Calibration method, device, system and computer program product

Abstract

The invention provides a calibration method, device and system and a computer program product. The calibration method comprises the following steps: acquiring a first output signal of the analog-to-digital converter; the first output signal comprises an output signal of the analog-to-digital converter under the first input voltage; acquiring a first working temperature of the analog-to-digital converter; determining target calibration data in a preset voltage range according to the first working temperature; the preset voltage range comprises a first input voltage; determining a target calibration coefficient according to the first output signal and the target calibration data; and calibrating the first output signal according to the target calibration coefficient. The corresponding target calibration data can be matched according to different working temperatures in the specific input range of the analog-to-digital converter, so that the target calibration coefficient at the current working temperature can be directly determined, the deviation of the output signal of the analog-to-digital converter can be calibrated, the accuracy of a product applied by the analog-to-digital converter is improved, and the product quality is improved. And the calibration process is simple and easy to realize.

Description

Technical Field

[0001] The embodiments of the present application relate to the field of integrated circuit technology, and in particular, to a calibration method, device, system, and computer program product. Background Art

[0002] An analog-to-digital converter (ADC) is a system that converts continuous time and continuous amplitude signals (i.e., analog signals) into discrete time and discrete amplitude signals (i.e., digital signals). However, during the use of the ADC, the output signal of the ADC may be affected by external interference, noise and other factors, resulting in a deviation between the actual value and theoretical value of the ADC output signal. This deviation will affect the accuracy of the product to which the ADC is applied, which is not conducive to the use of the product.

[0003] Therefore, it is very important to calibrate the deviation of the ADC output signal. Summary of the invention

[0004] The present application provides a calibration method, device, system and computer program product, which can calibrate the deviation of ADC output signal and improve the accuracy of the product to which the ADC is applied.

[0005] In a first aspect, a calibration method is provided, which is applied to an analog-to-digital converter. The calibration method comprises: Acquire a first output signal of the analog-to-digital converter; the first output signal includes an output signal of the analog-to-digital converter under a first input voltage; Acquire a first operating temperature of the analog-to-digital converter; Determining target calibration data within a preset voltage range according to the first operating temperature; the preset voltage range includes the first input voltage; determining a target calibration coefficient based on the first output signal and the target calibration data; The first output signal is calibrated according to the target calibration coefficient.

[0006] In one implementation, the target calibration data includes calibration data corresponding to a preset operating temperature; and determining the target calibration data according to the first operating temperature includes: When the first operating temperature matches the preset operating temperature, the target calibration data is determined according to the first operating temperature index.

[0007] In one implementation, the target calibration data is determined based on the second output signal, the third output signal, the first calibration coefficient, and the second calibration coefficient at a preset operating temperature; The second output signal includes an output signal of the analog-to-digital converter at a second input voltage, and the third output signal includes an output signal of the analog-to-digital converter at a third input voltage; the preset voltage range includes the second input voltage and the third input voltage and the second input voltage is less than the third input voltage; The first calibration coefficient is used to indicate the deviation between the second output signal and the fourth output signal; the fourth output signal includes an ideal output signal of the analog-to-digital converter under the second input voltage; The second calibration coefficient is used to indicate the deviation between the third output signal and the fifth output signal; the fifth output signal includes an ideal output signal of the analog-to-digital converter under the third input voltage.

[0008] In one implementation, the second input voltage comprises a lower limit input voltage of the analog-to-digital converter; and the third input voltage comprises an upper limit input voltage of the analog-to-digital converter.

[0009] In one implementation, determining target calibration data according to the first operating temperature includes: When the first operating temperature does not match the preset operating temperature, determining a first temperature range according to the first operating temperature; The index determines target calibration data according to the first temperature range.

[0010] In one implementation, the target calibration data is determined based on the second operating temperature, the third operating temperature, the first calibration data, and the second calibration data. The second operating temperature includes the lower limit temperature of the first temperature range, and the third operating temperature includes the upper limit temperature of the first temperature range; The first calibration data includes calibration data corresponding to the second operating temperature; The second calibration data includes calibration data corresponding to the third operating temperature.

