Equipment testing device and method, electronic equipment and computer readable storage medium

Abstract

The invention provides an equipment testing device and method, electronic equipment and a computer readable storage medium. The equipment testing device comprises a processing module, an assembly line module and an NFC detection module. A target device is placed on the assembly line module, the processing module is respectively connected with the NFC detection module and the target device, and the NFC detection module and the assembly line module are oppositely arranged. The NFC detection module is arranged relative to the assembly line module, so that the target equipment can directly test the NFC module on the assembly line without moving, and the test time is saved; and meanwhile, the NFC detection module and the processing module are arranged, so that automatic testing of the NFC module can be realized, the dependence on manpower is further reduced, and the labor cost is saved.

Description

Technical Field

[0001] The present invention relates to the field of equipment testing, and in particular to an equipment testing device, method, electronic equipment and computer-readable storage medium. Background Art

[0002] At present, the functional testing of NFC (Near Field Communication) of wearable devices, such as watches, is often done manually by taking the target device from the assembly line and placing it in a test fixture for testing. After the test, the target device is taken out of the test fixture manually. However, due to problems such as the reaction speed and operation efficiency of the staff, the manual functional testing method has the problem of long testing time in actual applications, and also increases the labor cost. Summary of the invention

[0003] The main purpose of the present invention is to provide a device testing apparatus, method, electronic device and computer-readable storage medium, aiming to solve the problem of long time and high labor cost of NFC function testing in the prior art.

[0004] To achieve the above object, the present invention provides a device testing apparatus, which includes a processing module, a pipeline module and an NFC detection module; a target device is placed on the pipeline module, the processing module is connected to the NFC detection module and the target device respectively, and the NFC detection module is arranged opposite to the pipeline module; wherein:

[0005] The pipeline module is used to drive the target device to move, and when the target device moves to face the NFC detection module, it can perform NFC information transmission with the NFC detection module;

[0006] The NFC detection module is used to perform NFC information transmission with the target device;

[0007] The processing module is used to obtain test data generated when the target device and the NFC detection module perform NFC information transmission, and test the NFC module of the target device according to the test data.

[0008] Optionally, the NFC detection module includes a signal generating unit and a signal listening unit; the signal generating unit and the signal listening unit are respectively arranged opposite to the pipeline module, and the signal generating unit and the signal listening unit are respectively connected to the processing module; wherein:

[0009] When the target device moves to face the signal generating unit, the target device can perform NFC information transmission with the signal generating unit;

[0010] When the target device moves to face the signal listening unit, the target device can perform NFC information transmission with the signal listening unit;

[0011] The signal generating unit is used to send a first test signal so that the target device generates first test data after receiving the first test signal;

[0012] The signal monitoring unit is used to detect the second test signal sent by the target device to generate second test data;

[0013] The processing module is used to test the NFC module of the target device according to the first test data and the second test data.

[0014] Optionally, the assembly line module includes a conveyor belt unit, a device carrier and a position control unit; the target device is placed on the device carrier, the device carrier is arranged on the conveyor belt unit, and the position control unit is arranged under the conveyor belt unit; wherein:

[0015] The conveyor belt unit is used to drive the equipment carrier to move;

[0016] The position control unit is used to control the device carrier to be in a transmission position when the device carrier is opposite to the NFC detection module, wherein, at the transmission position, the distance between the target device and the NFC detection module is less than a preset transmission distance.

[0017] Optionally, there are multiple target devices, and the signal generating unit includes a signal generating device and multiple polling antennas; the signal generating device is connected to each of the polling antennas, wherein:

[0018] When each of the target devices is respectively at a transmission position corresponding to each of the polling antennas, the second distance is greater than a preset multiple of the first distance, wherein the first distance is a vertical distance between the polling antenna and the NFC antenna of the target device, and the second distance is a distance between adjacent target devices;

[0019] The signal generating device is used to generate a first test signal and broadcast the first test signal through the polling antenna.

[0020] Optionally, there are multiple target devices, and the signal listening unit includes a signal receiving device and multiple listening antennas, and the signal receiving device is connected to each of the listening antennas, wherein:

[0021] When each of the target devices is respectively at a transmission position corresponding to each of the listening antennas, the fourth distance is greater than a preset multiple of the third distance, wherein the third distance is a vertical distance between the listening antenna and the NFC antenna of the target device, and the fourth distance is a distance between adjacent target devices;

[0022] The signal receiving device is used to obtain second test data obtained by the monitoring antenna receiving the second test signal, and send the second test data to the processing module.

[0023] Optionally, the position control unit includes a blocking lifting cylinder; wherein:

[0024] The blocking lifting cylinder is used to drive the equipment carrier to move in a direction relative to the NFC detection module.

[0025] Optionally, the conveyor belt unit includes a main conveyor belt, a defective conveyor belt and a driving device; the main conveyor belt and the defective conveyor belt are respectively connected to the driving device; the assembly line module also includes a blocking cylinder and a side thrust cylinder, the blocking cylinder is arranged under the main conveyor belt and before the NFC detection module, and the side thrust cylinder is arranged under the main conveyor belt and corresponding to the NFC detection module; wherein:

[0026] The driving device is used to drive the main transmission belt and the defective transmission belt;

[0027] The blocking cylinder is used to prevent a new target device from flowing to the transmission position when the NFC module of the target device is tested;

[0028] The side push cylinder is used to push the target device into the defective product conveyor belt when it is determined that the target device is unqualified.

[0029] To achieve the above object, the present invention further provides a device testing method, which is applied to the device testing apparatus as described above; wherein:

[0030] Determine the location of the target device on the pipeline module;

[0031] When the target device moves to face the NFC detection module, controlling the target device to transmit NFC information with the NFC detection module to obtain test data;

[0032] The NFC module of the target device is tested according to the test data.

[0033] Optionally, the NFC detection module includes a signal generating unit and a signal listening unit; when the target device moves to be opposite to the NFC detection module, controlling the target device and the NFC detection module to perform NFC information transmission, and obtaining the test data includes:

[0034] When the target device moves to be opposite to the signal generating unit, setting the target device to a simulated card mode;

[0035] Controlling the signal generating unit to send a first test signal to obtain first test data obtained by the target device receiving the first test signal;

[0036] When the target device moves to be opposite to the signal listening unit, setting the target device to a card reading and writing mode;

[0037] Controlling the target device to send a second test signal to obtain second test data obtained by the signal listening unit receiving the second test signal;

[0038] The NFC module of the target device is tested according to the first test data and the second test data.

[0039] Optionally, after testing the NFC module of the target device according to the test data, the method further comprises:

[0040] Obtaining a test result of the NFC module of the target device;

[0041] Determine whether the target device is unqualified according to the test result;

[0042] If the target device is unqualified, the side push cylinder is controlled to push the target device into the defective product conveyor belt.

[0043] To achieve the above objectives, the present invention also provides an electronic device, which includes a memory, a processor, and a computer program stored in the memory and executable on the processor, wherein the computer program implements the steps of the device testing method described above when executed by the processor.

[0044] To achieve the above object, the present invention further provides a computer-readable storage medium, on which a computer program is stored, and when the computer program is executed by a processor, the steps of the device testing method described above are implemented.

