Capacitance detection line with aging test station

Abstract

The invention provides a capacitor detection line with an aging test station, which can be used for an aging test in a capacitor detection process, and meanwhile, the structure of the existing detection line is improved, so that the labor cost can be reduced. The equipment comprises a capacitor feeding station, an aging rack mounting station, an aging test station and an aging rack dismounting station, each station is provided with a conveying track, each aging rack is provided with a plurality of capacitor loading units, and the aging test station comprises a tunnel type aging oven and an aging conveying track. The aging rack dismounting station is used for dismounting the capacitor loading unit from the aging rack, the aging conveying track is used for conveying the aging rack provided with the capacitor loading unit in the tunnel type aging oven, and the capacitor detection line further comprises an aging rack conveying track; and the starting end and the ending end of the aging rack conveying track are respectively arranged corresponding to the aging rack dismounting station and the aging rack mounting station.

Description

Technical Field

[0001] The invention relates to the technical field of capacitance detection, in particular to a capacitance detection line with an aging test station. Background Art

[0002] Finished capacitors such as tantalum capacitors, stacked aluminum capacitors and wound aluminum capacitors are generally in bulk state. The last production line in production requires aging testing to eliminate defective products.

[0003] For capacitors with lead packaging, such as wound aluminum capacitors, the current solution is to perform low-speed aging and low-speed serial charging tests on each capacitor, remove defective products, and then put them into the taping packaging device in bulk. The aging machine of this solution uses a drum or box-type heating aging machine. The number of capacitors loaded at one time is limited, so the efficiency is low. Currently, it can only achieve an aging and testing speed of one capacitor per second. Under the demand for large capacitor production capacity, the number of equipment that must be configured is huge, the floor space is also very large, and the labor required is also high, resulting in high production line costs and operating costs. Therefore, the wound aluminum capacitor industry is also in urgent need of equipment solutions that can increase speed and reduce labor operation costs.

[0004] As for capacitors packaged in surface-mount components, such as MLCC capacitors, the current method is to load the capacitors in a vertical state on an aging board with multiple capacitor accommodating slots, use the probe of the upper needle board to contact the upper electrode of the capacitor, and the contact electrode at the bottom of the accommodating hole to contact the lower electrode of the capacitor, and lead out the capacitor electrode in the above way. Multiple discrete aging boxes are used as aging units, and the aging boards are inserted into the aging boxes for aging. After aging, the capacitors are taken out of the aging boards, and the capacitors enter other high-speed MLCC bulk capacitor 4-parameter test sorting machines in a bulk state, and finally enter the high-speed MLCC bulk capacitance test taping machine. However, the aging and test results in the above method cannot be associated, which is not convenient for data tracking of capacitors.

[0005] In order to solve the above problems, the patent with publication number CN218890862U applied by the applicant earlier discloses a detection line for capacitor aging and testing, which adopts an automatic loading method and device to load the carrier box with capacitors into the aging board, and the aging board into the aging rack, and finally push the aging rack into the aging box. After the aging is completed, the aging rack is pushed out of the aging box, and the aging board is taken out of the aging rack and the carrier box is taken out of the aging board. The automatic unloading scheme is adopted, and the carrier box finally enters the fully automatic cassette 4-parameter test and taping integrated machine to form a higher efficiency back-end production line. However, in the aging test process, multiple aging boxes are required to cooperate with the automatic loading and unloading device, and finally cooperate with the automatic testing and taping device to achieve higher production efficiency. The above method is adopted because the capacitor is always located in the carrier box, which is convenient for tracking the capacitor data, while improving the efficiency and automation level of the last production line.

[0006] However, the operation of multiple aging boxes requires manual assistance, which makes the labor cost of the production line operation still appear to be high. For example, before and after the aging operation, each aging box must be loaded / unloaded with aging racks. Since the weight of a fully loaded aging rack is hundreds of kilograms, the transfer and loading / unloading operations require the operation of an electric pallet truck and an electric forklift. These auxiliary equipment must also be operated manually, which is costly. After the aging is completed, the empty aging racks also need to be manually circulated and transported, which also increases the labor cost. Summary of the invention

[0007] In view of the problem of high labor cost of existing capacitance detection lines, the present invention provides a capacitance detection line with an aging test station, which can be used for aging tests in the capacitance detection process, and at the same time improves the structure of the existing detection line to reduce labor costs.

