PTC heater control panel test system and test method thereof

Abstract

The invention discloses a PTC heater control panel test system and a test method thereof, and belongs to the technical field of controller test. The technical problems that manual switching is needed for each item, time and labor are wasted, and the testing efficiency cannot be improved are solved. The key points of the technical scheme are that the system comprises a test tool, a load test unit, a power supply test unit and a labeling machine; the load test unit comprises a PC terminal, a CAN receiver, a CAN control panel, a PLC device, a relay and a load, the PC terminal, the CAN receiver, the CAN control panel, the PLC device, the relay, the load and the test tool are connected in sequence, and the CAN control panel is connected with a bus of the test tool through a CAN network; the PC end is connected with the power supply test unit through an RS232 communication mode, the power supply test unit comprises an insulation voltage-withstanding instrument, a high-voltage power supply and a low-voltage power supply, the high-voltage power supply and the low-voltage power supply respectively provide test power for the test tool, an efficient test method is adopted, and the effect of improving the detection efficiency is achieved.

Description

Technical Field

[0001] The invention relates to the technical field of controller testing, and in particular to a PTC heater control panel testing system and a testing method thereof. Background Art

[0002] At present, positive temperature coefficient thermistor (PTC) electric heaters can be used for heating. PTC heaters are controlled by a control panel to achieve human-computer interaction. In order to ensure the factory pass rate of products, the control panel needs to be tested.

[0003] One of the important processes in testing the PTC heater control panel is to clamp the control panel onto the test fixture. For ease of description, the control panel is generally referred to as a specimen. After the specimen is assembled on the test fixture, it is necessary to complete the electrical connection between the specimen and the test fixture, that is, to connect its various ports with the test work. There are different test interfaces on the test fixture.

[0004] In order to simulate normal control, the following tests need to be completed: 1. Test whether it works normally when connected to a load; 2. Test whether the network communication is normal; 3. Test the impact of changes in high and low voltage power supplies on the product.

[0005] For the above test items, each item needs to be switched manually, which is time-consuming and labor-intensive and cannot improve the test efficiency. Summary of the invention

[0006] In order to solve the above technical problems and shortcomings: how to improve the test efficiency of the PTC heater control panel, the present invention provides a PTC heater control panel test system and a test method thereof.

[0007] In order to achieve the above-mentioned purpose and other related purposes, the present invention adopts the following technical solutions: A PTC heater control panel test system includes a test fixture, a load test unit, a power supply test unit, and a labeling machine; The load test unit includes a PC terminal, a CAN receiver, a CAN control board, a PLC device, a relay, and a load. The PC terminal, a CAN receiver, a CAN control board, a PLC device, a relay, a load, and a test tool are connected in sequence. The CAN control board is connected to the bus of the test fixture via the CAN network; The PC is connected to the power supply test unit through RS232 communication. The power supply test unit includes an insulation withstand voltage tester, a high-voltage power supply and a low-voltage power supply. The high-voltage power supply and the low-voltage power supply respectively provide test power to the test fixture. The PC is also connected to the label machine via a USB line.

[0008] Preferably, the test fixture is equipped with an auxiliary control module, a signal inversion module, a selection circuit, a current display, a test power source, a standard power source, a test pin and a test chip interface; The auxiliary control module is connected to a control terminal of the selection circuit and is used to provide a first control signal; The auxiliary control module is connected to the second control terminal of the selection circuit through the signal inversion module, and is used to provide a second control signal opposite to the first control signal; The input terminal of the selection circuit is connected to a test power source through a current display and is also connected to a standard power source.

[0009] Preferably, the signal inversion module includes a crystal switch tube Q4, a resistor R and an inversion power source, the inversion power source is connected to one end of the resistor R, the other end of the resistor R is connected to the first pin of the crystal switch tube Q4 and is used to output a second control signal, the second pin of the crystal switch tube Q4 is grounded, and the control end of the crystal switch tube Q4 is used to connect to the auxiliary control module.

