Pusher for use in automatic test apparatus, test apparatus comprising pusher, and method of mechanically pushing device under test having antenna into device under test receptacle

Abstract

Embodiments in accordance with the present invention include a pusher (140, 240, 340, 520, 720) for use in an automated test equipment (ATE) to mechanically push a device under test (DUT) (110) comprising an antenna or antenna array into a DUT receptacle (130). The pusher (140, 240, 340, 520, 720) includes a relatively higher dielectric constant dielectric region (160a, 260a, 560a) and a relatively lower dielectric constant dielectric region (160b, 260b, 560b). The relatively high dielectric constant dielectric electrical regions (160a, 260a, 560a) and the relatively low dielectric constant dielectric regions (160b, 260b, 560b) form the structure of parallel posts (e.g., rods or struts or rods) predominantly of the relatively high dielectric constant dielectric (160a, 260a, 560a) with the relatively low dielectric constant dielectric regions (160b, 260b, 560b) therebetween. Alternatively, the relatively higher dielectric constant dielectric region (160a, 260a, 560a) and the relatively lower dielectric constant dielectric region form a structure of a block of higher dielectric constant dielectric having filled or unfilled pores (160b, 260b, 560b) predominantly of lower dielectric constant dielectric. The higher dielectric constant dielectric posts (160a, 260a, 560a) or the lower dielectric constant dielectric holes (160b, 260b, 560b) extend in a first direction (170, 270) within + / -45 degrees of the urging direction (170, 270).

Description

[0001] Specification Technical Field

[0002] Embodiments according to the present invention relate to a pusher configured to push a device under test (DUT) into a DUT socket. Further embodiments relate to a test apparatus that includes a DUT to be pushed into a DUT socket (DUT socket) by the pusher. Further embodiments according to the present invention relate to the concept and / or design of a highly transparent pusher for a planar antenna module. Embodiments according to the present invention relate to a highly transparent pusher for an over-the-air test socket. Background Art

[0003] Millimeter-wave transceiver modules typically include electronic devices and planar antennas, which are located in a small-sized device. The size of the module is usually determined by the antenna aperture area or by the antenna array aperture area. Such modules are typically preferably (sometimes required) to be tested over-the-air (OTA) in automated test equipment (ATE) in a production environment. Processing and / or testing the module may require mechanically pushing the module into a DUT socket by a pushing mechanism or pusher on one side of or over the antenna or antenna array aperture.

[0004] The DUT antenna or antenna array is designed to have an air and / or (very) thin dielectric material layer on top so as not to interfere with the DUT antenna or antenna array. For testing the DUT in the ATE or for ATE testing, these conditions are partially mimicked or simulated by the pusher. The pusher can be part of an OTA socket and / or an ATE handling arm or an ATE test unit and may be a critical part in OTA testing because it contacts the antenna or antenna array in or of the DUT when pushing the DUT down into the DUT socket.

[0005] The problem with designing a pusher for an OTA test socket lies in the material of the pusher. The material of the pusher preferably has a (very) low dielectric constant, close to the dielectric constant of air, or more generally, the electrical properties of the pusher material preferably approach the electrical properties of air. In addition, the pusher material preferably has mechanical strength to withstand the mechanical stress of multiple cycles of pushing the DUT into the DUT socket. In other words, the pusher is preferably electromagnetically transparent or nearly transparent to avoid interfering with the DUT antenna while being mechanically strong and rigid. Unfortunately, due to physical reasons, there is no material that has both of these properties simultaneously.

[0006] Dielectric materials known to have a (very) low relative dielectric constant can meet the requirements for electromagnetic transparency, but at the same time, these materials are mechanically soft. In contrast, mechanically rigid actuators made of high dielectric constant materials can cause antenna feed impedance mismatch and / or alter the antenna radiation pattern.

[0007] Therefore, there is a need for an actuator that has optimal performance in both electromagnetic transparency and mechanical stiffness. SUMMARY OF THE INVENTION

[0008] An embodiment according to the present invention includes an actuator for an automated test equipment (ATE) to mechanically push a device under test (DUT) including an antenna or an antenna array into a DUT socket. The actuator includes a relatively high dielectric constant dielectric region and a relatively low dielectric constant dielectric region. The relatively high dielectric constant dielectric region and the relatively low dielectric constant dielectric region form a parallel column (such as a pole or a column or a rod) structure dominated by the relatively high dielectric constant dielectric, with the relatively low dielectric constant dielectric region between these columns. Alternatively, the relatively high dielectric constant dielectric region and the relatively low dielectric constant dielectric region form a structure of relatively high dielectric constant dielectric blocks, having parallel filled or unfilled holes dominated by the relatively low dielectric constant dielectric. The relatively high dielectric constant dielectric columns or relatively low dielectric constant dielectric holes extend in a first direction within + / - 45° of the pushing direction (170, 270).

[0009] To address the challenge of an actuator that is mechanically rigid but electromagnetic transparent or nearly transparent, embodiments of the actuator or the structure of the actuator have a hybrid design, which includes or mixes a mechanically soft material with a low dielectric constant and a mechanically strong material with a high dielectric constant. An actuator with such a hybrid design can also be applied to push a DUT with a single-polarization or dual-polarization antenna.

[0010] In other words, in order to avoid affecting (or overly affecting) the electromagnetic waves received or transmitted by the DUT antenna or the DUT antenna array, the design of the actuator and the dimensions of the relatively high dielectric constant dielectric region and / or the relatively low dielectric constant dielectric region of the actuator may be important or critical for the actuator. The relatively high dielectric constant dielectric region improves the mechanical stiffness of the actuator, while the relatively low dielectric constant dielectric region improves the electromagnetic transparency of the actuator.

[0011] In addition, the relatively high dielectric constant dielectric material around the relatively high dielectric constant dielectric columns or relatively low dielectric constant dielectric holes extends in a direction parallel to the pushing direction within + / - 45°, which also improves the stability, durability, and mechanical stiffness of the actuator.

