A method and apparatus for optimizing the parameters of an eddy current displacement sensor probe.

Abstract

This invention provides a method and apparatus for optimizing the parameters of an eddy current displacement sensor probe. The method includes: acquiring the coil parameters of the eddy current displacement sensor probe; establishing a three-dimensional probe simulation model based on the coil parameters; setting one of the coil parameters in the three-dimensional probe simulation model as a variable, and performing scanning simulations on the measured surface to obtain a family of response curves showing the change in displacement of the measured surface relative to the coil parameter; and determining the optimal parameters of the eddy current displacement sensor probe based on the family of response curves. This solution ensures high testing accuracy of the probe.

Description

Technical Field

[0001] This invention relates to the field of nondestructive testing technology, and in particular to a method and apparatus for optimizing the parameters of an eddy current displacement sensor probe. Background Technology

[0002] Eddy current sensors, as non-destructive and non-contact detection devices, possess advantages such as high sensitivity, strong anti-interference capability, insensitivity to media, and simple structure. In the development of eddy current displacement sensors on the "three-super" platform, probe design is particularly crucial. This includes not only the design of the probe structure but, more importantly, the design methodology for the probe coil structural parameters. The probe coil is a vital component of the eddy current sensor; its geometric dimensions are closely related to the sensor's sensitivity, linearity, and measurement range, making it a key aspect of the entire eddy current sensor development process.

[0003] In related technologies, the design of probe coil parameters mostly follows the empirical formula design method commonly used in domestic literature. However, probes designed using this method have approximate and posterior design phenomena, and still have the problem of poor detection accuracy, and cannot guarantee the optimal design.

[0004] Therefore, based on the above problems, there is an urgent need to provide a method and apparatus for optimizing the parameters of an eddy current displacement sensor probe. Summary of the Invention

[0005] To address the issue of poor detection accuracy in the design of traditional eddy current displacement sensor probe parameters, this invention provides a method and apparatus for optimizing the parameters of an eddy current displacement sensor probe.

[0006] In a first aspect, embodiments of the present invention provide a method for optimizing the parameters of an eddy current displacement sensor probe, comprising:

[0007] Obtain the coil parameters of the eddy current displacement sensor probe;

[0008] Based on the coil parameters, a three-dimensional probe simulation model for the eddy current displacement sensor is established.

[0009] One of the coil parameters in the three-dimensional probe simulation model is set as a variable, and the surface under test is scanned and simulated to obtain a family of response curves of the coil parameter and the displacement of the surface under test.

[0010] Based on the family of response curves, the optimal parameters of the eddy current displacement sensor probe are determined.

[0011] Secondly, embodiments of the present invention also provide a probe parameter optimization device for an eddy current displacement sensor, the device comprising:

[0012] Acquisition unit, used to acquire coil parameters of eddy current displacement sensor probe;

[0013] The model building unit is used to establish a three-dimensional probe simulation model for the eddy current displacement sensor based on the coil parameters.

[0014] The simulation unit is used to set one of the coil parameters in the three-dimensional probe simulation model as a variable, and to perform scanning simulation on the measured surface to obtain a family of response curves of the coil parameter and the displacement change of the measured surface.

[0015] The determining unit is used to determine the optimal parameters of the eddy current displacement sensor probe based on the family of response curves.

[0016] Thirdly, embodiments of the present invention also provide a computing device, including a memory and a processor, wherein the memory stores a computer program, and when the processor executes the computer program, it implements the method described in any embodiment of this specification.

[0017] Fourthly, embodiments of the present invention also provide a computer-readable storage medium having a computer program stored thereon, which, when executed in a computer, causes the computer to perform the methods described in any embodiment of this specification.

[0018] This invention provides a method and apparatus for optimizing the parameters of an eddy current displacement sensor probe. A three-dimensional probe simulation model of the eddy current displacement sensor is established, and one of the coil parameters in the simulation model is used as a variable to scan the measured surface with different displacements. This yields a family of response curves showing the change in the coil parameter and the displacement of the measured surface. Finally, the optimal parameters of the eddy current displacement sensor probe are determined based on this family of response curves. This ensures high sensitivity and linearity of the probe, thereby guaranteeing high detection accuracy of the eddy current displacement sensor. Attached Figure Description

[0019] To more clearly illustrate the technical solutions in the embodiments of the present invention or the prior art, the drawings used in the description of the embodiments or the prior art will be briefly introduced below. Obviously, the drawings described below are some embodiments of the present invention. For those skilled in the art, other drawings can be obtained based on these drawings without creative effort.

