Radiation inspection system

Abstract

The invention provides a radiation inspection system which comprises a scanning device, the scanning device comprises a radiation device and a detection device, the radiation device and the detection device are matched with each other to scan an inspected object, the radiation device is located on one side of the inspected object and comprises at least two radiation sources, and the at least two radiation sources of the radiation device are arranged in the first direction; each radiation source comprises at least two sub-light sources arranged at intervals in the second direction, the first direction is perpendicular to the second direction and intersects with the opposite arrangement direction of the radiation device and the detected object, and in the at least two radiation sources of the radiation device, any two adjacent radiation sources in the first direction are partially overlapped in the second direction. Therefore, the accuracy of the inspection result of the radiation inspection system can be improved.

Description

Technical Field

[0001] The present application relates to the technical field of radiation inspection, and in particular to a radiation inspection system. Background Art

[0002] Radiation inspection systems are widely used in medical treatment, security inspection, customs inspection and other fields. They usually include a radiation device and a detection device. The radiation device emits rays that irradiate the object to be inspected and are received by the detection device to generate an image to realize the inspection of the object to be inspected.

[0003] It has been found in practice that the accuracy of the inspection results of the radiation inspection system needs to be improved. Summary of the invention

[0004] A technical problem to be solved by the present application is to improve the accuracy of inspection results of a radiation inspection system.

[0005] In order to solve the above technical problems, the present application provides a radiation inspection system, which includes:

[0006] A scanning device comprises a radiation device and a detection device, which cooperate with each other to scan an object to be inspected. The radiation device is located on one side of the object to be inspected and comprises at least two radiation sources. The at least two radiation sources of the radiation device are arranged along a first direction and each comprises at least two sub-light sources arranged at intervals along a second direction. The first direction and the second direction are perpendicular to each other and intersect with the relative arrangement direction of the radiation device and the object to be inspected. Among the at least two radiation sources of the radiation device, any two adjacent radiation sources in the first direction partially overlap in the second direction.

[0007] In some embodiments, the overlapping parts of any two adjacent radiation sources in the first direction in the second direction form an overlapping area, and a sub-light source is provided in the overlapping area.

[0008] In some embodiments, a pair of sub-light sources collinear in the first direction are provided in the overlapping region.

[0009] In some embodiments, the sub-light sources that are collinear in the first direction in the overlapping region emit beams at different times.

[0010] In some embodiments, each sub-light source of the radiation device does not emit light beams at the same time.

[0011] In some embodiments, the scanning device is configured as at least one of the following:

[0012] The radiation device includes at least three radiation sources;

[0013] The radiation source includes at least three sub-light sources;

[0014] The sub-light source is a pulse light source.

[0015] In some embodiments, the radiation device is located on one side of the object under inspection in the up-down direction, the first direction is along the left-right direction, and the second direction is along the front-back direction; and / or, the radiation device is located on one side of the object under inspection in the left-right direction, the first direction is along the front-back direction, and the second direction is along the up-down direction.

[0016] In some embodiments, the detection device includes a backscatter detector, which cooperates with the radiation device to perform a backscatter scan on the object under inspection; and / or, the detection device includes a transmission detector, which cooperates with the radiation device to perform a transmission scan on the object under inspection.

[0017] In some embodiments, the radiation inspection system includes at least two scanning devices, and the radiation devices of the at least two scanning devices are arranged on different sides of the inspected object.

[0018] In some embodiments, the radiation inspection system includes at least three scanning devices.

[0019] By constructing the radiation device to include at least two distributed radiation sources arranged along a first direction, and constructing any two adjacent distributed radiation sources of the radiation device along the first direction to partially overlap in the second direction, not only can the scanning range of the radiation device be effectively expanded, but also the risk of missing scans by the radiation device within the scanning range can be effectively reduced. In this way, the accuracy of the inspection results can be effectively improved.

