Electrical testing equipment and test systems

Through the electrical testing mechanism and light source mechanism that integrates lighting and testing functions, the vertical movement of the electrical testing device is achieved by using the connecting rod mechanism and the drive member, which solves the problem of high production costs in the prior art, reduces the overall cost of the test system and improves synchronization and efficiency.

CN119881586BActive Publication Date: 2025-08-29RONGCHEER IND TECH (SUZHOU) CO LTD
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Patent Information

Application Number
CN202510374976.3
Authority / Receiving Office
CN · China
Patent Type
Patents(China)
Current Assignee / Owner
Filing Date
2025-03-27
Publication Date
2025-08-29
Estimated Expiration
2045-03-27

AI Technical Summary

Technical Problem

In the existing semiconductor test devices, the test socket with light emitting parts has a complex structure and heavy weight, resulting in high production costs and high load requirements for the conveying structure, making it difficult to meet the needs of large-scale production.

Method used

Design an electrical testing device, an electrical testing mechanism and a light source mechanism that integrates lighting and testing functions, and realizes vertical movement of the electrical testing mechanism and the light source mechanism through the connecting rod mechanism and the connecting rod driving member, reducing production costs and improving synchronization.

Benefits of technology

While achieving the photosensitive testing requirements, it reduces the production cost of the test system, ensures accurate switching between the electrical testing mechanism and the light source mechanism, avoids the setting of excess driver parts, and improves the testing efficiency.

✦ Generated by Eureka AI based on patent content.

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Abstract

The present invention discloses an electrical testing device and a testing system, belonging to the field of semiconductor electrical testing, which includes: a mounting frame; an electrical testing mechanism that can be raised and lowered on the mounting frame in a vertical direction; a light source mechanism that can be raised and lowered on the mounting frame in a vertical direction and is arranged opposite to the electrical testing mechanism in the vertical direction; a connecting rod mechanism that is respectively connected to the electrical testing mechanism and the light source mechanism; a connecting rod driving member that is arranged on the mounting frame and is transmission-connected to the connecting rod mechanism; a test gap for accommodating products is formed between the electrical testing mechanism and the light source mechanism, and the electrical testing mechanism and the light source mechanism are suitable for moving toward each other to a test state driven by the connecting rod mechanism to illuminate and test the product, or moving back to back in a vertical direction to a separated state to allow the product to enter and exit. The present invention adopts the above structure, and the electrical testing device integrates the lighting and testing functions to reduce the production cost of the testing system.
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Description

Technical Field

[0001] The present invention relates to the field of semiconductor electrical testing, and in particular to an electrical testing device and a testing system. Background Art

[0002] Semiconductor products, such as chips, need to be electrically tested after production to ensure the yield rate after leaving the factory. Existing testing devices usually include a socket mechanism and an electrical testing mechanism. The socket mechanism is used to accommodate and fix the product, and the electrical testing mechanism is suitable for being electrically connected to the socket mechanism to perform electrical testing on the product. For some photosensitive chips, the photosensitive area of ​​the product needs to be illuminated during the test process in order to verify the various functions of the product. For example, Chinese utility model patent CN219016505U discloses a photosensitive chip test socket for being electrically connected to an electrical testing mechanism, which can accommodate and fix the product, and the socket is provided with a light-emitting component for illuminating the photosensitive area of ​​the product.

[0003] In actual production, to increase the level of test automation, multiple socket mechanisms are typically installed, each connected to a conveyor structure. An electrical measuring mechanism is located along the conveyor structure's path. When the conveyor structure drives the socket mechanism through the electrical measuring mechanism, the electrical measuring mechanism connects with the socket mechanism. However, conventional test sockets with light-emitting components are complex and heavy, making individual test sockets expensive. Installing large quantities of these sockets on a conveyor structure significantly increases production costs, and the high load requirements placed on the conveyor structure further increase costs.

[0004] Therefore, it is necessary to improve the prior art to overcome the above defects. Summary of the Invention

[0005] An object of the present invention is to provide an electrical testing device and a testing system, wherein the electrical testing device integrates illumination and testing functions to reduce the production cost of the testing system.

[0006] The object of the present invention is to achieve the following technical solution: an electrical testing device comprising:

[0007] Mounting rack;

[0008] An electrical measuring mechanism is arranged on the mounting frame so as to be vertically movable;

[0009] A light source mechanism is vertically movable on the mounting frame and is arranged opposite to the electrical measuring mechanism in the vertical direction;

[0010] A connecting rod mechanism is connected to the electrical measuring mechanism and the light source mechanism respectively;

[0011] A connecting rod driving member is provided on the mounting frame and is in transmission connection with the connecting rod mechanism;

[0012] A test gap for accommodating products is formed between the electrical measuring mechanism and the light source mechanism. The electrical measuring mechanism and the light source mechanism are suitable for moving toward each other in the vertical direction to a test state driven by the connecting rod mechanism to illuminate and test the products, or moving back to back in the vertical direction to a separated state to allow products to enter and exit.

