Intelligent storage device for sampling probe

Abstract

An intelligent storage device for sampling probes comprises a box body, a storage rack, a discharging assembly and a feeding assembly, the storage rack is fixed in the box body and enables the sampling probes to be stacked and stored, the sampling probes are stacked into at least three layers, and the discharging assembly comprises an overturning driving part, an overturning shaft, a bearing plate and a pushing connecting rod; the turnover shaft is located under the storage rack, the two ends of the turnover shaft are rotationally connected with the box body, the turnover driving part is fixed to one side of the box body and connected with the turnover shaft, the bearing plate comprises a first bearing section, a second bearing section and a connecting section, the connecting section is fixed to the turnover shaft, and the first bearing section and the second bearing section are fixed to the connecting section; the material pushing connecting rod is arranged on the second bearing section, the first bearing section bears the first layer of probes, the bearing plate rotates to drive the first layer of probes to fall onto the feeding assembly from the bottom of the storage rack, meanwhile, the second bearing section bears the second layer of probes to ascend, and the material pushing connecting rod pushes the third layer of probes to ascend.

Description

Technical Field

[0001] The invention relates to the field of sampling probe storage boxes, and in particular to an intelligent storage device for sampling probes. Background Art

[0002] In the steel smelting industry, sampling probes are required for molten steel sampling and sampling testing. The existing sampling operations are highly dependent on manual operation. Workers need to manually hold the sampling rod to insert the sampling probe into the ladle to obtain molten steel samples. The high temperature and high-risk characteristics of the working environment pose a great threat to the personal safety of workers. With the rise of the Industrial 4.0 era, manual sampling operations have begun to be replaced by robots. By installing the sampling rod on the robot's mechanical arm, the robot can perform molten steel sampling operations. However, as a disposable consumable, the sampling probe needs to be replaced in time after completing a single sampling operation. The operation of replacing the sampling probe still relies on manual operation. The operation of manually replacing the sampling probe is too cumbersome and affects efficiency. In view of this, the present invention is proposed. Summary of the invention

[0003] In order to solve the problem of complicated operation and low efficiency in manually replacing a sampling probe, the present invention provides an intelligent material storage device for the sampling probe.

[0004] In order to solve the above technical problems, the present invention provides an intelligent material storage device for sampling probes, comprising: the intelligent material storage device comprises a box body, a storage rack, a material unloading assembly and a material feeding assembly, the bottom of the box body is provided with an inclined material guide plate, the material feeding assembly is located at the bottom of the material guide plate, the storage rack is fixed in the box body and allows the sampling probes to be stacked and stored, the sampling probes are stacked in at least three layers, and from bottom to top, they are respectively a first layer of probes, a second bottom layer of probes and a third layer of probes;

[0005] The unloading assembly includes a flipping drive member, a flipping shaft, a supporting plate and a pushing connecting rod. The flipping shaft is located directly below the storage rack and has two ends rotatably connected to the box body. The flipping drive member is fixed to one side of the box body and connected to the flipping shaft. The supporting plate includes a first supporting section, a second supporting section and a connecting section. The connecting section is fixed on the flipping shaft. The first supporting section and the second supporting section are fixed on the connecting section. The pushing connecting rod is arranged on the second supporting section. The first supporting section supports the first layer of probes. When the supporting plate rotates, it drives the first layer of probes to rotate out from the bottom of the storage rack and pass through the guide plate to fall onto the feeding assembly. At the same time, the second supporting section supports the second layer of probes to rise, and the pushing connecting rod pushes the third layer of probes to rise.

[0006] In an embodiment of the present invention, the first supporting section is arc-shaped with an arc-shaped opening facing upward, the second supporting section is arc-shaped with an arc-shaped opening facing downward, the first supporting section is directly opposite to the bottom of the storage rack to support the first layer of probes, and after the supporting plate rotates, it drives the second supporting section to rotate to the bottom of the storage rack and support the second layer of probes, and at the same time, the first supporting section drives the first layer of probes to rotate out of the storage rack.

[0007] In an embodiment of the present invention, the pushing connecting rod includes a first hinged rod, a second hinged rod and an arc-shaped support plate. The first hinged rod is fixed on the second supporting section. The two ends of the second hinged rod are respectively hingedly connected to the first hinged rod and the arc-shaped support plate. The rotation of the support plate can drive the arc-shaped support plate to support the third layer of probe to rise.