[0020] Other features and advantages of the present application will become apparent from the following detailed description of exemplary embodiments of the present application with reference to the accompanying drawings. BRIEF DESCRIPTION OF THE DRAWINGS

[0021] In order to more clearly illustrate the embodiments of the present application or the technical solutions in the prior art, the drawings required for use in the embodiments or the description of the prior art will be briefly introduced below. Obviously, the drawings described below are only some embodiments of the present application. For ordinary technicians in this field, other drawings can be obtained based on these drawings without paying creative work.

[0022] Figure 1 Schematic diagram of the structure of the radiation inspection system in the embodiment of the present application.

[0023] Figure 2 Schematic diagram of the structure of the radiation device in the embodiment of the present application.

[0024] Figure 3 Schematic diagram of the structure of the collimator in the embodiment of the present application. Description of Reference Numerals

[0025] 10. Scanning device;

[0026] 1. Radiation device; 11. Radiation source; 12. Sub-light source; 13. Overlapping area;

[0027] 2. Detection device; 21. Backscatter detector;

[0028] 3. Collimator; 31. Collimation port;

[0029] 4. Check the channel;

[0030] 5. The subject of inspection;

[0031] X, first direction; Y, second direction; H, up and down direction; W, left and right direction; L, front and back direction. DETAILED DESCRIPTION

[0032] The following will be combined with the drawings in the embodiments of the present application to clearly and completely describe the technical solutions in the embodiments of the present application. Obviously, the described embodiments are only part of the embodiments of the present application, rather than all of the embodiments. The following description of at least one exemplary embodiment is actually only illustrative and is by no means intended to limit the present application and its application or use. Based on the embodiments in the present application, all other embodiments obtained by ordinary technicians in this field without carrying out creative work are within the scope of protection of this application.

[0033] Technologies, methods, and equipment known to ordinary technicians in the relevant art may not be discussed in detail, but where appropriate, the technologies, methods, and equipment should be considered as part of the specification.

[0034] In the description of the present application, it should be understood that the directions or positional relationships indicated by directional words such as "front, back, up, down, left, right", "lateral, vertical, perpendicular, horizontal" and "top, bottom" are usually based on the directions or positional relationships shown in the drawings, and are only for the convenience of describing the present application and simplifying the description. Unless otherwise specified, these directional words do not indicate or imply that the device or element referred to must have a specific direction or be constructed and operated in a specific direction, and therefore cannot be understood as limiting the scope of protection of the present application; the directional words "inside and outside" refer to the inside and outside relative to the contours of each component itself.

[0035] In the description of the present application, it should be understood that the use of terms such as "first" and "second" to limit components is only for the convenience of distinguishing the corresponding components. Unless otherwise stated, the above terms have no special meaning and therefore cannot be understood as limiting the scope of protection of the present application.

[0036] In addition, the technical features involved in the different embodiments of the present application described below can be combined with each other as long as they do not conflict with each other.

[0037] In practice, it is found that the limited scanning range of the radiation device is an important reason for the low accuracy of the inspection results. This is because the limited scanning range of the radiation device means that in the process of inspecting the object under inspection using the radiation inspection system, the radiation device can only cover a part of the area of ​​the object under inspection at a time, and cannot completely cover a certain dimension of the object under inspection (such as height or width) at one time, which may cause missed scans and missed inspections, affecting the accuracy of the inspection results. The corresponding problem is more obvious when the object under inspection is a large object, which also makes it difficult for the radiation inspection system to effectively meet the inspection needs of large objects.

[0038] Based on the above findings, the present application improves the structure of the existing radiation inspection system and provides a radiation inspection system accordingly.

[0039] Figure 1-Figure 3 The structure of the radiation inspection system in the present application is shown as an example. It can be understood that Figure 1-Figure 3 It is only a schematic diagram, and the shapes of the components shown therein do not constitute the sole limitation.