[0013] Furthermore, the connecting rod mechanism includes:

[0014] a rotating shaft rotatably disposed on the mounting frame, wherein the output end of the connecting rod driving member is connected to the rotating shaft;

[0015] a lever, adapted to rotate synchronously with the rotating shaft;

[0016] a first connecting rod, both ends of which are hinged to one end of the lever and the electric measuring mechanism respectively;

[0017] a second connecting rod, both ends of which are hinged to the other end of the lever and the light source mechanism respectively;

[0018] The first connecting rod and the second connecting rod cause the electrical measuring mechanism and the light source mechanism to move toward or away from each other in response to the rotation of the lever.

[0019] Furthermore, the lever is fixedly mounted on the rotating shaft; or, the connecting rod mechanism also includes a rotating member and a cam, the rotating member is supported between the mounting frame and the lever so that the lever can rotate relative to the mounting frame, the cam is fixedly mounted on the rotating shaft and is transmission-connected to the electrical measuring mechanism, and the lever rotates in response to the rotation of the cam.

[0020] Furthermore, the electrical measuring mechanism is located below the light source mechanism. When the electrical measuring mechanism and the light source mechanism move toward each other, the electrical measuring mechanism is suitable for approaching the product upward and being electrically connected to the product, and the light source mechanism is suitable for approaching the product downward and covering the photosensitive area of ​​the product.

[0021] Furthermore, the electrical measuring mechanism includes:

[0022] a first lifting seat, slidably connected to the mounting frame;

[0023] an electrical measuring board, fixed on the first lifting seat;

[0024] Connectors, electrically connected to the electrical test board and external test equipment respectively;

[0025] The surface of the electrical testing board is perpendicular to the vertical direction, and the upper surface of the electrical testing board is provided with electrical connection elements for electrically connecting to the product.

[0026] Furthermore, the light source mechanism includes:

[0027] A second lifting seat is slidably connected to the mounting frame, and the second lifting seat is provided with a light exit hole extending vertically therethrough;

[0028] a light source fixed to the top of the second lifting base, with its irradiation end in contact with the top of the light exit hole;

[0029] Wherein, the bottom of the light exit hole is suitable for covering the photosensitive area of ​​the product.

[0030] In addition, the present invention also provides a testing system, comprising:

[0031] The aforementioned electrical testing device;

[0032] A turntable device, comprising a turntable and a plurality of socket mechanisms for accommodating products, wherein the plurality of socket mechanisms are evenly distributed on the turntable along the circumference of the turntable, and the turntable is suitable for driving the socket mechanisms to move into or out of the test gap;

[0033] Wherein, when the electrical measuring mechanism and the light source mechanism move toward each other to a testing state, the electrical measuring mechanism and the light source mechanism are adapted to be connected to the socket mechanism.

[0034] Furthermore, the socket mechanism includes a socket, which is recessed inward from the top to form a receiving groove. The product is adsorbed and positioned in the receiving groove and electrically connected to the socket. The photosensitive area of ​​the product is arranged upward. When the electrical measuring mechanism and the light source mechanism are in a testing state, the electrical measuring mechanism is electrically plugged into the bottom of the socket, and the light source mechanism is sealed in the notch of the receiving groove and is suitable for emitting light from the notch of the receiving groove to the photosensitive area of ​​the product.

[0035] Furthermore, the socket mechanism further includes:

[0036] A base is provided on the turntable, and the socket is provided on the base;

[0037] a cover assembly disposed on the base and movable to a closed state to cover the notch of the receiving slot, or to an open state to open the notch of the receiving slot;

[0038] a transmission assembly connected to the cover assembly;

[0039] In which, the turntable device includes a switching mechanism, which is suitable for approaching and pushing the transmission assembly. The cover assembly can be switched to an open state under the drive of the transmission assembly, and when the switching mechanism is away from the transmission assembly, the transmission assembly is suitable for resetting and driving the cover assembly to switch to a closed state.

[0040] Furthermore, the cover plate assembly includes:

[0041] A connecting column, fixed to the base;

[0042] There are two cover plates, both of which are sleeved on the connecting post, and the two cover plates are suitable for moving in opposite directions along the axis of the connecting post to an open state or moving towards each other to a closed state;

[0043] The cover plate is provided with a avoidance portion in the vertical direction for avoiding the photosensitive area of ​​the product. The light source mechanism in the test state can be sealed on the top of the avoidance portion and emit light from the avoidance portion to the photosensitive area of ​​the product.

[0044] Compared with the prior art, the present invention has the following beneficial effects: the present invention arranges an electric measuring mechanism and a light source mechanism that can be raised and lowered in the vertical direction on the mounting frame. When the product flows through the test gap between the electric measuring mechanism and the light source mechanism, the electric measuring mechanism and the light source mechanism can move toward each other in the vertical direction to a test state to illuminate and test the product, or move back to back in the vertical direction to a separated state for the product to enter and exit. The electrical testing device integrates both illumination and testing functions, which can meet the needs of photosensitivity testing while effectively reducing the production cost of the testing system; in addition, by arranging a connecting rod mechanism and a connecting rod driving member that is transmission-connected to the connecting rod mechanism, the connecting rod mechanism is respectively connected to the electric measuring mechanism and the light source mechanism. The connecting rod mechanism can drive the electric measuring mechanism and the light source mechanism to move toward or back to each other in the vertical direction under the drive of the connecting rod driving member. The electric measuring mechanism and the light source mechanism have high synchronization during movement, ensuring that the two are accurately switched to the test state or the separated state, and can avoid the setting of more driving members, further reducing costs. BRIEF DESCRIPTION OF THE DRAWINGS

[0045] Figure 1 It is a structural diagram of an embodiment of an electrical testing device of the present invention.