[0012] In a preferred embodiment, the relatively high dielectric constant dielectric columns or relatively low dielectric constant dielectric holes are circular or square or triangular or cross-shaped.

[0013] The shape of the higher dielectric constant dielectric pillars or the lower dielectric constant dielectric holes can be selected from basic geometries to meet different potential objectives. These objectives can be, for example, maximizing the electromagnetic transparency or mechanical stiffness of the pusher; maintaining a fixed ratio between the higher dielectric constant and lower dielectric constant dielectric materials; achieving a pusher structure that matches the profile of the DUT; or enhancing the mechanical stability of the pusher.

[0014] In a preferred embodiment, the structure includes 5 to 50, or preferably 10 to 30, higher dielectric constant dielectric pillars or lower dielectric constant dielectric holes per free space wavelength of the electromagnetic waves transmitted or received by the antenna or antenna array of the DUT (e.g., at the center frequency of the operating frequency band of the device under test).

[0015] The main requirements for the pusher are mechanical stiffness and electromagnetic transparency. The number of higher dielectric constant dielectric pillars or lower dielectric constant dielectric holes is selected such that the pusher remains transparent or nearly transparent to the electromagnetic waves transmitted or received by the antenna or antenna array of the DUT, while maintaining mechanical rigidity to push the DUT into the DUT socket. Based on previously conducted experiments, 5 to 50, or preferably 10 to 30, higher dielectric constant dielectric pillars or lower dielectric constant dielectric holes per free space wavelength meet this requirement.

[0016] The minimum number of pillars (e.g., 5 or preferably 10) is the number for the pusher to maintain mechanical stability and rigidity, while the maximum number of pillars (e.g., 50 or preferably 30) is the number for the pusher to remain electromagnetic transparent or nearly transparent to at least the electromagnetic waves transmitted or received by the antenna or antenna array of the DUT.

[0017] The maximum number of holes (e.g., 50 or preferably 30) is the number for the pusher to maintain mechanical stability and rigidity, while the minimum number of holes (e.g., 5 or preferably 10) is the number for the pusher to remain electromagnetic transparent or nearly transparent to at least the electromagnetic waves transmitted or received by the antenna or antenna array of the DUT.

[0018] In a preferred embodiment, the structure includes a matrix or regular grid of higher dielectric constant dielectric pillars or lower dielectric constant dielectric holes, such as a rectangular grid or triangular grid of higher dielectric constant dielectric pillars or lower dielectric constant dielectric holes.

[0019] A periodic structure of higher dielectric constant dielectric pillars or lower dielectric constant dielectric holes can be used instead of locally adjusting the structure of each pusher according to the radiation slots or edges of the dual-polarized antenna surface of the DUT. Thus, the same pusher can be used for different DUTs or different antennas of the same DUT.

[0020] In the x-y plane, a pusher structure with a regular grid of dielectric columns with a relatively high dielectric constant or dielectric holes with a relatively low dielectric constant is semi-isotropic and is used for operation in two orthogonal polarizations or for operations with two orthogonal polarizations. For example, potential structures (or options) covering the x-y plane are: i) a square grid of cylindrical air-filled with a square cross-section, ii) a triangular grid of cylindrical air-filled with a circular cross-section, and iii) a triangular grid of cylindrical air-filled with a triangular cross-section.

[0021] According to an embodiment, the structure (e.g., regions of high dielectric constant dielectric materials and low dielectric constant dielectric materials including columns or holes) includes a relatively high dielectric constant dielectric region with a volume percentage between 9% and 66.6% or between 20% and 60%, and a relatively low dielectric constant dielectric region with a volume percentage between 91% and 33.3% or between 80% and 40%. Preferably, the structure includes a relatively high dielectric constant dielectric region with a volume percentage between 30% and 50% and a relatively low dielectric constant dielectric region with a volume percentage between 70% and 50%.

[0022] The ratio between the relatively high dielectric constant dielectric region and the relatively low dielectric constant dielectric region is selected such that the pusher remains transparent or almost transparent to the electromagnetic waves transmitted or received by the antenna or antenna array of the DUT, while maintaining mechanical rigidity for pushing the DUT into the DUT socket.

[0023] In a preferred embodiment, the surface of the pusher configured to contact the device under test is formed, configured, or machined such that the pusher (e.g., within a distance of 1 / 10 of the wavelength of the electromagnetic waves transmitted or received by the antenna of the DUT) avoids contacting or approaching the conductive edges of the DUT antenna. The conductive edges may be the metal edges of the antenna structure and have a significant impact on radiation.

[0024] The pusher contacting or approaching the DUT antenna will have a negative impact on the performance of the DUT antenna. The dielectric loading of the radiation edges of the DUT antenna or their proximity to each other will affect their resonance. Changing the resonance will change the feed impedance and radiation behavior of the antenna. In addition, if the pusher is large compared to the wavelength and has a non-negligible dielectric constant, it is preferably to avoid any resonance occurring inside the pusher, because this will lead to changes (sometimes catastrophic changes) in the radiation and feed characteristics.

[0025] In a preferred embodiment, the pusher includes a spacer configured between the alternating parallel layer structure and the DUT. The spacer is perpendicular to the alternating parallel layer with a tolerance within + / - 15°, and / or the spacer is parallel to the surface of the DUT to be pushed by the pusher with a tolerance within + / - 15°.

[0026] The advantage of the spacer being replaceable is that in any case, there is no need to replace the entire pusher, only the spacer needs to be replaced. Additionally, if the pusher has to be adapted to a new DUT or is damaged, only the spacer needs to be replaced, thus saving costs and materials.

[0027] In a preferred embodiment, the spacer is a structured spacer, that is, it is further formed, configured or processed to contact the device under test such that the spacer avoids contacting or approaching the conductive edges of the DUT antenna, for example within a distance of 1 / 10 of the wavelength of the electromagnetic wave transmitted or received by the DUT antenna. The conductive edges may be the metal edges of the antenna structure and have a great influence on radiation.