[0040] See also Figure 1-Figure 3 In the present application, the radiation inspection system includes a scanning device 10, the scanning device 10 includes a radiation device 1 and a detection device 2, the radiation device 1 and the detection device 2 cooperate with each other to scan the object 5 to be inspected, the radiation device 1 is located on one side of the object 5 to be inspected, and includes at least two radiation sources 11, the at least two radiation sources 11 of the radiation device 1 are arranged along a first direction X, and each includes at least two sub-light sources 12 arranged at intervals along a second direction Y, and among the at least two radiation sources 11 of the radiation device 1, any two adjacent radiation sources 11 in the first direction X partially overlap in the second direction Y. The first direction X and the second direction Y are perpendicular to each other and intersect (for example, perpendicular to) the relative arrangement direction of the radiation device 1 and the object 5 to be inspected.

[0041] In the above scheme, the radiation source 11 included in the radiation device 1 is a distributed radiation source, which does not include only one sub-light source 12, but includes at least two sub-light sources 12 arranged at intervals along the second direction Y. In this way, the problem of limited scanning range of a single sub-light source 12 can be effectively solved. Therefore, compared with the case where the radiation source 11 only includes a single sub-light source 12, the scanning range in the second direction Y can be effectively expanded, which makes it convenient for the radiation device 1 to cover a larger area of ​​a certain dimension (such as height or width) of the object to be inspected 5 at one time, thereby reducing the risk of missed scanning and missed inspection due to a small scanning range.

[0042] Moreover, in the above scheme, at least two radiation sources 11 of the radiation device 1 arranged along the first direction X are not completely overlapped or completely staggered in the second direction Y, but partially overlapped in the second direction Y, so that any two adjacent radiation sources 11 in the first direction X are staggered in the second direction Y (that is, partially staggered and partially overlapped). In this way, the risk of missed scanning can be reduced, the imaging quality can be improved, and the accuracy of the inspection result can be improved while the scanning range is effectively expanded.

[0043] Among them, when two adjacent radiation sources 11 in the first direction X (hereinafter referred to as two adjacent radiation sources 11) are not misaligned in the second direction Y and completely overlap, it means that the coverage lengths of the radiation sources 11 of the radiation device 1 in the second direction Y are the same. In this case, the radiation device 1 can only rely on the sub-light source 12 in a single radiation source 11 to expand the scanning range in the second direction Y, and the expansion of the scanning range in the second direction Y is limited.

[0044] When two adjacent radiation sources 11 do not completely overlap in the second direction Y but are staggered, along the direction from one side to the other side of the second direction Y, the radiation source 11 located downstream always further increases the coverage length in the second direction Y on the basis of the upstream adjacent radiation source 11. In this case, the radiation device 1 can not only rely on the sub-light source 12 in a single radiation source 11 to expand the scanning range in the second direction Y, but also rely on the increased coverage length in the second direction Y of each radiation source 11 included relative to the upstream adjacent radiation source 11 to expand the scanning range in the second direction Y. Therefore, the scanning range of the scanning device 1 in the second direction Y can be more effectively expanded, so that the overall scanning range of the scanning device 1 is further increased.

