Parameter optimization method and device for eddy current displacement sensor probe

By establishing a three-dimensional probe simulation model and performing scanning simulation, the optimal parameters of the eddy current displacement sensor probe are determined, which solves the problem of poor detection accuracy in traditional designs and achieves higher sensitivity and linearity.

CN120145677AActive Publication Date: 2025-06-13BEIJING INST OF CONTROL ENG
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Patent Information

Application Number
CN202510236381.1
Authority / Receiving Office
CN · China
Patent Type
Applications(China)
Current Assignee / Owner
Filing Date
2025-02-28
Publication Date
2025-06-13
Estimated Expiration
2045-02-28

AI Technical Summary

Technical Problem

The parameter design of traditional eddy current displacement sensor probes has the problem of poor detection accuracy and cannot guarantee the optimal design.

Method used

By establishing a three-dimensional probe simulation model detected by the eddy current displacement sensor, setting one of the coil parameters as a variable, performing scanning simulation to obtain the response curve group, and determining the optimal parameters of the probe based on this.

Benefits of technology

The sensitivity and linearity of the probe are improved, thereby improving the detection accuracy of the eddy current displacement sensor.

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Abstract

The invention provides a parameter optimization method and device for an eddy current displacement sensor probe, and the method comprises the steps: obtaining coil parameters of the eddy current displacement sensor probe; according to the coil parameters, establishing a three-dimensional probe simulation model detected by the eddy current displacement sensor; setting one coil parameter in the three-dimensional probe simulation model as a variable, and performing scanning simulation on the measured surface to obtain a response curve cluster of the coil parameter and the displacement change of the measured surface; and determining optimal parameters of the eddy current displacement sensor probe based on the response curve group. According to the scheme, high test precision of the probe can be ensured.
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Description

Technical Field

[0001] The embodiments of the present invention relate to the technical field of non-destructive testing, and particularly to a method and device for optimizing parameters of an eddy current displacement sensor probe. Background Art

[0002] As a non-destructive and non-contact detection device, the eddy current sensor has the advantages of high sensitivity, strong anti-interference ability, being unaffected by the medium, and simple structure. In the development process of the eddy current displacement sensor for the "Three Supers" platform, the design of the probe is particularly important, which not only includes the design of the probe structure, but more importantly, the design method of the probe coil structure parameters. The probe coil is an important part of the eddy current sensor, and its geometric dimensions are closely related to the sensitivity, linearity, and measurement range of the sensor, which is the key link in the research and development of the entire eddy current sensor.

[0003] In the related art, in the design of the probe coil parameters, the empirical formula design method commonly used in domestic literature is mostly followed. However, the probe designed by this method has the phenomena of approximation and posterior design, and there are still problems of poor detection accuracy and cannot guarantee the optimal design.

[0004] Therefore, based on the above problems, there is an urgent need to provide a method and device for optimizing parameters of an eddy current displacement sensor probe. Summary of the Invention

[0005] In order to solve the problem of poor detection accuracy in the design of traditional eddy current displacement sensor probe parameters, the embodiments of the present invention provide a method and device for optimizing parameters of an eddy current displacement sensor probe.

[0006] In a first aspect, the embodiments of the present invention provide a method for optimizing parameters of an eddy current displacement sensor probe, including:

[0007] Obtaining the coil parameters of the eddy current displacement sensor probe;

[0008] According to the coil parameters, establishing a three-dimensional probe simulation model for the detection of the eddy current displacement sensor;

[0009] Setting one of the coil parameters in the three-dimensional probe simulation model as a variable, and respectively performing scanning simulations on the measured surface to obtain a response curve family of the coil parameter and the displacement change of the measured surface;

[0010] Based on the response curve family, determining the optimal parameters of the eddy current displacement sensor probe.

[0011] In a second aspect, the embodiments of the present invention further provide a device for optimizing probe parameters of an eddy current displacement sensor, and the device includes:

[0012] An acquisition unit, configured to acquire the coil parameters of the probe of the eddy current displacement sensor;

[0013] A model construction unit, configured to establish a three-dimensional probe simulation model for detection by the eddy current displacement sensor according to the coil parameters;

[0014] A simulation unit, configured to set one of the coil parameters in the three-dimensional probe simulation model as a variable, and respectively perform scanning simulations on the measured surface to obtain a response curve family of the coil parameter and the displacement change of the measured surface;

[0015] A determination unit, configured to determine the optimal parameters of the probe of the eddy current displacement sensor based on the response curve family.