[0046] Figure 2 yes Figure 1 Schematic diagram of the structure in another direction.

[0047] Figure 3 yes Figure 1 Schematic diagram of the location of the electrical measuring mechanism and light source mechanism.

[0048] Figure 4 yes Figure 1 Schematic diagram of the structure of the middle connecting rod mechanism.

[0049] Figure 5 A schematic structural diagram of another embodiment of the electrical testing device of the present invention.

[0050] Figure 6 yes Figure 5 Schematic diagram of the structure in another direction.

[0051] Figure 7 yes Figure 5 Schematic diagram of the structure of the middle connecting rod mechanism.

[0052] Figure 8 It is a structural diagram of the test system of the present invention.

[0053] Figure 9 It is a schematic diagram of the matching of the socket mechanism and the electrical testing device in the present invention.

[0054] Figure 10 It is a schematic diagram of the exploded structure of the socket mechanism in the present invention.

[0055] Figure 11 It is a structural diagram of the socket mechanism in the present invention.

[0056] Figure 12 It is a schematic diagram of the coordination between the switching mechanism and the socket mechanism in the present invention.

[0057] Description of reference numerals:

[0058] 1000, electrical test device; 2000, turntable device; 100, mounting frame; 200, electrical test mechanism; 210, first lift seat; 211, lift seat body; 212, support block; 213, mounting block; 214, lining plate; 215, pillar; 216, first spring; 220, electrical test board; 221, electrical connection element; 230, connector; 240, first hinge; 300, light source mechanism; 310, second lift seat; 311, light exit hole; 320, light source; 330, second hinge; 400, connecting rod mechanism; 410, rotating shaft; 420, lever; 421, lever body; 422, first hinge; 423, second hinge; 430, first connecting rod; 440, second connecting rod; 450, rotating member; 460, Cam; 461, first guide hole; 470, first follower; 500, connecting rod drive; 600, test gap; 700, turntable; 710, first mounting slot; 800, socket mechanism; 810, socket; 811, receiving slot; 820, base; 821, first mounting hole; 822, second mounting slot; 823, second mounting hole; 824, notch; 830, cover assembly; 831, cover; 8311, avoidance portion; 832, connecting column; 840, transmission assembly; 841, transmission plate; 8411, second guide hole; 8412, protrusion; 842, second follower; 843, second spring; 900, switching mechanism; 910, mounting seat; 920, lifting drive; 930, third follower; 940, connecting block. DETAILED DESCRIPTION

[0059] In order to make the above-mentioned objects, features and advantages of the present application more obvious and easy to understand, the specific implementation methods of the present application are described in detail below in conjunction with the accompanying drawings. It will be understood that the specific embodiments described herein are only used to explain the present application, rather than to limit the present application. It should also be noted that, for ease of description, only some, rather than all, structures related to the present application are shown in the accompanying drawings. Based on the embodiments in the present application, all other embodiments obtained by ordinary technicians in this field without making creative work are within the scope of protection of this application.

[0060] As used herein, the terms "comprise," "comprising," and "having," and any variations thereof, are intended to cover non-exclusive inclusions. For example, a process, method, system, product, or apparatus comprising a series of steps or elements is not limited to the listed steps or elements but may optionally include steps or elements not listed, or may optionally include other steps or elements inherent to the process, method, product, or apparatus.

[0061] References herein to "embodiments" mean that a particular feature, structure, or characteristic described in connection with the embodiments may be included in at least one embodiment of the present application. The appearance of this phrase in various places in the specification does not necessarily refer to the same embodiment, nor does it constitute an independent or alternative embodiment that is mutually exclusive of other embodiments. It is understood, both explicitly and implicitly, by those skilled in the art that the embodiments described herein may be combined with other embodiments.

[0062] See also Figures 1 to 4 As shown, an electrical testing device 1000 corresponding to a preferred embodiment of the present invention includes: a mounting frame 100; an electrical testing mechanism 200, which can be vertically raised and lowered on the mounting frame 100; a light source mechanism 300, which can be vertically raised and lowered on the mounting frame 100 and is arranged opposite to the electrical testing mechanism 200 in the vertical direction; a connecting rod mechanism 400, which is respectively connected to the electrical testing mechanism 200 and the light source mechanism 300; a connecting rod driving member 500, which is provided on the mounting frame 100 and is transmission-connected to the connecting rod mechanism 400; wherein a test gap 600 for accommodating a product is formed between the electrical testing mechanism 200 and the light source mechanism 300, and the electrical testing mechanism 200 and the light source mechanism 300 are adapted to move toward each other in the vertical direction to a testing state driven by the connecting rod mechanism 400 to illuminate and test the product, or move away from each other in the vertical direction to a separated state to allow the product to enter and exit.

