Test fixture, upper computer and test system

Abstract

The invention relates to the field of chips, and particularly discloses a test fixture, an upper computer and a test system, the test fixture is connected with an external power supply, the test fixture is used for testing a to-be-tested storage device, the test fixture comprises a circuit board, and the circuit board is provided with a main control chip and a plurality of connectors; the power supply input end of the main control chip is connected with the external power supply, the power supply output end of the main control chip is connected with the plurality of connectors, and the plurality of connectors are used for connecting the to-be-tested storage devices of different protocol types; and the main control chip is used for monitoring the current flowing through the storage device to be tested, uploading the monitoring data to the upper computer for analysis and calculating the power consumption. According to the method, the power consumption of the to-be-tested storage devices with various different interface types can be quickly and conveniently tested.

Description

Technical Field

[0001] The present application relates to the field of chips, and in particular to a test fixture, a host computer and a test system. Background Art

[0002] Current test fixtures are all based on a single type of interface. For example, the USB interface adapter voltage, current and power consumption test fixture requires manual welding of wires for each test of the voltage, current and power consumption data of storage devices with different interfaces, which is not convenient for manual testing and for testers to quickly get started.

[0003] Even if the voltage and current test equipment is manually welded with wires to adapt to different interfaces, different commands still need to be manually input during testing to perform voltage, current and power consumption tests at different stages, which is very inconvenient, time-consuming and labor-intensive.

[0004] Therefore, how to conveniently and quickly test the actual power consumption of storage devices to be tested with different interface types has become an urgent problem to be solved in the art. Summary of the invention

[0005] The purpose of the present application is to provide a test fixture, a host computer and a test system, the purpose of which is to conveniently and quickly test the power consumption of storage devices under test with different interface types and improve the test efficiency.

[0006] An embodiment of the present application also discloses a test fixture, which is connected to an external power supply and is used to test a storage device to be tested. The test fixture includes a circuit board, on which a main control chip and multiple connectors are provided; a power supply input end of the main control chip is connected to the external power supply, and a power supply output end of the main control chip is connected to multiple connectors, and the multiple connectors are used to connect the storage devices to be tested of different protocol types; the main control chip is used to monitor the current flowing through the storage device to be tested, and upload the monitoring data to a host computer for analysis and calculation of power consumption.

[0007] Optionally, the main control chip is used to obtain the test instructions issued by the host computer and parse them into control signals, and output current and voltage to the corresponding connector according to the control signals.

[0008] Optionally, the main control chip includes a current detection module, which is used to monitor the current change between the power supply input end of the main control chip and the power supply output end of the main control chip, and transmit the monitoring data to the host computer.

[0009] Optionally, the interface types of the multiple connectors include a 2.5-inch interface, an M.2 interface, a USB interface and an MSATA interface.

[0010] Optionally, during each test, only the storage device to be tested of one protocol type is inserted into the connector of the corresponding interface type for testing.

[0011] Optionally, the main control chip automatically identifies the interface type and protocol of the inserted storage device to be tested, and transmits a detection signal to the host computer, and the host computer automatically generates a corresponding test instruction according to the detection signal transmitted by the active chip.

[0012] Optionally, the storage devices to be tested of multiple different protocol types are simultaneously inserted into their respective corresponding connectors; the test fixture also includes multiple controllers, each of which is arranged between two adjacent connectors of different interface types, and the output end of the controller is communicatively connected to the two adjacent connectors of different interface types, and the input end of the controller is communicatively connected to the main control chip, and the controller is used to switch the signal conduction between two adjacent connectors of different interface types according to the control signal output by the main control chip.

[0013] The embodiment of the present application also discloses a host computer, including: a control module, an output module, a calculation module, a receiving module and a display module, wherein the control module is connected to the output module and the receiving module respectively, the receiving module is connected to the calculation module, and the calculation module is connected to the display module; the control module is used to generate a test instruction, the output module is used to send a test instruction signal to the lower computer; the receiving module is used to receive feedback data from the lower computer; the calculation module calculates and draws a corresponding power consumption curve according to the feedback data received by the receiving module; the display module is used to display the test data during the test process.

[0014] Optionally, the host computer further includes a storage module, which is connected to the calculation module and is used to store the test data of the storage device to be tested accordingly.