[0010] Preferably, the selection circuit includes a crystal switch tube Q1, a crystal switch tube Q2, and a crystal switch tube Q3, wherein the first pin of the crystal switch tube Q1 is used to connect to a current display, the second pin of the crystal switch tube Q1 is connected to the second pin of the crystal switch tube Q2, the first pin of the crystal switch tube Q2 is connected to the first pin of the crystal switch tube Q3, the second pin of the crystal switch tube Q3 is connected to a standard power source, the control ends of the crystal switch tubes Q1 and Q2 are connected together as the second control end, and the control end of the crystal switch tube Q3 serves as the first control end.

[0011] Preferably, a plurality of the selection circuits are provided and connected in parallel.

[0012] Preferably, the test chip interface has a plurality of test pins, and the auxiliary control module controls the selection circuit to simultaneously provide the test power source corresponding to each test pin on the test chip interface.

[0013] Preferably, the response time of the crystal switch tube Q3 is earlier than the response time of the crystal switch tube Q1 and the crystal switch tube Q2, and the response time of the crystal switch tube Q1 and the crystal switch tube Q2 are the same.

[0014] Preferably, the signal output by the auxiliary control module is a level signal, and the level signal includes a true signal and a virtual signal. In the initial state, the auxiliary control module outputs a virtual signal by default, and the virtual signal is a voltage of 0V.

[0015] On the other hand, a PTC heater control panel testing method is also provided, using the above-mentioned PTC heater control panel testing system, comprising the following steps: Step 1, wait for the sample communication connection, and start the test after the communication is successful; Step 2: The relay controls the high-voltage detection circuit to start, the PC controls the high-voltage power supply of the insulation withstand voltage tester to work, and the high-voltage test result is judged. The relay controls the function detection circuit to start, connects the external signal, and judges whether the CAN message of the product has a fault report. If there is no fault, the sample starts working. The signal is sent to judge whether the CAN message of the product has a fault report and whether the power is normal. If there is a fault, it is qualified. Step 3: The result voice prompts whether to issue the label, waits for the sample product to be taken away, disconnects the communication, and the voice prompts reset; Step 4, repeat steps 1-3.

[0016] On the other hand, a PTC heater control panel test method is also provided. Using the above-mentioned PTC heater control panel test system, first, the test chip interface is connected to the PTC heater control panel, and the standard working state of the chip is obtained by connecting to a standard power source for power supply; Next, the auxiliary control module switches the control signal, and the selection circuit simultaneously provides different test power sources to the respective chip pins for testing, and the test status is fed back through the current display; Finally, whether there is a fault is determined by comparing the working state of the standard power source with the working state of different test power sources.

[0017] In summary, the invention has at least one of the following beneficial technical effects: 1. Using this system can greatly save manpower and is very intelligent and automated; 2. This system is easy to operate and efficient. It can achieve quality inspection very safely and reliably, and improve the qualified rate of product samples out of the warehouse; 3. By testing the chip pins, the qualification of product samples can be more reliably ensured and the detection efficiency can be improved. BRIEF DESCRIPTION OF THE DRAWINGS

[0018] Figure 1 It is a system principle diagram of an embodiment of the present invention; Figure 2 It is a method flow chart of an embodiment of the present invention; Figure 3 It is a circuit diagram of an embodiment of the present invention.

[0019] Description of the reference numerals of the main components: 1. Auxiliary control module; 2. Current display; 3. Selection circuit; 4. Signal inversion module; 6. Chip interface; 100. Test tooling; 200. Labeling machine; 301. PC terminal; 302. CAN receiver; 303. CAN control board; 304. PLC device; 305. Relay; 306. Load; 401. High voltage power supply; 402. Low voltage power supply. DETAILED DESCRIPTION

[0020] The following is an explanation of the embodiments of the present invention by specific examples. Those skilled in the art can easily understand other advantages and effects of the present invention from the contents disclosed in this specification. The present invention can also be implemented or applied through other different specific embodiments. The details in this specification can also be modified or changed in various ways based on different viewpoints and applications without departing from the spirit of the present invention. It should be noted that the following embodiments and features in the embodiments can be combined with each other without conflict.

