Throughput testing method and device, storage medium and computer equipment

Abstract

The invention provides a throughput test method and device, a storage medium and computer equipment, and the method comprises the steps: responding to the triggering operation of a plurality of radio frequency test selection controls corresponding to a plurality of radio frequency test functions displayed in a test function interface, and displaying preset frequency band information corresponding to each selected radio frequency test function; in response to a selection operation for the frequency band preset information of the current test function, generating a test instruction of the current test function based on target frequency band information selected for the current test function; wherein the current test function is a radio frequency test function corresponding to any selected radio frequency test selection control; and sending the test instruction of each radio frequency test function to a comprehensive test instrument, and controlling the comprehensive test instrument to carry out throughput test on the to-be-tested equipment according to each test instruction to obtain a throughput test result corresponding to each radio frequency test function by the to-be-tested equipment. The method is used for achieving the effect of improving the throughput testing efficiency.

Description

Technical Field

[0001] The present application relates to the field of radio frequency testing technology, and in particular to a throughput testing method, device, storage medium, and computer equipment. Background Art

[0002] With the development of mobile smart technology, mobile terminals have become one of the indispensable devices in daily life. For mobile terminals, communication and other functions are usually realized through radio frequency technology. With the development of radio frequency technology, more and more radio frequency technologies are applied to mobile terminals. For example, more and more frequency bands including 2G, 3G, 4G, and 5G are included. In this way, there are thousands of frequency bands that need to be tested for mobile terminals.

[0003] In the related art, the test focus is mainly placed on the throughput test of the mobile terminal, and the throughput test of the mobile terminal is mainly achieved through a manual test mode.

[0004] However, the applicant discovered during the implementation process that the related technology has the problem of low throughput test efficiency. Summary of the invention

[0005] Based on this, the purpose of this application is to solve at least one of the above-mentioned technical defects, especially the technical defect of low throughput test efficiency in the prior art. This application provides a throughput test method, device, storage medium, and computer equipment.

[0006] In a first aspect, the present application provides a throughput test method, which is applied to a host computer of a throughput test system, wherein the throughput test system further includes a comprehensive tester and a device to be tested, and the host computer is connected to the comprehensive tester and the device to be tested respectively; the method includes:

[0007] In response to triggering operations of multiple RF test selection controls corresponding to multiple RF test functions displayed in the test function interface, preset frequency band information corresponding to each selected RF test function is displayed;

[0008] In response to the selection operation of the frequency band preset information for the current test function, a test instruction for the current test function is generated based on the target frequency band information selected for the current test function; wherein the current test function is the radio frequency test function corresponding to any selected radio frequency test selection control;

[0009] The test instructions of each RF test function are sent to the comprehensive tester, and the comprehensive tester is controlled to perform a throughput test on the device under test according to each test instruction, so as to obtain a throughput test result corresponding to each RF test function of the device under test.

[0010] In one embodiment, in response to a triggering operation of multiple RF test selection controls corresponding to multiple RF test functions displayed in a test function interface, preset frequency band information corresponding to each selected RF test function is displayed, including:

[0011] In response to triggering operations on multiple RF test selection controls in sequence in the test function interface, preset frequency band information of multiple RF test functions corresponding to the multiple RF test selection controls is displayed in sequence in the test function interface.

[0012] In one embodiment, in response to a selection operation of preset frequency band information for a current test function, a test instruction for the current test function is generated based on target frequency band information selected for the current test function, including:

[0013] In response to a selection operation of preset frequency band information for a current test function, displaying selected target frequency band information;

[0014] In response to a trigger operation of starting a test control displayed in the test function interface, a test instruction for each radio frequency test function is generated based on target frequency band information of each radio frequency test function.

[0015] In one embodiment, in response to a selection operation of preset frequency band information for a current test function, displaying selected target frequency band information includes:

[0016] In response to a selection operation of the first frequency band preset information in the test function interface, displaying the first target frequency band information selected for the current test function;

[0017] In response to the triggering operation of the test plan adding control displayed in the test function interface, and the selection operation of the added frequency band information, the target frequency band information added for the current test function is displayed.

[0018] In one embodiment, controlling the comprehensive tester to perform a throughput test on the device under test according to each test instruction includes:

[0019] The control integrated tester performs throughput tests on the devices to be tested in sequence using various test instructions in the order of adding operations.

[0020] In one embodiment, the method further comprises:

[0021] In response to a triggering operation of a report generation control displayed in the test function interface, a throughput test report for the device to be tested is generated based on the throughput test result.

[0022] In one embodiment, the method further comprises:

[0023] In response to a trigger operation of starting a test control displayed in the test function interface, test progress information of a throughput test on the device under test is displayed in the test function interface.

[0024] In one embodiment, the method further comprises:

[0025] In response to the communication connection detection control displayed in the test function interface, determine the connection status between the host computer and the comprehensive tester;

[0026] When the connection status indicates that the connection is not connected, the communication signal light of the control tester is always on.