[0008] The technical solution is as follows: a capacitor detection line with an aging test station, which includes a capacitor loading station, an aging rack installation station, an aging test station, and an aging rack disassembly station, each station is respectively equipped with a conveying track, the capacitor loading station is used to place the capacitor into a capacitor loading unit, each of the capacitor loading units accommodates multiple capacitors, the aging rack installation station is used to install the capacitor loading unit on the aging rack, each aging rack is installed with multiple capacitor loading units, the aging test station includes a tunnel aging furnace, an aging conveying track, the aging rack disassembly station is used to remove the capacitor loading unit from the aging rack, and is characterized in that: the aging conveying track is used to convey the aging rack with the capacitor loading unit installed in the tunnel aging furnace, the capacitor detection line also includes an aging rack conveying track, the starting end and the ending end of the aging rack conveying track are respectively arranged corresponding to the aging rack disassembly station and the aging rack installation station.

[0009] Furthermore, the tunnel-type aging furnace and the aging conveying track are both U-shaped or only the aging conveying track is U-shaped, and the aging rack installation station and the aging rack disassembly station are respectively arranged at the front end of the entrance and exit of the tunnel-type aging furnace; the entrance and exit of the tunnel-type aging furnace are respectively provided with temperature conversion zones, and the temperature conversion zones are respectively separated from the tunnel-type aging furnace and the outside by insulating doors.

[0010] Furthermore, a powered contact array is installed on the tunnel-type aging furnace, and an electrical connection contact array is installed on the aging rack. The electrical connection contact arrays are electrically connected to each capacitor installed on the aging rack, respectively. The powered contact array is connected to a displacement mechanism. When the aging rack equipped with the capacitor loading unit moves in the tunnel-type aging furnace, the powered contact array is located on the moving path of the electrical connection contact array. The displacement mechanism is used to drive the powered contact array to connect with the electrical connection contact array.

[0011] Furthermore, before the capacitor loading unit is loaded into the aging rack, a contact status test is performed on each capacitor therein and the position of the capacitor with poor contact is recorded. After the aging test, a contact status test is performed again on each capacitor in the capacitor loading unit and the position of the capacitor with poor contact is recorded. Only capacitors with good contact before and after the aging test are judged to have undergone an effective aging test. For capacitors that have not undergone an effective aging test, they are taken out and subjected to an aging test again.

[0012] Furthermore, the capacitor loading unit includes a power-on contact and a test contact. Multiple capacitors are connected in parallel or each capacitor is connected in series with a protection element and then connected in parallel to two of the power-on contacts. The power-on contacts are connected in parallel to the test contacts. The power-on contacts are used to connect to the electrical connection contact array to power the capacitor, and the test contacts are used to connect to the measurement contacts in the power-on contact array to measure whether the capacitor loading unit obtains an aging voltage.

[0013] Furthermore, the capacitor loading station includes a capacitor carrier box loading station and an aging board installation station. The capacitor carrier box loading station is used to place bulk capacitors into capacitor carrier boxes, and each capacitor carrier box contains multiple capacitors; the aging board installation station is used to install the capacitor carrier box onto the aging board to form an aging fixture, and each aging board contains multiple capacitor carrier boxes. The capacitor loading unit is the aging board containing multiple capacitor carrier boxes; an aging board disassembly station is also provided behind the aging rack disassembly station, and the aging board disassembly station is used to remove the capacitor carrier box from the aging board. The capacitor detection line also includes an aging board conveying track, and the starting end and the ending end of the aging board conveying track are respectively arranged corresponding to the aging board disassembly station and the aging board installation station.

