Testing equipment and method
Through the collaborative work of the host computer and the test bench, fully automated testing of railway signaling equipment was achieved, solving the problems of insufficient testing efficiency and accuracy in existing technologies and improving the efficiency and accuracy of test results.
Patent Information
- Application Number
- CN202411636183.6
- Authority / Receiving Office
- CN · China
- Patent Type
- Applications(China)
- Current Assignee / Owner
- Filing Date
- 2024-11-15
- Publication Date
- 2025-03-07
AI Technical Summary
In existing technologies, the testing of inter-station safety transmission systems for railway signaling equipment relies on manual or semi-automatic methods, which suffer from human error and low efficiency, failing to meet the requirements for high-efficiency and high-accuracy testing.
A testing device and method are provided, including a host computer and a test bench, which work together to achieve a fully automated testing process. The test bench can automatically send test signals, receive and process test results, and generate test reports.
It eliminates the uncertainty and potential errors of human operation, significantly improves the efficiency and accuracy of test results, and reduces manual recording time and errors.
Smart Images
Figure CN119576680A_ABST
Abstract
Description
Technical Field
[0001] The present application relates to the field of data processing technology, and in particular to a testing device and method. Background Art
[0002] As an important part of transportation, the transportation efficiency and safety performance of railways are directly related to economic development and social stability. With the continuous increase in the running speed and running density of trains on railways, higher requirements are placed on the safety of railway signal equipment. Taking the inter-station safety transmission system in railway signal equipment as an example, the inter-station safety transmission system transmits inter-station safety information through optical fiber and adopts the railway signal safety communication protocol RSSP-I and the 2 times 2 take 2 architecture. This architecture improves the reliability and safety of the inter-station safety transmission system through redundant design.
[0003] At present, the testing of inter-station safety transmission systems mainly relies on manual testing or semi-automatic testing. The testing process of manual testing requires manual operation, including connecting and disconnecting lines, recording test results, etc. Semi-automatic testing can use some simple test equipment and software to assist testing.
[0004] However, during manual testing, due to the uncertainty of human operation, it is easy to make operational errors or record errors, thus affecting the accuracy of the test results. And due to the long time and the existence of human errors, the test efficiency of manual testing is low and cannot meet the needs of large-scale and efficient testing. Although semi-automatic testing has introduced some automation tools, it still requires manual intervention and cannot achieve full automation, and the test efficiency is still not high. Summary of the invention
[0005] Based on the above problems, the present application provides a testing device and method, which can improve the testing efficiency of railway signal equipment.
[0006] The embodiments of the present application disclose the following technical solutions:
[0007] In a first aspect, the present application discloses a test device, the test device comprising a host computer and a test bench, the test device being used to connect to a device under test;
[0008] The test bench is used to send a test signal to the device under test in response to a test instruction sent by the host computer;
[0009] The test bench is also used to receive the test result sent by the device under test;
[0010] The test bench is also used to send the test results to the host computer, so that the host computer generates a test report according to the test results.
[0011] Optionally, the test bench is specifically used to: in response to a test instruction sent by the host computer, pre-process the test signal corresponding to the test instruction to improve the driving capability of the test signal; limit the current of the processed test signal to reduce the current in the loop of the processed test signal; and send the secondary processed test signal to the device under test.
[0012] Optionally, the test bench is specifically used to: receive a result signal sent by the device under test; limit the current of the result signal to reduce the current in the loop of the result signal; perform at least one of filtering, amplifying and digitizing the processed result signal to obtain a secondary processed result signal; and send the test result corresponding to the secondary processed result signal to the host computer, so that the host computer generates a test report based on the test result corresponding to the secondary processed result signal.
[0013] Optionally, the test bench is specifically used to: receive a voltage signal sent by the device under test; filter and / or amplify the voltage signal to obtain a processed voltage signal; send the processed voltage signal to the host computer through an isolation module, so that the host computer generates a test report based on the test results corresponding to the processed voltage signal.
[0014] Optionally, the test bench is specifically used to: receive a current signal sent by the device under test; convert the current signal into a voltage signal; filter and / or amplify the voltage signal to obtain a processed voltage signal; and send the processed voltage signal to the host computer through an isolation module, so that the host computer generates a test report based on the test results corresponding to the processed voltage signal.
