Stainless steel bottom cover polishing roughness detection method, detection device and system

Abstract

The present invention relates to the field of data processing technology, and in particular to a method, a detection device and a system for detecting the polishing roughness of a stainless steel bottom cover, the method comprising: obtaining height data of each detection point on the surface of the stainless steel bottom cover; determining the contour points of the stainless steel bottom cover, drawing straight lines along the direction of the trend vectors of all the contour points, obtaining the intersection points of each straight line, and taking the average of the positions of all the intersection points as the center position of the stainless steel bottom cover; determining the co-location sequence of the stainless steel bottom cover; determining the engraving point evaluation of each detection point in the current co-location sequence; recording all detection points with engraving point evaluation greater than a first threshold as engraving points; eliminating the engraving points and detection points whose height data do not meet the preset requirements of the stainless steel bottom cover surface, and determining the roughness of the stainless steel bottom cover according to the height data of the remaining detection points on the stainless steel bottom cover surface. The present invention improves the detection accuracy of the quality of the stainless steel bottom cover.

Description

Technical Field

[0001] The present invention relates to the technical field of data processing, and in particular to a method, a device and a system for detecting the polishing roughness of a stainless steel bottom cover. Background Art

[0002] The stainless steel bottom cover is a common mechanical component, widely used in various equipment and products, such as watches, pressure vessels, electronic equipment housings, etc. It is usually made of stainless steel material, which has the characteristics of corrosion resistance, high strength, beautiful appearance and durability. For the bottom cover of the watch case, the bottom cover not only plays a role in protecting the watch movement and other internal components, but is also usually closely related to the appearance design of the watch. For the stainless steel bottom cover, bottom cover polishing is an important step to improve the appearance quality of the watch case. In addition to improving the overall beauty of the case, the smooth bottom cover of the case can also increase the comfort of the user.

[0003] In some scenarios, in order to ensure the quality of the stainless steel bottom cover of the watch case, it is necessary to detect the roughness of the surface of the stainless steel bottom cover when performing quality inspection on the stainless steel bottom cover. Laser scanning detection technology is a commonly used quality inspection technology for stainless steel bottom covers. Laser scanning detection technology is a non-contact measurement that can avoid damaging the surface of the stainless steel bottom cover during the inspection process. The principle is to use a laser beam to scan the surface of the stainless steel bottom cover, obtain the height information of the surface of the stainless steel bottom cover through the reflection change of the laser, and then analyze the height data to obtain the surface roughness of the stainless steel bottom cover. Among them, since the surface of the stainless steel bottom cover will be engraved with the brand information, production specifications and some decorative patterns of the watch, when the roughness is detected by laser scanning, there is a certain height difference between the position of the engraved pattern and the surface of the stainless steel bottom cover, so the height data at the pattern may interfere with the calculation of the roughness. The commonly used method is to identify the texture of the surface engraving of the stainless steel bottom cover and denoise the engraved part through algorithms such as filtering to eliminate the influence of the engraved part on the roughness. Although this method can filter the influence of the engraved part on the measurement result, it will affect the data accuracy around the engraved part, thereby resulting in a low accuracy of the detection result of the roughness of the surface of the stainless steel bottom cover, thereby affecting the detection accuracy of the quality of the stainless steel bottom cover. Summary of the invention

[0004] In order to solve the technical problem of low accuracy of the detection result of the roughness of the surface of the stainless steel bottom cover, the object of the present invention is to provide a method, a detection device and a system for detecting the polishing roughness of the stainless steel bottom cover.

[0005] In order to solve the above technical problems, the technical solutions adopted are as follows:

[0006] The embodiment of the present invention provides a method for detecting the polishing roughness of a stainless steel bottom cover, comprising: obtaining height data of each detection point on the surface of the stainless steel bottom cover; determining the contour points of the stainless steel bottom cover according to the height data of each detection point and the height data of detection points in each direction within the neighborhood of each detection point, drawing straight lines along the directions of the trend vectors of all the contour points, obtaining the intersection points of the straight lines, and taking the average of the positions where all the intersection points are located as the center position of the stainless steel bottom cover; determining the parity sequence of the stainless steel bottom cover according to the height data and the center position of the contour points; determining the engraving point evaluation of each detection point in the current parity sequence according to the height data of all detection points in the parity sequence adjacent to the current parity sequence; recording all detection points whose engraving point evaluation is greater than a first threshold as engraving points; eliminating detection points whose engraving points and height data do not meet the preset requirements of the surface of the stainless steel bottom cover, and determining the roughness of the stainless steel bottom cover according to the height data of the remaining detection points on the surface of the stainless steel bottom cover.

[0007] Optionally, determining the contour points of the stainless steel bottom cover based on the height data of each detection point and the height data of the detection points in each direction within the neighborhood of each detection point includes: determining the height trend parameters of the current detection point in each direction within the neighborhood based on the height data of the current detection point and the height data of the detection points in each direction within the neighborhood of the current detection point; using the height trend parameters of the current detection point in each direction as models for direction vectors in each direction, summing all the direction vectors to obtain the trend vector of the current detection point; determining a comparison area of ​​the current detection point with the current detection point as the center, dividing the comparison area into two sides based on a vertical line of the direction of the trend vector, and calculating the variance of the height data of all detection points on both sides respectively; recording the side with a smaller variance of the height data on both sides as the flat side of the current detection point, and recording the side with a larger variance of the height data as the oblique side of the current detection point; determining the contour evaluation of the current detection point based on the variance of the height data of the oblique side of the current detection point, the variance of the height data of the flat side of the current detection point, and the variance of the trend vectors of all detection points on the oblique side of the current detection point; and recording all detection points with contour evaluations greater than a second threshold as contour points of the stainless steel bottom cover.

[0008] Optionally, determining the height trend parameters of the current detection point in each direction within the neighborhood of the current detection point based on the height data of the current detection point and the height data of the detection points in each direction within the neighborhood of the current detection point includes: calculating the average height value of the height data of the detection points in each direction within the neighborhood of the current detection point; determining the absolute value of the first difference between the height data of the current detection point and the average height value in each direction as the height trend parameter of the current detection point in each direction within the neighborhood.

[0009] Optionally, determining the contour evaluation of the current detection point based on the variance of the height data of the oblique side of the current detection point, the variance of the height data of the flat side of the current detection point, and the variance of the trend vectors of all detection points on the oblique side of the current detection point includes: calculating the second difference between the variance of the height data of the flat side of the current detection point and the variance of the height data of the oblique side of the current detection point, and the reciprocal of the first product between the second difference and the variance of the trend vectors of all detection points on the oblique side of the current detection point; and normalizing the reciprocal of the first product to obtain the contour evaluation of the current detection point.