[0014] Furthermore, the aging board is provided with a circuit adapter board. When the capacitor carrier box is installed on the aging board, each capacitor is electrically connected to the circuit adapter board; when the aging board is installed on the aging rack, the aging board is electrically connected to the electrical connection contact array through the circuit adapter board.

[0015] Furthermore, the capacitor loading station includes an aging board loading station and an aging board installation station. The aging board loading station is used to place the capacitor in a plurality of positioning grooves for placing the capacitor on the aging board. The aging board installation station is used to fix the capacitor and electrically connect the capacitor to the circuit adapter board on the aging board. The capacitor loading unit is the aging board. An aging board disassembly station is also provided behind the aging rack disassembly station. The aging board disassembly station is used to cancel the fixation of the capacitor on the aging board. The capacitor detection line also includes a fixing conveying track. The starting end and the ending end of the fixing conveying track correspond to the aging board disassembly station and the aging board installation station, respectively.

[0016] Furthermore, a contact electrode for contacting the capacitor electrode is provided at the bottom of each positioning groove, and the contact electrode is connected to the powered end 1 on the surface of the aging board; the aging board installation station is used to connect the upper needle plate with the aging board to form an aging fixture, and the fixing part is the upper needle plate, and the bottom of the upper needle plate is provided with a probe corresponding to each positioning groove for contacting the other electrode of the capacitor. When the upper needle plate is connected to the aging board, the probe is electrically connected to the powered end 2 on the surface of the aging board, and a plurality of the powered ends 1 and 2 are gathered to form the circuit adapter board. When the aging board is installed on the aging rack, the aging board is electrically connected to the electrical connection contact array through the circuit adapter board.

[0017] Furthermore, a front-end testing station is provided before the aging board installation station, and the front-end testing station includes one or more testing stations for capacity loss, withstand voltage and insulation resistance IR tests; after the aging test is completed, a back-end testing station is provided after the aging board disassembly and assembly station, and the back-end testing station includes one or more testing stations for capacity loss, withstand voltage and insulation resistance IR tests. According to the measured capacitance parameters before and after the aging test, the parameter change before and after the aging test is obtained, and whether the stability and reliability of the capacitor meet the requirements is judged according to the size of the parameter change. A defective product rejection station and a sorting station for classifying, taking out and placing the capacitors according to the measured values ​​are also provided after the back-end testing station.

[0018] Furthermore, the capacitor detection line also includes a workpiece testing station, a waste screening station and a packaging station. The packaging station and the capacitor loading station are connected through an empty capacitor carrier conveying track. The empty capacitor carrier conveying track is used to convey capacitor storage carriers that are not loaded with capacitors after packaging.

[0019] Beneficial effect: Since the tunnel-type aging furnace is used to directly carry out the aging test on the aging rack equipped with the capacitor loading unit, the aging rack is transported in the tunnel-type aging furnace by the aging conveyor track to complete the aging. Compared with the existing test line, which needs to move the aging racks one by one to the aging box for aging and then take them out, it can reduce manpower consumption; at the same time, when the aging test is completed and the disassembly is completed, the empty aging rack can be transported to the aging rack installation station through the aging rack conveyor track for recycling, so that there is no need to manually operate the transportation tool to move the aging rack, further reducing manpower consumption. BRIEF DESCRIPTION OF THE DRAWINGS

[0020] Figure 1 It is a schematic diagram of the structure of the present invention; Figure 2 for Figure 1 The left part is an enlarged schematic diagram; Figure 3 for Figure 1 Enlarged schematic diagram of right supplement; Figure 4 This is a schematic diagram of the aging rack; Figure 5 It is a partial schematic diagram of the tunnel-type aging furnace; Figure 6 It is a schematic diagram of the energized contact array and displacement mechanism; Figure 7 This is the circuit diagram for capacitor connection; Figure 8 This is a schematic diagram of the aging board without the loading box installed; Fig. 9 This is the installation diagram of the aging board without the loading box installed; Fig.10 A partial schematic diagram of the wound aluminum capacitor loading box. DETAILED DESCRIPTION

