Pusher for use in automatic test apparatus, test apparatus comprising pusher, and method of mechanically pushing device under test having single linear polarized antenna into device under test receptacle

Abstract

Embodiments in accordance with the present invention include a pusher (140, 240, 340, 520, 720, 950, 960, 101, 111, 121) for use in an automated test equipment (ATE) to mechanically push a device under test (DUT) (110, 1020, 1150, 1250) comprising an antenna (120, 220, 500, 600, 710, 810, 910) or an antenna array into a DUT socket (130). The pusher (140, 240, 340, 520, 720, 950, 960, 101, 111, 121) includes a structure (150, 250, 550, 101, 112, 1220) in which there are alternating parallel layers (150, 250, 550, 101, 112, 1220) of a relatively higher dielectric constant (160a, 260a, 560a, 1140) and a relatively lower dielectric constant (160a, 260a, 560a, 1140). The layers (150, 250, 550, 101, 112, 122) of higher dielectric constants (160a, 260a, 560a, 1140) and lower dielectric constants (160b, 260b, 560b) extend in a first direction (170, 270) that is within + / -45 degrees of the pushing direction (170, 270).

Description

[0001] Specification Technical Field

[0002] Embodiments according to the present invention relate to a pusher configured to push a device under test (DUT) into a DUT socket. Embodiments according to the present invention relate to a pusher configured to push a DUT having a single linear polarization antenna into a DUT socket. Further embodiments relate to a test apparatus including a DUT to be pushed by the pusher into a DUT socket (DUT receptacle). Further embodiments according to the present invention relate to the concept and / or design of a highly transparent pusher for a planar antenna module. Embodiments according to the present invention relate to a highly transparent pusher for an over-the-air test socket. Background Art

[0003] Millimeter-wave transceiver modules typically include electronic devices and planar antennas, which are located in a compact device. The size of the module is usually determined by the antenna aperture area or by the antenna array aperture area. Such modules are typically preferably (sometimes required) to be tested over-the-air (OTA) in automated test equipment (ATE) in a production environment. Processing and / or testing the module may require mechanically pushing the module into a DUT socket through a pusher mechanism or pusher on one side of or over the antenna or antenna array aperture.

[0004] The DUT antenna or antenna array is designed to have an air and / or (very) thin dielectric material layer on top, so as not to interfere with the DUT antenna or antenna array. For testing the DUT in ATE or for ATE testing, these conditions are partially mimicked or simulated by the pusher. The pusher can be part of an OTA socket and / or an ATE handling arm or ATE test unit, and may be a critical part in OTA testing because it contacts the antenna or antenna array in or of the DUT when pushing the DUT down into the DUT socket.

[0005] The problem with designing a pusher for an OTA test socket lies in the material of the pusher. The material of the pusher preferably has a (very) low dielectric constant, close to the dielectric constant of air, or more generally, the electrical properties of the pusher material preferably approach those of air. In addition, the pusher material preferably has mechanical strength to withstand the mechanical stress of multiple cycles of pushing the DUT into the DUT socket. In other words, the pusher is preferably electromagnetic transparent or nearly transparent to avoid interfering with the single linear polarization antenna of the DUT, while being mechanically strong and rigid. Unfortunately, due to physical reasons, there is no material that has both of these two properties simultaneously.

[0006] Dielectric materials known to have a (very) low relative dielectric constant can meet the requirements for electromagnetic transparency, but at the same time, these materials are mechanically soft. In contrast, mechanically rigid actuators made of high dielectric constant materials can cause antenna feed impedance mismatch and / or alter the antenna radiation pattern.

[0007] Therefore, there is a need for an actuator that has optimal performance in both electromagnetic transparency and mechanical stiffness. Summary of the Invention

[0008] An embodiment according to the present invention includes an actuator for an automated test equipment (ATE) to mechanically push a device under test (DUT) including an antenna or an antenna array into a DUT socket. The actuator includes a structure in which there are alternating parallel layers of relatively high dielectric constant and relatively low dielectric constant. The higher dielectric constant layers and the lower dielectric constant layers extend in a first direction that is within ±45° of the pushing direction.

[0009] To address the challenge of having a mechanically rigid but electromagnetic transparent or nearly transparent actuator, embodiments of the actuator or the structure of the actuator have a hybrid design that includes and / or mixes a mechanically soft material with a low dielectric constant and a mechanically strong material with a high dielectric constant. An actuator having such a hybrid design can be applied to push a DUT having a single-polarization antenna.

[0010] In other words, to avoid affecting (or overly affecting) the electromagnetic waves received or transmitted by the DUT antenna or DUT antenna array, the design of the actuator and the dimensions of the high dielectric constant dielectric layers and / or low dielectric constant dielectric layers of the actuator may be important or critical to the actuator. The higher dielectric constant layers increase the mechanical stiffness of the actuator, while the lower dielectric constant layers increase the electromagnetic transparency of the actuator.

[0011] In addition, extending the higher dielectric constant dielectric layers in a direction parallel within ±45° of the pushing direction, or having the surfaces of the parallel layers perpendicular within ±45° of the pushing direction, can also improve the stability, durability, and mechanical stiffness of the actuator.

[0012] In a preferred embodiment, the ratio between the thickness of the higher dielectric constant layers and the thickness of the lower dielectric constant layers is between 1:10 and 2:1.

[0013] The main requirements for the actuator are mechanical stiffness and electromagnetic transparency. The thicknesses of the higher dielectric constant layers and the lower dielectric constant layers are selected such that the actuator remains transparent or nearly transparent to the electromagnetic waves transmitted or received by the antenna or antenna array of the DUT, while maintaining mechanical rigidity for pushing the DUT into the DUT socket. Based on experiments conducted previously, a ratio between 1:10 and 2:1 meets this requirement.

[0014] According to an embodiment, a structure of alternating layers of a relatively high dielectric constant and a relatively low dielectric constant includes a relatively high dielectric constant dielectric region having a volume percentage between 9% and 66.6% or between 20% and 60%, and a relatively low dielectric constant dielectric region having a volume percentage between 91% and 33.3% or between 80% and 40%. Preferably, the structure includes a relatively high dielectric constant dielectric region having a volume percentage between 30% and 50%, and a relatively low dielectric constant dielectric region having a volume percentage between 70% and 50%.

[0015] The ratio between the relatively high dielectric constant dielectric region or the layer of the relatively high dielectric constant and the relatively low dielectric constant dielectric region or the layer of the relatively low dielectric constant should be selected appropriately so that the pusher remains transparent or almost transparent to the electromagnetic waves transmitted or received by the antenna or antenna array of the DUT, while maintaining mechanical rigidity for pushing the DUT into the DUT socket.

[0016] In a preferred embodiment, the surface of the pusher configured to contact the device under test is formed, configured, or machined such that the pusher (e.g., within a distance of 1 / 10 of the wavelength of the electromagnetic waves transmitted or received by the antenna of the DUT) avoids contacting or approaching the conductive edge of the DUT antenna. The conductive edge may be the metal edge of the antenna structure and has a great influence on radiation.

[0017] The pusher contacting or approaching the DUT antenna will have a negative impact on the performance of the DUT antenna. The dielectric loading of the radiation edges of the DUT antenna or their proximity to each other will affect their resonance. Changing the resonance will change the feed impedance and radiation behavior of the antenna. In addition, if the pusher is large compared to the wavelength and has a non-negligible dielectric constant, it is preferably to avoid any resonance inside the pusher, because this will lead to changes (sometimes catastrophic changes) in the radiation and feeding characteristics.

[0018] In a preferred embodiment, the pusher includes a spacer configured between the alternating parallel layer structure and the DUT. The spacer is perpendicular to the alternating parallel layers with a tolerance within + / - 15°, and / or the spacer is parallel to the surface of the DUT to be pushed by the pusher with a tolerance within + / - 15°.

[0019] The benefit of the spacer is that it is replaceable, so in any case, there is no need to replace the entire pusher, only the spacer needs to be replaced. In addition, if the pusher has to adapt to a new DUT or is damaged, only the spacer needs to be replaced, thus saving costs and materials.

[0020] In a preferred embodiment, the spacer is a structured spacer, that is, it is further formed, configured, or processed to contact the device under test such that the spacer avoids contacting or approaching the conductive edges of the DUT antenna, for example, within a distance of 1 / 10 of the wavelength of the electromagnetic wave transmitted or received by the antenna of the DUT. The conductive edges may be the metal edges of the antenna structure and have a great influence on radiation.

