves into the slide of the extension portion (33).

[0010] Preferably, a third magnet is provided on the inner side of the slideway of the extension portion, the plug is in an inverted T shape and is made of cast iron material or is provided with a fourth magnet, so that the limiting function is enhanced by magnetic adsorption.

[0011] Preferably, the docking groove is provided with a protective cover for covering the docking groove during idle time, and slide grooves are provided on both sides of the docking groove, a spring is provided in the slide groove, and the two ends of the spring are respectively connected to the slide groove and the protective cover; a pressure plate is provided above the protective cover, the pressure plate covers the protective cover and the slide groove and is provided with an opening corresponding to the shape of the docking groove and the extension part.

[0012] Preferably, a folded edge is provided in the middle of the protective cover, and the folded edge matches the shape of the notch of the docking groove.

[0013] Preferably, the probe joint adopts a lifting mechanism to achieve lifting movement in the vertical direction, and the lifting mechanism is arranged on the supporting column.

[0014] Preferably, the working platform is an XY moving platform or an XYZ moving platform, and the movement is controlled by a control unit.

[0015] Preferably, a probe bin storage position for placing the probe bin is provided on the support column.

[0016] Preferably, the probe compartment is provided with a plurality of vacancies for receiving the probes, and magnets are provided on the side walls of the vacancies for fixing the probes.

[0017] A probe switching method for a measuring instrument, used to implement a probe switching device for a measuring instrument as described above, comprises the following steps: Start the probe switching program through the control unit to initialize the status of each component; The transfer mechanism rotates from the storage position of the measuring instrument body to move the probe compartment to above the docking position of the working platform; Control the working platform to move so that the docking position is aligned with the probe chamber, and then fix the probe chamber on the docking position; Control the working platform to move again, and move the probe compartment to below the probe connector; Remove the original probe and store it in an empty space in the probe compartment, and dock the probe connector with the target probe in the probe compartment. After installation, lift the probe connector to the initial working position; The working platform moves to disengage the probe bin from the docking position, and the transfer mechanism rotates to move the probe bin to the storage position on the measuring instrument body, completing the probe switching.

[0018] Beneficial effects: The probe switching device and switching method for a measuring instrument provided by the present invention have the following beneficial effects: The present invention realizes the rapid positioning and transportation of the probe bin from the storage position to the docking slot through the movement and coordination of the swing arm of the transfer mechanism and the working platform; the magnetic adsorption structure and the limit structure ensure the stability of the probe bin during the transportation and docking process to avoid shaking, and the position sensor on the support shaft can monitor the rotation angle of the swing arm in real time, thereby improving the speed and stability of probe replacement and ensuring accurate positioning.

[0019] By setting a protective cover on the docking groove, cooperating with the spring and the slide groove to achieve automatic sliding and resetting, it can effectively prevent dust and debris from entering the docking groove and the gap, reduce equipment wear, and ensure long-term stable operation of the equipment.

[0020] The control unit synchronously controls the lifting and lowering of the probe connector, the transfer of the swing arm and the movement of the workbench to achieve fully automatic one-button operation for probe replacement. It has a compact structure and is suitable for scenarios with limited space, meeting the needs of a variety of complex working conditions. BRIEF DESCRIPTION OF THE DRAWINGS

[0021] In order to more clearly illustrate the embodiments of the present invention or the technical solutions in the prior art, the drawings required for use in the embodiments or the description of the prior art are briefly introduced below.

[0022] Figure 1 It is a schematic diagram of the overall structure of the probe switching device of the present invention; Figure 2 It is a schematic diagram of the structure of the probe chamber of the present invention; Figure 3 It is a structural schematic diagram of the docking portion of the present invention; Figure 4 It is a structural schematic diagram of the docking position of the working platform of the present invention; Figure 5 It is a schematic diagram of the structure of the probe chamber connected to the docking position of the present invention; Figure 6 It is a structural schematic diagram of the swing arm and the position sensor of the present invention; Figure 7 It is a schematic diagram of the state structure when the probe chamber enters the extension part when the probe switching device of the present invention is activated; Figure 8 This is a schematic diagram of the state when the probe chamber moves to below the probe connector when the probe switching device of the present invention is activated.

