Hard disk test method and device, electronic equipment and computer readable storage medium

Abstract

The invention provides a hard disk testing method and device, electronic equipment and a computer readable storage medium, and relates to the technical field of hard disk testing. The hard disk testing method comprises the following steps: acquiring a hard disk use scene of a user; wherein the hard disk use scene at least comprises one of the following types: a system disk, a backup disk, a cache disk, a load disk and a common disk; segmenting a preset test period based on types included in the hard disk use scene; determining a test plan based on the segmented test periods and the test items corresponding to the types; by judging the use scene of the user, determining the aging test scheme in a targeted manner and comprehensively considering and simulating the use scene of a real user, the real aging result can be ensured, and the reliability of the aging data and the stability of the whole solid state disk in the use scene can be improved.

Description

Technical Field

[0001] The present invention relates to the technical field of hard disk testing, and in particular to a hard disk testing method, device, electronic equipment and computer-readable storage medium. Background Art

[0002] Most of the existing technical solutions do not take the aging test of solid-state drives into comprehensive consideration, resulting in a large deviation between the test method and the actual user usage scenario. The actual user model is not taken into consideration, but judgment is made through the mapping table inside the firmware. Once read interference or even uncorrectable errors occur during the read interference process, users will not only face unstable performance, but may even face the problem of data loss.

[0003] In the prior art, an aging test is performed in the firmware of the SSD through EC (erase count), ignoring the scenario of reading in user use. If data inconsistency caused by read interference occurs, this solution cannot simulate the actual scenario and the aging data provided is unreliable. Summary of the invention

[0004] The purpose of the present invention is to provide a hard disk testing method, device, electronic device and computer-readable storage medium. By judging the user's usage scenario, an aging test plan is determined in a targeted manner, and the usage scenario of the real user is fully considered to ensure the authenticity of the aging result, improve the reliability of the aging data, and the stability of the entire solid-state hard disk in the usage scenario.

[0005] In a first aspect, the present invention provides a hard disk testing method, comprising:

[0006] Obtain the user's hard disk usage scenario; wherein the hard disk usage scenario includes at least one of the following types: system disk, backup disk, cache disk, load disk and ordinary disk;

[0007] Split the preset test cycles based on the types included in the hard disk usage scenario;

[0008] Determine the test plan based on the divided test cycles and test items corresponding to the types.

[0009] In some preferred embodiments of the present invention, at least one target type corresponding to the hard disk usage scenario;

[0010] The steps of dividing the preset test cycle based on the types included in the hard disk usage scenario include:

[0011] Determine the target type corresponding to the hard disk usage scenario;

[0012] Determine the test item corresponding to the target type as the target test item;

[0013] Assigning a first weight to the first test time of the target test item plan;

[0014] Assign a second weight to the second test time of the test item plan corresponding to the remaining types except the target type; wherein the first weight is greater than the second weight;

[0015] The preset test cycle is divided based on the first test time, the first weight, the second test time and the second weight.

[0016] In some preferred embodiments of the present invention, the step of dividing the preset test cycle based on the first test time, the first weight, the second test time and the second weight includes:

[0017] Normalizing the first weight and the second weight;

[0018] The preset test cycle is divided based on the standardized first weight, the first test time, the standardized second weight and the second test time.

[0019] In some preferred embodiments of the present invention, the first test time, the second test time and the test period are constrained by the following formula:

[0020] N×T1+M×T2=T a ;

[0021] Where N is the number of target types; T1 is the first test time; M is the number of types remaining except the target type; T2 is the second test time; T a For the test cycle.

[0022] In some preferred embodiments of the present invention, the first weight after normalization and the second weight after normalization are constrained by the following formula:

[0023] N×Q1+M×Q2=100;

[0024] Among them, N is the number of target types; Q1 is the first weight after normalization; M is the number of types remaining except the target type; Q2 is the second weight after normalization.

[0025] In a second aspect, the present invention provides a hard disk testing device, comprising:

[0026] A hard disk usage scenario determination module, used to obtain a user's hard disk usage scenario; wherein the hard disk usage scenario includes at least one of the following types: system disk, backup disk, cache disk, load disk and ordinary disk;

[0027] A test cycle processing module, used for dividing the preset test cycle based on the types included in the hard disk usage scenario;

[0028] The test plan determination module is used to determine the test plan based on the divided test cycles and test items corresponding to the types.