[0021] like Figure 1-Figure 3A capacitor detection line with an aging test station is shown, which includes a capacitor loading station 100, an aging rack installation station 200, an aging test station 300, an aging rack disassembly station 400, and, as needed, a workpiece testing station 500 (for 4-parameter testing of capacitors), a waste screening station 600 (for removing defective products), a replenishing station 700 (for filling the vacant positions after removing defective capacitors with qualified capacitors) and a packaging station 800. Conveying tracks are provided in each station and between them, and in particular, the packaging station 800 and the capacitor loading station 100 are connected by an empty capacitor carrier conveying track, and the empty capacitor carrier conveying track is used to convey the capacitor storage carrier that is not loaded with capacitors after packaging (the capacitor storage carrier refers to the capacitor carrier box or aging board that directly stores capacitors as described below), so that the capacitor detection line is connected at the first position, reducing the manpower consumption of transporting the capacitor storage carrier. Among them, the capacitor loading station 100 is used to place the capacitor into the capacitor loading unit, each capacitor loading unit contains multiple capacitors, and the aging rack installation station 200 is used to install the capacitor loading unit into the following Figure 4 On the aging rack 1 shown, each aging rack 1 is installed with multiple capacitor loading units, the aging test station includes a tunnel-type aging furnace 301 and an aging conveying track 302, the aging rack disassembly station 400 is used to remove the capacitor loading unit from the aging rack 1, the aging conveying track 302 is used to convey the aging rack 1 installed with the capacitor loading unit in the tunnel-type aging furnace 301, the capacitor detection line also includes an aging rack conveying track 401, and the starting end and the ending end of the aging rack conveying track 401 are respectively corresponding to the aging rack disassembly station 400 and the aging rack installation station 200.

[0022] Preferably, the tunnel-type aging furnace 301 can be U-shaped or the aging conveying track 302 can be U-shaped. The tunnel-type aging furnace 301 is linear. The aging conveying track 302 at the corner can use a chain plate bending machine to convey the aging rack. The aging rack installation station 200 and the aging rack disassembly station 400 are respectively arranged at the front end of the entrance and exit of the tunnel-type aging furnace 301, so that the two stations can be arranged relative to each other; the entrance and exit positions of the tunnel-type aging furnace 301 are respectively provided with temperature conversion zones 303, and the temperature conversion zones 303 are respectively separated from the tunnel-type aging furnace 301 and the outside by the insulation door 304. The insulation door 304 is preferably a translation insulation door to save space; by using the area between the double doors as the conversion zone between the aging high-temperature zone and the external normal temperature zone, the inner door is in a closed state before the outer door is opened, so that the high-temperature zone inside the tunnel furnace will not be directly exposed to the external environment, so that when the aging rack enters and exits the tunnel furnace, the temperature in the tunnel furnace will not fluctuate greatly.

[0023] Although simply heating the capacitor at high temperature is also a way of capacitor aging test, the common aging test also requires the capacitor to be powered in a high temperature environment. Figure 4 , Figure 5 , Figure 6 A powered contact array 305 is installed on the tunnel-type aging furnace 301, and an electrically connected contact array 2 is installed on the aging rack 1. In order to facilitate installation and other operations, the contact array can be set on the side of each device. The electrically connected contact array 2 is electrically connected to each capacitor installed on the aging rack 1 respectively. The powered contact array 305 is connected to a displacement mechanism 306 (such as a cylinder). When the aging rack 1 equipped with a capacitor loading unit moves in the tunnel-type aging furnace 301, the powered contact array 305 is located on the moving path of the electrically connected contact array 2. The displacement mechanism 306 is used to drive the powered contact array 305 to connect with the electrically connected contact array 2, thereby applying voltage to the capacitor.

[0024] After the aging rack enters the tunnel-type aging furnace, it passes through multiple workstations in sequence at a certain rhythm. When the aging rack stops at a workstation, the powered contact array 305 of the workstation moves to the electrical connection contact array 2 of the aging rack to achieve electrical connection between the two groups of contact arrays. The aging powered device and the test device outside the tunnel-type aging furnace are connected to the contact array of the aging rack through the contact array set at each workstation, so as to power up each capacitor in each aging board in the aging rack.

