On-chip RC oscillator calibration method based on automatic test equipment

Abstract

The invention provides an on-chip RC oscillator calibration method based on automatic test equipment, and the method comprises the steps: building the communication between the automatic test equipment and a target chip, transmitting calibration data, enabling the target chip to update the parameters of an RC oscillator, receiving and testing an oscillation signal, adjusting the calibration data until the frequency of the oscillation signal is close to a reference frequency, and completing the calibration of the on-chip RC oscillator. And finally determining target calibration data and writing the target calibration data into the target chip. The calibration efficiency can be improved.

Description

Technical Field

[0001] This application relates to the field of testing, and particularly to an in-chip RC oscillator calibration method based on an automated test device. Background Art

[0002] In the design and manufacturing process of digital chips, a large number of digital and analog modules are often integrated inside the chip after tape-out. These analog modules, including but not limited to ADC (Analog-to-Digital Converter), DAC (Digital-to-Analog Converter), LDO (Low Dropout Regulator), and RC oscillator, etc., are crucial for the overall performance and function realization of the chip. Among them, as an important source of clock signals, the accuracy and stability of the frequency of the RC oscillator directly affect the working efficiency of the chip and the reliability of data processing.

[0003] However, in terms of the calibration of RC oscillators, due to the differences in the solutions provided by different IP (Intellectual Property) vendors, the calibration methods are also different. Some IP vendors of RC oscillators tend to adopt in-chip automatic calibration methods. Through built-in logic circuits and algorithms, the parameters of the oscillator are automatically adjusted when the chip starts or under specific conditions to achieve the expected frequency range. This method simplifies the calibration process and improves the calibration efficiency, but it may be limited by the resources inside the chip and the algorithm complexity.

[0004] On the other hand, some IP vendors of RC oscillators choose the manual calibration method. This method usually requires testing the oscillator through specific test equipment (such as ATE, i.e., automated test equipment) outside the chip and manually adjusting the calibration parameters on the chip according to the test results. Although manual calibration provides higher flexibility and customization, the calibration process is relatively cumbersome and is easily affected by human factors, resulting in difficulty in ensuring calibration accuracy and consistency. Summary of the Invention In view of this, the embodiments of this application provide an in-chip RC oscillator calibration method based on an automated test device, which can improve the calibration efficiency.

[0005] The technical solution of the embodiments of this application is implemented as follows: In a first aspect, the embodiments of this application provide an in-chip RC oscillator calibration method based on an automated test device, including the following steps: Establish handshake communication between the automated test device and the target chip; Send calibration data to the target chip through the automated test device, so that the target chip updates the oscillation parameters of the RC oscillator based on the calibration data and returns an oscillation signal under the oscillation parameters; Receive the oscillation signal through the automated test device, adjust the calibration data based on the magnitude relationship between the oscillation signal and the reference frequency, and perform multiple tests on the oscillation signal based on the adjusted calibration data until the frequency of the oscillation signal is closest to the reference frequency; Determine the calibration data used when the frequency of the oscillation signal is closest to the reference frequency as the target calibration data, and write the target calibration data into the target chip.

[0006] In a second aspect, an embodiment of the present application further provides an in-chip RC oscillator calibration device based on an automated test device, and the device includes: A establishing module, configured to establish handshake communication between the automated test device and the target chip; A sending module, configured to send calibration data to the target chip through the automated test device, so that the target chip updates the oscillation parameters of the RC oscillator based on the calibration data and returns an oscillation signal under the oscillation parameters; An adjusting module, configured to receive the oscillation signal through the automated test device, adjust the calibration data based on the magnitude relationship between the oscillation signal and the reference frequency, and perform multiple tests on the oscillation signal based on the adjusted calibration data until the frequency of the oscillation signal is closest to the reference frequency; A determining module, configured to determine the calibration data used when the frequency of the oscillation signal is closest to the reference frequency as the target calibration data, and write the target calibration data into the target chip.

[0007] In a third aspect, an embodiment of the present application further provides an electronic device, including: a processor, a storage medium, and a bus. The storage medium stores machine-readable instructions executable by the processor. When the electronic device runs, the processor communicates with the storage medium through the bus, and the processor executes the machine-readable instructions to execute the in-chip RC oscillator calibration method according to any one of the first aspect.

[0008] In a fourth aspect, an embodiment of the present application further provides a computer-readable storage medium, on which a computer program is stored. When the computer program is run by a processor, it executes the in-chip RC oscillator calibration method according to any one of the first aspect.

[0009] The embodiments of the present application have the following beneficial effects: (1) Improve calibration accuracy and efficiency: In the embodiments of this application, high-precision and high-speed sampling and data analysis are achieved through the ATE device, which can accurately measure the output frequency of the RC oscillator and automatically adjust the calibration data according to the difference from the reference frequency, thus significantly improving the calibration accuracy. At the same time, the automation characteristics of the ATE device greatly shorten the calibration cycle and improve the overall efficiency of testing and calibration.

[0010] (2) Unify the calibration process: In view of the problem that the calibration methods for RC oscillators provided by different IP manufacturers are inconsistent, the embodiments of this application provide a unified calibration process. Whether it is automatic calibration or manual calibration, standardized and procedural operations can be achieved through the ATE device, reducing the complexity of the calibration work and the dependence on specific IP manufacturers.