[0010] Optionally, determining the isotope sequence of the stainless steel bottom cover according to the height data and the center position of the contour points includes: clustering all contour points into two types of clusters according to the height data of the contour points, using the contour points in the first cluster as junction contour points, and using the contour points in the second cluster as edge contour points, the average distance between the position of each contour point in the first cluster and the center position is smaller than the average distance between the position of each contour point in the second cluster and the center position; drawing a circle with the center position as the center and the average distance between all junction contour points and the center position as the radius, and the obtained circular area is the inner area of ​​the junction contour of the stainless steel bottom cover; drawing multiple concentric circles with the center position as the center and the scanning interval as the step length in the inner area of ​​the junction contour, and determining the isotope sequence using the height data of all detection points in the ring of each concentric circle and the height data of all detection points in the ring of the previous concentric circle.

[0011] Optionally, determining the engraving point evaluation of each detection point in the current isotope sequence according to the height data of all detection points in the current isotope sequence and isotope sequences adjacent to the current isotope sequence includes: determining the descent rate of the current isotope sequence according to a first average value of the height data of all detection points in the current isotope sequence, a second average value of the height data of all detection points in the previous adjacent isotope sequence in the current isotope sequence, and a scanning interval; determining the descent consistency of the current isotope sequence according to the descent rate of the current isotope sequence and the average of the descent rates of all isotope sequences; determining the isotope deviation coefficient of each detection point in the current isotope sequence according to the first average value, the height data of each detection point in the current isotope sequence, and the frequency of occurrence of the height data of each detection point in the current isotope sequence in the isotope sequence; and determining the engraving point evaluation of each detection point in the current isotope sequence according to the descent consistency of the current isotope sequence and the isotope deviation coefficient of each detection point in the current isotope sequence.

[0012] Optionally, determining the decrease rate of the current isochronous sequence based on a first average value of height data of all detection points in the current isochronous sequence, a second average value of height data of all detection points in the previous adjacent isochronous sequence in the current isochronous sequence, and a scanning interval includes: calculating a third difference between the first average value and the second average value; and determining a first ratio between the third difference and the scanning interval as the decrease rate of the current isochronous sequence.

[0013] Optionally, determining the engraving point evaluation of each detection point in the current isotope sequence according to the descending consistency of the current isotope sequence and the isotope deviation coefficient of each detection point in the current isotope sequence includes: calculating a fourth difference between a predetermined value and the descending consistency of the current isotope sequence, and a second product between the fourth difference and the isotope deviation coefficient of each detection point in the current isotope sequence; and normalizing the second product to obtain the engraving point evaluation of each detection point in the current isotope sequence.

[0014] In a second aspect, an embodiment of the present invention provides a polishing roughness detection device for a stainless steel bottom cover, comprising: an acquisition module, used to acquire height data of each detection point on the surface of the stainless steel bottom cover; a determination module, used to determine the contour points of the stainless steel bottom cover according to the height data of each detection point and the height data of the detection points in each direction within the neighborhood of each detection point, draw straight lines along the directions of the trend vectors of all the contour points, obtain the intersection points of each straight line, and take the average of the positions of all the intersection points as the center position of the stainless steel bottom cover; the determination module is also used to determine the parity sequence of the stainless steel bottom cover according to the height data and the center position of the contour points; the determination module is also used to determine the engraving point evaluation of each detection point in the current parity sequence according to the height data of all detection points in the parity sequence adjacent to the current parity sequence; all detection points whose engraving point evaluation is greater than a first threshold are recorded as engraving points; the determination module is also used to eliminate the detection points whose engraving points and height data do not meet the preset requirements of the surface of the stainless steel bottom cover, and determine the roughness of the stainless steel bottom cover according to the height data of the remaining detection points on the surface of the stainless steel bottom cover.

[0015] In a third aspect, an embodiment of the present invention provides a stainless steel bottom cover polishing roughness detection system, comprising: a processor and a memory; wherein the memory is used to store a computer program that can be run on the processor; the processor is used to execute the program stored in the memory to implement the steps of the stainless steel bottom cover polishing roughness detection method mentioned in the first aspect.

[0016] The present invention has the following beneficial effects: firstly, the height data of each detection point on the surface of the stainless steel bottom cover is obtained; and the contour points of the stainless steel bottom cover are determined according to the height data of each detection point and the height data of the detection points in each direction in the neighborhood of each detection point, and straight lines are drawn along the direction of the trend vectors of all the contour points to obtain the intersection points of the straight lines, and the average of the positions where all the intersection points are located is used as the center position of the stainless steel bottom cover; secondly, the co-location sequence of the stainless steel bottom cover is determined according to the height data and the center position of the contour points; and then the engraving point evaluation of each detection point in the current co-location sequence is determined according to the height data of all detection points in the co-location sequence adjacent to the current co-location sequence; and then all detection points whose engraving point evaluation is greater than a first threshold value are recorded as engraving points; the detection points whose engraving points and height data do not meet the preset requirements of the surface of the stainless steel bottom cover are eliminated, and finally the roughness of the stainless steel bottom cover is determined according to the height data of the remaining detection points on the surface of the stainless steel bottom cover.

[0017] In this way, the embodiment of the present invention obtains the height data of several detection points on the surface of the stainless steel bottom cover, obtains the contour points of the stainless steel bottom cover according to the change of the height data in the neighborhood around each detection point, and determines the center position of the stainless steel bottom cover along the direction of the trend vector of the contour point. And based on the center position, several isotope sequences are obtained, and the height mutation between adjacent isotope sequences is analyzed to screen out the engraving points in the stainless steel bottom cover and the detection points that do not meet the preset requirements of the surface of the stainless steel bottom cover, that is, the points on the surface of the non-stainless steel bottom cover. After screening out the engraving points in the stainless steel bottom cover and the points on the surface of the non-stainless steel bottom cover, the remaining detection points are used to calculate the surface roughness of the stainless steel bottom cover. Reduce the influence of the engraving part on the roughness detection result, because the embodiment of the present invention removes the engraving points, thereby avoiding the problem of the influence of the engraving part on the surrounding data accuracy, improving the accuracy of the detection result of the roughness of the stainless steel bottom cover surface, and improving the detection accuracy of the quality of the stainless steel bottom cover. BRIEF DESCRIPTION OF THE DRAWINGS

[0018] In order to more clearly illustrate the technical solutions and advantages in the embodiments of the present invention or the prior art, the drawings required for use in the embodiments or the prior art descriptions are briefly introduced below. Obviously, the drawings described below are only some embodiments of the present invention. For ordinary technicians in this field, other drawings can be obtained based on these drawings without paying creative work.