[0016] In a third aspect, an embodiment of the present invention further provides a computing device, including a memory and a processor. A computer program is stored in the memory. When the processor executes the computer program, the method described in any embodiment of this specification is implemented.

[0017] In a fourth aspect, an embodiment of the present invention further provides a computer-readable storage medium, on which a computer program is stored. When the computer program is executed on a computer, the computer is made to execute the method described in any embodiment of this specification.

[0018] An embodiment of the present invention provides a method and device for optimizing the parameters of a probe of an eddy current displacement sensor. By establishing a three-dimensional probe simulation model for detection by the eddy current displacement sensor, and taking one of the coil parameters in the simulation model as a variable and performing scanning simulations on the measured surface at different displacements, a response curve family of the coil parameter and the displacement change of the measured surface is obtained. Finally, based on the response curve family, the optimal parameters of the probe of the eddy current displacement sensor are determined, so as to ensure high sensitivity and linearity of the probe, and thus ensure high detection accuracy of the eddy current displacement sensor. BRIEF DESCRIPTION OF THE DRAWINGS

[0019] In order to more clearly illustrate the technical solutions in the embodiments of the present invention or the prior art, the following will briefly introduce the drawings required for use in the description of the embodiments or the prior art. Obviously, the following drawings are some embodiments of the present invention. For those of ordinary skill in the art, other drawings can be obtained based on these drawings without creative efforts.

[0020] Figure 1 is a flowchart of a method for optimizing the parameters of a probe of an eddy current displacement sensor provided by an embodiment of the present invention;

[0021] Figure 2It is the response curve group of the inductance of the probe coil of the eddy current displacement sensor provided by an embodiment of the present invention with the change of the displacement of the measured surface; wherein, the abscissa is the actual distance from the detected surface to the coil surface, with the unit of meter (m), and the ordinate is the coil inductance, with the unit of henry (H);

[0022] Figure 3 It is the hardware architecture diagram of a computing device provided by an embodiment of the present invention;

[0023] Figure 4 It is the structural diagram of a parameter optimization device for the probe of an eddy current displacement sensor provided by an embodiment of the present invention. Detailed implementation manners

[0024] To make the objectives, technical solutions, and advantages of the embodiments of the present invention clearer, the technical solutions in the embodiments of the present invention will be clearly and completely described below with reference to the accompanying drawings in the embodiments of the present invention. Obviously, the described embodiments are some, but not all, of the embodiments of the present invention. All other embodiments obtained by those of ordinary skill in the art based on the embodiments of the present invention without creative efforts shall fall within the protection scope of the present invention.

[0025] Please refer to Figure 1 , an embodiment of the present invention provides a parameter optimization method for the probe of an eddy current displacement sensor, and the method includes:

[0026] Step 100, obtaining the coil parameters of the probe of the eddy current displacement sensor;

[0027] Step 102, establishing a three-dimensional probe simulation model for the detection of the eddy current displacement sensor according to the coil parameters;

[0028] Step 104, setting one of the coil parameters in the three-dimensional probe simulation model as a variable, and respectively performing scanning simulation on the measured surface to obtain the response curve group of the coil parameter and the displacement change of the measured surface;

[0029] Step 106, determining the optimal parameters of the probe of the eddy current displacement sensor based on the response curve group.

[0030] In the embodiment of the present invention, by establishing a three-dimensional probe simulation model for the detection of the eddy current displacement sensor, and setting one of the coil parameters in the simulation model as a variable and performing scanning simulation on the measured surface with different displacements, the response curve group of the coil parameter and the displacement change of the measured surface is obtained. Finally, the optimal parameters of the probe of the eddy current displacement sensor are determined based on the response curve group, so as to ensure the high sensitivity and linearity of the probe, and thus ensure the high detection accuracy of the eddy current displacement sensor.