[0008] In an embodiment of the present invention, a first limiting groove and a second limiting groove are provided at one end of the second hinged rod close to the arc-shaped support plate, and when the arc-shaped support plate supports the third layer of probes, it drives the arc-shaped support plate to rotate from the first limiting groove to the second limiting groove.

[0009] In an embodiment of the present invention, when the supporting plate rotates and causes the second supporting section to support the second layer of probes, the side surface of the first hinged rod abuts against the second layer of probes and restricts the rotation of the supporting plate.

[0010] In an embodiment of the present invention, the intelligent material storage device also includes an alarm. A first proximity switch electrically connected to the alarm is provided on the box body on one side of the storage rack. The first proximity switch is used to detect whether there is a sampling probe at the position of the storage rack corresponding to the third layer probe. When the first proximity switch fails to detect the sampling probe, the alarm is triggered to sound an alarm.

[0011] In an embodiment of the present invention, the intelligent material storage device also includes an alarm, a contact is arranged in the second limit groove, the alarm is connected in series to the circuit of the flip drive component, and the circuit of the contact is connected in parallel to the alarm, and when the arc-shaped support plate rotates to the second limit groove, the contact is triggered to conduct and the alarm is short-circuited.

[0012] In an embodiment of the present invention, the feeding assembly includes a material receiving plate, a feeding plate and a feeding driving member, the material receiving plate is fixed to one side of the material guide plate, and a supporting groove for supporting the sampling probe is provided on the material receiving plate, and the feeding driving member is fixed to one side of the material receiving plate and connected to the feeding plate to drive the feeding plate to push the sampling probe to move laterally;

[0013] The feeding assembly also includes a second proximity switch, which is installed on the side of the supporting plate to detect whether a sampling probe exists in the supporting groove.

[0014] In an embodiment of the present invention, the feeding assembly includes a first flip pressure piece, a second flip pressure piece and a clamping drive piece, the clamping drive piece is located on the side of the material receiving plate away from the feeding drive piece, and the two fingers of the clamping drive piece are respectively connected to the first flip pressure piece and the second flip pressure piece to drive the first flip pressure piece and the second flip pressure piece to be jointly mounted on the sampling probe.

[0015] In an embodiment of the present invention, at least two storage racks are arranged side by side in the box body to store different types of sampling probes, and the number of the unloading components is adapted to the storage racks.

[0016] Compared with the prior art, the present invention has the following beneficial effects:

[0017] The offline calibration device and method provided by the embodiments of the present invention include at least the following technical effects:

[0018] The sampling probes are stored in a stacked manner through the storage rack, and the supporting plate is arranged at the bottom of the storage rack, so that when the flip driving member drives the supporting plate to rotate, the first supporting section rotates the first layer of probes out of the storage rack, and the rotated sampling probes fall to the feeding assembly through the inclined material guide plate, so that the robot can grab the sampling probes from the feeding assembly, and under the action of the feeding assembly, the positioning time of the robot when grabbing the sampling probes is saved, thereby improving the replacement efficiency of the sampling probes. Since the sampling probes in the storage rack are stacked, in order to ensure that only one sampling probe is taken out of the storage rack each time the supporting plate rotates, the second supporting section is driven to rotate synchronously when the supporting plate rotates, and the second layer of probes is supported and lifted under the action of the second supporting section to prevent the second layer of probes from falling from the bottom of the storage rack. In order to reduce the friction between the second supporting section and the second layer of probes, the pushing connecting rod is driven to support and lift the third layer of probes when the supporting plate rotates, thereby reducing the gravity of the second layer of probes on the second supporting section, so as to reduce the difficulty of rotating the supporting plate.

[0019] Other features and advantages of the embodiments of the present invention will be described in the following specific implementation examples. BRIEF DESCRIPTION OF THE DRAWINGS

[0020] In order to more clearly illustrate the specific implementation methods of the present application or the technical solutions in the prior art, the drawings required for use in the specific implementation methods or the description of the prior art will be briefly introduced below. Obviously, the drawings described below are some implementation methods of the present application. For those skilled in the art, other drawings can be obtained based on these drawings without paying any creative work.