[0029] In some preferred embodiments of the present invention, at least one target type corresponding to the hard disk usage scenario;

[0030] A test cycle processing module is used to determine the target type corresponding to the hard disk usage scenario; determine the test item corresponding to the target type as the target test item; assign a first weight to the first test time planned for the target test item; assign a second weight to the second test time planned for the test items corresponding to the remaining types except the target type; wherein the first weight is greater than the second weight; and divide the preset test cycle based on the first test time, the first weight, the second test time and the second weight.

[0031] In some preferred embodiments of the present invention, the test cycle processing module is used to standardize the first weight and the second weight; and divide the preset test cycle based on the standardized first weight, the first test time, the standardized second weight and the second test time.

[0032] In a third aspect, the present invention provides an electronic device including a processor and a memory, wherein the memory stores computer executable instructions that can be executed by the processor, and the processor executes the computer executable instructions to implement the hard disk testing method of the first aspect.

[0033] In a fourth aspect, the present invention provides a computer-readable storage medium storing computer-executable instructions. When the computer-executable instructions are called and executed by a processor, the computer-executable instructions prompt the processor to implement the hard disk testing method of the first aspect.

[0034] The present invention brings the following beneficial effects:

[0035] The present invention provides a hard disk testing method, device, electronic device and computer-readable storage medium, including: obtaining a user's hard disk usage scenario; wherein the hard disk usage scenario includes at least one of the following types: a system disk, a backup disk, a cache disk, a load disk and a common disk; dividing a preset test cycle based on the type included in the hard disk usage scenario; determining a test plan based on the divided test cycles and test items corresponding to the types; determining an aging test plan in a targeted manner by judging the user's usage scenario, and comprehensively considering the simulation of the usage scenario of the real user, thereby ensuring the authenticity of the aging result, improving the reliability of the aging data, and the stability of the entire solid-state hard disk in the usage scenario. BRIEF DESCRIPTION OF THE DRAWINGS

[0036] In order to more clearly illustrate the specific implementation methods of the present invention or the technical solutions in the prior art, the drawings required for use in the specific implementation methods or the description of the prior art will be briefly introduced below. Obviously, the drawings described below are some implementation methods of the present invention. For ordinary technicians in this field, other drawings can be obtained based on these drawings without paying creative work.

[0037] Figure 1 A flowchart of a hard disk testing method provided by an embodiment of the present invention;

[0038] Figure 2 A test cycle segmentation flow chart provided by an embodiment of the present invention;

[0039] Figure 3 A structural schematic diagram of a hard disk testing device provided by an embodiment of the present invention;

[0040] Figure 4 A schematic diagram of the structure of an electronic device provided by an embodiment of the present invention.

[0041] Icons: 310 - hard disk usage scenario determination module; 320 - test cycle processing module; 330 - test plan determination module; 400 - memory; 401 - processor; 402 - bus; 403 - communication interface. DETAILED DESCRIPTION

[0042] In order to make the purpose, technical solutions and advantages of the embodiments of the present invention clearer, the technical solutions in the embodiments of the present invention will be clearly and completely described below in conjunction with the drawings in the embodiments of the present invention. Obviously, the described embodiments are part of the embodiments of the present invention, not all of the embodiments. Generally, the components of the embodiments of the present invention described and shown in the drawings here can be arranged and designed in various different configurations.

[0043] Therefore, the following detailed description of the embodiments of the present invention provided in the accompanying drawings is not intended to limit the scope of the invention claimed for protection, but merely represents selected embodiments of the present invention. Based on the embodiments of the present invention, all other embodiments obtained by ordinary technicians in this field without creative work are within the scope of protection of the present invention.

[0044] It should be noted that similar reference numerals and letters denote similar items in the following drawings, and therefore, once an item is defined in one drawing, further definition and explanation thereof is not required in subsequent drawings.

[0045] In the description of the present invention, it should be noted that the terms "center", "upper", "lower", "left", "right", "vertical", "horizontal", "inside", "outside", etc. indicate positions or positional relationships based on the positions or positional relationships shown in the accompanying drawings, or the positions or positional relationships in which the product of the invention is usually placed when in use. They are only for the convenience of describing the present invention and simplifying the description, and do not indicate or imply that the device or element referred to must have a specific position, be constructed and operated in a specific position, and therefore cannot be understood as limiting the present invention. In addition, the terms "first", "second", "third", etc. are only used to distinguish the description, and cannot be understood as indicating or implying relative importance.

