Uniform luminescence monitoring method of array structure
By analyzing the luminescent image of the dot matrix light source on the target array structure and combining optical parameters, a high-precision evaluation of the uniformity of the luminescent is achieved, solving the problems of insufficient accuracy and complex operation of traditional methods.
Patent Information
- Application Number
- CN202411804844.1
- Authority / Receiving Office
- CN · China
- Patent Type
- Applications(China)
- Current Assignee / Owner
- Filing Date
- 2024-12-09
- Publication Date
- 2025-03-07
AI Technical Summary
The traditional luminescence uniformity monitoring method has insufficient measurement accuracy and complex operation, making it difficult to meet the high-precision requirements of modern industry for the performance of luminescents.
By analyzing the captured image when the dot matrix light source on the target array structure emits light, key spots are obtained, and combined with optical parameters, the uniform luminescence monitoring results of the target array structure are analyzed to improve monitoring accuracy.
It effectively improves the accuracy of uniform luminescence monitoring of the target array structure and can accurately reflect the uniformity performance of the luminescent body.
Smart Images
Figure CN119574062A_ABST
Abstract
Description
Technical Field
[0001] The present invention relates to the field of display technology, and in particular to a method for monitoring uniform light emission of an array structure. Background Art
[0002] In recent years, with the rapid development of display technology, the uniformity of light emission has become one of the important indicators to measure its performance. Traditional methods for monitoring uniformity of light emission often have problems such as insufficient measurement accuracy and complex operation, which makes it difficult to meet the high-precision requirements of modern industry for the performance of light emitters. Therefore, how to achieve efficient and accurate monitoring of light emission uniformity has become one of the current research centers.
[0003] Therefore, the present invention provides a method for monitoring uniform light emission of an array structure. Summary of the invention
[0004] The present invention provides a uniform light emission monitoring method for an array structure, which is used to obtain a key light spot by analyzing a captured image of a dot matrix light source on a target array structure when emitting light; a light spot uniformity evaluation result obtained by analyzing the uniformity of the key light spot is combined with an optical uniformity evaluation result obtained by analyzing the optical parameters of the dot matrix light source on the target array structure collected, and a uniform light emission monitoring result of the target array structure is obtained by analysis, which can effectively improve the accuracy of the uniform light emission monitoring of the target array structure.
[0005] The present invention provides a method for monitoring uniform light emission of an array structure, comprising: Step 1: using a set camera to capture images of the dot matrix light source on the target array structure when it emits light according to a set capture frequency, to obtain a first array light-emitting image set; Step 2: performing image processing and analysis on the first array light-emitting image set to obtain a key light spot, and obtaining a light spot uniformity evaluation result by analyzing the uniformity of the key light spot; Step 3: Use the set sensor to collect the optical parameters of the dot matrix light source on the target array structure in real time, and analyze the optical parameters to obtain the optical uniformity evaluation result; Step 4: Analyze the light spot uniformity evaluation result and the optical uniformity evaluation result together to obtain the uniform light emission monitoring result of the current target array structure.
[0006] Preferably, the step 1 further comprises: From the array database, using the target array structure as a screening condition, the historical luminous usage records of the dot matrix light source corresponding to the target array structure are screened and obtained, and the historical luminous usage records are output as the first luminous analysis data; If the first light emitting analysis data does not exist, the initial capture frequency of the current target array structure is used as the set capture frequency to capture the image of the dot matrix light source on the current target array structure when emitting light; If the first luminous analysis data exists, extracting a first feature associated with the luminous effect of the dot matrix light source from the first luminous analysis data, and performing weighted average calculation on the first feature to obtain a first effect influence coefficient; When the first effect influence coefficient is not greater than the set influence threshold, based on the set capture frequency used at the last capture moment, an image of the dot matrix light source on the current target array structure when emitting light is captured; When the first effect influence coefficient is greater than a set influence threshold, adjusting the set capture frequency used at the previous capture moment to obtain an adjusted frequency; The adjusted frequency is used as the set capture frequency at the current moment to capture the image of the dot matrix light source on the current target array structure when it emits light.
[0007] Preferably, the calculation formula of the adjusted frequency is as follows: ; In the formula, Expressed as adjusted frequency; Indicates the set capture frequency used at the last capture moment; It is expressed as the time interval between the current and the last capture moment; It is represented by the first effect influence coefficient currently obtained; It represents the set impact threshold; e represents a constant with a value of 2.7.
[0008] Preferably, performing image processing and analysis on the first array luminous image set to obtain a key light spot, and obtaining a light spot uniformity evaluation result by analyzing the uniformity of the key light spot, including: Step 11: performing image preprocessing on the first array luminescence image set to obtain a key luminescence image; Step 12: Selecting a region to be monitored from the key luminescent image and cropping it to obtain an initial image; Step 13: Compare the initial image with the key luminous image in terms of dot matrix light source characteristics to obtain a characteristic similarity coefficient; Step 14: If the feature similarity coefficient is greater than the set similarity threshold, the current initial image is regarded as a test image; If the feature similarity coefficient is not greater than the set similarity threshold, repeat steps 11 to 14 until a test image is obtained; Step 15: using a preset reading tool to obtain the pixel grayscale value of each pixel in the test image; Pixels whose grayscale values are greater than the set grayscale threshold are regarded as bright spots, and pixels whose grayscale values are not greater than the set grayscale threshold are regarded as background; Step 16: after setting the dot matrix light source in the test image according to the actual shape and characteristic parameters of the dot matrix light source, extracting the array sub-image of each dot matrix light source; Step 17: Perform spot screening and corresponding uniformity analysis on the array sub-image to obtain a grayscale uniformity evaluation result of the current array sub-image, and output it as a spot uniformity evaluation result; Step 18: Based on the grayscale uniformity evaluation result, if the array sub-image is a key image and the grayscale uniformity evaluation coefficient is not less than the set grayscale uniformity threshold, the current array sub-image is marked as a uniform image and output as the spot uniformity evaluation result; If the array sub-image is a key image and the grayscale uniformity evaluation coefficient is less than the set grayscale uniformity threshold, the current array sub-image is marked as a non-uniform image and output as a spot uniformity evaluation result; If the array sub-image is a general image, the current array sub-image is marked as a non-uniform image and output as a light spot uniformity evaluation result.