[0020] Figure 1 This is a flowchart of a parameter optimization method for an eddy current displacement sensor probe according to an embodiment of the present invention;

[0021] Figure 2This is a family of response curves of the probe coil inductance of an eddy current displacement sensor provided in an embodiment of the present invention as the displacement of the measured surface changes; wherein, the horizontal axis is the actual distance from the measured surface to the coil surface, in meters (m), and the vertical axis is the coil inductance, in Henry (H);

[0022] Figure 3 This is a hardware architecture diagram of a computing device provided in an embodiment of the present invention;

[0023] Figure 4 This is a structural diagram of a parameter optimization device for an eddy current displacement sensor probe provided in an embodiment of the present invention. Detailed Implementation

[0024] To make the objectives, technical solutions, and advantages of the embodiments of the present invention clearer, the technical solutions of the embodiments of the present invention will be clearly and completely described below with reference to the accompanying drawings. Obviously, the described embodiments are some embodiments of the present invention, but not all embodiments. All other embodiments obtained by those skilled in the art based on the embodiments of the present invention without creative effort are within the scope of protection of the present invention.

[0025] Please refer to Figure 1 This invention provides a method for optimizing the parameters of an eddy current displacement sensor probe, the method comprising:

[0026] Step 100: Obtain the coil parameters of the eddy current displacement sensor probe;

[0027] Step 102: Based on the coil parameters, establish a three-dimensional probe simulation model for the eddy current displacement sensor.

[0028] Step 104: Set one of the coil parameters in the three-dimensional probe simulation model as a variable, and perform scanning simulation on the measured surface to obtain the family of response curves of the coil parameter and the displacement change of the measured surface.

[0029] Step 106: Based on the family of response curves, determine the optimal parameters of the eddy current displacement sensor probe.

[0030] In this embodiment of the invention, a three-dimensional probe simulation model for eddy current displacement sensor detection is established, and one of the coil parameters in the simulation model is used as a variable to scan the measured surface with different displacements. This yields a family of response curves showing the change in the coil parameter and the displacement of the measured surface. Finally, the optimal parameters of the eddy current displacement sensor probe are determined based on this family of response curves. This ensures high sensitivity and linearity of the probe, thereby guaranteeing high detection accuracy of the eddy current displacement sensor.

[0031] For step 100:

[0032] In some preferred embodiments, the coil parameters include the outer diameter of the coil, the inner diameter of the coil, the number of coil turns, and the coil specifications.

[0033] In this embodiment, considering that the coil parameters determine the linearity, sensitivity and measurement range of the eddy current sensor, and the above performance will have an important impact on the detection accuracy of the probe, the outer diameter of the coil can be determined first according to factors such as the area of ​​the measured surface and the overall requirements of the measured surface, and then a suitable coil specification can be selected as needed to establish a three-dimensional simulation model of the eddy current displacement sensor probe.

[0034] Regarding step 102:

[0035] In the three-dimensional probe simulation model, the different number of coil turns will cause different inner diameters of the coil, and the different inner diameters of the coil will affect the inductance of the eddy current displacement sensor probe. Therefore, in this embodiment, the number of coil turns is used as a parameter variable, and scanning simulation is performed on the measured surface at different distances. During the scanning simulation, the inner diameter of the coil changes with the number of coil turns, so the family of response curves of the number of coil turns and the displacement of the measured surface can be obtained in the end.

[0036] For steps 104 to 106:

[0037] For example, assuming the outer diameter of the coil is 12mm, the enameled wire is 0.05mm × 0.3mm square, and the number of coil turns varies from 10, 20, 30… to 110, a three-dimensional probe simulation model with coil turns of 10, 20, 30… to 110 is used to scan and simulate the measured surface at different displacements. The resulting family of response curves showing the change in the number of coil turns with the displacement of the measured surface is as follows: Figure 2 As shown in the figure, the inductance of the coil gradually increases with the increase of the number of coil turns. Specifically, each curve from bottom to top corresponds to 10, 20, 30...110 coil turns. The figure shows that as the number of coil turns increases, the maximum inductance of the coil increases, but the linearity of the overall response curve family cannot be determined. Since the linearity of the response curve determines the linearity of the eddy current displacement sensor probe, this embodiment considers transforming the response points (i.e., the displacement-inductance corresponding points) of each response curve to the parameter domain using the HOUGH transform method. From the design perspective of eddy current sensors, the peak value formed in the parameter domain represents the linearity of the probe response; the higher the peak value, the higher the linearity of the probe response curve. Therefore, this embodiment uses the HOUGH transform method to measure the linearity of each response curve, thus determining the number of coil turns corresponding to the optimal linearity.

