Alloy sampling resistor surface temperature detection device

Abstract

The invention provides a surface temperature detection device for an alloy sampling resistor. The surface temperature detection device comprises an intermittent transmission mechanism and a detection mechanism, the intermittent transmission mechanism comprises a guide rail, a carrying arm and a plurality of jigs located on the guide rail, the carrying arm is used for stirring the jigs to slide along the guide rail, and the jigs are provided with a plurality of limiting rods; the detection mechanism comprises a sliding table, an isolation box and a monitoring support, the isolation box and the monitoring support are located on the sliding table, a power connection terminal is arranged on the side, facing the guide rail, of the sliding table, a plurality of temperature sensors are arranged on the monitoring support, and the temperature sensors are used for making contact with the to-be-detected alloy sampling resistors on the limiting rods. During testing, the isolation box separates the to-be-tested alloy sampling resistor from the external space, so that the influence of the external environment temperature on the detection value is reduced; the temperature sensor is in direct contact with the to-be-detected alloy sampling resistor to detect the surface temperature, so that the detection precision is improved; the surface temperatures of a plurality of to-be-detected alloy sampling resistors can be detected at the same time through a single detection action, and the detection efficiency is improved.

Description

Technical Field

[0001] The invention relates to the field of alloy sampling resistor detection, and in particular to a device for detecting the surface temperature of an alloy sampling resistor. Background Art

[0002] Alloy sampling resistors can feedback the change of current in the circuit and are mainly used in battery protection boards, inverters, lamps, motors and other products. In order to ensure the quality of alloy sampling resistors, surface temperature detection is required before shipment. Detecting and analyzing the surface temperature data is helpful to timely discover and solve problems with the product.

[0003] There are several reasons for monitoring the surface temperature of the alloy sampling resistor:

[0004] 1. Prevent overheating damage: When current passes through a resistor, heat is generated. If the heat dissipation capacity of the resistor is insufficient to cope with the generated heat, its surface temperature will continue to rise, which may reach the melting point of the material or cause excessive thermal stress, thus causing physical damage to the resistor or performance degradation. By testing the surface temperature, the heating of the resistor can be monitored in real time to avoid overheating damage.

[0005] 2. Ensure measurement accuracy: The resistance of a resistor usually changes with temperature, and this change is called the temperature coefficient (TCR). For applications that require high-precision measurements, temperature changes in resistors may introduce significant measurement errors. Testing the surface temperature of a resistor during current loading can help evaluate the impact of temperature on measurement accuracy and take appropriate compensation measures to improve measurement accuracy.

[0006] 3. Evaluate heat dissipation performance: The heat dissipation performance of the resistor directly affects its stability and life during use. By testing the surface temperature of the resistor during current loading, its heat dissipation efficiency can be evaluated, and the heat dissipation design can be optimized accordingly, such as increasing the heat dissipation area, using heat sinks, etc., to improve the resistance's carrying capacity and stability.

[0007] 4. Compliance with standards and specifications: Many industry standards or specifications have clear requirements for the temperature of resistors under specific working conditions. Testing the surface temperature of resistors can ensure that the product meets these standards and specifications, thereby meeting market access requirements and improving the market competitiveness of products.

[0008] 5. Predicting life: The life of a resistor is closely related to its operating temperature. Too high an operating temperature will accelerate the aging process of the resistor and shorten its service life. By testing the surface temperature of the resistor during current loading, its service life can be predicted, providing data support for product maintenance and replacement.

[0009] In the existing scheme, thermal imagers are mainly used to monitor the surface temperature of alloy sampling resistors. However, thermal imagers can only detect a single resistor in the loading process at a time, and the temperature change and then stabilization after the resistor is powered on is a continuous process. In order to meet production needs, multiple thermal imagers need to be configured to improve the detection efficiency. The production cost of the detection equipment is high and the efficiency is low. On the other hand, the use of thermal imagers is limited by the ambient temperature and cannot detect the surface temperature data of the resistor in a high temperature environment for a long time.