[0009] Preferably, performing spot screening and corresponding uniformity analysis on the array sub-image to obtain a grayscale uniformity evaluation result of the current array sub-image includes: Traverse all array sub-images and calculate the total area of bright spots in each array sub-image; Compare the bright spot area with the total area of the corresponding array sub-image to obtain a first area ratio; When the first area ratio is greater than a set area ratio threshold, the corresponding dot matrix light source in the current array sub-image is determined to be a key light spot, and the current array sub-image is marked as a valid image; Dividing the effective image into first sub-light regions, and determining a first average grayscale value of each first sub-light region; Based on the first average gray value, calculating the gray relative difference coefficient between any two first sub-light areas in the current array sub-image; Extract the maximum coefficient value and the minimum coefficient value from all the obtained grayscale relative difference coefficients, and obtain the first difference value by subtracting the minimum coefficient value from the maximum coefficient value; Summarize all grayscale relative difference coefficients and calculate the standard deviation to obtain the second difference value; The first difference value is combined with the second difference value to calculate a gray uniformity evaluation coefficient of the current valid image, and output it as a gray uniformity evaluation result; When the first area ratio is not greater than the set area ratio threshold, it is determined that the corresponding dot matrix light source in the current array sub-image is a general light spot, and the current array sub-image is marked as a general image; Dividing the general image into second sub-light regions, and determining a second average grayscale value of each second sub-light region; Determine a reference grayscale value according to the obtained second average grayscale value; Sort the second average grayscale values greater than the reference grayscale value from large to small to obtain a first average grayscale list; Sort the second average grayscale values that are not greater than the reference grayscale value from large to small to obtain a second average grayscale list; Using the second average grayscale value in the first average grayscale list, sequentially performing subtraction operations on all the second average grayscale values in the second average grayscale list to obtain a first grayscale comparison difference; By obtaining the standard deviation and average value of all first grayscale comparison differences, a grayscale comparison standard deviation and a grayscale comparison average value are correspondingly obtained; The grayscale comparison standard deviation is divided by the grayscale comparison average value to obtain a first difference representation value; Using the second average grayscale value in the first average grayscale list, sequentially performing a division operation on all the second average grayscale values in the second average grayscale list to obtain a first grayscale proportion; Using all the acquired first grayscale proportions, a first grayscale proportion matrix is established, and the first grayscale proportion matrix is analyzed to obtain a second difference representation value; The grayscale non-uniformity evaluation coefficient of the current general image is calculated using the first difference characterization value and the second difference characterization value, and is output as a grayscale uniformity evaluation result.
[0010] Preferably, the optical parameters of the dot matrix light source on the target array structure are collected in real time by using a set sensor, and the optical parameters are analyzed to obtain an optical uniformity evaluation result, including: Using a set sensor that presents an array distribution consistent with the target array structure, optical parameters of each dot matrix light source on the target array structure are collected in real time to obtain dot matrix light source parameters; Traversing all the dot matrix light sources, comparing the corresponding dot matrix light source parameters of any two dot matrix light sources with the same optical parameter, and obtaining a plurality of first parameter differences; Using the first parameter difference to establish a light source parameter deviation matrix corresponding to different optical parameters; Each light source parameter deviation matrix is analyzed and calculated to obtain the corresponding light source parameter deviation value, which is output as an optical uniformity evaluation result.
[0011] Preferably, the dot matrix light source parameters refer to illumination, brightness and color temperature.
[0012] Preferably, the light spot uniformity evaluation result is combined with the optical uniformity evaluation result for analysis to obtain a uniform light emission monitoring result of the current target array structure, including: Performing weighted average calculation on the parameter deviation values in the optical uniformity evaluation result to obtain a first uniformity characterization coefficient; When the first uniform characterization coefficient is greater than a set characterization threshold, it is determined that the current target array structure is uniformly luminous, and the result is output as a uniform luminous monitoring result; When the first uniform characterization coefficient is not greater than a set characterization threshold, it is determined that the target array structure emits non-uniform light; The first uniformity characterization coefficient is calculated in combination with the spot uniformity evaluation result to obtain a non-uniformity evaluation coefficient; The calculation formula of the uneven evaluation coefficient is as follows: ; In the formula, It is expressed as the coefficient of uneven evaluation; It is expressed as the first uniform characterization coefficient; It is expressed as setting the characterization threshold; It is expressed as the total number of array sub-images, and also represents the total number of dot matrix light sources in the current target array structure; It is expressed as the total number of non-uniform images; It is expressed as the corresponding gray uniformity evaluation coefficient of the i-th non-uniform image, or the gray non-uniformity evaluation coefficient, where i=1, 2, 3, , n1; It is expressed as the total spot area corresponding to the i-th non-uniform image; Expressed as the area of the test image; It is expressed as the contribution weight of grayscale unevenness to the calculation of unevenness evaluation coefficient; It is expressed as the contribution weight of the optical parameter deviation to the calculation of the non-uniformity evaluation coefficient; It is represented as the jth dot matrix light source parameter of the dot matrix light source corresponding to the i-th non-uniform image, where j=1, 2, 3; It is expressed as the average value of the parameters of the j-th dot matrix light source; Using the unevenness assessment coefficient as a matching condition, the real-time unevenness level is obtained from the set unevenness level table; The non-uniformity evaluation coefficient and the real-time non-uniformity level are output as uniform light emission monitoring results.
[0013] Compared with the prior art, the present invention has the following beneficial effects: The key light spot is obtained by analyzing the image of the dot matrix light source on the captured target array structure when it is emitting light; the light spot uniformity evaluation result obtained by analyzing the uniformity of the key light spot is combined with the optical uniformity evaluation result obtained by analyzing the optical parameters of the dot matrix light source on the collected target array structure, and the uniform light emission monitoring result of the target array structure is analyzed to effectively improve the accuracy of the uniform light emission monitoring of the target array structure.