[0027] In a second aspect, the present application provides a throughput test device, which is applied to a host computer of a throughput test system. The throughput test system also includes a comprehensive tester and a device to be tested. The host computer is connected to the comprehensive tester and the device to be tested respectively. The device includes:

[0028] A radio frequency selection response module, for responding to the triggering operation of multiple radio frequency test selection controls corresponding to multiple radio frequency test functions displayed in the test function interface, and displaying the preset frequency band information corresponding to each selected radio frequency test function;

[0029] A frequency band selection response module, for responding to a selection operation of frequency band preset information for a current test function, and generating a test instruction for the current test function based on target frequency band information selected for the current test function; wherein the current test function is a radio frequency test function corresponding to any selected radio frequency test selection control;

[0030] The instruction sending module is used to send the test instructions of each RF test function to the comprehensive tester, and control the comprehensive tester to perform throughput test on the device under test according to each test instruction to obtain the throughput test results corresponding to each RF test function of the device under test.

[0031] In a third aspect, the present application provides a computer device, including a memory and a processor, wherein the memory stores a computer program, and the processor implements the steps of the above method when executing the computer program.

[0032] In a fourth aspect, the present application provides a computer-readable storage medium having a computer program stored thereon, which implements the steps of the above method when the computer program is executed by a processor.

[0033] In a fifth aspect, the present application provides a computer program product, including a computer program, which implements the steps of the above method when executed by a processor.

[0034] It can be seen from the above technical solutions that the embodiments of the present application have the following advantages:

[0035] The throughput test method, device, storage medium, and computer equipment provided by the present application, by displaying multiple RF test selection controls corresponding to multiple RF test functions in the test function interface, the user can choose to trigger one or more RF test selection controls, and the preset frequency band information corresponding to each selected RF test function can be displayed in the test function interface to provide the preset frequency band information for the user to select. In response to the user's selection operation of the target frequency band information of the RF test function, a test instruction of the RF test function is generated, and the comprehensive tester is controlled to perform a throughput test on the device to be tested according to each test instruction. Compared with traditional technologies, the present application can realize automated throughput testing through the above steps, and can complete a large number of test tasks, and can also arbitrarily combine and match different test conditions, thereby improving the efficiency of throughput testing. BRIEF DESCRIPTION OF THE DRAWINGS

[0036] In order to more clearly illustrate the embodiments of the present application or the technical solutions in the prior art, the drawings required for use in the embodiments or the description of the prior art will be briefly introduced below. Obviously, the drawings described below are only some embodiments of the present application. For ordinary technicians in this field, other drawings can be obtained based on these drawings without paying creative labor.

[0037] Figure 1 A schematic diagram of the structure of a throughput test system provided in an embodiment of the present application;

[0038] Figure 2 A flow chart of a throughput test method provided in an embodiment of the present application Figure 1 ;

[0039] Figure 3 A flow chart of a throughput test method provided in an embodiment of the present application Figure 2 ;

[0040] Figure 4 A flow chart of a throughput test method provided in an embodiment of the present application Figure 3 ;

[0041] Figure 5 A flow chart of a throughput test method provided in an embodiment of the present application Figure 4 ;

[0042] Figure 6 A schematic diagram of the structure of a test function interface of a host computer provided in an embodiment of the present application;

[0043] Figure 7 A schematic diagram of the structure of a throughput test device provided in an embodiment of the present application;

[0044] Figure 8A schematic diagram of the internal structure of a computer device provided in an embodiment of the present application. DETAILED DESCRIPTION

[0045] The following will be combined with the drawings in the embodiments of the present application to clearly and completely describe the technical solutions in the embodiments of the present application. Obviously, the described embodiments are only part of the embodiments of the present application, not all of the embodiments. Based on the embodiments in the present application, all other embodiments obtained by ordinary technicians in this field without creative work are within the scope of protection of this application.

[0046] With the development of mobile smart technology, mobile terminals have become one of the indispensable devices in daily life. For mobile terminals, communication and other functions are usually realized through radio frequency technology. With the development of radio frequency technology, more and more radio frequency technologies are applied to mobile terminals. For example, more and more frequency bands including 2G, 3G, 4G, and 5G are included. In this way, there are thousands of frequency bands that need to be tested for mobile terminals.

[0047] In the related technologies, the test focus is mainly on the throughput test of mobile terminals, and the throughput test of mobile terminals is mainly achieved through manual testing. However, the current testing of data throughput of mobile terminals has the following technical problems: multiple frequency bands, heavy workload, no automated software; long test time, occupying test resources; cumbersome test steps; difficult to unify standards, affecting the result judgment.

[0048] Based on this, the present application provides a throughput test method, device, storage medium, and computer equipment, which can realize automated throughput testing, complete a large number of test tasks, and arbitrarily combine and match different test conditions, thereby improving the efficiency of throughput testing, mainly solving the problem of low throughput test efficiency in related technologies. While achieving improved efficiency, it can also solve the various technical problems mentioned above.

[0049] In an exemplary embodiment, Figure 1 This is a schematic diagram of the structure of the throughput test system provided in the embodiment of the present application. Figure 1 As shown, the throughput test system includes a host computer 101, a comprehensive tester 102 and a device under test 103, wherein the host computer 101 is respectively connected to the comprehensive tester 102 and the device under test 103. The device under test 103 may be a mobile terminal, which may include a mobile phone.