[0011] In one implementation, the first calibration data is determined based on the second output signal, the third output signal, the first calibration coefficient, and the second calibration coefficient at the second operating temperature; The second calibration data is determined based on the second output signal at the third operating temperature, the third output signal, the first calibration coefficient, and the second calibration coefficient; The second output signal includes an output signal of the analog-to-digital converter at a second input voltage, and the third output signal includes an output signal of the analog-to-digital converter at a third input voltage; The first calibration coefficient is used to indicate the deviation between the second output signal and the fourth output signal; the fourth output signal includes an ideal output signal of the analog-to-digital converter under the second input voltage; The second calibration coefficient is used to indicate the deviation between the third output signal and the fifth output signal; the fifth output signal includes an ideal output signal of the analog-to-digital converter under the third input voltage.

[0012] In a second aspect, a calibration device is provided, which is applied to an analog-to-digital converter. The calibration device comprises: A first interface circuit configured to receive a first output signal of the analog-to-digital converter; a second interface circuit configured to receive a first operating temperature of the analog-to-digital converter; The processing circuit is coupled to the first interface circuit and the second interface circuit, and is configured to execute the calibration method of the above first aspect or any one implementation of the first aspect.

[0013] In a third aspect, a calibration system is provided, which is applied to an analog-to-digital converter. The calibration system comprises: a storage unit configured to store target calibration data; The calibration device provided in the third aspect above is coupled to the storage unit and is configured to calibrate the first output signal of the analog-to-digital converter.

[0014] According to a fourth aspect, a computer program product is provided, comprising instructions, wherein when the instructions are executed by a processor, the calibration method according to the first aspect or any one implementation of the first aspect is executed.

[0015] Compared with the prior art, this application has at least one of the following technical effects: (1) The present application can match the corresponding target calibration data according to different operating temperatures within the specific input range of the ADC, so as to directly determine the target calibration coefficient at the current operating temperature, and calibrate the deviation of the ADC output signal through the target calibration coefficient. Even if the current operating temperature or input voltage of the ADC changes, it can still be accurately calibrated. In this way, calibration within a specific input range and temperature range can reduce the impact of temperature and input voltage changes on the reference voltage source or device, improve the accuracy of calibration, and improve the precision of the product to which the analog-to-digital converter is applied.

[0016] (2) Based on the target calibration data, the present application can achieve calibration only through the current actual output (first output signal) and current operating temperature (first operating temperature) of the ADC, without performing additional and complex calibration operations. The process is simple and easier to implement, which can optimize the calibration process and improve the calibration efficiency. BRIEF DESCRIPTION OF THE DRAWINGS

[0017] The following is a brief introduction to the drawings used in describing the embodiments of the present application: Figure 1 A schematic diagram of a calibration method provided in some embodiments of the present application; Figure 2 A schematic flow chart of another calibration method provided in some embodiments of the present application; Figure 3 A schematic diagram of the structure of another calibration device is provided in some embodiments of the present application; Figure 4 This is a schematic diagram of the structure of a calibration system provided in some embodiments of the present application. DETAILED DESCRIPTION

[0018] In order to more clearly illustrate the technical solutions in the embodiments of the present application, the specific implementation methods of the present application will be described below with reference to the accompanying drawings. The accompanying drawings described below are only some embodiments of the present application. For ordinary technicians in this field, other accompanying drawings and other embodiments can be obtained based on these accompanying drawings without creative work. Adjustments and improvements made without departing from the concept of the present application are all within the scope of protection of the present application.

[0019] In order to simplify the drawings, each of the drawings schematically shows only the parts related to the corresponding embodiments, and they do not represent the actual structure of the product, and there may be more or fewer structures or components in reality. In addition, in order to simplify the drawings and facilitate understanding, for the structures or components shown in the drawings, there may actually be more or fewer similar structures or components.