[0011] (3) Enhance the stability and reliability of the chip: Through precise calibration, the output frequency of the RC oscillator can be stably maintained within the required range, thereby improving the overall stability and reliability of the digital chip. This is particularly important for application scenarios that require high-precision clock signals, such as communication, data processing, and other fields.

[0012] (4) Reduce calibration costs: In the embodiments of this application, the ATE device is used for calibration, eliminating the need for additional calibration equipment or complex calibration environments, thus reducing calibration costs. At the same time, the reusability of the ATE device also improves the resource utilization efficiency. Description of the Drawings

[0013] To more clearly illustrate the technical solutions of the embodiments of this application, the drawings required for use in the embodiments will be briefly introduced below. It should be understood that the following drawings only show some embodiments of this application and should not be regarded as limiting the scope. For those of ordinary skill in the art, other related drawings can also be obtained based on these drawings without creative efforts.

[0014] Figure 1 It is a schematic flowchart of steps S101 - S104 provided by the embodiments of this application; Figure 2 It is a schematic diagram provided by the embodiments of this application; Figure 3 It is a schematic flowchart of steps S301 - S302 provided by the embodiments of this application; Figure 4 It is a schematic structural diagram of an on-chip RC oscillator calibration device based on an automated test equipment provided by the embodiments of this application; Figure 5 It is a schematic diagram of the composition structure of an electronic device provided by the embodiments of this application. Detailed Embodiments

[0015] To make the objectives, technical solutions, and advantages of the embodiments of this application clearer, the following will clearly and completely describe the technical solutions in the embodiments of this application in conjunction with the accompanying drawings in the embodiments of this application. It should be understood that the accompanying drawings in this application only serve the purpose of illustration and description, and are not used to limit the protection scope of this application. Additionally, it should be understood that the schematic drawings are not drawn to scale. The flowcharts used in this application illustrate the operations implemented according to some embodiments of this application. It should be understood that the operations in the flowchart may not be implemented in sequence, and steps without a logical context relationship may be reversed or implemented simultaneously. Furthermore, those skilled in the art can add one or more other operations to the flowchart or remove one or more operations from the flowchart under the guidance of the content of this application.

[0016] In the following description, reference is made to "some embodiments", which describe a subset of all possible embodiments. However, it can be understood that "some embodiments" can be the same subset or different subsets of all possible embodiments, and can be combined with each other without conflict.

[0017] In addition, the described embodiments are only a part of the embodiments of this application, rather than all the embodiments. The components of the embodiments of this application usually described and illustrated in the accompanying drawings here can be arranged and designed in various different configurations. Therefore, the following detailed description of the embodiments of this application provided in the accompanying drawings is not intended to limit the scope of the claimed application, but merely represents the selected embodiments of this application. All other embodiments obtained by those skilled in the art based on the embodiments of this application without creative efforts fall within the protection scope of this application.

[0018] In the following description, the terms "first / second / third" involved are only used to distinguish similar objects, and do not represent a specific order for the objects. It can be understood that "first / second / third" can be interchanged with a specific order or sequence when permitted, so that the embodiments of this application described here can be implemented in an order other than that illustrated or described here.

[0019] It should be noted that the term "including" will be used in the embodiments of this application to indicate the existence of the features stated thereafter, but does not exclude the addition of other features.

[0020] Unless otherwise defined, all technical and scientific terms used herein have the same meaning as commonly understood by those skilled in the technical field to which this application belongs. The terms used herein are for the purpose of describing the embodiments of this application and do not limit this application.

[0021] See Figure 1 and Figure 2 , Figure 1It is a schematic flowchart of steps S101 - S104 of the on - chip RC oscillator calibration method based on an automated test equipment (ATE) provided by an embodiment of the present application. Figure 2 It is a schematic diagram provided by an embodiment of the present application, which will be described in combination with Figure 1 the steps S101 - S104 shown and Figure 2 will be explained.

[0022] In step S101, handshake communication is established between the automated test equipment and the target chip.

[0023] Here, the handshake communication between the automated test equipment and the target chip is achieved through a specific communication protocol and interface (such as JTAG). The purpose of the handshake communication is to ensure smooth communication between the test equipment and the chip, laying a foundation for subsequent data transmission and calibration operations.

[0024] In step S102, calibration data is sent to the target chip through the automated test equipment, so that the target chip updates the oscillation parameters of the RC oscillator based on the calibration data and returns an oscillation signal under the oscillation parameters.

[0025] Here, calibration data is sent to the target chip through the automated test equipment. These data are used to guide the RC oscillator inside the chip to adjust its oscillation parameters. Before sending the calibration data, the test equipment can perform corresponding configuration and initialization according to the model and specifications of the chip.

[0026] In step S103, the oscillation signal is received through the automated test equipment, the calibration data is adjusted based on the magnitude relationship between the oscillation signal and the reference frequency, and the oscillation signal is tested multiple times based on the adjusted calibration data until the frequency of the oscillation signal is closest to the reference frequency.

[0027] Here, the target chip updates the oscillation parameters of the RC oscillator based on the received calibration data and returns an oscillation signal under the oscillation parameters. The automated test equipment receives these oscillation signals and evaluates the calibration effect by comparing with the reference frequency. If there is a deviation between the frequency of the oscillation signal and the reference frequency, the test equipment will adjust the calibration data based on this deviation. This adjustment involves increasing or decreasing the value of the calibration data to gradually approach the reference frequency.