[0015] Optionally, the test device is further used to connect to an auxiliary device, and the auxiliary device and the test device are connected via a universal asynchronous receiver / transmitter UART port and / or a controller area network bus CAN port.
[0016] Optionally, the test result includes a level result, and the level result includes a high level and a low level.
[0017] Optionally, the testing device includes a board under test.
[0018] In a second aspect, the present application provides a testing method, which is applied to a testing device, wherein the testing device includes a host computer and a testing bench, and the testing device is used to connect to a device under test, and the method includes:
[0019] In response to the test instruction sent by the host computer, the test bench sends a test signal to the device under test;
[0020] The test bench receives the test result sent by the device under test;
[0021] The test bench sends the test result to the host computer, so that the host computer generates a test report according to the test result.
[0022] Optionally, in response to the test instruction sent by the host computer, the test bench sends a test signal to the device under test, including:
[0023] In response to the test instruction sent by the host computer, the test bench preprocesses the test signal corresponding to the test instruction to improve the driving ability of the test signal;
[0024] The test bench performs current limiting on the processed test signal to reduce the current in the loop of the processed test signal;
[0025] The test bench sends the secondary processed test signal to the device under test.
[0026] Compared with the prior art, this application has the following beneficial effects:
[0027] The embodiment of the present application provides a test device and method, the test device includes a host computer and a test bench, the test device is used to connect to the device under test; the test bench is used to send a test signal to the device under test in response to the test instruction sent by the host computer; receive the test result sent by the device under test; send the test result to the host computer so that the host computer generates a test report according to the test result. Thus, the present application realizes the full automation of the test process through the collaborative work of the host computer and the test bench. The test bench can automatically send a test signal to the device under test according to the test instruction sent by the host computer, and receive and process the test result. This automated method eliminates the uncertainty and potential errors of manual operation, and significantly improves the efficiency and accuracy of the test results. In addition, the automatic recording and processing of the test results reduces the time and errors of manual recording, further improving the test efficiency. BRIEF DESCRIPTION OF THE DRAWINGS
[0028] In order to more clearly illustrate the embodiments of the present application or the technical solutions in the prior art, the drawings required for use in the embodiments or the description of the prior art will be briefly introduced below. Obviously, the drawings described below are only some embodiments of the present application. For ordinary technicians in this field, other drawings can be obtained based on these drawings without paying creative labor.
[0029] Figure 1 A schematic diagram of a test device provided in an embodiment of the present application;
[0030] Figure 2A schematic diagram of an excitation output module provided in an embodiment of the present application;
[0031] Figure 3 A schematic diagram of a collection input interface module provided in an embodiment of the present application;
[0032] Figure 4 A schematic diagram of an analog input interface module provided in an embodiment of the present application;
[0033] Figure 5 A schematic diagram of a serial port and CAN communication interface module provided in an embodiment of the present application;
[0034] Figure 6 A schematic diagram of a test architecture provided in an embodiment of the present application;
[0035] Figure 7 A flowchart of a testing method provided in an embodiment of the present application. DETAILED DESCRIPTION
[0036] First, the technical terms involved in this application are explained:
[0037] Railway signaling equipment mainly includes inter-station safety information transmission systems based on optical communication, track circuits, computer interlocking, axle counting, Local Electronic Unit (LEU), on-board equipment, transponders, and microcomputer monitoring.
[0038] Among them, the inter-station safety information transmission system based on optical communication is mainly used for the transmission of inter-station signal control information, such as train position, speed, route status, etc., to ensure the safe operation of trains.
[0039] Track circuit is a circuit system used to detect whether a train is occupying a railway track. It applies current to the track and detects the change in current to determine whether the track is occupied by a train, thereby ensuring that the train runs on the correct track and preventing train collisions.
[0040] Computer interlocking uses computer technology to achieve centralized control and management of equipment such as switches, signals, and track circuits, ensuring that trains run safely along predetermined routes and preventing signal conflicts and train collisions.
[0041] An axle counter is a device used to detect the number of axles on a railway track. Sensors installed on both sides of the track detect the number of axles when a train passes by, thereby determining whether the track is occupied.