[0019] Figure 1 A flow chart of a method for detecting the polishing roughness of a stainless steel bottom cover provided by one embodiment of the present invention;

[0020] Figure 2 A schematic diagram of the distribution of a stainless steel bottom cover and a scanning area provided by an embodiment of the present invention;

[0021] Figure 3 A schematic diagram of a trend vector provided by an embodiment of the present invention;

[0022] Figure 4 A schematic structural diagram of a device for detecting the polishing roughness of a stainless steel bottom cover provided by one embodiment of the present invention;

[0023] Figure 5 A schematic structural diagram of a stainless steel bottom cover polishing roughness detection system provided by an embodiment of the present invention. DETAILED DESCRIPTION

[0024] In order to further explain the technical means and effects adopted by the present invention to achieve the predetermined invention purpose, the following is a detailed description of a method, a detection device and a system for detecting the polishing roughness of a stainless steel bottom cover proposed by the present invention, its specific implementation, structure, features and effects, in combination with the accompanying drawings and preferred embodiments. In the following description, different "one embodiment" or "another embodiment" does not necessarily refer to the same embodiment. In addition, specific features, structures or characteristics in one or more embodiments may be combined in any suitable form.

[0025] Unless defined otherwise, all technical and scientific terms used herein have the same meaning as commonly understood by one of ordinary skill in the art to which this invention belongs.

[0026] It should be noted that in order to ensure that the calculation results are meaningful, when performing fractional operations in the embodiments of the present invention, when the denominator is 0, it is necessary to add a parameter adjustment factor greater than 0 to the denominator to prevent the denominator from being 0. The value of the parameter adjustment factor is set by the implementer according to actual conditions, and this application does not impose any special restrictions.

[0027] The specific scheme of the method for detecting the polishing roughness of a stainless steel bottom cover provided by the present invention is described in detail below with reference to the accompanying drawings.

[0028] Embodiment 1:

[0029] See also Figure 1 , which shows a flow chart of a method for detecting the polishing roughness of a stainless steel bottom cover provided by an embodiment of the present invention, comprising:

[0030] Step S101, obtaining height data of each detection point on the surface of the stainless steel bottom cover.

[0031] Specifically, the stainless steel bottom cover can be the stainless steel bottom cover of a watch or the stainless steel bottom cover of other electronic devices, and the embodiment of the present invention is not limited thereto. The shape of the stainless steel bottom cover can be circular or in other shapes. The embodiment of the present invention takes the circular stainless steel bottom cover as an example for explanation. In the embodiment of the present invention, the stainless steel bottom cover is placed on a horizontal plane, and a laser scanner that has completed horizontal calibration is aligned with the surface to be measured of the stainless steel bottom cover. The scanning interval is set to 5μm, and the scanning range is slightly larger than the minimum circumscribed square of the stainless steel bottom cover to ensure that the height data of the stainless steel bottom cover can be fully collected. For example, Figure 2 As shown, Figure 2 A schematic diagram of a stainless steel bottom cover and a distribution of a scanning area provided by an embodiment of the present invention, wherein the scanning area is the minimum circumscribed rectangle of the stainless steel bottom cover, and the laser scanner scans point by point in the scanning area to obtain height data of all detection points, wherein the height of the horizontal plane on which the stainless steel bottom cover is placed is the reference height 0. That is, the height data of the area other than the stainless steel bottom cover in the scanning area is 0.

[0032] Step S102, determining the contour points of the stainless steel bottom cover according to the height data of each detection point and the height data of the detection points in each direction within the neighborhood of each detection point, drawing straight lines along the directions of the trend vectors of all the contour points, obtaining the intersection points of the straight lines, and taking the average of the positions of all the intersection points as the center position of the stainless steel bottom cover.

[0033] Specifically, the embodiment of the present invention is to separate the height data of the engraved part of the stainless steel bottom cover from the height data of the smooth surface of the stainless steel surface, and then calculate the surface roughness of the stainless steel bottom cover through the height data of the smooth surface of the stainless steel bottom cover. Since the product information and other contents on the stainless steel bottom cover are usually arranged in a circle with the center of the stainless steel bottom cover as the center, the center of the stainless steel bottom cover is first located, and then the pattern of the engraved texture on the stainless steel bottom cover is further analyzed. Among them, for the stainless steel bottom cover, in addition to the engraved texture being arranged in a circle, the contour on the stainless steel bottom cover is also circular, and the texture and the contour of the stainless steel bottom cover are both centered on the center of the stainless steel bottom cover. The main contours on the stainless steel bottom cover include the edge contour and the boundary contour of the smooth surface and the bevel. Although the edge contour is easier to determine, since the edge contour is usually processed with structures such as holes or grooves for assembly, it does not appear as a completely regular circle. Only using the edge contour to locate the center of the stainless steel bottom cover may have a large deviation. Therefore, in addition to the edge contour, the boundary contour of the smooth surface and the bevel is obtained and analyzed in combination with the edge contour.

[0034] Furthermore, by comparing the height data of each detection point with its adjacent detection points, all possible contour points on the surface of the stainless steel bottom cover are obtained to accurately locate the center of the stainless steel bottom cover. For edge contour points, the height of the outer side of the edge is 0, while the height of the inner side of the edge is close to the height of the current detection point and increases in a certain direction. For boundary contour points, the height of one side of the edge is almost the same as the height of the current detection point, while the height of the other side is close to the height of the current detection point and decreases in a certain direction.

[0035] Further, as an optional embodiment of the present invention, determining the contour point of the stainless steel bottom cover according to the height data of each detection point and the height data of the detection points in each direction within the neighborhood of each detection point includes: determining the height trend parameters of the current detection point in each direction within the neighborhood according to the height data of the current detection point and the height data of the detection points in each direction within the neighborhood of the current detection point; using the height trend parameters of the current detection point in each direction as models for direction vectors in each direction, summing all direction vectors to obtain the trend vector of the current detection point; determining the comparison area of ​​the current detection point with the current detection point as the center, dividing the comparison area into two sides based on the vertical line of the direction of the trend vector, and calculating the variance of the height data of all detection points on both sides respectively; recording the side with a smaller variance of the height data on both sides as the flat side of the current detection point, and recording the side with a larger variance of the height data as the oblique side of the current detection point; determining the contour evaluation of the current detection point according to the variance of the height data of the oblique side of the current detection point, the variance of the height data of the flat side of the current detection point, and the variance of the trend vectors of all detection points on the oblique side of the current detection point; recording all detection points with contour evaluations greater than the second threshold as contour points of the stainless steel bottom cover.