[0014] Other features and advantages of the present invention will be described in the following description, and partly become apparent from the description, or understood by practicing the present invention. The purpose and other advantages of the present invention can be realized and obtained by the structures particularly pointed out in the written description and the accompanying drawings.
[0015] The technical solution of the present invention is further described in detail below through the accompanying drawings and embodiments. BRIEF DESCRIPTION OF THE DRAWINGS
[0016] The accompanying drawings are used to provide a further understanding of the present invention and constitute a part of the specification. Together with the embodiments of the present invention, they are used to explain the present invention and do not constitute a limitation of the present invention. In the accompanying drawings: Figure 1 The figure is a flow chart of a method for monitoring uniform light emission of an array structure according to an embodiment of the present invention. DETAILED DESCRIPTION
[0017] The preferred embodiments of the present invention are described below in conjunction with the accompanying drawings. It should be understood that the preferred embodiments described herein are only used to illustrate and explain the present invention, and are not used to limit the present invention.
[0018] The embodiment of the present invention provides a method for monitoring uniform light emission of an array structure, such as Figure 1 As shown, including: Step 1: using a set camera to capture images of the dot matrix light source on the target array structure when it emits light according to a set capture frequency, to obtain a first array light-emitting image set; Step 2: performing image processing and analysis on the first array light-emitting image set to obtain a key light spot, and obtaining a light spot uniformity evaluation result by analyzing the uniformity of the key light spot; Step 3: Use the set sensor to collect the optical parameters of the dot matrix light source on the target array structure in real time, and analyze the optical parameters to obtain the optical uniformity evaluation result; Step 4: Analyze the light spot uniformity evaluation result and the optical uniformity evaluation result together to obtain the uniform light emission monitoring result of the current target array structure.
[0019] In this embodiment, setting the camera refers to a camera device used to capture images of luminous dots of light sources; setting the capture frequency refers to setting the frequency of the camera to capture images; the target array structure refers to an array structure in which luminous dots of light sources are arranged in a certain arrangement, such as an organic electroluminescent array structure, wherein the organic electroluminescent structure refers to a structure in which electroluminescent elements composed of organic materials are arranged in an array; the first array luminous image set refers to a series of images of the luminous dots of light sources on the target array structure captured by the set camera according to the set capture frequency; the key light spot refers to a light spot with significant brightness or characteristics screened out by image processing and analysis technology in the first array luminous image set.
[0020] In this embodiment, the setting sensor refers to an optical sensor; the light spot uniformity evaluation result refers to the uniformity of the key light spot obtained by processing and analyzing the first array luminous image set, and the grayscale uniformity evaluation coefficient, uniform image and non-uniform image obtained; the optical uniformity evaluation result refers to the result obtained by analyzing the optical parameters of the dot matrix light source on the target array structure, which is composed of the parameter deviation values obtained by analyzing the corresponding light source parameter deviation matrix of each optical parameter; the optical parameters refer to illumination, brightness and color temperature; the uniform luminescence monitoring result refers to the determination of the uniform luminescence of the current target array structure, or refers to the non-uniformity evaluation coefficient and the real-time non-uniformity level (when the current target array structure is determined to be non-uniformly luminous).
[0021] The beneficial effects of the above technical solution are: a key light spot is obtained by analyzing the image of the dot matrix light source on the captured target array structure when it is emitting light; the light spot uniformity evaluation result obtained by analyzing the uniformity of the key light spot is combined with the optical uniformity evaluation result obtained by analyzing the optical parameters of the dot matrix light source on the collected target array structure, and the uniform light emission monitoring result of the target array structure is analyzed to effectively improve the accuracy of the uniform light emission monitoring of the target array structure.
[0022] The embodiment of the present invention provides a method for monitoring uniform light emission of an array structure, wherein step 1 further comprises: From the array database, using the target array structure as a screening condition, the historical luminous usage records of the dot matrix light source corresponding to the target array structure are screened and obtained, and the historical luminous usage records are output as the first luminous analysis data; If the first light emitting analysis data does not exist, the initial capture frequency of the current target array structure is used as the set capture frequency to capture the image of the dot matrix light source on the current target array structure when emitting light; If the first luminous analysis data exists, extracting a first feature associated with the luminous effect of the dot matrix light source from the first luminous analysis data, and performing weighted average calculation on the first feature to obtain a first effect influence coefficient; When the first effect influence coefficient is not greater than the set influence threshold, based on the set capture frequency used at the last capture moment, an image of the dot matrix light source on the current target array structure when emitting light is captured; When the first effect influence coefficient is greater than a set influence threshold, adjusting the set capture frequency used at the previous capture moment to obtain an adjusted frequency; The adjusted frequency is used as the set capture frequency at the current moment to capture the image of the dot matrix light source on the current target array structure when it emits light.
[0023] In this embodiment, the array database is composed of historical luminous usage records of different array structures and corresponding dot matrix light sources, wherein the historical luminous usage records include luminous duration, luminous intensity, luminous frequency, luminous stability, etc.; the first luminous analysis data refers to the historical luminous usage records of the dot matrix light sources corresponding to the target array structure obtained by screening from the array database with the target array structure as the screening condition; the initial capture frequency refers to the pre-set frequency of setting the camera to capture images.
[0024] In this embodiment, the first feature is to extract features associated with the luminous effect of the dot matrix light source from the first luminous analysis data, such as luminous intensity uniformity, luminous frequency stability, luminous duration stability, and luminous color consistency, etc.; wherein, the luminous intensity uniformity is determined by whether the brightness of each part of the dot matrix light source is consistent when emitting light, the luminous frequency stability is determined by whether the frequency of the dot matrix light source is in a non-fluctuating or flickering state when emitting light, the luminous duration stability is determined by whether the luminous time of the dot matrix light source remains consistent when it emits light continuously, and the luminous color consistency is determined by whether the color of the colored dot matrix light source remains consistent when emitting light.