[0025] In order to ensure effective power-on, before the capacitor loading unit is loaded into the aging rack 1, the contact status of each capacitor therein is tested and the position of the capacitor with poor contact is recorded. After the aging test, the contact status of each capacitor in the capacitor loading unit is tested again and the position of the capacitor with poor contact is recorded. Only capacitors with good contact before and after the aging test are judged to have undergone an effective aging test; capacitors that have not undergone an effective aging test are taken out and subjected to the aging test again.

[0026] In addition, if Figure 7 The capacitor loading unit includes a powered contact A and a test contact B. A plurality of capacitors are connected in parallel or in series with protection elements (such as resistors) and then connected in parallel to two of the powered contacts (if all the capacitors are connected in parallel at one time, there are only two powered contacts). The powered contacts are connected in parallel to the test contacts. The powered contacts are used to connect to the electrical connection contact array to energize the capacitors. The test contacts are used to connect to the measurement contacts in the powered contact array to measure whether the capacitor loading unit obtains the aging voltage. When the aging rack stays at an aging position in the tunnel aging furnace, the contact array configured at the aging position will contact multiple contacts of the aging board, a part of which is used to apply the aging voltage to the capacitors in the aging board, and another part of the contacts is used to measure whether the aging voltage is obtained on the aging board, so as to ensure that the aging voltage will not be applied to the aging board because the contacts applying the aging voltage have poor contact.

[0027] As an implementation method, combined with Figure 2The capacitor loading station 100 includes a capacitor carrier box loading station 101 (which can be loaded through a vibration plate) and an aging board installation station 102. The capacitor carrier box loading station 101 is used to place bulk capacitors into capacitor carrier boxes. Each capacitor carrier box contains multiple capacitors. The device for loading capacitors into carrier boxes can adopt a turret loading method. A testing device is provided on the turret to predict and eliminate bad capacitors, so that the capacitors entering the carrier boxes are initially good capacitors. In order to increase the speed of capacitor box loading, one or more turret loading mechanisms can be used to form a high-speed box loading unit. This unit contains an empty carrier box entrance station, one or more box loading stations, a carrier box moving conveyor line, etc. The carrier box loaded with capacitors is sent to the station where the carrier box is loaded into the aging board through the conveyor line; the aging board installation station 102 is used to install the capacitor carrier box on the aging board to form an aging fixture, which can also specifically include an aging board screw tightening station 103, an aging board contact test station 104, etc. (For the specific aging board installation, please refer to the relevant content disclosed in the patent publication number CN218890862U). Figure 2 105 is an aging board storage position, each aging board contains multiple capacitor carrier boxes, and the capacitor loading unit is an aging board containing multiple capacitor carrier boxes. The aging board containing multiple capacitor carrier boxes can be inserted into the aging rack 1 through the slot 4 on the aging rack 1 by taking the board robot 3 (arm); an aging board disassembly station 402 is also provided behind the aging rack disassembly station 400, and the aging board disassembly station 402 is used to remove the capacitor carrier box from the aging board. Accordingly, it can also be provided with an aging board storage position 105, an aging board contact test station 104, and an aging board screw disassembly station 403. The capacitor detection line also includes an aging board conveying track 404. The starting end and the ending end of the aging board conveying track 404 correspond to the aging board disassembly station 402 and the aging board installation station 102 respectively, so that it is convenient to transport empty aging boards, thereby saving manpower.

[0028] On the basis of the above, a circuit adapter board is provided on the aging board. When the capacitor carrier box is installed on the aging board, each capacitor is electrically connected to the circuit adapter board; when the aging board is installed on the aging rack, the aging board is electrically connected to the electrical connection contact array 2 through the circuit adapter board.