[0028] Since the spacer is replaceable, each antenna design can have a dedicated spacer, thus avoiding contacting or approaching the conductive edges of the DUT antenna or antenna array. That is to say, the same pusher can use different spacers for different DUTs, making the pusher and ATE more flexible.

[0029] In a preferred embodiment, the relative dielectric constant of the spacer is less than or equal to 1.5.

[0030] The spacer is made of a dielectric material with a relatively low dielectric constant and is configured to be in close contact with the DUT antenna without contacting or approaching the conductive edges of the antenna, so as to be transparent or almost transparent to the electromagnetic wave received or transmitted by the DUT antenna.

[0031] In a preferred embodiment, the thickness of the spacer is between 50 microns and 500 microns.

[0032] The spacer is configured to cover the entire surface area of the DUT antenna. Even if the surface area of the antenna is uneven, the thickness of 50 microns to 500 microns mentioned above helps to achieve this goal. Additionally, good mechanical stability can be achieved without overly reducing the antenna function.

[0033] In a preferred embodiment, the thickness of the spacer is between 100 microns and 200 microns.

[0034] If the antenna area of the DUT is slightly (or sufficiently) flat, a thickness between 100 microns and 200 microns may also be sufficient to cover the entire surface area of the DUT antenna.

[0035] In a preferred embodiment, the pusher includes a dielectric plate, such as a dielectric plate made of a mechanically rigid material with a relatively high dielectric constant, which is transverse or perpendicular to the pushing direction with a tolerance within + / - 15°. The dielectric plate is configured to mechanically support and / or stabilize at least a higher dielectric constant dielectric column or at least a higher dielectric constant dielectric block around a lower dielectric constant dielectric hole.

[0036] The dielectric plate with relatively high mechanical strength is transverse to the pushing direction and is connected to a dielectric column or a dielectric block with a relatively high dielectric constant. This makes the pusher more durable, stiffer, and more stable. For example, if the surface of the DUT is uneven, this can prevent the dielectric column with a relatively high dielectric constant of the pusher from moving independently.

[0037] In a preferred embodiment, the thickness of the dielectric plate is an integer multiple of half the wavelength of the electromagnetic wave in the dielectric material of the dielectric plate that the DUT antenna transmits or receives, for example, at the center frequency of the DUT operating frequency band, with a tolerance within 1 / 10 of the wavelength of the electromagnetic wave that the DUT antenna transmits or receives, for example, at the center frequency of the DUT operating frequency band. It is calculated as the free space wavelength divided by the square root of the relative dielectric constant of the dielectric. The distance between the dielectric plate and the surface of the antenna of the device under test is at least one wavelength of the electromagnetic wave that the DUT antenna transmits or receives, for example, at the center frequency of the DUT operating frequency band.

[0038] The dielectric plate is made of a material with strong mechanical strength and has a relatively high dielectric constant. The dielectric plate is preferably as electromagnetic transparent as possible. Therefore, when choosing the thickness of the plate and / or the distance between the DUT antenna and the plate, the negative impact of the plate on the electromagnetic wave transmitted or received by the DUT antenna should be minimized. For example, the loss of the electromagnetic wave transmitted or received by the DUT antenna should be minimized.

[0039] In a preferred embodiment, the length of the dielectric column with a relatively high dielectric constant or the dielectric hole with a relatively low dielectric constant in the pushing direction is, for example, between 0.5 and 2 times the free space wavelength of the electromagnetic wave that the DUT antenna transmits or receives at the center frequency of the DUT operating frequency band.

[0040] The length of the dielectric column with a relatively high dielectric constant or the dielectric hole with a relatively low dielectric constant, that is, the length of the pusher structure in the pushing direction, for example, the length in the main lobe direction of the electromagnetic wave transmitted or received by the DUT antenna, defines the amount of electromagnetic wave absorbed by the pusher. A pusher with a finite length or a dielectric column with a relatively high dielectric constant or a dielectric hole with a relatively low dielectric constant with a finite length limits the amount of electromagnetic wave absorbed from the electromagnetic wave transmitted or received by the DUT antenna. Therefore, in the case of a limited length of the alternating parallel layers, the pusher remains as transparent as possible to the electromagnetic wave received or transmitted by the DUT antenna while maintaining mechanical rigidity.

[0041] In a preferred embodiment, the relative dielectric constant of the relatively high dielectric constant dielectric region is greater than 2 or preferably between 2.5 and 4.

[0042] Materials with high mechanical strength have a high relative permittivity. Materials used to provide mechanical stability and strength for the pusher are found to have a relative permittivity of at least 2. A relative permittivity between 2.5 and 4 can well balance mechanical strength and electromagnetic transparency.

[0043] In a preferred embodiment, the relatively high permittivity dielectric region is made of a polymer or polycarbonate or quartz or polytetrafluoroethylene or PEEK material.

[0044] In a preferred embodiment, the relative permittivity of the relatively low permittivity dielectric region is less than or equal to 1.5.

[0045] Materials with a relatively low permittivity (permittivity of 1.5) are transparent or almost transparent to the electromagnetic waves emitted or received by the DUT antenna.

[0046] In a preferred embodiment, the relatively low permittivity dielectric region includes air.

[0047] Air has a low relative permittivity. Therefore, in a simple pusher design, only the relatively high permittivity dielectric region is constructed, while the relatively low permittivity dielectric region is left empty, for example filled with air. In this case, the air around and / or within the air or holes between the relatively high permittivity dielectric regions is part of the pusher structure.

[0048] In a preferred embodiment, the pusher direction is parallel to the far - field direction of the electric field in the main lobe of the DUT antenna, with a tolerance within + / - 15°. Alternatively, the pusher direction is perpendicular to the main surface of the DUT, with a tolerance within + / - 15°. Another option is that the pusher direction is perpendicular to the main surface of the DUT socket, with a tolerance within + / - 15°.