[0020] In this application, unless otherwise clearly specified and limited, ordinal numbers, such as "first", "second", etc., are only used to distinguish and describe associated objects, and cannot be understood as indicating or implying the relative importance or order between associated objects. In addition, ordinal numbers do not represent the number of associated objects. For example, "first output signal" may include one output signal, or multiple output signals. "Multiple" includes two or more, and other quantifiers are similar. " / " is used to describe the relationship between associated objects, which represents the "or" relationship between associated objects. "And / or" is used to describe the relationship between associated objects, which includes any combination relationship between associated objects, such as "a and / or b" includes: "alone a", "alone b", or "a and b". "One or more" or "at least one" in multiple objects refers to any object or any combination of multiple objects, such as "one or more of a1, a2, a3" or "at least one of a1, a2, a3" includes: "alone a1", "alone a2", "alone a3", "a1 and a2", "a1 and a3", "a2 and a3", or "a1, a2 and a3".

[0021] In the embodiments of the present application, "connection" includes direct or indirect connection between objects, which may be directly connected through a medium (e.g., a wire, a trace, etc.), or indirectly connected through other elements, or may be internally connected. Similarly, "coupling" includes signal connection between objects, which may be directly connected through a medium (e.g., a wire, a trace, etc.), or may be connected through other elements, etc.

[0022] An analog-to-digital converter (ADC) is a system that can convert continuous time and continuous amplitude signals (i.e., analog signals) into discrete time and discrete amplitude signals (i.e., digital signals). ADC can be used as an interface between analog signals and digital signal processing systems in the real world, and is a bridge between the analog world and the digital world. ADC has a wide range of applications, for example, it can be applied to related electronic systems or products in the fields of communications, industry, automobiles, and medical care (such as sensors, controllers, communication systems, etc.). During the use of ADC, the output signal of ADC may be affected by external interference, noise and other factors, resulting in a deviation between the actual value and theoretical value of the output signal of ADC. This deviation will affect the accuracy of the product to which ADC is applied, which is not conducive to the use of the product.

[0023] Taking the automotive field as an example, ADC can be used in vehicle controllers. The vehicle controller can receive analog data (or signals) generated in real time by various sensors, communication equipment, motors and other devices or devices in the vehicle. ADC can convert these analog data into digital signals and provide them to the processor of the vehicle controller. The processor of the vehicle controller can analyze the digital signal provided by the ADC and then control the car to perform the corresponding operation. However, in the actual application environment, the power supply voltage, reference voltage source, ground, etc. of the ADC will generate corresponding noise, which will affect the output result of the ADC; process deviations and changes in the external environment (such as temperature changes) will affect the output result of the ADC. This will affect the analysis and judgment of the vehicle sensor, resulting in the inability to accurately control the operations performed by the car. The present application does not limit the type of vehicle controller, such as: domain control unit (DCU), electronic control unit (ECU), vehicle central computer (VCC), zone controller (zonal / zone ECU, or, zonecontrol unit, ZCU), micro control unit (MCU), or vehicle control unit (VCU), etc.

[0024] In one implementation, the output signal of the ADC can be calibrated to improve the accuracy of the ADC output result. For example, the ADC can be calibrated with a built-in self-calibration circuit. However, due to the influence of temperature, process, etc. on circuit components and the influence of the components themselves (such as offset, etc.), this calibration method brings large deviations and is difficult to calibrate within a reasonable range. In addition, the self-calibration inside the ADC may add additional auxiliary circuits, increasing the complexity and power consumption of the design. If the auxiliary circuit is not designed properly, it may affect the output result of the ADC in the actual application environment. Further, the ADC self-calibration is limited by the accuracy of the ADC reference voltage source, that is, there is an error between the reference voltage source and the ideal voltage difference, and the self-calibration circuit cannot calibrate this error. For example, the reference voltage source of the ADC can be calibrated. However, the adjustment accuracy of the reference voltage source is limited, so that there is always an error between it and the ideal voltage source, resulting in a deviation in the ADC output result. In addition, under different temperatures and input voltages, the reference voltage source will also be different, which will cause the ADC output result to also have a corresponding deviation, reducing the accuracy of the ADC output result. For example, the output of the ADC can be calibrated by software calibration of the offset error and gain error of the ADC. This method requires calculating the offset error and gain error separately. Once one of the values ​​is inaccurate, it will affect the final output result. In addition, this method is also limited by the accuracy of the ADC reference voltage source.