[0028] In step S104, the calibration data used when the frequency of the oscillation signal is closest to the reference frequency is determined as the target calibration data, and the target calibration data is written into the target chip.

[0029] Here, the automated test device conducts multiple tests on the oscillating signal based on the adjusted calibration data. After each test, the calibration data is further adjusted according to the test results. This process will be repeated until the frequency of the oscillating signal is closest to the reference frequency. When the deviation between the frequency of the oscillating signal and the reference frequency reaches a predetermined threshold (i.e., when it is closest to the reference frequency), the automated test device determines the calibration data used at this time as the target calibration data. Then, the test device writes these target calibration data into the target chip so that the chip can maintain a stable output frequency during future operations.

[0030] In some embodiments, referring to Figure 3 , Figure 3 is a schematic flowchart of steps S301 - S302 provided by an embodiment of the present application. The establishment of the handshake communication between the automated test device and the target chip can be achieved through steps S301 - S302, and will be described in conjunction with each step.

[0031] In step S301, the automated test device boots the handshake program to the RAM memory of the target chip through the JTAG interface and sets the program start address as the start address for calibrating the handshake program.

[0032] In step S302, after the BOOT process is completed, the automated test device shakes hands with the target chip.

[0033] Here, the automated test device transfers the handshake program to the RAM memory of the target chip through the JTAG interface. The JTAG interface is a commonly used debugging and programming interface that allows high - speed data transfer between the test device and the target chip. The handshake program is stored in the RAM memory of the target chip. After booting the handshake program to the RAM memory, the automated test device sets the start address of the program as the start address for calibrating the handshake program. When the program starts to execute, it will start reading instructions from this specific address.

[0034] Once the handshake program is successfully booted to the RAM memory of the target chip and the correct start address is set, the BOOT process is completed. At this time, the target chip is ready to execute the handshake program. Next, the automated test device shakes hands with the target chip. The handshake process usually involves a series of specific communication protocols and instruction exchanges to ensure that both parties can correctly identify each other and establish a stable communication connection. If the handshake process is successful, the communication connection between the automated test device and the target chip is established, and the test device can start sending calibration data to the chip and receiving the oscillating signal returned by the chip.

[0035] In some embodiments, when the automated test device shakes hands with the target chip, the automated test device sends a specific signal to the target chip and receives a reply signal from the internal program of the target chip to the specific signal, so as to complete the handshake communication between the automated test device and the target chip; the internal program of the target chip performs at least one of the following operations: Initialize the target chip, where the initialization includes configuring registers and setting an initial working state; Receive the handshake request signal sent by the automated test device and send a corresponding reply signal to confirm the successful handshake; After the handshake is successful, output a clock signal according to the instruction of the automated test device, where the clock signal is used for the calibration process of the RC oscillator; wherein, the clock signal is an oscillating signal that has been frequency-divided; During the process of the automated test device calibrating the RC oscillator, update the oscillation parameters of the RC oscillator according to the calibration data and calibration instructions sent by the automated test device, and return the updated oscillating signal to the automated test device.

[0036] The automated test device will send a specific signal to the target chip as the start of the handshake communication. This signal is usually a predefined instruction or data packet used to notify the target chip that the test device is ready for communication. After receiving this specific signal, the target chip will execute its internal program to respond to this signal. The internal program will check the legality of the signal and accordingly send a reply signal to the automated test device. This reply signal usually indicates that the target chip is ready to receive subsequent calibration data and instructions. After receiving the reply signal, the automated test device will verify its legality to confirm whether the handshake communication with the target chip has been successfully established. If the verification passes, then the communication link between the test device and the chip is officially established.

[0037] After the handshake communication is completed, the internal program of the target chip will perform a series of operations to support the subsequent RC oscillator calibration process: Initialization of the chip: Configure registers: The internal program will configure the registers of the chip to ensure that the chip operates in the correct state. These registers may include clock control registers, status registers, etc.

[0038] Set the initial working state: In addition to register configuration, the program will also set the initial working state of the chip, such as the working mode, power consumption level, etc.

[0039] Response to Handshake Request: During the handshake communication process, the internal program receives and processes the handshake request signal sent by the automated test equipment, and then sends a corresponding reply signal to confirm the successful handshake.

[0040] Output of Clock Signal: Generation of Clock Signal: After the handshake is successful, the internal program outputs a clock signal according to the instructions of the automated test equipment. This clock signal is usually a divided oscillation signal and is used for the subsequent calibration process of the RC oscillator.

[0041] Stability of Clock Signal: The output clock signal needs to have sufficient stability to ensure the accuracy of the calibration process.

[0042] Calibration of RC Oscillator: Receiving Calibration Data: During the calibration process of the RC oscillator by the automated test equipment, the internal program receives the calibration data and calibration instructions sent by the test equipment.

[0043] Updating Oscillation Parameters: According to the received calibration data and instructions, the internal program updates the oscillation parameters of the RC oscillator. These parameters may include capacitance value, inductance value, etc.

[0044] Return of Updated Oscillation Signal: After updating the oscillation parameters, the internal program returns the updated oscillation signal to the automated test equipment. The test equipment evaluates the calibration effect based on this signal and adjusts the subsequent calibration data and instructions accordingly.