[0021] Figure 1 A schematic diagram of the three-dimensional structure of the intelligent storage device provided in an embodiment of the present application;

[0022] Figure 2 A schematic diagram of the three-dimensional structure of the intelligent material storage device provided in an embodiment of the present application after the box body is removed;

[0023] Figure 3 A schematic diagram of a partial three-dimensional structure of a first state of an intelligent storage device provided in an embodiment of the present application;

[0024] Figure 4 A schematic diagram of a partial three-dimensional structure of the second state of the intelligent storage device provided in an embodiment of the present application;

[0025] Figure 5 for Figure 3 The enlarged view of point C in the figure;

[0026] Figure 6 for Figure 4 The enlarged view of point D in the figure;

[0027] Figure 7 A schematic diagram of the three-dimensional structure of a material unloading component in the intelligent material storage device provided in an embodiment of the present application;

[0028] Figure 8 for Figure 1 A in the enlarged view;

[0029] Fig. 9 for Figure 1 Enlarged view of point B in .

[0030] The reference numerals are described as follows:

[0031] 1. Intelligent material storage device; 2. Sampling probe; 11. Box; 12. Storage rack; 13. Unloading assembly; 14. Feeding assembly; 21. First layer probe; 22. Second layer probe; 23. Third layer probe;

[0032] 111. Guide plate;

[0033] 121, material receiving plate; 122, material feeding plate; 123, material feeding driving member; 124, supporting groove; 125, first turning pressing member; 126, second turning pressing member; 127, clamping driving member;

[0034] 131. Flip driving member; 132. Flip axis; 133. Support plate; 134. Push rod; 1331. First supporting section; 1332. Second supporting section; 1333. Connecting section; 1334. Bearing; 1341. First hinged rod; 1342. Second hinged rod; 1343. Arc-shaped support plate; 1344. First limiting groove; 1345. Second limiting groove. DETAILED DESCRIPTION

[0035] The terms "second direction", "first direction", "third direction", "inside", "outside" and the like that appear below to indicate orientation or positional relationships, unless otherwise specified, are to be understood as being based on the orientation or positional relationships shown in the accompanying drawings and are only for the convenience of describing the present application and simplifying the description, and do not indicate or imply that the device or element referred to must have a specific orientation, be constructed and operated in a specific orientation, and therefore should not be understood as a limitation on the present application.

[0036] In addition, if there is a feature defined as "first" or "second", it is only used for descriptive purposes and cannot be understood as indicating or implying relative importance or implicitly indicating the number of the indicated technical features. Features defined as "first" or "second" may explicitly or implicitly include at least one of the defined features. If the description of "plurality" appears, the general meaning is to include at least two, such as two, three, etc., unless otherwise clearly and specifically defined.

[0037] In this application, unless otherwise clearly specified and limited, the terms such as "installed", "connected", "connected", "fixed" and so on should be understood in a broad sense. For example, it can be a fixed connection, a detachable connection, or an integrated connection; it can be a mechanical connection or an electrical connection, it can be a direct connection, or it can be an indirect connection through an intermediate medium, it can be the internal connection of two elements or the interaction relationship between two elements. For those skilled in the art, the specific meanings of the above terms in this application can be understood according to the specific circumstances.

[0038] In the description of this specification, if the terms "one embodiment", "some embodiments", "example", "specific example", or "some examples" appear, it means that the specific features, structures, materials or characteristics described in conjunction with the embodiment or example are included in at least one embodiment or example of the present application. In this specification, the schematic representations of the above terms do not necessarily refer to the same embodiment or example. Moreover, the specific features, structures, materials or characteristics described may be combined in any one or more embodiments or examples in a suitable manner. In addition, those skilled in the art may combine and combine the different embodiments or examples described in this specification and the features of the different embodiments or examples, unless they are contradictory.

[0039] See also Figure 1-Figure 4 In order to solve the problems in the prior art, the present invention provides an intelligent storage device 1 for sampling probes 2, including: the intelligent storage device 1 includes a box body 11, a storage rack 12, a material unloading assembly 13 and a material feeding assembly 14, the bottom of the box body 11 is provided with an inclined material guide plate 111, the material feeding assembly 14 is located at the bottom of the material guide plate 111, the storage rack 12 is fixed in the box body 11 and allows the sampling probes 2 to be stacked and stored, and the sampling probes 2 are stacked in at least three layers, and from bottom to top, they are the first layer of probes 21, the second bottom layer of probes and the third layer of probes 23;