[0021] Since the spacer is replaceable, each antenna design can have a dedicated spacer, thus avoiding contacting or approaching the conductive edges of the antenna or antenna array of the DUT. That is to say, the same pusher can use different spacers for different DUTs, making the pusher and ATE more flexible.

[0022] In a preferred embodiment, the relative dielectric constant of the spacer is less than or equal to 1.5.

[0023] The spacer is made of a dielectric material with a relatively low dielectric constant and is configured to be in close contact with the DUT antenna without contacting or approaching the conductive edges of the antenna, so as to be transparent or almost transparent to the electromagnetic waves received or transmitted by the DUT antenna.

[0024] In a preferred embodiment, the thickness of the spacer is between 50 microns and 500 microns.

[0025] The spacer is configured to cover the entire surface area of the DUT antenna. Even if the surface area of the antenna is uneven, the thickness of 50 microns to 500 microns mentioned above helps to achieve this goal. In addition, good mechanical stability can be achieved without overly reducing the antenna function.

[0026] In a preferred embodiment, the thickness of the spacer is between 100 microns and 200 microns.

[0027] If the antenna area of the DUT is slightly (or sufficiently) flat, a thickness between 100 microns and 200 microns may also be sufficient to cover the entire surface area of the DUT antenna.

[0028] In a preferred embodiment, the pusher includes a dielectric plate, such as a dielectric plate made of a mechanically rigid material with a relatively high dielectric constant, which is transverse or perpendicular to the pushing direction with a tolerance within + / - 15°. The dielectric plate is configured to mechanically support and / or stabilize at least the layer with a relatively high dielectric constant.

[0029] The dielectric plate with relatively high mechanical strength is transverse to the pushing direction and is connected to the layer with a relatively high dielectric constant. This makes the pusher more durable, rigid, and stable. For example, if the surface of the DUT is uneven, this can prevent the single layer with a relatively high dielectric constant of the pusher from moving independently.

[0030] In a preferred embodiment, the thickness of the dielectric plate is equal to an integer multiple of half the wavelength of the electromagnetic wave in the dielectric material of the dielectric plate that is transmitted or received by the DUT antenna, for example, at the center frequency of the DUT operating frequency band, with a tolerance within 1 / 10 of the wavelength of the electromagnetic wave that is transmitted or received by the antenna of the DUT, for example, at the center frequency of the DUT operating frequency band. It is calculated as the free space wavelength divided by the square root of the relative permittivity of the dielectric. The distance between the dielectric plate and the surface of the antenna of the device under test is at least one wavelength of the electromagnetic wave that is transmitted or received by the antenna of the DUT, for example, at the center frequency of the DUT operating frequency band.

[0031] The dielectric plate is made of a material with high mechanical strength and has a relatively high relative permittivity. The dielectric plate is preferably as electromagnetic transparent as possible. Therefore, when choosing the thickness of the plate and / or the distance between the DUT antenna and the plate, the negative impact of the plate on the electromagnetic wave transmitted or received by the DUT antenna should be minimized. For example, the loss of the electromagnetic wave transmitted or received by the DUT antenna should be minimized.

[0032] In a preferred embodiment, the length of the alternating parallel layers in the pushing direction is, for example, between 0.5 and 2 times the free space wavelength of the electromagnetic wave that is transmitted or received by the DUT antenna at the center frequency of the DUT operating frequency band.

[0033] The length of the alternating parallel layers, that is, the length of the pusher structure in the pushing direction, for example, the length in the main lobe direction of the electromagnetic wave transmitted or received by the DUT antenna, defines the amount of electromagnetic wave absorbed by the pusher. A pusher with a finite length or alternating parallel layers with a finite length limits the amount of electromagnetic wave absorbed from the electromagnetic wave transmitted or received by the DUT antenna. Therefore, in the case where the length of the alternating parallel layers is finite, the pusher is as transparent as possible to the electromagnetic wave transmitted or received by the DUT antenna while maintaining mechanical rigidity.

[0034] In a preferred embodiment, the relative permittivity of the relatively high relative permittivity layer is greater than 2 or preferably between 2.5 and 4.

[0035] Materials with high mechanical strength have a high relative permittivity. Materials used to provide mechanical stability and strength to the pusher are found to have a relative permittivity of at least 2. A relative permittivity between 2.5 and 4 can well balance mechanical strength and electromagnetic transparency.

[0036] In a preferred embodiment, the relatively high relative permittivity layer is made of a polymer or polycarbonate or quartz or polytetrafluoroethylene or PEEK material.

[0037] In a preferred embodiment, the relative permittivity of the relatively low relative permittivity layer is less than or equal to 1.5.

[0038] Materials with a relatively low dielectric constant (dielectric constant of 1.5) are transparent or nearly transparent to the electromagnetic waves emitted or received by the DUT antenna.

[0039] In a preferred embodiment, the relatively low dielectric constant layer includes air.

[0040] Air has a low relative dielectric constant. Therefore, in a simple pusher design, only the relatively high dielectric constant layer is constructed, while the relatively low dielectric constant layer is left empty, for example filled with air. In this case, the air around and / or between the relatively high dielectric constant layers is part of the pusher structure.

[0041] In a preferred embodiment, the pushing direction is parallel to the far-field direction of the electric field in the main lobe of the DUT antenna, with a tolerance within + / - 15°. Alternatively, the pushing direction is perpendicular to the main surface of the DUT, with a tolerance within + / - 15°. Another option is that the pushing direction is perpendicular to the main surface of the DUT socket, with a tolerance within + / - 15°.

[0042] To improve the transparency of the pusher to the electromagnetic waves emitted or received by the DUT antenna, the effective area of the pusher structure should be minimized, especially the effective area of the relatively high dielectric constant layer of the pusher. If the direction of the structure (e.g., the extension of the layer) is parallel to the main lobe of the received or emitted electromagnetic waves, the effective area of the structure is minimized. In most cases, the main lobe is also perpendicular to the main surface of the DUT or the DUT socket, with a tolerance within + / - 15°.

[0043] Another embodiment includes a test device for testing a device under test. The test device includes a device under test having an antenna or an antenna array, the above-mentioned pusher, and a device under test socket. The device under test having an antenna or an antenna array in the test device is configured to be pushed into the device under test socket by the above-mentioned pusher. The antenna of the DUT is a single linear polarization antenna.

[0044] According to another embodiment of the present invention, a method of mechanically pushing a device under test including an antenna or an antenna array into a device under test socket of an automated test equipment is created. The method includes mechanically pushing the device under test into the device under test socket with the above-mentioned pusher. The antenna of the DUT is a single linear polarization antenna.

[0045] It should be noted that the methods and the corresponding devices are based on the same considerations. In addition, these methods can be supplemented by any features or functions and details of the devices described herein individually and in combination. Description of the Drawings

[0046] Embodiments according to the present application will be described subsequently with reference to the drawings, wherein:

[0047] Figure 1Schematic diagram of an embodiment of a test apparatus including a DUT socket, a DUT with an antenna, and a pusher;

[0048] Figure 2 Schematic diagram of an embodiment of a pusher configured to repeatedly push a DUT into a DUT socket;

[0049] Figure 3 Picture of an embodiment of a test apparatus without a DUT, the test apparatus including a pusher and a DUT socket with a test antenna;

[0050] Figure 4 Shows a dielectric constant - strength graph, where the abscissa value represents the dielectric constant value and the ordinate value represents the flexural strength value;

[0051] Figure 5a Shows an initial DUT patch antenna without any pusher;

[0052] Figure 5b Shows a DUT patch antenna and a traditional pusher;

[0053] Figure 5c Shows a DUT patch antenna with a dielectric plate having a higher dielectric constant;

[0054] Figure 5d Shows a DUT patch antenna and a pusher structure including alternating parallel layers of relatively high dielectric constant and air layers or relatively low dielectric constant layers;

[0055] Figure 5e Shows a DUT patch antenna and a dielectric spacer with a lower dielectric constant;

[0056] Figure 6a Shows a 3D simulation of a DUT with a dual - polarized patch antenna;

[0057] Figure 6b Shows a graph of the measured results of the input reflection coefficient of the simulation and a Smith chart;

[0058] Figure 7a Shows a 3D simulation of an arrangement including a patch antenna and a traditional pusher;