[0036] Specifically, the embodiment of the present invention presets the comparison length to 9, takes 9 detection points in each of the 8 neighborhood directions with each detection point as the center, compares the difference between the height data of each center point and the detection points in each direction of its 8 neighborhoods, and analyzes the height trend of the area around each detection point through the difference in height data. Among them, when determining the height trend parameters of the current detection point in each direction within the neighborhood, first calculate the average height value of the height data of the detection points in each direction within the neighborhood of the current detection point; then determine the absolute value of the first difference between the height data of the current detection point and the average height value of each direction as the height trend parameter of the current detection point in each direction within the neighborhood.

[0037] Specifically, the present invention takes the ath direction in the neighborhood of the i-th point as an example, and specifically uses the following method to calculate the height trend parameter of the i-th detection point in the a-th direction in the neighborhood:

[0038]

[0039] In the above formula, Represents the height trend parameter of the i-th detection point in the a-th direction within the neighborhood. Represents the height data of the i-th detection point. Indicates the comparison length, The value can be determined according to actual conditions. In the embodiment of the present invention, Q=9. Represents the height data of the qth detection point in the ath direction within the neighborhood of the i-th detection point.

[0040] in, The average value of the height data of all the detection points within the comparison length of the ith detection point in the neighborhood in the ath direction represents the height in the ath direction. Due to the high step accuracy of laser scanning, more detection points need to be selected for analysis in order to analyze the height trend of the stainless steel bottom cover on a macro scale. When the number of detection points is small, it reflects the roughness of the material surface of the stainless steel bottom cover but cannot show the shape of the stainless steel bottom cover. Here, the contour points are obtained by analyzing the shape.

[0041] Furthermore, the embodiment of the present invention takes the ith detection point as the starting point, and respectively constructs the direction vectors in each direction in the 8 neighborhood directions of the ith detection point using the height trend parameters of each direction of the ith detection point as models. The sum of all direction vectors is calculated, and the result of the sum is recorded as the trend vector of the ith detection point. The trend vector reflects the overall height change trend of the surrounding area of ​​each detection point, and the direction of the trend vector approximately represents the direction of the largest height change of the detection point. For the contour points of the stainless steel bottom cover, the direction of the largest height change is the radial direction of the circle, that is, the direction of the trend vector approximately represents the radial direction of the circle. Exemplarily, as Figure 3 As shown, Figure 3 A schematic diagram of a trend vector provided by an embodiment of the present invention. Draw a vertical line to the direction of the trend vector, that is, Figure 3 In the dotted part, the edge contour points and the boundary contour points all meet the feature that "the height data of the detection points on one side are almost the same, and the height data of the detection points on the other side are different but the direction trend changes are almost the same". The embodiment of the present invention calculates the contour evaluation of all detection points based on this feature.

[0042] Furthermore, the embodiment of the present invention takes the i-th detection point as the center. The square area of ​​size is recorded as the comparison area of ​​the i-th detection point, that is, Q points are taken from the top, bottom, left and right of the i-th detection point, and the side length of the comparison area is 2Q+1. The vertical line of the trend vector direction divides the comparison area into two sides, and the variance of the height data of all detection points on both sides of the comparison area is obtained respectively. The side with the smaller variance of the height data is recorded as the flat side, and the side with the larger variance of the height data is recorded as the oblique side.

[0043] Further, as an optional embodiment of the present invention, determining the contour evaluation of the current detection point based on the variance of the height data of the oblique side of the current detection point, the variance of the height data of the flat side of the current detection point, and the variance of the trend vectors of all detection points on the oblique side of the current detection point includes: calculating the second difference between the variance of the height data of the flat side of the current detection point and the variance of the height data of the oblique side of the current detection point, and the reciprocal of the first product between the second difference and the variance of the trend vectors of all detection points on the oblique side of the current detection point; normalizing the reciprocal of the first product to obtain the contour evaluation of the current detection point.

[0044] Specifically, the embodiment of the present invention takes the i-th detection point as the current detection point as an example, and specifically uses the following formula to calculate the contour evaluation of the current detection point:

[0045]

[0046] In the above formula, Represents the contour evaluation of the i-th detection point. Represents the variance of the height data of the flat side of the i-th detection point. Indicates the variance of the height data of the oblique side of the i-th detection point. Represents the variance of the trend vector of all detection points on the oblique side of the i-th detection point. Represents a linear normalization function, which is used to Perform normalization.

[0047] Furthermore, the embodiment of the present invention obtains the contour evaluation of all detection points, presets a second threshold, and records all detection points whose contour evaluation is greater than the second threshold as contour points. Draw the trend vectors of all contour points as straight lines, and obtain several intersection points. Since the trend vectors approximately represent the radial direction, the intersection points are the approximation of the center of the circle. The average of the positions of all intersection points is taken as the center position of the stainless steel bottom cover. Among them, the second threshold can be determined according to actual conditions, and the value in the embodiment of the present invention is 0.8.

[0048] Step S103, determining the co-location sequence of the stainless steel bottom cover according to the height data and the center position of the contour points.

[0049] Specifically, the smooth surface of the stainless steel bottom cover is not necessarily a plane with completely consistent height, but usually has an arc, so the embodiment of the present invention analyzes from circles with the same radius instead of directly analyzing the height data of the entire plane. All isotopic sequences are obtained through the height data of the detection points in the ring where multiple concentric circles are located, and the height data mutation is analyzed based on the isotopic sequence.

[0050] Further, as an optional embodiment of the present invention, determining the isotope sequence of the stainless steel bottom cover according to the height data and the center position of the contour points includes: clustering all contour points into two types of clusters according to the height data of the contour points, using the contour points in the first cluster as the junction contour points, and using the contour points in the second cluster as the edge contour points, the average distance between the position of each contour point in the first cluster and the center position is smaller than the average distance between the position of each contour point in the second cluster and the center position; drawing a circle with the center position as the center and the average distance between all the junction contour points and the center position as the radius, and the obtained circular area is the inner area of ​​the junction contour of the stainless steel bottom cover; drawing multiple concentric circles with the center position as the center and the scanning interval as the step length in the inner area of ​​the junction contour, and determining the isotope sequence using the height data of all detection points in the ring of each concentric circle and the height data of all detection points in the ring of the previous concentric circle.