[0040] The unloading assembly 13 includes a flip driving member 131, a flip shaft 132, a supporting plate 133 and a pushing connecting rod 134. The flip shaft 132 is located directly below the storage rack 12 and is rotatably connected to the box body 11 at both ends. The flip driving member 131 is fixed to one side of the box body 11 and connected to the flip shaft 132. The supporting plate 133 includes a first supporting section 1331, a second supporting section 1332 and a connecting section 1333. The connecting section 1333 is fixed to the flip shaft 132. The first supporting section 1331 and the second supporting section 1332 are fixed on the connecting section 1333, and the pushing connecting rod 134 is arranged on the second supporting section 1332. The first supporting section 1331 supports the first layer of probes 21. When the supporting plate 133 rotates, it drives the first layer of probes 21 to rotate out from the bottom of the storage rack 12 and pass through the guide plate 111 to fall onto the feeding assembly 14. At the same time, the second supporting section 1332 supports the second layer of probes 22 to rise, and the pushing connecting rod 134 pushes the third layer of probes 23 to rise.

[0041] By placing multiple sampling probes 2 into the storage rack 12, so that the multiple sampling probes 2 are stacked and stored on the storage rack 12, the supporting plate 133 is set at the bottom of the storage rack 12, so that the first layer of probes 21 in the storage rack 12 fall onto the first supporting section 1331, and then when the robot needs to replace the sampling probe 2, the flip drive member 131 drives the flip shaft 132 to rotate, so that the flip shaft 132 drives the supporting plate 133 to rotate synchronously, at this time, the first supporting section 1331 drives the first layer of probes 21 to rotate from the storage rack 12 The first layer of probes 21 that are rotated out fall onto the guide plate 111 under the action of gravity. Since the guide plate 111 is inclined and the feeding assembly 14 is located at the bottom of the guide plate 111, the first layer of probes 21 that fall onto the guide plate 111 roll along the inclined guide plate 111 to the feeding assembly 14, which makes it easy for the robot to grab the sampling probe 2 from the feeding assembly 14. The feeding assembly 14 saves the positioning time of the robot when grabbing the sampling probe 2, thereby improving the replacement efficiency of the sampling probe 2.

[0042] While the supporting plate 133 rotates, the second supporting section 1332 rotates synchronously and moves to the bottom of the storage rack 12 to support the second layer of probes 22, so as to raise the height of the sampling probes 2 above the second layer of probes 22, thereby preventing the second layer of probes 22 from falling from the storage rack 12, ensuring that only one sampling probe 2 is taken out of the storage rack 12 with a single drive of the flipping drive 131, so that the robot can accurately grab the sampling probe 2 from the feeding assembly 14.

[0043] Since there is sliding friction between the second supporting section 1332 and the second layer of probes 22 when lifting the second layer of probes 22, the torque required for the second supporting section 1332 to lift the second layer of probes 22 is relatively large. When there are more than three sampling probes 2 on the second supporting section 1332, the gravity exerted on the second supporting section 1332 will increase, thereby increasing the friction between the second supporting section 1332 and the second layer of probes 2, and increasing the difficulty of rotating the supporting plate 133. Therefore, the pushing connecting rod 134 is arranged on the second supporting section 1332 so that the pushing connecting rod 134 pushes the third layer of probes 23 and the sampling probes 2 above to rise, thereby reducing the gravity of the second layer of probes 2 exerted on the second supporting section 1332, so as to reduce the difficulty of rotating the supporting plate 133.

[0044] After the first layer of probes 21 rotate out of the first supporting section 1331, the flipping drive member 131 drives in the reverse direction and drives the flipping shaft 132 to rotate in the reverse direction. At the same time, the supporting plate 133 rotates in the reverse direction. At this time, the pushing connecting rod 134 supports the third layer of probes 23 to descend and move away from the bottom of the third layer of probes 23. At the same time, the second supporting section 1332 supports the second layer of probes 22 to descend and move away from the bottom of the second layer of probes 22. At the same time, the first supporting end returns to its original position and allows the second layer of probes 22 to fall onto the first supporting section 1331, so that the flipping drive member 131 can perform the next flipping action. Such a cycle can enable the robot to realize fast and efficient sampling probe 2 replacement operations and improve work efficiency.

