IGBT aging test device

Abstract

An IGBT aging test device disclosed by the present invention comprises a test box and a control box connected with the test box, the control box comprises a controller, the test box comprises a plurality of test cabinets, each test cabinet comprises a loading assembly, a heat dissipation assembly and a driving assembly used for outputting test information, and the driving assembly is electrically connected with the controller. The driving assembly comprises a signal interface in signal connection with a to-be-tested piece, the heat dissipation assembly is arranged at the lower end of the loading assembly, the loading assembly comprises a first positioning piece, a uniform mounting plate, a plurality of temperature sensors and a plurality of heating pieces, the plurality of temperature sensors are uniformly distributed at the upper end of the mounting plate, and the plurality of heating pieces are uniformly arranged at the lower end of the mounting plate. The plurality of heating pieces and the plurality of temperature sensors are electrically connected with the controller, the first positioning piece is in sliding connection with the heat dissipation assembly, and the first positioning piece comprises a stabilizing piece used for stabilizing the to-be-tested piece. According to the utility model, the IGBT can be uniformly heated, and the heating temperature is easy to control, so that the aging test is accurate.

Description

Technical Field

[0001] The invention relates to the field of semiconductor aging testing, and in particular to an IGBT aging testing device. Background Art

[0002] With the development of electronic technology, IGBT is becoming more and more applicable, and the testing of IGBT is becoming more and more important, especially the aging test.

[0003] Since the size of IGBT is usually relatively large, during the aging test, when a general aging test device heats the IGBT, the IGBT is easily heated unevenly, resulting in inaccurate aging test of the IGBT.

[0004] Some aging test devices use gas heating to evenly heat the IGBT, but it is difficult to control the heating temperature. Summary of the invention

[0005] In order to overcome the deficiencies of the prior art, the object of the present invention is to provide an IGBT aging test device, which can heat the IGBT uniformly, easily control the heating temperature, and make the aging test accurate.

[0006] The purpose of the present invention is achieved by the following technical solutions: An IGBT aging test device comprises a test box and a control box connected to the test box, the control box comprises a controller, the test box comprises a plurality of test cabinets, the test cabinets comprise a loading assembly, a heat dissipation assembly and a driving assembly for outputting test information, the driving assembly is electrically connected to the controller, the driving assembly comprises a signal interface connected to a signal of a piece to be tested, the heat dissipation assembly is arranged at the lower end of the loading assembly, the loading assembly comprises a first positioning member, a uniform mounting plate, a plurality of temperature sensors and a plurality of heating members, the plurality of temperature sensors are uniformly distributed at the upper end of the mounting plate, the plurality of heating members are uniformly arranged at the lower end of the mounting plate, the plurality of heating members and the plurality of temperature sensors are all electrically connected to the controller, the first positioning member is slidably connected to the heat dissipation assembly, and the first positioning member comprises a stabilizing member for stabilizing the piece to be tested.

[0007] Preferably, the heat dissipation assembly includes a heat conducting plate, a heat dissipation plate and a plurality of first air ducts, the heat conducting plate is arranged between the mounting plate and the heat dissipation plate, and the plurality of first air ducts are all arranged at the lower end of the heat dissipation plate.

[0008] Preferably, the heating element is a heating rod, and a plurality of heating rods pass through the heat conducting plate. A first fan and a plurality of heat sinks are arranged in the first air duct, and the plurality of heat sinks are arranged at the lower end of the heat sink. The first fan is electrically connected to the controller.

[0009] Preferably, the loading assembly further comprises a second positioning member, the second positioning member is slidably connected to the heat dissipation assembly, the second positioning member comprises two moving members for moving the test piece, and the stabilizing member and the moving member are both located above the mounting plate.

[0010] Preferably, the first positioning member also includes two first slides and a first slide rail, the first slide rail slides along the X-axis with the heat dissipation component through the two first slides, and the stabilizing member slides along the Y-axis through the first slide rail; the second positioning member also includes two second slides and a second slide rail, the second slide rail slides along the X-axis with the heat dissipation component through the two second slides, and the two movable members slide along the Y-axis through the second slide rails.