[0050] Exemplarily, the host computer 101 is used to control the comprehensive tester 102 to perform a throughput test on the device under test 103. For example, parameters for the throughput test can be set on the host computer 101, and the host computer 101 transmits a test instruction to the comprehensive tester 102 to control the comprehensive tester 102 to test the device under test 103.

[0051] In an exemplary embodiment, Figure 2 A flow chart of a throughput test method provided in an embodiment of the present application Figure 1 ,like Figure 2 As shown, this embodiment applies this method to Figure 1 The host computer in the example is used for illustration. It can be understood that the method can also be applied to a server, and can also be applied to a system including a terminal and a server, and is implemented through the interaction between the terminal and the server. In this embodiment, the method includes the following S201 to S203. Among them:

[0052] S201. In response to a triggering operation of a plurality of RF test selection controls corresponding to a plurality of RF test functions displayed in a test function interface, preset frequency band information corresponding to each selected RF test function is displayed.

[0053] Among them, the host computer may be a terminal. The test function interface may be a function interface displayed by the host computer, for example, it may be the interface of a certain application (software). The RF test function may refer to a preset function of the RF frequency band to be tested, for example, it may be a 2G / 3G test, an LTE test, an LTE-A test, etc. The trigger operation may refer to an operation of triggering the RF test selection control, for example, clicking the RF test selection control with a mouse to trigger the RF test selection control. The RF test selection control may refer to a control set in the test function interface, and multiple RF test selection controls may be set according to multiple RF test functions. By triggering the RF test selection control, the test of the corresponding RF test function may be entered.

[0054] Exemplarily, the host computer may be provided with a test function interface, and the host computer may display multiple RF test selection controls corresponding to multiple RF test functions in the test function interface. The user may trigger any one or more RF test selection controls in the test function interface to enter the test of the corresponding RF test function.

[0055] The terminal can display the preset frequency band information corresponding to each selected RF test function in the test function interface in response to the selection operation of one or more RF test selection controls. For example, the test function interface displays a selection area for the RF test function, and multiple RF test selection controls are displayed in the selection area; the test function interface of the host computer can also display a frequency band display area, and the preset frequency band information corresponding to each selected RF test function is displayed in the frequency band selection area for the user to select.

[0056] For example, when the user selects the 2G / 3G test, the host computer can synchronously display the test frequency band of the comprehensive tester to the test function interface of the host computer in response to the trigger operation of the 2G / 3G test selection control, and can also synchronize the setting information of the comprehensive tester to the test function interface of the host computer. For example, the preset frequency band information that can be tested in the comprehensive tester can be displayed in the test function interface of the host computer, so that the user can select the frequency band information for testing.

[0057] S202. In response to a selection operation of preset frequency band information for a current test function, a test instruction for the current test function is generated based on target frequency band information selected for the current test function; wherein the current test function is a radio frequency test function corresponding to any selected radio frequency test selection control.

[0058] The target frequency band information may refer to the selected frequency band information. The current test function may be any one of a plurality of radio frequency test functions, that is, the implementation method for the current test function provided in this embodiment may be applied to any radio frequency test function. The test instruction may refer to an instruction for controlling the comprehensive tester to perform a test.

[0059] Exemplarily, the user can trigger the selection operation for the frequency band preset information in the test function interface, and select the frequency band preset information of the current test function. For the frequency band preset information of any RF test function, the host computer can determine the selected target frequency band information in response to the selection operation for the frequency band preset information, and can generate a test instruction based on the target frequency band information. The test instruction can be used to instruct the comprehensive tester to perform a test of the corresponding RF test function.

[0060] Optionally, the host computer may display a display area for the selected target frequency band information in the test function interface. In response to the selection operation of the frequency band preset information for the current test function, the host computer may display the selected target frequency band information in the display area of ​​the target frequency band information so that the user can confirm whether the correct frequency band information is selected.

[0061] For example, the user can select the frequency band / channel / bandwidth to be tested in the frequency band display area, and the host computer can display the selected frequency band / channel / bandwidth in the selected display area. And when multiple RF test functions are selected for testing, the host computer can display the test plans of the multiple RF test functions one by one in the task plan display area. For example, the target frequency band information of each RF test function can be displayed one by one in the task plan display area, and the test order of multiple RF test functions can be displayed, wherein the test order can be obtained according to the planned order, such as the test order of multiple RF test functions can be determined according to the sorting order of the target frequency band information of the multiple RF test functions.

[0062] S203: Send the test instructions of each RF test function to the comprehensive tester, and control the comprehensive tester to perform a throughput test on the device under test according to each test instruction, so as to obtain a throughput test result corresponding to each RF test function of the device under test.

[0063] The throughput test may refer to a throughput test performed on a frequency band selected for each radio frequency test, etc. The throughput test result may be test data generated by a comprehensive tester.

[0064] For example, after starting the throughput test, the host computer can send the test instructions corresponding to each RF test function to the comprehensive tester, and control the comprehensive tester to perform the throughput test of the corresponding RF test function of the device under test according to the test instructions. In addition, the host computer can obtain the throughput test results corresponding to each RF test function performed on the device under test.