[0038] It should be noted that in this embodiment, the number of coil turns is not limited to the above-mentioned increasing method. The simulation granularity can be set according to the accuracy required in actual use. However, as the simulation granularity increases, the amount of computation will increase accordingly.

[0039] In some implementations, step 106 includes:

[0040] Each response point of each response curve in the family of response curves is transformed to obtain linearity curves of multiple response curves;

[0041] Based on each of the linearity curves, determine the linearity of each response curve;

[0042] Based on the linearity and probe response sensitivity parameters, an objective function for the probe parameters of the eddy current displacement sensor is established.

[0043] The optimal parameters of the eddy current displacement sensor probe are determined based on the objective function.

[0044] In this embodiment, the performance of the eddy current displacement sensor is evaluated not only by the probe linearity, but also by the probe sensitivity. Therefore, in order to determine the optimal parameters of the eddy current displacement sensor probe, this embodiment comprehensively considers the probe linearity and sensitivity to construct an objective function for the eddy current displacement sensor probe parameters. This is beneficial to determine the optimal design parameters of the probe coil through the objective function, thereby ensuring the high detection accuracy of the eddy current displacement sensor.

[0045] In some implementations, the transformation relationship is as follows:

[0046] p = x i cosθ+y i sinθ

[0047] In the formula, x i and y i Let p be a point on the response curve, p be the distance between the corresponding line and the origin of the parameter domain, and θ be the angle between the perpendicular line of the corresponding line passing through the origin and the positive direction of the horizontal coordinate in the parameter domain space.

[0048] In some implementations, the peak value corresponding to the linearity curve is determined as the linearity of each response curve.

[0049] Specifically, following the example above, the following can be obtained through scanning simulation: Figure 2 The family of response curves showing the change in the number of coil turns as a function of the displacement of the measured surface is then used to transform each response point in each response curve, assuming (x i ,y iLet be a point on the response curve. Using the aforementioned transformation formula, calculate the density distribution of this point in the parameter domain. In the HOUGH transform, if a point with strong linearity exists, it will form a peak (p, θ) in the parameter domain. Here, θ represents the angle between the perpendicular line to the origin and the positive direction of the abscissa in the parameter domain space, and p represents the distance between the line and the origin of the parameter domain. The peak value formed in the parameter domain is determined as the linearity of the current response curve. If the linearity of the displacement-inductance response curve obtained from the coil turns simulation is higher, then the peak value Fx in the parameter domain will also be higher. Therefore, the peak value Fx and the θ corresponding to the peak point of the coil response curve for each number of turns are obtained. x And the peak value Fx and the corresponding θ at the peak point x By constructing an objective function, the optimal coil parameters can be determined.

[0050] In some implementations, the probe response sensitivity parameter is the slope of the response curve corresponding to the current linearity.

[0051] In some implementations, the objective function is specifically as follows:

[0052] Y = Fx 2 +θ x 2

[0053] In the formula, Fx is the peak value of the linearity curve, and θ x The parameter is the sensitivity parameter of the probe response.

[0054] To ensure that the eddy current displacement sensor probe with the selected coil parameters has optimal linearity and sensitivity, this embodiment combines the linearity of the family of response curves of the eddy current displacement sensor coil inductance as a function of displacement. Considering that the peak value in the parameter domain [p, θ] represents the linearity of the probe response, a higher peak value Fx indicates higher linearity of the probe response curve, and θ represents the sensitivity of the eddy current probe response, a larger θ indicates a steeper slope of the probe response curve, therefore, Fx is selected as the target function. 2 +θ x 2 The number of coil turns corresponding to the maximum value is used as the optimal design parameter for the coil, which can ensure good linearity and sensitivity of the eddy current displacement sensor probe, thereby ensuring high detection accuracy of the eddy current displacement sensor.

[0055] like Figure 3 , Figure 4 As shown, this embodiment of the invention provides a parameter optimization device for an eddy current displacement sensor probe. The device embodiment can be implemented through software, hardware, or a combination of both. From a hardware perspective, such as... Figure 3The diagram shown is a hardware architecture diagram of a computing device housing a parameter optimization device for an eddy current displacement sensor probe provided in an embodiment of the present invention. Except for... Figure 3 In addition to the processor, memory, network interface, and non-volatile memory shown, the computing device in the embodiment may also include other hardware, such as a forwarding chip responsible for processing packets. Taking software implementation as an example, such as... Figure 4 As shown, a device in a logical sense is formed by the CPU of its computing device reading the corresponding computer program from the non-volatile memory into memory and running it. This embodiment provides a parameter optimization device for an eddy current displacement sensor probe, the device comprising:

[0056] Acquisition unit 301 is used to acquire the coil parameters of the eddy current displacement sensor probe;

[0057] The model building unit 302 is used to establish a three-dimensional probe simulation model for the eddy current displacement sensor based on the coil parameters.