[0045] The present invention proposes a device testing apparatus, method, electronic device and computer-readable storage medium, wherein the device testing apparatus comprises a processing module, an assembly line module and an NFC detection module; the target device is placed on the assembly line module, the processing module is connected to the NFC detection module and the target device respectively, and the NFC detection module is arranged relative to the assembly line module; wherein: the assembly line module is used to drive the target device to move, and when the target device moves to be relative to the NFC detection module, it can transmit NFC information with the NFC detection module; the NFC detection module is used to transmit NFC information with the target device; the processing module is used to obtain the test data generated when the target device and the NFC detection module transmit NFC information, and test the NFC module of the target device according to the test data. By setting the NFC detection module relative to the assembly line module, the target device can directly test the NFC module on the assembly line without moving, thus saving the test time; at the same time, setting the NFC detection module and the processing module can realize the automatic test of the NFC module, further reducing the dependence on manual labor and saving labor costs. BRIEF DESCRIPTION OF THE DRAWINGS

[0046] The accompanying drawings, which are incorporated in and constitute a part of this specification, illustrate embodiments consistent with the invention and, together with the description, serve to explain the principles of the invention.

[0047] In order to more clearly illustrate the embodiments of the present invention or the technical solutions in the prior art, the drawings required for use in the embodiments or the description of the prior art will be briefly introduced below. Obviously, for ordinary technicians in this field, other drawings can be obtained based on these drawings without paying any creative labor.

[0048] Figure 1 It is a module structure diagram of the equipment testing device of the present invention;

[0049] Figure 2 It is a schematic diagram of the overall structure of the equipment testing device of the present invention;

[0050] Figure 3 A schematic diagram of a tuning circuit of a device testing apparatus of the present invention;

[0051] Figure 4 It is a module structure diagram of the electronic device of the present invention.

[0052] Description of Figure Numbers:

[0053] Label name Label name 100 Processing Module 300 NFC detection module 200 Pipeline module 311 Signal generator 211 Main conveyor belt 312 Polling Antenna 212 Defective conveyor belt 321 Signal receiving device 213 Drive device 322 Listening Antenna 214 Display 400 Target devices 220 Equipment carrier C1~C3 First capacitor to third capacitor 231 Block lifting cylinder S1~S3 First switch to third switch 232 Stop cylinder R1~R2 First resistor~Second resistor 233 Side thrust cylinder DETAILED DESCRIPTION

[0054] It should be understood that the specific embodiments described herein are only used to explain the present invention and are not intended to limit the present invention. In order to enable those skilled in the art to better understand the present application, the technical solutions in the embodiments of the present application will be clearly and completely described below in conjunction with the drawings in the embodiments of the present application. Obviously, the described embodiments are only embodiments of a part of the present application, not all embodiments. Based on the embodiments in the present application, all other embodiments obtained by ordinary technicians in the field without making creative work should fall within the scope of protection of the present application.

[0055] The present invention provides a device for testing equipment, referring to Figure 1 , Figure 1 : is a module structure diagram of the device testing device of the present invention, the device testing device comprises a processing module 100, a pipeline module 200 and an NFC detection module 300; the target device 400 is placed on the pipeline module 200, the processing module 100 is connected to the NFC detection module 300 and the target device 400 respectively, and the NFC detection module 300 is arranged opposite to the pipeline module 200; wherein:

[0056] The pipeline module 200 is used to drive the target device 400 to move. When the target device 400 moves to face the NFC detection module 300, it can perform NFC information transmission with the NFC detection module 300;

[0057] The NFC detection module 300 is used to perform NFC information transmission with the target device 400;

[0058] The processing module 100 is used to obtain test data generated when the target device 400 and the NFC detection module 300 perform NFC information transmission, and test the NFC module of the target device 400 according to the test data.

[0059] The target device 400 is a device that needs to be tested and is equipped with an NFC module. The target device 400 includes but is not limited to a mobile phone, a tablet or a wearable device such as a smart watch, a headset, a smart bracelet, etc.;

[0060] The NFC detection module 300 interacts with the target device 400 to exchange information related to the NFC module function, thereby obtaining test data reflecting the NFC function of the target device 400; it can be understood that based on the different items actually required to be tested, the NFC detection module 300 can be structurally configured accordingly to meet different types of test items.

[0061] The processing module 100 is provided with a test strategy for the NFC module of the target device 400. After acquiring the test data, the test strategy is used to determine whether the NFC function of the target device 400 corresponding to the test data is qualified. The specific test strategy can be set based on the actual test requirements; for example, the sub-strategies corresponding to all executable test items can be pre-stored. Before performing the test on the target device 400, the staff can select the items to be tested to generate a specific test strategy based on the sub-strategies corresponding to the selected test items.

[0062] The assembly line module 200 drives the target device 400 to move; it is understandable that the target device 400 is transferred between different workstations through the assembly line during the production and testing process. Generally, after arriving at a workstation, it is necessary to transfer to the workstation to perform related processes; in this embodiment, the assembly line module 200 is arranged relative to the NFC detection module 300. At the same time, when the target device 400 moves on the assembly line module 200, it can realize information transmission with the NFC detection module 300, so that the NFC module of the target device 400 can be tested; that is, in this embodiment, the target device 400 can directly complete the test of the target device 400 on the assembly line without transferring to the workstation, thereby reducing labor costs. At the same time, there is no need to set up other transfer devices, such as robotic arms, etc., saving equipment investment; at the same time, since the transfer step is omitted, the target device 400 can start testing after reaching the position relative to the NFC detection module 300, reducing the time required for testing and improving detection efficiency.

[0063] In this embodiment, by setting the NFC detection module 300 relative to the pipeline module 200, the target device 400 can directly test the NFC module on the pipeline without moving, thereby saving testing time; at the same time, setting the NFC detection module 300 and the processing module 100 can realize automatic testing of the NFC module, further reducing the dependence on manual labor and saving labor costs.

[0064] Further, see also Figure 2 , the NFC detection module 300 includes a signal generating unit and a signal listening unit; the signal generating unit and the signal listening unit are respectively arranged opposite to the pipeline module 200, and the signal generating unit and the signal listening unit are respectively connected to the processing module 100; wherein:

[0065] When the target device 400 moves to face the signal generating unit, it can perform NFC information transmission with the signal generating unit;

[0066] When the target device 400 moves to face the signal listening unit, it can perform NFC information transmission with the signal listening unit;

[0067] The signal generating unit is used to send a first test signal, so that the target device 400 generates first test data after receiving the first test signal;

[0068] The signal monitoring unit is used to detect the second test signal sent by the target device 400 to generate second test data;

[0069] The processing module 100 is used to test the NFC module of the target device 400 according to the first test data and the second test data.

[0070] It can be understood that the NFC module can realize the simulation card mode and the reading and writing card mode; the card simulation mode is to simulate the NFC of the target device 400 as an NFC card, passively respond to the signal of the external radio frequency field, and realize reading / writing; the reading and writing card mode is that the NFC of the target device 400 generates a radio frequency field, and actively sends a signal to the NFC card in the radio frequency field, so as to realize reading / writing of the NFC card.

[0071] In order to detect the analog card mode and the card reading and writing mode, a signal generating unit and a signal listening unit are provided in this embodiment.

[0072] The signal generating unit is set for the simulated card mode of the NFC module, the signal generating unit outputs a first test signal, the NFC module of the target device 400 receives the first test signal, and generates first test data based on the actual reception situation; and the processing module 100 implements the test of the simulated card mode of the NFC module according to the first test data.

[0073] The signal listening unit sets the card reading and writing mode of the NFC module, the NFC module of the target device 400 outputs a second test signal, the signal listening unit receives the second test signal, and generates second test data based on the actual reception situation; and the processing module 100 implements the test of the card reading and writing mode of the NFC module according to the second test data.

[0074] It should be noted that, in actual applications, the NFC module of the target device 400 may only support the analog card mode or the card reading and writing mode. Therefore, the signal generating unit or the signal listening unit may be correspondingly set based on actual needs.

[0075] Furthermore, the assembly line module 200 includes a conveyor belt unit, a device carrier 220 and a position control unit; the target device 400 is placed on the device carrier 220, the device carrier 220 is arranged on the conveyor belt unit, and the position control unit is arranged under the conveyor belt unit; wherein:

[0076] The conveyor belt unit is used to drive the equipment carrier 220 to move;

[0077] The position control unit is used to control the device carrier 220 to be in a transmission position when the device carrier 220 is opposite to the NFC detection module 300, wherein at the transmission position, the distance between the target device 400 and the NFC detection module 300 is less than a preset transmission distance.