[0042] LEU is used to encode the status information of ground equipment (such as signals, switches, etc.) into data messages and transmit them to on-board equipment through transponders, thereby realizing information exchange between ground and on-board equipment.
[0043] On-board equipment refers to various signal and communication equipment installed on trains, which are mainly used for automatic protection and automatic driving of trains to ensure that trains run safely at the predetermined speed and route.
[0044] A transponder is a passive or active device installed beside or on the track, used to send data messages to on-board equipment. It is mainly used to provide information such as train location, speed limit, route status, etc., to help on-board equipment perform precise train control.
[0045] The microcomputer monitoring system is a system used to monitor the status of railway signal equipment in real time. It monitors and records the working status of various signal equipment through computer technology. It is mainly used for equipment status monitoring and fault diagnosis, timely detection and processing of equipment failures, and ensuring the normal operation of the railway signal system.
[0046] As described above, the current testing of the inter-station safety transmission system mainly relies on manual testing or semi-automatic testing. The testing process of manual testing requires manual operation, including connecting and disconnecting lines, recording test results, etc. Semi-automatic testing can use some simple test equipment and software to assist testing.
[0047] However, during manual testing, due to the uncertainty of human operation, it is easy to make operational errors or record errors, thus affecting the accuracy of the test results. And due to the long time and the existence of human errors, the test efficiency of manual testing is low and cannot meet the needs of large-scale and efficient testing. Although semi-automatic testing has introduced some automation tools, it still requires manual intervention and cannot achieve full automation, and the test efficiency is still not high.
[0048] After research, the inventor provides a test device and method, the test device includes a host computer and a test bench, the test device is used to connect to the device under test; the test bench is used to send a test signal to the device under test in response to the test instruction sent by the host computer; receive the test result sent by the device under test; send the test result to the host computer, so that the host computer generates a test report according to the test result. Therefore, the present application realizes the full automation of the test process through the collaborative work of the host computer and the test bench. The test bench can automatically send a test signal to the device under test according to the test instruction sent by the host computer, and receive and process the test result. This automated method eliminates the uncertainty and potential errors of manual operation, and significantly improves the efficiency and accuracy of the test results. In addition, the automatic recording and processing of the test results reduces the time and errors of manual recording, further improving the test efficiency.
[0049] In order to enable those skilled in the art to better understand the solution of the present application, the technical solution in the embodiments of the present application will be clearly and completely described below in conjunction with the drawings in the embodiments of the present application. Obviously, the described embodiments are only part of the embodiments of the present application, not all of the embodiments. Based on the embodiments in the present application, all other embodiments obtained by ordinary technicians in this field without creative work are within the scope of protection of this application.
[0050] See also Figure 1 , which is a schematic diagram of a test device provided in an embodiment of the present application. Figure 1 It can be seen that the test system 10 includes a test device 11, a device under test 12 and an auxiliary device 13. Among them, the test device 11 is the core part of the entire test system 10, including a host computer 14 and a test bench 15, and the host computer 14 and the test bench 15 are connected through a local area network (LAN) to achieve data communication and control.
[0051] The host computer 14 is responsible for the management and control of the entire test process, including sending test instructions, collecting test results, and generating test reports. In addition, the host computer 14 also provides an interface (such as a UART port and / or a CAN port, etc.) connected to the auxiliary equipment 13, which can be a power supply, a signal generator, an oscilloscope, etc., for expanding the test capability or improving the test accuracy.
[0052] As a physical platform for test execution, the test bench 15 can receive test instructions from the host computer 14, generate the required test signals and output them to the device under test 12 through the corresponding interface. At the same time, the test bench 15 is also equipped with a variety of interfaces, such as controller area network (CAN) port, serial port, IO port, analog / digital conversion interface, etc., to meet different test needs and technical requirements.
[0053] The device under test 12 is an object that needs to be tested. In the embodiment of the present application, the device under test 12 refers to a board under test in a railway safety transmission device.
[0054] The auxiliary equipment 13 includes some necessary peripheral equipment, such as railway-specific relays, 24V DC power supply, network router or switch, etc. The auxiliary equipment 13 is usually provided to meet special requirements in a specific test scenario.
[0055] Specifically, the test bench 15 is used to send a test signal to the device under test in response to a test instruction sent by the host computer.
[0056] The test bench 15 is also used to receive the test result sent by the device under test.