[0046] In addition, the terms "horizontal", "vertical", "overhanging" and the like do not mean that the components are required to be absolutely horizontal or overhanging, but can be slightly tilted. For example, "horizontal" only means that its direction is more horizontal than "vertical", and does not mean that the structure must be completely horizontal, but can be slightly tilted.

[0047] In the description of the present invention, it is also necessary to explain that, unless otherwise clearly specified and limited, the terms "set", "install", "connect", and "connect" should be understood in a broad sense, for example, it can be a fixed connection, a detachable connection, or an integral connection; it can be a mechanical connection or an electrical connection; it can be a direct connection, or it can be indirectly connected through an intermediate medium, or it can be the internal communication of two elements. For ordinary technicians in this field, the specific meanings of the above terms in the present invention can be understood according to specific circumstances.

[0048] When the SSD is subjected to an aging test, in order to achieve data accuracy, the internal algorithms caused by various reading, writing and erasing situations need to be considered to improve the reliability of the aging test results. For aging test methods with different algorithms or superposition types, comprehensive consideration should be given to whether they can simulate the usage scenarios of real users, so as to ensure the authenticity of the aging results, improve the reliability of the aging data, and the stability of the entire SSD in the usage scenario.

[0049] Flash memory is not an ideal storage medium. Especially when the density of flash memory continues to increase, its reliability is decreasing, and its unreliable characteristics are increasingly prominent. Therefore, it is urgent to solve the reliability problem from different levels. Among them, the aging test is based on the failure law of the bathtub curve of NAND characteristics, finds out the early failure, and then selects good products to provide customers to meet reliability requirements. The reasons for its poor reliability can be mainly attributed to the following reasons:

[0050] RDD (read disturb) refers to the phenomenon that when reading a NAND page, it will affect other pages on the same block, causing data on these other pages to have read errors. In order to effectively avoid such data read errors, it is necessary to move the data on the block in time to ensure data reliability;

[0051] DR (data retention) In the data retention process, as time goes by, the electrons stored in the floating gate are affected by the electric field and will "escape" / "capture" through the insulating layer. When the number of electrons reaches a certain value, the data will flip, eventually leading to the loss of user data. Therefore, it is essential to move the data in time;

[0052] The problem of wear leveling (WL) cannot be ignored. When the wear levels of each block on the NAND flash memory are uneven, it will affect the service life of the SSD. In this case, it is necessary to exchange the data stored on the blocks with less wear with the data on the blocks with more wear to achieve wear leveling. This process actually involves moving the data on the blocks with less wear.

[0053] GBB (grow bad block) is a bad block that often occurs during the use of the solid-state drive. When such errors occur, it is necessary to immediately obtain the correct data through error correction algorithms or Raid methods, and decide whether to mark it as a bad block based on its own algorithm, and move the data to a new, good block to ensure normal storage and reading of data.

[0054] When GC (garbage collection) SSD is used normally, because the units of page write operation and block erase operation are different, during the process of random write / repeated address write operation, it is necessary to recycle and move the invalid data on the block, and this behavior can also be called foreground GC.

[0055] Since NAND has the above-mentioned unique properties, in order to ensure its reliability and stability, data needs to be moved during the internal management process. When the solid-state drive is in use, if the above-mentioned situations occur at the same time and all data need to be moved, it will cause resource competition problems, resulting in performance fluctuations, and may even cause data errors due to untimely movement. To solve this problem, the present invention proposes a method for optimizing the aging test of solid-state drives, thereby improving the reliability and performance stability of solid-state drives.

[0056] Some embodiments of the present invention are described in detail below in conjunction with the accompanying drawings. In the absence of conflict, the following embodiments and features in the embodiments can be combined with each other.

[0057] Embodiment 1

[0058] The embodiment of the present invention provides a hard disk testing method, see Figure 1 The flowchart of a hard disk testing method provided by an embodiment of the present invention is shown, and the method includes:

[0059] Step S102, obtaining the user's hard disk usage scenario; wherein the hard disk usage scenario includes at least one of the following types: system disk, backup disk, cache disk, load disk and ordinary disk.