[0025] Based on the defects of the above-mentioned calibration method, the embodiments of the present application provide a calibration method, device and other solutions, which can accurately calibrate the output signal of the ADC and improve the accuracy of the product to which the ADC is applied. The solution of the present application can be calibrated within a specific input range and temperature range, which can reduce the impact of temperature and input voltage changes on the reference voltage source or device, and is conducive to improving the calibration accuracy. Furthermore, the solution of the present application is simple to operate and easier to implement, which can optimize the calibration process and improve the calibration efficiency.

[0026] The following is a description with reference to the accompanying drawings.

[0027] Please refer to Figure 1 , which is a flow chart of a calibration method provided in some embodiments of the present disclosure. Figure 1 As shown, the calibration method is applied to ADC, and the calibration method at least includes the following steps: S110: Acquire a first output signal of the analog-to-digital converter; the first output signal includes an output signal of the analog-to-digital converter under a first input voltage; S120: Acquire a first operating temperature of the analog-to-digital converter; S130: determining target calibration data within a preset voltage range according to the first operating temperature; the preset voltage range includes the first input voltage; S140: determining a target calibration coefficient according to the first output signal and the target calibration data; S150: Calibrate the first output signal according to the target calibration coefficient.

[0028] The above calibration method can match the corresponding target calibration data according to different operating temperatures within the specific input range of the ADC, so that the target calibration coefficient at the current operating temperature can be directly determined, and the deviation of the ADC output signal can be calibrated through the target calibration coefficient. Even if the current operating temperature or input voltage of the ADC changes, it can be accurately calibrated. In this way, calibration is performed under a specific input range and temperature range, which can reduce the impact of temperature and input voltage changes on the reference voltage source or device, improve the accuracy of calibration, and improve the accuracy of the product used by the analog-to-digital converter. Furthermore, the solution of the present application, based on the target calibration data, can achieve calibration only through the current actual output (first output signal) and current operating temperature (first operating temperature) of the ADC, without performing additional and complex calibration operations. The process is simple and easier to implement, which can optimize the calibration process and improve the calibration efficiency.

[0029] The above steps are explained below. The output signal of the ADC can be considered as the ratio of its input signal (i.e., input voltage) to the reference voltage (which can be generated by a reference voltage source). That is, when the operating temperature remains unchanged, a corresponding output signal will be generated under different input voltages, and there is a corresponding relationship between the output signal and the input voltage. For example, the above first output signal can correspond to the first input voltage. In addition, when the ADC is working, as the working time increases or the external environment changes, the working temperature of the ADC will also change. The above first working temperature includes the current working temperature of the ADC during calibration.

[0030] The calibration data can be determined through multiple tests at the factory before the ADC leaves the factory. The preset voltage range corresponds to the target calibration data set, that is, there are different target calibration data sets under different voltage ranges. The target calibration data set includes multiple calibration data, and the calibration data is related to the operating temperature of the ADC. During the calibration process, when the input voltage corresponding to the ADC output signal is determined, it can be matched to the target calibration data set under the preset voltage range according to the preset voltage range corresponding to the input voltage. Based on the current operating temperature (first operating temperature) of the ADC, the target calibration data can be indexed and determined from the multiple calibration data of the target calibration data set.

[0031] According to the first output signal and the target calibration data, the target calibration coefficient can be determined. Furthermore, according to the target calibration coefficient, the first output signal can be calibrated. The first output signal is the actual output signal of the ADC, which is the output result under the influence of factors such as the current ADC reference voltage, noise, process or operating temperature. Obviously, the target calibration coefficient determined based on the first output signal and the target calibration data can eliminate the deviation caused by these influencing factors without additional calibration. The calibration process is simple and easy to implement, which is conducive to optimizing the calibration process and improving the calibration efficiency.