[0045] In an embodiment of the present invention, the first supporting section 1331 is arc-shaped with an arc-shaped opening facing upward, the second supporting section 1332 is arc-shaped with an arc-shaped opening facing downward, the first supporting section 1331 is directly opposite to the bottom of the storage rack 12 to support the first layer of probes 21, and after the supporting plate 133 rotates, it drives the second supporting section 1332 to rotate to the bottom of the storage rack 12 and support the second layer of probes 22, and at the same time, the first supporting section 1331 drives the first layer of probes 21 to rotate out of the storage rack 12.

[0046] The first supporting section 1331 is set to be an arc with the opening facing upward, so that when the supporting plate 133 is not rotated, the first supporting section 1331 is directly opposite to the bottom of the storage rack 12, and a stable supporting force is provided for the first layer of probes 21 to prevent the first layer of probes 21 from rolling or sliding on the first supporting section 1331, and after the supporting plate 133 is rotated, the first layer of probes 21 can automatically fall out of the first supporting section 1331, thereby realizing automatic dropping of the sampling probe 2, ensuring that only one sampling probe 2 is taken out of the storage rack 12 each time the supporting plate 133 rotates and the dropped feeding assembly 14, so that the robot can accurately grab the sampling probe 2 from the feeding assembly 14, thereby improving the replacement efficiency of the sampling probe 2.

[0047] The second supporting section 1332 is configured to be an arc with the opening facing downward, so that when the supporting plate 133 rotates and drives the second supporting section 1332 to move to the bottom of the storage rack 12, the second supporting section 1332 contacts and slides against the second layer of probes 22, so that the second layer of probes 22 fit on the arc of the second supporting section 1332 and are lifted, thereby preventing the second layer of probes 22 from falling out of the storage rack 12, resulting in two sampling probes 2 falling off when the supporting plate 133 is flipped once.

[0048] See also Figure 5-Figure 7 In an embodiment of the present invention, the push rod 134 includes a first hinged rod 1341, a second hinged rod 1342 and an arc-shaped support plate 1343. The first hinged rod 1341 is fixed on the second supporting section 1332. The two ends of the second hinged rod 1342 are respectively hingedly connected to the first hinged rod 1341 and the arc-shaped support plate 1343. The rotation of the support plate 133 can drive the arc-shaped support plate 1343 to support the third-layer probe 23 to rise.

[0049] The first hinged rod 1341 is fixed on the second supporting section 1332, and the second hinged rod 1342 is hinged between the first hinged rod 1341 and the arc-shaped supporting plate 1343, so that the first hinged connecting rod is driven to move synchronously when the supporting plate 133 rotates. When the arc-shaped supporting plate 1343 contacts the third-layer probe 23, the second hinged connecting rod is driven to rotate upward around the first hinged connecting rod. As the supporting plate 133 continues to rotate, the second hinged connecting rod continues to rotate upward and drives the arc-shaped supporting plate 1343 to support the third-layer probe 23 to be lifted. When the arc-shaped supporting plate 1343 supports the third-layer probe 23 to be lifted, the third-layer probe 23 The arc-shaped support plate 1343 is in a stationary state relative to the third-layer probe 23, thereby reducing the friction between the third-layer probe 23 and the arc-shaped support plate 1343. When the third-layer probe 23 is lifted by the arc-shaped support plate 1343, the gravity exerted by the second-layer probe 22 on the second supporting section 1332 is reduced, thereby reducing the friction between the second-layer probe 22 and the second supporting section 1332, so that the second supporting section 1332 can support the lifting height of the second-layer probe 22, and finally the first supporting section 1331 can take the first-layer probe 21 out of the storage rack 12, so that the robot can grab the sampling probe 2 at the feeding assembly 14, thereby improving the replacement efficiency of the sampling probe 2.

[0050] When the supporting plate 133 does not rotate, Figure 5 As shown in the state, the first layer of probes 21 falls on the first supporting section 1331, and the second layer of probes 22 and the third layer of probes 23 are stacked and stored on the first layer of probes 21. When the flip driving member 131 drives the supporting plate 133 to rotate, as shown in FIG. Figure 6 As shown, the first supporting section 1331 rotates out the first layer of probes 21 from the storage rack 12, and at the same time, the second supporting section 1332 rotates to the bottom of the storage rack 12 and supports the second layer of probes 22 to prevent the second layer of probes 22 from falling from the bottom of the storage rack 12, ensuring that only one sampling probe 2 is taken out each time the supporting plate 133 rotates. While the supporting plate 133 rotates, the arc-shaped supporting plate 1343 contacts the third layer of probes 23, and as the supporting plate 133 continues to rotate, the second hinge rod 1342 rotates around the first hinge rod 1341, and the arc-shaped supporting plate 1343 rotates around the second hinge rod 1342, so that the arc-shaped supporting plate 1343 supports the third layer of supporting plate to rise, so as to reduce the gravity exerted by the second layer of probes 22 on the second supporting section 1332, and facilitate the rotation of the supporting plate 133.