[0060] Specifically, first, we need to understand the user's hard disk usage scenarios. This can be obtained through user surveys and product feedback. Hard disk usage scenarios include at least one of the following types: system disk, backup disk, cache disk, load disk and ordinary disk. The system disk is mainly used for the startup and operation of the operating system, the backup disk is used to store backups of important data, the cache disk is used to increase data access speed, the load disk is used to withstand the pressure of large amounts of data reading and writing, and the ordinary disk is a general-purpose hard disk.

[0061] Step S104, dividing the preset test cycle based on the types included in the hard disk usage scenario.

[0062] Specifically, after understanding the user's hard disk usage scenarios, we need to divide the test cycle according to these scenarios. For example, for system disks, we may need to perform more startup and operation tests; for backup disks, we may need to perform more data recovery tests; for cache disks, we may need to perform more read and write speed tests; for load disks, we may need to perform more stress tests; for ordinary disks, we may need to perform more general performance tests. In this way, we can ensure that our test plan can fully cover various usage scenarios.

[0063] Further, in some preferred embodiments of the present invention, the hard disk usage scenario corresponds to at least one target type; the step of dividing the preset test cycle based on the types included in the hard disk usage scenario, see Figure 2 The embodiment of the present invention shown in the figure provides a test cycle segmentation flow chart, the segmentation process includes:

[0064] Step S202, determining the target type corresponding to the hard disk usage scenario.

[0065] Specifically, first, we need to determine the target type based on the user's hard disk usage scenario. This can be obtained through user surveys, market research, and product feedback. Hard disk usage scenarios include at least one of the following types: system disk, backup disk, cache disk, load disk, and ordinary disk. The system disk is mainly used to start and run the operating system, the backup disk is used to store backups of important data, the cache disk is used to increase data access speed, the load disk is used to withstand the pressure of large amounts of data reading and writing, and the ordinary disk is a general-purpose hard disk.

[0066] Step S204: determine the test item corresponding to the target type as the target test item.

[0067] Specifically, after determining the target type, we need to determine the target test items corresponding to the target type. For example, for system disks, we may need to perform more startup and operation tests; for backup disks, we may need to perform more data recovery tests; for cache disks, we may need to perform more read and write speed tests; for load disks, we may need to perform more stress tests; for ordinary disks, we may need to perform more general performance tests. In this way, we can ensure that our test plan can fully cover various usage scenarios.

[0068] For example, we classify the aging tests required by different algorithms into the following categories: Read Disturb (RD), Data Retention (DR), Wear Leveling (WL), Grow Bad Block (GBB), and Garbage Collection (GC). These aging tests correspond to different hard disk usage scenarios, such as system disk, backup disk, cache disk, load disk, and ordinary disk.

[0069] Step S206, assigning a first weight to the first test time planned for the target test item.

[0070] Specifically, after determining the target test items, we need to assign a weight to the first test time planned for these test items. This weight can be adjusted according to the actual situation. For example, if we think the target test item is very important, we can assign a higher weight to it.

[0071] Step S208, assigning a second weight to the second test time of the test item plan corresponding to the remaining types except the target type; wherein the first weight is greater than the second weight.

[0072] Specifically, after assigning weights to the target test items, we need to assign a weight to the second test time planned for other types of test items. This weight should be smaller than the first weight to reflect the importance of the target test item.

[0073] Generally, set various types of aging data test loads: RDD: pure read load, DR: write the entire disk and then power off, WL: sequential write load, GBB: random read, write and erase load, GC: random read and write, and the load relationship satisfies: RDD+DR+WL+GBB+GC=10 days (test period);

[0074] For example, we assign scores to the aging test proposed in step S204, with a total score of 100 points, and 20 points for each item by default, such as: RDD: 20, DR: 20, WL: 20, GBB: 20, GC: 20. The specific principles for increasing or decreasing the scores are as follows:

[0075] For users who use SSD as system disk, the target type is system disk. Since there are more read operations, the target test item corresponding to the target type is RDD. Therefore, the score of RDD (that is, the first weight) is increased to 80 points, and the score of each of the other four items (that is, the second weight) is 5 points;

[0076] For users who use SSDs for data backup, since there are many cold data migration operations, the DR score is increased to 80 points, and the other four items are 5 points each;

[0077] For users who use SSD as cache disk, due to the large number of hot data migration operations, the WL score is increased to 80 points, and the other four items are 5 points each;

[0078] For users who use SSD as a load scenario, since they need to process a large number of read, write and erase operations, the score of GBB is increased to 80 points, and the other four items are 5 points each;

[0079] For general scenario user groups, since random read and write operations are required to meet various load relations, the GC score is increased to 80 points, and the other four items are 5 points each.