[0057] The test bench 15 is also used to send the test results to the host computer, so that the host computer generates a test report according to the test results.
[0058] Next, the module composition of the test bench 15 is explained:
[0059] The test bench 15 includes an excitation output module, an acquisition input interface module, an analog input interface module, a serial port and a CAN communication interface module.
[0060] The stimulus output module is responsible for converting the test instruction received from the host computer 14 into a test signal, and the test signal is used to drive the device under test 12 so as to test the device under test 12. Figure 2 , which is a schematic diagram of an excitation output module provided in an embodiment of the present application. Specifically, the excitation output module is divided into two types of outputs, the first type is 18-way optocoupler isolation output, and the second type is 18-way relay isolation output. Among them, the 18-way optocoupler isolation output is electrically isolated through the optocoupler isolation output unit, and can drive the small current voltage signal on the tested board of the device under test 12. The optocoupler isolation output unit improves the isolation, protects the input and output ports, and can drive small current signals such as digital IO signals. The 18-way relay isolation output is electrically isolated through the relay output unit, and can drive the large current voltage signal on the tested board of the device under test 12. The relay output unit has a stronger driving ability and is suitable for controlling large current signals such as power switches. In addition, it is necessary to equip the excitation output module with a MOS drive unit to enhance the driving ability of the test signal. The MOS drive unit can amplify the weak test signal to drive the subsequent circuit. Subsequently, in order to prevent the drive signal from being too large and damaging other devices of the device, each excitation output module is added with a current limiting unit. The current limiting unit can limit the current in the loop, thereby protecting other electronic components from damage by excessive current.
[0061] That is to say, the working principle of the excitation output module of the test bench is: first, the test instruction from the host computer is received; secondly, the test signal is pre-processed by the MOS driving unit to the test signal corresponding to the test instruction to improve the driving ability of the test signal; then the current limiting unit limits the current of the processed test signal to reduce the current in the loop of the processed test signal, thereby protecting other devices; finally, the test signal after enhancement and current limiting processing (that is, the test signal after secondary processing) is finally output to the tested board drive port of the tested device 12 through the optocoupler isolation output unit or the relay output unit.
[0062] The acquisition input interface module is responsible for receiving the output signal (i.e., result signal) of the tested board of the device under test 12 from the output port of the tested board of the device under test 12, and converting these output signals into a format that can be recognized and processed by the host computer 14 through a series of hardware and software processing. Figure 3 , which is a schematic diagram of an acquisition input interface module provided in an embodiment of the present application. All acquisition input interface modules are equipped with a current limiting unit. The main function of the current limiting unit is to limit the current size of the output signal of the tested board of the tested device 12, thereby ensuring the stability and safety of the output signal and preventing excessive current from damaging the acquisition input interface module. The optocoupler isolation acquisition unit uses optocoupler devices to achieve electrical isolation, thereby improving stability and anti-interference capabilities. The optocoupler isolation acquisition unit can accurately collect the level state of the output signal and convert it into a format that can be processed by the acquisition circuit of the host computer 14.
[0063] That is to say, the working principle of the acquisition input interface module is: first, the output signal (i.e., the result signal) of the board under test is received. Secondly, the current limiting unit limits the current of the result signal to reduce the current in the loop of the result signal to ensure that the current is within a safe range. The signal after current limiting then drives the optocoupler isolation acquisition unit to collect the level state of the optocoupler rear stage. Next, the collected signal is further processed, such as filtering, amplification, digitization, etc., so as to convert the signal into a format that can be recognized and processed by the host computer. Finally, the processed signal is sent to the host computer via Ethernet, and the host computer further processes and judges the received signal, for example, generating a test report based on the test results corresponding to the result signal after secondary processing.
[0064] The analog input interface module is responsible for receiving analog signals of the tested board of the tested device 12 from the tested device 12, and converting these analog signals into digital signals through a series of processing and conversion, so that the host computer 14 can perform further processing and judgment. Among them, the analog signals usually include the voltage signal of the tested board and the current signal of the tested board. Figure 4 , which is a schematic diagram of an analog input interface module provided in an embodiment of the present application. The voltage signal of the board under test is first processed by a signal conditioning circuit, including filtering, amplification and other steps to ensure the accuracy and stability of the voltage signal. The processed voltage signal is input to the console processor through an isolation module (such as an analog isolation circuit). When the current signal of the board under test is received, it needs to be converted into a voltage signal through a current-to-voltage circuit (such as a current transformer or a resistor) for subsequent processing. The converted voltage signal is processed in the same way as the directly received voltage signal, that is, it first passes through the signal conditioning circuit and then passes through the analog isolation circuit.