[0065] Optionally, the host computer can send the test instructions of each RF test function to the comprehensive tester in the order in which the tests are required. The comprehensive tester can use the test instructions in sequence according to the test order in the test plan to perform throughput tests on the device under test, and obtain the throughput test results corresponding to each RF test function of the device under test, and the host computer can obtain the throughput test results returned by the comprehensive tester.

[0066] For example, a control for starting the test may be provided in the test function interface of the host computer. The host computer may respond to the user triggering the operation of starting the test control. The host computer may send the test instructions of each RF test function to the integrated tester according to the test plan. The integrated tester may perform a throughput test on the device under test using each test instruction in accordance with the test sequence set in the test plan.

[0067] In this embodiment, by displaying multiple RF test selection controls corresponding to multiple RF test functions in the test function interface, the user can choose to trigger one or more RF test selection controls, and the preset frequency band information corresponding to each selected RF test function can be displayed in the test function interface to provide the preset frequency band information for the user to select. By responding to the user's selection operation on the target frequency band information of the RF test function, a test instruction of the RF test function is generated, and the comprehensive tester is controlled to perform a throughput test on the device under test according to each test instruction. Compared with traditional technologies, the present application can realize automated throughput testing through the above steps, and can complete a large number of test tasks, and can arbitrarily combine and match different test conditions, thereby improving the efficiency of throughput testing.

[0068] In an exemplary embodiment, in response to a triggering operation of multiple RF test selection controls corresponding to multiple RF test functions displayed in a test function interface, preset frequency band information corresponding to each selected RF test function is displayed, including:

[0069] In response to triggering operations on multiple RF test selection controls in sequence in the test function interface, preset frequency band information of multiple RF test functions corresponding to the multiple RF test selection controls is displayed in sequence in the test function interface.

[0070] Exemplarily, when the user selects to trigger multiple RF test selection controls, the host computer can display the preset frequency band information of the corresponding multiple RF test functions one by one in response to the user's triggering operations on the multiple RF test selection controls in sequence.

[0071] For example, when the user triggers the first RF test selection control, the host computer can display the preset frequency band information of the RF test function corresponding to the first RF test selection control, and the user can select the preset frequency band information to be tested, and the host computer can display the target frequency band information of the RF test function corresponding to the first RF test selection control.

[0072] When the user triggers the second RF test selection control, the host computer can display the preset frequency band information of the RF test function corresponding to the second RF test selection control, and the user can select the preset frequency band information to be tested. At this time, the user can also choose not to select and continue to trigger the third RF test selection control. In this way, the RF test function corresponding to the triggered second RF test selection control will not be tested. In this way, any switching operation of the control can be realized without affecting the function selection that the user needs to test.

[0073] In the present embodiment, by responding to the triggering operation of multiple RF test selection controls in sequence in the test function interface, the preset frequency band information of multiple RF test functions corresponding to the multiple RF test selection controls can be displayed one by one in sequence in the test function interface, thereby ensuring the possibility for the user to test the RF test function corresponding to each RF test selection control, which is facilitating any combination of user tests and improving the efficiency of throughput testing.

[0074] In an exemplary embodiment, Figure 3 A flow chart of a throughput test method provided in an embodiment of the present application Figure 2 ,like Figure 3 As shown, in Figure 2On the basis of the above, step S202 in the throughput test method is described in detail. In step S202, in response to the selection operation of the frequency band preset information for the current test function, based on the target frequency band information selected for the current test function, a test instruction for the current test function is generated, including S301 to S302, wherein:

[0075] S301, in response to a selection operation of preset frequency band information for a current test function, displaying selected target frequency band information;

[0076] S302: In response to a trigger operation of starting a test control displayed in a test function interface, a test instruction for each radio frequency test function is generated based on target frequency band information of each radio frequency test function.

[0077] The start test control may refer to a button for triggering the start test.

[0078] Exemplarily, the test function interface may be provided with a display area selection and a test start control. The host computer may respond to the operation of selecting the frequency band preset information in the frequency band display area in the test function interface, and display the selected target frequency band information in the frequency band preset information. In this way, the user can check whether the frequency band information to be tested is selected, thereby ensuring the correctness of the throughput test.

[0079] After the user has selected the frequency band information to be tested, the test control can be triggered. The host computer can respond to the user's triggering operation of the test control and start the throughput test of the device under test through the comprehensive tester. For each RF test function, the host computer can generate a test instruction corresponding to the RF test function based on the target frequency band information of the RF test function. The test instruction can be an instruction provided by the comprehensive tester, that is, the comprehensive tester can process the instruction to ensure the correctness of the throughput test of the device under test.

[0080] In this embodiment, the accuracy of the test is ensured by displaying the selected target frequency band information in the test function interface, and by responding to the trigger operation of the start test control in the test function interface, the test instructions of each RF test function can be generated based on the target frequency band information of each RF test function, thereby ensuring the effectiveness of controlling the comprehensive tester to perform throughput testing, thereby realizing automated throughput testing and improving the efficiency of throughput testing.