[0011] Preferably, the test box further comprises a plurality of cabinets for loading the test cabinets, the test cabinets comprise a first slide, and each test cabinet is slidably disposed in the cabinet via the first slide.

[0012] Preferably, the test cabinet further includes a second air duct, a second fan is disposed in the cabinet, and an air outlet of the second fan is disposed opposite to the second air duct.

[0013] Preferably, the test cabinet further comprises a frame and a power supply, the upper end of the frame is provided with a second slide, the power supply is slidably connected to the frame via the second slide, and the cabinet is provided at the lower end of the frame.

[0014] Preferably, the IGBT aging test device further comprises a wind box, the wind box is arranged on a side of the test box, and a third air duct is arranged in the wind box.

[0015] Preferably, the controller is an industrial computer, and the control box further includes a keyboard and a display screen, and both the keyboard and the display screen are electrically connected to the industrial computer.

[0016] Compared with the prior art, the present invention has the following beneficial effects: The IGBT aging test device disclosed in the present application discloses a mounting plate and a plurality of heating elements, wherein the plurality of heating elements are evenly arranged at the lower end of the mounting plate, so that the mounting plate can be heated evenly, and the test piece mounted on the mounting plate can also be heated evenly, and the even mounting plate can evenly dissipate heat, so that the test piece can be heated evenly and the test is more accurate.

[0017] In addition, the present application also discloses a controller, a heat dissipation component and multiple temperature sensors. The multiple temperature sensors are evenly distributed on the upper end of the mounting plate. The temperature sensors can transmit temperature parameters to the controller. The controller can control the heating of the heating element or the heat dissipation of the heat dissipation component according to the temperature parameters, thereby easily controlling the temperature of the mounting plate and the test piece. BRIEF DESCRIPTION OF THE DRAWINGS

[0018] Figure 1 It is a schematic diagram of the three-dimensional structure of the IGBT aging test device of the present invention; Figure 2 It is a three-dimensional structural schematic diagram of the test box of the present invention; Figure 3 It is a schematic diagram of the three-dimensional structure of the test cabinet of the present invention; Figure 4 It is a three-dimensional structural schematic diagram of the loading assembly and the heat dissipation assembly of the present invention; Figure 5 It is a schematic diagram of the planar structure of the loading assembly and the heat dissipation assembly of the present invention; Figure 6 for Figure 5 Sectional view at A in the middle; Figure 7 for Figure 5 Sectional view at B in the middle; Figure 8 It is a three-dimensional structural schematic diagram of the cabinet of the present invention.

[0019] In the figure: 100, IGBT aging test device; 10, test box; 11, cabinet; 111, second fan; 112, power supply; 113, second slide; 12, test cabinet; 121, second air duct; 122, first slide; 123, stopper; 124, handle; 125, third slide; 126, heat dissipation hole; 13, loading assembly; 131, mounting plate; 132, heating element; 133, temperature sensor; 14, driving assembly; 141 , signal interface; 15, heat dissipation component; 151, first air duct; 152, heat sink; 153, slide bar; 154, heat conduction plate; 155, heat sink; 16, frame; 161, power supply; 17, first positioning member; 171, first slide member; 172, first slide rail; 173, stabilizing member; 18, second positioning member; 181, second slide member; 182, second slide rail; 183, moving member; 20, control box; 30, bellows; 31, third air duct. DETAILED DESCRIPTION

[0020] In order to more clearly understand the specific technical solutions, features and advantages of the present invention, the present invention is further described in detail below in conjunction with the accompanying drawings and specific implementation methods.

[0021] In the description of the present invention, it should be noted that the terms "upper", "lower", "left", "right", "lateral", "longitudinal", "horizontal", "inner", "outer", etc. indicate the orientation or position relationship based on the orientation or position relationship shown in the drawings, or the orientation or position relationship in which the product of the invention is usually placed when in use. They are only for the convenience of describing the present invention and simplifying the description, and do not indicate or imply that the device or element referred to must have a specific orientation, be constructed and operated in a specific orientation, and therefore cannot be understood as limiting the present invention. In addition, the terms "first", "second", "third", etc. are only used to distinguish the description, and cannot be understood as indicating or implying relative importance.