[0059] Figure 7b Shows the measured results of the simulation input reflection coefficient of a selected polarization of a dual - polarized antenna on a graph and a Smith chart when the relative dielectric constant of the pusher is 1.0, and the radiation patterns in two exemplary vertical cross - sections;

[0060] Figure 7cShows the simulated input reflection coefficient measurement results of a selected polarization of a dual-polarized antenna on a graph and a Smith chart when the relative permittivity of the pusher is 1.2, as well as the radiation patterns in two exemplary vertical cross-sections;

[0061] Figure 7d Shows the simulated input reflection coefficient measurement results on a graph and a Smith chart of a selected polarization of a dual-polarized antenna when the relative permittivity of the pusher is 3.6, as well as the radiation patterns in two exemplary vertical cross-sections;

[0062] Figure 8a Shows a 3D simulation of a device including a patch antenna and a spacer layer;

[0063] Figure 8b Shows the simulated input reflection coefficient measurement results on a graph and a Smith chart when the relative permittivity of the spacer is 1.3;

[0064] Figure 9a Shows 3D simulations of three different test devices;

[0065] Figure 9b Shows the Figure 9a results of simulated input reflection coefficient measurements on the first 3D simulation test device of [], where there is no pusher;

[0066] Figure 9c Shows the Figure 9a results of simulated input reflection coefficient measurements on the second 3D simulation test device of [], where the pusher is a simplified block with a relative permittivity of 1.1;

[0067] Figure 9d Shows the Figure 9a results of simulated input reflection coefficient measurements on the second 3D simulation test device of [], where the pusher is a simplified block with a relative permittivity of 1.2;

[0068] Figure 9e Shows the Figure 9a results of simulated input reflection coefficient measurements on the second 3D simulation test device of [], where the pusher is a simplified brick with a relative permittivity of 1.3;

[0069] Figure 9f Shows the Figure 9a results of simulated input reflection coefficient measurements on the third 3D simulation test device of [], where the pusher is a layered pusher of 39 slats with a relative permittivity of 1.3;

[0070] Figure 9g Shows the Figure 9aResults of simulated input reflection coefficient measurements on the third 3D simulation test device, where the pusher is a layered pusher of 39 slats with a relative permittivity of 2.5;

[0071] Figure 10a Shows the 3D simulation of the test device;

[0072] Figure 10b Shows Figure 10a The simulation test device, which is constructed layer by layer from three images;

[0073] Figure 10c Shows the Figure 10a Results of simulated input reflection coefficient measurements on the test device, which includes a pusher with 39 slats and a structured spacer layer with relative permittivities of 2.5 and 1.3, respectively;

[0074] Figure 10d Shows the Figure 10a Results of simulated input reflection coefficient measurements on the test device, which includes a pusher with 39 slats and a structured spacer layer with relative permittivities of 3.1 and 1.3, respectively;

[0075] Figure 10e Shows the Figure 10a Results of simulated input reflection coefficient measurements on the test device, which includes a pusher with 39 slats and a structured spacer layer with relative permittivities of 3.6 and 1.3, respectively;

[0076] Figure 11a Shows two images of the same 3D simulation test device including a pusher and a DUT with an antenna;

[0077] Figure 11b Shows the Figure 11a Results of simulated input reflection coefficient measurements on the test device, where the pusher has 15 slats with a structured spacer layer made of materials with relative permittivities of 3.6 and 1.3, respectively;

[0078] Figure 12a Shows the simulation test device, namely Figure 11a The simulation test device, where the pusher has an additional dielectric plate;

[0079] Figure 12b Shows the Figure 12a Results of simulated input reflection coefficient measurements on the test device, which has a layered pusher of 15 slats and a structured spacer layer; and

[0080] Figure 13A comparison table showing the variation of the feed reflection coefficient is presented. Detailed implementation

[0081] In the following, different inventive embodiments and aspects will be described. Additionally, further embodiments will be defined by the appended claims. It should be noted that any embodiment defined by the claims can optionally be supplemented by any details, features, and functions described herein. Moreover, the embodiments described herein can be used alone or, optionally, supplemented by any details, features, and functions included in the claims.

[0082] Furthermore, it should be noted that the various aspects described herein can be used alone or in combination. Thus, details can be added to each of the said individual aspects without adding details to another said aspect. It should also be noted that the present disclosure explicitly or implicitly describes features that can be used in an automated test device, a test apparatus, or a pusher. Therefore, any feature described herein can be used in the scenario of an automated test device, the scenario of a test apparatus, or the scenario of a pusher.

[0083] In addition, the features and functions related to the method disclosed herein can also be used in a device configured to perform these functions. Moreover, any features and functions regarding the device disclosed herein can also be used in the corresponding method. In other words, the methods disclosed herein can be supplemented by any features and functions described regarding the device.

[0084] The present invention will be more fully understood from the detailed description given below and the drawings of the embodiments of the present invention. However, these should not be considered as limiting the present invention to the specific embodiments described, but only for explanation and understanding.

[0085] According to Figure 1 the embodiment of

[0086] Figure 1 A schematic diagram of an embodiment of a test apparatus 100 is shown, which is used to test a device under test (DUT) 110 including one or more antennas 120 and / or an antenna array 120. The test apparatus 100 includes an embodiment of a DUT socket 130, a DUT 110 having an antenna 120, and a pusher 140.

[0087] The test apparatus 100 is configured to test the DUT 110, particularly the antenna 120 of the DUT 110. The DUT 110 is configured to be pushed into the device under test socket 130 by the pusher 140 along the pushing direction 170.

[0088] The pusher 140 is a schematic diagram of an embodiment, including a structure 150 that includes alternating parallel layers of a relatively high dielectric constant 160a and a relatively low dielectric constant 160, where "relatively" means that the dielectric constant of a given dielectric region is higher or lower relative to other dielectric regions of the pusher 140. The structure 150 and / or the alternating parallel layers of the relatively high dielectric constant 160a and the relatively low dielectric constant 160b extend in a direction within + / - 45° of the pushing direction 170.

[0089] The pusher 140 is configured to mechanically push a device under test 110 including an antenna 120 or an antenna array 120 into a device under test socket 130 of an automated test equipment. Compared with traditional pushers, the structure 150 of the pusher 140 with alternating parallel layers of a relatively high dielectric constant 160a and a relatively low dielectric constant 160b significantly improves the transparency of the pusher 140 to electromagnetic waves transmitted or received by the antenna 120 of the DUT 110, while the pusher 140 maintains sufficient mechanical rigidity to repeatedly push the DUT 110 into the DUT socket 130 in a production environment.

[0090] The structure 150 includes a relatively high dielectric constant dielectric region 160a with a volume percentage between 9% and 66.6% or between 20% and 60% and a relatively low dielectric constant dielectric region 160b with a volume percentage between 91% and 33.3% or between 80% and 40%. Preferably, the structure includes a relatively high dielectric constant dielectric region 160a with a volume percentage between 30% and 50% and a low dielectric constant dielectric region 160b with a volume percentage between 70% and 50%.

[0091] The layer 160a with a relatively high dielectric constant has a relative dielectric constant, for example, greater than 2 or preferably between 2.5 and 4, such as a polymer or polycarbonate or quartz or polytetrafluoroethylene or PEEK material. The layer 160b with a relatively low dielectric constant has a relative dielectric constant, for example, less than or equal to 1.5. As Figure 2 shown, the relatively low dielectric constant dielectric region may also include air.

[0092] According to Figure 2 Example of

[0093] Figure 2 A schematic diagram of an embodiment of a pusher 240 with an antenna 220 of a DUT is shown, and this pusher is similar to Figure 1 the pusher 140. The pusher includes a spacer 290, a structure 250, and a dielectric plate 280, and there are alternating parallel layers of a relatively high dielectric constant layer 260a and a relatively low dielectric constant layer 260b in the structure 250.

[0094] The pusher 240 is configured to repeatedly push the DUT 220 (similar to the Figure 1 DUT 110) into the DUT socket. The DUT includes at least an antenna 220 or an antenna array that transmits or receives electromagnetic waves 210. The antenna is a single linear polarization antenna.