[0063] The present invention sets an electric measuring mechanism 200 and a light source mechanism 300 on a mounting frame 100 that can be lifted and lowered in a vertical direction. When the product flows through the test gap 600 between the electric measuring mechanism 200 and the light source mechanism 300, the electric measuring mechanism 200 and the light source mechanism 300 can move toward each other in the vertical direction to a test state to illuminate and test the product, or move back to each other in the vertical direction to a separated state to facilitate the entry and exit of the product. The electrical testing device 1000 integrates both illumination and testing functions, which can meet the needs of photosensitivity testing while effectively reducing the production cost of the testing system. In addition, by setting a connecting rod mechanism 400 and a connecting rod driving member 500 that is transmission-connected to the connecting rod mechanism 400, the connecting rod mechanism 400 is connected to the electric measuring mechanism 200 and the light source mechanism 300 respectively. The connecting rod mechanism 400 can drive the electric measuring mechanism 200 and the light source mechanism 300 to move toward or away from each other in the vertical direction under the drive of the connecting rod driving member 500. The electric measuring mechanism 200 and the light source mechanism 300 have high synchronization during the movement process, ensuring that the two are accurately switched to the test state or the separation state, and can avoid setting up more driving members, thereby further reducing costs.

[0064] Furthermore, the electrical measuring mechanism 200 is located below the light source mechanism 300, and the photosensitive area of ​​the product is arranged upward. When the electrical measuring mechanism 200 and the light source mechanism 300 move toward each other, the electrical measuring mechanism 200 is suitable for approaching the product upward and being electrically connected to the product, and the light source mechanism 300 is suitable for approaching the product downward and covering the photosensitive area of ​​the product.

[0065] Furthermore, the electrical testing mechanism 200 includes a first lifting base 210, an electrical testing board 220, and a connector 230. A vertically arranged slide rail structure is provided between the first lifting base 210 and the mounting frame 100, allowing the first lifting base 210 to slide in contact with the mounting frame 100. The electrical testing board 220, specifically a PCB, is affixed to the first lifting base 210. The board surface of the electrical testing board 220 is perpendicular to the vertical direction, and its upper surface is provided with electrical connectors 221 for electrically connecting to the product. The connector 230 is affixed to and electrically connected to the electrical testing board 220. The connector 230 is electrically connected to external testing equipment via cables to obtain various product test data.

[0066] In this embodiment, the first lift 210 includes a lift body 211, a support block 212, a mounting block 213, and a backing plate 214. The lift body 211 is slidably connected to the mounting frame 100. The bottom of the support block 212 is removably fixed to the lift body 211 via screws, and the mounting block 213 is removably fixed to the top of the support block 212 via screws. The backing plate 214 is fixed to the top of the support block 212, and the electrical test board 220 is mounted on the backing plate 214.

[0067] The above structure facilitates the assembly and removal of the electrical test board 220. By replacing support blocks 212 of different heights, the height of the electrical test board 220 can be adjusted to suit the product. Preferably, both the lift base body 211 and the mounting block 213 are provided with support posts 215. A first spring 216 is connected between the two support posts 215. The first spring 216 provides a force that presses the support block 212 and the mounting block 213 against the lift base body 211, improving the tightness of the connection.

[0068] Furthermore, the light source mechanism 300 includes a second lift base 310 and a light source 320. The second lift base 310 is located above the first lift base 210, with a test gap 600 formed between the bottom of the second lift base 310 and the top of the electrical testing board 220. A vertically arranged slide rail structure is provided between the second lift base 310 and the mounting frame 100 to enable a sliding connection between the second lift base 310 and the mounting frame 100. A light exit hole 311 is vertically formed through the second lift base 310. The light source 320 is fixed to the top of the second lift base 310, with the irradiation end of the light source 320 aligned with the top of the light exit hole 311. The bottom of the light exit hole 311 is adapted to cover the photosensitive area of ​​the product. Light emitted from the irradiation end of the light source 320 can pass through the light exit hole 311 and be directed toward the photosensitive area of ​​the product. This allows the product's photosensitive area to be isolated from the outside world during testing, preventing interference from external light and improving test accuracy.

[0069] Furthermore, the linkage mechanism 400 is located below the electrical measurement mechanism 200 and includes a rotating shaft 410, a lever 420, a first connecting rod 430, and a second connecting rod 440. The rotating shaft 410 is rotatably mounted on the mounting frame 100, with the axis of the rotating shaft 410 parallel to the horizontal direction. The lever 420 is adapted to rotate synchronously with the rotating shaft 410. The ends of the first connecting rod 430 are respectively hinged to one end of the lever 420 and the electrical measurement mechanism 200. The ends of the second connecting rod 440 are respectively hinged to the other end of the lever 420 and the light source mechanism 300. The connecting rod driving member 500 is a rotating motor arranged on the mounting frame 100, and its output end is connected to the rotating shaft 410 to drive the rotating shaft 410 to rotate. The rotating shaft 410 can drive the lever 420 to rotate synchronously. One end of the lever 420 rotates downward and the other end rotates upward, thereby causing one of the first connecting rod 430 and the second connecting rod 440 to be pushed upward and the other to be pulled downward. The electrical measuring mechanism 200 and the light source mechanism 300 can move toward or away from each other in response to the push and pull of the first connecting rod 430 and the second connecting rod 440.