[0049] To improve the transparency of the pusher to the electromagnetic waves emitted or received by the DUT antenna, the effective area of the pusher structure should be minimized, especially the effective area of the relatively high permittivity dielectric region of the pusher. If the direction of the structure is parallel to the main lobe of the received or emitted electromagnetic waves, the effective area of the structure is minimized. In most cases, the main lobe is also perpendicular to the main surface of the DUT or DUT socket, with a tolerance within + / - 15°.

[0050] Another embodiment includes a test device for testing a device under test. The test device includes a device under test having an antenna or antenna array, the above - mentioned pusher, and a device - under - test socket. The device under test having an antenna or antenna array in the test device is configured to be pushed into the device - under - test socket by the above - mentioned pusher.

[0051] According to another embodiment of the present invention, a method is created for mechanically pushing a device under test (DUT) including an antenna or an antenna array into a DUT socket of an automated test equipment. The method includes mechanically pushing the DUT into the DUT socket with the above-mentioned pusher.

[0052] It should be noted that the method and the corresponding device are based on the same consideration. In addition, these methods can be supplemented by any features, functions, and details of the device described herein individually and in combination. BRIEF DESCRIPTION OF THE DRAWINGS

[0053] Subsequently, embodiments according to the present application will be described with reference to the accompanying drawings, where:

[0054] Figure 1 A schematic diagram of an embodiment of a test device including a DUT socket, a DUT with an antenna, and a pusher is shown;

[0055] Figure 2 A schematic diagram of an embodiment of a pusher configured to repeatedly push a DUT into a DUT socket is shown;

[0056] Figure 3 A picture of an embodiment of a test device without a DUT is shown. The test device includes a pusher and a DUT socket with a test antenna;

[0057] Figure 4 A dielectric constant - strength graph is shown, where the abscissa value represents the dielectric constant value and the ordinate value represents the flexural strength value;

[0058] Figure 5a An initial DUT patch antenna without any pusher is shown;

[0059] Figure 5b A DUT patch antenna and a conventional pusher are shown;

[0060] Figure 5c A DUT patch antenna with a dielectric plate having a relatively high dielectric constant is shown;

[0061] Figure 5d A DUT patch antenna and a pusher structure are shown, where regions of a relatively high dielectric constant dielectric material are separated by air or by regions of a low dielectric constant dielectric material;

[0062] Figure 5e A DUT patch antenna and a dielectric spacer with a relatively low dielectric constant are shown;

[0063] Figure 6a A 3D simulation of a DUT with a dual - polarized patch antenna is shown;

[0064] Figure 6bA graph and a Smith chart showing the measured results of the simulated input reflection coefficient;

[0065] Figure 7a A 3D simulation showing the arrangement including a patch antenna and a conventional pusher;

[0066] Figure 7b Shows the measured results of the simulated input reflection coefficient of a selected polarization on the graph and the Smith chart when the relative permittivity of the pusher is 1.0, and the radiation pattern simulation in two exemplary vertical cross-sections;

[0067] Figure 7c Shows the measured results of the simulated input reflection coefficient of a selected polarization on the graph and the Smith chart when the relative permittivity of the pusher is 1.2, and the radiation pattern simulation in two exemplary vertical cross-sections;

[0068] Figure 7d Shows the measured results of the simulated input reflection coefficient of a selected polarization on the graph and the Smith chart when the relative permittivity of the pusher is 3.6, and the radiation pattern simulation in two exemplary vertical cross-sections;

[0069] Figure 8a A 3D simulation showing a device including a patch antenna and a spacer layer;

[0070] Figure 8b Shows the measured results of the simulated input reflection coefficient on the graph and the Smith chart when the relative permittivity of the spacer is 1.3;

[0071] Figure 9 Shows a table comparing the characteristics of three different potential structures of the pusher;

[0072] Figure 10a Shows four simulated pusher structures to be measured;

[0073] Figure 10b Shows when the pusher includes a spacer, Figure 10a the first structure (44% square grid) and a λ / 2 plate (ε rel = 1.3 / 3.6 / 3.6), the measured results of the simulated input reflection coefficient on the graph and the Smith chart, and the radiation pattern simulation of two exemplary vertical cross-sections for a selected polarization;

[0074] Figure 10c Shows when the pusher includes a spacer, Figure 10a the second structure (44% triangular hole grid) and a λ / 2 plate (ε relWhen (ε = 1.3 / 3.6 / 3.6), the simulated input reflection coefficient measurement results on the chart and Smith chart, and the radiation pattern simulation for two exemplary vertical cuts for a selected polarization;

[0075] Figure 10d Shows that when the pusher includes a spacer, Figure 10a The first structure (36% square grid) and the λ / 2 plate (ε rel When (ε = 1.3 / 3.6 / 3.6), the simulated input reflection coefficient measurement results on the chart and Smith chart, and the radiation pattern simulation for two exemplary vertical cuts for a selected polarization;

[0076] Figure 10e Shows that when the pusher includes a spacer, Figure 10a The fourth structure (36% triangular hole grid) and the λ / 2 plate (ε rel When (ε = 1.3 / 3.6 / 3.6), the simulated input reflection coefficient measurement results on the chart and Smith chart, and the radiation pattern simulation for two exemplary vertical cuts for a selected polarization; and

[0077] Figure 11 Shows a comparison table of the variation of the feed reflection coefficient. Detailed Description

[0078] Hereinafter, different inventive embodiments and aspects will be described. In addition, further embodiments will be defined by the appended claims. It should be noted that any embodiment defined by the claims can optionally be supplemented by any details, features, and functions described herein. In addition, the embodiments described herein can be used alone or optionally supplemented by any details, features, and functions included in the claims.