[0022] like Figure 1-Figure 5 As shown, the present application discloses an IGBT aging test device 100, which includes a test box 10 and a control box 20 connected to the test box 10, the control box 20 includes a controller (not shown), the test box 20 includes a plurality of test cabinets 12, the test cabinet 12 includes a loading component 13, a heat dissipation component 15 and a drive component 14 for outputting test information, the drive component 14 is electrically connected to the controller, the drive component includes a signal interface 141 connected to a signal of a device under test, the heat dissipation component 15 is arranged on the loading component 13, and the heat dissipation component 15 is arranged on the loading component 13. 3, the loading assembly 13 includes a first positioning member 17, a uniform mounting plate 131, a plurality of temperature sensors 133 and a plurality of heating members 132, the plurality of temperature sensors 133 are uniformly distributed on the upper end of the mounting plate 131, the plurality of heating members 132 are uniformly arranged on the lower end of the mounting plate 131, the plurality of heating members 132 and the plurality of temperature sensors 133 are electrically connected to the controller, the first positioning member 17 is slidably connected to the heat dissipation assembly 15, and the first positioning member 17 includes a stabilizing member 173 for stabilizing the piece to be tested.

[0023] In the above-mentioned embodiment, the IGBT aging test device 100 disclosed in the present application discloses a mounting plate 131 and a plurality of heating elements 132. The plurality of heating elements 132 are evenly arranged at the lower end of the mounting plate 131, so that the mounting plate 131 can be heated evenly, and the test piece mounted on the mounting plate 131 can also be heated evenly, and the even mounting plate 131 can evenly dissipate heat, so that the test piece is heated evenly and the test is more accurate. In addition, a plurality of temperature sensors 133 are evenly distributed at the upper end of the mounting plate 131, and the temperature sensors can transmit temperature parameters to the controller, and the controller can control the heating of the heating element 132 or the heat dissipation of the heat dissipation component 15 according to the temperature parameters, so that the temperature of the mounting plate 131 and the test piece can be easily controlled.

[0024] The controller can output a test signal to the drive component 14, and the drive component 14 can convert the test signal into test information. The signal interface 141 then transmits the test information to the device under test on the mounting plate 131 through a signal line or a power line, and the device under test (IGBT) is tested. Preferably, the uniform mounting plate 131 is a steel plate or a copper plate with uniform material and thickness. The first positioning member 17 is slidably connected to the heat dissipation component 15, and the stabilizing member 173 can be moved above the mounting plate 131. The stabilizing member 173 can support the device under test. The stabilizing member 173 can also be a stud or a clamping member to stabilize the device under test on the mounting plate 131.

[0025] In a preferred embodiment, Figure 1-Figure 3 As shown, the test box 10 also includes a plurality of cabinets 11 for loading the test cabinets 12. The test cabinets 12 include a frame 16, a power supply 112, a first slide 122 and a second air duct 121. Each test cabinet 12 is slidably disposed in the cabinet 11 through the first slide 122. Figure 8 As shown, a second fan 111 is disposed in the cabinet 11, and an air outlet of the second fan 111 is disposed opposite to the second air duct 121. A second slide 113 is disposed at the upper end of the frame 16, and the power supply 112 is slidably connected to the frame 16 through the second slide 113, and the cabinet 11 is disposed at the lower end of the frame 11.

[0026] In the above embodiment, the first slide 122 facilitates the sliding of the test cabinet 12 in the cabinet body 11, and the second slide 113 facilitates the sliding of the power supply 112 on the frame 16. The second fan 111 supplies the second air duct 121, and the second air duct 121 supplies air to the first air duct 151. The test cabinet 12 is also provided with heat dissipation holes 126 to facilitate heat dissipation. The power supply 112 is used to supply power to the test cabinet 12 and the controller. In order to facilitate the sliding of the test cabinet 12, a cabinet door is also provided on the cabinet body 11, and a handle 124 is provided at one end of the test cabinet 12 close to the cabinet door. In order to position the test cabinet 12, a stopper 123 is also provided on the test cabinet 12.