[0045] In addition, when two adjacent radiation sources 11 are completely offset in the second direction Y, the distance between the last sub-light source 12 of one radiation source 11 and the first sub-light source 12 of the other radiation source 11 in the second direction Y is relatively large. Since there is no sub-light source 12 within the corresponding distance range, the corresponding distance is relatively large, which means that there is a high risk that the portion of the object 5 located in the area between the two cannot be scanned, that is, there is a high risk of missed scanning, which may result in incomplete images, affect imaging quality, and affect the accuracy of inspection results. Among them, the reason why the distance between the last sub-light source 12 of one radiation source 11 and the first sub-light source 12 of the other radiation source 11 in the second direction Y is relatively large when two adjacent radiation sources 11 are completely staggered in the second direction Y is, on the one hand, that the two radiation sources 11 completely staggered in the second direction Y may not be directly connected end to end, but there is a gap, and the corresponding gap will cause the distance between the last sub-light source 12 of one radiation source 11 and the first sub-light source 12 of the other radiation source 11 in the second direction Y to be relatively large, thereby increasing the risk of missed scanning; on the other hand, the two sub-light sources 12 of the radiation source 11 located at the two ends of the second direction Y and the radiation source 11 There is also a certain distance between the two ends of the second direction Y itself, and the corresponding distance is usually larger than the distance between two adjacent sub-light sources 12 of the same radiation source 11, which may also cause that among the two adjacent radiation sources 11 that are completely staggered in the second direction Y, the distance between the last sub-light source 12 of one radiation source 11 and the first sub-light source 12 of the other radiation source 11 in the second direction Y is larger, thereby increasing the risk of missed scanning. Moreover, even if there is no gap between the two adjacent radiation sources 11 that are completely staggered in the second direction Y, but are directly connected end to end, there is still the problem that the distance between the last sub-light source 12 of one radiation source 11 and the first sub-light source 12 of the other radiation source 11 in the second direction Y is larger, thereby increasing the risk of missed scanning.

[0046] By making the two adjacent radiation sources 11 not completely staggered in the second direction Y but staggered with each other, the scanning range can be expanded by utilizing the partial staggering of the radiation sources 11 in the second direction Y, and the distance between the last sub-light source 12 of one radiation source 11 and the first sub-light source 12 of the other radiation source 11 in the second direction Y can be reduced by utilizing the partial overlap of the radiation sources 11 in the second direction Y, thereby effectively reducing the risk of missed scanning, improving imaging quality, and improving the accuracy of inspection results. Among them, when two adjacent radiation sources 11 partially overlap in the second direction Y, it can not only solve the problem of high risk of missed scanning caused by the gap between the head and tail of the two adjacent radiation sources 11, and the large distance between the last sub-light source 12 of one radiation source 11 and the first sub-light source 12 of the other radiation source 11 in the second direction Y, but also solve the problem of high risk of missed scanning caused by the large gap between the sub-light sources 12 at the end of the radiation source 11 and the large distance between the last sub-light source 12 of one radiation source 11 and the first sub-light source 12 of the other radiation source 11 in the second direction Y. Therefore, the distance between the last sub-light source 12 of one radiation source 11 and the first sub-light source 12 of the other radiation source 11 in the second direction Y can be effectively reduced, thereby effectively reducing the risk of missed scanning.

[0047] It can be seen that the above scheme, by constructing the radiation device 1 to include at least two distributed radiation sources 11 arranged along the first direction X, and constructing any two adjacent distributed radiation sources 11 of the radiation device 1 along the first direction X to partially overlap in the second direction Y, can not only effectively expand the scanning range of the radiation device 1 and reduce the risk of missed scanning and missed inspection due to the small scanning range, but also effectively reduce the risk of missed scanning of the radiation device 1 within the scanning range. In this way, the accuracy of the inspection result can be more effectively improved, the inspection requirements of the inspected object 5, especially the large inspected object, can be better met, and the inspection accuracy of the inspected object 5, especially the large inspected object, can be improved.

[0048] The overlapping portion of any two adjacent radiation sources 11 in the first direction X in the second direction Y may be referred to as an overlapping region 13, and there may be no sub-light source 12 in the overlapping region 13, or there may be a sub-light source 12. Compared with the case where there is no sub-light source 12 in the overlapping region 13, when there is a sub-light source 12 in the overlapping region 13, it means that the overlapping region 13 has a larger area, the head-to-tail overlapping range of the two adjacent radiation sources 11 is larger, and the blank area without the sub-light source 12 is smaller, so it is more conducive to reducing the risk of missed scanning, which is conducive to further improving the imaging quality and the accuracy of the inspection results.