[0079] In addition, it should be noted that the various aspects described herein can be used alone or in combination. Therefore, details can be added to each of the described individual aspects without adding details to another described aspect. It should also be noted that the present disclosure explicitly or implicitly describes features that can be used in an automated test device, a test apparatus, or a pusher. Therefore, any feature described herein can be used in the scenario of an automated test device, the scenario of a test apparatus, or the scenario of a pusher.

[0080] In addition, the features and functions related to the method disclosed herein can also be used in a device configured to perform these functions. In addition, any feature and function regarding the device disclosed herein can also be used in the corresponding method. In other words, the methods disclosed herein can be supplemented by any feature and function described regarding the device.

[0081] The present invention will be more fully understood from the detailed description given below and the accompanying drawings of embodiments of the invention. However, these should not be regarded as limiting the invention to the specific embodiments described, but are for explanation and understanding only.

[0082] According to Figure 1 embodiment of

[0083] Figure 1 A schematic diagram showing an embodiment of a test apparatus 100 for testing a device under test (DUT) 110 including one or more antennas 120 and / or an antenna array 120 is presented. The test apparatus 100 includes an embodiment of a DUT socket 130, a DUT 110 having an antenna 120, and a pusher 140.

[0084] The test apparatus 100 is configured to test the DUT 110, particularly the antenna 120 of the DUT 110. The DUT 110 is configured to be pushed into the device under test socket 130 by the pusher 140 along the pushing direction 170.

[0085] The pusher 140 is a schematic representation of an embodiment and includes a structure 150 that includes a relatively high dielectric constant dielectric region 160a and a relatively low dielectric constant dielectric region 160b, where "relatively" means that the dielectric constant of a given dielectric region is higher or lower relative to other dielectric regions of the pusher 140. The structure 150 may include relatively high dielectric constant dielectric parallel columns 160a, such as rods or struts or bars, or relatively low dielectric constant dielectric regions 160b between the columns 160a. Alternatively, the structure may include relatively high dielectric constant dielectric blocks 160a having parallel filled or unfilled holes 160b dominated by relatively low dielectric constant dielectrics within the relatively high dielectric constant dielectric blocks 160a. Either way, the relatively high dielectric constant dielectric columns 160a or the relatively low dielectric constant dielectric holes 160b extend in a direction within + / - 45° of the pushing direction 170.

[0086] The pusher 140 is configured to mechanically push the device under test 110 including the antenna 120 or the antenna array 120 into the device under test socket 130 of an automated test equipment. Compared with traditional pushers, the structure 150 of the pusher 140 having a relatively high dielectric constant dielectric region 160a and a relatively low dielectric constant dielectric region 160b significantly improves the transparency of the pusher 140 to electromagnetic waves transmitted or received by the antenna 120 of the DUT 110, while the pusher 140 maintains sufficient mechanical rigidity to repeatedly push the DUT 110 into the DUT socket 130 in a production environment.

[0087] Structure 150 includes a higher dielectric constant dielectric region 160a with a volume percentage between 9% and 66.6% or between 20% and 60%, and a lower dielectric constant dielectric region 160b with a volume percentage between 91% and 33.3% or between 80% and 40%. Preferably, the structure includes a higher dielectric constant dielectric region 160a with a volume percentage between 30% and 50%, and a lower dielectric constant dielectric region 160b with a volume percentage between 70% and 50%. For example, the higher dielectric constant dielectric region 160a is a column, rod, pillar, or bar, with a lower dielectric constant dielectric region 160b between the columns. The dielectric columns 160a with a higher dielectric constant extend within + / - 45° of the pushing direction 170.

[0088] The relatively higher dielectric constant dielectric region 160a has a relative dielectric constant greater than 2, for example, or preferably between 2.5 and 4, such as a polymer, polycarbonate, quartz, polytetrafluoroethylene, or PEEK material. The relatively lower dielectric constant dielectric region 160b has a relative dielectric constant less than or equal to 1.5, for example. As Figure 2 shown, the lower dielectric constant dielectric region may also include air.

[0089] According to Figure 2 embodiment

[0090] Figure 2 A schematic diagram of an embodiment of the pusher 240 is shown, with an antenna 220 of the DUT. The pusher is similar to Figure 1 the pusher 140. The pusher includes a spacer 290, a structure 250 of a relatively higher dielectric constant dielectric region 260a and a relatively lower dielectric constant dielectric region 260b, and a dielectric plate 280.

[0091] The pusher 240 is configured to repeatedly push the DUT 220 (similar to Figure 1 the DUT 110) into the DUT socket. The DUT includes at least an antenna 220 or an antenna array that transmits or receives electromagnetic waves 210.

[0092] The spacer 290 of the pusher is connected to the pusher structure 250 and is configured to be located between the structure 250 and the DUT or the antenna 220 of the DUT. The spacer is perpendicular to the higher dielectric constant columns 260a of the pusher 240 or alternatively perpendicular to the lower dielectric constant holes 260b of the pusher, with a tolerance within + / - 15°. The spacer is made of a lower dielectric constant mechanically soft dielectric material with a relative dielectric constant less than 1.5. The spacer is configured or machined such that the spacer avoids contact or proximity to the conductive edges of the DUT antenna within a range of 1 / 10 of the wavelength of the electromagnetic waves transmitted or received by the antenna 220. The conductive edges may be the metal edges of the antenna structure and have a significant impact on radiation.

[0093] The dielectric plate 280 is connected to the high dielectric constant dielectric column 260a and is arranged transversely or perpendicularly to the pushing direction 270 with a tolerance within + / - 15°.

[0094] The dielectric plate 280 of the pusher 240 is configured to mechanically support at least the high dielectric constant dielectric column 260a of the structure 250. In order to remain transparent or almost transparent to the electromagnetic wave 210 transmitted or received by the antenna 220, the thickness of the dielectric plate 280 is an integer multiple of half the wavelength of the electromagnetic wave 210 in the dielectric material of the dielectric plate 280. The calculation formula is the free space wavelength divided by the square root of the relative dielectric constant of the dielectric. The thickness tolerance is 1 / 10 of the wavelength of the electromagnetic wave transmitted or received by the antenna 220 of the DUT, for example, at the center of the operating frequency band of the DUT.