[0051] See also Figure 7In an embodiment of the present invention, a first limiting groove 1344 and a second limiting groove 1345 are provided at one end of the second hinged rod 1342 close to the arc-shaped support plate 1343. When the arc-shaped support plate 1343 supports the third layer of probe 23, it drives the arc-shaped support plate 1343 to rotate from the first limiting groove 1344 to the second limiting groove 1345, so that under the action of the second limiting groove 1345, the arc-shaped support plate 1343 can maintain stability when supporting the third layer of probe 23 to rise, thereby avoiding the arc-shaped support plate 1343 from rotating too much at an angle to affect the supporting effect of the third layer of probe 23, and at the same time, avoiding the arc-shaped support plate 1343 from rotating into the first limiting groove 1344 when supporting the third layer of probe 23, thereby improving the supporting stability of the arc-shaped support plate 1343 for the sampling probe 2.

[0052] In an embodiment of the present invention, a bearing 1334 is provided on the second supporting section 1332. When the supporting plate 133 rotates, the bearing 1334 is driven to contact the second layer probe 22, so that the sliding friction between the second layer probe 22 and the second supporting section 1332 is changed into rolling friction, thereby improving the rotation smoothness of the supporting plate 133.

[0053] See also Figure 6 In the embodiment of the present invention, when the supporting plate 133 rotates and the second supporting section 1332 supports the second layer probe 22, the side of the first hinge rod 1341 abuts against the second layer probe 22 and limits the rotation of the supporting plate 133, so as to prevent the supporting plate 133 from rotating excessively and causing the second supporting section 1332 to rotate away from the bottom of the storage rack 12, thereby causing the second layer probe 22 to fall from the bottom of the storage rack 12. At the same time, when the first hinge rod 1341 abuts against the second layer probe 22, the second hinge rod 1342 supports the third layer probe 23 at an inclined angle, so as to prevent the rotation angle of the second hinge rod 1342 from being too large and causing the supported third layer probe 23 to fall from the arc-shaped supporting plate 1343.

[0054] In an embodiment of the present invention, the intelligent material storage device 1 also includes an alarm. A first proximity switch electrically connected to the alarm is provided on the box body 11 on one side of the storage rack 12. The first proximity switch is used to detect whether there is a sampling probe 2 at the position of the storage rack 12 corresponding to the third layer probe 23. When the first proximity switch fails to detect the sampling probe 2, the alarm is triggered to sound an alarm, so that the operator can replenish the sampling probe 2 according to the alarm, avoid production interruption caused by probe shortage, and ensure the continuity and stability of production.

[0055] In an embodiment of the present invention, the intelligent storage device 1 also includes an alarm, a contact is arranged in the second limit groove 1345, the alarm is connected in series to the circuit of the flip drive member 131, and the circuit of the contact is connected in parallel to the alarm. When the arc-shaped support plate 1343 rotates to the second limit groove 1345, the contact is triggered to conduct and the alarm is short-circuited to ensure that the alarm will not sound only when the flip drive member 131 drives the support plate 133 to rotate and the arc-shaped support plate 1343 moves to the second limit groove 1345, that is, the arc-shaped support plate 1343 supports the third layer of probe 23. The alarm will sound, which means that there are enough sampling probes 2 in the storage rack 12. On the contrary, when the flip driving member 131 drives the supporting plate 133 to rotate and the arc-shaped supporting plate 1343 is still in the first limiting groove 1344, that is, the arc-shaped supporting plate 1343 does not support the sampling probe 2, the alarm will sound, avoiding alarm abnormalities caused by misoperation or equipment failure, ensuring the accuracy of equipment operation and alarm, so that operators can supplement the sampling probe 2 according to the alarm, avoiding production interruptions due to probe shortages, and ensuring the continuity and stability of production.