[0015] The embodiment of the present application also discloses a test system, comprising the above-mentioned test fixture and the above-mentioned host computer; the host computer is used to send test instructions and receive feedback data from the test fixture; the test fixture is connected to the storage device to be tested; the test fixture is used to test the storage device to be tested according to the test instructions sent by the host computer, generate test data, and feed back the test data to the host computer.

[0016] The present application improves a test fixture for testing power consumption of a storage device to be tested. By arranging a plurality of connectors of different protocol types on a circuit board, one test fixture can be adapted to be compatible with storage devices to be tested with different types of interfaces and different protocols. When it is necessary to test the power consumption of the storage device to be tested, the test fixture is connected to an external power supply so that the external power supply supplies power to the test fixture, and then the storage device to be tested is connected to the corresponding connector on the test fixture. At this time, the power supply current and voltage of the external power supply will pass through the main control chip, and then the actual power supply voltage and current will be output to the device to be tested connected to the connector through the main control chip. The current and voltage changes generated in this process will be monitored in real time by the main control chip, so that the monitoring data will be transmitted to a host computer, and the actual power consumption of the storage device to be tested will be formed through analysis and calculation processing by the host computer. In this way, the power consumption of storage devices to be tested with different interface types can be tested conveniently and quickly, thereby improving the test efficiency. BRIEF DESCRIPTION OF THE DRAWINGS

[0017] The included drawings are used to provide a further understanding of the embodiments of the present application, which constitute a part of the specification, are used to illustrate the implementation methods of the present application, and together with the text description, explain the principles of the present application. Obviously, the drawings described below are only some embodiments of the present application. For ordinary technicians in this field, other drawings can be obtained based on these drawings without creative work. In the drawings:

[0018] Figure 1 A schematic diagram of a first embodiment of the test fixture of the present application;

[0019] Figure 2 A schematic diagram of a second embodiment of the test fixture of the present application;

[0020] Figure 3 This is a structural block diagram of an embodiment of the host computer of the present application;

[0021] Figure 4 This is a structural block diagram of an embodiment of the test system of the present application.

[0022] Among them, 10, test system; 100, test fixture; 110, circuit board; 120, main control chip; 130, connector; 140, current detection module; 150, controller; 200, host computer; 210, control module; 220, output module; 230, calculation module; 240, receiving module; 250, display module; 300, storage device to be tested; 400, external power supply; 160, power supply input terminal; 170, power supply output terminal. DETAILED DESCRIPTION

[0023] The present application is described in detail below with reference to the accompanying drawings and optional embodiments. It should be noted that, under the premise of no conflict, the embodiments or technical features described below can be arbitrarily combined to form new embodiments.

[0024] Figure 1 This is a schematic diagram of the first embodiment of the test fixture of the present application. Figure 1 As shown, the embodiment of the present application also discloses a test fixture 100, which is connected to an external power supply 400. The test fixture 100 is used to test a storage device 300 to be tested. The test fixture 100 includes a circuit board 110, on which a main control chip 120 and a plurality of connectors 130 are arranged; a power supply input terminal 160 of the main control chip 120 is connected to the external power supply 400, and a power supply output terminal 170 of the main control chip 120 is connected to a plurality of connectors 130, and the plurality of connectors 130 are used to connect storage devices 300 to be tested of different protocol types; the main control chip 120 is used to monitor the current flowing through the storage device 300 to be tested, and upload the monitoring data to the host computer 200 for analysis and calculation of power consumption.

[0025] The present application improves a test fixture 100 for testing power consumption of a storage device 300 to be tested. By providing a plurality of connectors 130 of different protocol types on a circuit board 110, a test fixture 100 can be adapted to be compatible with storage devices 300 to be tested with different types of interfaces and different protocols. When the power consumption of the storage device 300 to be tested needs to be tested, the test fixture 100 is connected to an external power supply 400 so that the external power supply 400 supplies power to the test fixture 100, and then the storage device 300 to be tested is connected to the corresponding connector 130 on the test fixture 100. At this time, the power supply current and voltage of the external power supply 400 will pass through the main control chip 120, and then the actual power supply voltage and current will be output to the device to be tested connected to the connector 130 via the main control chip 120. The current and voltage changes generated in this process will be monitored in real time by the main control chip 120, so that the monitoring data will be transmitted to the host computer 200, and the actual power consumption of the storage device 300 to be tested will be formed through analysis and calculation by the host computer 200. In this way, the power consumption of the storage devices 300 to be tested with different interface types can be tested quickly and conveniently, thereby improving the test efficiency.