[0010] Among the products currently using alloy sampling resistors, there are categories that are prone to heat, such as motors, battery modules, etc. The heat generated by these products during operation will cause the ambient temperature of the location where the alloy sampling resistor is located to fluctuate, thereby affecting the change in the resistance value of the alloy sampling resistor itself. The existing detection equipment cannot simulate the actual working environment of the alloy sampling resistor, and the existing detection tools have weak detection capabilities for the surface temperature of the alloy sampling resistor in a high temperature environment. For example, the normal working environment temperature of the thermal imager is between -20℃ and 55℃. When the ambient temperature exceeds this value, the actual surface temperature of the alloy sampling resistor cannot be effectively detected.

[0011] Based on the above problems, it is necessary to improve the existing temperature detection equipment. While improving the temperature detection efficiency and reducing the interference of external factors on the monitoring data, it also considers the influence of different ambient temperatures on the surface temperature of the alloy sampling resistor, thereby improving the comprehensiveness and accuracy of the surface temperature monitoring of the alloy sampling resistor. Summary of the invention

[0012] The purpose of the present invention is to overcome the shortcomings of the prior art and provide an alloy sampling resistor surface temperature detection device, which not only improves the temperature detection efficiency and reduces the interference of external factors on the monitoring data, but also takes into account the influence of different ambient temperatures on the surface temperature of the alloy sampling resistor, thereby improving the comprehensiveness and accuracy of the alloy sampling resistor surface temperature monitoring.

[0013] The objective of the present invention is achieved through the following technical solutions:

[0014] A device for detecting the surface temperature of an alloy sampling resistor, comprising: an intermittent transmission mechanism and a detection mechanism;

[0015] The intermittent transmission mechanism includes a guide rail, a transport arm and a plurality of jigs located on the guide rail, wherein the transport arm is used to move the jigs to slide along the guide rail, and each of the jigs is provided with a plurality of limit rods;

[0016] The detection mechanism includes a slide, an isolation box and a monitoring bracket located on the slide. The slide is used to drive the isolation box and the monitoring bracket to approach or move away from the guide rail. The slide is provided with power terminals and a rheostat. The monitoring bracket is provided with multiple temperature sensors. The temperature sensors are used to contact the alloy sampling resistor to be tested on the limit rod.

[0017] In one embodiment, the detection mechanism also includes a heater and a thermally conductive seat, the heater is embedded in the thermally conductive seat, a plurality of temperature-controlled chambers are provided on the thermally conductive seat, the power terminal is located in the temperature-controlled chamber, and each temperature-controlled chamber can accommodate an alloy sampling resistor to be tested; the temperature sensor is provided with a probe, and the probe faces the thermally conductive seat; the monitoring bracket is slidably connected to the slide, and a cylinder is provided on the slide, and the cylinder is used to drive the monitoring bracket to approach or move away from the thermally conductive seat so that the probe extends into or away from the temperature-controlled chamber.

[0018] In one embodiment, a heat insulating layer is provided on the outer sides of the monitoring bracket and the heat conducting seat.

[0019] In one of the embodiments, a heat insulation plate is provided between the heat conducting seat and the slide table.

[0020] In one embodiment, the fixture is provided with a socket, and the socket is provided with a plurality of grooves, and the grooves are used to accommodate the limiting rods.

[0021] In one embodiment, the transport arm includes a transverse driving part, a carrier plate, a longitudinal driving part and a picking rod, the carrier plate and the longitudinal driving part are arranged on the transverse driving part, the transverse driving part is used to drive the carrier plate to reciprocate along the extension direction of the guide rail, the longitudinal driving part is used to drive the picking rod to approach or move away from the guide rail, and the picking rod is provided with a limiting groove matching the socket.

[0022] In one embodiment, the limiting rod is detachably connected to the socket.

[0023] In one of the embodiments, a positioning pin matching the limiting rod is provided in the groove.

[0024] In one of the embodiments, a material unloading platform is provided at the end of the guide rail.

[0025] In one embodiment, the limiting rod extends toward the side where the detection mechanism is located, and the end of the limiting rod is suspended outside the guide rail.