[0045] Through the above process, the automated test equipment can establish a stable communication connection with the target chip and successfully calibrate the RC oscillator. This ensures that the chip can output a stable and accurate clock signal in subsequent operations.

[0046] In some embodiments, the sending of calibration data to the target chip by the automated test equipment includes: Controlling the automated test equipment to send calibration data and a calibration valid signal to the target chip through the GPIO interface, so that the target chip stores the calibration data in the calibration register of the RC oscillator, and after the calibration data takes effect, outputs the updated divided oscillation signal and a frequency valid signal to the automated test equipment through the GPIO.

[0047] The automated test equipment sends calibration data to the target chip through the GPIO (General-Purpose Input / Output) interface. The GPIO interface is a commonly used digital interface that can be used for data transmission and sending control signals. The test equipment sends the calibration data to the target chip through the GPIO interface. These data usually include values for adjusting the oscillation parameters of the RC oscillator, such as capacitance values, inductance values, or frequency adjustment values, etc. In addition to the calibration data, the test equipment also sends a calibration valid signal. This signal is used to notify the target chip that the currently sent data is valid calibration data and should be stored and used to update the parameters of the RC oscillator. After receiving the calibration data and the calibration valid signal, the target chip stores these data in the calibration register of the RC oscillator. The calibration register is a register specifically used to store calibration data, and its value directly affects the oscillation parameters of the RC oscillator. After storing the calibration data, the target chip updates the oscillation parameters of the RC oscillator according to these data. This process may involve adjusting components such as capacitors and inductors, as well as fine-tuning the oscillation frequency. After the parameter update is completed, the target chip outputs an updated and divided oscillation signal. This signal is generated by the RC oscillator according to the new oscillation parameters, and its frequency should be closer to the expected calibration target. At the same time, the target chip also sends a frequency valid signal to the automated test equipment through the GPIO interface. This signal is used to notify the test equipment that the currently output oscillation signal is valid and has been updated according to the latest calibration data.

[0048] The automated test equipment receives the updated and divided oscillation signal output by the target chip through the GPIO interface. The test equipment measures the frequency of the received signal to verify whether it meets the expected calibration target. This process involves comparing with a reference frequency and calculating the frequency error, etc. If the measurement result shows that the frequency does not meet the calibration target, the test equipment adjusts the calibration data according to the error value and sends it to the target chip again for a new round of calibration process. After multiple iterations and adjustments, when the measurement result shows that the frequency meets the calibration target, the test equipment ends the calibration process and stores the final calibration data in the memory of the test equipment for subsequent use.

[0049] Through the above process, the automated test equipment can accurately calibrate the RC oscillator in the target chip to ensure that it outputs a stable and accurate clock signal.

[0050] In some embodiments, adjusting the calibration data based on the magnitude relationship between the oscillation signal and the reference frequency includes: Compare the oscillation signal with the reference frequency. Let the reset calibration value of the target chip be a, and the calibration data be b. If the frequency of the oscillation signal is greater than the reference frequency, then b = a - 1; if the frequency of the oscillation signal is less than the reference frequency, then b = a + 1; Send the updated calibration data and the data valid signal to the target chip.

[0051] Here, in the in-chip RC oscillator calibration process based on an automated test device, the test device adjusts the calibration data according to the magnitude relationship between the oscillation signal and the reference frequency to ensure that the RC oscillator can output a stable and accurate clock signal.

[0052] The automated test device first obtains the divided oscillation signal from the target chip through the GPIO interface or other communication methods. The test device internally stores a reference frequency value, which represents the desired output frequency of the RC oscillator. The reference frequency is usually obtained through high-precision measurement and has high accuracy. The test device compares the obtained oscillation signal with the reference frequency to determine their frequency difference. Before starting the calibration process, an initial reset calibration value a is set inside the target chip. This value is usually an initial value used to guide subsequent calibration adjustments. If the frequency of the oscillation signal is greater than the reference frequency, it means that the output frequency of the RC oscillator is too high. To reduce the frequency, the test device adjusts the calibration data b to a - 1, that is, decreases the calibration value. If the frequency of the oscillation signal is less than the reference frequency, it means that the output frequency of the RC oscillator is too low. To increase the frequency, the test device adjusts the calibration data b to a + 1, that is, increases the calibration value.

[0053] After adjusting the calibration data, the test device sends a data valid signal to the target chip. This signal is used to notify the target chip that the currently sent calibration data is valid and should be used to update the parameters of the RC oscillator. The target chip receives the calibration data and the data valid signal from the test device through the GPIO interface or other communication methods. The target chip stores the received calibration data in the calibration register and updates the oscillation parameters of the RC oscillator according to these data. After the parameter update is completed, the target chip outputs the updated oscillation signal. This signal is closer to the reference frequency, thereby improving the accuracy and stability of the clock signal.

[0054] Through the above process, the automated test device can accurately adjust the calibration data of the RC oscillator in the target chip to ensure that it outputs a stable and accurate clock signal. This process is an iterative process and may require multiple comparisons, adjustments, and verifications until the expected calibration target is achieved.

[0055] In some embodiments, writing the target calibration data into the target chip includes: The target calibration data is written into the corresponding OTP in the target chip through the JTAG by the automated test device, so that when the target chip is used, the bootloader of the target chip can read the calibration data in the OTP and write it into the calibration register of the corresponding RC oscillator.