[0080] Step S210, dividing the preset test cycle based on the first test time, the first weight, the second test time and the second weight.

[0081] Specifically, after assigning weights to all test items, we need to split the preset test cycle according to these weights. Specifically, we can divide the test cycle into multiple stages, each corresponding to a test item. Then, we can adjust the duration of each stage according to the weight of the stage. For example, if we think that a certain stage has a higher weight, then we can increase the duration of the stage; vice versa. In this way, we can ensure that our test plan can effectively utilize limited resources to meet the needs of different types of hard drives.

[0082] Furthermore, in some preferred embodiments of the present invention, the step of dividing the preset test cycle based on the first test time, the first weight, the second test time and the second weight includes: standardizing the first weight and the second weight; dividing the preset test cycle based on the standardized first weight, the first test time, the standardized second weight and the second test time.

[0083] Furthermore, in some preferred embodiments of the present invention, the first weight after standardization and the second weight after standardization are constrained by the following formula: N×Q1+M×Q2=100; wherein N is the number of target types; Q1 is the first weight after standardization; M is the number of types remaining except the target type; Q2 is the second weight after standardization.

[0084] Specifically, when the RDD load user group and the GC load user group exist at the same time (for example, ordinary consumers use it as both a system disk and a general scenario disk), then RDD 80 points + GC 80 points + the sum of other items 15 points = 175 points. Adjusted to 100% in proportion, that is, RDD = 80 / 175 points, GC = 80 / 175 points, etc. Similarly, the number of test days is rounded up, with the minimum unit being hours.

[0085] Specifically, in step S106, a test plan is determined based on the divided test cycles and test items corresponding to the types.

[0086] Specifically, after determining the test cycle and test type, we can start to develop a detailed test plan. This test plan should include the specific description of each test item, expected results, test methods, test tools and other information. For example, for system disks, our test plan may include boot time test, system stability test, system resource usage test, etc.; for backup disks, our test plan may include data recovery speed test, data recovery integrity test, data recovery reliability test, etc.; for cache disks, our test plan may include read speed test, write speed test, cache hit rate test, etc.; for load disks, our test plan may include continuous read and write test, random read and write test, high concurrent read and write test, etc.; for ordinary disks, our test plan may include file transfer speed test, file system performance test, hard disk life test, etc.

[0087] Further, in some preferred embodiments of the present invention, the first test time, the second test time and the test period are constrained by the following formula: N×T1+M×T2=T a ; Where N is the number of target types; T1 is the first test time; M is the number of types other than the target type; T2 is the second test time; T a For the test cycle.

[0088] Exemplarily, the above scores are assigned 80 for the main scenarios based on the 80:20 principle to grasp the main contradictions. Then, we set the test loads for various types of aging data: RDD is a pure read load, DR is a power-off placement after writing the entire disk, WL is a sequential write load, GBB is a random read, write and erase load, and GC is a random read and write load. The load relationships are satisfied. When a user is identified as a certain type, the score weight is matched to generate a test data model. For example, for the RDD model: RDD load is 8 days, DR load is 0.5 days, WL load is 0.5 days, GBB load is 0.5 days, and GC load is 0.5 days; when it is identified as a user group of one of the above types, the corresponding weighted scores are added together and re-weighted.

[0089] When the comprehensive mode is identified, the default score is 20 points for each item. That is to say, for a 10-day operation cycle, each load runs for 2 days. The load pressure and static trigger internal algorithm migration in the above steps need to be adjusted according to the actual product specifications. The aging test cycle needs to be set according to the actual situation based on the quality of different products.

[0090] Furthermore, in some preferred embodiments of the present invention, the method further comprises: dynamically adjusting the test cycle based on the number of server error reports; specifically comprising the following steps:

[0091] Error number monitoring: First, you need to implement a monitoring system to track and record the number of errors on the server. This can be achieved through log management tools or custom scripts.

[0092] Set thresholds: Determine different thresholds for the number of errors to trigger adjustments to the test cycle. For example, you can set three levels: low (0-10 errors), medium (11-50 errors), and high (more than 50 errors).