[0049] As an example of a sub-light source 12 in the overlapping area 13, see Figure 2 In some embodiments, a pair of sub-light sources 12 collinear in the first direction X is provided in the overlapping region 13. At this time, the overlapping region 13 not only has sub-light sources 12, but also has and only has a pair of sub-light sources 12 collinear in the first direction X. The pair of sub-light sources 12 are respectively the last sub-light source 12 of one radiation source 11 and the first sub-light source 12 of the other radiation source 11 of the two adjacent radiation sources 11. The two are aligned in the second direction Y, and the distance is 0. Since there is no blank area without sub-light sources 12 between the two adjacent radiation sources 11 at this time, the risk of missed scanning can be more effectively reduced, the imaging quality can be improved, and the accuracy of the inspection result can be improved. In addition, there is only a pair of sub-light sources 12 collinear in the first direction X in the overlapping region 13, which means that the other sub-light sources 12 of the two adjacent radiation sources 11 are not aligned in the first direction Y, but staggered. In this way, compared with the case where at least two pairs of sub-light sources 12 collinear in the first direction X are provided in the overlapping region 13, the radiation device 1 has a longer coverage length in the second direction Y and a larger scanning range. It can be seen that a pair of sub-light sources 12 collinear in the first direction X are provided in the overlapping area 13, which can not only effectively expand the scanning range of the radiation device 1 in the first direction Y, but also further reduce the risk of missed scanning, and therefore, is more conducive to improving the accuracy of the inspection result.

[0050] When a pair of sub-light sources 12 that are collinear in the first direction X are provided in the overlapping area 13, the corresponding collinear sub-light sources 12 can be configured to emit beams at different times, that is, among the two sub-light sources 12 that are collinear in the first direction X, one sub-light source 12 emits a beam and the other sub-light source 12 does not, and the two sub-light sources 12 emit beams in a time-sharing (or staggered) manner. In this way, mutual interference between the collinear sub-light sources 12 can be reliably prevented, which is conducive to reducing the control difficulty and achieving a smoother inspection process.

[0051] In some embodiments, the sub-light sources 12 of the radiation device 1 do not emit beams at the same time. This can reliably prevent the sub-light sources 12 of the radiation device 1 from interfering with each other, further reduce the control difficulty, and improve the smoothness of the inspection process.

[0052] As an example of the sub-light source 12 in the above embodiments, the sub-light source 12 is a pulse light source. Since a pulse light source is a discontinuous light source, when the sub-light source 12 is a pulse light source, it is more convenient to control different sub-light sources 12 to emit beams at different times.

[0053] In the above-mentioned embodiments, the number of radiation sources 11 and sub-light sources 12 in the radiation device 1 is not limited, and can be two, three or more. When the radiation device 1 includes at least three radiation sources 11, and / or the radiation source 11 includes at least three sub-light sources 12, it is more conducive to expanding the scanning range, improving the inspection accuracy, and making the radiation inspection system more suitable for large objects to be inspected.

[0054] In the aforementioned embodiments, the radiation device 1 of the scanning device 10 can be located on any side of the inspected object 5 , for example, on any side in the up-down direction H or on any side in the left-right direction W.