[0026] The above alloy sampling resistor surface temperature detection device has the following advantages:

[0027] 1. An isolation box is provided to separate the alloy sampling resistor to be tested from the external space during the test, reducing the interference of external factors on the detection value;

[0028] 2. The isolation box can be used to reduce the interference of external factors, and the surface temperature change of the alloy after the resistance is connected to electricity under the influence of different ambient temperatures can be measured, making the detection value more comprehensive;

[0029] 3. The temperature sensor directly contacts the sampling resistor of the alloy to be tested to detect its surface temperature, thereby improving the detection accuracy;

[0030] 4. A single detection action can simultaneously measure the surface temperature of multiple alloy sampling resistors to be tested, thereby improving detection efficiency. BRIEF DESCRIPTION OF THE DRAWINGS

[0031] In order to more clearly illustrate the technical solutions of the embodiments of the present invention, the drawings required for use in the embodiments are briefly introduced below. It should be understood that the following drawings only show certain embodiments of the present invention and therefore should not be regarded as limiting the scope. For ordinary technicians in this field, other related drawings can be obtained based on these drawings without creative work.

[0032] Figure 1 It is a structural schematic diagram of the surface temperature detection device of the alloy sampling resistor;

[0033] Figure 2 It is a schematic diagram of the external structure of the testing mechanism;

[0034] Figure 3 This is a schematic diagram of the split location of the isolation box;

[0035] Figure 4 It is a schematic diagram of the cooperation between the heater and the thermal seat;

[0036] Figure 5 It is a schematic diagram of the coordination between the monitoring bracket and the slide;

[0037] Figure 6 is a cross-sectional schematic diagram of the detection mechanism;

[0038] Figure 7 It is a schematic diagram of the state where the probe contacts the alloy sampling resistor;

[0039] Figure 8 This is a schematic diagram of the structure of the fixture.

[0040] Figure numerals: 10, alloy sampling resistor surface temperature detection device; 100, intermittent transmission mechanism; 110, guide rail; 111, unloading platform; 120, carrying arm; 121, lateral drive unit; 122, carrier plate; 123, longitudinal drive unit; 124, picking rod; 130, fixture; 131, limit rod; 132, socket; 1321, groove; 1322, positioning pin; 200, detection mechanism; 210, slide; 211, power terminal; 212, cylinder; 220, isolation box; 230, monitoring bracket; 240, temperature sensor; 241, probe; 250, heater; 260, thermal seat; 261, control room; 270, insulation layer; 280, insulation board. DETAILED DESCRIPTION

[0041] In order to facilitate the understanding of the present invention, the present invention will be described more fully below with reference to the relevant drawings. The preferred embodiments of the present invention are given in the drawings. However, the present invention can be implemented in many different forms and is not limited to the embodiments described herein. On the contrary, the purpose of providing these embodiments is to make the disclosure of the present invention more thoroughly understood.

[0042] It should be noted that when an element is referred to as being "fixed to" another element, it may be directly on the other element or there may be a central element. When an element is considered to be "connected to" another element, it may be directly connected to the other element or there may be a central element at the same time. The terms "vertical", "horizontal", "left", "right" and similar expressions used herein are for illustrative purposes only and do not represent the only implementation method.

[0043] Unless otherwise defined, all technical and scientific terms used herein have the same meaning as those commonly understood by those skilled in the art of the present invention. The terms used herein in the specification of the present invention are only for the purpose of describing specific embodiments and are not intended to limit the present invention. The term "and / or" used herein includes any and all combinations of one or more related listed items.

[0044] See also Figure 1 The present invention provides an alloy sampling resistor surface temperature detection device 10, which includes: an intermittent transmission mechanism 100 and a detection mechanism 200.

[0045] See also Figure 1 and Figure 8The intermittent transmission mechanism 100 includes a guide rail 110, a transport arm 120, and a plurality of jigs 130 located on the guide rail 110. The transport arm 120 is used to move the jig 130 to slide along the guide rail 110. Each jig 130 is provided with a plurality of limit rods 131. The limit rods 131 are used to fix the alloy sampling resistor 20 to be tested. Preferably, the limit rods 131 extend toward the side where the detection mechanism 200 is located, and the end of the limit rods 131 is suspended outside the guide rail 110.