[0095] The structure 250 of the pusher is similar to Figure 1 the pusher structure 150, where the length of the high dielectric constant dielectric column 260a or the low dielectric constant dielectric hole 260b in the pushing direction is between 0.5 and 2 free space wavelengths of the electromagnetic wave transmitted or received by the antenna 220 of the DUT.

[0096] The pusher 240 can also be used in a test device, similar to Figure 1 the test device 100. A picture of the test device with the pusher is shown in Figure 3 .

[0097] According to Figure 3 the embodiment of

[0098] Figure 3 Shows a picture of an embodiment of a test device 300 similar to Figure 1 the test device 100. The test device 300 includes a pusher 340 (similar to Figure 1 the pusher 140 or Figure 2 the pusher 240) and a DUT socket 330. The DUT of the test device 300 is not shown, but Figure 3 further shows a test antenna 350 of an automated test equipment (ATE), which is configured to perform an over-the-air (OTA) test or measurement on the DUT.

[0099] According to Figure 4 dielectric constant-strength diagram

[0100] Figure 4Shows a dielectric constant - strength graph 400, where the abscissa value represents the dielectric constant value and the ordinate value represents the flexural strength value. Different materials are represented in this graph, such as ceramics 450, polymers 452, polymer foams 454, and laminates 456. Existing pusher (or socket) materials 410, ideal pusher materials 430, and available pusher materials 440 are also marked on the graph.

[0101] As shown in the graph, existing pusher (or socket) materials 410 have satisfactory flexural strength, but their dielectric constants are higher than the ideal value. A satisfactory dielectric constant should be to the left of line 420, or less than or equal to 1.5. The position of the ideal material 430 is shown in the graph, but there are no known materials that meet these requirements. An existing material with a dielectric constant less than or equal to 1.5 is a polymer foam, whose flexural strength is 1 / 100 of that of existing or traditional pusher materials 410. th As shown, available materials 440 with low dielectric constants do not have the preferred flexural strength.

[0102] Currently, there is no ideal material that can meet the requirements of a low dielectric constant (e.g., less than 1.5) and a high flexural strength (higher than 30 MPa), so an improved design concept is needed. Figure 2 The design concept adopted by the pusher 240 is a combination of all new ideas or design concepts in Figure 5.

[0103] Design concept according to Figure 5

[0104] Figure 5a -e shows schematic diagrams of existing pusher design concepts and new pusher design concepts.

[0105] Figure 5a Shows an initial state, such as a patch antenna 500 without any pusher. The patch antenna 500 is used as a typical example of a planar antenna. It has two opposite radiation edges 503, 506, and the electric field 509 is mainly perpendicular to these two edges. The operating frequency and feed impedance are determined by the resonance of the electromagnetic field 509, which is enclosed between the ground and the patch, as well as between the two radiation edges 503, 506.

[0106] That is to say, Figure 5a Shows the initial arrangement of a single patch antenna 500 without any pusher. The antenna radiates or emits electromagnetic waves 510, which are preferably not affected by the pusher in an ideal test setup.

[0107] Figure 5b Shows Figure 5aPatch antenna 500 and a conventional pusher 520, which has a conventional design concept. The integral or solid block of the pusher 520 is configured to push the DUT-antenna 500 into the DUT socket. The conventional pusher 520 is made of Figure 4 the existing pusher material 410 in

[0108] To avoid the pusher from changing the resonance of the DUT-antenna 500, thereby avoiding changing the feed impedance and radiation behavior, Figure 5c -e introduces three dielectric structural features of the pusher and their specific electromagnetic characteristics.

[0109] Figure 5c A dielectric plate 580 of a hard, mechanically strong dielectric material with a relatively high dielectric constant is shown placed parallel to the antenna aperture plane of the DUT-antenna 500. The thickness of the plate 580 is an integer multiple of half the wavelength of the electromagnetic wave in the dielectric material of the dielectric plate 580, with a tolerance within 1 / 10 of the wavelength of the electromagnetic wave transmitted or received by the DUT antenna 500.

[0110] The distance between the DUT antenna 500 and the dielectric plate 580 is at least one wavelength of the electromagnetic wave transmitted or received by the DUT-antenna 500. The hard, mechanically strong, relatively high dielectric constant dielectric material required for mechanical stability cannot contact the radiation slots or the metal or conductive edges of the antenna aperture plane, otherwise it will cause feed impedance detuning. The conductive edge may be the metal edge of the antenna structure and has a great influence on radiation.

[0111] Figure 5d A patch antenna 500 is shown with a pusher structure 550, where regions of a relatively high dielectric constant dielectric material 560a are separated by air or by regions of a lower dielectric constant dielectric material 560b. The structure 550 provides a lower effective dielectric constant for an electric field parallel to the extension of the relatively high dielectric constant dielectric column 560a and a higher effective dielectric constant for an electric field parallel to the extension of the relatively high dielectric constant dielectric column 560a.

[0112] If the direction of the electric field is known, the structure 550 of the columns of the relatively high dielectric constant dielectric material 560a with appropriate orientation will have a smaller impact on the performance of the DUT-antenna 500. This applies, for example, to the on-site configuration such as the antenna 500.

[0113] Figure 5e Shows a DUT patch antenna 500 with a dielectric spacer 590 having a lower dielectric constant. The UT with the patch antenna 500 is configured to be pushed into the DUT socket by the spacer 590 or spacer layer 590.

[0114] The surface of the planar antenna includes, for example, a dielectric surface area, metal edges, and a metal surface area. In terms of contacting the surface with a dielectric pusher, the most sensitive areas are the metal edges and the dielectric areas close to them because these areas may form radiating edges or slots, while the metal surface is not a critical area.