[0032] The present application does not limit the value of the preset voltage range. For example, the preset voltage range includes the input voltage range of the ADC, that is, the lower limit voltage of the preset voltage range includes the lower limit input voltage of the ADC (that is, the lowest voltage allowed to be input, such as 0V), and the upper limit voltage of the preset voltage range includes the upper limit input voltage of the ADC (that is, the highest voltage allowed to be input, such as 5V). For example, the preset voltage range may also include any voltage range within the ADC input voltage range, that is, the preset voltage range may also be smaller than the ADC input voltage range, such as 2-4V, etc.

[0033] The following is an explanation of the process of determining the target calibration data based on the first operating temperature and index. Figure 2 , which is a flow chart of another calibration process provided in some embodiments of the present application. Figure 2 As shown, the calibration method includes at least the following steps: S110: Acquire a first output signal of the analog-to-digital converter; the first output signal includes an output signal of the analog-to-digital converter under a first input voltage; S120: Acquire a first operating temperature of the analog-to-digital converter; S210: Determine whether the first operating temperature matches the preset operating temperature, if so, execute step S220; otherwise, execute step S230; S220: When the first operating temperature matches the preset operating temperature, determining target calibration data according to the first operating temperature index; S230: When the first operating temperature does not match the preset operating temperature, determining a first temperature range according to the first operating temperature; S240: Determine target calibration data by index according to the first temperature range; S140: determining a target calibration coefficient according to the first output signal and the target calibration data; S150: Calibrate the first output signal according to the target calibration coefficient.

[0034] Below Figure 2 Two cases of the first operating temperature are described below.

[0035] In the first case, the first operating temperature matches the preset operating temperature.

[0036] There is a mapping relationship between the preset operating temperature and the calibration data, and different preset operating temperatures correspond to different calibration data. When the first operating temperature is equal to the preset operating temperature, the target calibration data at the operating temperature can be directly indexed and determined. By way of example, the preset operating temperature may also include any one or more operating temperatures within the allowable operating temperature range of the ADC. For example, the preset operating temperature may include one or more of normal temperature 25°C, low temperature -40°C, and high temperature 125°C. Taking normal temperature as an example, assuming that the normal temperature is 25°C, when the first operating temperature is equal to 25°C, the target calibration data includes the calibration data corresponding to 25°C, and the calibration data at 25°C can be directly indexed and determined according to the first operating temperature.

[0037] In one implementation, the target calibration data includes a first mapping relationship between an output signal of an ADC at a preset operating temperature and an initial calibration coefficient. The output signals of the multiple ADCs correspond to multiple input voltages at the operating temperature. The initial calibration coefficient is used to indicate the deviation between the output signal of the ADC and the theoretical output signal. For example, the initial calibration coefficient can be determined by a proportional relationship or a loss function such as a mean squared error (MSE). For example, the initial calibration coefficient Ri can be the ratio of the output signal of the ADC to the theoretical output signal:

[0038] Among them, ADC_output_i represents the output signal of ADC, represents the input voltage corresponding to ADC_output_i, represents the reference voltage of ADC, n represents the resolution of ADC (for example, n=12), and i is a positive integer.

[0039] For example, the first mapping relationship may include a calibration function. The target calibration data may be determined based on the second output signal, the third output signal, the first calibration coefficient, and the second calibration coefficient at a preset operating temperature. The second output signal includes the ADC at the second input voltage The third output signal includes the ADC at the third input voltage The first calibration coefficient R1 and the second calibration coefficient R2 are both initial calibration coefficients. The first calibration coefficient R1 is used to indicate the deviation between the second output signal ADC_output_1 and the fourth output signal code_1. The fourth output signal code_1 includes the ADC at the second input voltage The second calibration coefficient R2 is used to indicate the deviation between the third output signal ADC_output_2 and the fifth output signal code_2. The fifth output signal code_2 includes the ADC at the third input voltage The ideal output signal.