[0056] Here, after a series of calibration steps are completed, the automated test device determines a target calibration data. This data is obtained through a series of adjustment algorithms based on the comparison result between the oscillation signal and the reference frequency. The target calibration data aims to enable the RC oscillator to output a stable and accurate clock signal to meet the clock requirements of the system.

[0057] The OTP memory is a special area inside the target chip for storing some key parameters or configuration information. Once the OTP is written, its content cannot be modified (or can only be modified a limited number of times), which ensures the reliability and security of the stored information. The automated test device writes the target calibration data into the corresponding OTP area in the target chip.

[0058] When the target chip is started, its internal Bootloader program will run first. The Bootloader is a piece of firmware code used to initialize the system hardware, load the operating system or application programs, etc. The Bootloader reads the previously stored target calibration data from the OTP area. This process ensures that the optimal calibration data determined during the calibration process can be correctly applied to the RC oscillator. The Bootloader writes the read calibration data into the calibration register corresponding to the RC oscillator. After the calibration data is written into the calibration register, the RC oscillator adjusts its oscillation parameters according to these data. This process ensures that the RC oscillator can output a stable and accurate clock signal to meet the clock requirements of the system.

[0059] Through the above process, the automated test device can accurately write the target calibration data into the target chip and automatically apply these data through the Bootloader during application. This greatly improves the accuracy and stability of the clock signal output by the RC oscillator and provides a strong guarantee for the normal operation of the system.

[0060] In some embodiments, the method further includes: When testing the signal frequency sent by the target chip by the automated test device, set the sampling period of the automated test device to the minimum value to maximize the sampling frequency without exceeding the hardware performance and computing power of the automated test device.

[0061] Here, when performing frequency testing, the goal is to measure the signal frequency emitted by the target chip as accurately as possible. The setting of the sampling period directly affects the accuracy and reliability of the measurement results. The sampling period refers to the time interval between two consecutive samplings of the target chip signal by the automated test equipment. The shorter the sampling period, the more data points can be collected within the same time, thus potentially obtaining more accurate measurement results.

[0062] To maximize the sampling frequency without exceeding the hardware performance and computing power of the automated test equipment, the sampling period should be set to the minimum value of the equipment. This can ensure that as many data points as possible are collected within the limited test time, thereby improving the accuracy and reliability of the measurement results.

[0063] In summary, the embodiments of the present application have the following beneficial effects: (1) Improve calibration accuracy and efficiency: The embodiments of the present application achieve high-precision and high-speed sampling and data analysis through the ATE device, can accurately measure the output frequency of the RC oscillator, and automatically adjust the calibration data according to the difference from the reference frequency, thereby significantly improving the calibration accuracy. At the same time, the automated characteristics of the ATE device greatly shorten the calibration cycle and improve the overall efficiency of testing and calibration.

[0064] (2) Unify the calibration process: Aiming at the problem of inconsistent calibration methods for RC oscillators provided by different IP manufacturers, the embodiments of the present application provide a unified calibration process. Whether it is automatic calibration or manual calibration, standardized and process-based operations can be achieved through the ATE device, reducing the complexity of the calibration work and the dependence on specific IP manufacturers.

[0065] (3) Enhance chip stability and reliability: Through precise calibration, the output frequency of the RC oscillator can be stably maintained within the required range, thereby improving the overall stability and reliability of the digital chip. This is particularly important for application scenarios that require high-precision clock signals, such as communication, data processing, and other fields.

[0066] (4) Reduce calibration costs: The embodiments of the present application use the ATE device for calibration, without the need for additional calibration equipment or complex calibration environments, reducing calibration costs. At the same time, the reusability of the ATE device also improves the resource utilization efficiency.

[0067] Based on the same inventive concept, the embodiments of the present application also provide an in-chip RC oscillator calibration device based on an automated test equipment corresponding to the in-chip RC oscillator calibration method based on an automated test equipment in the first embodiment. Since the principle of solving problems by the device in the embodiments of the present application is similar to the above-mentioned in-chip RC oscillator calibration method based on an automated test equipment, the implementation of the device can refer to the implementation of the method, and the repeated parts will not be elaborated.

[0068] As shown in Figure 4 the figure, Figure 4 is a schematic structural diagram of an on-chip RC oscillator calibration device 400 based on an automated test device provided in an embodiment of the present application. The on-chip RC oscillator calibration device 400 based on the automated test device includes: A establishing module 401, configured to establish handshake communication between the automated test device and the target chip; A sending module 402, configured to send calibration data to the target chip through the automated test device, so that the target chip updates the oscillation parameters of the RC oscillator based on the calibration data and returns an oscillation signal under the oscillation parameters; An adjusting module 403, configured to receive the oscillation signal through the automated test device, adjust the calibration data based on the magnitude relationship between the oscillation signal and the reference frequency, and perform multiple tests on the oscillation signal based on the adjusted calibration data until the frequency of the oscillation signal is closest to the reference frequency; A determining module 404, configured to determine the calibration data used when the frequency of the oscillation signal is closest to the reference frequency as the target calibration data, and write the target calibration data into the target chip.

[0069] Those skilled in the art should understand that Figure 4 the implementation functions of the various units in the on-chip RC oscillator calibration device 400 based on the automated test device shown in the figure can be understood with reference to the relevant descriptions of the on-chip RC oscillator calibration method based on the automated test device described above. Figure 4 The functions of the various units in the on-chip RC oscillator calibration device 400 based on the automated test device shown in the figure can be implemented by a program running on a processor, or can be implemented by specific logic circuits.