[0051] Specifically, the height data of each detection point on the oblique side is lower than the height data of the smooth plane. In order to avoid misjudging the height data of the oblique side of the stainless steel bottom cover as the height data after engraving, the embodiment of the present invention clusters all contour points into two categories, wherein the detection points in a cluster with a small average distance from the center position of the stainless steel bottom cover are used as junction contour points. The detection points in a cluster with a large average distance from the center position of the stainless steel bottom cover are used as edge contour points. Since the laser engraving part is usually engraved on the smooth plane of the stainless steel bottom cover, that is, the inner area of ​​the junction contour, the embodiment of the present invention discusses the inner area of ​​the junction contour to obtain the detection points of the engraved texture. With the center position of the stainless steel bottom cover as the center of the circle and the average distance between all the junction contour points and the center position of the stainless steel bottom cover as the radius, a circle is drawn. The circular area approximately represents the smooth plane area of ​​the stainless steel bottom cover, that is, the inner area of ​​the junction contour.

[0052] Furthermore, with the center position of the stainless steel bottom cover as the center of the circle and the scanning interval as the step length, several concentric circles are made. The height data of all the detection points included in the ring of each concentric circle minus the height data of the previous concentric circle constitute a height data sequence, which is recorded as a homonymous sequence in the embodiment of the present invention. It is worth noting that all sequences do not overlap, and each detection point belongs to only one homonymous sequence. The height data of the detection points on the same circle on the stainless steel bottom cover are the same. If there is an engraved texture point, the height data of the engraved texture point is smaller than that of the detection point that has not been engraved. Obtain all homonymous sequences and analyze the sudden change of height data.

[0053] Step S104: Determine the engraving point evaluation of each detection point in the current co-location sequence according to the height data of all detection points in the current co-location sequence and co-location sequences adjacent to the current co-location sequence. All detection points with engraving point evaluations greater than a first threshold are recorded as engraving points.

[0054] Specifically, the embodiment of the present invention first analyzes the situation of the presence of carving points in each isotopic sequence from the height changes between different isotopic sequences. According to the difference between the mean height of each isotopic sequence and the adjacent isotopic sequence, the consistency of the average height change of each isotopic sequence and other isotopic sequences is calculated. In the case of no carving points, the average height of the isotopic sequence changes evenly, and the presence of carving points will reduce the average height of the isotopic sequence, so the difference between its average height and the adjacent isotopic sequence will also increase.

[0055] Further, as an optional embodiment of the present invention, determining the engraving point evaluation of each detection point in the current isotope sequence according to the height data of all detection points in the current isotope sequence and the isotope sequence adjacent to the current isotope sequence includes: determining the descent rate of the current isotope sequence according to a first average value of the height data of all detection points in the current isotope sequence, a second average value of the height data of all detection points in the previous adjacent isotope sequence in the current isotope sequence, and a scanning interval; determining the descent consistency of the current isotope sequence according to the descent rate of the current isotope sequence and the average of the descent rates of all isotope sequences; determining the isotope deviation coefficient of each detection point in the current isotope sequence according to the first average value, the height data of each detection point in the current isotope sequence, and the frequency of occurrence of the height data of each detection point in the current isotope sequence in the isotope sequence; and determining the engraving point evaluation of each detection point in the current isotope sequence according to the descent consistency of the current isotope sequence and the isotope deviation coefficient of each detection point in the current isotope sequence.

[0056] Specifically, the scanning interval in the embodiment of the present invention refers to the scanning interval of using a laser scanner to obtain the height data of the detection point on the stainless steel bottom cover, which can be determined according to actual conditions and is not limited in the embodiment of the present invention. In the embodiment of the present invention, when calculating the descent rate, the third difference between the first average value and the second average value is first calculated;

[0057] Then, a first ratio between the third difference value and the scanning interval is determined as the decrease rate of the current co-location sequence.

[0058] Among them, the embodiment of the present invention uses the rth isotope sequence Calculate the drop rate for the current isochronous sequence as an example, where Represents the height data of the first detection point in the rth isotope sequence, Represents the height data of the second detection point in the rth isotope sequence, represents the rth isotope sequence The height data of the rth isotope sequence. The specific calculation is as follows:

[0059]

[0060] In the above formula, represents the decline rate of the rth isotopic sequence. Represents the first average value of the height data of all detection points in the rth co-location sequence. It represents the second average value of the height data of all detection points in the previous co-location sequence adjacent to the r-th co-location sequence. Indicates the scan interval.

[0061] Furthermore, the embodiment of the present invention uses the following formula to calculate the descending consistency of the current homology sequence:

[0062]

[0063] In the above formula, represents the descending consistency of the rth isotopic sequence. represents the decline rate of the rth isotopic sequence. Represents the mean of the decline rates of all isotopic sequences. (-) indicates the inverse normalization function, which is used to Perform normalization.

[0064] The descending consistency reflects the consistency between the height change of the rth isotopic sequence and the height change of other isotopic sequences. The smaller the value, the more engraving points the rth isotopic sequence may have, which leads to a large difference in height data from adjacent isotopic sequences. For the stainless steel bottom cover, the height data of the engraved circular pattern will be greatly different from the adjacent isotopic sequences, and the descending consistency of the isotopic sequences corresponding to the circular pattern engraving points is low.

[0065] Furthermore, the height mutation is analyzed by horizontal comparison in the same isotopic sequence. In the same isotopic sequence, the height data of the uncarved detection points are similar, while the height data of the carved points are lower. Therefore, taking the rth isotopic sequence in the embodiment of the present invention as an example, the isotopic deviation coefficient of the lth detection point in the rth isotopic sequence is calculated by the following formula: :

[0066]

[0067] In the above formula, It represents the parity deviation coefficient of the lth detection point in the rth parity sequence. Represents the first average value of the height data of all detection points in the rth co-location sequence. Represents the height data of the lth detection point in the rth isotope sequence. Indicates the frequency of occurrence of the height data of the lth detection point in the rth isotope sequence in the rth isotope sequence. Represents a linear normalization function, which is used to Perform normalization.

[0068] in, Indicates the degree to which the lth detection point is lower than the average height data of the isotopic sequence in which it is located. The larger the value, the lower the height data of the lth detection point is below the average value, and the more likely this detection point is a detection point after engraving. The represents the proportion of the detection points with the same height data as the lth detection point in the sequence. Usually, the detection points engraved on the stainless steel bottom cover account for a much smaller proportion in the same position sequence than the detection points not engraved. Therefore The smaller the value of is, the fewer the detection points are with the same height data as the lth detection point.