[0025] In this embodiment, the first effect influence coefficient is used to characterize the luminous effect of the dot matrix light source on the current target array structure, and is calculated based on the weighted average of the acquired first features, wherein the weight assigned to the first feature is obtained by solving a matrix constructed by pairwise comparison and relative importance scoring using the hierarchical analysis method; for example, there are currently first features q1, q2, q3, and q4, and the corresponding weights are w1, w2, w3, and w4, respectively. At this time, the first effect influence coefficient is equal to , e is expressed as a constant, and its value is 2.7; the set impact threshold is predetermined, and is generally 0.3; the adjusted frequency refers to the frequency obtained after adjusting the set capture frequency used at the previous capture moment.
[0026] The beneficial effect of the above technical solution is: by intelligently adjusting the set capture frequency according to the luminous effect of the dot matrix light source, the image capture efficiency can be effectively improved, providing a more reliable data basis for subsequent image processing and analysis, and helping to improve the accuracy and stability of uniform luminescence monitoring of the array structure.
[0027] The embodiment of the present invention provides a method for monitoring uniform light emission of an array structure, and the calculation formula of the adjusted frequency is as follows: ; In the formula, Expressed as adjusted frequency; Indicates the set capture frequency used at the last capture moment; It is expressed as the time interval between the current and the last capture moment; It is represented by the first effect influence coefficient currently obtained; It represents the set impact threshold; e represents a constant with a value of 2.7.
[0028] The beneficial effect of the above technical solution is that by calculating the adjusted frequency, a data basis can be provided for the current setting of the shooting frequency for collecting and capturing images, which in turn helps to improve the image capture efficiency and provide a more reliable data basis for subsequent image processing and analysis.
[0029] The embodiment of the present invention provides a method for monitoring uniform light emission of an array structure, performing image processing and analysis on the first array light emission image set to obtain a key light spot, and obtaining a light spot uniformity evaluation result by analyzing the uniformity of the key light spot, including: Step 11: performing image preprocessing on the first array luminescence image set to obtain a key luminescence image; Step 12: Selecting a region to be monitored from the key luminescent image and cropping it to obtain an initial image; Step 13: Compare the initial image with the key luminous image in terms of dot matrix light source characteristics to obtain a characteristic similarity coefficient; Step 14: If the feature similarity coefficient is greater than the set similarity threshold, the current initial image is regarded as a test image; If the feature similarity coefficient is not greater than the set similarity threshold, repeat steps 11 to 14 until a test image is obtained; Step 15: using a preset reading tool to obtain the pixel grayscale value of each pixel in the test image; Pixels whose grayscale values are greater than the set grayscale threshold are regarded as bright spots, and pixels whose grayscale values are not greater than the set grayscale threshold are regarded as background; Step 16: after setting the dot matrix light source in the test image according to the actual shape and characteristic parameters of the dot matrix light source, extracting the array sub-image of each dot matrix light source; Step 17: Perform spot screening and corresponding uniformity analysis on the array sub-image to obtain a grayscale uniformity evaluation result of the current array sub-image, and output it as a spot uniformity evaluation result; Step 18: Based on the grayscale uniformity evaluation result, if the array sub-image is a key image and the grayscale uniformity evaluation coefficient is not less than the set grayscale uniformity threshold, the current array sub-image is marked as a uniform image and output as the spot uniformity evaluation result; If the array sub-image is a key image and the grayscale uniformity evaluation coefficient is less than the set grayscale uniformity threshold, the current array sub-image is marked as a non-uniform image and output as a spot uniformity evaluation result; If the array sub-image is a general image, the current array sub-image is marked as a non-uniform image and output as a light spot uniformity evaluation result.
[0030] In this embodiment, image preprocessing refers to denoising, grayscale and image screening; the key luminescent image is obtained by denoising and grayscale processing the images in the first array luminescent image set, and then performing image screening, wherein the image screening processing refers to selecting the image with the highest quality coefficient from all preprocessed images in the first array luminescent image set as the key luminescent image, and the quality coefficient is obtained by weighted averaging the quality index values obtained by quality assessment of the preprocessed images in the first array luminescent image set using the image clarity index, wherein the image clarity index includes the gradient mean, the gradient variance and the Laplacian variance, which are indicators determined by calculating the gradient amplitude of each pixel after calculating the gradient of the image in the horizontal and vertical directions using the image gradient operator, and then determining the index based on the gradient amplitude of the entire image; the weight assigned to the quality index value is obtained by solving the matrix constructed by comparing the image clarity indexes pairwise and scoring the relative importance by using the hierarchical analysis method; the initial image is obtained by selecting the area to be monitored from the key luminescent image and cropping it.
[0031] In this embodiment, the area to be monitored refers to the area containing all the dot matrix light sources in the key luminous image; the dot matrix light source features include the brightness, color, shape and position of the light source; the feature similarity coefficient is used to characterize the similarity between the dot matrix light source features of the initial image and the key luminous image, and is obtained by calculating the sub-feature similarity values of each dot matrix light source feature of the initial image and the key luminous image using the cosine similarity algorithm, and then weighted averaging the sub-feature similarity values. The weights assigned to the sub-feature similarity values are obtained by solving the matrix constructed by pairwise comparison and relative importance scoring of the dot matrix light source features using the hierarchical analysis method; the similarity threshold is set in advance and is equal to , where b1 represents the total number of dot matrix light source features; the test image refers to the corresponding initial image when the feature similarity coefficient is greater than the set similarity threshold; the preset reading tool refers to a predetermined image processing software, such as OpenCV; the actual shape of the dot matrix light source refers to the geometric shape of the dot matrix light source, such as circle, square, and ellipse; the characteristic parameters refer to the diameter, side length, and array spacing of the dot matrix light source; the bright spot refers to the pixel point whose pixel grayscale value is greater than the set grayscale threshold; the background refers to the pixel point whose pixel grayscale value is not greater than the set grayscale threshold.