[0023] In the figure: 1. measuring instrument body; 11. support column; 111. probe compartment storage position; 12. lifting mechanism; 13. probe connector; 2. probe compartment; 21. first magnet; 22. boss; 23. plug; 3. working platform; 31. docking groove; 311. protective cover; 312. slide groove; 313. spring; 314. folding edge; 315. pressure plate; 32. notch; 33. extension part; 331. third magnet; 4. docking part; 41. second magnet; 42. V-shaped groove; 5. swing arm; 51. position sensor. DETAILED DESCRIPTION

[0024] The present invention will be described more clearly and completely below by way of a preferred embodiment in conjunction with the accompanying drawings, but the present invention is not limited to the scope of the embodiment.

[0025] like Figure 1-Figure 8 As shown, a probe switching device for a measuring instrument includes a measuring instrument body 1, a probe compartment 2, a working platform 3, a transfer mechanism and a control unit. The measuring instrument body 1 includes a support column 11 and a probe connector 13 installed on the support column 11, and the probe connector 13 is used to install and release the probe.

[0026] In one embodiment, the probe connector 13 realizes vertical lifting movement through the lifting mechanism 12. The lifting mechanism 12 is driven by a stepper motor, and the vertical movement of the probe connector 13 is realized through a lead screw and a guide rail system. A lifting frame can be added between the lifting mechanism 12 and the probe connector 13, and the probe connector 113 is installed on the lifting frame. The lifting and lowering of the lifting frame is controlled by the lifting mechanism 12, thereby controlling the vertical movement of the probe connector 13. The probe connector is a standardized interface for docking or detaching with the probe.

[0027] In one embodiment, a probe chamber storage position 111 for placing the probe chamber 2 is further provided on the side wall of the support column 11 . When the device is in an initial state, the probe chamber 2 is located in the probe chamber storage position 111 .

[0028] The control unit includes a number of circuit boards, which can be arranged in the support column 11 and electrically connected to various mechanisms, so as to control the lifting and lowering of the probe connector 13, the movement of the working platform 3 and the rotation of the transfer mechanism, thereby realizing automatic switching of the probes. A number of corresponding buttons or intelligent operation display pages are arranged on the base of the measuring instrument body, so that control can be carried out conveniently and quickly.

[0029] When the control unit issues a lifting command, the stepper motor starts to drive the screw to rotate. The screw rotation drives the probe connector 13 to rise or fall through the nut and guide rail system. The probe connector 13 descends to a predetermined height and docks with the target probe in the probe chamber 2. When the probe connector is detached, it rises to the initial position synchronously.

[0030] The probe bin 2 stores multiple probes and is provided with empty spaces for receiving the probes. Magnets can be used on both sides of the empty spaces to adsorb the probes in the empty spaces. The transfer mechanism is installed on the support column 11, which is provided with a swing structure capable of transferring the probe bin 2 from the transfer mechanism to the docking position of the working platform 3.

[0031] In one embodiment, the swing structure of the transfer mechanism includes a swing arm 5, one end of which is mounted on the support column 11 of the measuring instrument body 1 through a rotating shaft, and the free end of the swing arm 5 is connected to the docking part 4, and the docking part 4 and the probe chamber 2 are detachably connected through a docking structure.

[0032] like Figure 6 As shown, two position sensors 51 are arranged on the support shaft 11 around the rotating axis of the swing arm 5. The two position sensors 51 respectively detect the horizontal position and the vertical position of the swing arm. When the swing arm 5 reaches the horizontal position, the position sensor 51 located below is triggered to transmit a signal. At this time, the swing arm 5 transfers the probe bin 2 to the top of the docking position of the working platform 31. When the swing arm reaches the vertical position, the position sensor located above is triggered. At this time, the swing arm 5 transfers the probe bin 2 to the probe bin storage position 111 on the support column 11. The position sensor 51 detects the rotation angle and position state of the swing arm 5 in real time to provide feedback information to the control unit to ensure the movement accuracy of the swing arm.

[0033] like Figure 2 As shown, the docking structure includes a magnetic adsorption component and a limiting support component. The magnetic adsorption component includes a first magnet 21 arranged on the side wall of the probe chamber 2 and a second magnet 41 arranged on the docking part 4. The detachable connection between the probe chamber 2 and the docking part 4 is achieved through magnetic adsorption.

[0034] like Figure 3 As shown, the limiting support assembly includes a protrusion 22 arranged on the upper and lower side walls of the probe chamber 2 and a V-shaped groove 42 arranged on the docking portion 4. The protrusion 22 cooperates with the V-shaped groove 42 to ensure the stable position of the probe chamber 2 during transportation.