[0081] Optionally, Figure 4 A flow chart of a throughput test method provided in an embodiment of the present application Figure 3 ,like Figure 4 As shown, in Figure 3Based on the above, step S301 in the throughput test method is described in detail. In step S301, in response to the selection operation of the preset frequency band information for the current test function, the selected target frequency band information is displayed, including S401 to S402, wherein:

[0082] S401. In response to a selection operation on first frequency band preset information in a test function interface, displaying first target frequency band information selected for a current test function.

[0083] S402. In response to the triggering operation of the test plan adding control displayed in the test function interface and the selection operation of the added frequency band information, the target frequency band information added for the current test function is displayed.

[0084] The test plan adding control may refer to a button for adding a test plan.

[0085] Exemplarily, the host computer responds to the triggering operation of the radio frequency test selection control in the test function interface, and displays a plurality of frequency band preset information in the frequency band display area in the test function interface. The terminal responds to the selection operation of the frequency band preset information and displays the first target frequency band information selected for the current test function in the selected display area. The host computer can also respond to the triggering operation of the test plan adding control in the test function interface to add a test plan, and again respond to the selection operation of the frequency band preset information to display the added target frequency band information in the display area. For example, select a frequency band preset information to add to the test plan, and then add a test plan for other frequency band preset information through the test plan adding control. During the execution process, the test plan can be tested in the order of addition.

[0086] In this embodiment, for the RF test functions that need to be tested, multiple test plans can be added through the test plan adding control. This is conducive to completing the throughput test of multiple frequency bands, thereby further improving the efficiency of the throughput test.

[0087] Optionally, combined Figure 4 In the embodiment, in the above step S203, controlling the comprehensive tester to perform a throughput test on the device under test according to each test instruction includes:

[0088] The control integrated tester performs throughput tests on the devices to be tested in sequence using various test instructions in the order of adding operations.

[0089] For example, select the frequency band / channel / bandwidth to be tested in the frequency band display area, and add the test plan control. The test plans will be displayed one by one in the task plan area, and multiple test plans can be established at the same time. During the throughput test, the host computer can control the comprehensive tester to perform throughput tests on the equipment under test one by one in the order of adding plans.

[0090] In this embodiment, the throughput test of the device under test is performed in sequence by controlling the comprehensive tester in the order of adding operations, which is beneficial to the accuracy of the test of the device under test and can ensure that multiple frequency band tests in the test plan are effectively completed, thereby improving the efficiency of the throughput test.

[0091] In an exemplary embodiment, Figure 5 A flow chart of a throughput test method provided in an embodiment of the present application Figure 4 ,like Figure 5 As shown, in Figure 2 Based on this, other steps of the throughput test method are described in detail. The method also includes S501 to S502, wherein:

[0092] S501. In response to a communication connection detection control displayed in a test function interface, determine a connection status between a host computer and a comprehensive tester.

[0093] S502. When the connection status indicates that the connection is not connected, the communication signal light of the control comprehensive tester is always on.

[0094] The communication connection detection control may refer to a button for detecting the communication connection status. The connection status may be used to indicate whether the communication connection is successful or failed.

[0095] Exemplarily, a communication connection detection control may be provided in the test function interface of the host computer. The user may trigger the communication connection detection control before starting the test. The host computer responds to the user's triggering operation of the communication connection detection control to obtain and determine the connection status between the host computer and the comprehensive tester; if the host computer is successfully connected to the comprehensive tester, the communication signal light of the comprehensive tester is controlled to be always on. It can be understood that if the communication signal light of the comprehensive tester is not on after the user triggers the communication connection detection control, it means that there is no connection between the host computer and the comprehensive tester.

[0096] For example, the application software for connecting to the comprehensive tester is installed on the PC. The PC and the comprehensive tester are connected using a network cable. The IP addresses are designed to be in the same network segment, such as the PC IP address is 192.168.20.1, and the host computer IP address is 192.168.20.3, so that the PC and the instrument maintain a communication connection. When the communication connection detection control is clicked, it automatically checks whether the PC and the instrument are in an interconnected state. If the connection is successful, the remote light on the instrument is on, otherwise it is off, indicating that the instrument is not connected.

[0097] In this embodiment, by responding to the communication connection detection control displayed in the test function interface, the connection status between the host computer and the comprehensive tester is determined, thereby ensuring the correct connection between the host computer and the comprehensive tester and ensuring the accuracy of the throughput test of the device under test, thereby improving the efficiency of the throughput test.

[0098] Alternatively, if Figure 5 As shown, the method further includes S503, wherein:

[0099] S503: In response to a trigger operation of starting a test control displayed in the test function interface, test progress information of a throughput test on the device under test is displayed in the test function interface.

[0100] The start test control may refer to a control for starting a test. The test progress information may include test log information, that is, log information and progress information during the test.

[0101] Exemplarily, the host computer can display a start test control and a test progress display area in the test function interface. After determining the test plan, the user can trigger the start test control to start the throughput test of the device under test. The host computer can control the comprehensive tester to perform a throughput test on the device under test in response to the user's trigger operation on the start test control, and the host computer can display the test progress information of the throughput test in the progress display area. In this way, it is helpful for the user to understand the test progress of the throughput test, and it is helpful for the user to judge whether the current test is normal. If the progress information shows abnormality, the user can choose to interrupt the test, thereby ensuring the accuracy of the throughput test.