[0046] See also Figure 1 , the detection mechanism 200 is located on the extension track of the guide rail 110;

[0047] See also Figure 2 and Figure 3 The detection mechanism 200 includes a slide 210 and an isolation box 220 and a monitoring bracket 230 located on the slide 210. The slide 210 is used to drive the isolation box 220 and the monitoring bracket 230 to approach or move away from the guide rail 110. The slide 210 is provided with a power terminal 211 and a variable resistor (not shown in the figure). The monitoring bracket 230 is provided with a plurality of temperature sensors 240. The temperature sensor 240 is used to contact the sampling resistor of the alloy to be tested on the limit rod 131.

[0048] See also Figures 4 to 7 The working principle of the alloy sampling resistor surface temperature detection device 10 is as follows:

[0049] The alloy sampling resistors 20 to be tested are stacked on the fixture 130 , and one alloy sampling resistor 20 to be tested is placed on each limit rod 131 ;

[0050] When the transport arm 120 is started, the jig 130 storing the alloy sampling resistor 20 to be tested is moved forward along the guide rail 110;

[0051] The detection mechanism 200 is located on the extension track of the guide rail 110. The transport arm 120 moves one of the fixtures 130 to the position of the detection mechanism 200 and then pauses. The slide 210 moves toward the position of the guide rail 110 so that the power terminal 211 contacts the pins on the alloy sampling resistor 20 to be tested. At this time, the isolation box 220 covers the alloy sampling resistor 20 to be tested.

[0052] Next, the power terminal 211 is powered on, and after being kept in the powered state, the temperature sensor 240 on the monitoring bracket 230 collects the surface temperature value of the alloy sampling resistor 20 at this time;

[0053] After the detection action is completed, the slide 210 moves away from the guide rail 110, and the transport arm 120 starts again to move the fixture 130 away, and at the same time moves the next fixture 130 to the location of the detection mechanism 200 to prepare for the next detection.

[0054] It can be seen that the fixture 130 is provided with multiple limit rods 131, which can simultaneously carry multiple alloy sampling resistors 20 to be tested, and the monitoring bracket 230 is configured with multiple temperature sensors 240, which can simultaneously collect surface temperature data of multiple alloy sampling resistors 20 in a single detection action, thereby improving the detection efficiency.

[0055] It should be emphasized that during the detection process, the power terminal 211 is connected to the pin of the alloy sampling resistor 20. The power terminal 211 makes the alloy sampling resistor 20 conductive with the power supply, allowing the alloy sampling resistor 20 to be connected to the circuit. The temperature sensor 240 collects the change in surface temperature of the alloy sampling resistor 20 after it is powered on. The variable resistor can change the magnitude of the current passed into the alloy sampling resistor 20, allowing the temperature sensor 240 to detect the surface temperature value of the alloy sampling resistor 20 under different currents. According to the change in its surface temperature value under different currents, it is judged whether the alloy sampling resistor 20 meets the standard, thereby improving the accuracy of the detection.

[0056] It should be noted that by using a variable resistor to change the current connected to the alloy sampling resistor 20, the value of the surface temperature change of the alloy sampling resistor 20 under different currents can be obtained, thereby judging whether the various performances of the alloy sampling resistor 20 meet the standards, and isolating it through the isolation box 220, eliminating the interference of external factors on the test results. However, among the products using the alloy sampling resistor 20, there are categories that are easy to generate heat, such as motors, battery modules, etc. The heat generated by these products during operation will cause the ambient temperature at the location of the alloy sampling resistor 20 to fluctuate, thereby affecting the change of the resistance value of the alloy sampling resistor 20 itself, and the existing detection equipment cannot simulate the actual working environment of the alloy sampling resistor 20, and the existing detection tools have weak detection capabilities for the surface temperature of the alloy sampling resistor 20 in a high temperature environment. For example, the normal working environment temperature of the thermal imager is between -20°C and 55°C. When the ambient temperature exceeds this value, the actual surface temperature of the alloy sampling resistor 20 cannot be effectively detected.

[0057] In order to make the detection results of the alloy sampling resistor surface temperature detection device 10 more reliable, the following improvements are made:

[0058] See also Figure 5 and Figure 7 The detection mechanism 200 further includes a heater 250 and a heat-conducting seat 260. The heater 250 is embedded in the heat-conducting seat 260. The heat-conducting seat 260 is provided with a plurality of control chambers 261. The power connection terminal 211 is located in the control chambers 261. Each control chamber 261 can accommodate an alloy sampling resistor 20 to be tested.