[0095] The spacer 290 of the pusher is connected to the pusher structure 250 and is configured to be located between the structure 250 and the DUT or the antenna 220 of the DUT. The spacer is perpendicular to the surfaces of the alternating parallel layers 260a, 260b of the pusher 240, with a tolerance within + / - 15°. The spacer is made of a mechanically soft dielectric material with a relative dielectric constant less than 1.5. The spacer is configured or machined such that the spacer avoids contact or proximity to the conductive edges of the DUT antenna within a range of 1 / 10 of the wavelength of the electromagnetic waves transmitted or received by the antenna 220. The conductive edges may be the metal edges of the antenna structure and have a great influence on radiation.

[0096] The dielectric plate 280 is connected to the higher dielectric constant dielectric column 260a and is arranged transversely or perpendicular to the pushing direction 270, with a tolerance within + / - 15°.

[0097] The dielectric plate 280 of the pusher 240 is configured to mechanically support at least the relatively higher dielectric constant layer 260a of the structure 250. In order to remain transparent or almost transparent to the electromagnetic waves 210 transmitted or received by the antenna 220, the thickness of the dielectric plate 280 is an integer multiple of half the wavelength of the electromagnetic waves 210 in the dielectric material of the dielectric plate 280. The calculation formula is the free space wavelength divided by the square root of the relative dielectric constant of the dielectric. The thickness tolerance is 1 / 10 of the wavelength of the electromagnetic waves transmitted or received by the antenna 220, for example, at the center of the operating frequency band of the DUT.

[0098] The structure 250 of the pusher is similar to the Figure 1 pusher structure 150, where the length of the alternating parallel layers 260a, 260b in the pushing direction is between 0.5 and 2 times the free space wavelength of the electromagnetic waves transmitted or received by the antenna 220 of the DUT.

[0099] The pusher 240 can also be used in a test device, similar to the Figure 1 test device 100. A picture of the test device with the pusher is shown in Figure 3 .

[0100] According to Figure 3 Example of

[0101] Figure 3 Shows a picture of an embodiment of a test device 300 similar to the Figure 1 test device 100. The test device 300 includes a pusher 340 (similar to theFigure 1 the pusher 140 or Figure 2 the pusher 240), and the DUT socket 330. The DUT of the test device 300 is not shown, but Figure 3 further shows a test antenna 350 of an automated test equipment (ATE), which is configured to perform an over-the-air (OTA) test or measurement on the DUT.

[0102] According to Figure 4 dielectric constant-strength diagram

[0103] Figure 4 A dielectric constant-strength graph 400 is shown, where the abscissa value represents the dielectric constant value and the ordinate value represents the flexural strength value. Different materials are represented in this graph, such as ceramics 450, polymers 452, polymer foams 454, and sandwich layers 456. Existing pusher (or socket) materials 410, ideal pusher materials 430, and available pusher materials 440 are also marked on the graph.

[0104] The graph shows that the existing pusher (or socket) materials 410 have satisfactory flexural strength, but their dielectric constants are higher than the ideal value. A satisfactory dielectric constant should be to the left of line 420, or less than or equal to 1.5. The position of the ideal material 430 is shown in the graph, but there is no known material that meets these requirements. The existing material with a dielectric constant less than or equal to 1.5 is a polymer foam, and its flexural strength is 1 / 100 of that of the existing or traditional pusher materials 410 th . As shown, the available materials 440 with low dielectric constants do not have the preferred flexural strength.

[0105] There is currently no ideal material that can meet the requirements of a low dielectric constant (e.g., less than 1.5) and a high flexural strength (higher than 30 MPa), so an improved design concept is needed. Figure 2 The design concept adopted by the pusher 240 of

[0106] Design concept according to Figure 5

[0107] Figure 5a -e shows schematic diagrams of the existing pusher design concept and the new pusher design concept.

[0108] Figure 5a Shows an initial state, such as a patch antenna 500 without any pusher. The patch antenna 500 is used as a typical example of a planar antenna. It has two opposite radiation edges 503, 506, and the electric field 509 is mainly perpendicular to these two edges. The operating frequency and feed impedance are determined by the resonance of the electromagnetic field 509, and the electromagnetic field is enclosed between the ground and the patch and between the two radiation edges 503, 506.

[0109] That is to say, Figure 5a shows an initial arrangement of a single patch antenna 500 without any pusher. The antenna radiates or emits electromagnetic waves 510, which are preferably not affected by the pusher in an ideal test setup.

[0110] Figure 5b shows Figure 5a the patch antenna 500 and a conventional pusher 520, which has a conventional design concept. The whole or solid block of the pusher 520 is configured to push the DUT - antenna 500 into the DUT socket. The conventional pusher 520 is made of Figure 4 the existing pusher material 410 in

[0111] In this conventional design, the dielectric loading of the radiation edges or their proximity affects the resonance of the DUT - antenna 500. The dielectric pusher 520 will change the resonance of the DUT - antenna 500, thus changing the feed impedance and radiation behavior of the DUT antenna. If the pusher is large compared to the wavelength and has a non - negligible dielectric constant, it is preferably to avoid any resonance occurring within the pusher itself, because this will ultimately lead to significant or sometimes even catastrophic changes in the radiation and feed characteristics. Figure 5c -e introduces three dielectric structural features of the pusher and their specific electromagnetic features.

[0112] Figure 5c shows a dielectric plate 580 made of a hard, mechanically strong, higher dielectric constant dielectric material placed parallel to the antenna aperture plane of the DUT - antenna 500. The thickness of the plate 580 is an integer multiple of half the wavelength of the electromagnetic wave in the dielectric material of the dielectric plate 580, with a tolerance within 1 / 10 of the wavelength of the electromagnetic wave emitted or received by the DUT antenna 500.

[0113] The distance between the DUT antenna 500 and the dielectric plate 580 is at least one wavelength of the electromagnetic wave emitted or received by the DUT - antenna 500. The hard, mechanically strong, higher dielectric constant dielectric material required for mechanical stability cannot contact the radiation slots or the metal or conductive edges of the antenna aperture plane, otherwise it will cause feed impedance detuning. The conductive edge may be the metal edge of the antenna structure, which has a great influence on radiation.

[0114] Figure 5dShows a patch antenna 500 and a pusher structure 550, which consists of alternating parallel layers of relatively high dielectric constant and air or relatively low dielectric constant. Structure 550 (a laminated stack of thin sheets of a high dielectric constant dielectric material separated by air or low dielectric constant spacer layers in between) provides a lower effective dielectric constant for the electric field perpendicular to the plane of the sheet and a higher effective dielectric constant for the electric field parallel to the plane of the sheet.

[0115] If the direction of the electric field is known, then the influence of the properly oriented structure 550 or the laminated stack 560a of thin sheets of high dielectric constant dielectric material on the performance of the DUT - antenna 500 will be less.

[0116] Figure 5e Shows a DUT patch antenna 500 and a low dielectric constant dielectric spacer 590. The DUT with the patch antenna 500 is configured to be pushed into a DUT socket by the spacer 590 or spacer layer 590.

[0117] The surface of a planar antenna includes, for example, a dielectric surface area, metal edges, and metal surface areas. In terms of the surface contacted by a dielectric pusher, the most sensitive areas are the metal edges and the dielectric areas close to them, because these areas may form radiating edges or slots, while the metal surface is not a critical area.

[0118] Some structured dielectric spacers or spacer layers or sheets provide mechanical contact between the planar antenna surface and the pusher only in the metal areas and non - critical dielectric areas of the antenna surface. Preferably, the radiating edges or slots are not in direct contact, and some small air gaps are provided above these edges or slots.

[0119] Figure 5c and 5e The concept of... is very obvious and can be directly implemented, while Figure 5d the concept of... further quantifies the trade - off between input and return. In the subsequent figures, the design concept of... - e is simulated. Figure 5a -e is simulated.

[0120] Antenna simulation according to Figure 6

[0121] Figure 6a Shows a 3D simulation of a DUT with a dual - polarized patch antenna, which is a possible example of the patch antenna 500 in Figure 5. The example antenna 600 used in Figure 6 can quantify the performance in a simulation using electromagnetic field simulation software. The example antenna 600 is a bilinear - polarized microstrip patch antenna. It represents the vast majority of planar antennas because its operating principle and problems are common to all patch and slot antennas.

[0122] The center operating frequency of 28 GHz is used in the simulation. The characteristic line impedance of the terminal ports of the two feed lines is approximately 35 ohms.

[0123] Figure 6b The measured results of the simulated input reflection coefficient on the frequency-reflection graph 630 and the Smith chart 660 are shown. The graph shows the input reflection coefficient. The marker corresponds to approximately (40.9 + j1.0) Ω at 28 GHz.