[0102] For example, by clicking the start test control, the device under test can register on the integrated test instrument. The software of the host computer will send signaling instructions to the integrated test instrument according to the test plan. The integrated test instrument will automatically test the throughput value of the device under test according to the established test plan.

[0103] In this embodiment, by responding to the trigger operation of starting the test control, the test progress information of the throughput test of the device under test can be displayed in the progress display area in the test function interface, which is beneficial to ensure the accuracy of the throughput test and improve the efficiency of the throughput test.

[0104] Alternatively, if Figure 5 As shown, the method further includes S504, wherein:

[0105] S504: In response to a triggering operation of a report generation control displayed in the test function interface, a throughput test report for the device to be tested is generated based on the throughput test result.

[0106] The report generation control may refer to a control for generating a test report.

[0107] For example, the host computer may display a report generation control in the test function interface. After the throughput test is completed, the user may trigger the report generation control, and the host computer may generate a throughput test report of the throughput test of the device to be tested according to the throughput test result in response to the user's triggering operation on the report generation control.

[0108] For example, the software of the host computer can complete data recording by reading the data tested by the comprehensive tester.

[0109] In actual application, the throughput test report can be shown in Table 1. The throughput test report can include the tested frequency band, bandwidth, channel and other information. Click the report generation control, and the host computer software can automatically import the test data into the Excel report template.

[0110] Table 1 Throughput test report

[0111]

[0112] DL refers to the downlink rate, and UL refers to the uplink rate. The data in the blank rows of Table 1 are the data to be tested.

[0113] It can be understood that the above Table 1 is for illustration only and is not intended to limit the present application.

[0114] In an exemplary embodiment, Figure 6 A structural diagram of a test function interface of a host computer provided in an embodiment of the present application, such as Figure 6 As shown, the test function interface has a radio frequency test function selection area 610, a frequency band display area 620, a selection display area 630, a task plan area 640, a test progress display area 650, and a test log display area 660. The radio frequency test function selection area 610 may be provided with a plurality of radio frequency test selection controls, for example, 2G / 3G test, LTE test, LTE-A test, SA test, NSA test, NRCA test, MINO test, etc.

[0115] In addition, the test function interface is also provided with a start test control 670, a communication connection detection control 680, a report generation control 690, a test plan addition control 600, etc.

[0116] Exemplarily, the throughput test method in each of the above embodiments can be implemented through the function setting of the test function interface of the above host computer.

[0117] In this way, the throughput testing method provided in the embodiment of the present application can realize automated testing of throughput; the test strategy can be freely customized, the test is flexible, 2G / 3G / 4G / 5G can be tested in any combination, and various CA / ENDC / MIMO tests can be freely combined for testing; the test report can be automatically output; the efficiency of mobile phone throughput performance testing can be improved; MIMO and 5GNR tests, as well as multi-band ENDC combinations are added to the test, and the test coverage is wider.

[0118] The test frequency band information can be edited arbitrarily (more can be integrated on the software side), test combinations, and 5G NR CA and ENDC combinations can be matched arbitrarily. The conditions of multiple combinations can be met. Through the automated test software, the throughput applications of CA, ENDC, and MIMO can be increased, achieving full coverage of current mobile data services.

[0119] It should be understood that, although the various steps in the flowcharts involved in the above-mentioned embodiments are displayed in sequence according to the indication of the arrows, these steps are not necessarily executed in sequence according to the order indicated by the arrows. Unless there is a clear explanation in this article, the execution of these steps does not have a strict order restriction, and these steps can be executed in other orders. Moreover, at least a part of the steps in the flowcharts involved in the above-mentioned embodiments can include multiple steps or multiple stages, and these steps or stages are not necessarily executed at the same time, but can be executed at different times, and the execution order of these steps or stages is not necessarily to be carried out in sequence, but can be executed in turn or alternately with other steps or at least a part of the steps or stages in other steps.

[0120] The throughput testing device provided in the embodiment of the present application is described below. The throughput testing device and the above-mentioned throughput testing method have the same inventive concept. The implementation solution provided by the device to solve the problem is similar to the implementation solution recorded in the above-mentioned method. Therefore, the specific limitations in one or more throughput testing device embodiments provided below can refer to the limitations on the throughput testing method above. The throughput testing device described below and the throughput testing method described above can be referenced to each other, and will not be repeated here.

[0121] In an exemplary embodiment, Figure 7 A schematic diagram of a throughput test device provided in an embodiment of the present application is shown in FIG. Figure 7 As shown, the device is applied to the host computer of the throughput test system, the throughput test system also includes a comprehensive tester and a device to be tested, and the host computer is connected to the comprehensive tester and the device to be tested respectively; the throughput test device 70 includes: a radio frequency selection response module 710, a radio frequency selection response module 711 and an instruction sending module 730, wherein:

[0122] The RF selection response module 710 is used to respond to the triggering operation of multiple RF test selection controls corresponding to multiple RF test functions displayed in the test function interface, and display the preset frequency band information corresponding to each selected RF test function.