[0032] In this embodiment, the array sub-image refers to a local image of a single dot matrix light source extracted from a test image using image processing technology; the grayscale uniformity evaluation result refers to the grayscale uniformity evaluation coefficient (when the first area ratio is greater than the set area ratio threshold), or refers to the grayscale non-uniformity evaluation coefficient (when the first area ratio is not greater than the set area ratio threshold); the grayscale uniformity evaluation coefficient is used to characterize the grayscale uniformity of the dot matrix light source; the set grayscale uniformity threshold is predetermined, generally 0.8; a uniform image refers to an array sub-image whose grayscale uniformity evaluation coefficient is not less than the set grayscale uniformity threshold; a non-uniform image refers to an array sub-image whose grayscale uniformity evaluation coefficient is less than the set grayscale uniformity threshold, or an array sub-image marked as a general image.
[0033] The beneficial effect of the above technical solution is: by performing image processing and analysis on the first array luminous image set to obtain the key light spot, and by analyzing the uniformity of the key light spot, a light spot uniformity evaluation result is obtained, which can provide a reliable basis for subsequent uniform luminescence monitoring of the array structure.
[0034] The embodiment of the present invention provides a uniform light emission monitoring method for an array structure, which performs light spot screening and corresponding uniformity analysis on an array sub-image to obtain a gray uniformity evaluation result of the current array sub-image, including: Traverse all array sub-images and calculate the total area of bright spots in each array sub-image; Compare the bright spot area with the total area of the corresponding array sub-image to obtain a first area ratio; When the first area ratio is greater than a set area ratio threshold, the corresponding dot matrix light source in the current array sub-image is determined to be a key light spot, and the current array sub-image is marked as a valid image; Dividing the effective image into first sub-light regions, and determining a first average grayscale value of each first sub-light region; Based on the first average gray value, calculating the gray relative difference coefficient between any two first sub-light areas in the current array sub-image; Extract the maximum coefficient value and the minimum coefficient value from all the obtained grayscale relative difference coefficients, and obtain the first difference value by subtracting the minimum coefficient value from the maximum coefficient value; Summarize all grayscale relative difference coefficients and calculate the standard deviation to obtain the second difference value; The first difference value is combined with the second difference value to calculate a gray uniformity evaluation coefficient of the current valid image, and output it as a gray uniformity evaluation result; When the first area ratio is not greater than the set area ratio threshold, it is determined that the corresponding dot matrix light source in the current array sub-image is a general light spot, and the current array sub-image is marked as a general image; Dividing the general image into second sub-light regions, and determining a second average grayscale value of each second sub-light region; Determine a reference grayscale value according to the obtained second average grayscale value; Sort the second average grayscale values greater than the reference grayscale value from large to small to obtain a first average grayscale list; Sort the second average grayscale values that are not greater than the reference grayscale value from large to small to obtain a second average grayscale list; Using the second average grayscale value in the first average grayscale list, sequentially performing subtraction operations on all the second average grayscale values in the second average grayscale list to obtain a first grayscale comparison difference; By obtaining the standard deviation and average value of all first grayscale comparison differences, a grayscale comparison standard deviation and a grayscale comparison average value are correspondingly obtained; The grayscale comparison standard deviation is divided by the grayscale comparison average value to obtain a first difference representation value; Using the second average grayscale value in the first average grayscale list, sequentially performing a division operation on all the second average grayscale values in the second average grayscale list to obtain a first grayscale proportion; Using all the acquired first grayscale proportions, a first grayscale proportion matrix is established, and the first grayscale proportion matrix is analyzed to obtain a second difference representation value; The grayscale non-uniformity evaluation coefficient of the current general image is calculated using the first difference characterization value and the second difference characterization value, and is output as a grayscale uniformity evaluation result.
[0035] In this embodiment, the total area of bright spots refers to the total number of pixels regarded as bright spots in the array sub-image; the first area ratio refers to the ratio of the bright spot area to the total area of the corresponding array sub-image; the set area ratio threshold is predetermined, generally 0.8; the effective image refers to the array sub-image whose first area ratio is greater than the set area ratio threshold; the key light spot refers to the corresponding dot matrix light source in the effective image; the first sub-light area refers to the sub-area obtained by evenly dividing the effective image according to a preset ratio, wherein the preset ratio is predetermined.
[0036] In this embodiment, the grayscale relative difference coefficient is obtained by multiplying the absolute difference of the first average grayscale value and the absolute distance difference between the two first sub-light regions, for example: , where k1 represents the relative grayscale difference coefficient; e represents a constant with a value of 2.7; d1 represents the absolute difference of the first average grayscale value between the current two first sub-light regions; It is expressed as the influence weight of the absolute difference of the first average grayscale value between the first sub-light areas on the calculation of the grayscale relative difference coefficient; It is represented as the absolute distance difference between the two current first sub-light regions, obtained by calculating the Euclidean distance between the center points of the two first sub-light regions; It is expressed as the influence weight of the absolute distance difference between the first sub-light areas on the calculation of the grayscale relative difference coefficient; the weights assigned to the absolute difference of the average grayscale value between the first sub-light areas and the absolute distance difference between the first sub-light areas are obtained by solving the matrix constructed after pairwise comparison and relative importance scoring using the hierarchical analysis method. ; The first difference value is obtained by subtracting the minimum coefficient from the maximum coefficient, where the maximum coefficient refers to the maximum value of all grayscale relative difference coefficients obtained, and the minimum coefficient refers to the minimum value of all grayscale relative difference coefficients obtained; the grayscale uniformity evaluation coefficient is used to characterize the grayscale uniformity of the current valid image, and the calculation formula is equal to ,in, is represented as the first difference value; r2 is represented as the second difference value.
[0037] In this embodiment, the general image refers to an array sub-image whose first area ratio is not greater than a set area ratio threshold; the general light spot refers to the corresponding point matrix light source in the general image; the second sub-light area refers to a sub-area obtained by uniformly dividing the general image according to a preset ratio, wherein the preset ratio is predetermined.