[0021] It should be noted that the illustrations provided in the following embodiments are only schematic illustrations of the basic concept of the present invention. The illustrations only show the components related to the present invention rather than being drawn according to the number, shape and size of the components in actual implementation. In actual implementation, the type, quantity and proportion of each component can be changed at will, and the component layout type may also be more complicated.

[0022] The following is combined with Figure 1-3 The specific implementation methods of the present invention are further described. Example 1

[0023] The present invention discloses a PTC heater control panel test system, including a test fixture 100 , a load 306 test unit, a power supply test unit, and a labeling machine 200 .

[0024] The load 306 test unit includes a PC terminal 301, a CAN receiver 302, a CAN control board 303, a PLC device 304, a relay 305, and a load 306. The PC terminal 301, the CAN receiver 302, the CAN control board 303, the PLC device 304, the relay 305, the load 306, and the test fixture 100 are connected in sequence. The CAN control board 303 is connected to the bus of the test fixture 100 via the CAN network. The PC terminal 301 is connected to the power supply test unit via RS232 communication. The power supply test unit includes an insulation withstand voltage instrument, a high-voltage power supply 401 and a low-voltage power supply 402. The high-voltage power supply 401 and the low-voltage power supply 402 provide test power to the test fixture 100 respectively. The PC terminal 301 is also connected to the labeling machine 200 via a USB line.

[0025] This system has a simple structure and is easy to deploy. It can greatly reduce labor costs and construction costs and is very economical. Example 2

[0026] This embodiment provides a PTC heater control panel test method based on the first embodiment, using the above-mentioned PTC heater control panel test system, including the following steps: Step 1, wait for the sample communication connection, and start the test after the communication is successful; Step 2, relay 305 controls the high-voltage detection circuit to start, PC controls the high-voltage power supply 401 of the insulation withstand voltage tester to work, judges the high-voltage test result, relay 305 controls the function detection circuit to start, connects the external signal, judges the CAN message of the product, whether there is a fault report, if there is no fault, sends the sample to start working signal, judges the product CAN message, whether there is a fault report, whether the power is normal, if there is a fault, it is qualified; Step 3: The result voice prompts whether to issue the label, waits for the sample product to be taken away, disconnects the communication, and the voice prompts reset; Step 4, repeat steps 1-3.

[0027] This operation mode can effectively improve the level of intelligence, safety and reliability of operation. Through voice prompts, errors and omissions in the operation process can be avoided, operators can be reminded, and the detection work can be completed very efficiently. Example 3

[0028] refer to Figure 3 As shown, based on the above embodiment, the test fixture 100 can be further equipped with an auxiliary control module 1, a signal inversion module 4, a selection circuit 3, a current display 2, a test power source, a standard power source, a test pin and a test chip interface 6.

[0029] The auxiliary control module 1 is connected to a control end of the selection circuit 3 to provide a first control signal; the auxiliary control module 1 is connected to a second control end of the selection circuit 3 through a signal inversion module 4 to provide a second control signal opposite to the first control signal; the input end of the selection circuit 3 is connected to a test power source through a current display 2 and is also connected to a standard power source.

[0030] Preferably, the signal inversion module 4 includes a crystal switch tube Q4, a resistor R and an inversion power source, the inversion power source is connected to one end of the resistor R, the other end of the resistor R is connected to the first pin of the crystal switch tube Q4 and is used to output a second control signal, the second pin of the crystal switch tube Q4 is grounded, and the control end of the crystal switch tube Q4 is used to connect to the auxiliary control module 1.

[0031] Preferably, the selection circuit 3 includes a crystal switch tube Q1, a crystal switch tube Q2, and a crystal switch tube Q3, wherein the first pin of the crystal switch tube Q1 is used to connect to the current display 2, the second pin of the crystal switch tube Q1 is connected to the second pin of the crystal switch tube Q2, the first pin of the crystal switch tube Q2 is connected to the first pin of the crystal switch tube Q3, the second pin of the crystal switch tube Q3 is connected to a standard power source, the control ends of the crystal switch tubes Q1 and Q2 are connected together as the second control end, and the control end of the crystal switch tube Q3 serves as the first control end.