[0093] Propose a dynamic adjustment strategy: If the number of errors is at a low level: the test cycle can be relatively extended, because it indicates that the server is running stably and does not require frequent testing. If the number of errors is at a medium level: the test cycle should be shortened, system problems should be checked more frequently, and more in-depth tests should be performed for known problems. If the number of errors is at a high level: the test cycle needs to be significantly shortened, and intensive testing should be performed immediately to quickly identify and solve problems.

[0094] Design feedback mechanisms: After each test, collect and analyze test results, and further adjust the test cycle based on this information. If the test results show that the problem is solved quickly, you can consider less frequent test cycles; if the problem is complex and persistent, you may need to continue with shorter test cycles until the problem is solved.

[0095] Based on the historical data and trends of server errors, continuously optimize the threshold and test cycle adjustment strategy. This includes considering the severity of the error, some serious errors may require immediate testing, while minor errors can be resolved in the next regular test.

[0096] The test frequency can be automatically adjusted by setting up a monitoring and alarm system. In this way, when the number of errors exceeds the preset threshold, the system can immediately notify the test team and adjust the test plan. Ensure that the test cycle is flexibly adjusted according to the actual operation of the server, thereby effectively maintaining the stability and performance of the server.

[0097] The technical solution of the present invention optimizes the problem of matching various types of aging data with user groups. Compared with the traditional method of finding early errors based only on the internal part of the SSD, the present invention combines user groups and accurately finds early errors according to score weighting. At the same time, a comprehensive aging test method is provided for SSD in various scenarios.

[0098] The hard disk testing method provided by the present invention classifies and processes the aging test methods according to different algorithmic reasons, assigns values ​​and decentralizes rights, adopts specific methods to test specific users, and finds out problems that are more in line with reality; for various problems that cause customer dissatisfaction, it reconsiders them comprehensively from the user's perspective, with a clear purpose, avoids inaccurate reliability data, and solves the practical problem of being overwhelmed by the inconsistency between application and actual testing.

[0099] The present invention provides a hard disk testing method, comprising: obtaining a user's hard disk usage scenario; wherein the hard disk usage scenario includes at least one of the following types: a system disk, a backup disk, a cache disk, a load disk, and a common disk; dividing a preset test cycle based on the types included in the hard disk usage scenario; determining a test plan based on the divided test cycles and test items corresponding to the types; determining an aging test plan in a targeted manner by judging the user's usage scenario, and comprehensively considering the simulation of the usage scenario of the real user, thereby ensuring the authenticity of the aging result, improving the reliability of the aging data, and the stability of the entire solid-state hard disk in the usage scenario.

[0100] Embodiment 2

[0101] Based on the above embodiments, the present invention provides a hard disk testing device. Figure 3 The structure diagram of a hard disk testing device provided by an embodiment of the present invention is shown, and the device includes:

[0102] The hard disk usage scenario determination module 310 is used to obtain the user's hard disk usage scenario; wherein the hard disk usage scenario includes at least one of the following types: system disk, backup disk, cache disk, load disk and ordinary disk.

[0103] The test cycle processing module 320 is used to divide the preset test cycles based on the types included in the hard disk usage scenario.

[0104] The test plan determination module 330 is used to determine the test plan based on the divided test cycles and test items corresponding to the types.

[0105] Furthermore, in some preferred embodiments of the present invention, at least one target type corresponds to the hard disk usage scenario; a test cycle processing module 320 is used to determine the target type corresponding to the hard disk usage scenario; the test item corresponding to the target type is determined as the target test item; a first weight is assigned to the first test time planned for the target test item; a second weight is assigned to the second test time planned for the test items corresponding to the remaining types except the target type; wherein the first weight is greater than the second weight; and the preset test cycle is divided based on the first test time, the first weight, the second test time and the second weight.

[0106] Furthermore, in some preferred embodiments of the present invention, the test cycle processing module 320 is used to standardize the first weight and the second weight; and divide the preset test cycle based on the standardized first weight, the first test time, the standardized second weight and the second test time.

[0107] Further, in some preferred embodiments of the present invention, the first test time, the second test time and the test period are constrained by the following formula: N×T1+M×T2=Ta ; Where N is the number of target types; T1 is the first test time; M is the number of types other than the target type; T2 is the second test time; T a For the test cycle.