[0078] The device carrier 220 is used to carry the target device 400; further, in order to facilitate the establishment of a connection between the target device 400 and the processing module 100, the device carrier 220 can be connected to the processing module 100. At the same time, a connecting device, such as a USB interface, electrical contacts, etc., is set on the device carrier 220, so that after the interface or contacts of the target device 400 are connected to the USB interface or electrical contacts on the device carrier 220, communication with the processing module 100 can be achieved.

[0079] The device carrier 220 is disposed on the conveyor belt unit. When the conveyor belt unit moves, the device carrier 220 moves along with the conveyor belt unit, thereby driving the target device 400 to move.

[0080] It can be understood that when the NFC detection module 300 and the target device 400 transmit information, it is necessary to ensure that the NFC detection module 300 and the NFC detection module 300 of the target device 400 are in an effective transmission posture and distance. Therefore, in this embodiment, a position control unit is provided so that after the target device 400 and the NFC detection module 300 are opposite to each other, the device carrier 220 is moved and maintained in the transmission position, so that the target device 400 and the NFC detection module 300 can realize information transmission at a position where the transmission distance is less than the preset transmission distance, and at the same time, the stability of the relative position relationship between the two can be guaranteed, thereby improving the test accuracy.

[0081] The transmission position is a position where the NFC detection module 300 and the target device 400 can perform stable information transmission; generally, the transmission position can be set based on the position of the coil in the actual NFC detection module 300 and the position of the coil in the NFC module of the target device 400. When the target device 400 is in the transmission position, the central axis of the coil of the NFC detection module 300 coincides with the central axis of the coil of the NFC module of the target device 400, and the center distance is less than the preset transmission distance; the specific value of the preset transmission distance can be set based on actual needs.

[0082] Furthermore, the number of the target devices 400 is multiple, and the signal generating unit includes a signal generating device 311 and multiple polling antennas 312; the signal generating device 311 is connected to each of the polling antennas 312, wherein:

[0083] When each of the target devices 400 is respectively at a transmission position corresponding to each of the polling antennas 312, the second distance is greater than a preset multiple of the first distance, wherein the first distance is a vertical distance between the polling antenna 312 and the NFC antenna of the target device 400, and the second distance is a distance between adjacent target devices 400;

[0084] The signal generating device 311 is used to generate a first test signal and broadcast the first test signal through the polling antenna 312 .

[0085] The signal generating device 311 is used to generate a first test signal; the signal generating device 311 can be an NFC protocol signal generator; specifically, when testing the analog card mode of the target device 400, the processing module 100 can send the instructions required for the test to the signal generating device 311, and after receiving the instructions, the signal generating device 311 generates a first test signal and sends the first test signal to the polling antenna 312; the polling antenna 312 is used to send the first test signal; specifically, the signal generating device 311 transmits a first test signal with a carrier frequency of 13.56 MHz through the polling antenna 312, and the NFC antenna coupling inside the target device 400 provides energy for the NFC module of the target device 400, and the NFC module of the target device 400 is activated to respond to the signal generating device 311; the signal generating device 311 respectively ... TypeA, TypeB, FeliCa, ISO15693 communication interface protocols select communication rates, such as 106kbps, 212kbps, 424kbps modulated carrier information polling target device 400, the NFC module of the target device 400 generates a subcarrier frequency Fc and performs ASK coding modulation response according to the corresponding protocol and communication rate; the RF consistency test of the NFC module in the analog card mode includes five aspects: transmission power, carrier frequency, waveform modulation, waveform quality, and no-load field strength; the protocol consistency test includes ASK modulation number, subcarrier modulation, communication distance test and communication quality, return loss, resonant frequency, quality factor Q, communication quality, communication distance, etc.; the specific tests of different detection items are described below:

[0086] RF conformance test:

[0087] Transmission power: The signal generating device 311 sends power to the polling antenna 312 to generate a stable radio frequency field without modulation. The signal generating device 311, as a polling device, performs carrier modulation and transmission through the polling antenna 312 based on a preset protocol. The preset protocol includes but is not limited to one or more of ISO / IEC14443TypeA, TypeB, FeliCa, and ISO15693 protocols. The output voltage range of the signal generating device 311 is 0 to 15V. The output transmission power can be adjusted by adjusting the output voltage of the signal generating device 311. The processing module 100 monitors the output voltage of the first end, that is, the transmitting end voltage of the polling antenna 312, and simultaneously obtains the transmitting end voltage of the antenna of the NFC module in the target device 400. The transmission power test can be completed by comparing the transmitting end voltage of the polling antenna 312 with the transmitting end voltage of the antenna of the NFC module.

[0088] Carrier frequency: The signal generating device 311 outputs a 13.56MHz sinusoidal unmodulated signal to the polling antenna 312. The processing module 100 has a built-in FPGA (Field Programmable Gate Array) frequency measurement module. The high-speed ADC samples the voltage signal to detect the J2 port pulse trigger, and continuously intercepts 400us of the unmodulated waveform to obtain the average frequency of the unmodulated waveform, and determines the standard frequency according to the average frequency. Further, the harmonic content of the carrier frequency is analyzed by Fourier transform to ensure that the carrier frequency meets the requirements. Specifically, the closer the carrier frequency is to the 13.56mHz center point frequency, the higher the quality. The NFC of the target device 400 responds to the polling antenna 312 and generates a subcarrier of 848kHz. The polling antenna 312 receives the response signal. The processing module 100 samples at high speed, demodulates the subcarrier information in the response signal, and determines whether the frequency of the subcarrier is within the range of 848kHz. If it is within the range of 848kHz, the carrier frequency is qualified.

[0089] Waveform modulation: The signal generating device 311 outputs an ASK carrier modulation signal through the polling antenna 312 based on a preset protocol. The phase of the ASK carrier modulation signal starts from 0 degrees and increases in steps of 10 degrees until 180 degrees. The processing module 100 continuously captures the modulation waveform received by the target device 400NFC for 40us, and performs all waveform analysis on the modulation waveform after filtering out the 13.56MHz carrier, so that the received signal envelope time meets the requirements; if the signal envelope is V, V1 is the initial value before modulation, V2=0.05V1, V3=0.6V1, V4=0.9V1; wherein, V4 drops to V2 as the falling edge of the envelope, and V2 rises to V4 as the rising edge of the envelope, the rising edge is kept below 400ns, and the falling edge is kept below 600ns. The quality of waveform modulation is measured by the envelope time, the amplitude and phase of the modulation waveform;

[0090] Waveform quality: The signal generator 311 outputs a 13.56MHz sinusoidal unmodulated signal to the polling antenna 312. The built-in FPGA frequency measurement module of the processing module 100 detects the pulse trigger of the processing module 100 and continuously captures 400us of the unmodulated waveform. The NFC standard requires that the carrier be a standard sine wave without burrs, harmonics or clutter. The processing module 100 uses Fourier transform to analyze the harmonic content of the carrier frequency of the unmodulated waveform and the distortion rate of the sine wave. The waveform quality is determined based on the harmonic content and the distortion rate of the sine wave. It can be understood that the smaller the distortion rate of the sine wave, the higher the waveform quality, and the lower the harmonic content, the higher the waveform quality;

[0091] No-load field strength: When the polling antenna 312 generates an unmodulated RF field, the ISO standard PICC coil is vertically placed 3 cm above the center of the polling antenna 312. The processing module 100 obtains a continuous 10us unmodulated waveform through edge-triggered sampling, measures the peak-to-peak value of the voltage of this unmodulated waveform, and divides the peak-to-peak value of the voltage by 0.9 to obtain the no-load field strength.