[0070] Preferably, the first lift base 210 is provided with a first hinge 240 for articulating with the linkage mechanism 400, and the second lift base 310 is provided with a second hinge 330 for articulating with the linkage mechanism 400. The first hinge 240 is specifically located on the lift base body 211 and extends downward from the bottom of the lift base body 211, while the second hinge 330 extends downward from the bottom of the second lift base 310. The first hinge 240 can be integrally formed with the first lift base 210, or formed separately and then assembled together; the second hinge 330 can be integrally formed with the second lift base 310, or formed separately and then assembled together.

[0071] In one embodiment, the lever 420 is directly fixedly mounted on the rotating shaft 410, resulting in a simple overall structure and low cost for the linkage mechanism 400. The lever 420 includes a rod-shaped lever body 421. The middle portion of the lever body 421 is fixedly mounted outside the rotating shaft 410, and both ends extend radially along the rotating shaft 410. The ends of the lever body 421 extend toward the first lifting base 210 and / or the second lifting base 310 to form a first hinge portion 422 and a second hinge portion 423, respectively. When the lever body 421 is rotated to a horizontal position, the first hinge portion 422 and the second hinge portion 423 extend parallel to the vertical direction. The first hinge portion 422 is positioned directly below the first hinge 240, and the second hinge portion 423 is positioned directly below the second hinge 330. The two ends of the first link 430 are hinged between the first hinge 240 and the first hinge portion 422, and the two ends of the second link 440 are hinged between the second hinge 330 and the second hinge portion 423. When the lever 420 is rotated clockwise, it can push the first link 430 upward and pull the second link 440 downward, so that the electric measuring mechanism 200 and the light source mechanism 300 move toward each other to the testing state. When the lever 420 is rotated counterclockwise, it can pull the first link 430 downward and push the second link 440 upward, so that the electric measuring mechanism 200 and the light source mechanism 300 move away from each other to the separation state.

[0072] However, the above structure has relatively poor synchronization, is difficult to control accurately, and occupies a large space. Figures 5 to 7 As shown, the linkage mechanism 400 further includes a rotating member 450 and a cam 460. The rotating member 450, which can be a shaft, cam bearing follower, or the like, is supported between the mounting frame 100 and the lever 420, allowing the lever 420 to rotate relative to the mounting frame 100. The axis of the rotating member 450 is parallel to the axis of the rotating shaft 410. The cam 460 is fixedly mounted on the rotating shaft 410 and is in transmission connection with the electric measuring mechanism 200. The lever 420 rotates in response to the rotation of the cam 460.

[0073] Specifically, the cam 460 is provided with a first guide hole 461 extending axially through the rotating shaft 410 and / or the rotating member 450. The first guide hole 461 is an arc-shaped hole extending along the rotation direction of the cam 460. The connecting rod mechanism 400 includes a first follower 470 arranged on the first lifting seat 210. The first follower 470 is a cam bearing follower, which is at least partially embedded in the first guide hole 461 and can roll along the extension direction of the first guide hole 461.

[0074] When the cam 460 is rotated clockwise, the first guide hole 461 is suitable for pulling the first follower 470 upward to drive the first lifting seat 210 to move upward. At the same time, the first connecting rod 430, driven by the first lifting seat 210, pulls the lever 420 upward to rotate the lever 420 clockwise. The second lifting seat 310 moves downward in response to the pulling of the second connecting rod 440, so that the electric measuring mechanism 200 and the light source mechanism 300 move toward each other to the testing state; when the cam 460 is rotated counterclockwise, the first guide hole 461 is suitable for pulling the first follower 470 downward to drive the first lifting seat 210 to move downward. At the same time, the first connecting rod 430, driven by the first lifting seat 210, pushes the lever 420 downward to rotate the lever 420 counterclockwise. The second lifting seat 310 moves upward in response to the pushing of the second connecting rod 440, so that the electric measuring mechanism 200 and the light source mechanism 300 move away from each other to the separation state. By adopting the above structure, the connecting rod mechanism 400 has a compact structure and is suitable for applications with limited space. The electrical measuring mechanism 200 and the light source mechanism 300 are more stable and reliable during movement, and have high synchronization.

[0075] In addition, refer to Figure 8 and Figure 9As shown, the present invention further provides a testing system, including a turntable device 2000 and the aforementioned electrical testing device 1000 . The turntable device 2000 includes a turntable 700 and a plurality of socket mechanisms 800 for accommodating products. The plurality of socket mechanisms 800 are evenly distributed on the turntable 700 along the circumference of the turntable 700. The turntable 700 has a loading and unloading station and a testing station. The turntable 700 is suitable for driving the socket mechanism 800 to move to the loading and unloading station so that the operator or the automatic handling structure can load the product to be tested into the socket mechanism 800, or move the tested product out of the socket mechanism 800. The electrical testing device 1000 is arranged at the testing station. The turntable 700 is suitable for driving the socket mechanism 800 to move to the testing station so that the socket mechanism 800 is in the test gap 600. The electrical testing mechanism 200 and the light source mechanism 300 can move toward each other to the testing state. The electrical testing mechanism 200 and the light source mechanism 300 are suitable for being connected to the socket mechanism 800 to realize electrical testing of the product on the socket mechanism 800. Preferably, there are multiple test stations and multiple electrical testing devices 1000, which correspond one to one with the test stations. Multiple socket mechanisms 800 can be transferred to different test stations in sequence under the drive of the turntable 700, so that multiple products can be electrically tested at the same time, thereby improving test efficiency.