[0124] Simulation of traditional thruster according to Figure 7

[0125] Figure 7a A 3D simulation of a device is shown. The device includes a patch antenna 710 of the DUT (similar to the patch antenna 600 in FIG. 6) and a conventional solid dielectric pusher 720. The pusher 720 is configured to mechanically push the main surface of the DUT or the DUT antenna into the DUT socket, as also shown in Figure 5b the design concept.

[0126] Figure 7b -d shows the results of measuring the simulated input reflection coefficient of the Figure 7a device, where different pushers are used, for example, the pusher has different relative dielectric constants. The center operating frequency of 28 GHz is used in the simulation. The characteristic line impedance of the terminal ports of the two feed lines is approximately 35 ohms.

[0127] Figure 7b Shows the results of measuring the simulated input reflection coefficient carried out in Figure 7a the first case, in which the pusher is made of a material with a relative dielectric constant of 1.0, such as air or vacuum. This is equivalent to having no pusher. Note that Figure 6b the results presented in Figure 7b (such as testing the antenna of the device in air) are slightly different because, for accurate comparison, in Figure 7b -d, the size of the computational domain is kept equal for all simulations including the pusher. That is, to be able to compare the Figure 6b measurements in -d, the computational domain includes the pusher, while this is not the case for the results in

[0128] Figure 7b Shows the results of measuring the simulated input reflection coefficient, where the pusher 720 is made of a material with a relative dielectric constant of 1, which is equivalent to having no pusher. The size of the pusher is considered in the simulation, so the simulated measurement results are slightly different from the simulated measurement results in the graph 630 and the Smith chart 660 of FIG. 6.

[0129] The simulated measurement results of the input reflection coefficient are shown in Figure 732 and Smith Chart 734. The marker is approximately -24.2 dB and (42.3 + j1.2)Ω at 28 GHz (0.0615exp(+j 13.7°)).

[0130] The radiation patterns of a selected polarization of a dual-polarized antenna in two exemplary perpendicular cut planes are shown in Figures 736 and 738.

[0131] The radiation pattern for the first cutting plane results in:

[0132] Frequency: 28GHz,

[0133] Main lobe amplitude: 7.12dBi,

[0134] Main lobe direction: 3.0 degrees,

[0135] Angular width (3dB): 86.1 degrees, and

[0136] Sidelobe level: -17.8dB.

[0137] The radiation pattern for the second cutting plane results in:

[0138] Frequency: 28GHz,

[0139] Main lobe amplitude: 7.11dBi,

[0140] Main lobe direction: 1.0 degrees,

[0141] Angular width (3dB): 78.4 degrees,

[0142] Sidelobe level: -17.7dB.

[0143] Figure 7c Shown in Figure 7a The results of simulated input reflection coefficient measurement are shown in the second case where the pusher 720 is made of a material with a relative dielectric constant of 1.2, such as a dielectric foam material. Similar to the first case, the results of the simulated reflection coefficient measurement are presented in Figure 742 and Smith Chart 744. The markers are approximately -18.4 dB and (35.4-j8.5)Ω at 28GHz (0.120exp(+j 262.6°)).

[0144] The radiation patterns of a selected polarization of a dual-polarized antenna in two exemplary perpendicular cut planes are shown in Figures 746 and 748.

[0145] The radiation pattern for the first cutting plane results in:

[0146] Frequency: 28GHz,

[0147] Main lobe amplitude: 7.42 dBi,

[0148] Main lobe direction: 3.0 degrees,

[0149] Angular width (3 dB): 84 degrees, and

[0150] Side lobe level: -16.4 dB.

[0151] The radiation pattern results for the second cutting plane are:

[0152] Frequency: 28 GHz,

[0153] Main lobe amplitude: 7.41 dBi,

[0154] Main lobe direction: 1.0 degree,

[0155] Angular width (3 dB): 77.2 degrees,

[0156] Side lobe level: -16.5 dB.

[0157] Figure 7d Shows the results of the simulated input reflection coefficient measurements conducted in the Figure 7a third case, where the pusher 720 is made of a material with a relative dielectric constant of 3.6, which can be a polyetheretherketone (PEEK) material. The results of the simulated reflection coefficient measurements are presented in FIGS. 752 and Smith chart 754. The marker is approximately -8.1 dB and (16.55 - j3.9) Ω at 28 GHz (0.394exp(+j 194.6°)).

[0158] The radiation patterns in two exemplary vertical cutting planes of a selected polarization of the dual-polarized antenna are shown in FIGS. 756 and 758.

[0159] The radiation pattern results for the first cutting plane are:

[0160] Frequency: 28 GHz,

[0161] Main lobe amplitude: 6.8 dBi,

[0162] Main lobe direction: 28.0 degrees,

[0163] Angular width (3 dB): 104.4 degrees, and

[0164] Side lobe level: -8 dB.

[0165] The radiation pattern results for the second cutting plane are:

[0166] Frequency: 28 GHz,

[0167] Main lobe amplitude: 6.08 dBi,

[0168] Main lobe direction: 6.0 degrees,

[0169] Angular width (3dB): 81.6 degrees,

[0170] Sidelobe level: -10.2dB.

[0171] To summarize the design concept used by the conventional pusher 720, the Figure 7b simulation measurement results of Figure 7c and Figure 7d simulation measurement results of

[0172] Comparing the first case and the second case, or Figure 7b and Figure 7c simulation measurement results of

[0173] the first case and the third case, i.e., Figure 7b simulation measurement results of Figure 7d the feed reflection coefficient moves 0.153 in the complex plane, the gain increases from 7.1dBi to 7.4Bi, and the beam widths decrease from 86° to 84° (E-plane) and from 78° to 77° (H-plane), respectively. This change and the influence of the pusher are obviously acceptable. However, the mechanical rigidity of the material with a relative dielectric constant of 1.2 is insufficient.

[0174] Figure 7a The simulation measurement results of the conventional pusher shown (as Figure 7b -d) indicate that further design concepts or their combination are still needed.

[0175] Simulation of spacer according to Figure 8

[0176] Figure 8 shows a 3D simulation of the patch antenna 810 (similar to the patch antenna 600 in Figure 6) and the spacer 830, which is configured to push the DUT into the DUT socket. The simulated spacer 830 is a low-dielectric constant spacer with a relative dielectric constant of 1.3 and an overall thickness of 300 microns. The spacer is considered to be in contact with the antenna surface. In addition, the spacer provides (air filter) grooves or cuts along the radiation edge or slot, with a depth of, for example, 150 microns and a groove width of, for example, 300 microns.

[0177] The results of the simulated reflection coefficient measurements are shown in Fig. 840 and Smith Chart 850. The markers are approximately -22.2 dB and (38.47 - j5.8) Ω at 28 GHz (0.0077exp(+j283.5°)).

[0178] Simulation of structural design according to Figure 9

[0179] Figure 9a 3D simulations of three different test setups are shown. The first 3D simulation test setup 910 is the initial example antenna 940, similar to the example antenna 600 of Fig. 6, which is a possible example of the patch antenna 500 of Fig. 5. The initial example antenna 940 is a bilinear polarization antenna or a patch antenna. The example antenna 940 is used to quantify performance in the following second and third 3D simulation test setups when performing simulations using electromagnetic field simulation software.

[0180] The second 3D simulation test setup 920 includes the initial example antenna 940 and a uniform dielectric pusher 950. The pusher 950 can be regarded as a block or only as a simplified block body.

[0181] The third 3D simulation test setup 930 includes the initial example antenna 940 and a pusher 960 with an alternating layer structure or a layered pusher 960 made of dielectric strips. In this example, the pusher has 39 strips, each with a thickness of 50 μm and a gap of 100 μm between adjacent strips.

[0182] Figure 9b Shows the results of simulated input reflection coefficient measurements on the first 3D simulation test setup 910 Figure 9a where there is no pusher. This is equivalent to Figure 9a the second test setup 920 with pusher 950 in

[0183] Figure 9c Shows the results of simulated input reflection coefficient measurements on the second 3D simulation test setup 920 Figure 9a where the pusher 950 is a simplified block body made of a material with a relative dielectric constant of 1.1. The results of the simulated reflection coefficient measurements are presented in Fig. 922 and Smith Chart 924. The markers are approximately -21.6 dB and (36.0 - j5.92) Ω at 28 GHz (0.083exp(+j 260°)).