[0092] Protocol conformance testing:

[0093] ASK modulation number: The signal generating device 311 performs ASK modulation with different amplitudes for different preset protocols. Specifically, ISO / IEC14443TypeA corresponds to 100% ASK modulation, ISO / IEC14443TypeB corresponds to 10% ASK modulation, ISO15693 corresponds to 10% ASK modulation, and FeliCa corresponds to 8-30% ASK modulation; the processing module 100 continuously captures the modulation waveform received by the target device 400NFC for 40us, and performs all waveform analysis on the intercepted waveform, so as to The received signal envelope time meets the requirements; if the signal envelope is V, V5 is the initial value before modulation, V6=0.05V5, V7=0.5V5, V8=0.8V5, wherein V8 drops to V6 for the falling edge of the envelope, V6 rises to V8 for the rising edge of the envelope, the rising edge is kept below 400ns, and the falling edge is kept below 600ns; the processing module 100 filters the waveform and demodulates the ASK modulation number according to the decoding rules of the corresponding protocol, and determines whether the ASK modulation number meets the qualified conditions according to the amplitude, phase, time, frequency, etc. in the ASK modulation number;

[0094] Subcarrier modulation: The processing module 100 transmits a polling RF electromagnetic signal through the polling antenna 312. The NFC of the target device 400 responds to the polling antenna 312 and generates a subcarrier of 848 kHz. The polling antenna 312 receives a response signal. The processing module 100 demodulates the response signal and detects whether the subcarrier frequency meets the qualified conditions.

[0095] Communication distance and communication quality: Control the action of the blocking lifting cylinder 231 so that the distance between the antenna of the NFC module and the plane where the polling antenna 312 is located starts from 10 cm and decreases in steps of 0.5 cm until 1 cm to obtain multiple detection distances; for each detection distance, the processing unit determines the communication quality corresponding to the detection distance by detecting the transmission power, carrier frequency, waveform modulation, waveform quality, no-load field strength, waveform rising edge time, waveform falling edge time, time detection delay time, detection response time, etc. When the communication quality corresponding to all detection distances meets the quality requirements corresponding to the detection distance, the communication distance detection is qualified;

[0096] Return loss, quality factor, and resonant frequency test: The processing module 100 starts from a 12MHz carrier frequency and increases in steps of 10Hz until 16MHz to transmit unmodulated sine waves, obtain the coupled peak-to-peak voltage of the carrier received by the target device 400NFC, and record the frequency point corresponding to the maximum peak-to-peak voltage, that is, the resonant frequency point; the quality factor is:

[0097]

[0098] Where Z eq1 is the impedance at the resonance point, w is the peak-to-peak value measured and calculated, C t is the resonance point after the polling antenna 312 is coupled; since the inductance, capacitance and quality factor of the polling antenna 312 are fixed values, they can be measured in advance by an LCR digital bridge meter, so the return loss, quality factor, resonance frequency and frequency bandwidth of the target device 400NFC antenna less than -10dB at the resonance point can be calculated;

[0099] In the present embodiment, a plurality of polling antennas 312 are provided so that the analog card modes of a plurality of target devices 400 can be tested simultaneously, so as to improve the test efficiency. Meanwhile, in the present embodiment, a plurality of polling antennas 312 receive the first test signal output by the same signal generating device 311, so that the signals transmitted by the antennas are more consistent. Compared with the scheme of a plurality of signal generating devices 311, the same-frequency interference can be significantly reduced, and the investment in the test device equipment can be reduced.

[0100] It is understandable that when multiple target devices 400 are tested simultaneously, interference will occur between the target devices 400; relatively, the longer the distance, the smaller the mutual interference between the target devices 400. Therefore, in this embodiment, the first distance and the second distance are limited; specifically, according to the empirical formula of the near-field antenna test:

[0101]

[0102] Where R is the distance, l is the maximum physical size of the antenna, and λ is the electromagnetic wavelength (NFC carrier frequency is 13.56MHz). The antenna input impedance is:

[0103]

[0104] Among them, Zin is the input impedance, Vi is the signal voltage at the wireless input end, Ii is the signal current, Rin is the resistance component, Xin is the reactance component; the antenna radiation power Pr is:

[0105] Pr=k(Qcν) 2

[0106] Qcν=IL

[0107] Among them, k is the proportionality coefficient, I represents the time-varying current, L represents the antenna length, Qc represents the charge, and ν represents the charge acceleration; therefore, the antenna radiation power can be represented by the change of voltage and current; the antenna directivity coefficient D is:

[0108]

[0109] Among them, θ is the angle relative to the horizontal plane, β is the angle relative to the vertical plane; Pr is the average power radiated by the antenna, M is the radiation intensity, r is the distance, and the antenna quality factor Q is:

[0110]

[0111] The resonant frequency f is:

[0112]

[0113] Where, L is the antenna equivalent inductance, C is the equivalent capacitance;

[0114] By substituting the distance from the polling antenna 312 to the coil center of the NFC module of the target device 400, that is, the first distance L1, into the formula, it can be seen that when the second distance L2>2L1, the interference between adjacent antennas is relatively small, and the farther the adjacent target devices 400 are apart, the smaller the interference; therefore, the preset multiple can be set to 2 or a value greater than 2.

[0115] Furthermore, the number of the target devices 400 is multiple, and the signal listening unit includes a signal receiving device 321 and multiple listening antennas 322, and the signal receiving device 321 is connected to each of the listening antennas 322, wherein:

[0116] When each of the target devices 400 is respectively at a transmission position corresponding to each of the listening antennas 322, the fourth distance is greater than a preset multiple of the third distance, wherein the third distance is a vertical distance between the listening antenna 322 and the NFC antenna of the target device 400, and the fourth distance is a distance between adjacent target devices 400;

[0117] The signal receiving device 321 is used to obtain second test data obtained by the monitoring antenna 322 receiving the second test signal, and send the second test data to the processing module 100 .

[0118] The signal receiving device 321 is used to receive the second test data; the signal receiving device 321 can be an NFC protocol analyzer; specifically, when testing the card reading and writing mode of the target device 400, the processing module 100 can send the instructions required for the test to the target device 400, and after receiving the instructions, the target device 400 generates a second test signal, and sends the second test signal to the listening antenna 322 through the NFC module; the listening antenna 322 receives the second test signal, and obtains the second test data based on the actual received content, and sends the second test data to the signal receiving device 321; specifically, the target device 400 transmits the second test signal with a carrier frequency of 13.56 MHz through the NFC antenna; the target device 400 respectively ... TypeA, TypeB, FeliCa, ISO15693 communication interface protocols select communication rate, such as 106kbps, 212kbps, 424kbps modulated carrier information polling target device 400, listen to the NFC module to generate subcarrier frequency Fc and perform ASK coding modulation response in the corresponding protocol and communication rate; the RF consistency test of the NFC module in the analog card mode includes five aspects: transmission power, carrier frequency, waveform modulation, waveform quality, and no-load field strength; the protocol consistency test includes ASK modulation number, load modulation amplitude and phase, communication distance test and communication quality, return loss, resonant frequency, quality factor Q, communication quality, communication distance, working loan, etc.; the specific tests of different detection items are described below:

[0119] Antenna input amplitude: the peak-to-peak value of the voltage of the fourth monitoring signal of the processing module 100, which is the antenna input amplitude;

[0120] Load modulation: The NFC module of the target device 400 provides an unmodulated radio frequency field, and the processing module 100 monitors the load modulation signal received by the intercept antenna 322, measures the peak-to-peak value of the load modulation signal, and completes the load modulation test;

[0121] Transmission power: The NFC module of the target device 400 transmits power to generate a stable RF field without modulation at the listening antenna 322, and the listening antenna 322 is in the working domain; the processing module 100 uses edge triggering at the fourth end to capture a continuous 10us unmodulated waveform and measure the root mean square voltage of this waveform to determine the transmission power characteristics of the NFC module of the target device 400;

[0122] Carrier frequency: The NFC module of the target device 400 outputs a 13.56MHz sinusoidal unmodulated signal, and the listening antenna 322 responds to the signal. The built-in FPGA frequency measurement module of the processing module 100 detects the pulse trigger of the fourth terminal of the processing module 100, and continuously intercepts 400us of the unmodulated waveform to obtain the average frequency of the unmodulated waveform, and determines the standard frequency according to the average frequency. Further, the harmonic content of the carrier frequency is analyzed by Fourier transform to make the carrier frequency meet the requirements. Specifically, the closer the carrier frequency is to the center point frequency of 13.56mHz, the higher the quality.