[0032] In this embodiment, the transistors Q1, Q2 and Q3 are PMOS transistors, which are turned on at a low level and turned off at a high level when working. The transistor Q4 is an NMOS transistor, which is just the opposite of the PMOS transistor when working, that is, turned on at a high level and turned off at a low level.

[0033] In order to detect more efficiently, multiple selection circuits 3 are provided and connected in parallel, so that detection can be performed simultaneously and detection time can be saved.

[0034] In order to meet different product testing requirements, the test chip interface 6 has multiple test pins, and the auxiliary control module 1 controls the selection circuit 3 to simultaneously provide the test power source corresponding to each test pin on the test chip interface 6. Selective connection can be performed as needed, thereby improving the detection range and adaptability.

[0035] In order to respond more effectively, the response time of the transistor switch Q3 is earlier than that of the transistor switch Q1 and the transistor switch Q2, and the response time of the transistor switch Q1 and the transistor switch Q2 are the same. The test power source can be connected after the standard power source is disconnected, thereby improving the reliability of the work.

[0036] In order to save electric energy, the signal output by the auxiliary control module 1 is a level signal, which includes a true signal and a virtual signal. In the initial state, the auxiliary control module 1 outputs a virtual signal by default, and the virtual signal is 0V voltage. In this way, in the initial state, it consumes very little power and can save a lot of electric energy.

[0037] When working, the test power source VTES1 or the test power source VTESn (n represents a natural number) can be provided to the chip for testing as required. There are many chips and pins on the chip on the control panel. The working conditions of multiple pins can be detected at the same time, which can greatly improve the product qualification rate. Example 4

[0038] Corresponding to the third embodiment, this embodiment also provides a PTC heater control panel test method, using the above-mentioned PTC heater control panel test system, first, the test chip interface 6 is connected to the PTC heater control panel, and the standard working state of the chip is obtained by connecting to a standard power source for power supply; Next, the auxiliary control module 1 switches the control signal, and the selection circuit 3 simultaneously provides different test power sources to the respective chip pins for testing, and the test status is fed back through the current display 2; Finally, whether there is a fault is determined by comparing the working state of the standard power source with the working state of different test power sources.

[0039] From the above, we can see that the use of this system can greatly save manpower and is very intelligent and automated; this system is simple to operate, efficient in operation, and can achieve quality inspection very safely and reliably, thereby improving the qualified rate of product samples leaving the warehouse; by testing the chip pins, it can more reliably ensure the qualification of product samples and improve detection efficiency.

[0040] The above embodiments are only illustrative of the principles and effects of the present invention, and are not intended to limit the present invention. Anyone familiar with the technology may modify or change the above embodiments without violating the spirit and scope of the present invention. Therefore, any equivalent changes made to the structure, shape, and principle of the present invention should be included in the protection scope of the present invention.

Claims

1. A PTC heater control panel test system, comprising a test fixture (100), a load (306) test unit, a power supply test unit, and a labeling machine (200); characterized in that: The load (306) test unit includes a PC end (301), a CAN receiver (302), a CAN control board (303), a PLC device (304), a relay (305), and a load (306). The PC end (301), the CAN receiver (302), the CAN control board (303), the PLC device (304), the relay (305), the load (306), and the test fixture (100) are connected in sequence. The CAN control board (303) is connected to the bus of the test fixture (100) via the CAN network; The PC end (301) is connected to a power supply test unit via RS232 communication, the power supply test unit comprising an insulation withstand voltage tester, a high voltage power supply (401) and a low voltage power supply (402), the high voltage power supply (401) and the low voltage power supply (402) respectively providing test power to the test fixture (100); The PC terminal (301) is also connected to the label machine (200) via a USB line.