[0059] See also Figure 6 , the temperature sensor 240 is provided with a probe 241, and the probe 241 faces the heat transfer seat 260;

[0060] The monitoring bracket 230 is slidably connected to the slide 210 . The slide 210 is provided with a cylinder 212 . The cylinder 212 is used to drive the monitoring bracket 230 to approach or move away from the heat-conducting seat 260 so that the probe 241 extends into or moves away from the temperature-controlled chamber 261 .

[0061] After the improvement, the detection mechanism 200 can detect the change in the surface temperature of the alloy sampling resistor 20 under different ambient temperatures. The specific process is as follows:

[0062] After the slide 210 moves toward the position of the guide rail 110, the limit rod 131 is inserted into the temperature control chamber 261. At this time, each temperature control chamber 261 contains an alloy sampling resistor 20 to be tested, and at this time, the alloy sampling resistor 20 to be tested is in contact with the power terminal 211, and the alloy sampling resistor 20 to be tested is turned on;

[0063] The cylinder 212 pushes the monitoring bracket 230 to slide, so that the probe 241 extends into the temperature control chamber 261 and contacts the alloy sampling resistor 20. The temperature sensor 240 collects the surface temperature value of the alloy sampling resistor 20 at room temperature. The cylinder 212 retracts, so that the probe 241 leaves the temperature control chamber 261.

[0064] Next, the heater 250 starts to heat the heat-conducting seat 260 until the temperature in the control room 261 rises to the target value, and the cylinder 212 pushes the monitoring bracket 230 again to make the probe 241 contact the alloy sampling resistor 20, and the temperature sensor 240 collects the surface temperature value of the alloy sampling resistor 20 at this temperature, and after the collection is completed, the cylinder 212 retracts again;

[0065] By analogy, the heater 250 continuously increases the temperature in the control chamber 261, and each time the temperature in the control chamber 261 rises, the cylinder 212 is started to make the probe 241 contact the alloy sampling resistor 20, and the surface temperature values ​​of the alloy sampling resistor 20 under different ambient temperatures are collected.

[0066] It should be noted that the isolation box 220 and the temperature control chamber 261 are double isolated, so that the alloy sampling resistor 20 to be tested is in a relatively stable temperature environment, which can ensure the accuracy of the test value.

[0067] In summary, the alloy sampling resistor surface temperature detection device 10 has the following advantages:

[0068] 1. The variable resistor changes the current size connected to the alloy sampling resistor 20 to be tested, and can detect the change of the surface temperature of the alloy sampling resistor 20 under different working currents, thereby improving the reliability of the detection value;

[0069] 2. The alloy sampling resistor 20 is detected under different temperatures by cooperating with the heater 250 and the thermal seat 260 to obtain the change of the surface temperature of the alloy sampling resistor 20 under different ambient temperatures, so that the detection value of the alloy sampling resistor surface temperature detection device 10 is more comprehensive, and the reliability of the detection value is further improved.

[0070] See also Figure 3 In one embodiment, the outer sides of the monitoring bracket 230 and the heat-conducting seat 260 are provided with a heat-insulating layer 270, and a heat-insulating plate 280 is provided between the heat-conducting seat 260 and the slide 210. The heat-insulating layer 270 and the heat-insulating plate 280 cooperate to slow down the speed at which the temperature in the control room 261 dissipates outward, so that the temperature in the control room 261 is kept stable, and the temperature fluctuation is reduced, thereby improving the accuracy of the resistor 20 used for the alloy.

[0071] See also Figure 8 In one embodiment, a socket 132 is provided on the fixture 130, and a plurality of grooves 1321 are provided on the socket 132, and the grooves 1321 are used to accommodate the limit rod 131. The limit rod 131 and the socket 132 are detachably connected, and a positioning pin 1322 matching the limit rod 131 is provided in the groove 1321. The limit rod 131 is replaceable, so that the alloy sampling resistor surface temperature detection device 10 can adapt to alloy sampling resistors 20 of different specifications.