[0123] Waveform modulation: The listening antenna 322 detects the modulated signal emitted by the NFC antenna, and the processing module 100 continuously captures the modulated waveform of 20us, and performs all waveform analysis on the intercepted waveform to ensure that the received signal envelope time meets the requirements; for example, the signal envelope is V, V9 is the initial value before modulation, V10 = 0.05V9, V11 = 0.6V9, V12 = 0.9V9; wherein, V12 drops to V10 for the falling edge of the envelope, and V10 rises to V12 for the rising edge of the envelope, the rising edge is kept below 400ns, and the falling edge is kept below 600ns. The quality of waveform modulation is measured by the envelope time and the amplitude of the modulated waveform;

[0124] Waveform quality: The NFC module of the target device 400 outputs a 13.56MHz sine wave unmodulated signal, and the listening antenna 322 responds to the signal. The built-in FPGA frequency measurement module of the processing module 100 detects the pulse trigger of the fourth terminal of the processing module 100, and continuously intercepts 400us of the unmodulated waveform. The NFC standard requires that the carrier wave is a standard sine wave without burrs, harmonics or clutter. The processing module 100 uses Fourier transform to analyze the harmonic content of the carrier frequency of the unmodulated waveform and the distortion rate of the sine wave, and determines the waveform quality according to the harmonic content and the distortion rate of the sine wave. It can be understood that the smaller the distortion rate of the sine wave, the higher the waveform quality, and the lower the harmonic content, the higher the waveform quality;

[0125] No-load field strength: When the NFC antenna generates an unmodulated RF field, the ISO standard PICC coil is placed vertically 3 cm above the center of the listening antenna 322. The processing module 100 obtains a continuous 10us unmodulated waveform through edge-triggered sampling, measures the peak-to-peak value of the voltage of this unmodulated waveform, and divides the peak-to-peak value of the voltage by 0.9 to obtain the no-load field strength.

[0126] Return loss, quality factor, and resonant frequency test: The NFC module of the target device 400 starts from a 12MHz carrier frequency and increases in steps of 10Hz until 16MHz to transmit unmodulated sine waves. The processing module 100 obtains the coupled peak-to-peak voltage of the carrier received by the listening antenna 322 and records the frequency point corresponding to the maximum peak-to-peak voltage, that is, the resonant frequency point; the quality factor is:

[0127]

[0128] Communication distance: Control the action of the cylinder 380 corresponding to the Y direction so that the distance between the NFC antenna and the plane where the interrogation antenna is located starts from 4 cm and decreases in steps of 0.5 cm until 1 cm to obtain multiple detection distances; for each detection distance, the processing module 100 determines the communication quality corresponding to the detection distance by detecting transmission power, carrier frequency, waveform modulation, waveform quality, no-load field strength, waveform rising edge time, waveform falling edge time, time detection delay time, detection response time, etc. When the communication qualities corresponding to all detection distances meet the quality requirements corresponding to the detection distance, the communication distance detection is qualified.

[0129] In the present embodiment, a plurality of listening antennas 322 are provided so that the card reading and writing modes of a plurality of target devices 400 can be tested simultaneously to improve the test efficiency. At the same time, in the present embodiment, a plurality of listening antennas 322 output a second test signal to the same signal receiving device 321, so that the consistency between the received signals is better. Compared with the scheme of a plurality of signal receiving devices 321, the same-frequency interference can be significantly reduced, while reducing the investment in the test device equipment.

[0130] The third distance and the fourth distance can be set similarly to the first distance and the second distance, and will not be described in detail.

[0131] It is understandable that the antenna impedance of the NFC module of different target devices 400 is different, and when testing, an antenna that matches the antenna impedance of the NFC module needs to be used for testing; therefore, a tuning circuit can be set between the signal generating device 311 and the polling antenna 312, and between the signal receiving device 321 and the listening antenna 322; take the signal generating device 311 as an example; see Figure 3The tuning circuit includes a first switch S1, a second switch S2, a third switch S3, a first capacitor C1, a second capacitor C2, a third capacitor C3, a first resistor R1 and a second resistor R2; wherein, a first end of the signal generating device 311 is connected to a first end of the first capacitor C1, a second end of the first capacitor C1 is connected to a second end of the signal generating device 311 through the first switch S1 and the second capacitor C2 in sequence, a second end of the first capacitor C1 is also connected to a second end of the signal generating device 311 through the second switch S2 and the first resistor R1 in sequence, a second end of the first capacitor C1 is also connected to a first end of the second resistor R2, a second end of the second resistor R2 is connected to a first end of the polling antenna 312, and a second end of the polling antenna 312 is connected to a second end of the signal generating device 311; the third capacitor C3 is connected in parallel to the polling antenna 312, and the third switch S3 is connected in parallel to the second resistor R2.

[0132] Among them, R L is the equivalent resistance of the antenna, C L is the equivalent capacitance of the antenna, L L is the equivalent inductance of the antenna.

[0133] When setting the tuning circuit, the signal receiving device 321 and the listening antenna 322 may adopt the same structure as above, replacing the signal generating device 311 with the signal receiving device 321 , and replacing the polling antenna 312 with the listening antenna 322 .

[0134] Poynting's theorem explains the law of conservation of energy in the electromagnetic field. In an isotropic linear medium, the direction of the energy density of the electric and magnetic fields represents the direction of electromagnetic energy transmission. The magnitude of the energy density represents the electromagnetic energy flowing through a unit area perpendicular to it per unit time. The energy density is expressed as:

[0135] S=E x H

[0136] Among them, S is the Poynting vector, E is the electric field intensity, and H is the magnetic field intensity. According to the properties of the right-handed system formed by the electric field intensity, magnetic field intensity and propagation direction of the electromagnetic wave, it can be judged that the energy density S of the electromagnetic wave is always along the propagation direction of the electromagnetic wave, that is, the energy propagation is forward.

[0137] The mutual inductance M between the polling antenna 312 and the antenna of the NFC module of the target device 400 is:

[0138]

[0139] Where R1 is the antenna radius of the reader, R2 is the antenna radius of the transponder, N1 is the number of antenna circles of the reader, N2 is the number of antenna circles of the transponder, and X represents the center distance of the antenna;

[0140] According to Faraday's law of electromagnetic induction and Maxwell's equations, the voltage U2 of the input chip can be obtained as:

[0141]

[0142] Among them, R2 can be regarded as the internal resistance of the transponder antenna, which is usually small, and RL is the input resistance of the transponder chip, which is usually large. In order to improve the coupling efficiency and enable the chip to work stably, a resonant capacitor needs to be added to the antenna end of the transponder. When the circuit is in a resonant state, the voltage U2 input to the chip is:

[0143]

[0144] The polling antenna 312 and the listening antenna 322 may adopt the PICC standard antenna recommended by the NFC Forum standard, and the tuning circuit is matched with the impedance of the NFC antenna of the watch to be tested by controlling the first switch S1, the second switch S2, and the third switch S3.