[0038] In this embodiment, the reference grayscale value refers to the average value of the obtained second average grayscale values; the first average grayscale list is a list established by sorting the second average grayscale values greater than the reference grayscale value from large to small; the second average grayscale list is a list established by sorting the second average grayscale values not greater than the reference grayscale value from large to small; the first grayscale comparison difference is obtained by subtracting the second average grayscale value in the second average grayscale list from the second average grayscale value in the first average grayscale list; the first difference characterization value is obtained by dividing the grayscale comparison standard deviation by the grayscale comparison average value, wherein the grayscale comparison standard deviation refers to the standard deviation of all first grayscale comparison differences obtained; the grayscale comparison average value refers to the average value of all first grayscale comparison differences obtained; the first difference characterization value is obtained by dividing the grayscale comparison standard deviation by the grayscale comparison average value.
[0039] In this embodiment, the first grayscale proportion is obtained by dividing all the second average grayscale values in the second average grayscale list by the second average grayscale value in the first average grayscale list; the first grayscale proportion matrix is a matrix composed of all the first grayscale proportions obtained; the second difference characterization value is obtained by calculating the Gini coefficient of the first grayscale proportion matrix; the grayscale unevenness evaluation coefficient is obtained by weighted average of the first difference characterization value and the second difference characterization value. For example, if there is a first difference characterization value u1 and a first difference characterization value u2, then the current grayscale unevenness evaluation coefficient is ,in, It is expressed as the influence weight of the first difference characterization value on the calculation of the grayscale non-uniformity evaluation coefficient; It is expressed as the influence weight of the second difference characterization value on the calculation of the grayscale non-uniformity evaluation coefficient; the weights assigned to the first difference characterization value and the second difference characterization value are obtained by solving the matrix constructed after pairwise comparison and relative importance scoring using the hierarchical analysis method.
[0040] The beneficial effect of the above technical solution is: by performing key spot screening and corresponding uniform analysis on the array sub-image, the grayscale uniformity evaluation coefficient of the current array sub-image is obtained, which can accurately reflect the grayscale uniformity of the current array sub-image.
[0041] The embodiment of the present invention provides a method for monitoring uniform light emission of an array structure, which uses a set sensor to collect optical parameters of a dot matrix light source on a target array structure in real time, and analyzes the optical parameters to obtain an optical uniformity evaluation result, including: Using a set sensor that presents an array distribution consistent with the target array structure, optical parameters of each dot matrix light source on the target array structure are collected in real time to obtain dot matrix light source parameters; Traversing all the dot matrix light sources, comparing the corresponding dot matrix light source parameters of any two dot matrix light sources with the same optical parameter, and obtaining a plurality of first parameter differences; Using the first parameter difference to establish a light source parameter deviation matrix corresponding to different optical parameters; Each light source parameter deviation matrix is analyzed and calculated to obtain the corresponding light source parameter deviation value, which is output as an optical uniformity evaluation result.
[0042] In this embodiment, the setting sensor refers to an optical sensor; the optical parameters refer to illumination, brightness and color temperature; the dot matrix light source parameters refer to the optical parameters collected by each dot matrix light source on the target array structure at the current moment; the first parameter difference refers to the absolute difference in the parameters of the corresponding dot matrix light source parameters of the same optical parameter of any two dot matrix light sources; the light source parameter deviation matrix is used to represent the deviation relationship between different dot matrix light sources in the target array structure on a certain specific optical parameter, and each optical parameter has a corresponding light source parameter deviation matrix; the light source parameter deviation value is obtained by calculating the standard deviation of the elements in the light source parameter deviation matrix, and is used to quantify the overall deviation degree of different dot matrix light sources in the target array structure on a certain specific optical parameter; the optical uniformity evaluation result is composed of the parameter deviation values obtained by analyzing the corresponding light source parameter deviation matrix of each optical parameter.
[0043] The beneficial effect of the above technical solution is: by using the set sensor to collect the optical parameters of the dot matrix light source on the target array structure in real time, and analyzing the optical parameters, the optical uniformity evaluation result can be obtained. Accurately reflect the differences in optical parameters and uniformity between dot matrix light sources.
[0044] The embodiment of the present invention provides a method for monitoring uniform light emission of an array structure, which combines and analyzes the light spot uniformity evaluation result and the optical uniformity evaluation result to obtain a uniform light emission monitoring result of the current target array structure, including: Performing weighted average calculation on the parameter deviation values in the optical uniformity evaluation result to obtain a first uniformity characterization coefficient; When the first uniform characterization coefficient is greater than a set characterization threshold, it is determined that the current target array structure is uniformly luminous, and the result is output as a uniform luminous monitoring result; When the first uniform characterization coefficient is not greater than a set characterization threshold, it is determined that the target array structure emits non-uniform light; The first uniformity characterization coefficient is calculated in combination with the light spot uniformity evaluation result to obtain a non-uniformity evaluation coefficient; The calculation formula of the uneven evaluation coefficient is as follows: ; In the formula, It is expressed as the coefficient of uneven evaluation; It is expressed as the first uniform characterization coefficient; It is expressed as setting the characterization threshold; It is expressed as the total number of array sub-images, and also represents the total number of dot matrix light sources in the current target array structure; It is expressed as the total number of non-uniform images; It is expressed as the corresponding gray uniformity evaluation coefficient of the i-th non-uniform image, or the gray non-uniformity evaluation coefficient, where i=1, 2, 3, , n1; It is expressed as the total spot area corresponding to the i-th non-uniform image; Expressed as the area of the test image; It is expressed as the contribution weight of grayscale unevenness to the calculation of unevenness evaluation coefficient; It is expressed as the contribution weight of the optical parameter deviation to the calculation of the non-uniformity evaluation coefficient; It is represented as the jth dot matrix light source parameter of the dot matrix light source corresponding to the i-th non-uniform image, where j=1, 2, 3; It is expressed as the average value of the parameters of the j-th dot matrix light source; Using the unevenness assessment coefficient as a matching condition, the real-time unevenness level is obtained from the set unevenness level table; The non-uniformity evaluation coefficient and the real-time non-uniformity level are output as uniform light emission monitoring results.