[0058] The simulation unit 303 is used to set one of the coil parameters in the three-dimensional probe simulation model as a variable, and to perform scanning simulation on the measured surface to obtain a family of response curves of the coil parameter and the displacement change of the measured surface.

[0059] The determining unit 304 is used to determine the optimal parameters of the eddy current displacement sensor probe based on the family of response curves.

[0060] In this embodiment of the invention, the acquisition unit 301 can be used to execute step 100 in the above method embodiment, the model building unit 301 can be used to execute step 102 in the above method embodiment, the simulation unit 302 can be used to execute step 104 in the above method embodiment, and the determination unit 303 can be used to execute step 106 in the above method embodiment.

[0061] In one embodiment of the present invention, the coil parameters in the acquisition unit 301 include the outer diameter of the coil, the inner diameter of the coil, the number of coil turns, and the coil specifications.

[0062] In one embodiment of the present invention, when the determining unit 304 performs the process of determining the optimal parameters of the eddy current displacement sensor probe based on the family of response curves, it includes:

[0063] Each response point of each response curve in the family of response curves is transformed to obtain linearity curves of multiple response curves;

[0064] Based on each of the linearity curves, determine the linearity of each response curve;

[0065] Based on the linearity and probe response sensitivity parameters, an objective function for the probe parameters of the eddy current displacement sensor is established.

[0066] The optimal parameters of the eddy current displacement sensor probe are determined based on the objective function.

[0067] In one embodiment of the present invention, the transformation relationship is as follows:

[0068] p = x i cosθ+y i sinθ

[0069] In the formula, x i and y i Let p be a point on the response curve, p be the distance between the corresponding line and the origin of the parameter domain, and θ be the angle between the perpendicular line of the corresponding line passing through the origin and the positive direction of the horizontal coordinate in the parameter domain space.

[0070] In one embodiment of the present invention, determining the linearity of each response curve based on the linearity curve includes: determining the peak value corresponding to the linearity curve as the linearity of each response curve.

[0071] In one embodiment of the present invention, the probe response sensitivity parameter is the slope of the response curve corresponding to the current linearity.

[0072] In one embodiment of the present invention, the objective function is specifically as follows:

[0073] Y = Fx 2 +θ x 2

[0074] In the formula, Fx is the peak value of the linearity curve, and θ x The parameter is the sensitivity parameter of the probe response.

[0075] It is understood that the structures illustrated in the embodiments of the present invention do not constitute a specific limitation on a parameter optimization device for an eddy current displacement sensor probe. In other embodiments of the present invention, a parameter optimization device for an eddy current displacement sensor probe may include more or fewer components than illustrated, or combine some components, or split some components, or arrange the components differently. The illustrated components may be implemented in hardware, software, or a combination of software and hardware.

[0076] The information interaction and execution process between the modules in the above-mentioned device are based on the same concept as the method embodiment of the present invention, and the specific details can be found in the description of the method embodiment of the present invention, and will not be repeated here.

[0077] This invention also provides a computing device, including a memory and a processor. The memory stores a computer program, and when the processor executes the computer program, it implements a parameter optimization method for an eddy current displacement sensor probe according to any embodiment of this invention.

[0078] This invention also provides a computer-readable storage medium storing a computer program, which, when executed by a processor, causes the processor to perform a parameter optimization method for an eddy current displacement sensor probe according to any embodiment of this invention.

[0079] Specifically, a system or apparatus equipped with a storage medium may be provided, on which software program code implementing the functions of any of the embodiments described above is stored, and the computer (or CPU or MPU) of the system or apparatus may read and execute the program code stored in the storage medium.

[0080] In this case, the program code read from the storage medium can itself implement the function of any of the above embodiments, and therefore the program code and the storage medium storing the program code constitute part of the present invention.

[0081] Examples of storage media used to provide program code include floppy disks, hard disks, magneto-optical disks, optical disks (such as CD-ROM, CD-R, CD-RW, DVD-ROM, DVD-RAM, DVD-RW, DVD+RW), magnetic tapes, non-volatile memory cards, and ROMs. Alternatively, program code can be downloaded from a server computer via a communication network.