[0070] In a possible implementation manner, the establishing module 401 establishing the handshake communication between the automated test device and the target chip includes: Booting a handshake program to the RAM memory of the target chip through the JTAG interface by the automated test device, and setting the program start address as the start address for calibrating the handshake program; After the BOOT process is completed, performing a handshake between the automated test device and the target chip.

[0071] In a possible implementation, when the establishment module 401 performs a handshake with the target chip through the automated test device, the automated test device sends a specific signal to the target chip and receives a reply signal of the specific signal from the internal program of the target chip to complete the handshake communication between the automated test device and the target chip; the internal program of the target chip performs at least one of the following operations: Initialize the target chip, where the initialization includes configuring registers and setting an initial working state; Receive a handshake request signal sent by the automated test device and send a corresponding reply signal to confirm successful handshake; After successful handshake, output a clock signal according to an instruction of the automated test device, where the clock signal is used for the calibration process of the RC oscillator; wherein, the clock signal is an oscillating signal that has been frequency-divided; During the process of the automated test device calibrating the RC oscillator, update the oscillation parameters of the RC oscillator according to the calibration data and calibration instructions sent by the automated test device, and return the updated oscillating signal to the automated test device.

[0072] In a possible implementation, the sending module 402 sends calibration data to the target chip through the automated test device, including: Control the automated test device to send calibration data and a calibration valid signal to the target chip through a GPIO interface, so that the target chip stores the calibration data in a calibration register of the RC oscillator, and after the calibration data takes effect, outputs the updated frequency-divided oscillating signal and a frequency valid signal to the automated test device through the GPIO.

[0073] In a possible implementation, the adjustment module 403 adjusts the calibration data based on the magnitude relationship between the oscillating signal and a reference frequency, including: Compare the oscillating signal with the reference frequency. Let the reset calibration value of the target chip be a and the calibration data be b. If the frequency of the oscillating signal is greater than the reference frequency, then b = a - 1; if the frequency of the oscillating signal is less than the reference frequency, then b = a + 1; Send the updated calibration data and a data valid signal to the target chip.

[0074] In a possible implementation, the determination module 404 writes target calibration data into the target chip, including: The target calibration data is written into the corresponding OTP in the target chip through the JTAG by the automated test device, so that when the target chip is used, the bootloader of the target chip can read the calibration data in the OTP and write it into the calibration register of the corresponding RC oscillator.

[0075] In a possible implementation manner, the method of the sending module 402 further includes: When the automated test device tests the signal frequency sent by the target chip, set the sampling period of the automated test device to the minimum value, so as to maximize the sampling frequency on the premise of not exceeding the hardware performance and computing power of the automated test device.

[0076] The above in-chip RC oscillator calibration device based on an automated test device has the following beneficial effects: (1) Improve calibration accuracy and efficiency: The embodiments of the present application use an ATE device to achieve high-precision and high-speed sampling and data analysis, can accurately measure the output frequency of the RC oscillator, and automatically adjust the calibration data according to the difference from the reference frequency, thereby significantly improving the calibration accuracy. At the same time, the automated characteristics of the ATE device greatly shorten the calibration cycle and improve the overall efficiency of testing and calibration.

[0077] (2) Unify the calibration process: In view of the problem that the calibration methods provided by different IP manufacturers for RC oscillators are inconsistent, the embodiments of the present application provide a unified calibration process. Whether it is automatic calibration or manual calibration, standardized and process-based operations can be achieved through the ATE device, reducing the complexity of the calibration work and the dependence on specific IP manufacturers.

[0078] (3) Enhance the stability and reliability of the chip: Through precise calibration, the output frequency of the RC oscillator can be stably maintained within the required range, thereby improving the overall stability and reliability of the digital chip. This is particularly important for application scenarios that require high-precision clock signals, such as communication and data processing fields.

[0079] (4) Reduce calibration costs: The embodiments of the present application use an ATE device for calibration, without the need for additional calibration equipment or a complex calibration environment, reducing calibration costs. At the same time, the reusability of the ATE device also improves the resource utilization efficiency.

[0080] As Figure 5 shown, Figure 5 is a schematic structural diagram of an electronic device 500 provided by an embodiment of the present application. The electronic device 500 includes: A processor 501, a storage medium 502, and a bus 503. The storage medium 502 stores machine-readable instructions executable by the processor 501. When the electronic device 500 runs, the processor 501 communicates with the storage medium 502 through the bus 503. The processor 501 executes the machine-readable instructions to perform the steps of the on-chip RC oscillator calibration method based on an automated test device according to the embodiments of the present application.

[0081] In practical applications, each component in the electronic device 500 is coupled together through the bus 503. It can be understood that the bus 503 is used to realize the connection and communication between these components. In addition to the data bus, the bus 503 also includes a power bus, a control bus, and a status signal bus. However, for the sake of clear illustration, in Figure 5 all kinds of buses are labeled as the bus 503.

[0082] The above-mentioned electronic device has the following beneficial effects: (1) Improve calibration accuracy and efficiency: The embodiments of the present application use an ATE device to achieve high-precision and high-speed sampling and data analysis, can accurately measure the output frequency of the RC oscillator, and automatically adjust the calibration data according to the difference from the reference frequency, thus significantly improving the calibration accuracy. At the same time, the automation feature of the ATE device greatly shortens the calibration cycle and improves the overall efficiency of testing and calibration.