[0031] Regarding step 100:

[0032] In some preferred embodiments, the coil parameters include the outer diameter of the coil, the inner diameter of the coil, the number of turns of the coil, and the coil specification.

[0033] In this embodiment, considering that the coil parameters determine the linearity, sensitivity, and measurement range of the eddy current sensor, and the above performances will have an important impact on the detection accuracy of the probe. Therefore, first, the outer diameter of the coil can be determined according to factors such as the area size of the measured surface and the overall requirements of the measured surface, and the appropriate coil specification can be selected according to the needs, and a three-dimensional simulation model of the eddy current displacement sensor probe can be established.

[0034] Regarding step 102:

[0035] In the three-dimensional probe simulation model, since different numbers of turns of the coil will cause different inner diameters of the coil, and different inner diameters of the coil will affect the inductance of the eddy current displacement sensor probe. Therefore, in this embodiment, the number of turns of the coil is used as a parameter variable, and the scanned simulations are respectively carried out on the measured surfaces at different distances. During the scanned simulation process, the inner diameter of the coil changes with the change of the number of turns of the coil. Therefore, finally, a family of response curves of the number of turns of the coil and the displacement change of the measured surface can be obtained.

[0036] Regarding steps 104 to 106:

[0037] For example, assume that the outer diameter of the coil is 12 mm, the enameled wire of the coil is of a square specification of 0.05 mm×0.3 mm, and the number of turns of the coil changes from 10, 20, 30... to 110. The three-dimensional probe simulation models with the number of turns of the coil being 10, 20, 30... to 110 are respectively used to carry out scanned simulations on the measured surfaces with different displacements. The family of response curves of the number of turns of the coil with the change of the displacement of the measured surface obtained is as Figure 2 shown. Among them, as the number of turns of the coil increases, the inductance of the coil gradually increases, that is, the number of turns of the coil corresponding to each curve from bottom to top in the figure is 10, 20, 30... to 110 in turn; it can be seen from the figure that as the number of turns of the coil increases, the maximum inductance of the coil increases, but the linearity of the change of the overall family of response curves cannot be determined, and the linearity of the response curve determines the linearity of the eddy current displacement sensor probe. Therefore, in order to determine the number of turns of the coil corresponding to the optimal linearity, in this embodiment, it is considered to use the method of HOUGH transform to transform the response points (i.e., the displacement-inductance corresponding points) in each response curve into the parameter domain. From the design of the eddy current sensor, the formation of a peak in the parameter domain represents the linearity of the probe response, and the higher the peak, the higher the linearity of the probe response curve. Therefore, in this embodiment, the HOUGH transform method is used to measure the linearity of each response curve, and thus the number of turns of the coil corresponding to the optimal linearity can be determined.

[0038] It should be noted that in this embodiment, the change in the number of coil turns is not limited to the above increasing method, and the simulation granularity can be set according to the accuracy required in practice. However, as the simulation granularity increases, the amount of computation will increase accordingly.

[0039] In some embodiments, step 106 includes:

[0040] Transform each response point of each response curve in the response curve group to obtain the linearity curves of multiple response curves;

[0041] Determine the linearity of each response curve according to each linearity curve;

[0042] Based on the linearity and the probe response sensitivity parameter, establish an objective function for the probe parameters of the eddy current displacement sensor;

[0043] Determine the optimal parameters of the probe of the eddy current displacement sensor according to the objective function.

[0044] In this embodiment, measuring the performance of the eddy current displacement sensor not only includes the probe linearity, but also the sensitivity of the probe is extremely important. Therefore, in order to determine the optimal parameters of the probe of the eddy current displacement sensor, the linearity and sensitivity of the probe are comprehensively considered in this embodiment, so as to construct an objective function for the probe parameters of the eddy current displacement sensor. In this way, it is beneficial to determine the optimal design parameters of the probe coil through this objective function, so as to ensure a high detection accuracy of the eddy current displacement sensor.

[0045] In some embodiments, the transformation relation formula is as follows:

[0046] p = x i cosθ + y i sinθ

[0047] In the formula, x i and y i are a point on the response curve, p is the distance between the corresponding straight line and the origin of the parameter domain, and θ is the angle between the perpendicular line passing through the origin of the corresponding straight line and the positive direction of the abscissa in the parameter domain space.