[0076] Further, refer to Figures 10 to 12 As shown, the socket mechanism 800 includes a socket 810, which is recessed inward from its top to form a receiving groove 811. The inner contour of the receiving groove 811 is adapted to the outer contour of the product. The product can be adsorbed and positioned in the receiving groove 811 and electrically connected to the socket 810. The bottom of the receiving groove 811 is provided with an adsorption hole, which is connected to an external vacuum generating structure to provide adsorption force to the receiving groove 811. The bottom of the product is adsorbed to the bottom of the receiving groove 811, and the photosensitive area is arranged upward. When the electrical measurement mechanism 200 and the light source mechanism 300 are in the test state, the electrical measurement mechanism 200 is suitable for electrically plugging into the bottom of the socket 810, and the light source mechanism 300 is sealed to the notch of the receiving groove 811 and is suitable for emitting light from the notch of the receiving groove 811 to the photosensitive area of ​​the product.

[0077] Specifically, the bottom of the socket 810 is provided with connection holes corresponding to the electrical connectors 221 of the electrical test board 220. The electrical connectors 221 are adapted to be inserted upwardly into the connection holes of the socket 810, driven upwardly by the electrical test board 220. The bottom of the second lift base 310 is parallel to the top of the socket 810. During the downward movement of the second lift base 310, the bottom end of the light exit hole 311 seals against the notch of the receiving slot 811, allowing light to enter the receiving slot 811 through the light exit hole 311.

[0078] However, with the above structure, during the high-speed rotation of the turntable 700, the product may fly out of the receiving slot 811 due to the centrifugal force. As a preferred embodiment, the socket mechanism 800 includes a base 820, a cover assembly 830, and a transmission assembly 840. The base 820 is mounted on the turntable 700, and the socket 810 is mounted on the base 820. The cover assembly 830 is mounted on the base 820 and can be moved horizontally to a closed position to cover the notch of the receiving slot 811, or to an open position to open the notch of the receiving slot 811. The transmission assembly 840 is connected to the cover assembly 830. The turntable device 2000 also includes a switching mechanism 900 provided at the loading and unloading station of the turntable 700. The switching mechanism 900 is suitable for approaching and pushing the transmission assembly 840. The cover assembly 830 can be switched to an open state under the drive of the transmission assembly 840, and when the switching mechanism 900 is away from the transmission assembly 840, the transmission assembly 840 is suitable for resetting and driving the cover assembly 830 to switch to a closed state.

[0079] By adopting the above structure, when the socket mechanism 800 moves to the loading and unloading station, the switching mechanism 900 can act on the transmission assembly 840, so that the cover assembly 830 switches to the open state to avoid hindering the taking and placing of the product. When the switching mechanism 900 does not act on the transmission assembly 840, the transmission assembly 840 can be reset, so that the cover assembly 830 switches to the closed state, thereby preventing the product from flying out of the receiving groove 811 when the product is transferred; in addition, the switching mechanism 900 does not need to be set on the turntable 700, which reduces the burden on the turntable 700, and only one needs to be set, which simplifies the structure of the turntable device 2000 and improves the service life of the turntable 700.

[0080] Specifically, the turntable 700 is recessed inward from its outer circumference to form a first mounting groove 710. The first mounting groove 710 extends vertically through the top and bottom of the turntable 700. The base 820 is fixedly embedded in the first mounting groove 710. There are multiple first mounting grooves 710, and each corresponds to the base 820. The base 820 is provided with a first mounting hole 821 extending vertically through the base 820. The socket 810 is fixed in the first mounting hole 821 to prevent the base 820 from blocking the top and bottom of the socket 810. The base 820 is recessed inward from its top surface to form a second mounting groove 822. The cover assembly 830 is installed in the second mounting groove 822. The base 820 is provided with a second mounting hole 823 extending vertically through the base 820. The transmission assembly 840 is vertically mounted in the second mounting hole 823 so as to be liftable in the vertical direction.

[0081] The length direction of the base 820 is parallel to the recessed direction of the first mounting groove 710. The first mounting hole 821, the second mounting groove 822 and the second mounting hole 823 are arranged side by side along the length direction of the base 820, and the first mounting hole 821 is close to the slot mouth of the first mounting groove 710, the second mounting hole 823 is close to the bottom of the first mounting groove 710, and the second mounting groove 822 is located between the first mounting hole 821 and the second mounting hole 823.

[0082] Furthermore, the cover plate assembly 830 includes a cover plate 831 and a connecting post 832. The connecting post 832 is fixed at both ends to the two opposing inner walls of the second mounting groove 822. The cover plate 831 is sleeved over the connecting post 832 and is slidable along the connecting post 832. In this embodiment, the axial direction of the connecting post 832 is parallel to the width direction of the base 820. The cover plate 831 is received in the second mounting groove 822 and sleeved over the connecting post 832. The cover plate 831 partially extends out of the second mounting groove 822 to form a cover portion. The cover portion is located above the socket 810 and is adapted to slide along the axial direction of the connecting post 832 to close or open the notch of the receiving groove 811.