[0083] (2) Unify the calibration process: To address the issue of inconsistent calibration methods for RC oscillators provided by different IP manufacturers, the embodiments of the present application provide a unified calibration process. Whether it is automatic calibration or manual calibration, standardized and procedural operations can be achieved through the ATE device, reducing the complexity of the calibration work and the dependence on specific IP manufacturers.

[0084] (3) Enhance chip stability and reliability: Through precise calibration, the output frequency of the RC oscillator can be stably maintained within the required range, thereby improving the overall stability and reliability of the digital chip. This is particularly important for application scenarios that require high-precision clock signals, such as communication, data processing, and other fields.

[0085] (4) Reduce calibration costs: The embodiments of the present application use an ATE device for calibration, eliminating the need for additional calibration equipment or complex calibration environments, and reducing calibration costs. At the same time, the reusability of the ATE device also improves the resource utilization efficiency.

[0086] The embodiments of the present application also provide a computer-readable storage medium. The storage medium stores executable instructions, which, when executed by at least one processor 501, implement the on-chip RC oscillator calibration method based on an automated test device according to the embodiments of the present application.

[0087] In some embodiments, the storage medium may be a ferromagnetic random access memory (FRAM), read-only memory (ROM), programmable read-only memory (PROM), erasable programmable read-only memory (EPROM), electrically erasable programmable read-only memory (EEPROM), flash memory, magnetic surface memory, optical disc, or compact disc read-only memory (CD-ROM), etc.; it may also be various devices including one or any combination of the above memories.

[0088] In some embodiments, the executable instructions may be in the form of a program, software, software module, script, or code, written in any form of programming language (including compiled or interpreted languages, or declarative or procedural languages), and may be deployed in any form, including being deployed as a stand-alone program or being deployed as a module, component, subroutine, or other unit suitable for use in a computing environment.

[0089] As an example, the executable instructions may or may not correspond to a file in the file system, may be stored as part of a file that holds other programs or data, for example, in one or more scripts in a hypertext markup language (HTML) document, stored in a single file dedicated to the program in question, or, stored in multiple cooperating files (such as files that store one or more modules, subroutines, or portions of code).

[0090] As an example, the executable instructions may be deployed to execute on one computing device, or on multiple computing devices located at one location, or, on multiple computing devices distributed at multiple locations and interconnected by a communication network.

[0091] The above computer-readable storage medium has the following beneficial effects: (1) Improve calibration accuracy and efficiency: The embodiments of this application use an ATE device to achieve high-precision and high-speed sampling and data analysis, which can accurately measure the output frequency of the RC oscillator and automatically adjust the calibration data according to the difference from the reference frequency, thus significantly improving the calibration accuracy. At the same time, the automation feature of the ATE device greatly shortens the calibration cycle and improves the overall efficiency of testing and calibration.

[0092] (2) Unify the calibration process: In view of the inconsistent calibration methods for RC oscillators provided by different IP manufacturers, the embodiments of this application provide a unified calibration process. Whether it is automatic calibration or manual calibration, standardized and procedural operations can be achieved through the ATE device, reducing the complexity of the calibration work and the dependence on specific IP manufacturers.

[0093] (3) Enhance the stability and reliability of the chip: Through precise calibration, the output frequency of the RC oscillator can be stably maintained within the required range, thus improving the overall stability and reliability of the digital chip. This is particularly important for application scenarios that require high-precision clock signals, such as communication, data processing, and other fields.

[0094] (4) Reduce calibration costs: The embodiments of this application use an ATE device for calibration, eliminating the need for additional calibration equipment or complex calibration environments, and reducing calibration costs. At the same time, the reusability of the ATE device also improves resource utilization efficiency.

[0095] In several embodiments provided in this application, it should be understood that the disclosed methods and electronic devices can be implemented in other ways. The device embodiments described above are merely illustrative. For example, the division of the units is only a logical function division, and there may be other division methods in actual implementation. For example, multiple units or components can be combined, or can be integrated into another system, or some features can be ignored, or not executed. In addition, the coupling, direct coupling, or communication connection between the various components shown or discussed can be through some interfaces, and the indirect coupling or communication connection of the devices or units can be electrical, mechanical, or other forms.

[0096] The modules described as separate components may or may not be physically separated, and the components shown as modules may or may not be physical units, that is, they can be located in one place, or can be distributed to multiple network units. Some or all of the units can be selected according to actual needs to achieve the purpose of the solution of this embodiment.

[0097] In addition, the functional units in each embodiment of this application can be integrated in a processing unit, or each unit can exist physically alone, or two or more units can be integrated in one unit.

[0098] When the above-mentioned function is implemented in the form of a software functional unit and sold or used as an independent product, it can be stored in a non-volatile computer-readable storage medium executable by a processor. Based on such an understanding, the technical solution of the present application, in essence, or the part that contributes to the prior art, or a part of the technical solution, can be embodied in the form of a software product. The computer software product is stored in a storage medium and includes several instructions for causing a computer device (which may be a personal computer, a platform server, or a network device, etc.) to execute all or part of the steps of the methods described in various embodiments of the present application. The foregoing storage medium includes: various media such as USB flash drives, mobile hard disks, ROM, RAM, magnetic disks, or optical discs that can store program codes.