[0029] The above capacitors may include various surface mount capacitors, or wound aluminum capacitors, etc. For example, when used for wound aluminum capacitors, such as Fig.10As shown, the inside of the carrier box is provided with a plurality of positioning grooves 7 for accommodating the wound capacitor body 5 and the lead wire 6 (equivalent to the electrode of the patch capacitor), and the wound aluminum capacitor is installed in the positioning groove in a horizontal manner, wherein two probe pressure point positions C can be provided for each lead wire. In the aging unit, a probe is provided on the aging needle plate for each lead wire to contact and lead out the electrode; after the carrier box enters the test unit, the test device is provided with a multi-channel 4-wire probe card, and 2 probes are provided on each capacitor lead wire for contact, so as to realize a 4-wire contact mode of a capacitor, complete the ESR value test, or include the capacity and loss test, and the test device can also be provided with a 2-wire probe card for leakage current or insulation resistance test, or also include a probe card for current surge test.

[0030] When the packaging station uses taping, the arrangement spacing of the capacitors in the carrier box is consistent with the spacing of the tape used for packaging. After the carrier box passes through the testing station, screening and replenishing station, it enters the packaging station (taking taping packaging as an example), and a row of capacitors is taken from the carrier box at the same time to the taping station and the tape is put into the tape to complete the packaging. This method is relatively simple, but its operating efficiency will be significantly reduced in the case of a large number of defective capacitors. After the carrier box enters the test unit to complete the test, the carrier box enters the turret taping device. At this time, the arrangement spacing of the capacitors in the carrier box is not limited by the taping spacing, and it can also cope with batches of capacitors with a large number of defective products. The efficiency of the taping device is not affected by the large number of defective capacitors.

[0031] As another embodiment, the capacitor loading station includes an aging board loading station and an aging board installation station 102, combined with Figure 8 , Fig. 9 The aging board loading station is used to place the capacitor in a plurality of positioning grooves 1001 for placing capacitors provided on the aging board. The capacitor is loaded into the aging board by directly placing the capacitor on the aging board and implanting the capacitor into the receiving groove by shaking the aging board. The capacitor can also be placed in a sieve plate with multiple sieve holes, each sieve hole corresponding to a capacitor receiving space on the aging board. By shaking the combination of the sieve plate and the aging board, the capacitor will flow through the sieve holes into the receiving holes of the aging board. The aging board installation station 102 is used to fix the capacitor and electrically connect the capacitor to the circuit adapter board on the aging board. The capacitor loading unit is the aging board. An aging board disassembly station 402 is also provided behind the aging rack disassembly station. The aging board disassembly station 402 is used to cancel the fixation of the capacitor on the aging board. The capacitor detection line also includes a fixing conveying track (see Figure 2 The aging board conveying track 404 in the figure), the starting end and the ending end of the fixing part conveying track are respectively arranged corresponding to the aging board disassembly station 102 and the aging board installation station 402, so as to facilitate the conveyance of the fixing parts.

[0032] Specifically, a contact electrode is provided at the bottom of each positioning groove, and the contact electrode is connected to the powered end 1 on the surface of the aging board through a circuit printed on the surface of the aging board; the aging board installation station is used to connect the upper needle plate 1003 with the aging board to form an aging fixture, and the upper needle plate 1003 is a fixing part. A probe 1004 corresponding to each positioning groove 1001 is provided at the bottom of the upper needle plate 1003. When the upper needle plate 1003 is connected to the aging board, the probe 1004 is connected to the powered end 2 on the surface of the aging board (for example, the probe can be used as a contact probe, one end of the contact probe contacts the capacitor electrode, and the other end is led out and connected to another probe on the upper needle plate That is, a connecting probe is connected to the powered terminal 2 to achieve the connection between the contact probe and the powered terminal 2). Multiple powered terminals 1 and 2 are gathered at the circuit adapter board 1002 (such as a gold finger plug) at the end of the aging board. When the aging board is installed on the aging rack 1, the aging board is electrically connected to the electrical connection contact array 2 through the circuit adapter board 1002. The above method is particularly suitable for MLCC capacitors (chip capacitors) with electrodes at both ends. The capacitor can be placed vertically in the positioning groove, the contact electrode contacts the bottom electrode of the capacitor, and the probe contacts the top electrode of the capacitor. This arrangement can reduce the use of capacitor carriers and thus reduce costs.