[0040] Take the first mapping relationship as the calibration function and the preset working temperature as the normal temperature of 25°C as an example. According to the above formulas (1) and (2), it can be determined that under the condition of normal temperature of 25°C, the ADC input voltage is the second input voltage , the third input voltage Initial calibration coefficients R1, R2 under: ; ; The ADC input voltage is the second input voltage , the third input voltage When , the corresponding output result of ADC is the second output signal ADC_output_1 and the third output signal ADC_output_2. In this way, two sets of data (ADC_output_1, R1) and (ADC_output_2, R2) can be obtained. Based on these two sets of data, the first mapping relationship can be determined. For example, the first calibration function can be determined by the following formula using linear interpolation method: : ; in, Represents the first output signal. Substituting the above formula, the target calibration coefficient K can be determined (i.e. R'=K). According to the target calibration coefficient K, the first output signal To perform a calibration: ; in, Similarly, when the preset working temperature is other temperatures, the description of the above related embodiments of calibration under the normal temperature of 25°C can be referred to.

[0041] For example, the first mapping relationship may also include a calibration curve. The target calibration data may be determined based on multiple output signals at a preset operating temperature, and initial calibration coefficients corresponding to each of the multiple output signals. The multiple output signals are output signals corresponding to different input voltages at a preset operating temperature. The method for determining the initial calibration coefficient may refer to the contents of the above-mentioned embodiment. In this way, multiple groups of data (ADC_output_m, Rm) may be obtained, where m represents the number of multiple output signals. With ADC_output_m as the horizontal coordinate and Rm as the vertical coordinate, a first calibration curve may be determined by fitting multiple groups of data. Based on the first calibration curve, when the horizontal coordinate is the first output signal , the corresponding ordinate, i.e., the target calibration coefficient, can be determined.

[0042] In the second case, the first operating temperature does not match the preset operating temperature.

[0043] There is a mapping relationship between the first temperature range and the calibration data, and different first temperature ranges may correspond to different calibration data. When the first operating temperature does not meet any preset operating temperature (for example, it does not meet any of the low temperature of -40°C, the normal temperature of 25°C, and the high temperature of 125°C), the target calibration data in the temperature range can be determined according to the temperature range index in which the first operating temperature is located. The present application does not limit the first temperature range, and the preset operating temperature may also include any one or more temperature intervals within the allowable operating temperature range of the ADC. For example, the first temperature range includes -40°C to 25°C, or may also include 25°C to 125°C. Taking 25°C to 125°C as an example, assuming that the first operating temperature is 30°C, which is within the temperature range of 25°C to 125°C, the target calibration data in the temperature range can be directly indexed.

[0044] In one implementation, the target calibration data includes a second mapping relationship between the operating temperature and the temperature calibration data. For example, the second mapping relationship may include a calibration function. In this case, the target calibration data may be determined based on the second operating temperature, the third operating temperature, the first calibration data, and the second calibration data. The second operating temperature T1 includes the lower limit temperature of the first temperature range. The third operating temperature T2 includes the upper limit temperature of the first temperature range. The first calibration data r1 includes the temperature calibration data corresponding to the second operating temperature T1. The second calibration data r2 includes the temperature calibration data corresponding to the third operating temperature T2. The first calibration data r1 can be indexed and determined by the second operating temperature T1, and the second calibration data r2 can be indexed and determined by the third operating temperature T2. In this way, two sets of data (T1, r1) and (T2, r2) can be obtained. The second mapping relationship can be determined based on these two sets of data. For example, the second calibration function can be determined by the following formula using linear interpolation : ; Wherein, T0 represents the first operating temperature. Substituting T0 into the above formula, the target calibration coefficient k (i.e., r'=k) can be determined. According to the target calibration coefficient k, the first output signal can be calibrated: ; Similarly, when the first operating range is other temperature ranges, reference may be made to the description of the above related embodiments of calibration performed under the condition of 25° C. to 125° C.