[0072] See also Figure 1 In one embodiment, the transport arm 120 includes a transverse driving portion 121, a carrier plate 122, a longitudinal driving portion 123 and a picking rod 124. The carrier plate 122 and the longitudinal driving portion 123 are arranged on the transverse driving portion 121. The transverse driving portion 121 is used to drive the carrier plate 122 to reciprocate along the extension direction of the guide rail 110. The longitudinal driving portion 123 is used to drive the picking rod 124 to approach or move away from the guide rail 110. A limiting groove matching the socket 132 is opened on the picking rod 124, and a material unloading platform 111 is provided at the end of the guide rail 110.

[0073] The above-mentioned embodiments only express several implementation methods of the present invention, and the descriptions thereof are relatively specific and detailed, but they cannot be understood as limiting the scope of the invention patent. It should be pointed out that, for ordinary technicians in this field, several variations and improvements can be made without departing from the concept of the present invention, and these all belong to the protection scope of the present invention. Therefore, the protection scope of the patent of the present invention shall be subject to the attached claims.

Claims

1. A surface temperature detection device for an alloy sampling resistor, characterized in that: include: Intermittent transmission mechanism and detection mechanism; The intermittent transmission mechanism includes a guide rail, a transport arm and a plurality of jigs located on the guide rail, wherein the transport arm is used to move the jigs to slide along the guide rail, and each of the jigs is provided with a plurality of limit rods; The detection mechanism includes a slide, an isolation box and a monitoring bracket located on the slide. The slide is used to drive the isolation box and the monitoring bracket to approach or move away from the guide rail. The slide is provided with power terminals and a rheostat. The monitoring bracket is provided with multiple temperature sensors. The temperature sensors are used to contact the alloy sampling resistor to be tested on the limit rod.

2. The alloy sampling resistor surface temperature detection device according to claim 1, characterized in that: The detection mechanism also includes a heater and a heat-conducting seat, wherein the heater is embedded in the heat-conducting seat, and a plurality of temperature-controlled chambers are provided on the heat-conducting seat, wherein the power connection terminal is located in the temperature-controlled chambers, and each temperature-controlled chamber can accommodate an alloy sampling resistor to be tested; The temperature sensor is provided with a probe, and the probe faces the heat-conducting seat; the monitoring bracket is slidably connected to the slide, and a cylinder is provided on the slide, and the cylinder is used to drive the monitoring bracket to approach or move away from the heat-conducting seat so that the probe extends into or away from the temperature-controlled room.

3. The alloy sampling resistor surface temperature detection device according to claim 2, characterized in that: The outer sides of the monitoring bracket and the heat-conducting seat are both provided with a heat insulation layer.

4. The alloy sampling resistor surface temperature detection device according to claim 2, characterized in that: A heat insulation plate is provided between the heat conducting seat and the slide table.

5. The alloy sampling resistor surface temperature detection device according to claim 1, characterized in that: The fixture is provided with a socket, and the socket is provided with a plurality of grooves, and the grooves are used to accommodate the limiting rods.

6. The alloy sampling resistor surface temperature detection device according to claim 5, characterized in that: The transport arm includes a transverse driving part, a carrier plate, a longitudinal driving part and a picking rod. The carrier plate and the longitudinal driving part are arranged on the transverse driving part. The transverse driving part is used to drive the carrier plate to reciprocate along the extension direction of the guide rail. The longitudinal driving part is used to drive the picking rod to approach or move away from the guide rail. The picking rod is provided with a limiting groove matching the socket.

7. The alloy sampling resistor surface temperature detection device according to claim 5, characterized in that: The limiting rod is detachably connected to the socket.

8. The alloy sampling resistor surface temperature detection device according to claim 5, characterized in that: A positioning pin matching the limiting rod is arranged in the groove.

9. The alloy sampling resistor surface temperature detection device according to claim 1, characterized in that: A material unloading platform is arranged at the end of the guide rail.

10. The alloy sampling resistor surface temperature detection device according to claim 1, characterized in that: The limiting rod extends toward the side where the detection mechanism is located, and the end of the limiting rod is suspended outside the guide rail.

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