[0099] The above are only specific embodiments of the present application, but the protection scope of the present application is not limited thereto. Any person skilled in the art within the technical scope disclosed by the present application can easily think of changes or substitutions, which should all be covered by the protection scope of the present application. Therefore, the protection scope of the present application shall be subject to the protection scope of the claims.

Claims

1. A method for calibrating an on-chip RC oscillator based on automated test equipment, characterized in that: The method comprises: Establishing handshake communication between the automated test equipment and the target chip; Sending calibration data to the target chip through the automated test equipment, so that the target chip updates the oscillation parameters of the RC oscillator based on the calibration data and returns an oscillation signal under the oscillation parameters; Receiving the oscillation signal through the automated testing equipment, adjusting the calibration data based on the magnitude relationship between the oscillation signal and the reference frequency, and performing multiple tests on the oscillation signal based on the adjusted calibration data until the frequency of the oscillation signal is closest to the reference frequency; The calibration data used when the frequency of the oscillation signal is closest to the reference frequency is determined as target calibration data, and the target calibration data is written into the target chip.

2. The on-chip RC oscillator calibration method based on automated test equipment according to claim 1, characterized in that: The step of establishing handshake communication between the automated test equipment and the target chip comprises: BOOT the handshake program to the RAM memory of the target chip through the JTAG interface by the automated test equipment, and set the program startup first address as the first address for calibrating the handshake program; After the BOOT process is completed, the automatic test equipment performs a handshake with the target chip.

3. The method according to claim 2, characterized in that When the automatic test device performs handshake with the target chip, the automatic test device sends a specific signal to the target chip, and receives a reply signal from the internal program of the target chip to the specific signal, so as to complete the handshake communication between the automatic test device and the target chip; the internal program of the target chip performs at least one of the following operations: Initializing the target chip, wherein the initialization includes configuring registers and setting an initial working state; Receive a handshake request signal sent by the automated test equipment, and send a corresponding reply signal to confirm that the handshake is successful; After the handshake is successful, a clock signal is output according to the instruction of the automated test equipment, and the clock signal is used in the calibration process of the RC oscillator; wherein the clock signal is an oscillation signal after frequency division; During the process of the automatic test equipment performing calibration of the RC oscillator, the oscillation parameters of the RC oscillator are updated according to the calibration data and calibration instructions sent by the automatic test equipment, and the updated oscillation signal is returned to the automatic test equipment.

4. The method according to claim 1, characterized in that: The sending calibration data to the target chip by the automated testing equipment comprises: Control the automated test equipment to send calibration data and a calibration valid signal to the target chip through the GPIO interface, so that the target chip stores the calibration data in the calibration register of the RC oscillator, and after the calibration data takes effect, outputs the updated divided oscillation signal and frequency valid signal to the automated test equipment through the GPIO.

5. The method according to claim 1, characterized in that The adjusting the calibration data based on the magnitude relationship between the oscillation signal and the reference frequency includes: Compare the oscillation signal with the reference frequency, assume that the reset calibration value of the target chip is a, and the calibration data is b. If the frequency of the oscillation signal is greater than the reference frequency, then b=a-1; if the frequency of the oscillation signal is less than the reference frequency, then b=a+1; The updated calibration data and data valid signal are sent to the target chip.

6. The method according to claim 1, characterized in that Writing target calibration data into the target chip comprises: The target calibration data is written into the corresponding OTP in the target chip through JTAG by the automated test equipment, so that when the target chip is used, the bootloader of the target chip can read the calibration data in the OTP and write it into the corresponding calibration register of the RC oscillator.

7. The method according to claim 1, characterized in that The method further comprises: When the automated testing equipment tests the frequency of the signal emitted by the target chip, the sampling period of the automated testing equipment is set to a minimum value to maximize the sampling frequency without exceeding the hardware performance and computing power of the automated testing equipment.

8. An on-chip RC oscillator calibration device based on automated test equipment, characterized in that: The device comprises: An establishment module, used to establish handshake communication between the automated test equipment and the target chip; A sending module, used for sending calibration data to the target chip through the automated test equipment, so that the target chip updates the oscillation parameters of the RC oscillator based on the calibration data and returns an oscillation signal under the oscillation parameters; an adjustment module, configured to receive the oscillation signal through the automated test equipment, adjust the calibration data based on a magnitude relationship between the oscillation signal and a reference frequency, and perform multiple tests on the oscillation signal based on the adjusted calibration data until the frequency of the oscillation signal is closest to the reference frequency; The determination module is used to determine the calibration data used when the frequency of the oscillation signal is closest to the reference frequency as the target calibration data, and write the target calibration data into the target chip.

9. An electronic device, characterized in that: include: A processor, a storage medium and a bus, wherein the storage medium stores machine-readable instructions executable by the processor, and when the electronic device is running, the processor communicates with the storage medium via the bus, and the processor executes the machine-readable instructions to perform the on-chip RC oscillator calibration method based on automated test equipment as described in any one of claims 1 to 7.

10. A computer-readable storage medium, characterized in that: The computer-readable storage medium stores a computer program, and when the computer program is executed by a processor, the on-chip RC oscillator calibration method based on automated testing equipment according to any one of claims 1 to 7 is executed.

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