[0048] In some embodiments, the peak value corresponding to the linearity curve is determined as the linearity of each response curve.

[0049] Specifically, following the above example, after obtaining the response curve group of the number of coil turns changing with the displacement of the measured surface as shown in Figure 2 through scanning simulation, transform each response point in each response curve graph. Assuming (x i , y i) is a point on the response curve. The density distribution of this point in the parameter domain is calculated using the above transformation relation. In the HOUGH transform, if there are points with strong linearity, peaks (p, θ) will be formed in the parameter domain. Among them, θ of the peak represents the angle between the perpendicular line passing through the origin corresponding to the straight line and the positive direction of the abscissa in the parameter domain space, and p of the peak represents the distance between the straight line and the origin of the parameter domain. The peak formed in the parameter domain is determined as the linearity of the current response curve. The higher the linearity of the displacement-inductance response curve obtained by coil turn simulation, the higher the peak Fx in the parameter domain. Therefore, the peak Fx corresponding to the response curve of each turn of the coil and θ corresponding to the peak point are obtained. x , and use the peak Fx and θ corresponding to the peak point x to construct an objective function, so as to be able to determine the optimal coil parameters.

[0050] In some embodiments, the probe response sensitivity parameter is the slope of the response curve corresponding to the current linearity.

[0051] In some embodiments, the objective function is specifically as follows:

[0052] Y = Fx 2 + θ x 2

[0053] In the formula, Fx is the peak of the linearity curve, and θ x is the probe response sensitivity parameter.

[0054] In order to ensure that the eddy current displacement sensor probe with the finally selected coil parameters has better linearity and sensitivity, in this embodiment, the linearity of the response curve group of the eddy current displacement sensor coil inductance changing with displacement is combined. Considering that forming a peak in the parameter domain [p, θ] represents the linearity of the probe response, the higher the peak Fx, the higher the linearity of the probe response curve, and θ represents the sensitivity of the eddy current probe response. The larger θ is, the larger the slope of the probe response curve. Therefore, select Fx in the objective function 2 + θ x 2 The coil turn corresponding to the maximum value is used as the optimal design parameter of the coil, which can ensure the better linearity and sensitivity of the eddy current displacement sensor probe, and further ensure the higher detection accuracy of the eddy current displacement sensor.

[0055] As Figure 3 , Figure 4 shown, the embodiment of the present invention provides a parameter optimization device for an eddy current displacement sensor probe. The device embodiment can be implemented by software, or by hardware or a combination of software and hardware. From the hardware level, as Figure 3As shown, it is a hardware architecture diagram of a computing device where a parameter optimization device for an eddy current displacement sensor probe provided by an embodiment of the present invention is located. In addition to Figure 3 the shown processor, memory, network interface, and non-volatile memory, the computing device where the device is located in the embodiment usually may also include other hardware, such as a forwarding chip responsible for processing packets, etc. Taking software implementation as an example, as Figure 4 shown, as a logically meaningful device, it is formed by the CPU of its corresponding computing device reading the corresponding computer program in the non-volatile memory into the memory and running. A parameter optimization device for an eddy current displacement sensor probe provided by the present embodiment, the device includes:

[0056] An acquisition unit 301, configured to acquire the coil parameters of the eddy current displacement sensor probe;

[0057] A model construction unit 302, configured to establish a three-dimensional probe simulation model detected by the eddy current displacement sensor according to the coil parameters;

[0058] A simulation unit 303, configured to set one of the coil parameters in the three-dimensional probe simulation model as a variable, and respectively perform scanning simulations on the measured surface to obtain a response curve group of the coil parameter and the displacement change of the measured surface;

[0059] A determination unit 304, configured to determine the optimal parameters of the eddy current displacement sensor probe based on the response curve group.

[0060] In an embodiment of the present invention, the acquisition unit 301 can be used to execute step 100 in the above method embodiment, the model construction unit 301 can be used to execute step 102 in the above method embodiment, the simulation unit 302 can be used to execute step 104 in the above method embodiment, and the determination unit 303 can be used to execute step 106 in the above method embodiment.