[0145] It is understandable that when the device test device operates in PCD mode, the frequency of the carrier wave will be affected by the NFC of the target device 400, while in PICC mode, when communicating with the polling antenna 312, the carrier wave frequency for signal modulation needs to be completely determined by the radio frequency frequency of the electromagnetic field of the polling antenna 312. If the device test device operates in PICC mode, it is necessary to demodulate the signal sent from the polling antenna 312 and modulate the signal when responding.

[0146] The clock required for demodulation by the listening antenna 322 must maintain the same frequency as the radio frequency signal of the alternating electromagnetic field; when the listening antenna 322 modulates the signal, it needs to respond to the polling and other instructions of the NFC of the target device 400. At this time, the carrier frequency of the device in PICC mode performing data modulation by the listening antenna 322 is also determined according to the carrier frequency of the NFC of the target device 400, that is, the same frequency is used to modulate the signal; the clock source driving the listening antenna 322 to work is completely a clock of the same frequency extracted from the radio frequency signal of the NFC of the target device 400; considering that the signal on the NFC radio frequency antenna of the target device 400 is not continuous when the listening antenna 322 is modulating and demodulating, it is necessary to obtain a clock at a fixed frequency when there is no alternating electromagnetic field on the antenna. This fixed frequency value is the frequency of the signal before the alternating electromagnetic field disappears. It can be seen that during the Pause period of the TypeA signal, there is no radio frequency signal on the NFC antenna or the radio frequency signal is extremely weak.

[0147] In order to extract the same-frequency signal and maintain the same-frequency signal when the field disappears, this embodiment adopts a solution that combines the function modules of the NFC protocol signal generator and the NC protocol analyzer for frequency measurement and regeneration of the same-frequency signal and the hardware circuit. The main functions of the hardware circuit are to amplify and limit the signal taken from the NFC antenna; the main functions of the NFC protocol signal generator and the NFC protocol analyzer are to lock the frequency according to the signal obtained from the hardware and continue to generate the original frequency signal when the alternating electromagnetic field disappears.

[0148] Furthermore, the position control unit includes a blocking lifting cylinder 231; wherein:

[0149] The blocking lifting cylinder 231 is used to drive the device carrier 220 to move in a direction relative to the NFC detection module 300 .

[0150] When the target device 400 is transferred to a position relative to the NFC detection module 300, the device carrier 220 is lifted from the conveyor belt by blocking the lifting cylinder 231, which can reduce the impact of conveyor belt vibration on the test results on the one hand, and keep the target device 400 in the transfer position on the other hand; when the test of the target device 400 is completed, the blocking lifting cylinder 231 descends, and the device carrier 220 returns to the conveyor belt for movement.

[0151] When setting the blocking lifting cylinder 231 , a blocking lifting cylinder 231 is set for each polling antenna 312 and listening antenna 322 ; each blocking lifting cylinder 231 lifts the target device 400 to the transmission position of the corresponding polling antenna 312 when rising.

[0152] If a simulated card test is performed first and then a card reading and writing test is performed, the processing module 100 establishes a communication connection with the target device 400 through the device carrier 220 after receiving the test command, and reads relevant information of the target device 400, such as the serial number, software version, operating system version, hardware version, etc. After ensuring that the version is correct, the processing module 100 sends a command to the target device 400 to put the watch to be tested in a simulated card state; when the target device 400 is transmitted to a position relative to the polling antenna 312, the device carrier 220 is lifted up from the conveyor belt by the blocking lifting cylinder 231 corresponding to the polling antenna 312, and a simulated card test is performed; after the simulated card test is completed, the blocking lifting cylinder 231 descends, and the processing module 100 sends a command to the target device 400 to put the watch to be tested in a card reading and writing state, and then the carrier returns to the conveyor belt to move, and when it moves to a position relative to the listening antenna 322, the device carrier 220 is lifted up from the conveyor belt by the blocking lifting cylinder 231 corresponding to the listening antenna 322, and a card reading and writing test is performed; after the card reading and writing test is completed, the blocking lifting cylinder 231 descends, and the device carrier 220 returns to the conveyor belt; then it can flow into the next workstation. In this embodiment, target devices 400 from different batches can perform analog card testing and reader / writer testing respectively at the same time; and target devices 400 from the same batch can perform analog card testing or reader / writer testing at the same time; this avoids the situation in which the reader / writer mode is in an idle waiting state during analog card testing and the analog card mode is in an idle state during reader / writer testing, thereby greatly improving the test efficiency.

[0153] It should be noted that each device in the pipeline module 200 can be controlled by setting a processing device and linked with the processing module 100, so that each device performs corresponding operations during the test process of the target device 400; the specific control method can be set based on actual needs.

[0154] Further, the conveyor belt unit includes a main conveyor belt 211, a defective conveyor belt 212 and a driving device 213; the main conveyor belt 211 and the defective conveyor belt 212 are respectively connected to the driving device 213; the assembly line module 200 also includes a blocking cylinder 232 and a side push cylinder 233, the blocking cylinder 232 is arranged under the main conveyor belt 211 and before the NFC detection module 300, and the side push cylinder 233 is arranged under the main conveyor belt 211 and corresponds to the NFC detection module 300; wherein:

[0155] The driving device 213 is used to drive the main conveyor belt 211 and the defective conveyor belt 212 to transmit;

[0156] The blocking cylinder 232 is used to prevent a new target device 400 from flowing to the transmission position when the NFC module of the target device 400 is tested;

[0157] The side push cylinder 233 is used to push the target device 400 into the defective product conveyor belt 212 when it is determined that the target device 400 is unqualified.

[0158] The main conveyor belt 211 serves as an inflow device for the target device 400, and the target device 400 directly performs the NFC module test on the main conveyor belt 211, so that when there is a target device 400 being tested, the subsequent newly-inflow target device 400 will affect the target device 400 being tested. Therefore, in this embodiment, a blocking cylinder 232 is provided, and when there is a target device 400 being tested, the blocking cylinder 232 rises, driving the blocking block to rise, thereby blocking the new target device 400 on the main conveyor belt 211 from flowing in; it can be understood that the inflow direction is the direction of the NFC detection module 300, and the blocking cylinder 232 is provided before the NFC detection module 300, therefore, when the blocking cylinder 232 rises, the newly-inflow target device 400 is blocked before the NFC detection module 300, thereby not affecting the target device 400 being tested.

[0159] The main conveyor belt 211 serves as the main conveyor belt when the target device 400 is subjected to the NFC module test, and connects the front and rear workstations. It is understandable that when the NFC module test result is qualified, it can flow into the next workstation, and when the NFC module test result is unqualified, it needs to be retested, scrapped or other operations for unqualified products are required. Therefore, in this embodiment, a defective conveyor belt 212 is provided to realize automatic diversion of qualified and unqualified target devices 400, and the qualified target device 400 is transmitted to the next workstation through the main conveyor belt 211, and the unqualified target device 400 is transmitted to the unqualified workstation through the defective conveyor belt 212.

[0160] In order to achieve the transfer of the position of the target device 400 from the main conveyor belt 211 to the defective conveyor belt 212, a side push cylinder 233 is provided in this embodiment; when the test result of the target device 400 is unqualified, the side push cylinder 233 is controlled to operate to push the target device 400 from the main conveyor belt 211 to the defective conveyor belt 212.

[0161] When setting the side-push cylinder 233, a side-push cylinder 233 is set for each polling antenna 312 and listening antenna 322 respectively; when the target device 400 fails the analog card test or the read-write card test, the side-push cylinder 233 at the corresponding position is controlled to push the target device 400 to the defective conveyor belt 212.