[0108] Furthermore, in some preferred embodiments of the present invention, the first weight after standardization and the second weight after standardization are constrained by the following formula: N×Q1+M×Q2=100; wherein N is the number of target types; Q1 is the first weight after standardization; M is the number of types remaining except the target type; Q2 is the second weight after standardization.

[0109] Furthermore, in some preferred embodiments of the present invention, the device further comprises: a test cycle adjustment module, which is used to dynamically adjust the test cycle based on the number of server error reports.

[0110] Those skilled in the art can clearly understand that, for the convenience and brevity of description, the specific working process of the hard disk testing device described above can refer to the corresponding process in the aforementioned embodiment of the hard disk testing method, and will not be repeated here.

[0111] Embodiment 3

[0112] The embodiment of the present invention also provides an electronic device for running a hard disk testing method; see Figure 4 The structural diagram of an electronic device provided by an embodiment of the present invention is shown, and the electronic device includes a memory 400 and a processor 401, wherein the memory 400 is used to store one or more computer instructions, and the one or more computer instructions are executed by the processor 401 to implement the above-mentioned hard disk testing method.

[0113] Further, Figure 4 The electronic device shown further includes a bus 402 and a communication interface 403 , and the processor 401 , the communication interface 403 and the memory 400 are connected via the bus 402 .

[0114] The memory 400 may include a high-speed random access memory (RAM), and may also include a non-volatile memory, such as at least one disk storage. The communication connection between the system network element and at least one other network element is realized through at least one communication interface 403 (which may be wired or wireless), and the Internet, wide area network, local area network, metropolitan area network, etc. may be used. The bus 402 may be an ISA bus, a PCI bus, or an EISA bus, etc. The bus can be divided into an address bus, a data bus, a control bus, etc. For ease of representation, Figure 4Only one bidirectional arrow is used in the diagram, but this does not mean that there is only one bus or only one type of bus.

[0115] The processor 401 may be an integrated circuit chip with signal processing capabilities. In the implementation process, each step of the above method can be completed by the hardware integrated logic circuit or software instructions in the processor 401. The above processor 401 can be a general-purpose processor, including a central processing unit (CPU), a network processor (NP), etc.; it can also be a digital signal processor (DSP), an application-specific integrated circuit (ASIC), a field-programmable gate array (FPGA) or other programmable logic devices, discrete gates or transistor logic devices, discrete hardware components. The methods, steps and logic block diagrams disclosed in the embodiments of the present invention can be implemented or executed. The general processor can be a microprocessor or the processor can also be any conventional processor, etc. The steps of the method disclosed in the embodiment of the present invention can be directly embodied as a hardware decoding processor for execution, or a combination of hardware and software modules in the decoding processor for execution. The software module may be located in a storage medium mature in the art, such as a random access memory, a flash memory, a read-only memory, a programmable read-only memory, or an electrically erasable programmable memory, a register, etc. The storage medium is located in the memory 400, and the processor 401 reads the information in the memory 400 and completes the steps of the method of the above embodiment in combination with its hardware.

[0116] An embodiment of the present invention also provides a computer-readable storage medium, which stores computer-executable instructions. When the computer-executable instructions are called and executed by a processor, the computer-executable instructions prompt the processor to implement the above-mentioned hard disk testing method. The specific implementation can be found in the method embodiment, which will not be repeated here.

[0117] The computer program product of the hard disk testing method, device and electronic device provided in the embodiments of the present invention includes a computer-readable storage medium storing program code. The instructions included in the program code can be used to execute the method in the previous method embodiment. The specific implementation can be found in the method embodiment and will not be repeated here.

[0118] Those skilled in the art can clearly understand that, for the convenience and brevity of description, the specific working process of the system and / or device described above can refer to the corresponding process in the aforementioned method embodiment, and will not be repeated here.

[0119] In addition, in the description of the embodiments of the present invention, unless otherwise clearly specified and limited, the terms "installed", "connected", and "connected" should be understood in a broad sense, for example, it can be a fixed connection, a detachable connection, or an integral connection; it can be a mechanical connection or an electrical connection; it can be a direct connection or an indirect connection through an intermediate medium, or it can be the internal communication of two components. For ordinary technicians in this field, the specific meanings of the above terms in the present invention can be understood according to specific circumstances.