[0045] For example, the second mapping relationship may also include a calibration curve. For example, with the operating temperature Tp as the horizontal coordinate and the temperature calibration data rp as the vertical coordinate (p represents the number of multiple operating temperatures), the second calibration curve may be determined by fitting multiple sets of data (Tp, rp). Based on the second calibration curve, when the horizontal coordinate is the first operating temperature T0, the corresponding vertical coordinate, i.e., the target calibration coefficient, may be determined.

[0046] In one implementation, the first calibration data may be determined based on the second output signal, the third output signal, the first calibration coefficient, and the second calibration coefficient at the second operating temperature T1. The second calibration data may be determined based on the second output signal, the third output signal, the first calibration coefficient, and the second calibration coefficient at the third operating temperature T3. For example, r1 above may be R' at the second operating temperature, r2 may be R' at the third operating temperature, and the determination process of R' may refer to the contents of the aforementioned embodiments.

[0047] The second output signal includes an output signal of the ADC at a second input voltage. The third output signal includes an output signal of the ADC at a third input voltage. The first calibration coefficient is used to indicate the deviation between the second output signal and the fourth output signal. The fourth output signal includes an ideal output signal of the ADC at the second input voltage. The second calibration coefficient is used to indicate the deviation between the third output signal and the fifth output signal. The fifth output signal includes an ideal output signal of the ADC at the third input voltage. The second output signal includes an output signal of the ADC at the second input voltage. The third output signal includes an output signal of the ADC at the third input voltage. The first calibration coefficient is used to indicate the deviation between the second output signal and the fourth output signal. The fourth output signal includes an ideal output signal of the ADC at the second input voltage. The second calibration coefficient is used to indicate the deviation between the third output signal and the fifth output signal. The fifth output signal includes an ideal output signal of the ADC at the third input voltage.

[0048] The description of the second output signal, the third output signal, the first calibration coefficient, the second calibration coefficient, the fourth output signal and the fifth output signal can refer to the contents of the aforementioned embodiment. The second operating temperature is similar to the first operating temperature, and the description of the first operating temperature can refer to the description of the related contents.

[0049] Based on the same technical concept, the present application also provides a calibration device for ADC. Figure 3 , which is a schematic diagram of the structure of a calibration device provided in an embodiment of the present application. Figure 3 As shown, the calibration device 300 includes a first interface circuit 310, a second interface circuit 320 and a processing circuit 330. The first interface circuit 310 is configured to receive a first output signal of the ADC. The second interface circuit 320 is configured to receive a first operating temperature of the ADC. The processing circuit 330, coupled to the first interface circuit 310 and the second interface circuit 320, is configured to execute the calibration method in any of the above embodiments. For the first output signal, the first operating temperature, the calibration method, etc., please refer to the description of the aforementioned embodiments, which will not be repeated here.

[0050] The above calibration device can be set in a calibration system, which includes, for example, a terminal (such as a personal computer or a server) or an integrated circuit (such as an MCU chip or an ADC chip). Please refer to Figure 4 , which is a schematic diagram of the structure of a calibration system provided in some embodiments of the present application. Figure 4 As shown, the calibration system 400 includes a storage unit 410 and a calibration device 420. The storage unit 410 is configured to store target calibration data, and the content of the target calibration data can refer to the description of the aforementioned embodiment. The calibration device 420 is coupled to the storage unit 410, and can calibrate the first output signal of the ADC based on the target calibration data. That is, the calibration device 420 can execute the calibration method in any of the above embodiments to improve the accuracy of the ADC output signal. The target calibration data can be pre-stored in the storage unit, and the target calibration data in the storage unit can be directly used for calibration during calibration, which can improve the calibration efficiency.

[0051] The present application also provides a computer program product, comprising instructions, wherein when the instructions are executed by a processor, the calibration method in any of the above embodiments is executed.

[0052] In the above embodiments, the description of each embodiment has its own emphasis. For parts that are not described or recorded in detail in a certain embodiment, reference can be made to the relevant descriptions of other embodiments. In addition, the above embodiments can be freely combined as needed.