[0065] That is to say, the working principle of the analog input interface module is as follows: first, the voltage signal of the board under test or the current signal of the board under test from the device under test 12 is received. If the current signal of the board under test is received, the current signal of the board under test is first converted into the voltage signal of the board under test through the current-to-voltage circuit. Secondly, the voltage signal of the board under test is processed by the signal conditioning circuit, including steps such as filtering and amplification to ensure the accuracy and stability of the signal. The processed voltage signal is then input to the console processor through the analog isolation circuit. The main function of the analog isolation circuit is to prevent signal interference and electrical isolation, and to ensure the reliability and safety of the signal. Then the console processor decodes the received signal and converts it into a digital signal so that the host computer 104 can further process and judge it. Finally, the decoded data is sent to the host computer 104 via Ethernet. The host computer 104 processes, analyzes and judges according to the received data to realize monitoring and control of the object under test.
[0066] The serial port and CAN communication interface modules are responsible for connecting the tested board of the device under test 12 and the host computer 14. They ensure accurate and reliable transmission of communication data through their respective processing circuits and isolation modules. Figure 5 , which is a schematic diagram of a serial port and CAN communication interface module provided in an embodiment of the present application. Specifically, the serial communication interface module is responsible for receiving the data sent by the tested board of the tested device 12 through the serial port (i.e., the tested board serial communication port), and forwarding these data to the console processor after passing through the serial signal processing circuit and the isolation module, and the console processor sends these data to the host computer 14. At the same time, the serial communication interface module can also receive the data sent by the host computer through Ethernet, and after being processed by the console processor, it is forwarded to the tested board through the isolation module and the serial signal processing circuit. The CAN communication interface module is similar to the serial communication interface module, but it uses the CAN bus protocol for communication. The CAN communication interface module is responsible for receiving the data sent by the tested board of the tested device 12 through the CAN bus (the tested board CAN communication port), and forwarding these data to the console processor through the CAN signal processing circuit and the isolation module, and the console processor sends these data to the host computer 14. At the same time, it can also receive the data sent by the host computer through Ethernet, and after processing, it is forwarded to the tested board through the isolation module and the CAN signal processing circuit.
[0067] Next, the main functional characteristics of the test bench 15 are explained, see Figure 6 , which is a schematic diagram of a test architecture provided in an embodiment of the present application.
[0068] First, the test bench 15 has the basic ability to handle network communications, that is, it can parse the specific format data packets obtained from other devices on the network (such as the host computer 13), and can also generate specific format data packets to send to other devices on the network. In addition, the time interval for periodic data upload is usually set to 100 milliseconds, that is, the test bench 15 will automatically collect data packets at a time interval of 100 milliseconds, or automatically send data packets (i.e. update data), which helps to ensure stable operation of the equipment and timely discovery and resolution of problems. In addition, if the test bench 15 detects any abnormality (such as equipment failure, performance degradation, etc.) based on the data, it can quickly upload these abnormal information to the host computer 13, thereby allowing the operator or automation system to take immediate measures to intervene.
[0069] Second, the test bench 15 has flexible resource management capabilities, allowing the host computer 14 to dynamically adjust the configuration by sending specific instructions. For example, the test bench 15 can respond to the instructions of the host computer 14 to reallocate the number of digital IO ports, set the number of analog inputs, configure the parameters of the UART and CAN interfaces, etc. This flexibility is essential for adapting to different test requirements.
[0070] Third, the test bench 15 can monitor the voltage values of up to 5 analog input ports in real time. This function is very important for detecting continuously changing physical quantities such as current and temperature in the circuit.
[0071] Fourthly, the test bench 15 can also read the level result of the digital input port in real time, that is, high level or low level. This function is very important for checking discrete events such as switch status and digital signal integrity.