[0082] Furthermore, it should be clear that not only can the program code read by the computer be executed, but also the operating system or other components operating on the computer can be instructed based on the program code to perform some or all of the actual operations, thereby realizing the function of any of the embodiments described above.

[0083] Furthermore, it is understood that the program code read from the storage medium is written to the memory set in the expansion board inserted into the computer or to the memory set in the expansion module connected to the computer. Then, based on the instructions of the program code, the CPU or other components installed on the expansion board or expansion module execute some and all of the actual operations, thereby realizing the function of any of the above embodiments.

[0084] It should be noted that, in this document, relational terms such as "first" and "second" are used only to distinguish one entity or operation from another, and do not necessarily require or imply any such actual relationship or order between these entities or operations. Furthermore, the terms "comprising," "including," or any other variations thereof are intended to cover non-exclusive inclusion, such that a process, method, article, or apparatus that comprises a list of elements includes not only those elements but also other elements not expressly listed, or elements inherent to such a process, method, article, or apparatus.

[0085] Those skilled in the art will understand that all or part of the steps of the above method embodiments can be implemented by hardware related to program instructions. The aforementioned program can be stored in a computer-readable storage medium. When the program is executed, it performs the steps of the above method embodiments. The aforementioned storage medium includes various media that can store program code, such as ROM, RAM, magnetic disk, or optical disk.

[0086] Finally, it should be noted that the above embodiments are only used to illustrate the technical solutions of the present invention, and not to limit them; although the present invention has been described in detail with reference to the foregoing embodiments, those skilled in the art should understand that modifications can still be made to the technical solutions described in the foregoing embodiments, or equivalent substitutions can be made to some of the technical features; and these modifications or substitutions do not cause the essence of the corresponding technical solutions to deviate from the spirit and scope of the technical solutions of the embodiments of the present invention.

Claims

1. A method for optimizing probe parameters of an eddy current displacement sensor, characterized in that, include: Obtain the coil parameters of the eddy current displacement sensor probe; Based on the coil parameters, a three-dimensional probe simulation model for the eddy current displacement sensor is established. One of the coil parameters in the three-dimensional probe simulation model is set as a variable, and the surface under test is scanned and simulated to obtain a family of response curves of the coil parameter and the displacement of the surface under test. The Hough transform is applied to each response point of each response curve in the family of response curves to transform it to the parameter domain, resulting in linearity curves for multiple response curves; the transformation relationship is as follows: p = x i cosθ+ y i sinθ In the formula, x i and y i Let p be a point on the response curve, p be the distance between the corresponding line and the origin of the parameter domain, and θ be the angle between the perpendicular line of the corresponding line passing through the origin and the positive direction of the horizontal coordinate in the parameter domain space. Based on each linearity curve, the linearity of each response curve is determined; wherein, the peak value corresponding to each linearity curve is determined as the linearity of each response curve; Based on the linearity and probe response sensitivity parameters, an objective function for the eddy current displacement sensor probe parameters is established; wherein, the probe response sensitivity parameter is the slope of the response curve corresponding to the current linearity; the specific objective function is as follows: Y=Fx 2 +θ x 2 In the formula, Fx is the peak value of the linearity curve, and θ x The sensitivity parameter of the probe response; The optimal parameters of the eddy current displacement sensor probe are determined based on the objective function.

2. The method according to claim 1, characterized in that, The coil parameters include the outer diameter of the coil, the inner diameter of the coil, the number of turns of the coil, and the coil specifications.

3. A probe parameter optimization device for an eddy current displacement sensor, used to implement the method as described in any one of claims 1 to 2, characterized in that, include: Acquisition unit, used to acquire coil parameters of eddy current displacement sensor probe; The model building unit is used to establish a three-dimensional probe simulation model for the eddy current displacement sensor based on the coil parameters. The simulation unit is used to set one of the coil parameters in the three-dimensional probe simulation model as a variable, and to perform scanning simulation on the measured surface to obtain a family of response curves of the coil parameter and the displacement change of the measured surface. The determining unit is used to determine the optimal parameters of the eddy current displacement sensor probe based on the family of response curves.

4. A computing device comprising a memory and a processor, wherein the memory stores a computer program, and the processor, when executing the computer program, implements the method as described in any one of claims 1-2.

5. A computer-readable storage medium having a computer program stored thereon, which, when executed in a computer, causes the computer to perform the method of any one of claims 1-2.

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