[0027] In a preferred embodiment, Figure 3-Figure 5As shown, the loading assembly 13 further includes a second positioning member 18, which is slidably connected to the heat dissipation assembly 15, and the second positioning member 18 includes two moving members 183 for moving the test piece, and the stabilizing member 173 and the moving member 183 are both located above the mounting plate 131. The first positioning member 17 further includes two first slides 171 and a first slide rail 172, the first slide rail 172 slides along the X-axis with the heat dissipation assembly 15 through the two first slides 171, and the stabilizing member 173 slides along the Y-axis through the first slide rail 172; the second positioning member 18 further includes two second slides 181 and a second slide rail 182, the second slide rail 182 slides along the X-axis with the heat dissipation assembly 15 through the two second slides 181, and the two moving members 183 slide along the Y-axis through the second slide rail 182.

[0028] In the above embodiment, a slide bar 153 is provided on the side wall of the heat dissipation component 15, and the first slide member 171 and the second slide member 181 can be slidably connected to the heat dissipation component 15 through the slide bar 153. Preferably, the two moving members 183 can be clamping members, and the two moving members 183 can clamp the test piece, and the moving members 183 can slide along the X axis along the second slide rail 182, and the second slide rail 182 can slide along the Y axis through the slide member, so the two moving members 183 can clamp the test piece to slide on the mounting plate 131, so that the test piece is moved to a suitable test position for heating or heat dissipation. The stabilizing member 173 can also be moved to the test piece through the first slide rail 172 and the first slide member 171 to stabilize the test piece, and the two moving members 183 and the stabilizing member 173 can form a triangle to make the test piece more stable.

[0029] In a preferred embodiment, Figure 4-Figure 7 As shown, the heat dissipation assembly 15 includes a heat conducting plate 154, a heat dissipation plate 155 and a plurality of first air ducts 151, wherein the heat conducting plate 154 is disposed between the mounting plate 131 and the heat dissipation plate 155, and the plurality of first air ducts 151 are disposed at the lower end of the heat dissipation plate 155. The heating element 132 is a heating rod, and the plurality of heating rods all pass through the heat conducting plate 154. A first fan and a plurality of heat dissipation fins 152 are disposed in the first air duct 151, and the plurality of heat dissipation fins 152 are disposed at the lower end of the heat dissipation plate 155, and the first fan is electrically connected to the controller.

[0030] In the above embodiment, the controller can control the start and stop of the first fan, the speed and the temperature rise of the heating rod, the first air duct 151 is connected to the driving assembly 14, and is conducive to the heat dissipation of the heat dissipation plate 155 and the driving assembly 14, and the heat conduction plate 155 is conducive to heat dissipation and the heat of the heating rod is transferred to the mounting plate 131. The heat conduction plate 154 and the heat dissipation plate 155 can be copper plates or aluminum plates.

[0031] In a preferred embodiment, Figure 1 As shown, the controller is an industrial computer, and the control box 20 also includes a keyboard and a display screen, and the keyboard and the display screen are both electrically connected to the industrial computer. The IGBT aging test device 100 also includes a bellows 30, which is arranged on the side of the test box 10, and a third air duct 31 is arranged in the bellows 30.

[0032] In the above embodiment, the keyboard is used to operate the industrial computer, the display screen is used to display test data, and a third fan is also provided in the third air duct 31. The third fan is electrically connected to the industrial computer and is used to dissipate heat from the test box.

[0033] In summary, the IGBT aging test device 100 disclosed in the present application can heat the mounting plate 131 evenly by evenly arranging a plurality of heating elements 132 at the lower end of the mounting plate 131. The even mounting plate 131 can also evenly dissipate heat, so that the device to be tested is evenly heated and the test is more accurate. The controller can control the heating element 132 to heat or the heat dissipation component 15 to dissipate heat according to the temperature parameter, so that the temperature of the mounting plate 131 and the device to be tested can be easily controlled.