[0061] In an embodiment of the present invention, the coil parameters in the acquisition unit 301 include the coil outer diameter, coil inner diameter, number of coil turns, and coil specification.

[0062] In an embodiment of the present invention, when the determination unit 304 executes the determination of the optimal parameters of the eddy current displacement sensor probe based on the response curve group, it includes:

[0063] Respectively perform transformations on each response point of each response curve in the response curve group to obtain linearity curves of multiple response curves;

[0064] Determine the linearity of each response curve according to each linearity curve;

[0065] Based on the linearity and probe response sensitivity parameters, establish an objective function for the probe parameters of the eddy current displacement sensor;

[0066] According to the objective function, determine the optimal parameters of the probe of the eddy current displacement sensor.

[0067] In an embodiment of the present invention, the transformation relationship is as follows:

[0068] p = x i cosθ + y i sinθ

[0069] In the formula, x i and y i are a point on the response curve, p is the distance between the corresponding straight line and the origin of the parameter domain, and θ is the angle between the perpendicular line passing through the origin of the corresponding straight line and the positive direction of the abscissa in the parameter domain space.

[0070] In an embodiment of the present invention, the determining the linearity of each response curve according to the linearity curve includes: determining the peak value corresponding to the linearity curve as the linearity of each response curve.

[0071] In an embodiment of the present invention, the probe response sensitivity parameter is the slope of the response curve corresponding to the current linearity.

[0072] In an embodiment of the present invention, the objective function is specifically as follows:

[0073] Y = Fx 2 + θ x 2

[0074] In the formula, Fx is the peak value of the linearity curve, and θ x is the probe response sensitivity parameter.

[0075] It can be understood that the structure schematically shown in the embodiments of the present invention does not constitute a specific limitation on a parameter optimization device for a probe of an eddy current displacement sensor. In other embodiments of the present invention, a parameter optimization device for a probe of an eddy current displacement sensor may include more or fewer components than shown in the figure, or combine certain components, or split certain components, or different component arrangements. The components shown in the figure can be implemented in hardware, software, or a combination of software and hardware.

[0076] For the information interaction, execution process, etc. between the modules in the above device, since it is based on the same concept as the method embodiment of the present invention, the specific content can be referred to the description in the method embodiment of the present invention, and will not be repeated here.

[0077] An embodiment of the present invention further provides a computing device, including a memory and a processor. A computer program is stored in the memory. When the processor executes the computer program, a parameter optimization method for an eddy current displacement sensor probe in any embodiment of the present invention is implemented.

[0078] An embodiment of the present invention further provides a computer-readable storage medium. A computer program is stored on the computer-readable storage medium. When the computer program is executed by a processor, the processor is enabled to execute a parameter optimization method for an eddy current displacement sensor probe in any embodiment of the present invention.

[0079] Specifically, a system or device equipped with a storage medium can be provided. Software program code for implementing the functions in any one of the above embodiments is stored on the storage medium, and the computer (or CPU or MPU) of the system or device reads and executes the program code stored in the storage medium.

[0080] In this case, the program code read from the storage medium itself can implement the functions in any one of the above embodiments. Therefore, the program code and the storage medium storing the program code constitute a part of the present invention.

[0081] Embodiments of the storage medium for providing program code include floppy disks, hard disks, magneto-optical disks, optical disks (such as CD-ROM, CD-R, CD-RW, DVD-ROM, DVD-RAM, DVD-RW, DVD+RW), magnetic tapes, non-volatile memory cards, and ROMs. Optionally, the program code can be downloaded from a server computer via a communication network.

[0082] In addition, it should be clear that not only can the functions in any one of the above embodiments be realized by executing the program code read by the computer, but also by an operating system operating on the computer based on the instructions of the program code to complete part or all of the actual operations.

[0083] In addition, it can be understood that the program code read from the storage medium is written into the memory provided in the expansion board inserted into the computer or the memory provided in the expansion module connected to the computer. Subsequently, based on the instructions of the program code, the CPU etc. installed on the expansion board or expansion module execute part and all of the actual operations, thereby realizing the functions in any one of the above embodiments.