[0115] Some structured dielectric spacers or spacer layers or sheets provide mechanical contact between the planar antenna surface and the pusher only in the metal areas and non-critical dielectric areas of the antenna surface. Preferably, the radiating edges or slots are not in direct contact, and some small air gaps are provided above these edges or slots.

[0116] Figure 5c and 5e The concept of... is very obvious and can be directly implemented, while Figure 5d the concept of... further quantifies the trade-off between input and gain. The design concept of... is simulated in the subsequent figures. Figure 5a -e

[0117] Antenna simulation according to Figure 6

[0118] Figure 6a Shows a 3D simulation of a DUT with a dual-polarized patch antenna, which is a possible example of the patch antenna 500 in Figure 5. The example antenna 600 used in Figure 6 can quantify the performance in a simulation using electromagnetic field simulation software. The example antenna 600 is a bilinear polarization microstrip patch antenna. It represents the vast majority of planar antennas because its operating principle and problems are common to all patch and slot antennas.

[0119] The center operating frequency of 28 GHz is used in the simulation. The characteristic line impedance of the terminal ports of the two feed lines is approximately 35 ohms.

[0120] Figure 6b Shows the simulation input reflection coefficient measurement results in the frequency-reflection graph 630 and on the Smith chart 660. The graph shows the input reflection coefficient. The marker corresponds to approximately (40.9 + j1.0) Ω at 28 GHz.

[0121] Simulation of traditional pusher according to Figure 7

[0122] Figure 7aShows a 3D simulation of a device that includes a patch antenna 710 of the DUT (similar to the patch antenna 600 of FIG. 6) and a conventional solid dielectric pusher 720, which is configured to mechanically push the main surface of the DUT or the DUT antenna into the DUT socket, as also shown in Figure 5b the design concept.

[0123] Figure 7b -d shows the results of simulated input reflection coefficient measurements for the Figure 7a device, where different pushers are used, e.g., pushers with different relative permittivities. A center operating frequency of 28 GHz is used in the simulation. The characteristic line impedance of the terminal ports of the two feed lines is approximately 35 ohms.

[0124] Figure 7b Shows the results of simulated input reflection coefficient measurements performed in Figure 7a the first case, where the pusher is made of a material with a relative permittivity of 1.0, such as air or vacuum. This is equivalent to having no pusher. Note that Figure 6b the results presented in Figure 7b e.g., testing the antenna of the device in air) are slightly different because, for an accurate comparison, in Figure 7b the size of the computational domain is kept equal for all simulations including the pusher. That is, to be able to compare the Figure 6b measurements of -d, the computational domain includes the pusher, while this is not the case for the results in

[0125] Figure 7b Shows the results of simulated input reflection coefficient measurements where the pusher 720 is made of a material with a relative permittivity of 1, which is equivalent to having no pusher. The size of the pusher is taken into account during the simulation, so the simulated measurement results are slightly different from the simulated measurement results in FIGS. 630 and Smith chart 660 of FIG. 6.

[0126] The simulated measurement results of the input reflection coefficient are shown in FIGS. 732 and Smith chart 734. The marker is approximately -24.2 dB and (42.3 + j1.2) Ω at 28 GHz (0.0615exp(+j 13.7°)).

[0127] The radiation patterns of a selected polarization of the dual-polarized antenna in two exemplary vertical cut planes are shown in FIGS. 736 and 738.

[0128] The radiation pattern results for the first cut plane are as follows:

[0129] Frequency: 28 GHz,

[0130] Main lobe amplitude: 7.12 dBi,

[0131] Main lobe direction: 3.0 degrees,

[0132] Angular width (3dB): 86.1 degrees, and

[0133] Side lobe level: -17.8dB.

[0134] The radiation pattern results for the second cutting plane are:

[0135] Frequency: 28GHz,

[0136] Main lobe amplitude: 7.11dBi,

[0137] Main lobe direction: 1.0 degree,

[0138] Angular width (3dB): 78.4 degrees,

[0139] Side lobe level: -17.7dB.

[0140] Figure 7c The results of the simulation input reflection coefficient measurement in the second case at Figure 7a are shown, where the pusher 720 is made of a material with a relative dielectric constant of 1.2, such as a dielectric foam material. Similar to the first case, the results of the simulation reflection coefficient measurement are presented in FIGS. 742 and Smith chart 744. The markings are approximately -18.4dB and (35.4 - j8.5)Ω at 28GHz (0.120exp(+j 262.6°)).

[0141] The radiation patterns of a selected polarization of the dual-polarized antenna in two exemplary vertical cutting planes are shown in FIGS. 746 and 748.

[0142] The radiation pattern results for the first cutting plane are:

[0143] Frequency: 28GHz,

[0144] Main lobe amplitude: 7.42dBi,

[0145] Main lobe direction: 3.0 degrees,

[0146] Angular width (3dB): 84 degrees, and

[0147] Side lobe level: -16.4dB.

[0148] The radiation pattern results for the second cutting plane are:

[0149] Frequency: 28GHz,

[0150] Main lobe amplitude: 7.41dBi,

[0151] Main lobe direction: 1.0 degree,

[0152] Angular width (3dB): 77.2 degrees,

[0153] Sidelobe level: -16.5 dB.

[0154] Figure 7d The results of the third case are shown, where the pusher 720 is made of a material with a relative permittivity of 3.6, which can be a polyetheretherketone (PEEK) material. The results of the simulated reflection coefficient measurements are presented in FIG. 752 and the Smith chart 754. The marker is approximately -8.1 dB and (16.55 - j3.9) Ω at 28 GHz (0.394exp(+j 194.6°)).

[0155] The radiation patterns in two exemplary vertical cross-sectional planes of a selected polarization of the dual-polarized antenna are shown in FIGS. 756 and 758.