[0026] It should be noted that the storage device 300 to be tested in the present application may be an SSD storage device, such as a solid-state drive, a mobile hard drive, a USB flash drive, etc. The interface type may be 2.5 inches, M.2, mSATA, etc., and the protocol may be AHCI or NVMe, etc.

[0027] Specifically, the main control chip 120 is used to obtain the test instruction sent by the host computer 200 and parse it into a control signal, and output current and voltage to the corresponding connector 130 according to the control signal.

[0028] When the test instruction issued by the host computer 200 is transmitted to the main control chip 120 of the test fixture 100, the main control chip 120 will parse the acquired test instruction signal, and accurately control the output current and voltage in the corresponding load mode to the connector 130 according to the parsed result, thereby providing the working voltage and current for the storage device 300 to be tested connected to the connector 130; and, the main control chip 120 will also monitor the current and voltage changes from the power supply input terminal 160 of the main control chip 120 to the power supply output terminal 170 of the main control chip 120 in real time, and record the corresponding data, and feed it back to the host computer 200, and obtain the corresponding power consumption after analysis and processing by the host computer 200.

[0029] In addition, the main control chip 120 can form different load modes according to different test instructions, and dynamically adjust the current and voltage output to the connector 130 to meet the power requirements of different storage devices 300 to be tested; and only the corresponding test instructions need to be entered in the host computer 200, and the main control chip 120 will automatically complete all subsequent operations, so there is no need to manually enter different commands to perform voltage, current and power consumption tests at different stages, which simplifies the operation steps.

[0030] Furthermore, the main control chip 120 includes a current detection module 140 , which is used to monitor the current change between the power supply input terminal 160 of the main control chip 120 and the power supply output terminal 170 of the main control chip 120 , and transmit the monitoring data to the host computer 200 .

[0031] In the present application, a current detection module 140 is provided. When the storage device 300 to be tested is tested, the external power supply 400 supplies power to the test fixture 100. The current flows into the power supply input terminal 160 of the main control chip 120, and then flows out from the power supply output terminal 170 of the main control chip 120 through the current detection module 140. The current detection module 140 monitors the current changes between the power supply input and output terminals of the main control chip 120 in real time and accurately, and transmits the monitoring data to the host computer 200. The host computer 200 calculates the actual power consumption of the storage device 300 to be tested through analysis and processing, which is convenient and quick, and effectively improves the test efficiency.

[0032] In addition, the test fixture 100 of the present application has multiple connectors 130 with different interface types. Specifically, the interface types of the multiple connectors 130 include a 2.5-inch interface, an M.2 interface, a USB interface, and an MSATA interface.

[0033] The types of connectors 130 in this application include M.2 gold fingers, M.2 female connectors 130, 2.5-inch male connectors 130, 2.5-inch female connectors 130, U.2 male connectors 130, U.2 female connectors 130, USBA male connectors, USBA female connectors, Typec male connectors, Typec female connectors, etc. By setting up multiple connectors 130 with different interface types, a test fixture 100 can meet the testing of storage devices 300 to be tested with a variety of different interfaces and protocols, thereby improving the compatibility of the test fixture 100 with different types of storage devices 300 to be tested.

[0034] In addition, when it is necessary to test the storage device 300 to be tested with a direct interface and protocol type, it is only necessary to connect the storage device 300 to be tested to the test fixture 100 by inserting it into the socket. This eliminates the need for manual welding of wires for testing, which is convenient and quick, and effectively improves the test efficiency.

[0035] In the present embodiment, since the host computer 200 can be a computer, the test instructions issued by the computer can generally only test the storage device 300 of one protocol type. Therefore, in each test process, only the storage device 300 of one protocol type is inserted into the connector 130 of the corresponding interface type for testing. In this way, the stability and effectiveness of the test can be guaranteed. If the storage device 300 of another type needs to be tested, it is necessary to unplug the storage device 300 of the previous type and insert the storage device 300 of another type into the corresponding connector 130. The installation is simple and convenient, which is conducive to improving the test efficiency.