[0123] The frequency band selection response module 720 is used to respond to the selection operation of the frequency band preset information for the current test function, and generate a test instruction for the current test function based on the target frequency band information selected for the current test function; wherein the current test function is the RF test function corresponding to any selected RF test selection control.

[0124] The instruction sending module 730 is used to send the test instructions of each RF test function to the comprehensive tester, and control the comprehensive tester to perform a throughput test on the device under test according to each test instruction to obtain the throughput test results corresponding to each RF test function of the device under test.

[0125] In an exemplary embodiment, the radio frequency selection response module is used to respond to the triggering operation of multiple radio frequency test selection controls in sequence in the test function interface, and sequentially display the preset frequency band information of multiple radio frequency test functions corresponding to the multiple radio frequency test selection controls in the test function interface;

[0126] In an exemplary embodiment, the frequency band selection response module is used to display the selected target frequency band information in response to the selection operation of the frequency band preset information for the current test function; in response to the trigger operation of the start test control displayed in the test function interface, based on the target frequency band information of each RF test function, generate test instructions for each RF test function.

[0127] In an exemplary embodiment, the frequency band selection response module is used to select the first frequency band preset information and display the first target frequency band information selected for the current test function; in response to the trigger operation of the test plan adding control displayed in the test function interface and the selection operation of the added frequency band information, the target frequency band information added for the current test function is displayed.

[0128] In an exemplary embodiment, the instruction sending module is used to control the comprehensive tester to perform throughput tests on the devices to be tested in sequence using various test instructions in the order of adding operations.

[0129] In an exemplary embodiment, the apparatus further includes a report generating module.

[0130] The report generation module is used to generate a throughput test report for the device to be tested based on the throughput test result in response to a trigger operation of a report generation control displayed in the test function interface.

[0131] In an exemplary embodiment, the apparatus further includes a start-up response module.

[0132] The start test is used to respond to the trigger operation of the start test control displayed in the test function interface, and display the test progress information of the throughput test of the device under test in the test function interface.

[0133] In an exemplary embodiment, the apparatus further includes a connection detection module.

[0134] The connection detection module is used to respond to the communication connection detection control displayed in the test function interface to determine the connection status between the host computer and the comprehensive tester; when the connection status indicates that it is not connected, the communication signal light of the comprehensive tester is controlled to be always on.

[0135] In an exemplary embodiment, the present application also provides a computer-readable storage medium, in which a computer program is stored. When the computer program is executed by one or more processors, the one or more processors execute the steps of the throughput testing method in any of the above embodiments.

[0136] In an exemplary embodiment, the present application also provides a computer device having a computer program stored therein, wherein when the computer-readable instructions are executed by one or more processors, the one or more processors execute the steps of any throughput test method in the above embodiments.

[0137] In an exemplary embodiment, the present application further provides a computer program product, including a computer program, which implements the steps of any throughput testing method in the above embodiments when executed by a processor.

[0138] Indicatively, if Figure 8 As shown, Figure 8 This is a schematic diagram of the internal structure of a computer device provided in an embodiment of the present application. The computer device 800 may be provided as a server. Figure 8 The computer device 800 includes a processing component 802, which further includes one or more processors, and a memory resource represented by a memory 801 for storing instructions executable by the processing component 802, such as an application. The application stored in the memory 801 may include one or more modules, each corresponding to a set of instructions. In addition, the processing component 802 is configured to execute the instructions to perform the text recognition method of any of the above embodiments.

[0139] The computer device 800 may further include a power supply component 803 configured to perform power management of the computer device 800, a wired or wireless network interface 804 configured to connect the computer device 800 to a network, and an input / output (I / O) interface 805. The computer device 800 may operate based on an operating system stored in the memory 801, such as Windows Server TM, Mac OS X TM, Unix TM, Linux TM, Free BSD TM, or the like.

[0140] Those skilled in the art will understand that Figure 8 The structure shown in the figure is only a block diagram of a part of the structure related to the solution of the present application, and does not constitute a limitation on the computer device to which the solution of the present application is applied. The specific computer device may include more or fewer components than those shown in the figure, or combine certain components, or have a different arrangement of components.

[0141] It should be noted that the user information (including but not limited to user device information, user personal information, etc.) and data (including but not limited to data used for analysis, stored data, displayed data, etc.) involved in this application are all information and data authorized by the user or fully authorized by all parties, and the collection, use and processing of relevant data must comply with relevant regulations.

[0142] Finally, it should be noted that, in this article, relational terms such as first and second, etc. are only used to distinguish one entity or operation from another entity or operation, and do not necessarily require or imply any such actual relationship or order between these entities or operations. Moreover, the terms "include", "comprise" or any other variants thereof are intended to cover non-exclusive inclusion, so that a process, method, article or device including a series of elements includes not only those elements, but also other elements not explicitly listed, or also includes elements inherent to such process, method, article or device. In the absence of further restrictions, the elements defined by the sentence "comprise a ..." do not exclude the presence of other identical elements in the process, method, article or device including the elements.