[0055] See also Figure 1 When the radiation device 1 is located on one side of the up-down direction H of the inspected object 5, the radiation device 1 performs a top or bottom viewing angle scan on the inspected object 5, and the relative arrangement direction of the radiation device 1 and the inspected object 5 is the up-down direction H. In this case, the first direction X can be along the front-to-back direction L or inclined relative to the front-to-back direction L, and the second direction Y can be along the left-to-right direction W or inclined relative to the left-to-right direction W, so that each radiation source 11 of the radiation device 1 is arranged along the front-to-back direction L or in a direction inclined relative to the front-to-back direction L, and each sub-light source 12 in each radiation source 11 is arranged along the left-to-right direction W and in a direction inclined relative to the left-to-right direction W, and each radiation source 11 partially overlaps in the left-to-right direction W and in a direction inclined relative to the left-to-right direction W, and performs a larger range of scanning in the left-to-right direction W, so that the corresponding scanning device 10 can quickly and accurately complete the top or bottom viewing angle scan of the inspected object 5. Among them, when the first direction X and the second direction Y are respectively along the front-to-back direction L and the left-to-right direction W, the scanning direction of the radiation device 1 is perpendicular to the relative movement direction of the inspected object and the radiation inspection system (i.e., the front-to-back direction L); and when the first direction X and the second direction Y are respectively inclined relative to the front-to-back direction L and the left-to-right direction W, the scanning direction of the radiation device 1 forms an angle with the relative movement direction of the inspected object 5 and the radiation inspection system, and is relatively inclined, and the corresponding inclination angle can be adjusted to adapt to the relative movement speed of the inspected object 5 and the inspection system in the front-to-back direction L.

[0056] Also, see Figure 1When the radiation device 1 is located on one side of the left-right direction W of the inspected object 5, the radiation device 1 performs a side-angle scan on the inspected object 5, and the relative arrangement direction of the radiation device 1 and the inspected object 5 is the left-right direction W. In this case, the first direction X can be along the front-to-back direction L or inclined relative to the front-to-back direction L, and the second direction Y can be along the up-down direction H or inclined relative to the up-down direction H, so that each radiation source 1 of the radiation device 1 is arranged along the front-to-back direction L or inclined relative to the front-to-back direction L, and each sub-light source 12 in each radiation source 11 is arranged along the up-down direction H or inclined relative to the up-down direction H, and each radiation source 11 partially overlaps in the up-down direction H or in a direction inclined relative to the up-down direction H, and performs a larger range of scanning in the up-down direction H, so that the corresponding scanning device 10 can quickly and accurately complete the side-angle scan of the inspected object 5. Among them, when the first direction X and the second direction Y are respectively along the front-to-back direction L and the up-to-down direction H, the scanning direction of the radiation device 1 is perpendicular to the relative movement direction of the inspected object and the radiation inspection system (i.e., the front-to-back direction L); and when the first direction X and the second direction Y are respectively inclined relative to the front-to-back direction L and the up-to-down direction H, the scanning direction of the radiation device 1 forms an angle with the relative movement direction of the inspected object 5 and the radiation inspection system, and is relatively inclined, and the corresponding inclination angle can be adjusted to adapt to the relative movement speed of the inspected object 5 and the inspection system in the front-to-back direction L.

[0057] In the aforementioned embodiments, the scanning device 10 performs a backscatter scan on the inspected object 5, which may be a transmission scan. When the scanning device 1 performs a backscatter scan on the inspected object 5, the detection device 2 includes a backscatter detector 21, which cooperates with the radiation device 1 to perform a backscatter scan on the inspected object 5. When the scanning device 10 performs a backscatter scan on the inspected object 5, the detection device 2 includes a transmission detector (not shown), which cooperates with the radiation device 1 to perform a transmission scan on the inspected object 5. Of course, in some embodiments, the detection device 2 may include both the backscatter detector 21 and the transmission detector, so that the scanning device 10 performs both a backscatter scan and a transmission scan on the inspected object 5, so as to further improve the inspection accuracy.

[0058] In addition, in the above-mentioned embodiments, the number of scanning devices 10 in the radiation inspection system is not limited, and can be one, two, three or more. Figure 1 When the radiation inspection system includes at least two scanning devices 10, the radiation devices 1 of the at least two scanning devices 10 can be arranged on different sides of the inspected object 5. In this way, the inspected object 5 can be scanned and inspected from at least two viewing angles, the inspection is more comprehensive, and the inspection accuracy can be further improved.

[0059] Next, combine Figure 1-Figure 3 The embodiments shown are used to further introduce the present application.