[0184] Figure 9d Shown in Figure 9a The results of simulated input reflection coefficient measurements on a second 3D simulation test device 920 of FIG. 926, where the pusher 950 is a simplified block made of a material with a relative dielectric constant of 1.2. The results of the simulated reflection coefficient measurements are presented in FIG. 926 and Smith chart 928. The markers are approximately -16.55 dB and (31.22-j8.11)Ω at 28 GHz (0.149exp(+j 239°)).

[0185] and Figure 9d similar, Figure 9e Shown in Figure 9a The results of simulated input reflection coefficient measurements on a second 3D simulation test device 920 of FIG. 940 are shown in FIG. 941 , where the pusher 950 is a simplified block made of a material with a relative dielectric constant of 1.3. The results of the simulated reflection coefficient measurements are presented in FIG. 942 and Smith chart 944 . The markers are approximately -13.72 dB and (27.24-j8.67)Ω at 28 GHz (0.206exp(+j 228°)).

[0186] Figure 9f and Figure 9g Shown in Figure 9a The results of simulated input reflection coefficient measurement on the third 3D simulation test device 930 of FIG. 960 are shown in FIG. 961 , where the pusher 950 is a layered pusher of 39 slats made of materials with relative dielectric constants of 1.3 and 2.5, respectively. The thickness of each slat is 50 μm, and the distance between two adjacent slats is 100 μm. The results of the simulated reflection coefficient measurement are presented in Figures 962 and 966, respectively, and in Smith charts 964 and 968, respectively.

[0187] Notice, Figure 9b -e simulation measurement results (e.g., measurements performed on a test setup without a pusher or with a simplified bulk pusher) show no difference between the different polarizations of the example antenna, while Figure 9f The measurement results of -g show that the layered pusher affects the two perpendicular polarizations differently, for example, the field parallel to the slats (first polarization or port 1 feed) is disturbed less by the layered pusher than the field perpendicular to the slats. That is, the curve and / or markings of port 1 are different from the curve and / or markings of port 2.

[0188] Figure 9f The marking of port 1 in is about -22.9 dB and (36.84-j5.32)Ω at 28GHz (0.072exp(+j 266°)). Figure 9f The marking of port 2 in is about -21.5dB and (36.14-j6.08)Ω at 28GHz (0.085exp(+j 261°)).

[0189] Figure 9g The markings of port 1 in are approximately -13.9 dB and (27.66 - j8.88) Ω at 28 GHz (0.202exp(+j 320°)). Figure 9g The markings of port 2 in are approximately -10.8 dB and (22.18 - j8.16) Ω at 28 GHz (0.289exp(+j 216°)).

[0190] Simulation of structural design according to Figure 10

[0191] Figure 10a A 3D simulation test device 1000 is shown, including a pusher 1010 and a DUT 1020 with an antenna. The pusher is a layered pusher, including a spacer layer 1013 of low dielectric constant structure (made of a material with a relative dielectric constant of 1.3) and a structure of an alternating layer structure 1016. In this example, the structure 1016 has 39 dielectric slats, where the thickness of the slats is 50 μm, and the distance or gap between two adjacent slats is 100 μm. In this simulation, the material of the slats has a variable dielectric constant. For example, measurements performed on different pushers made of different slat materials can be simulated.

[0192] To make it more clearly visible, Figure 10b the test device 1000 is shown or constructed layer by layer. The first image shows the DUT 1020 with an antenna, which is a dual-polarized patch antenna, similar to Figure 6a antenna 600. The second image shows the DUT 1020 and the low dielectric constant spacer layer 1013 of the pusher 1010. The third image shows the 3D simulation test device 1000 including the DUT 1020 and the pusher 1010, where the pusher 1010 has a structured spacer layer 1013 and an alternating layer 1016.

[0193] Figure 10c Shows the results of simulated input reflection coefficient measurements on the 3D simulation test device 1000 in Figure 10a , where the pusher 1010 is a layered pusher composed of 39 slats and has a structured spacer layer 1013. The structured spacer layer 1013 and the slats are made of materials with relative dielectric constants of 1.3 and 2.5, respectively. The results of the simulated reflection coefficient measurements are presented on Figure 1033 and Smith chart 1036.

[0194] Figure 10c The markings of port 1 in are approximately -17.9 dB and (30.4 - j4.9) Ω at 28 GHz (0.127exp(+j 218.6°)). Figure 10cThe markings of port 2 in [the relevant context] are approximately -13.9 dB and (25.5 - j4.1) Ω at 28 GHz (0.201exp(+j 202.5°)).

[0195] Figure 10d Shows the results of simulated input reflection coefficient measurements on the 3D simulation test device 1000 in Figure 10a where the pusher 1010 is a layered pusher composed of 39 slats and has a structured spacer layer 1013. The structured spacer layer 1013 and the slats are made of materials with relative permittivities of 1.3 and 3.1 respectively. The results of the simulated reflection coefficient measurements are presented in Figure 1043 and Smith chart 1046.

[0196] Figure 10d The markings of port 1 in [the relevant context] are approximately -17.5 dB and (29.6 - j4.2) Ω at 28 GHz (0.133exp(+j 211.2°)). Figure 10d The markings of port 2 in [the relevant context] are approximately -12.3 dB and (23.1 - j2.2) Ω at 28 GHz (0.242exp(+j 190.9°)).

[0197] Figure 10e Shows the results of simulated input reflection coefficient measurements on the 3D simulation test device 1000 in Figure 10a where the pusher 1010 is a layered pusher composed of 39 slats and has a structured spacer layer 1013. The structured spacer layer 1013 and the slats are made of materials with relative permittivities of 1.3 and 3.6 respectively. The results of the simulated reflection coefficient measurements are presented in Figure 1053 and Smith chart 1056.

[0198] Figure 10e The markings of port 1 in [the relevant context] are approximately -17.5 dB and (29.6 - j3.5) Ω at 28 GHz (0.134exp(+j 206°)). Figure 10e The markings of port 2 in [the relevant context] are approximately -11.5 dB and (21.7 - j0.7) Ω at 28 GHz (0.267exp(+j 183°)).

[0199] The simulated measurement results show that the layered pusher 1010 has different effects on two perpendicular polarizations. For example, the field parallel to the slats (the first polarization or port 1 feed) is less disturbed by the layered pusher than the field perpendicular to the slats.

[0200] Simulation of structural design according to Figure 11

[0201] Figure 11aShows two images of the same 3D simulation test device 1100 including a pusher 1110 and a DUT 1150 with an antenna. The first image focuses on the test device 1100, while the second image focuses on the slats 1140 of the pusher 1110. The pusher 1110 is a layered pusher 1110 that includes a spacer layer 1130 of a low dielectric constant structure (the spacer layer 1130 is made of a material with a relative dielectric constant of 1.3) and an alternating layer 1120 or slat 1140 structure separated by an air gap. In this simulation model or example, the structure 1120 has 15 dielectric slats 1140, where the thickness of the slats 1140 is 100 μm, and the adjacent slats 1140 are separated by an air gap of 300 μm. The slats 1140 are made of a material with a relative dielectric constant of 3.6.

[0202] Although the material of the low dielectric constant spacer 1130 or spacer layer 1130 is quite soft, the spacer layer 1130 also helps to disperse the pressure. Therefore, the density of the layers or slats 1140 in the layered pusher 1110 can be (slightly) reduced, thereby reducing the interference to the feed reflection coefficient. This can also be recognized when comparing the simulation measurement results of FIGS. 10 and 11.

[0203] Figure 11b Shows the results of simulation input reflection coefficient measurements performed on the Figure 11a 3D simulation test device 1100, where the pusher 1110 is a layered pusher with 15 slats 1140 having a structured spacer layer 1130. The structured spacer layer 1130 and the slats 1140 are made of materials with relative dielectric constants of 1.3 and 3.6, respectively. The results of the simulation reflection coefficient measurements are presented on FIG. 1163 and the Smith chart 1166.

[0204] The layered pusher 1110 has different effects on two perpendicular polarizations. For example, the field parallel to the slats 1140 (the first polarization or port 1 feed) is less interfered by the layered pusher 1110 than the field perpendicular to the slats 1140.

[0205] Figure 11b The marker of port 1 in Figure 11b is approximately -19.2 dB and (31.1 - j4.0) Ω at 28 GHz (0.110exp(+j 215.6°)).