[0035] When the two are connected, the first magnet 21 and the second magnet 41 are connected together by magnetic attraction, and the protrusion 22 is just placed in the V-shaped groove 42.

[0036] After the control unit is started, the rotating shaft is driven to rotate, driving the swing arm 5 to move the probe bin 2 from the probe bin storage position 111 to the top of the docking slot 31. The plug 23 of the probe bin 2 slides along the docking slot 31 to complete the precise docking with the docking slot 31. After the probe is installed or released, the transfer mechanism resets the probe bin 2 to the probe bin storage position 111.

[0037] The working platform 3 is provided with a docking position for receiving the probe chamber 2; the working platform 3 is an XY mobile platform or an XYZ mobile platform, and the working platform can realize precise movement in the XY plane or the XYZ plane by means of a stepper motor and a slide rail. The working platform 3 can adopt a multi-layer design. When it is an XY mobile platform, each layer is set to move along the X direction or along the Y direction. When it is an XYZ mobile platform, each layer is set to move along the X direction or along the Y direction and the whole can move along the Z direction. like Figure 4 As shown, the docking position on the working platform 3 includes a docking groove 31, which is provided with a notch 32. The notch 32 is arranged on the side of the working platform 3. The docking groove 31 is used to guide and receive the probe chamber 2. An extension portion 33 is arranged in the docking groove 31, and a slide is arranged in the extension portion 33. A plug 23 matching the slide is provided at the bottom of the probe chamber 2, and the plug 23 finally moves into the slide of the extension portion 33.

[0038] In one embodiment, when the working platform 3 is an XYZ moving platform, the lifting and lowering of the probe connector 13 may be achieved without using a lifting mechanism. Instead, the probe chamber 2 and the probe connector 13 may be docked by lifting and lowering the working platform 3 .

[0039] A third magnet 331 is disposed inside the slideway of the extension portion 33 . The plug 23 is in an inverted T shape and is made of cast iron or is provided with a fourth magnet, so that the limiting function is enhanced by magnetic adsorption.

[0040] like Figure 5 As shown, the control unit drives the working platform 3 to move in the X direction or the Y direction according to the position of the probe chamber 2, so that the plug 23 of the probe chamber 2 can enter the docking groove 31 through the notch 32, and finally slide along the docking groove 31 into the slideway of the extension portion 33, so as to realize the docking of the probe chamber 2 and the working platform 3. After the probe connector completes the installation or release operation, the working platform 3 moves again to complete the separation of the probe chamber 2 from the extension portion 33 and the docking groove 31.

[0041] The docking slot 31 is provided with a protective cover 311 for covering the docking slot 31 during idle time. Slide grooves 312 are provided on both sides of the docking slot 31. A spring 313 is provided in the slide groove. The two ends of the spring 313 are respectively connected to the slide groove 312 and the protective cover 311. A pressure plate 315 is provided above the protective cover 311. The pressure plate 315 covers the protective cover 311 and the slide groove 312 and is provided with an opening corresponding to the shape of the docking slot 31 and the extension portion 33.

[0042] A folded edge 314 is provided in the middle of the protection cover 311 , and the folded edge 314 matches the shape of the notch of the docking groove 31 .

[0043] When the probe enters the docking slot 31, the plug 23 pushes the folded edge 314, and the protective cover 311 slides along the slide groove 312 to the rear of the docking slot 31. At the same time, the pressure plate 315 can also be covered at this time to fix the position of the protective cover 311. After the probe chamber 2 is detached, the tension generated by the spring 313 drives the protective cover 311 to return to its initial position, covering the docking slot 31, the notch 32 and the extension 33.

[0044] The present invention also provides a probe switching method for a measuring instrument, which is used to implement the probe switching device for a measuring instrument as described above, and comprises the following steps: S1. Start the probe switching program through the control unit to initialize the status of each component; there are two types of initial states. The first is the state when any working state stops. The control program directly identifies it as the initial state and executes the probe switching program directly; the second is to set the specific initial position of each component, adjust it from the working state to the initial position and then execute the probe switching program.