[0060] like Figure 1 As shown, in this embodiment, the radiation inspection system includes three scanning devices 10, which are respectively arranged at the top, left side and right side of the inspection channel 4 to respectively detect the object to be inspected 5 (such as a vehicle) located in the inspection channel 4 from top perspectives, left perspectives and right perspectives.

[0061] Depend on Figure 1 It can be seen that, in this embodiment, each scanning device 10 includes a radiation device 1, a detection device 2 and a collimator 3, and the detection device 2 and the radiation device 1 are located on the same side of the inspection channel 4, and each includes two backscatter detectors 21 arranged on opposite sides of the radiation device 1, so as to cooperate with the radiation device 1 and the collimator 3 to perform backscatter scanning on the object under inspection 5.

[0062] During operation, the radiation emitted by the radiation device 1 is collimated by the collimator 3, and then reflected by the object 5 in the inspection channel 4. The reflected radiation is received by the two backscatter detectors 21 and converted into electrical signals that can be recorded to generate a backscatter image.

[0063] Figure 2 The structure of the radiation device 1 in this embodiment is further shown. Figure 2 As shown, in this embodiment, the radiation device 1 of each scanning device 10 includes two radiation sources 11, which are arranged side by side along the first direction X, and each includes a plurality of (four are taken as an example in the figure) sub-light sources 12 arranged at intervals along the second direction Y, and the two radiation sources 11 of the same radiation device 1 are staggered in the second direction Y to form an overlapping area 13, and there is only one pair of sub-light sources 12 in the overlapping area 13 that are collinear in the first direction X.

[0064] Specifically, Figure 1 and Figure 2 As shown, in this embodiment, the radiation device 1 located at the top of the inspection channel 4 has two radiation sources 11 arranged side by side along the front-to-back direction L, and both are radiation tubes including a plurality of (four in the figure are used as an example) sub-light sources 12 arranged at intervals along the left-right direction W, and the two radiation sources 11 are staggered in the left-right direction W to form an overlapping area 13, and there is only one pair of sub-light sources 12 in the overlapping area 13 that are collinear in the front-to-back direction L. In this way, the radiation device 1 correspondingly located at the top of the inspection channel 4 can perform a large range of scanning in the left-to-right direction W, and the risk of missed scanning is low, and a more accurate and efficient top-view backscatter scanning process can be achieved.

[0065] The radiation device 1 located on the left or right side of the inspection channel 4 has two radiation sources 11 arranged side by side along the front-to-back direction L, and both are radiation tubes including a plurality of (four in the figure as an example) sub-light sources 12 arranged at intervals along the up-down direction H, and the two radiation sources 11 are staggered in the up-down direction H to form an overlapping area 13, and there is only one pair of sub-light sources 12 in the overlapping area 13 that are collinear in the front-to-back direction L. In this way, the radiation device 1 located on the left or right side of the inspection channel 4 can perform a larger range of scanning in the up-down direction H with a lower risk of missed scanning, and can achieve a more accurate and efficient side-view backscatter scanning process.

[0066] In this embodiment, each sub-light source 12 is a pulse light source, and each sub-light source 12 does not emit beams at the same time, but emits beams in a time-sharing (or staggered) manner. Specifically, in this embodiment, each sub-light source 12 emits beams in sequence according to a preset order. In this way, there will be no mutual interference between different viewing angles and between different sub-light sources 12 at the same viewing angle, and scanning inspection of the object under inspection 5 can be successfully achieved.

[0067] Figure 3 The structure of the collimator 3 in this embodiment is further shown. Figure 3 As shown, in this embodiment, the collimator 3 is provided with a collimation port 31 for collimating the rays emitted by the radiation device 1. Figure 3 It can be seen that in this embodiment, the collimation opening 31 is circular, and the collimation opening 31 on the collimator 3 corresponds to the sub-light sources 12 of the corresponding radiation device 1 one by one, so that the collimator 3 can collimate the rays emitted by each sub-light source 12 of the radiation device 1 into a pencil beam. Of course, as a variation, the collimation opening 31 can also be in a long slot shape or other shapes, and at least two sub-light sources 12 share one collimation opening 31.