[0206] Simulation of structural design according to Figure 12

[0207] Figure 12aThe simulation test device 1200 is shown, which is similar to the simulation test device 1100 of FIG. 11. The pusher 1210 has an additional dielectric plate 1260. That is, the simulation test device 1200 includes a pusher 1210 and a DUT 1250 having an antenna. The pusher 1210 is a layered pusher 1210 that includes a low dielectric constant structured spacer layer 1230 (made of a material with a relative dielectric constant of 1.3), combined with an alternating layer structure 1220, and a dielectric plate 1260 is attached to the alternating layer structure 1220. In this simulation model or example, the structure 1220 has 15 dielectric strips, where the strip thickness is 100 μm, and the adjacent strips are separated by an air gap of 300 μm. The strips 1140 are made of a material with a relative dielectric constant of 3.6. A dielectric plate 1260 or dielectric sheet 1260 with a thickness of approximately half a wavelength (e.g., relative dielectric constant of 3.6 and thickness of 2.82 mm) is added to provide a mechanically feasible and stable pusher structure.

[0208] Figure 12b Shows the results of simulated input reflection coefficient measurements on the 3D simulation test device in Figure 12a , where the pusher 1210 is a layered pusher with 15 strips, with a structured spacer layer 1230. The structured spacer layer 1230, the strips, and the dielectric plate 1260 are made of materials with relative dielectric constants of 1.3, 3.6, and 3.6, respectively. The results of the simulated reflection coefficient measurements are presented in FIG. 1273 and the Smith chart 1276.

[0209] Figure 12b The marker for port 1 in is approximately -22.6 dB and (36.9 - j5.5) Ω at 28 GHz (0.074exp(+j 267.5°)). Figure 12b The marker for port 2 in is approximately -14.7 dB and (26.7 - j4.6) Ω at 28 GHz (0.183exp(+j 207.4°)).

[0210] The radiation patterns in two exemplary vertical cut planes of a selected polarization of a dual-polarized antenna are shown in FIGS. 1283 and 1286.

[0211] The radiation pattern results for the first cut plane are:

[0212] Frequency: 28 GHz,

[0213] Main lobe amplitude: 9.79 dBi,

[0214] Main lobe direction: 3.0 degrees,

[0215] Angular width (3 dB): 61.6 degrees, and

[0216] Sidelobe level: -13.7 dB.

[0217] The radiation pattern results for the second cutting plane are as follows:

[0218] Frequency: 28 GHz,

[0219] Main lobe amplitude: 9.74 dBi,

[0220] Main lobe direction: 0.0 degrees,

[0221] Angular width (3 dB): 50.9 degrees,

[0222] Sidelobe level: -11.8 dB.

[0223] Figure 13 Table 1300 showing the variation of the feed reflection coefficient is presented. That is, for different cases described in the "Description" column, the feed reflection coefficient and the variation of the feed reflection at 28 GHz are listed in the table. The notes related to the cases indicated by letters in the last column of the table are as follows:

[0224] There are minor differences between the simulations of the "antenna only" structure (i.e., without any pusher), which may be due to the different sizes of the "air volume" in the computational domain and the different meshes.

[0225] B According to the measurement with a pusher made of a homogeneous foam dielectric with a dielectric constant ε rel = 1.2, this variation of the feed reflection is acceptable, but it is not known to what extent (slightly) larger changes would also be acceptable.

[0226] C When a material with a dielectric constant ε rel = 3.6 such as PEEK is used for a homogeneous pusher, it will cause completely unacceptable interference to the antenna.

[0227] D This is a schematic example showing that if the directions of the electric field and the pusher layer are appropriate, using a layered sheet pusher can significantly reduce the interference to the antenna. Orthogonal polarization (feeding into other ports of the patch antenna) results in a reflection coefficient variation of |Г 9,port2 - Г4| = 0.318, which is much larger than 0.224 under the "correct" polarization. As the dielectric constant of the layer increases, this difference becomes larger. For example, in case #13, ε rel = 3.6, the variation between 0.310 and 0.170 depends on the directions of the layer and the field.

[0228] E The thin structured spacer layer is made of foam (ε rel = 1.3), which is very soft but has sufficient hardness when the thickness is small (0.3 mm). This spacer layer will be specially processed according to the layout of the antenna (array) aperture surface.

[0229] When comparing Case #9 with Case #11, it is obvious that the introduction of the thin structured spacer layer significantly reduces the variation of the feed reflection coefficient.

[0230] G Using a thin structured spacer layer (ε rel = 1.3) and a layered sheet pusher (made of PEEK, ε rel = 3.6), the variation of the feed reflection coefficient is very small. It can be further reduced by design features, such as increasing the period of the layered sheets, reducing the dielectric volume fraction in the layered sheet assembly, or adding a half-wave plate. Note that the performance of this structure is only applicable to single linear polarization antennas and arrays.

[0231] Regarding the radiation pattern, the dielectric pusher causes a focusing effect, such as higher directivity and a narrower beam in the direction perpendicular to the antenna surface. As long as this effect is small, it will not have a significant negative impact on the test application. Except for the schematic Case 3, such as a completely uniform PEEK pusher, all other pushers only cause minor pattern changes.

[0232] In summary, the proposed concept can achieve an "electromagnetically transparent" pusher for single linear polarization antennas mainly made of high dielectric constant materials.

[0233] Implement alternative solutions

[0234] Although some aspects are described in the context of a device, it is obvious that these aspects also represent a description of the corresponding method, where the blocks or devices correspond to method steps or features of method steps. Similarly, aspects described in the context of method steps also represent a description of the corresponding blocks or items or features of the corresponding device. Some or all of the method steps can be performed by (or using) hardware devices. In some embodiments, one or more of the most important method steps can be performed by such devices.

[0235] The above embodiments are only used to illustrate the principle of the present invention. It should be understood that modifications and variations of the arrangements and details described herein will be apparent to other technicians in the art. Therefore, the intention of the present invention is only limited by the scope of the upcoming patent claims, rather than by the specific details presented herein through the description and explanation of the embodiments.

Claims

1. A pusher (140, 240, 340, 520, 720, 950, 960, 1010, 1110, 1210) for use in an automated test device to mechanically push a device under test (110, 1020, 1150, 1250) into a device under test socket (130). wherein, The pusher (140, 240, 340, 520, 720, 950, 960, 1010, 1110, 1210) includes a structure (150, 250, 550, 1016, 1120, 1220) in which there are alternating layers (150, 250, 550, 1016, 1120, 1220) of a higher dielectric constant layer (160a, 260a, 560a, 1140) and a lower dielectric constant layer (160b, 260b, 560b), and wherein the layers extend in a first direction (170, 270) that is within + / - 45° of the pushing direction (170, 270).

2. The pusher (140, 240, 340, 520, 720, 950, 960, 1010, 1110, 1210) according to claim 1, wherein, The ratio between the thickness of the higher dielectric constant layer (160a, 260a, 560a, 1140) and the thickness of the lower dielectric constant layer (160b, 260b, 560b) is between 1:10 and 2:

1.

3. The pusher (140, 240, 340, 520, 720, 950, 960, 1010, 1110, 1210) according to one of the preceding claims, wherein, The alternating layers (150, 250, 550, 1016, 1120, 1220) include a higher dielectric constant region (160a, 260a, 560a, 1140) with a volume percentage between 9% and 66.6% or between 20% and 60%, and a lower dielectric constant region (160b, 260b, 560b) with a volume percentage between 91% and 33.3% or between 80% and 40%.

4. The pusher (140, 240, 340, 520, 720, 950, 960, 1010, 1110, 1210) according to one of the preceding claims, wherein, The surface of the pusher (140, 240, 340, 520, 720, 950, 960, 1010, 1110, 1210) configured to contact the device under test (110, 1020, 1150, 1250) is formed such that the pusher (140, 240, 340, 520, 720, 950, 960, 1010, 1110, 1210) avoids contacting or approaching the conductive edge of the antenna (120, 220, 500, 600, 710, 810, 910) of the device under test (110, 1020, 1150, 1250) within a distance of 1 / 10 of the wavelength of the electromagnetic wave transmitted or received by the antenna (120, 220, 500, 600, 710, 810, 910).