[0120] If the functions are implemented in the form of software functional units and sold or used as independent products, they can be stored in a computer-readable storage medium. Based on this understanding, the technical solution of the present invention, or the part that contributes to the prior art or the part of the technical solution, can be embodied in the form of a software product. The computer software product is stored in a storage medium, including several instructions for a computer device (which can be a personal computer, a server, or a network device, etc.) to perform all or part of the steps of the methods described in each embodiment of the present invention. The aforementioned storage medium includes: U disk, mobile hard disk, read-only memory (ROM, Read-Only Memory), random access memory (RAM, Random Access Memory), disk or optical disk, etc., which can store program codes.

[0121] Finally, it should be noted that the above embodiments are only used to illustrate the technical solutions of the present invention, rather than to limit it. Although the present invention has been described in detail with reference to the aforementioned embodiments, those skilled in the art should understand that they can still modify the technical solutions described in the aforementioned embodiments, or replace some or all of the technical features therein with equivalents. However, these modifications or replacements do not cause the essence of the corresponding technical solutions to deviate from the scope of the technical solutions of the embodiments of the present invention.

Claims

1. A hard disk testing method, characterized in that: include: Obtaining the user's hard disk usage scenario; wherein the hard disk usage scenario includes at least one of the following types: system disk, backup disk, cache disk, load disk and ordinary disk; Dividing the preset test cycle based on the types included in the hard disk usage scenario; A test plan is determined based on the divided test cycles and the test items corresponding to the types.

2. The hard disk testing method according to claim 1, characterized in that: at least one target type corresponding to the hard disk usage scenario; The step of dividing the preset test cycle based on the types included in the hard disk usage scenario includes: Determine the target type corresponding to the hard disk usage scenario; Determine the test item corresponding to the target type as a target test item; Assigning a first weight to a first test time planned for the target test item; Assigning a second weight to the second test time of the test items corresponding to the remaining types except the target type; wherein the first weight is greater than the second weight; The preset test cycle is divided based on the first test time, the first weight, the second test time, and the second weight.

3. The hard disk testing method according to claim 2, characterized in that: The step of dividing the preset test cycle based on the first test time, the first weight, the second test time and the second weight comprises: performing normalization processing on the first weight and the second weight; The preset test cycle is divided based on the first weight after standardization, the first test time, the second weight after standardization, and the second test time.

4. The hard disk testing method according to claim 2, characterized in that: The first test time, the second test time and the test period are constrained by the following formula: N×T1+M×T2=T a ; Wherein, N is the number of the target types; T1 is the first test time; M is the number of the remaining types except the target type; T2 is the second test time; T a For the test cycle.

5. The hard disk testing method according to claim 4, characterized in that: The first weight after normalization and the second weight after normalization are constrained by the following formula: N×Q1+M×Q2=100; Among them, N is the number of the target types; Q1 is the first weight after standardization; M is the number of the types remaining except the target type; Q2 is the second weight after standardization.

6. A hard disk testing device, characterized in that: include: A hard disk usage scenario determination module, used to obtain a user's hard disk usage scenario; wherein the hard disk usage scenario includes at least one of the following types: system disk, backup disk, cache disk, load disk and ordinary disk; A test cycle processing module, used for dividing the preset test cycle based on the types included in the hard disk usage scenario; A test plan determination module is used to determine a test plan based on the divided test cycles and test items corresponding to the types.

7. The hard disk testing device according to claim 6, characterized in that: at least one target type corresponding to the hard disk usage scenario; A test cycle processing module, used to determine the target type corresponding to the hard disk usage scenario; and determine the test item corresponding to the target type as a target test item; Assign a first weight to the first test time planned for the target test item; assign a second weight to the second test time planned for the test items corresponding to the remaining types except the target type; wherein the first weight is greater than the second weight; The preset test cycle is divided based on the first test time, the first weight, the second test time, and the second weight.

8. The hard disk testing device according to claim 7, characterized in that: A test cycle processing module is used to standardize the first weight and the second weight; and divide the preset test cycle based on the standardized first weight, the first test time, the standardized second weight and the second test time.

9. An electronic device, characterized in that: The invention comprises a processor and a memory, wherein the memory stores computer executable instructions that can be executed by the processor, and the processor executes the computer executable instructions to implement the hard disk testing method according to any one of claims 1 to 5.

10. A computer-readable storage medium, characterized in that: The computer-readable storage medium stores computer-executable instructions. When the computer-executable instructions are called and executed by a processor, the computer-executable instructions prompt the processor to implement the hard disk testing method according to any one of claims 1 to 5.

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