[0045] S2, the transfer mechanism rotates from the storage position of the measuring instrument body to move the probe compartment to above the docking position of the working platform; S3, such as Figure 7 As shown, the working platform is controlled to move so that the docking position is aligned with the probe chamber, and then the probe chamber is fixed on the docking position; S4, such as Figure 8 As shown, the working platform is controlled to move again, and the probe compartment is moved to below the probe connector; S5, remove the original probe and store it in an empty space in the probe compartment, and dock the probe connector with the target probe in the probe compartment. After the installation is completed, lift the probe connector to the initial working position; S6. The working platform moves to disengage the probe bin from the docking position, and the transfer mechanism rotates to move the probe bin to the storage position on the measuring instrument body, completing the probe switching.

[0046] The specific process is as follows: the swing arm 5 is in the initial state, the probe bin 2 is in the probe bin storage position 111 of the measuring instrument body 1; the probe replacement program is started, the control unit sends a start signal, the working platform 3 moves, and the docking groove 31 is moved to the docking initial position; The swing arm 5 swings to move the probe chamber 2 to the docking position, the working platform 3 moves to guide the probe chamber 2 from the notch 32 into the docking groove 31, and the working platform 3 changes the moving direction to guide the probe chamber 2 into the extension groove 33, completing the fixation of the probe chamber 2 on the working platform 3; The working platform 3 moves to pull apart the magnetic attraction between the front end docking portion 4 of the swing arm 5 and the probe chamber 2 to complete the separation of the probe chamber 2 and the swing arm 5; The working platform 3 and the probe connector 13 are moved respectively to complete the separation of the probe head on the probe connector 13 from the probe connector 13 and install it on the empty space of the probe chamber 2. The working platform 3 and the probe connector 13 are moved respectively to realize the docking of the probe connector 13 and the target probe. Here, if the working platform 3 is an XY moving platform, the working platform 3 is first moved in the X direction or the Y direction so that the probe chamber 2 is located below the probe connector 13, and then the probe connector 13 is lowered to a suitable position by the lifting mechanism 12 to complete the switching of the probes on the probe connector 13; if the working platform 3 is an XYZ moving platform, the working platform 3 is first moved in the X direction or the Y direction so that the probe chamber 2 is located below the probe connector 13, and then the working platform 3 is moved in the Z direction to a suitable position to complete the switching of the probes on the probe connector 13; After the probe switching is completed, the probe connector 13 returns to the initial position for preparing for the measurement work; the working platform 3 moves with the probe bin 2 to the initial position for recovering the probe bin 2, and the swing arm 5 falls to move the docking part 4 to the initial position for docking; The working platform 3 moves to connect the probe chamber 2 with the docking portion 4 of the swing arm 5 by magnetic attraction, and the convex head 22 and the V-shaped groove 42 are aligned at an angle, and then the working platform 3 drives the probe chamber 2 to dock with the docking portion 4 of the swing arm 5; The working platform 3 moves and pushes the probe chamber 3 out of the extension portion 33 by the thrust of the swing arm 5, so that the probe chamber 2 is in the docking groove 31, and the working platform 3 changes the moving direction so that the probe chamber 2 is separated from the docking groove 31 through the notch 32; After the probe bin 2 is separated from the working platform 3, the swing arm 5 and the working platform 3 move respectively, the swing arm 5 takes the probe bin 2 back to the probe bin storage position 111 on the measuring instrument body 1, and the working platform 3 moves to the workpiece measurement working position state; At this point, the probe replacement is complete, and the workpiece to be measured can be placed on the platform to execute the measurement program.

[0047] The above is only a preferred embodiment of the present invention. It should be pointed out that for ordinary technicians in this technical field, several improvements and modifications can be made without departing from the principle of the present invention. These improvements and modifications should also be regarded as the scope of protection of the present invention.

Claims

1. A probe switching device for a measuring instrument, characterized in that: The measuring instrument comprises a measuring instrument body (1), a probe bin (2), a working platform (3), a transfer mechanism and a control unit, wherein the measuring instrument body (1) comprises a support column (11) and a probe connector (13) mounted on the support column (11), the probe connector (13) being used to install and release the probe; the probe bin (2) being used to store the probe; a docking position for receiving the probe bin (2) is provided on the working platform (3); the transfer mechanism is mounted on the supporting column (11), and a swing structure capable of transferring the probe bin (2) from the transfer mechanism to the docking position of the working platform (3) is provided on the transfer mechanism; and the control unit is used to control the rotation of the transfer mechanism to realize automatic switching of the probe.

2. A probe switching device for a measuring instrument according to claim 1, characterized in that: The swing structure of the transfer mechanism comprises a swing arm (5), one end of the swing arm (5) is mounted on a support column (11) of a measuring instrument body (1) via a rotating shaft, the free end of the swing arm (5) is connected to a docking portion (4), and the docking portion (4) and the probe chamber (2) are detachably connected via a docking structure.