[0162] The conveyor unit may further include a display screen 214 , which is connected to the driving device 213 and is used to display relevant information of the test and control the driving device 213 .

[0163] The present invention also provides a device testing method, which is applied to the device testing apparatus as described above; the device testing method is applied to the device testing apparatus as described above; wherein:

[0164] Step S10, determining the position of the target device on the pipeline module;

[0165] Step S20, when the target device moves to face the NFC detection module, controlling the target device to transmit NFC information with the NFC detection module to obtain test data;

[0166] Step S30: testing the NFC module of the target device according to the test data.

[0167] The position of the target device on the pipeline module can be detected by setting a corresponding detection device, such as a sensor, visual detection, etc.

[0168] The target device is a device that needs to be tested and is equipped with an NFC module. The target device includes but is not limited to mobile phones, tablets, or wearable devices such as smart watches, headphones, and smart bracelets;

[0169] The NFC detection module exchanges information related to the NFC module function with the target device, thereby obtaining test data reflecting the NFC function of the target device; it is understandable that based on the different items actually required to be tested, the NFC detection module can be structurally configured accordingly to meet different types of test items.

[0170] The processing module is set with a test strategy for the NFC module of the target device. After obtaining the test data, the test strategy is used to determine whether the NFC function of the target device corresponding to the test data is qualified. The specific test strategy can be set based on the actual test requirements; for example, the sub-strategies corresponding to all executable test items can be pre-stored. Before performing the test on the target device, the staff can select the items to be tested to generate a specific test strategy based on the sub-strategies corresponding to the selected test items.

[0171] The assembly line module drives the target device to move; it is understandable that the target device is transferred between different workstations through the assembly line during the production and testing process. Generally, after arriving at a workstation, it needs to be transferred to that workstation to perform related processes; in this embodiment, the assembly line module is arranged relative to the NFC detection module. At the same time, when the target device moves on the assembly line module, it can realize information transmission with the NFC detection module, and therefore, the NFC module of the target device can be tested; that is, in this embodiment, the target device can directly complete the test of the target device on the assembly line without transferring to the workstation, thereby reducing labor costs. At the same time, there is no need to set up other transfer devices, such as robotic arms, etc., saving equipment investment; at the same time, since the transfer step is omitted, the target device can start testing after reaching the position relative to the NFC detection module, which reduces the time required for testing and improves detection efficiency.

[0172] In this embodiment, an NFC detection module is arranged relative to the pipeline module, so that the target device can directly test the NFC module on the pipeline without moving, thereby saving testing time; at the same time, the arrangement of the NFC detection module and the processing module can realize automatic testing of the NFC module, further reducing the dependence on manual labor and saving labor costs.

[0173] Furthermore, the NFC detection module includes a signal generating unit and a signal listening unit; when the target device moves to be opposite to the NFC detection module, the target device and the NFC detection module are controlled to perform NFC information transmission, and the test data obtained includes:

[0174] When the target device moves to be opposite to the signal generating unit, setting the target device to a simulated card mode;

[0175] Controlling the signal generating unit to send a first test signal to obtain first test data obtained by the target device receiving the first test signal;

[0176] When the target device moves to be opposite to the signal listening unit, setting the target device to a card reading and writing mode;

[0177] Controlling the target device to send a second test signal to obtain second test data obtained by the signal listening unit receiving the second test signal;

[0178] The NFC module of the target device is tested according to the first test data and the second test data.

[0179] It can be understood that the NFC module can realize the card simulation mode and the card reading and writing mode; the card simulation mode is to simulate the NFC of the target device as an NFC card, passively respond to the signal of the external RF field, and realize reading / writing; the card reading and writing mode is that the NFC of the target device generates a RF field, and actively sends signals to the NFC card in the RF field, to realize reading / writing of the NFC card.

[0180] In order to detect the analog card mode and the card reading and writing mode, a signal generating unit and a signal listening unit are provided in this embodiment.

[0181] The signal generating unit is set for the simulated card mode of the NFC module, the signal generating unit outputs a first test signal, the NFC module of the target device receives the first test signal, and generates first test data based on the actual receiving situation; and the processing module implements the test of the simulated card mode of the NFC module according to the first test data.

[0182] The signal listening unit sets the card reading and writing mode of the NFC module, the NFC module of the target device outputs a second test signal, the signal listening unit receives the second test signal, and generates second test data based on the actual reception situation; and the processing module implements the test of the card reading and writing mode of the NFC module according to the second test data.

[0183] It should be noted that, in actual applications, the NFC module of the target device may only support the simulated card mode or the card reader / writer mode. Therefore, the test for the simulated card mode or the card reader / writer mode may be set accordingly based on actual needs.

[0184] Further, after testing the NFC module of the target device according to the test data, the method further comprises:

[0185] Obtaining a test result of the NFC module of the target device;

[0186] Determine whether the target device is unqualified according to the test result;

[0187] If the target device is unqualified, the side push cylinder is controlled to push the target device into the defective product conveyor belt.

[0188] The main conveyor belt serves as the main conveyor belt when the target device is subjected to NFC module testing, and connects the front and rear workstations. It is understandable that when the NFC module test result is qualified, it can flow into the next workstation, and when the NFC module test result is unqualified, it needs to be retested, scrapped or other operations are performed on unqualified products. Therefore, in this embodiment, a defective conveyor belt is provided to realize automatic diversion of qualified and unqualified target devices, and the qualified target device is transmitted to the next workstation through the main conveyor belt, and the unqualified target device is transmitted to the unqualified workstation through the defective conveyor belt.

[0189] In order to achieve the transfer of the position of the target device from the main conveyor belt to the defective conveyor belt, a side push cylinder is provided in this embodiment; when the test result of the target device is unqualified, the side push cylinder is controlled to move to push the target device from the main conveyor belt to the defective conveyor belt.

[0190] When setting the side-thrust cylinder, a side-thrust cylinder is set for each polling antenna and listening antenna respectively; when the target device fails the simulation card test or the read-write card test, the side-thrust cylinder at the corresponding position is controlled to push the target device to the defective product conveyor belt.

[0191] Reference Figure 4 In terms of hardware structure, the electronic device may include components such as a communication module 10, a memory 20, and a processor 30. In the electronic device, the processor 30 is connected to the memory 20 and the communication module 10 respectively, and a computer program is stored in the memory 20. The computer program is executed by the processor 30 at the same time, and the steps of the above method embodiment are implemented when the computer program is executed.

[0192] The communication module 10 can be connected to an external communication device through a network. The communication module 10 can receive requests from an external communication device, and can also send requests, instructions and information to the external communication device, which can be other electronic devices, servers or Internet of Things devices, such as televisions, etc.

[0193] The memory 20 can be used to store software programs and various data. The memory 20 can mainly include a program storage area and a data storage area, wherein the program storage area can store an operating system, at least one application required for a function (such as determining the location of a target device on a pipeline module), etc.; the data storage area can include a database, and the data storage area can store data or information created according to the use of the system, etc. In addition, the memory 20 can include a high-speed random access memory, and can also include a non-volatile memory, such as at least one disk storage device, a flash memory device, or other volatile solid-state storage devices.

[0194] The processor 30 is the control center of the electronic device. It uses various interfaces and lines to connect various parts of the entire electronic device. It executes various functions of the electronic device and processes data by running or executing software programs and / or modules stored in the memory 20, and calling data stored in the memory 20, so as to monitor the electronic device as a whole. The processor 30 may include one or more processing units; optionally, the processor 30 may integrate an application processor and a modem processor, wherein the application processor mainly processes the operating system, user interface, and application programs, and the modem processor mainly processes wireless communications. It is understandable that the above-mentioned modem processor may not be integrated into the processor 30.