[0056] See also Figure 8 In an embodiment of the present invention, the feeding assembly 14 includes a receiving plate 121, a feeding plate 122 and a feeding driving member 123. The receiving plate 121 is fixed to one side of the material guide plate 111, and a supporting groove 124 for supporting the sampling probe 2 is opened on the receiving plate 121. The feeding driving member 123 is fixed to one side of the receiving plate 121 and connected to the feeding plate 122 to drive the feeding plate 122 to push the sampling probe 2 to move horizontally, so that after the sampling probe 2 falls onto the material guide plate 111, it slides along the material guide plate 111 into the supporting groove 124, and then the feeding driving member 123 drives the feeding plate 122 to move, so that the feeding plate 122 drives the sampling probe 2 to move horizontally in the supporting groove 124 from one side of the sampling probe 2, so that the sampling probe 2 moves horizontally, which is convenient for the robot to grasp and replace the moved sampling probe 2, thereby improving the accuracy and efficiency of replacing the sampling probe 2.

[0057] In an embodiment of the present invention, the feeding assembly 14 also includes a second proximity switch, which is installed on the side of the supporting plate 121 to detect whether there is a sampling probe 2 in the supporting groove 124. Under the action of the second proximity switch, it is detected whether there is a sampling probe 2 in the supporting groove 124, so that the operator can timely understand the feeding status according to the feedback of the second proximity switch to avoid the omission of the sampling probe 2.

[0058] See also Fig. 9In an embodiment of the present invention, the feeding assembly 14 includes a first flip pressure piece 125, a second flip pressure piece 126 and a clamping drive piece 127. The clamping drive piece 127 is located on the side of the supporting plate 121 away from the feeding drive piece 123, and the two fingers of the clamping drive piece 127 are respectively connected to the first flip pressure piece 125 and the second flip pressure piece 126 to drive the first flip pressure piece 125 and the second flip pressure piece 126 to be jointly mounted on the sampling probe 2.

[0059] The first flip pressure piece 125 and the second flip pressure piece 126 are driven to rotate respectively by the clamping driving piece 127, so that when the feeding driving piece 123 drives the feeding plate 122 to push the sampling probe 2 to move to the position between the first flip pressure piece 125 and the second flip pressure piece 126, the first flip pressure piece 125 and the second flip pressure piece 126 are driven to rotate by the clamping driving piece 127, so that the first flip pressure piece 125 and the second flip pressure piece 126 after selection are jointly mounted on the sampling probe 2, thereby achieving the positioning and fixing effect of the sampling probe 2, facilitating the robot to grab the sampling probe 2 from the first flip pressure piece 125 and the second flip pressure piece 126, and further improving the accuracy and efficiency of replacing the sampling probe 2.

[0060] In an embodiment of the present invention, at least two storage racks 12 are arranged side by side in the box body 11 to store different types of sampling probes 2. The number of unloading components 13 is adapted to the storage racks 12, so that different types of sampling probes 2 can be stored under the action of at least two storage racks 12. The number of unloading components 13 is adapted thereto, so that the operator can control the flipping drive member 131 in the corresponding unloading component 13 according to the working condition of the robot, and make the corresponding sampling probe 2 fall to the feeding component 14 for the robot to grab and replace, thereby improving the applicability and flexibility of the intelligent storage device 1, and reducing the cost and time required to replace equipment due to changes in production needs.

[0061] The various technical features described above can be combined arbitrarily. Although all possible combinations of these technical features are not described, any combination of these technical features should be considered to be covered by this specification as long as there is no contradiction in such combination.

[0062] Finally, it should be noted that the above embodiments are only used to illustrate the technical solutions of the present application, rather than to limit it. Although the present application has been described in detail with reference to the aforementioned embodiments, those skilled in the art should understand that they can still adjust the technical solutions described in the aforementioned embodiments, or replace some or all of the technical features therein with equivalents. However, these adjustments or replacements do not cause the essence of the corresponding technical solutions to deviate from the scope of the technical solutions of the embodiments of the present application.