[0034] The basic principles, main features and advantages of the present invention are shown and described above. Those skilled in the art should understand that the present invention is not limited to the above embodiments. The above embodiments and the description in the specification are only to illustrate the principles of the present invention. Without departing from the spirit and scope of the present invention, the present invention may have various changes and improvements, which fall within the scope of the present invention to be protected. The scope of protection of the present invention is defined by the attached claims and their equivalents.

Claims

1. An IGBT aging test device, comprising a test box and a control box connected to the test box, the control box comprising a controller, the test box comprising a plurality of test cabinets, the test cabinet comprising a loading assembly, a heat dissipation assembly and a drive assembly for outputting test information, the drive assembly being electrically connected to the controller, the drive assembly comprising a signal interface connected to a signal of a device under test, the heat dissipation assembly being arranged at the lower end of the loading assembly, characterized in that: The loading assembly includes a first positioning member, a uniform mounting plate, a plurality of temperature sensors and a plurality of heating members, wherein the plurality of temperature sensors are uniformly distributed on the upper end of the mounting plate, and the plurality of heating members are uniformly arranged on the lower end of the mounting plate. The plurality of heating members and the plurality of temperature sensors are electrically connected to the controller, and the first positioning member is slidably connected to the heat dissipation assembly, and the first positioning member includes a stabilizing member for stabilizing the test member.

2. The IGBT aging test device according to claim 1, characterized in that: The heat dissipation assembly includes a heat conduction plate, a heat dissipation plate and a plurality of first air ducts. The heat conduction plate is arranged between the mounting plate and the heat dissipation plate, and the plurality of first air ducts are all arranged at the lower end of the heat dissipation plate.

3. The IGBT aging test device according to claim 2, characterized in that: The heating element is a heating rod, and a plurality of heating rods all pass through the heat conducting plate. A first fan and a plurality of heat sinks are arranged in the first air duct, and the plurality of heat sinks are all arranged at the lower end of the heat sink. The first fan is electrically connected to the controller.

4. The IGBT aging test device according to claim 1, characterized in that: The loading assembly further comprises a second positioning member, the second positioning member is slidably connected to the heat dissipation assembly, the second positioning member comprises two moving members for moving the test piece, and the stabilizing member and the moving member are both located above the mounting plate.

5. The IGBT aging test device according to claim 4, characterized in that: The first positioning member also includes two first slides and a first slide rail, the first slide rail slides along the X-axis with the heat dissipation component through the two first slides, and the stabilizing member slides along the Y-axis through the first slide rail; the second positioning member also includes two second slides and a second slide rail, the second slide rail slides along the X-axis with the heat dissipation component through the two second slides, and the two moving members slide along the Y-axis through the second slide rails.

6. The IGBT aging test device according to claim 1, characterized in that: The test box further comprises a plurality of cabinet bodies for loading the test cabinets. The test cabinet comprises a first slideway, and each test cabinet is slidably disposed in the cabinet body via the first slideway.

7. The IGBT aging test device according to claim 6, characterized in that: The test cabinet further includes a second air duct. A second fan is disposed in the cabinet, and an air outlet of the second fan is disposed opposite to the second air duct.

8. The IGBT aging test device according to claim 7, characterized in that: The test cabinet further comprises a frame and a power supply. A second slide is arranged at the upper end of the frame. The power supply is slidably connected to the frame via the second slide. The cabinet is arranged at the lower end of the frame.

9. The IGBT aging test device according to claim 1, characterized in that: The IGBT aging test device further comprises a wind box, which is arranged on the side of the test box, and a third air duct is arranged in the wind box.

10. The IGBT aging test device according to claim 1, characterized in that: The controller is an industrial computer, and the control box further comprises a keyboard and a display screen, and both the keyboard and the display screen are electrically connected to the industrial computer.

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