[0143] The various embodiments in this specification are described in a progressive manner, and each embodiment focuses on the differences from other embodiments. The various embodiments can be combined as needed, and the same or similar parts can refer to each other.

[0144] The above description of the disclosed embodiments enables those skilled in the art to implement or use the present application. Various modifications to these embodiments will be apparent to those skilled in the art, and the general principles defined herein may be implemented in other embodiments without departing from the spirit or scope of the present application. Therefore, the present application will not be limited to the embodiments shown herein, but will conform to the widest scope consistent with the principles and novel features disclosed herein.

Claims

1. A throughput testing method, characterized in that: A host computer applied to a throughput test system, wherein the throughput test system further comprises a comprehensive tester and a device to be tested, wherein the host computer is connected to the comprehensive tester and the device to be tested respectively; and the method comprises: In response to a triggering operation of a plurality of RF test selection controls corresponding to a plurality of RF test functions displayed in the test function interface, the preset frequency band information corresponding to each selected RF test function is displayed; In response to a selection operation of frequency band preset information for a current test function, a test instruction for the current test function is generated based on target frequency band information selected for the current test function; wherein the current test function is a radio frequency test function corresponding to any selected radio frequency test selection control; The test instructions of each of the radio frequency test functions are sent to the comprehensive tester, and the comprehensive tester is controlled to perform a throughput test on the device under test according to each of the test instructions, so as to obtain a throughput test result corresponding to each of the radio frequency test functions of the device under test.

2. The method according to claim 1, characterized in that: The method of displaying preset frequency band information corresponding to each selected radio frequency test function in response to triggering operations of multiple radio frequency test selection controls corresponding to multiple radio frequency test functions displayed in the test function interface includes: In response to triggering operations on the plurality of RF test selection controls in sequence in the test function interface, preset frequency band information of the plurality of RF test functions corresponding to the plurality of RF test selection controls is displayed in sequence in the test function interface.

3. The method according to claim 1, characterized in that The step of generating a test instruction for the current test function based on target frequency band information selected for the current test function in response to a selection operation for preset frequency band information for the current test function includes: In response to a selection operation of preset frequency band information for the current test function, displaying selected target frequency band information; In response to a trigger operation of starting a test control displayed in the test function interface, a test instruction for each of the radio frequency test functions is generated based on target frequency band information of each of the radio frequency test functions.

4. The method according to claim 3, characterized in that The displaying of the selected target frequency band information in response to the selection operation of the frequency band preset information of the current test function includes: In response to a selection operation on the first frequency band preset information in the test function interface, displaying the first target frequency band information selected for the current test function; In response to the triggering operation of the test plan adding control displayed in the test function interface and the selection operation of the added frequency band information, the target frequency band information added for the current test function is displayed.

5. The method according to claim 4, characterized in that The controlling the comprehensive tester to perform a throughput test on the device under test according to each of the test instructions includes: The comprehensive tester is controlled to perform throughput test on the device under test in sequence by using each of the test instructions according to the order of the adding operation.

6. The method according to any one of claims 1 to 5, characterized in that: The method further comprises: In response to a triggering operation of a report generation control displayed in the test function interface, a throughput test report for the device to be tested is generated based on the throughput test result.

7. The method according to any one of claims 1 to 5, characterized in that: The method further comprises: In response to a trigger operation of starting a test control displayed in the test function interface, test progress information of a throughput test performed on the device under test is displayed in the test function interface.

8. The method according to any one of claims 1 to 5, characterized in that: The method further comprises: In response to the communication connection detection control displayed in the test function interface, determining the connection status between the host computer and the comprehensive tester; When the connection status indicates that the connection is not connected, the communication signal light of the comprehensive tester is controlled to be always on.

9. A throughput testing device, characterized in that: A host computer applied to a throughput test system, wherein the throughput test system further comprises a comprehensive tester and a device to be tested, wherein the host computer is connected to the comprehensive tester and the device to be tested respectively; the device comprises: A radio frequency selection response module, for responding to the triggering operation of multiple radio frequency test selection controls corresponding to multiple radio frequency test functions displayed in the test function interface, and displaying the preset frequency band information corresponding to each selected radio frequency test function; A frequency band selection response module, for responding to a selection operation of frequency band preset information for a current test function, and generating a test instruction for the current test function based on target frequency band information selected for the current test function; wherein the current test function is a radio frequency test function corresponding to any selected radio frequency test selection control; The instruction sending module is used to send the test instructions of each of the radio frequency test functions to the comprehensive tester, and control the comprehensive tester to perform a throughput test on the device under test according to each of the test instructions to obtain the throughput test results corresponding to each of the radio frequency test functions of the device under test.

10. A computer device comprising a memory and a processor, wherein the memory stores a computer program, characterized in that: When the processor executes the computer program, the steps of the method according to any one of claims 1 to 8 are implemented.

11. A computer-readable storage medium having a computer program stored thereon, characterized in that: When the computer program is executed by a processor, the steps of the method according to any one of claims 1 to 8 are implemented.

12. A computer program product, comprising a computer program, characterized in that When the computer program is executed by a processor, the steps of the method according to any one of claims 1 to 8 are implemented.

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