[0036] When the storage device 300 to be tested is inserted into the corresponding connector 130, the main control chip 120 automatically identifies the interface type and protocol of the inserted storage device 300 to be tested, and transmits the detection signal to the host computer 200. The host computer 200 automatically generates corresponding test instructions according to the detection signal transmitted by the main control chip 120.

[0037] In the present application, different types of SSDs, U disks, PSSDs and other storage devices 300 to be tested are inserted into the corresponding female sockets of the connectors 130. The power current flows from the power input terminal 160 into the current detection module 140 and flows out from the power output terminal 170 of the current detection module 140. The power output terminal 170 is connected to the female sockets of each connector 130, and the connectors 130 of the entire board are connected together. Therefore, when the SSD or U disk, PSSD operates in different load modes, the current detection module 140 can test the current and upload the test data to the host computer 200 through the connecting line. The actual power consumption of the storage device 300 to be tested is obtained after analysis, processing and calculation by the host computer 200, which effectively improves the test efficiency.

[0038] Figure 2 Schematic diagram of the second embodiment of the test fixture of the present application, as shown Figure 2 As shown, a plurality of storage devices 300 to be tested of different protocol types are simultaneously inserted into their respective corresponding connectors 130; the test fixture 100 also includes a plurality of controllers 150, each controller 150 is arranged between two adjacent connectors 130 of different interface types, and the output end of the controller 150 is communicatively connected to the two adjacent connectors 130 of different interface types, and the input end of the controller 150 is communicatively connected to the main control chip 120, and the controller 150 is used to switch the signal conduction between the two adjacent connectors 130 of different interface types according to the control signal output by the main control chip 120.

[0039] The present embodiment is different from the previous embodiment in that, in the present embodiment, a controller 150 is additionally provided on the test fixture 100, and the controller 150 controls the signal switching of two adjacent connectors 130 of different interface types. For example, when the two adjacent connectors 130 of different interface types are respectively a 2.5-inch connector 130 and an M.2 connector 130, when the controller 150 controls the signal conduction between the main control chip 120 and the 2.5-inch connector 130, the signal between the M.2 connector 130 and the main control chip 120 is disconnected; and when the controller 150 switches to control the signal conduction between the main control chip 120 and the M.2 connector 130, the signal between the 2.5-inch connector 130 and the main control chip 120 is disconnected. That is, multiple controllers 150 will only switch signals between corresponding connectors 130 according to the control signal transmitted by the main control chip 120, and other controllers 150 that have not obtained the control instruction will keep the other types of adjacent two connectors 130 in a disconnected state to prevent signal interference.

[0040] When it is necessary to test a plurality of different storage devices 300 to be tested, the storage devices 300 to be tested of a plurality of different protocol types can be simultaneously inserted into the corresponding connectors 130 and connected to the test fixture 100 at one time.

[0041] The designated test instruction is sent through the host computer 200. When the main control chip 120 receives the test instruction signal and performs analysis and processing, the control signal will be transmitted to the controller 150 connected to the connector 130 of the corresponding protocol type. At this time, the controller 150 that receives the control signal will connect the corresponding connector 130 with the main control chip 120, so that the main control chip 120 can output the current and voltage under the corresponding load mode to the corresponding connector 130, thereby testing the corresponding storage device 300 to be tested, and uploading the test data to the host computer 200, and calculating the actual power consumption through the host computer 200.

[0042] Since there is an independent controller 150 between each connector 130 to manage signal conduction, other controllers 150 that have not received the control signal will keep the two adjacent connectors 130 and the main control chip 120 open circuit, so that the test instructions issued by the computer control the test fixture 100 to test a storage device 300 of a protocol type. When the test is completed, the controller 150 switches to a device of another protocol type for testing, thereby avoiding interference between different protocol types and improving the accuracy of the test results. At the same time, there is no need to replace the storage device 300 for test after the test is completed, thereby improving the test efficiency and reducing the time for replacing equipment.

[0043] That is, in this embodiment, the main control chip 120 independently controls the controller 150, so that the tester does not need to manually change the storage device 300 to be tested with different protocol types for testing. The controller 150 can automatically complete the signal switching according to the control signal transmitted by the main control chip 120, thereby simplifying the operation steps.