[0069] Further, as an optional embodiment of the present invention, determining the engraving point evaluation of each detection point in the current isotope sequence according to the descending consistency of the current isotope sequence and the isotope deviation coefficient of each detection point in the current isotope sequence includes: calculating a fourth difference between a predetermined value and the descending consistency of the current isotope sequence, and a second product between the fourth difference and the isotope deviation coefficient of each detection point in the current isotope sequence; and normalizing the second product to obtain the engraving point evaluation of each detection point in the current isotope sequence.

[0070] Specifically, the predetermined value in the embodiment of the present invention can be determined according to actual conditions, and the value in the embodiment of the present invention is 1. Further, the embodiment of the present invention takes the lth detection point in the rth isochronous sequence as an example, and specifically uses the following formula to calculate the engraving point evaluation of the lth detection point in the rth isochronous sequence:

[0071]

[0072] In the above formula, Represents the engraving point evaluation of the lth detection point in the rth isotopic sequence. represents the descending consistency of the rth isotopic sequence. It represents the parity deviation coefficient of the lth detection point in the rth parity sequence. Represents a linear normalization function, which is used to Perform normalization.

[0073] Similarly, the engraving point evaluations of all the detection points are obtained according to the above-mentioned embodiment of the present invention.

[0074] Furthermore, the first threshold can be determined according to actual conditions, and in the embodiment of the present invention, the first threshold is set to 0.75. All detection points with engraving point evaluation greater than 0.75 are recorded as engraving points.

[0075] Step S105, removing the engraving points and the detection points whose height data do not meet the preset requirements of the surface of the stainless steel bottom cover, and determining the roughness of the stainless steel bottom cover according to the height data of the remaining detection points on the surface of the stainless steel bottom cover.

[0076] Specifically, when calculating the roughness, the embodiment of the present invention excludes the detection points with a height of 0 (detection points not on the stainless steel bottom cover) and the engraving points from the height data of all the detection points obtained by scanning, so as to prevent the texture generated by laser engraving from affecting the accuracy of the roughness calculation, and uses the height data of the remaining detection points to calculate the required roughness. Among them, the detection points that do not meet the preset requirements of the surface of the stainless steel bottom cover are the detection points with a height of 0.

[0077] Furthermore, in the embodiment of the present invention, the roughness of the stainless steel bottom cover is taken as the arithmetic mean roughness Ra as an example. The arithmetic mean roughness Ra refers to the height deviation of the surface profile of the stainless steel bottom cover, that is, the average value of the deviation degree of the stainless steel surface from the reference line and the analyzed length of the stainless steel bottom cover. The calculation formula is: , Refers to the height deviation of the surface profile of the stainless steel bottom cover, that is, the distance between a certain detection point and the reference line. L refers to the measured length of the stainless steel bottom cover. Refers to the horizontal position of any detection point on the surface of the stainless steel bottom cover. The more detailed content of the arithmetic mean roughness Ra can be found in the prior art, and the embodiment of the present invention is not limited here.

[0078] Furthermore, select several lengths of height data on the stainless steel bottom cover and calculate Ra. When selecting data, exclude the engraving points and the detection points on the non-stainless steel bottom cover. You can select the length data of multiple positions of the stainless steel bottom cover to calculate Ra respectively and take the average value to obtain a more accurate roughness result. It is worth noting that since the smooth surface and the inclined surface of the stainless steel bottom cover are different surfaces, they need to be calculated separately when calculating their roughness.

[0079] Furthermore, the embodiment of the present invention uses the calculated arithmetic mean roughness Ra as the roughness of the surface of the stainless steel bottom cover and compares it with the production requirements to check whether the roughness of the surface of the stainless steel bottom cover meets the production standards. Generally, the roughness requirements of the stainless steel bottom cover of a watch are The specific value can be adjusted according to the actual situation. The case with a stainless steel bottom cover that meets this condition is qualified, otherwise it is unqualified.

[0080] In the first embodiment of the present invention, the height data of several detection points on the surface of the stainless steel bottom cover are obtained, and the contour points of the stainless steel bottom cover are obtained according to the change of the height data in the neighborhood around each detection point, and the center position of the stainless steel bottom cover is determined along the direction of the trend vector of the contour point. Based on the center position, several isotopic sequences are obtained, and the height mutation between adjacent isotopic sequences is analyzed to screen out the engraved points in the stainless steel bottom cover and the detection points that do not meet the preset requirements of the surface of the stainless steel bottom cover, that is, the points on the surface of the non-stainless steel bottom cover. After screening out the engraved points in the stainless steel bottom cover and the points on the surface of the non-stainless steel bottom cover, the remaining detection points are used to calculate the surface roughness of the stainless steel bottom cover. The influence of the engraved part on the roughness detection result is reduced. Since the first embodiment of the present invention removes the engraved points, the problem of the influence of the engraved part on the surrounding data accuracy is avoided, the accuracy of the detection result of the roughness of the surface of the stainless steel bottom cover is improved, and the detection accuracy of the quality of the stainless steel bottom cover is improved.

[0081] Embodiment 2:

[0082] Corresponding to the polishing roughness detection method for the stainless steel bottom cover provided in the above embodiment, based on the same technical concept, the embodiment of the present invention further provides a polishing roughness detection device for the stainless steel bottom cover, which is used to execute the polishing roughness detection method for the stainless steel bottom cover. Figure 4 A schematic diagram of a stainless steel bottom cover polishing roughness detection device provided by another embodiment of the present invention is shown in FIG. Figure 4 As shown, the polishing roughness detection device 400 for stainless steel bottom cover includes: an acquisition module 401, which is used to acquire height data of each detection point on the surface of the stainless steel bottom cover; a determination module 402, which is used to determine the contour points of the stainless steel bottom cover according to the height data of each detection point and the height data of the detection points in each direction in the neighborhood of each detection point, draw straight lines along the direction of the trend vectors of all contour points, obtain the intersection points of each straight line, and take the average of the positions of all intersection points as the center position of the stainless steel bottom cover; the determination module 402 is also used to determine the parity sequence of the stainless steel bottom cover according to the height data and the center position of the contour points; the determination module 402 is also used to determine the engraving point evaluation of each detection point in the current parity sequence according to the height data of all detection points in the parity sequence adjacent to the current parity sequence; all detection points with engraving point evaluation greater than the first threshold are recorded as engraving points; the determination module 402 is also used to eliminate the detection points whose engraving points and height data do not meet the preset requirements of the surface of the stainless steel bottom cover, and determine the roughness of the stainless steel bottom cover according to the height data of the remaining detection points on the surface of the stainless steel bottom cover.