5. The pusher (140, 240, 340, 520, 720, 950, 960, 1010, 1110, 1210) according to one of claims 1 to 3 of the preceding claims, wherein, The pusher (140, 240, 340, 520, 720, 950, 960, 1010, 1110, 1210) includes spacers (290, 590, 830, 1013, 1130, 1230) configured between the alternating parallel layers (150, 250, 550, 1016, 1120, 1220) and the device under test (110, 1020, 1150, 1250); Among them, the spacer is perpendicular to the alternating layers (150, 250, 550, 1016, 1120, 1220) with a tolerance within + / - 15°, and / or the spacer (290, 590, 830, 1013, 1130, 1230) is parallel to the surface of the device under test (110, 1020, 1150, 1250) to be pushed by the pusher (140, 240, 340, 520, 720, 950, 960, 1010, 1110, 1210) with a tolerance within + / - 15°.

6. The pusher (140, 240, 340, 520, 720, 950, 960, 1010, 1110, 1210) according to claim 5, wherein, The spacer (290, 590, 830, 1013, 1130, 1230) is configured to contact the device under test (110, 1020, 1150, 1250) such that the spacer (290, 580, 830, 1011, 1130, 1230) avoids contacting or approaching the conductive edge of the antenna of the device under test (110, 1020, 1150, 1250) within a distance of 1 / 10 of the wavelength of the electromagnetic wave emitted or received by the antenna (120, 220, 500, 600, 710, 810, 910) of the device under test (110, 1020, 1150, 1250).

7. The pusher (140, 240, 340, 520, 720, 950, 960, 1010, 1110, 1210) according to claim 5 or 6, wherein, The relative dielectric constant of the spacer (290, 590, 830, 1013, 1130, 1230) is less than or equal to 1.

5.

8. The pusher (140, 240, 340, 520, 720, 950, 960, 1010, 1110, 1210) according to one of claims 5 to 7 of the preceding claims, wherein, The thickness of the spacer (290, 590, 830, 1013, 1130, 1230) is between 50 microns and 500 microns.

9. The pusher (140, 240, 340, 520, 720, 950, 960, 1010, 1110, 1210) according to claim 8, wherein, The thickness of the spacer (290, 590, 830, 1013, 1130, 1230) is between 100 microns and 200 microns.

10. The pusher (140, 240, 340, 520, 720, 950, 960, 1010, 1110, 1210) according to one of the preceding claims, wherein, The pusher (140, 240, 340, 520, 720, 950, 960, 1010, 1110, 1210) includes a dielectric plate transverse or perpendicular to the pushing direction with a tolerance within + / - 15°, wherein the dielectric plate is configured to mechanically support the higher dielectric constant layer.

11. The pusher (140, 240, 340, 520, 720, 950, 960, 1010, 1110, 1210) according to claim 10, wherein, The thickness of the dielectric plate (280, 580, 1260) is an integer multiple of half the wavelength of the electromagnetic wave emitted or received by the antenna (120, 220, 500, 600, 710, 810, 910) of the device under test (110, 1020, 1150, 1250) in the dielectric material of the dielectric plate (280, 580, 1260) with a tolerance within 1 / 10 of the wavelength of the electromagnetic wave emitted or received by the antenna (120, 220, 500, 600, 710, 810, 910) of the device under test (110, 1020, 1150, 1250), and wherein the distance between the dielectric plate and the surface of the antenna (120, 220, 500, 600, 710, 810, 910) of the device under test (110, 1020, 1150, 1250) is at least one wavelength of the electromagnetic wave emitted or received by the antenna (120, 220, 500, 600, 710, 810, 910) of the device under test (110, 1020, 1150, 1250).

12. The pusher (140, 240, 340, 520, 720, 950, 960, 1010, 1110, 1210) according to claim 10 or 11, wherein, The lengths of the alternating parallel layers (150, 250, 550, 1016, 1120, 1220) in the pushing directions (170, 270) are between 0.5 and 2 times the free-space wavelength of the electromagnetic wave transmitted or received by the antennas (120, 220, 500, 600, 710, 810, 910) of the devices under test (110, 1020, 1150, 1250).

13. The pusher (140, 240, 340, 520, 720, 950, 960, 1010, 1110, 1210) according to one of the preceding claims, wherein, The relative permittivity of the higher permittivity layers (160a, 260a, 560a, 1140) is greater than 2.

14. The pusher (140, 240, 340, 520, 720, 950, 960, 1010, 1110, 1210) according to one of the preceding claims, wherein, The higher permittivity layers (160a, 260a, 560a, 1140) are made of polymer or polycarbonate or quartz or polytetrafluoroethylene or PEEK material.

15. The pusher (140, 240, 340, 520, 720, 950, 960, 1010, 1110, 1210) according to one of the preceding claims, wherein, The relative permittivity of the lower permittivity layers (160b, 260b, 560b) is less than or equal to 1.

5.

16. The pusher (140, 240, 340, 520, 720, 950, 960, 1010, 1110, 1210) according to one of the preceding claims, wherein the lower dielectric constant layer (160b, 260b, 560b) comprises air.

17. The pusher (140, 240, 340, 520, 720, 950, 960, 1010, 1110, 1210) according to one of the preceding claims, wherein, The pushing directions (170, 270) are perpendicular to the far-field direction of the electric field in the main lobe of the antennas (120, 220, 500, 600, 710, 810, 910) of the devices under test (110, 1020, 1150, 1250) with a tolerance within + / - 15°, or wherein, the pushing directions (170, 270) are perpendicular to the main surfaces of the devices under test (110, 1020, 1150, 1250) with a tolerance within + / - 15°, or wherein, the pushing directions (170, 270) are perpendicular to the main surfaces of the device under test sockets (130) with a tolerance within + / - 15°.

18. A test device for testing a device under test (110, 1020, 1150, 1250), comprising a device under test (110, 1020, 1150, 1250) having an antenna (120, 220, 500, 600, 710, 810, 910), which is pushed into a device under test socket (130) by a pusher (140, 240, 340, 520, 720, 950, 960, 1010, 1110, 1210) according to one of the preceding claims to test the device under test (110, 1020, 1150, 1250).

19. The test device according to claim 18, wherein, The pusher (140, 240, 340, 520, 720, 950, 960, 1010, 1110, 1210) is the pusher (140, 240, 340, 520, 720, 950, 960, 1010, 1110, 1210) according to claim 10, and the thickness of the dielectric plates (280, 580, 1260) of the pusher (140, 240, 340, 520, 720, 950, 960, 1010, 1110, 1210) is equal to an integer multiple of half the wavelength of the electromagnetic wave transmitted or received by the antennas (120, 220, 500, 600, 710, 810, 910) of the devices under test (110, 1020, 1150, 1250) in the dielectric material of the dielectric plates (280, 580, 1260), with a tolerance within 1 / 10 of the wavelength of the electromagnetic wave transmitted or received by the antennas (120, 220, 500, 600, 710, 810, 910) of the devices under test (110, 1020, 1150, 1250), and Among them, the distance between the dielectric plate of the pusher (140, 240, 340, 520, 720, 950, 960, 1010, 1110, 1210) and the surface of the antenna (120, 220, 500, 600, 710, 810, 910) of the device under test (110, 1020, 1150, 1250) is at least one wavelength of the electromagnetic wave transmitted or received by the antenna (120, 220, 500, 600, 710, 810, 910) of the device under test (110, 1020, 1150, 1250).

20. The test device according to claim 18 or 19, wherein, The length of the alternating parallel layers of the pusher (140, 240, 340, 520, 720, 950, 960, 1010, 1110, 1210) in the pushing direction (170, 270) is between 0.5 and 2 times the free space wavelength of the electromagnetic wave transmitted or received by the antenna (120, 220, 500, 600, 710, 810, 910) of the device under test (110, 1020, 1150, 1250).

21. A method for mechanically pushing a device under test (110, 1020, 1150, 1250) into a device under test socket (130) of an automated test equipment, wherein, The method includes mechanically pushing the device under test (110, 1020, 1150, 1250) into the device under test socket (130) with a pusher (140, 240, 340, 520, 720, 950, 960, 1010, 1110, 1210), the pusher including a structure (150, 250, 550, 1016, 1120, 1220) in which there are alternating layers (150, 250, 550, 1016, 1120, 1220) of a higher dielectric constant layer (160a, 260a, 560a, 1140) and a lower dielectric constant layer (160b, 260b, 560b), and wherein the layers (150, 250, 550, 1016, 1120, 1220) extend in a first direction within + / - 45° of the pushing direction (170, 270).

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