[0045] In this embodiment, the first uniform characterization coefficient is used to reflect the overall optical uniformity of the dot matrix light source on the target array structure based on the optical parameter angle, and the formula is g , where g It is expressed as the first uniform characterization coefficient; It is expressed as the parameter deviation value of the parameter deviation matrix of the a-th light source, where a=1, 2, 3; It is expressed as the influence weight of the ath optical parameter on the overall optical uniformity of the dot matrix light source on the target array structure; e is expressed as a constant with a value of 2.7; and the characterization threshold is predetermined and is generally 0.8.
[0046] In this embodiment, the non-uniformity evaluation coefficient is used to evaluate the non-uniformity of the current target array structure; the non-uniformity level table is set to consist of different non-uniformity evaluation coefficient ranges and corresponding non-uniformity levels; It is expressed as the corresponding grayscale uniformity evaluation coefficient of the i-th non-uniform image (when the non-uniform image is an array sub-image marked as a key image), or the grayscale non-uniformity evaluation coefficient (when the non-uniform image is an array sub-image marked as a general image); the real-time non-uniformity level refers to the non-uniformity level screened out from the set non-uniformity level table using the currently acquired non-uniformity evaluation coefficient as a matching condition; the uniform luminescence monitoring result refers to the determination of the uniform luminescence of the current target array structure, or refers to the non-uniformity evaluation coefficient and the real-time non-uniformity level (determining the non-uniform luminescence of the current target array structure).
[0047] The beneficial effect of the above technical solution is that by combining and analyzing the light spot uniformity evaluation result with the optical uniformity evaluation result, the accuracy and reliability of uniform light emission monitoring of the current target array structure can be effectively improved.
[0048] Obviously, those skilled in the art can make various changes and modifications to the present invention without departing from the spirit and scope of the present invention. Thus, if these modifications and variations of the present invention fall within the scope of the claims of the present invention and their equivalents, the present invention is also intended to include these modifications and variations.
Claims
1. A method for monitoring uniform light emission of an array structure, characterized in that: include: Step 1: using a set camera to capture images of the dot matrix light source on the target array structure when it emits light according to a set capture frequency, to obtain a first array light-emitting image set; Step 2: performing image processing and analysis on the first array light-emitting image set to obtain a key light spot, and obtaining a light spot uniformity evaluation result by analyzing the uniformity of the key light spot; Step 3: Use the set sensor to collect the optical parameters of the dot matrix light source on the target array structure in real time, and analyze the optical parameters to obtain the optical uniformity evaluation result; Step 4: Analyze the light spot uniformity evaluation result and the optical uniformity evaluation result together to obtain the uniform light emission monitoring result of the current target array structure.
2. The method for monitoring uniform light emission of an array structure according to claim 1, characterized in that: The step 1 also includes: From the array database, using the target array structure as a screening condition, the historical luminous usage records of the dot matrix light source corresponding to the target array structure are screened and obtained, and the historical luminous usage records are output as the first luminous analysis data; If the first light emitting analysis data does not exist, the initial capture frequency of the current target array structure is used as the set capture frequency to capture the image of the dot matrix light source on the current target array structure when emitting light; If the first luminous analysis data exists, extracting a first feature associated with the luminous effect of the dot matrix light source from the first luminous analysis data, and performing weighted average calculation on the first feature to obtain a first effect influence coefficient; When the first effect influence coefficient is not greater than the set influence threshold, based on the set capture frequency used at the last capture moment, an image of the dot matrix light source on the current target array structure when emitting light is captured; When the first effect influence coefficient is greater than a set influence threshold, adjusting the set capture frequency used at the previous capture moment to obtain an adjusted frequency; The adjusted frequency is used as the set capture frequency at the current moment to capture the image of the dot matrix light source on the current target array structure when it emits light.
3. The method for monitoring uniform light emission of an array structure according to claim 2, characterized in that: The calculation formula of the adjusted frequency is as follows: ; In the formula, Expressed as adjusted frequency; Indicates the set capture frequency used at the last capture moment; It is expressed as the time interval between the current and the last capture moment; It is represented by the first effect influence coefficient currently obtained; It represents the set impact threshold; e represents a constant with a value of 2.
7.
4. The method for monitoring uniform light emission of an array structure according to claim 1, characterized in that: The first array luminous image set is processed and analyzed to obtain a key light spot, and the uniformity of the key light spot is analyzed to obtain a light spot uniformity evaluation result, including: Step 11: performing image preprocessing on the first array luminescence image set to obtain a key luminescence image; Step 12: Selecting a region to be monitored from the key luminescent image and cropping it to obtain an initial image; Step 13: Compare the initial image with the key luminous image in terms of dot matrix light source characteristics to obtain a characteristic similarity coefficient; Step 14: If the feature similarity coefficient is greater than the set similarity threshold, the current initial image is regarded as a test image; If the feature similarity coefficient is not greater than the set similarity threshold, repeat steps 11 to 14 until a test image is obtained; Step 15: using a preset reading tool to obtain the pixel grayscale value of each pixel in the test image; Pixels whose grayscale values are greater than the set grayscale threshold are regarded as bright spots, and pixels whose grayscale values are not greater than the set grayscale threshold are regarded as background; Step 16: after setting the dot matrix light source in the test image according to the actual shape and characteristic parameters of the dot matrix light source, extracting the array sub-image of each dot matrix light source; Step 17: Perform spot screening and corresponding uniformity analysis on the array sub-image to obtain a grayscale uniformity evaluation result of the current array sub-image, and output it as a spot uniformity evaluation result; Step 18: Based on the grayscale uniformity evaluation result, if the array sub-image is a key image and the grayscale uniformity evaluation coefficient is not less than the set grayscale uniformity threshold, the current array sub-image is marked as a uniform image and output as the spot uniformity evaluation result; If the array sub-image is a key image and the grayscale uniformity evaluation coefficient is less than the set grayscale uniformity threshold, the current array sub-image is marked as a non-uniform image and output as a spot uniformity evaluation result; If the array sub-image is a general image, the current array sub-image is marked as a non-uniform image and output as a light spot uniformity evaluation result.