[0033] It is also worth mentioning that, regarding capacitor testing, a front-end test station can be provided before the aging board installation station 102, and the front-end test station includes one or more test stations for capacity loss, withstand voltage and insulation resistance IR tests; after the aging test is completed, a back-end test station is provided after the aging board disassembly station 402, and the back-end test station includes one or more test stations for capacity loss, withstand voltage and insulation resistance IR tests. During the test, the probe card device can be used to contact the upper electrode of each capacitor and the external test contact on the aging board connected to the lower electrode of the capacitor, or directly press on the two electrodes of the capacitor. According to the measured capacitance parameters before and after the aging test, the parameter change before and after the aging test is obtained, and the stability and reliability of the capacitor are judged according to the size of the parameter change. Whether it meets the requirements, there is also a defective product rejection station and a sorting station for classifying, taking out and placing the capacitors according to the measured values ​​after the back-end test station.

[0034] The above are only preferred specific embodiments of the present invention, but the protection scope of the present invention is not limited thereto. Any changes or substitutions that can be easily thought of by anyone familiar with the technology within the technical scope disclosed by the present invention should be included in the protection scope of the present invention. Therefore, the protection scope of the present invention should be based on the protection scope of the claims.

Claims

1. A capacitor detection line with an aging test station, comprising a capacitor loading station, an aging rack installation station, an aging test station, and an aging rack disassembly station, each station being respectively equipped with a conveying track, the capacitor loading station being used to place the capacitor into a capacitor loading unit, each of the capacitor loading units accommodating a plurality of capacitors, the aging rack installation station being used to install the capacitor loading unit onto the aging rack, each aging rack being equipped with a plurality of the capacitor loading units, the aging test station comprising a tunnel aging furnace and an aging conveying track, the aging rack disassembly station being used to remove the capacitor loading unit from the aging rack, characterized in that: The aging conveying track is used to convey the aging rack installed with the capacitor loading unit in the tunnel aging furnace. The capacitor detection line also includes an aging rack conveying track. The starting end and the ending end of the aging rack conveying track are respectively arranged corresponding to the aging rack disassembly station and the aging rack installation station.

2. A capacitance testing line with an aging test station according to claim 1, characterized in that: The tunnel-type aging furnace and the aging conveying track are both U-shaped or only the aging conveying track is U-shaped, the aging rack installation station and the aging rack disassembly station are respectively arranged at the front end of the entrance and exit of the tunnel-type aging furnace; the entrance and exit of the tunnel-type aging furnace are respectively provided with temperature conversion zones, and the temperature conversion zones are respectively separated from the tunnel-type aging furnace and the outside by insulating doors.

3. A capacitance testing line with an aging test station according to claim 1, characterized in that: The tunnel-type aging furnace is equipped with an array of powered contacts, and the aging rack is equipped with an array of electrically connected contacts. The array of electrically connected contacts is electrically connected to each capacitor installed on the aging rack, respectively. The powered contact array is connected to a displacement mechanism. When the aging rack equipped with the capacitor loading unit moves in the tunnel-type aging furnace, the powered contact array is located on the moving path of the array of electrically connected contacts. The displacement mechanism is used to drive the powered contact array to connect with the array of electrically connected contacts.

4. A capacitance testing line with an aging test station according to claim 3, characterized in that: Before loading the capacitor loading unit into the aging rack, perform a contact status test on each capacitor therein and record the position of the capacitor with poor contact. After the aging test, perform a contact status test on each capacitor in the capacitor loading unit again and record the position of the capacitor with poor contact. Only capacitors with good contact before and after the aging test are judged to have undergone an effective aging test. For capacitors that have not undergone an effective aging test, take them out and perform the aging test again.