2. The PTC heater control panel test system according to claim 1, characterized in that: The test fixture (100) is equipped with an auxiliary control module (1), a signal inversion module (4), a selection circuit (3), a current display (2), a test power source, a standard power source, a test pin and a test chip interface (6); The auxiliary control module (1) is connected to a control terminal of the selection circuit (3) and is used to provide a first control signal; The auxiliary control module (1) is connected to the second control terminal of the selection circuit (3) via the signal inversion module (4) to provide a second control signal opposite to the first control signal; The input end of the selection circuit (3) is connected to a test power source through a current display (2) and is also connected to a standard power source.

3. The PTC heater control panel test system according to claim 2, characterized in that: The signal inversion module (4) comprises a crystal switch tube Q4, a resistor R and an inversion power source, wherein the inversion power source is connected to one end of the resistor R, the other end of the resistor R is connected to a first pin of the crystal switch tube Q4 and is used to output a second control signal, the second pin of the crystal switch tube Q4 is grounded, and the control end of the crystal switch tube Q4 is used to connect to the auxiliary control module (1).

4. The PTC heater control panel test system according to claim 3, characterized in that: The selection circuit (3) comprises a crystal switch tube Q1, a crystal switch tube Q2, and a crystal switch tube Q3, wherein the first pin of the crystal switch tube Q1 is used to connect to the current display (2), the second pin of the crystal switch tube Q1 is connected to the second pin of the crystal switch tube Q2, the first pin of the crystal switch tube Q2 is connected to the first pin of the crystal switch tube Q3, the second pin of the crystal switch tube Q3 is connected to a standard power source, the control ends of the crystal switch tubes Q1 and Q2 are connected together as the second control end, and the control end of the crystal switch tube Q3 is used as the first control end.

5. The PTC heater control panel test system according to claim 4, characterized in that: The selection circuits (3) are arranged in plurality and are connected in parallel.

6. The PTC heater control panel test system according to claim 5, characterized in that: The test chip interface (6) has a plurality of test pins, and the auxiliary control module (1) controls the selection circuit (3) to simultaneously provide a test power source corresponding to each test pin on the test chip interface (6).

7. The PTC heater control panel testing system according to claim 6, characterized in that: The response time of the crystal switch tube Q3 is earlier than the response time of the crystal switch tube Q1 and the crystal switch tube Q2, and the response time of the crystal switch tube Q1 and the crystal switch tube Q2 are the same.

8. The PTC heater control panel testing system according to claim 1, characterized in that: The signal output by the auxiliary control module (1) is a level signal, which includes a true signal and a virtual signal. In the initial state, the auxiliary control module (1) outputs a virtual signal by default, and the virtual signal is a voltage of 0V.

9. A PTC heater control panel testing method, characterized in that: The PTC heater control panel testing system according to claim 1 comprises the following steps: Step 1, wait for the sample communication connection, and start the test after the communication is successful; Step 2, the relay (305) controls the high-voltage detection circuit to start, the PC controls the high-voltage power supply (401) of the insulation withstand voltage tester to work, and the high-voltage test result is judged. The relay (305) controls the function detection circuit to start, connects the external signal, judges the CAN message of the product, whether there is a fault report, if there is no fault, sends a sample start working signal, judges the CAN message of the product, whether there is a fault report, whether the power is normal, if there is a fault, it is judged as qualified; Step 3: The result voice prompts whether to issue the label, waits for the sample product to be taken away, disconnects the communication, and the voice prompts reset; Step 4, repeat steps 1-3.

10. A PTC heater control panel testing method, characterized in that: The PTC heater control panel test system according to claim 7 is used, firstly, the test chip interface (6) is connected to the PTC heater control panel, and a standard power source is connected to supply power to obtain a standard working state of the chip; Next, the auxiliary control module (1) switches the control signal, and the selection circuit (3) simultaneously supplies different test power sources to the respective chip pins to perform the test, and the test status is fed back through the current display (2); Finally, whether there is a fault is determined by comparing the working state of the standard power source with the working state of different test power sources.

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