5. The method for monitoring uniform light emission of an array structure according to claim 4, characterized in that: Perform spot screening and corresponding uniformity analysis on the array sub-image to obtain the gray uniformity evaluation result of the current array sub-image, including: Traverse all array sub-images and calculate the total area of bright spots in each array sub-image; Compare the bright spot area with the total area of the corresponding array sub-image to obtain a first area ratio; When the first area ratio is greater than a set area ratio threshold, the corresponding dot matrix light source in the current array sub-image is determined to be a key light spot, and the current array sub-image is marked as a valid image; Dividing the effective image into first sub-light regions, and determining a first average grayscale value of each first sub-light region; Based on the first average gray value, calculating the gray relative difference coefficient between any two first sub-light areas in the current array sub-image; Extract the maximum coefficient value and the minimum coefficient value from all the obtained grayscale relative difference coefficients, and obtain the first difference value by subtracting the minimum coefficient value from the maximum coefficient value; Summarize all grayscale relative difference coefficients and calculate the standard deviation to obtain the second difference value; The first difference value is combined with the second difference value to calculate a gray uniformity evaluation coefficient of the current valid image, and output it as a gray uniformity evaluation result; When the first area ratio is not greater than the set area ratio threshold, it is determined that the corresponding dot matrix light source in the current array sub-image is a general light spot, and the current array sub-image is marked as a general image; Dividing the general image into second sub-light regions, and determining a second average grayscale value of each second sub-light region; Determine a reference grayscale value according to the obtained second average grayscale value; Sort the second average grayscale values greater than the reference grayscale value from large to small to obtain a first average grayscale list; Sort the second average grayscale values that are not greater than the reference grayscale value from large to small to obtain a second average grayscale list; Using the second average grayscale value in the first average grayscale list, sequentially performing subtraction operations on all the second average grayscale values in the second average grayscale list to obtain a first grayscale comparison difference; By obtaining the standard deviation and average value of all first grayscale comparison differences, a grayscale comparison standard deviation and a grayscale comparison average value are correspondingly obtained; The grayscale comparison standard deviation is divided by the grayscale comparison average value to obtain a first difference representation value; Using the second average grayscale value in the first average grayscale list, sequentially performing a division operation on all the second average grayscale values in the second average grayscale list to obtain a first grayscale proportion; Using all the acquired first grayscale proportions, a first grayscale proportion matrix is established, and the first grayscale proportion matrix is analyzed to obtain a second difference representation value; The grayscale non-uniformity evaluation coefficient of the current general image is calculated using the first difference characterization value and the second difference characterization value, and is output as a grayscale uniformity evaluation result.
6. The method for monitoring uniform light emission of an array structure according to claim 1, characterized in that: The optical parameters of the dot matrix light source on the target array structure are collected in real time by using the set sensor, and the optical uniformity evaluation results are obtained by analyzing the optical parameters, including: Using a set sensor that presents an array distribution consistent with the target array structure, optical parameters of each dot matrix light source on the target array structure are collected in real time to obtain dot matrix light source parameters; Traversing all the dot matrix light sources, comparing the corresponding dot matrix light source parameters of any two dot matrix light sources with the same optical parameter, and obtaining a plurality of first parameter differences; Using the first parameter difference to establish a light source parameter deviation matrix corresponding to different optical parameters; Each light source parameter deviation matrix is analyzed and calculated to obtain the corresponding light source parameter deviation value, which is output as an optical uniformity evaluation result.
7. The method for monitoring uniform light emission of an array structure according to claim 6, characterized in that: The dot matrix light source parameters refer to illumination, brightness and color temperature.
8. The method for monitoring uniform light emission of an array structure according to claim 1, characterized in that: The light spot uniformity evaluation result is combined with the optical uniformity evaluation result for analysis to obtain the uniform light emission monitoring result of the current target array structure, including: Performing weighted average calculation on the parameter deviation values in the optical uniformity evaluation result to obtain a first uniformity characterization coefficient; When the first uniform characterization coefficient is greater than a set characterization threshold, it is determined that the current target array structure is uniformly luminous, and the result is output as a uniform luminous monitoring result; When the first uniform characterization coefficient is not greater than a set characterization threshold, it is determined that the target array structure emits non-uniform light; The first uniformity characterization coefficient is calculated in combination with the light spot uniformity evaluation result to obtain a non-uniformity evaluation coefficient; The calculation formula of the uneven evaluation coefficient is as follows: ; In the formula, It is expressed as the coefficient of uneven evaluation; It is expressed as the first uniform characterization coefficient; It is expressed as setting the characterization threshold; It is expressed as the total number of array sub-images, and also represents the total number of dot matrix light sources in the current target array structure; It is expressed as the total number of non-uniform images; It is expressed as the corresponding gray uniformity evaluation coefficient of the i-th non-uniform image, or the gray non-uniformity evaluation coefficient, where i=1, 2, 3, , n1; It is expressed as the total spot area corresponding to the i-th non-uniform image; Expressed as the area of the test image; It is expressed as the contribution weight of grayscale unevenness to the calculation of unevenness evaluation coefficient; It is expressed as the contribution weight of the optical parameter deviation to the calculation of the non-uniformity evaluation coefficient; It is represented as the jth dot matrix light source parameter of the dot matrix light source corresponding to the i-th non-uniform image, where j=1, 2, 3; It is expressed as the parameter average of the j-th dot matrix light source parameters; Using the unevenness assessment coefficient as a matching condition, the real-time unevenness level is obtained from the set unevenness level table; The non-uniformity evaluation coefficient and the real-time non-uniformity level are output as uniform light emission monitoring results.