Claims

1. An intelligent material storage device for a sampling probe, characterized in that: include: The intelligent material storage device comprises a box body, a storage rack, a material unloading assembly and a material feeding assembly. The bottom of the box body is provided with an inclined material guide plate, the material feeding assembly is located at the bottom of the material guide plate, the storage rack is fixed in the box body and the sampling probes are stacked and stored, and the sampling probes are stacked in at least three layers, and from bottom to top, they are the first layer probe, the second bottom layer probe and the third layer probe; The unloading assembly includes a flipping drive member, a flipping shaft, a supporting plate and a pushing connecting rod. The flipping shaft is located directly below the storage rack and has two ends rotatably connected to the box body. The flipping drive member is fixed to one side of the box body and connected to the flipping shaft. The supporting plate includes a first supporting section, a second supporting section and a connecting section. The connecting section is fixed on the flipping shaft. The first supporting section and the second supporting section are fixed on the connecting section. The pushing connecting rod is arranged on the second supporting section. The first supporting section supports the first layer of probes. When the supporting plate rotates, it drives the first layer of probes to rotate out from the bottom of the storage rack and pass through the guide plate to fall onto the feeding assembly. At the same time, the second supporting section supports the second layer of probes to rise, and the pushing connecting rod pushes the third layer of probes to rise.

2. The intelligent material storage device according to claim 1, characterized in that: The first supporting section is arc-shaped with an arc-shaped opening facing upward, the second supporting section is arc-shaped with an arc-shaped opening facing downward, the first supporting section is directly opposite to the bottom of the storage rack to support the first layer of probes, and after the supporting plate rotates, it drives the second supporting section to rotate to the bottom of the storage rack and support the second layer of probes, and at the same time, the first supporting section drives the first layer of probes to rotate out of the storage rack.

3. The intelligent material storage device according to claim 2, characterized in that: The pushing connecting rod includes a first hinged rod, a second hinged rod and an arc-shaped support plate. The first hinged rod is fixed on the second supporting section. The two ends of the second hinged rod are respectively hingedly connected to the first hinged rod and the arc-shaped support plate. The rotation of the support plate can drive the arc-shaped support plate to support the third layer of probe to rise.

4. The intelligent material storage device according to claim 3, characterized in that: The second hinged rod is provided with a first limiting groove and a second limiting groove at one end close to the arc-shaped supporting plate. When the arc-shaped supporting plate supports the third layer of probes, it drives the arc-shaped supporting plate to rotate from the first limiting groove to the second limiting groove.

5. The intelligent material storage device according to claim 4, characterized in that: When the supporting plate rotates and causes the second supporting section to support the second layer of probes, the side surface of the first hinged rod abuts against the second layer of probes and restricts the rotation of the supporting plate.

6. The intelligent material storage device according to claim 1, characterized in that: The intelligent material storage device also includes an alarm. A first proximity switch electrically connected to the alarm is provided on the box body on one side of the storage rack. The first proximity switch is used to detect whether there is a sampling probe at the position of the storage rack corresponding to the third layer probe. When the first proximity switch fails to detect the sampling probe, the alarm is triggered to sound an alarm.

7. The intelligent material storage device according to claim 5, characterized in that: The intelligent material storage device also includes an alarm. A contact is arranged in the second limit groove. The alarm is connected in series to the circuit of the flip drive component, and the circuit of the contact is connected in parallel to the alarm. When the arc-shaped support plate rotates to the second limit groove, the contact is triggered to conduct and the alarm is short-circuited.

8. The intelligent material storage device according to claim 1, characterized in that: The feeding assembly includes a material receiving plate, a feeding plate and a feeding driving member, wherein the material receiving plate is fixed to one side of the material guide plate, and a supporting groove for supporting the sampling probe is provided on the material receiving plate, and the feeding driving member is fixed to one side of the material receiving plate and connected to the feeding plate to drive the feeding plate to push the sampling probe to move laterally; The feeding assembly also includes a second proximity switch, which is installed on the side of the supporting plate to detect whether a sampling probe exists in the supporting groove.

9. The intelligent material storage device according to claim 8, characterized in that: The feeding assembly includes a first flip pressure piece, a second flip pressure piece and a clamping drive piece, the clamping drive piece is located on the side of the material receiving plate away from the feeding drive piece, and two fingers of the clamping drive piece are respectively connected to the first flip pressure piece and the second flip pressure piece to drive the first flip pressure piece and the second flip pressure piece to be jointly mounted on the sampling probe.

10. The intelligent material storage device according to claim 1, characterized in that: At least two storage racks are arranged side by side in the box to store different types of sampling probes, and the number of the unloading components is adapted to the storage racks.

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