[0083] Preferably, there are two cover plates 831 arranged side by side along the width of the base 820. The two cover plates 831 are adapted to move toward each other under the drive of the transmission assembly 840 to close the receiving slot 811, or move away from each other to open the receiving slot 811. By adopting this structure, the movement path of a single cover plate 831 can be shortened, thereby improving opening and closing efficiency.

[0084] However, when the cover 831 is closed, it also blocks the product's photosensitive area, making it difficult for the light source mechanism 300 to illuminate the product's photosensitive area. In a preferred embodiment, the cover 831 is provided with a vertically extending escape portion 8311. The escape portion 8311 allows the product to escape from the photosensitive area, preventing the product from escaping from the receiving slot 811. When in a testing state, the light source mechanism 300 can be sealed on top of the escape portion 8311, directing light from the escape portion 8311 toward the product's photosensitive area.

[0085] Furthermore, the transmission assembly 840 includes a transmission plate 841, a second follower 842, and a second spring 843. The transmission plate 841 is vertically movable within the second mounting hole 823. The transmission plate 841 is provided with two second guide holes 8411 extending along the length of the base 820. The second guide holes 8411 are arranged in a figure-eight pattern, with the distance between the upper ends of the two second guide holes 8411 being smaller than the distance between the lower ends. A notch 824 is provided between the second mounting slot 822 and the second mounting hole 823. The second follower 842 is secured to the cover plate 831 and is at least partially embedded in the second guide hole 8411 through the notch 824. The second follower 842 has the same structure as the first follower 470. There are two second followers 842, each corresponding to the cover plate 831 and / or the second guide holes 8411. The transmission plate 841 has a protrusion 8412 that opposes the bottom of the base 820. The second spring 843 extends and contracts in a direction parallel to the vertical direction, and the second spring 843 is held between the bottom of the base 820 and the protrusion 8412. The second spring 843 is adapted to provide a force that drives the transmission plate 841 downward, causing the second follower 842 to abut against the upper end of the second guide hole 8411. The switching mechanism 900 is located below the turntable 700 and is adapted to lift the transmission plate 841, allowing the second guide hole 8411 to rise, thereby driving the two cover plates 831 to move away from each other to an open state. When the switching mechanism 900 descends, the second guide hole 8411 is adapted to descend under the rebound action of the second spring 843, thereby driving the cover plates 831 to move toward each other to a closed state.

[0086] Furthermore, the switching mechanism 900 includes a mounting base 910, a lifting driver 920, and a third follower 930. The lifting driver 920 is disposed on the mounting base 910 and is specifically a linear cylinder arranged in a vertical direction. A connecting block 940 is fixed to the output end of the lifting driver 920, and the third follower 930 is mounted on the connecting block 940. The structure of the third follower 930 is the same as that of the second follower 842. It corresponds to the bottom of the transmission plate 841. The lifting driver 920 is adapted to drive the third follower 930 upward to lift the transmission plate 841.

[0087] The working process of the test system of the present invention is as follows: the switching mechanism 900 lifts the transmission assembly 840 of the socket mechanism 800 at the loading and unloading station, so that the cover assembly 830 of the socket mechanism 800 is in the open state. Then, the product to be tested is loaded into the socket 810, and then the switching mechanism 900 is reset downward, so that the cover assembly 830 is sealed above the product; the turntable 700 drives the socket mechanism 800 to move to the test station so that the socket mechanism 800 is in the test gap 600, and then the connecting rod driving member 500 drives the electric measuring mechanism 200 and the light source mechanism 300 move toward each other to the testing state, the electrical testing board 220 is electrically connected to the bottom of the socket 810, and the second lifting seat 310 is sealed at the avoidance portion 8311 of the cover assembly 830. The light emitted by the light source 320 can be emitted to the photosensitive area of ​​the product through the light outlet 311 and the avoidance portion 8311, so that the product can undergo various tests; after the test is completed, the turntable 700 drives the socket mechanism 800 to flow back to the loading and unloading station, and the switching mechanism 900 lifts the transmission assembly 840 again to open the cover assembly 830 so that the tested product can be removed from the socket 810.

[0088] The above description is only an implementation method of the present application and does not limit the patent scope of the present application. Any equivalent structure or equivalent process transformation made using the contents of the description and drawings of this application, or directly or indirectly applied in other related technical fields, are also included in the patent protection scope of the present application.

Claims

1. An electrical testing device, characterized in that: include: Mounting frame (100); An electric measuring mechanism (200) is arranged on the mounting frame (100) so as to be movable in a vertical direction; A light source mechanism (300) is disposed on the mounting frame (100) so as to be liftable in a vertical direction, and is arranged opposite to the electrical measuring mechanism (200) in the vertical direction; The connecting rod mechanism (400) comprises: A rotating shaft (410) is rotatably disposed on the mounting frame (100), and an output end of the connecting rod driving member (500) is connected to the rotating shaft (410); A lever (420) adapted to rotate synchronously with the rotating shaft (410); A first connecting rod (430), both ends of which are hinged to one end of the lever (420) and the electric measuring mechanism (200); a second connecting rod (440) having two ends hingedly connected to the other end of the lever (420) and the light source mechanism (300), wherein the first connecting rod (430) and the second connecting rod (440) cause the electric measuring mechanism (200) and the light source mechanism (300) to move toward or away from each other in response to the rotation of the lever (420); A connecting rod driving member (500) is provided on the mounting frame (100) and is in transmission connection with the connecting rod mechanism (400); A test gap (600) for accommodating a product is formed between the electric measuring mechanism (200) and the light source mechanism (300). The electric measuring mechanism (200) and the light source mechanism (300) are adapted to move toward each other in a vertical direction to a test state driven by the connecting rod mechanism (400) to illuminate and test the product, or to move away from each other in a vertical direction to a separated state to allow the product to enter and exit.