[0084] It should be noted that in this document, relational terms such as first and second are only used to distinguish one entity or operation from another entity or operation, and do not necessarily require or imply any actual relationship or order between these entities or operations. Moreover, the term "comprising", "including" or any other variant thereof is intended to cover non-exclusive inclusion, such that a process, method, article or device comprising a series of elements includes not only those elements but also other elements not expressly listed, or elements inherent to such process, method, article or device.

[0085] Those of ordinary skill in the art can understand that all or part of the steps for implementing the above method embodiments can be completed by hardware related to program instructions. The foregoing program can be stored in a computer-readable storage medium. When the program is executed, it performs the steps including those of the above method embodiments; and the foregoing storage medium includes various media that can store program codes, such as ROM, RAM, magnetic disks or optical discs.

[0086] Finally, it should be noted that the above embodiments are only used to illustrate the technical solutions of the present invention and are not intended to limit them. Although the present invention has been described in detail with reference to the foregoing embodiments, those of ordinary skill in the art should understand that they can still modify the technical solutions described in the foregoing embodiments, or perform equivalent replacements for some of the technical features; and these modifications or replacements do not cause the essence of the corresponding technical solutions to deviate from the spirit and scope of the technical solutions of the embodiments of the present invention.

Claims

1. A parameter optimization method for an eddy current displacement sensor probe, characterized in that: include: Obtain coil parameters of the eddy current displacement sensor probe; According to the coil parameters, a three-dimensional probe simulation model for detection by the eddy current displacement sensor is established; One of the coil parameters in the three-dimensional probe simulation model is set as a variable, and the measured surface is scanned and simulated to obtain a group of response curves of the coil parameter and the displacement change of the measured surface; Based on the response curve family, optimal parameters of the eddy current displacement sensor probe are determined.

2. The method according to claim 1, characterized in that The coil parameters include coil outer diameter, coil inner diameter, coil turns and coil specifications.

3. The method according to claim 1, characterized in that Determining the optimal parameters of the eddy current displacement sensor probe based on the response curve group includes: Transforming each response point of each response curve in the response curve family respectively to obtain linearity curves of the plurality of response curves; Determining the linearity of each response curve according to each of the linearity curves; Based on the linearity and probe response sensitivity parameters, establishing an objective function of the eddy current displacement sensor probe parameters; According to the objective function, the optimal parameters of the eddy current displacement sensor probe are determined.

4. The method according to claim 3, characterized in that The transformation relationship is as follows: p=x i cosθ+y i sinθ In the formula, x i and i is a point on the response curve, p is the distance between the corresponding straight line and the origin of the parameter domain, and θ is the angle between the perpendicular line of the corresponding straight line passing through the origin and the positive direction of the abscissa in the parameter domain space.

5. The method according to claim 3, characterized in that: Determining the linearity of each response curve according to the linearity curve includes: determining a peak value corresponding to the linearity curve as the linearity of each response curve.

6. The method according to claim 5, characterized in that The probe response sensitivity parameter is the slope of the response curve corresponding to the current linearity.

7. The method according to claim 6, characterized in that The objective function is as follows: Y=Fx 2 +θ x 2 Where Fx is the peak value of the linearity curve, θ x is the probe response sensitivity parameter.

8. A parameter optimization device for an eddy current displacement sensor probe, characterized in that: include: An acquisition unit, used for acquiring coil parameters of an eddy current displacement sensor probe; A model building unit, used to build a three-dimensional probe simulation model for detection by the eddy current displacement sensor according to the coil parameters; A simulation unit, used for setting one of the coil parameters in the three-dimensional probe simulation model as a variable, performing scanning simulation on the measured surface respectively, and obtaining a group of response curves of the coil parameter and the displacement change of the measured surface; A determination unit is used to determine the optimal parameters of the eddy current displacement sensor probe based on the response curve group.

9. A computing device, comprising a memory and a processor, wherein the memory stores a computer program, and when the processor executes the computer program, the method according to any one of claims 1 to 7 is implemented.

10. A computer-readable storage medium having a computer program stored thereon, which, when executed in a computer, causes the computer to execute the method according to any one of claims 1 to 7.

Citation Information

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