[0072] Fifth, TestBench 15 supports precise control of the level changes of digital output ports, and can even perform IO state switching in the timer interrupt service routine to achieve microsecond-level control accuracy (default 10 microseconds). This fine control capability is very important for executing complex test sequences or simulating real-world working conditions.
[0073] Sixth, the test bench 15 supports UART interface communication. By configuring the UART interface, the test bench 15 can establish a connection with other serial communication devices to achieve data transmission and reception, so this function is very important for the compatibility and practicality of the test system.
[0074] Seventh, the test bench 15 supports CAN communication. By configuring the CAN interface, the test bench 15 can effectively interact with devices using CAN technology, which is very important for testing those inter-station secure transmission devices that rely on the CAN network.
[0075] In summary, the present application provides a test device, which includes a host computer and a test bench, and the test device is used to connect to the device under test; the test bench is used to send a test signal to the device under test in response to a test instruction sent by the host computer; receive the test result sent by the device under test; send the test result to the host computer so that the host computer generates a test report according to the test result. Thus, the present application realizes the full automation of the test process through the collaborative work of the host computer and the test bench. The test bench can automatically send a test signal to the device under test according to the test instruction sent by the host computer, and receive and process the test result. This automated method eliminates the uncertainty and potential errors of manual operation, and significantly improves the efficiency and accuracy of the test results. In addition, the automatic recording and processing of the test results reduces the time and errors of manual recording, and further improves the test efficiency.
[0076] See also Figure 7 , which is a flow chart of a test method provided in an embodiment of the present application. The method is applied to a test device, the test device includes a host computer and a test bench, and the test device is used to connect to the device under test. The method includes:
[0077] S701: In response to the test instruction sent by the host computer, the test bench sends a test signal to the device under test.
[0078] S702: The test bench receives the test result sent by the device under test.
[0079] S703: The test bench sends the test results to the host computer, so that the host computer generates a test report according to the test results.
[0080] In some specific implementations, in response to a test instruction sent by a host computer, the test bench sends a test signal to the device under test, including:
[0081] In response to the test instruction sent by the host computer, the test bench pre-processes the test signal corresponding to the test instruction to improve the driving ability of the test signal;
[0082] The test bench limits the current of the processed test signal to reduce the current in the loop of the processed test signal;
[0083] The test bench sends the secondary processed test signal to the device under test.
[0084] In some specific implementations, the test bench receives the test result sent by the device under test, including:
[0085] Receive the result signal sent by the device under test;
[0086] The test bench sends the test results to the host computer, so that the host computer generates a test report based on the test results, including:
[0087] Limiting the current of the result signal to reduce the current in the loop of the result signal;
[0088] Performing at least one of filtering, amplifying and digitizing the processed result signal to obtain a secondary processed result signal;
[0089] The test result corresponding to the result signal after the secondary processing is sent to the host computer, so that the host computer generates a test report according to the test result corresponding to the result signal after the secondary processing.
[0090] In some specific implementations, the test bench receives the test result sent by the device under test, including:
[0091] Receive the voltage signal sent by the device under test;
[0092] The test bench sends the test results to the host computer, so that the host computer generates a test report based on the test results, including:
[0093] Filtering and / or amplifying the voltage signal to obtain a processed voltage signal;
[0094] The processed voltage signal is sent to the host computer through the isolation module, so that the host computer generates a test report according to the test result corresponding to the processed voltage signal.
[0095] In some specific implementations, the test bench receives the test result sent by the device under test, including:
[0096] Receive the current signal sent by the device under test;
[0097] The test bench sends the test results to the host computer, so that the host computer generates a test report based on the test results, including:
[0098] Convert current signal into voltage signal;
[0099] Filtering and / or amplifying the voltage signal to obtain a processed voltage signal;
[0100] The processed voltage signal is sent to the host computer through the isolation module, so that the host computer generates a test report according to the test result corresponding to the processed voltage signal.
[0101] In some specific implementations, the test device is also used to connect to an auxiliary device, and the auxiliary device and the test device are connected via a universal asynchronous receiver / transmitter UART port and / or a controller area network bus CAN port.
[0102] In some specific implementations, the test result includes a level result, and the level result includes a high level and a low level.
[0103] In some specific implementations, the testing device includes a board under test.