2. The electrical testing device according to claim 1, wherein: The lever (420) is fixedly sleeved on the rotating shaft (410); alternatively, the connecting rod mechanism (400) further includes a rotating member (450) and a cam (460), wherein the rotating member (450) is supported between the mounting frame (100) and the lever (420) so that the lever (420) can rotate relative to the mounting frame (100), and the cam (460) is fixedly sleeved on the rotating shaft (410) and is transmission-connected to the electric measuring mechanism (200), and the lever (420) rotates in response to the rotation of the cam (460).

3. The electrical testing device according to claim 1, wherein: The electric measuring mechanism (200) is located below the light source mechanism (300). When the electric measuring mechanism (200) and the light source mechanism (300) move toward each other, the electric measuring mechanism (200) is adapted to move upwards toward the product and be electrically connected to the product, while the light source mechanism (300) is adapted to move downwards toward the product and cover the photosensitive area of ​​the product.

4. The electrical testing device according to claim 3, wherein: The electrical measuring mechanism (200) comprises: A first lifting seat (210) is slidably connected to the mounting frame (100); An electrical measuring plate (220) is fixed on the first lifting seat (210); A connector (230) electrically connected to the electrical test board (220) and external testing equipment, respectively; The surface of the electrical testing board (220) is perpendicular to the vertical direction, and the upper surface of the electrical testing board (220) is provided with an electrical connection element (221) for electrically connecting to a product.

5. The electrical testing device according to claim 3, wherein: The light source mechanism (300) comprises: A second lifting seat (310) is slidably connected to the mounting frame (100), and the second lifting seat (310) is provided with a light exit hole (311) extending vertically therethrough; A light source (320) is fixed to the top of the second lifting seat (310), and its irradiation end is in contact with the top of the light exit hole (311); Wherein, the bottom of the light exit hole (311) is suitable for covering the photosensitive area of ​​the product.

6. A testing system, characterized in that: include: The electrical testing device (1000) according to any one of claims 1 to 5; A turntable device (2000) comprising a turntable (700) and a plurality of socket mechanisms (800) for accommodating products, wherein the plurality of socket mechanisms (800) are evenly distributed on the turntable (700) along the circumference of the turntable (700), and the turntable (700) is suitable for driving the socket mechanisms (800) to move into or out of the test gap (600); When the electrical measuring mechanism (200) and the light source mechanism (300) move toward each other to a testing state, the electrical measuring mechanism (200) and the light source mechanism (300) are adapted to be connected to the socket mechanism (800).

7. The test system according to claim 6, wherein: The socket mechanism (800) includes a socket (810), the socket (810) is recessed inward from the top thereof to form a receiving groove (811), the product is adsorbed and positioned in the receiving groove (811), and is electrically connected to the socket (810), and the photosensitive area of ​​the product is arranged upward. When the electric measuring mechanism (200) and the light source mechanism (300) are in a testing state, the electric measuring mechanism (200) is electrically plugged into the bottom of the socket (810), and the light source mechanism (300) is sealed at the notch of the receiving groove (811) and is suitable for emitting light from the notch of the receiving groove (811) to the photosensitive area of ​​the product.

8. The test system according to claim 7, wherein: The socket mechanism (800) further comprises: A base (820) is provided on the turntable (700), and the socket (810) is provided on the base (820); a cover assembly (830) disposed on the base (820) and movable to a closed state to cover the notch of the receiving groove (811), or to an open state to open the notch of the receiving groove (811); A transmission assembly (840) connected to the cover assembly (830); The turntable device (2000) comprises a switching mechanism (900), wherein the switching mechanism (900) is adapted to approach and push the transmission assembly (840), and the cover assembly (830) can be switched to an open state under the drive of the transmission assembly (840), and when the switching mechanism (900) moves away from the transmission assembly (840), the transmission assembly (840) is adapted to reset and drive the cover assembly (830) to switch to a closed state.

9. The test system according to claim 8, wherein: The cover plate assembly (830) includes: A connecting column (832) is fixed to the base (820); There are two cover plates (831), both of which are sleeved on the connecting column (832), and the two cover plates (831) are suitable for moving in opposite directions along the axis of the connecting column (832) to an open state or moving towards each other to a closed state; The cover plate (831) is provided with a avoidance portion (8311) extending vertically therethrough for avoiding the photosensitive area of ​​the product. The light source mechanism (300) in the test state can be sealed on the top of the avoidance portion (8311) and emit light from the avoidance portion (8311) to the photosensitive area of ​​the product.

Citation Information

Patent Citations

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