3. A probe switching device for a measuring instrument according to claim 2, characterized in that: Two position sensors (51) are arranged on the support shaft (11) around the rotating shaft, and the position sensors (51) are used to detect the rotation angle and position state of the swing arm (5) to provide feedback information to the control unit.

4. A probe switching device for a measuring instrument according to claim 2, characterized in that: The docking structure comprises a magnetic adsorption component and a position limiting support component, wherein the magnetic adsorption component comprises a first magnet (21) arranged on the side wall of the probe chamber (2) and a second magnet (41) arranged on the docking portion (4), and a detachable connection between the probe chamber (2) and the docking portion (4) is achieved through magnetic adsorption.

5. A probe switching device for a measuring instrument according to claim 4, characterized in that: The position-limiting support assembly comprises a protrusion (22) arranged above and below the side wall of the probe bin (2) and a V-shaped groove (42) arranged on the docking portion (4); the protrusion (22) cooperates with the V-shaped groove (42) to ensure that the position of the probe bin (2) is stable during transportation.

6. A probe switching device for a measuring instrument according to claim 1, characterized in that: The docking position on the working platform (3) comprises a docking groove (31), the docking groove (31) is provided with a notch (32), the notch (32) is arranged on the side of the working platform (3), the docking groove (31) is used to guide and receive the probe chamber (2), an extension portion (33) is arranged in the docking groove (31), a slideway is arranged in the extension portion (33), a plug (23) matching the slideway is arranged at the bottom of the probe chamber (2), and the plug (23) finally moves into the slideway of the extension portion (33).

7. A probe switching device for a measuring instrument according to claim 6, characterized in that: A third magnet (331) is arranged inside the slideway of the extension portion (33), the plug (23) is in an inverted T-shape and is made of cast iron or provided with a fourth magnet, and the limiting function is enhanced by magnetic adsorption.

8. The probe switching device for a measuring instrument according to claim 6, characterized in that: The docking groove (31) is provided with a protective cover (311) for covering the docking groove (31) during idle time. Slide grooves (312) are provided on both sides of the docking groove (31), and a spring (313) is provided in the slide groove. The two ends of the spring (313) are respectively connected to the slide groove (312) and the protective cover (311). A pressing plate (315) is provided above the protective cover (311). The pressing plate (315) covers the protective cover (311) and the slide groove (312) and is provided with an opening corresponding to the shape of the docking groove (31) and the extension portion (33).

9. A probe switching device for a measuring instrument according to claim 8, characterized in that: A folded edge (314) is provided in the middle of the protection cover (311), and the folded edge (314) matches the shape of the notch of the docking groove (31).

10. The probe switching device for a measuring instrument according to claim 1, characterized in that: The probe joint (13) uses a lifting mechanism to achieve lifting movement in a vertical direction, and the lifting mechanism is arranged on the support column (11).

11. A probe switching device for a measuring instrument according to claim 1, characterized in that: The working platform (3) is an XY mobile platform or an XYZ mobile platform, and its movement is controlled by a control unit.

12. The probe switching device for a measuring instrument according to claim 1, characterized in that: A probe bin storage position (111) for accommodating the probe bin (2) is provided on the support column (11).

13. A probe switching device for a measuring instrument according to claim 1, characterized in that: The probe chamber (2) is provided with a plurality of vacancies for receiving probes, and magnets are arranged on the side walls of the vacancies for fixing the probes.

14. A probe switching method for a measuring instrument, used to implement a probe switching device for a measuring instrument as claimed in any one of claims 1 to 13, characterized in that: The following steps are involved: Start the probe switching program through the control unit to initialize the status of each component; The transfer mechanism rotates from the storage position of the measuring instrument body to move the probe compartment to above the docking position of the working platform; Control the working platform to move so that the docking position is aligned with the probe chamber, and then fix the probe chamber on the docking position; Control the working platform to move again, and move the probe compartment to below the probe connector; Remove the original probe and store it in an empty space in the probe compartment, and dock the probe connector with the target probe in the probe compartment. After installation, lift the probe connector to the initial working position; The working platform moves to disengage the probe bin from the docking position, and the transfer mechanism rotates to move the probe bin to the storage position on the measuring instrument body, completing the probe switching.

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