[0195] although Figure 4 Although not shown, the electronic device may further include a circuit control module, which is used to connect to a power source to ensure the normal operation of other components. Figure 4 The electronic device structure shown in the figure does not constitute a limitation of the electronic device, and may include more or less components than shown in the figure, or combine certain components, or arrange the components differently.

[0196] The present invention also provides a computer-readable storage medium on which a computer program is stored. The computer-readable storage medium may be Figure 4 The memory 20 in the electronic device may also be at least one of a ROM (Read-Only Memory) / RAM (Random Access Memory), a magnetic disk, and an optical disk. The computer-readable storage medium includes a number of instructions for enabling a terminal device with a processor (which may be a television, a car, a mobile phone, a computer, a server, a terminal, or a network device, etc.) to execute the methods described in the various embodiments of the present invention.

[0197] In the present invention, the terms "first", "second", "third", "fourth" and "fifth" are used for descriptive purposes only and are not to be understood as indicating or implying relative importance. For ordinary technicians in this field, the specific meanings of the above terms in the present invention can be understood according to specific circumstances.

[0198] In the description of this specification, the description with reference to the terms "one embodiment", "some embodiments", "example", "specific example", or "some examples" etc. means that the specific features, structures, materials or characteristics described in conjunction with the embodiment or example are included in at least one embodiment or example of the present invention. In this specification, the schematic representations of the above terms do not necessarily refer to the same embodiment or example. Moreover, the specific features, structures, materials or characteristics described may be combined in any one or more embodiments or examples in a suitable manner. In addition, those skilled in the art may combine and combine the different embodiments or examples described in this specification and the features of the different embodiments or examples, without contradiction.

[0199] Although the embodiments of the present invention have been shown and described above, the scope of protection of the present invention is not limited thereto. It is understood that the above embodiments are exemplary and cannot be understood as limiting the present invention. A person of ordinary skill in the art can change, modify and replace the above embodiments within the scope of the present invention, and these changes, modifications and replacements should be included in the scope of protection of the present invention. Therefore, the scope of protection of the present invention shall be subject to the scope of protection of the claims.

Claims

1. A device testing apparatus, characterized in that: The device testing apparatus comprises a processing module, a pipeline module and an NFC detection module; the target device is placed on the pipeline module, the processing module is connected to the NFC detection module and the target device respectively, and the NFC detection module is arranged opposite to the pipeline module; wherein: The pipeline module is used to drive the target device to move, and when the target device moves to face the NFC detection module, it can perform NFC information transmission with the NFC detection module; The NFC detection module is used to perform NFC information transmission with the target device; The processing module is used to obtain test data generated when the target device and the NFC detection module perform NFC information transmission, and test the NFC module of the target device according to the test data.

2. The device testing apparatus according to claim 1, characterized in that: The NFC detection module includes a signal generating unit and a signal listening unit; the signal generating unit and the signal listening unit are respectively arranged opposite to the pipeline module, and the signal generating unit and the signal listening unit are respectively connected to the processing module; wherein: When the target device moves to face the signal generating unit, the target device can perform NFC information transmission with the signal generating unit; When the target device moves to face the signal listening unit, the target device can perform NFC information transmission with the signal listening unit; The signal generating unit is used to send a first test signal so that the target device generates first test data after receiving the first test signal; The signal monitoring unit is used to detect the second test signal sent by the target device to generate second test data; The processing module is used to test the NFC module of the target device according to the first test data and the second test data.

3. The device testing apparatus according to claim 1, characterized in that: The assembly line module includes a conveyor belt unit, a device carrier and a position control unit; the target device is placed on the device carrier, the device carrier is arranged on the conveyor belt unit, and the position control unit is arranged under the conveyor belt unit; wherein: The conveyor belt unit is used to drive the equipment carrier to move; The position control unit is used to control the device carrier to be in a transmission position when the device carrier is opposite to the NFC detection module, wherein, at the transmission position, the distance between the target device and the NFC detection module is less than a preset transmission distance.

4. The equipment testing device according to claim 2 or 3, characterized in that: The number of the target devices is multiple, and the signal generating unit includes a signal generating device and multiple polling antennas; the signal generating device is connected to each of the polling antennas, wherein: When each of the target devices is respectively at a transmission position corresponding to each of the polling antennas, the second distance is greater than a preset multiple of the first distance, wherein the first distance is a vertical distance between the polling antenna and the NFC antenna of the target device, and the second distance is a distance between adjacent target devices; The signal generating device is used to generate a first test signal and broadcast the first test signal through the polling antenna.

5. The equipment testing device according to claim 2 or 3, characterized in that: The number of the target devices is multiple, and the signal listening unit includes a signal receiving device and multiple listening antennas, and the signal receiving device is connected to each of the listening antennas, wherein: When each of the target devices is respectively at a transmission position corresponding to each of the listening antennas, the fourth distance is greater than a preset multiple of the third distance, wherein the third distance is a vertical distance between the listening antenna and the NFC antenna of the target device, and the fourth distance is a distance between adjacent target devices; The signal receiving device is used to obtain second test data obtained by the monitoring antenna receiving the second test signal, and send the second test data to the processing module.

6. The device testing apparatus according to claim 3, characterized in that: The position control unit includes a blocking lifting cylinder; wherein: The blocking lifting cylinder is used to drive the equipment carrier to move in a direction relative to the NFC detection module.

7. The device testing apparatus according to claim 3, characterized in that: The conveyor belt unit includes a main conveyor belt, a defective conveyor belt and a driving device; the main conveyor belt and the defective conveyor belt are respectively connected to the driving device; the assembly line module also includes a blocking cylinder and a side thrust cylinder, the blocking cylinder is arranged under the main conveyor belt and in front of the NFC detection module, and the side thrust cylinder is arranged under the main conveyor belt and corresponding to the NFC detection module; wherein: The driving device is used to drive the main transmission belt and the defective transmission belt; The blocking cylinder is used to prevent a new target device from flowing to the transmission position when the NFC module of the target device is tested; The side push cylinder is used to push the target device into the defective product conveyor belt when it is determined that the target device is unqualified.

8. A device testing method, characterized in that: The device testing method is applied to the device testing apparatus as described in any one of claims 1 to 7; wherein: Determine the location of the target device on the pipeline module; When the target device moves to face the NFC detection module, controlling the target device to transmit NFC information with the NFC detection module to obtain test data; The NFC module of the target device is tested according to the test data.

9. The device testing method according to claim 8, characterized in that: The NFC detection module includes a signal generating unit and a signal listening unit; when the target device moves to be opposite to the NFC detection module, the target device is controlled to transmit NFC information with the NFC detection module, and the test data obtained includes: When the target device moves to be opposite to the signal generating unit, setting the target device to a simulated card mode; Controlling the signal generating unit to send a first test signal to obtain first test data obtained by the target device receiving the first test signal; When the target device moves to be opposite to the signal listening unit, setting the target device to a card reading and writing mode; Controlling the target device to send a second test signal to obtain second test data obtained by the signal listening unit receiving the second test signal; The NFC module of the target device is tested according to the first test data and the second test data.

10. The device testing method according to claim 8, characterized in that: After testing the NFC module of the target device according to the test data, the following steps are included: Obtaining a test result of the NFC module of the target device; Determine whether the target device is unqualified according to the test result; If the target device is unqualified, the side push cylinder is controlled to push the target device into the defective product conveyor belt.

11. An electronic device, characterized in that: The electronic device comprises a memory, a processor and a computer program stored in the memory and executable on the processor, wherein the computer program implements the steps of the device testing method according to any one of claims 8 to 10 when executed by the processor.

12. A computer-readable storage medium, characterized in that: The computer-readable storage medium stores a computer program, and when the computer program is executed by a processor, the steps of the device testing method according to any one of claims 8 to 10 are implemented.

Images