[0068] It can be seen that the radiation inspection system of this embodiment can perform multi-view imaging, and the scanning range of each view is large, the risk of missed scanning is low, and an efficient and accurate scanning inspection process can be achieved. Therefore, it is particularly suitable for inspecting large objects.

[0069] The above description is only an exemplary embodiment of the present application and is not intended to limit the present application. Any modifications, equivalent substitutions, improvements, etc. made within the spirit and principles of the present application shall be included in the protection scope of the present application.

Claims

1. A radiation inspection system, characterized in that: include: A scanning device (10) comprises a radiation device (1) and a detection device (2), wherein the radiation device (1) and the detection device (2) cooperate with each other to scan an object to be inspected (5), wherein the radiation device (1) is located on one side of the object to be inspected (5) and comprises at least two radiation sources (11), wherein the at least two radiation sources (11) of the radiation device (1) are arranged along a first direction (X) and each comprises at least two sub-light sources (12) arranged at intervals along a second direction (Y), wherein the first direction (X) and the second direction (Y) are perpendicular to each other and intersect with a relative arrangement direction of the radiation device (1) and the object to be inspected (5), and wherein any two adjacent radiation sources (11) in the at least two radiation sources (11) of the radiation device (1) in the first direction (X) partially overlap in the second direction (Y).

2. The radiation inspection system according to claim 1, characterized in that: The overlapping parts of any two adjacent radiation sources (11) in the first direction (X) in the second direction (Y) form an overlapping area (13), and the sub-light source (12) is arranged in the overlapping area (13).

3. The radiation inspection system according to claim 2, characterized in that: A pair of sub-light sources (12) collinear in the first direction (X) are provided in the overlapping area (13).

4. The radiation inspection system according to claim 3, characterized in that: The sub-light sources (12) that are collinear in the first direction (X) in the overlapping area (13) do not emit beams at the same time.

5. The radiation inspection system according to claim 1, characterized in that: Each sub-light source (12) of the radiation device (1) does not emit light beams at the same time.

6. The radiation inspection system according to claim 1, characterized in that: The scanning device (10) is configured as at least one of the following: The radiation device (1) comprises at least three radiation sources (11); The radiation source (11) comprises at least three sub-light sources (12); The sub-light source (12) is a pulse light source.

7. The radiation inspection system according to claim 1, characterized in that: The radiation device (1) is located on one side of the inspected object (5) in the up-down direction (H), the first direction (X) is along the front-to-back direction (L) or is inclined relative to the front-to-back direction (L), and the second direction (Y) is along the left-to-right direction (W) or is inclined relative to the left-to-right direction (W); and / or the radiation device (1) is located on one side of the inspected object (5) in the left-to-right direction (W), the first direction (X) is along the front-to-back direction (L) or is inclined relative to the front-to-back direction (L), and the second direction (Y) is along the up-down direction (H) or is inclined relative to the up-to-down direction (H).

8. The radiation inspection system according to claim 1, characterized in that: The detection device (2) comprises a backscatter detector (21), and the backscatter detector (21) cooperates with the radiation device (1) to perform a backscatter scan on the object to be inspected (5); and / or the detection device (2) comprises a transmission detector, and the transmission detector cooperates with the radiation device (1) to perform a transmission scan on the object to be inspected (5).

9. The radiation inspection system according to any one of claims 1 to 8, characterized in that: The radiation inspection system comprises at least two scanning devices (10), wherein the radiation devices (1) of the at least two scanning devices (10) are arranged on different sides of the inspected object (5).

10. The radiation inspection system according to claim 9, characterized in that: The radiation inspection system comprises at least three scanning devices (10).

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