[0044] Figure 3 This is a structural block diagram of an embodiment of the host computer of the present application. The embodiment of the present application also discloses a host computer 200, including: a control module 210, an output module 220, a calculation module 230, a receiving module 240 and a display module 250. The control module 210 is connected to the output module 220 and the receiving module 240 respectively, the receiving module 240 is connected to the calculation module 230, and the calculation module 230 is connected to the display module 250; the control module 210 is used to generate a test instruction, and the output module 220 is used to send a test instruction signal to the lower computer; the receiving module 240 is used to receive feedback data from the lower computer; the calculation module 230 calculates and draws a corresponding power consumption curve according to the feedback data received by the receiving module 240; the display module 250 is used to display the test data during the test process.

[0045] The host computer 200 in the present application can be a computer, and the computer is connected to the test fixture 100 by a data cable, so that the test instructions of the computer can be transmitted through the data cable, thereby transmitting the test instruction signal to the test fixture 100, and the main control chip 120 of the test fixture 100 decodes and analyzes after obtaining the test instructions, and outputs the corresponding current and voltage to the storage device 300 to be tested connected to the connector 130, and the main control chip 120 monitors the current and voltage changes, and uploads the monitoring data to the computer through the data cable. After the computer obtains the feedback data, it calculates and draws the corresponding power consumption curve graph, and displays it through the display module 250, so that the tester can use the computer to obtain the power consumption and performance parameters of the storage device 300 to be tested in real time.

[0046] The present application uses the host computer 200 to integrate test commands of different protocols and different power consumption stages, calls different test scripts and test software by itself, tests power consumption with one click and generates test documents in Excel format, which greatly simplifies the operation process and facilitates testers to understand the power consumption and performance of the storage device 300 to be tested in real time.

[0047] In addition, the host computer 200 of the present application analyzes and processes the received data, and can not only calculate key parameters such as power consumption, but also draw an intuitive power consumption curve chart, so that the tester can intuitively understand the actual power consumption of the storage device 300 to be tested, and facilitate subsequent performance adjustments.

[0048] Among them, the display module 250 includes a display screen, and can display current, voltage, power consumption and draw curve graphs and other information through the display screen. For example, the display screen provides an intuitive graphical user interface (GUI) to display various data during the test process in real time, including but not limited to power consumption curves, current changes, voltage levels, etc.; testers can conveniently monitor the progress of the test through this interface and make necessary adjustments.

[0049] In addition, the control module 210 of the host computer 200 may have built-in buttons for selecting different load modes and different modules for selecting the type of test product (SSD or USB flash drive, PSSD), so as to facilitate users to quickly test the current power consumption of the product.

[0050] Furthermore, the host computer 200 also includes a storage module, which is connected to the computing module 230 and is used to store the test data of the storage device 300 to be tested. By storing the test data through the storage module, all the test data can be fully recorded, which is convenient for subsequent analysis and comparison of product performance of different batches or versions.

[0051] Figure 4 A structural block diagram of an embodiment of the test system of the present application is shown in FIG. Figure 4 As shown, the embodiment of the present application also discloses a test system 10, including the above-mentioned test fixture 100 and the above-mentioned host computer 200; the host computer 200 is used to send test instructions and receive feedback data from the test fixture 100; the test fixture 100 is connected to the storage device 300 to be tested; the test fixture 100 is used to test the storage device 300 to be tested according to the test instructions sent by the host computer 200, generate test data, and feed back the test data to the host computer 200. The host computer 200 can automatically send test instructions to control the test fixture 100 to perform power consumption tests on the storage device 300 to be tested under different load modes, thereby reducing human intervention and greatly shortening the test time.

[0052] However, in the conventional test fixture 100, each time the voltage, current and power consumption data of the storage device with different interfaces is tested, wires must be manually welded for testing, which is not convenient for manual testing and for testers to quickly get started.

[0053] Based on the above problems, the present application improves the test fixture 100 in the test system 10. The present application improves the test fixture 100 used to test the power consumption of the storage device 300 to be tested. By setting a plurality of connectors 130 of different protocol types on the circuit board 110, one test fixture 100 can be adapted to be compatible with the storage devices 300 to be tested with different types of interfaces and different protocols. When the power consumption of the storage device 300 to be tested needs to be tested, the test fixture 100 is connected to the external power supply 400 so that the external power supply 400 supplies power to the test fixture 100, and then the storage device 300 to be tested is connected to the test fixture 100. The corresponding connector 130 on the fixture 100 is connected. At this time, the power supply current and voltage of the external power supply 400 will pass through the main control chip 120, and then the actual power supply voltage and current will be output to the device to be tested connected to the connector 130 through the main control chip 120. The current and voltage changes generated in this process will be monitored in real time by the main control chip 120, so that the monitoring data will be transmitted to the host computer 200, and the actual power consumption of the storage device 300 to be tested will be formed through the analysis and calculation of the host computer 200. In this way, the power consumption of the storage device 300 to be tested of different interface types can be tested conveniently and quickly, thereby improving the test efficiency. This improves the test efficiency and accuracy of the test system 10 and greatly simplifies the operation process.