[0104] In summary, the present application provides a test method, which realizes full automation of the test process through the collaborative work of the host computer and the test bench. The test bench can automatically send test signals to the device under test according to the test instructions sent by the host computer, and receive and process the test results. This automated method eliminates the uncertainty and potential errors of manual operation, and significantly improves the efficiency and accuracy of the test results. In addition, the automatic recording and processing of test results reduces the time and errors of manual recording, further improving the test efficiency.
[0105] It should be noted that each embodiment in this specification is described in a progressive manner, and the same or similar parts between the embodiments can be referred to each other, and each embodiment focuses on the differences from other embodiments. In particular, for the device and system embodiments, since they are basically similar to the method embodiments, the description is relatively simple, and the relevant parts can be referred to the partial description of the method embodiments. The device and system embodiments described above are merely schematic, wherein the units described as separate components may or may not be physically separated, and the components indicated as units may or may not be physical units, that is, they may be located in one place, or they may be distributed on multiple network units. Some or all of the modules may be selected according to actual needs to achieve the purpose of the scheme of this embodiment. Ordinary technicians in this field can understand and implement it without paying creative labor.
[0106] The above is only a specific implementation of the present application, but the protection scope of the present application is not limited thereto. Any changes or substitutions that can be easily thought of by a person skilled in the art within the technical scope disclosed in the present application should be included in the protection scope of the present application. Therefore, the protection scope of the present application should be based on the protection scope of the claims.
Claims
1. A testing device, characterized in that: The test equipment includes a host computer and a test bench, and the test equipment is used to connect to the device under test; The test bench is used to send a test signal to the device under test in response to a test instruction sent by the host computer; The test bench is also used to receive the test result sent by the device under test; The test bench is also used to send the test results to the host computer, so that the host computer generates a test report according to the test results.
2. The device according to claim 1, characterized in that The test bench is specifically used for: responding to the test instruction sent by the host computer, preprocessing the test signal corresponding to the test instruction to improve the driving ability of the test signal; limiting the current of the processed test signal to reduce the current in the loop of the processed test signal; and sending the secondary processed test signal to the device under test.
3. The device according to claim 1, characterized in that The test bench is specifically used for: receiving the result signal sent by the device under test; limiting the current of the result signal to reduce the current in the loop of the result signal; filtering, amplifying and digitizing the processed result signal to obtain a secondary processed result signal; sending the test result corresponding to the secondary processed result signal to the host computer, so that the host computer generates a test report according to the test result corresponding to the secondary processed result signal.
4. The device according to claim 1, characterized in that The test bench is specifically used to: receive the voltage signal sent by the device under test; filter and / or amplify the voltage signal to obtain a processed voltage signal; and send the processed voltage signal to the host computer through an isolation module so that the host computer generates a test report based on the test results corresponding to the processed voltage signal.
5. The device according to claim 1, characterized in that The test bench is specifically used to: receive the current signal sent by the device under test; convert the current signal into a voltage signal; filter and / or amplify the voltage signal to obtain a processed voltage signal; and send the processed voltage signal to the host computer through an isolation module, so that the host computer generates a test report according to the test results corresponding to the processed voltage signal.
6. The device according to claim 1, characterized in that The test device is also used to connect to an auxiliary device, and the auxiliary device and the test device are connected via a universal asynchronous receiver / transmitter UART port and / or a controller area network bus CAN port.
7. The device according to claim 1, characterized in that The test result includes a level result, and the level result includes a high level and a low level.
8. The device according to claim 1, characterized in that The testing equipment includes a board to be tested.
9. A testing method, characterized in that: Applied to a test device, the test device includes a host computer and a test bench, the test device is used to connect to a device under test, and the method includes: In response to the test instruction sent by the host computer, the test bench sends a test signal to the device under test; The test bench receives the test result sent by the device under test; The test bench sends the test result to the host computer, so that the host computer generates a test report according to the test result.
10. The method according to claim 9, characterized in that In response to the test instruction sent by the host computer, the test bench sends a test signal to the device under test, including: In response to the test instruction sent by the host computer, the test bench preprocesses the test signal corresponding to the test instruction to improve the driving ability of the test signal; The test bench performs current limiting on the processed test signal to reduce the current in the loop of the processed test signal; The test bench sends the secondary processed test signal to the device under test.