[0083] In the second embodiment of the present invention, the height data of several detection points on the surface of the stainless steel bottom cover are obtained, and the contour points of the stainless steel bottom cover are obtained according to the change of the height data in the neighborhood around each detection point, and the center position of the stainless steel bottom cover is determined along the direction of the trend vector of the contour point. Based on the center position, several isotopic sequences are obtained, and the height mutation between adjacent isotopic sequences is analyzed to screen out the engraved points in the stainless steel bottom cover and the detection points that do not meet the preset requirements of the surface of the stainless steel bottom cover, that is, the points on the surface of the non-stainless steel bottom cover. After screening out the engraved points in the stainless steel bottom cover and the points on the surface of the non-stainless steel bottom cover, the remaining detection points are used to calculate the roughness of the surface of the stainless steel bottom cover. The influence of the engraved part on the roughness detection result is reduced. Since the second embodiment of the present invention removes the engraved points, the problem of the influence of the engraved part on the surrounding data accuracy is avoided, the accuracy of the detection result of the roughness of the surface of the stainless steel bottom cover is improved, and the detection accuracy of the quality of the stainless steel bottom cover is improved.

[0084] Embodiment three:

[0085] Corresponding to the polishing roughness detection method for the stainless steel bottom cover provided in the above embodiment, based on the same technical concept, the embodiment of the present invention further provides a polishing roughness detection system for the stainless steel bottom cover, and the polishing roughness detection system for the stainless steel bottom cover is used to execute the polishing roughness detection method for the stainless steel bottom cover. Figure 5 A structural diagram of a stainless steel bottom cover polishing roughness detection system provided by another embodiment of the present invention is shown in FIG. Figure 5 The polishing roughness detection system for the stainless steel bottom cover may have relatively large differences due to different configurations or performances, and may include one or more processors 501 and memory 502, the memory 502 is used to store computer programs that can be run on the processor 501, and the processor 501 is used to execute the program stored in the memory 502 to achieve the above Figure 1 The memory 502 may be a temporary storage or a permanent storage. The application stored in the memory 502 may include one or more modules (not shown in the figure), each of which may include a series of computer executable instructions in the polishing roughness detection system of the stainless steel bottom cover.

[0086] Furthermore, the processor 501 can be configured to communicate with the memory 502, and execute a series of computer executable instructions in the memory 502 on the stainless steel bottom cover polishing roughness detection system. The stainless steel bottom cover polishing roughness detection system can also include one or more power supplies 503, one or more wired or wireless network interfaces 504, one or more input and output interfaces 505, and one or more keyboards 506.

[0087] Specifically in the third embodiment, the polishing roughness detection system of the stainless steel bottom cover includes a processor, a communication interface, a memory and a communication bus; wherein the processor, the communication interface and the memory communicate with each other through the bus; the memory is used to store computer programs; the processor is used to execute the programs stored in the memory to achieve the above Figure 1 The various steps in the method embodiment are the same as those in the method embodiment, and have the beneficial effects of the above method embodiments. To avoid repetition, the third embodiment of the present invention will not be described here.

[0088] It should be noted that the stainless steel bottom cover polishing roughness detection system provided in the embodiment of the present invention and the stainless steel bottom cover polishing roughness detection method provided in the embodiment of the present invention are based on the same application concept, so the specific implementation of this embodiment can refer to the implementation of the aforementioned stainless steel bottom cover polishing roughness detection method, and has the same or similar beneficial effects, and the repeated parts will not be repeated.

[0089] It should be noted that the sequence of the above embodiments of the present invention is only for description and does not represent the advantages and disadvantages of the embodiments. The processes depicted in the accompanying drawings do not necessarily require the specific order or continuous order shown to achieve the desired results. In some embodiments, multitasking and parallel processing are also possible or may be advantageous.

[0090] The various embodiments in this specification are described in a progressive manner, and the same or similar parts between the various embodiments can be referenced to each other, and each embodiment focuses on the differences from other embodiments.

[0091] The embodiment of the present invention further provides a computer-readable storage medium, which stores one or more programs. When the one or more programs are executed by an electronic device including a plurality of application programs, the electronic device executes Figure 1 The method disclosed in the illustrated embodiment implements the functions and beneficial effects of each method in the previous method embodiments, which will not be described in detail here.

[0092] Among them, the computer readable storage medium includes a read-only memory (ROM), a random access memory (RAM), a magnetic disk or an optical disk, etc.

Claims

1. A method for detecting the polishing roughness of a stainless steel bottom cover, characterized in that: The method for detecting the polishing roughness of the stainless steel bottom cover comprises: Use a laser scanner to obtain height data of each detection point on the surface of the stainless steel bottom cover; Determine the contour points of the stainless steel bottom cover according to the height data of each detection point and the height data of detection points in each direction in the neighborhood of each detection point, draw straight lines along the direction of the trend vectors of all contour points, obtain the intersection points of each straight line, and take the average of the positions of all intersection points as the center position of the stainless steel bottom cover; The isotope sequence of the stainless steel bottom cover is determined according to the height data of the contour points and the center position, specifically: all contour points are clustered into two types of clusters according to the height data of the contour points, the contour points in the first cluster are used as the boundary contour points, and the contour points in the second cluster are used as the edge contour points, the average distance between the position of each contour point in the first cluster and the center position is smaller than the average distance between the position of each contour point in the second cluster and the center position; a circle is drawn with the center position as the center and the average distance between all boundary contour points and the center position as the radius, and the obtained circular area is the inner area of ​​the boundary contour of the stainless steel bottom cover; in the inner area of ​​the boundary contour, multiple concentric circles are drawn with the center position as the center and the scanning interval as the step length, and the height data of all detection points included in the annular shape after subtracting the previous concentric circle from each concentric circle constitute a height data sequence, which is the isotope sequence; Determine the engraving point evaluation of each detection point in the current isotope sequence according to the height data of all detection points in the isotope sequence and the isotope sequence adjacent to the current isotope sequence; All detection points whose engraving point evaluation is greater than the first threshold are recorded as engraving points; The engraving points and the detection points whose height data do not meet the preset requirements of the surface of the stainless steel bottom cover are eliminated, and the roughness of the stainless steel bottom cover is determined according to the height data of the remaining detection points on the surface of the stainless steel bottom cover.