5. A capacitance testing line with an aging test station according to claim 3, characterized in that: The capacitor loading unit includes a power-on contact and a test contact. Multiple capacitors are connected in parallel or each capacitor is connected in series with a protection element and then connected in parallel to two of the power-on contacts. The power-on contacts and the test contacts are connected in parallel. The power-on contacts are used to connect to the electrical connection contact array to power the capacitor, and the test contacts are used to connect to the measurement contacts in the power-on contact array to measure whether the capacitor loading unit obtains an aging voltage.

6. A capacitance testing line with an aging test station according to claim 3, characterized in that: The capacitor loading station includes a capacitor carrier box loading station and an aging board installation station. The capacitor carrier box loading station is used to place bulk capacitors into capacitor carrier boxes, and each capacitor carrier box contains multiple capacitors; the aging board installation station is used to install the capacitor carrier box onto the aging board to form an aging fixture, and each aging board contains multiple capacitor carrier boxes. The capacitor loading unit is the aging board containing multiple capacitor carrier boxes; an aging board disassembly station is also provided behind the aging rack disassembly station, and the aging board disassembly station is used to remove the capacitor carrier box from the aging board. The capacitor detection line also includes an aging board conveying track, and the starting end and the ending end of the aging board conveying track are respectively arranged corresponding to the aging board disassembly station and the aging board installation station.

7. A capacitance testing line with an aging test station according to claim 6, characterized in that: The aging board is provided with a circuit adapter board. When the capacitor carrier box is installed on the aging board, each capacitor is electrically connected to the circuit adapter board; when the aging board is installed on the aging rack, the aging board is electrically connected to the electrical connection contact array through the circuit adapter board.

8. A capacitance testing line with an aging test station according to claim 3, characterized in that: The capacitor loading station includes an aging board loading station and an aging board installation station. The aging board loading station is used to place the capacitor in a plurality of positioning grooves for placing the capacitor on the aging board. The aging board installation station is used to fix the capacitor and electrically connect the capacitor to the circuit adapter board on the aging board. The capacitor loading unit is the aging board. An aging board disassembly station is also provided behind the aging rack disassembly station. The aging board disassembly station is used to cancel the fixation of the capacitor on the aging board. The capacitor detection line also includes a fixing conveying track. The starting end and the ending end of the fixing conveying track correspond to the aging board disassembly station and the aging board installation station, respectively.

9. A capacitance testing line with an aging test station according to claim 8, characterized in that: The electrodes of the capacitor are located at both ends thereof, and the bottom of each positioning groove is provided with a contact electrode for contacting the capacitor electrode, and the contact electrode is connected to the powered end 1 on the surface of the aging board; the aging board installation station is used to connect the upper needle plate with the aging board to form an aging fixture, and the fixing part is the upper needle plate, and the bottom of the upper needle plate is provided with a probe corresponding to each positioning groove for contacting the other electrode of the capacitor. When the upper needle plate is connected to the aging board, the probe is electrically connected to the powered end 2 on the surface of the aging board, and a plurality of the powered ends 1 and 2 are gathered to form the circuit adapter board. When the aging board is installed on the aging rack, the aging board is electrically connected to the electrical connection contact array through the circuit adapter board.

10. A capacitance testing line with an aging test station according to any one of claims 6 to 9, characterized in that: A front-end test station is provided before the aging board installation station, and the front-end test station includes one or more test stations for capacity loss, withstand voltage and insulation resistance IR tests; after the aging test is completed, a back-end test station is provided after the aging board disassembly station, and the back-end test station includes one or more test stations for capacity loss, withstand voltage and insulation resistance IR tests. According to the measured capacitance parameters before and after the aging test, the parameter change before and after the aging test is obtained, and whether the stability and reliability of the capacitor meet the requirements is judged according to the size of the parameter change. A defective product rejection station and a sorting station for classifying, taking out and placing the capacitors according to the measured values ​​are also provided after the back-end test station.

11. A capacitance testing line with an aging test station according to any one of claims 1 to 9, characterized in that: The capacitor detection line also includes a workpiece testing station, a screening station and a packaging station. The packaging station and the capacitor loading station are connected through an empty capacitor carrier conveying track. The empty capacitor carrier conveying track is used to convey the capacitor storage carrier without capacitor after packaging.

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