Claims

1. A calibration method, characterized in that: Applied to an analog-to-digital converter, the calibration method comprises: Acquire a first output signal of the analog-to-digital converter; the first output signal comprises an output signal of the analog-to-digital converter under a first input voltage; Acquiring a first operating temperature of the analog-to-digital converter; Determining target calibration data within a preset voltage range according to the first operating temperature; the preset voltage range includes the first input voltage; determining a target calibration coefficient according to the first output signal and the target calibration data; The first output signal is calibrated according to the target calibration coefficient.

2. The calibration method according to claim 1, characterized in that: The target calibration data includes calibration data corresponding to a preset operating temperature; and determining the target calibration data according to the first operating temperature includes: When the first operating temperature matches the preset operating temperature, the target calibration data is determined according to the first operating temperature index.

3. The calibration method according to claim 2, characterized in that: The target calibration data is determined based on the second output signal, the third output signal, the first calibration coefficient and the second calibration coefficient at the preset operating temperature; The second output signal includes an output signal of the analog-to-digital converter at a second input voltage, and the third output signal includes an output signal of the analog-to-digital converter at a third input voltage; the preset voltage range includes the second input voltage and the third input voltage, and the second input voltage is less than the third input voltage; The first calibration coefficient is used to indicate a deviation between the second output signal and the fourth output signal; The fourth output signal comprises an ideal output signal of the analog-to-digital converter at the second input voltage; The second calibration coefficient is used to indicate the deviation between the third output signal and the fifth output signal; the fifth output signal includes an ideal output signal of the analog-to-digital converter under the third input voltage.

4. The calibration method according to claim 3, characterized in that: The second input voltage comprises a lower limit input voltage of the analog-to-digital converter; and the third input voltage comprises an upper limit input voltage of the analog-to-digital converter.

5. The calibration method according to claim 3, characterized in that: The step of determining target calibration data according to the first operating temperature includes: When the first operating temperature does not match the preset operating temperature, determining a first temperature range according to the first operating temperature; The target calibration data is determined by indexing according to the first temperature range.

6. The calibration method according to claim 5, characterized in that: The target calibration data is determined based on the second operating temperature, the third operating temperature, the first calibration data, and the second calibration data, The second operating temperature includes a lower limit temperature of the first temperature range, and the third operating temperature includes an upper limit temperature of the first temperature range; The first calibration data includes calibration data corresponding to the second operating temperature; The second calibration data includes calibration data corresponding to the third operating temperature.

7. The calibration method according to claim 6, characterized in that: The first calibration data is determined based on the second output signal, the third output signal, the first calibration coefficient and the second calibration coefficient at the second operating temperature; The second calibration data is determined based on the second output signal, the third output signal, the first calibration coefficient, and the second calibration coefficient at the third operating temperature; The second output signal includes an output signal of the analog-to-digital converter at the second input voltage, and the third output signal includes an output signal of the analog-to-digital converter at the third input voltage; The first calibration coefficient is used to indicate the deviation between the second output signal and a fourth output signal; the fourth output signal includes an ideal output signal of the analog-to-digital converter under the second input voltage; The second calibration coefficient is used to indicate the deviation between the third output signal and the fifth output signal; the fifth output signal includes an ideal output signal of the analog-to-digital converter under the third input voltage.

8. A calibration device, characterized in that: Applied to an analog-to-digital converter, the calibration device comprises: A first interface circuit is configured to receive a first output signal of the analog-to-digital converter; a second interface circuit configured to receive a first operating temperature of the analog-to-digital converter; A processing circuit is coupled to the first interface circuit and the second interface circuit, and is configured to execute the calibration method according to any one of claims 1 to 7.

9. A calibration system, characterized in that: Applied to an analog-to-digital converter, the calibration system comprises: a storage unit configured to store target calibration data; The calibration device according to claim 8, coupled to the storage unit, is configured to calibrate the first output signal of the analog-to-digital converter.

10. A computer program product, characterized in that The method comprises instructions, wherein when the instructions are executed by a processor, the calibration method according to any one of claims 1 to 7 is executed.

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