2. The method for detecting the polishing roughness of a stainless steel bottom cover according to claim 1, characterized in that: The step of determining the contour points of the stainless steel bottom cover according to the height data of each detection point and the height data of detection points in each direction within the neighborhood of each detection point comprises: Determine the height trend parameters of the current detection point in each direction within the neighborhood according to the height data of the current detection point and the height data of the detection points in each direction within the neighborhood of the current detection point; Using the height trend parameters of the current detection point in each direction as models to construct direction vectors in each direction, summing all direction vectors to obtain the trend vector of the current detection point; Determine a comparison area of ​​the current detection point with the current detection point as the center, divide the comparison area into two sides based on a vertical line of the direction of the trend vector, and calculate the variance of the height data of all detection points on both sides respectively; The side with the smaller variance of the height data on both sides is recorded as the flat side of the current detection point, and the side with the larger variance of the height data is recorded as the inclined side of the current detection point; Determine a contour evaluation of the current detection point according to the variance of the height data of the oblique side of the current detection point, the variance of the height data of the flat side of the current detection point, and the variance of the trend vectors of all detection points on the oblique side of the current detection point; All detection points whose contour evaluation is greater than the second threshold are recorded as contour points of the stainless steel bottom cover.

3. The method for detecting the polishing roughness of a stainless steel bottom cover according to claim 2, characterized in that: The step of determining the height trend parameters of the current detection point in each direction within the neighborhood of the current detection point according to the height data of the current detection point and the height data of the detection points in each direction within the neighborhood of the current detection point comprises: Calculate the average height value of the height data of the detection points in each of the directions within the neighborhood of the current detection point; Determine the absolute value of the first difference between the height data of the current detection point and the average height value of each of the directions as the height trend parameter of the current detection point in each direction within the neighborhood.

4. The method for detecting the polishing roughness of a stainless steel bottom cover according to claim 2, characterized in that: Determining the contour evaluation of the current detection point according to the variance of the height data of the oblique side of the current detection point, the variance of the height data of the flat side of the current detection point, and the variance of the trend vectors of all detection points on the oblique side of the current detection point comprises: Calculate a second difference between the variance of the height data of the flat side of the current detection point and the variance of the height data of the oblique side of the current detection point, and a reciprocal of a first product between the second difference and the variance of the trend vectors of all detection points on the oblique side of the current detection point; The reciprocal of the first product is normalized to obtain a contour evaluation of the current detection point.

5. The method for detecting the polishing roughness of a stainless steel bottom cover according to any one of claims 1 to 4, characterized in that: The step of determining the engraving point evaluation of each detection point in the current isochronous sequence according to the height data of all detection points in the isochronous sequence and the isochronous sequence adjacent to the current isochronous sequence comprises: Determine the descent rate of the current co-location sequence according to a first average value of height data of all detection points in the current co-location sequence, a second average value of height data of all detection points in a previous adjacent co-location sequence in the current co-location sequence, and a scanning interval; Determining the decline consistency of the current isotope sequence according to the decline rate of the current isotope sequence and the average of the decline rates of all isotope sequences; Determine the parity deviation coefficient of each detection point in the current parity sequence according to the first average value, the height data of each detection point in the current parity sequence, and the frequency of occurrence of the height data of each detection point in the current parity sequence in the parity sequence; The engraving point evaluation of each detection point in the current isotope sequence is determined according to the descending consistency of the current isotope sequence and the isotope deviation coefficient of each detection point in the current isotope sequence.

6. The method for detecting the polishing roughness of a stainless steel bottom cover according to claim 5, characterized in that: Determining the drop rate of the current co-location sequence according to a first average value of height data of all detection points in the current co-location sequence, a second average value of height data of all detection points in a previous adjacent co-location sequence in the current co-location sequence, and the scanning interval comprises: calculating a third difference between the first average value and the second average value; A first ratio between the third difference and the scanning interval is determined as a decrease rate of the current parity sequence.

7. The method for detecting the polishing roughness of a stainless steel bottom cover according to claim 5, characterized in that: The step of determining the engraving point evaluation of each detection point in the current isotope sequence according to the descending consistency of the current isotope sequence and the isotope deviation coefficient of each detection point in the current isotope sequence comprises: Calculating a fourth difference between a predetermined value and the descending consistency of the current isotope sequence, and a second product between the fourth difference and the isotope deviation coefficient of each detection point in the current isotope sequence; The second product is normalized to obtain an engraving point evaluation of each detection point in the current co-location sequence.

8. A stainless steel bottom cover polishing roughness detection device, characterized in that: include: The acquisition module uses a laser scanner to acquire the height data of each detection point on the surface of the stainless steel bottom cover; A determination module, used to determine the contour points of the stainless steel bottom cover according to the height data of each detection point and the height data of detection points in each direction within the neighborhood of each detection point, draw straight lines along the directions of the trend vectors of all the contour points, obtain the intersection points of each straight line, and take the average of the positions of all the intersection points as the center position of the stainless steel bottom cover; The determination module is also used to determine the homonymous sequence of the stainless steel bottom cover according to the height data of the contour points and the center position, specifically: all contour points are clustered into two types of clusters according to the height data of the contour points, the contour points in the first cluster are used as the boundary contour points, and the contour points in the second cluster are used as the edge contour points, the average distance between the position of each contour point in the first cluster and the center position is smaller than the average distance between the position of each contour point in the second cluster and the center position; a circle is drawn with the center position as the center and the average distance between all boundary contour points and the center position as the radius, and the obtained circular area is the inner area of ​​the boundary contour of the stainless steel bottom cover; in the inner area of ​​the boundary contour, a plurality of concentric circles are drawn with the center position as the center and the scanning interval as the step length, and the height data of all detection points included in the annular shape after subtracting the previous concentric circle from each concentric circle constitute a height data sequence, which is the homonymous sequence; The determination module is further used to determine the engraving point evaluation of each detection point in the current isochronous sequence according to the height data of all detection points in the isochronous sequence and the isochronous sequence adjacent to the current isochronous sequence; and record all detection points whose engraving point evaluation is greater than a first threshold as engraving points; The determination module is further used to remove the engraving points and the detection points whose height data do not meet the preset requirements of the surface of the stainless steel bottom cover, and determine the roughness of the stainless steel bottom cover according to the height data of the remaining detection points on the surface of the stainless steel bottom cover.

9. A stainless steel bottom cover polishing roughness detection system, characterized in that: include: A processor and a memory; wherein the memory is used to store a computer program that can be run on the processor; A processor is used to execute the program stored in the memory to implement the steps of the method for detecting the polishing roughness of the stainless steel bottom cover as described in any one of claims 1 to 7.

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