[0054] It should be noted that the inventive concept of the present application can form a large number of embodiments, but the length of the application document is limited and it is impossible to list them one by one. Therefore, under the premise of no conflict, the embodiments or technical features described above can be arbitrarily combined to form new embodiments. After the embodiments or technical features are combined, the original technical effects will be enhanced.

[0055] The above content is a further detailed description of the present application in combination with specific optional implementation methods, and it cannot be determined that the specific implementation of the present application is limited to these descriptions. For ordinary technicians in the technical field to which the present application belongs, several simple deductions or substitutions can be made without departing from the concept of the present application, which should be deemed to fall within the scope of protection of the present application.

Claims

1. A test fixture connected to an external power supply, the test fixture is used to test a storage device to be tested, characterized in that: The test fixture comprises a circuit board, on which a main control chip and a plurality of connectors are arranged; a power supply input end of the main control chip is connected to the external power supply, and a power supply output end of the main control chip is connected to the plurality of connectors, and the plurality of connectors are used to connect the storage devices to be tested of different protocol types; The main control chip is used to monitor the current flowing through the storage device to be tested, and upload the monitoring data to the host computer for analysis and calculation of power consumption.

2. The test fixture according to claim 1, characterized in that: The main control chip is used to obtain the test instructions sent by the host computer and parse them into control signals, and output current and voltage to the corresponding connector according to the control signals.

3. The test fixture as claimed in claim 2, characterized in that: The main control chip includes a current detection module, which is used to monitor the current change between the power supply input end of the main control chip and the power supply output end of the main control chip, and transmit the monitoring data to the host computer.

4. The test fixture as claimed in claim 3, characterized in that: The interface types of the multiple connectors include a 2.5-inch interface, an M.2 interface, a USB interface, and an MSATA interface.

5. The test fixture as claimed in claim 4, characterized in that: During each test, only the storage device to be tested of one protocol type is inserted into the connector of the corresponding interface type for testing.

6. The test fixture as claimed in claim 5, characterized in that: The main control chip automatically identifies the interface type and protocol of the inserted storage device to be tested, and transmits a detection signal to the host computer. The host computer automatically generates a corresponding test instruction according to the detection signal transmitted by the active chip.

7. The test fixture as claimed in claim 4, characterized in that: Inserting the storage devices to be tested of multiple different protocol types into the corresponding connectors at the same time; The test fixture also includes multiple controllers, each of which is arranged between two adjacent connectors of different interface types, and the output end of the controller is communicatively connected to the two adjacent connectors of different interface types, and the input end of the controller is communicatively connected to the main control chip, and the controller is used to switch the signal conduction between two adjacent connectors of different interface types according to the control signal output by the main control chip.

8. A host computer, characterized in that: include: A control module, an output module, a calculation module, a receiving module and a display module, wherein the control module is connected to the output module and the receiving module respectively, the receiving module is connected to the calculation module, and the calculation module is connected to the display module; The control module is used to generate test instructions, and the output module is used to send test instruction signals to the lower computer; the receiving module is used to receive feedback data from the lower computer; the calculation module calculates and draws the corresponding power consumption curve according to the feedback data received by the receiving module; the display module is used to display the test data during the test process.

9. The host computer according to claim 8, characterized in that: The host computer further comprises a storage module, which is connected to the calculation module and is used for correspondingly storing the test data of the storage device to be tested.

10. A testing system, characterized in that: Comprising the test fixture as claimed in any one of claims 1 to 7 and the host computer as claimed in claim 8 or 9; The host computer is used to send test instructions and receive feedback data from the test fixture; The test fixture is connected to the storage device to be tested; The test fixture is used to test the storage device to be tested according to the test instruction sent by the host computer, generate test data, and feed back the test data to the host computer.

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