[0156] The radiation pattern results for the first cross-sectional plane are:

[0157] Frequency: 28 GHz,

[0158] Main lobe amplitude: 6.8 dBi,

[0159] Main lobe direction: 28.0 degrees,

[0160] Angular width (3dB): 104.4 degrees, and

[0161] Sidelobe level: -8 dB.

[0162] The radiation pattern results for the second cross-sectional plane are:

[0163] Frequency: 28 GHz,

[0164] Main lobe amplitude: 6.08 dBi,

[0165] Main lobe direction: 6.0 degrees,

[0166] Angular width (3dB): 81.6 degrees,

[0167] Sidelobe level: -10.2 dB.

[0168] To summarize the design concept used for the conventional pusher 720, the Figure 7b simulation measurement results are compared with the Figure 7c and Figure 7d simulation measurement results.

[0169] Comparing the first case and the second case, or Figure 7b and Figure 7cThe simulation measurement results show that the feed reflection coefficient changes by 0.153 in the complex plane, the gain increases from 7.1 dBi to 7.4 dBi, and the beam widths decrease from 86° to 84° (E-plane) and from 78° to 77° (H-plane), respectively. Such changes and the influence of the pusher are obviously acceptable. However, the mechanical rigidity of the material with a relative dielectric constant of 1.2 is insufficient.

[0170] For the first and third cases, namely Figure 7b the simulation measurement results of Figure 7d show that the feed reflection coefficient moves by 0.455 in the complex plane, the gain decreases from 7.1 dBi to 6.8 dBi, and the beam widths change from 86° to 104° (E-plane) and from 78° to 82° (H-plane), respectively. Such changes and the influence of the pusher are excessive and unacceptable, for example.

[0171] Figure 7a The simulation measurement results of the conventional pusher shown (as Figure 7b shown in -d) indicate that further design concepts or their combination are still needed.

[0172] Simulation of spacer according to Figure 8

[0173] Figure 8 shows a 3D simulation of the patch antenna 810 (similar to the patch antenna 600 in Figure 6) and the spacer 830, which is configured to push the DUT into the DUT socket. The simulated spacer 830 is a low-dielectric-constant spacer with a relative dielectric constant of 1.3 and an overall thickness of 300 microns. The spacer is considered to contact the antenna surface. In addition, the spacer provides (air filter) grooves or cuts along the radiation edge or slot, with a depth of, for example, 150 microns and a groove width of, for example, 300 microns.

[0174] The results of the simulated reflection coefficient measurements are shown in Figure 840 and the Smith chart 850. The markers are approximately -22.2 dB and (38.47 - j5.8) Ω at 28 GHz (0.0077exp(+j283.5°)).

[0175] According to Figure 9 structural design simulation

[0176] Figure 9 Table 900 is shown, comparing the characteristics of three different potential structures of the pusher. The three pusher structures are structured dielectrics, known to be semi-isotropic in the xy plane and suitable for operation with two orthogonal polarizations. The three different choices or different design concepts of the structure are: a) a square grid with air-filled cylinders 910 having a square cross-section, b) a triangular grid with air-filled cylinders 920 having a circular cross-section, and c) a triangular grid with air-filled cylinders 930 having a triangular cross-section.Figure 9 Table 900 compares these three options 910, 920, and 930.

[0177] For a fair comparison, we selected equal air and dielectric volume fractions in Table 900 for all three options 910, 920, and 930, and selected approximately equal cell volumes for all three options 910, 920, and 930. Each design concept option 910, 920, and 930 was tested at two different dielectric volume fractions of 43.75% and 36%.

[0178] Specifically, option 910 (e.g., a square grid of air-filled cylinders with a square cross-section) with square cells of 400x400 μm2 forms a cell area of 160,000 μm2. For an inner square of 300x300 μm2, the dielectric volume fraction of option 910 is 43.75%, or for an inner square of 320x320 μm2, the dielectric volume percentage becomes 36%. In both cases, the grid was rotated 45° about the z-axis, e.g., rotated along the z-direction.

[0179] The values measured in the first case (e.g., dielectric volume fraction of 43.75%) were -13.0 dB and -13.0 dB, resulting in a feed reflection coefficient of Γ = 0.224e j 194° and Γ = 0.222e j 194° , resulting in a change in feed reflection of |Γ - Γ1| = 0.286 and |Γ - Γ1| = 0.284.

[0180] The values measured in the second case (e.g., dielectric volume fraction of 36%) were -14.3 dB and -14.3 dB, resulting in a feed reflection coefficient of Γ = 0.193e j 205° and Γ = 0.192e j 204° , resulting in a change in feed reflection of |Γ - Γ1| = 0.254 and |Γ - Γ1| = 0.253.

[0181] Specifically, option 920 (e.g., a triangular grid of air-filled cylinders with a circular cross-section) with triangular cells having a side length of 608 μm forms a cell area of 160,069 μm 2 . When the radius of the circle is 239.4 μm, the dielectric volume fraction of option 920 is 43.75%, or when the radius of the circle is 255.4 μm, the dielectric volume percentage is 36%. In both cases, the grid was rotated 15° about the z-axis, e.g., rotated along the z-direction.

[0182] In the first case (e.g., dielectric volume fraction of 43.75%), the measured values are -13.3 dB and -13.2 dB, resulting in feed reflection coefficients of Γ = 0.217e j 192.2° and Γ = 0.218e j 192.5° , resulting in changes in feed reflection of |Γ - Γ1| = 0.279 and |Γ - Γ1| = 0.280.

[0183] In the second case, (e.g., dielectric volume fraction of 36%), the measured values are -14.8 dB and -14.8 dB, resulting in feed reflection coefficients of Γ = 0.181e j 201.5° and Γ = 0.182e j 201.8° resulting in changes in feed reflection of |Γ - Γ1| = 0.243 and |Γ - Γ1| = 0.243.

[0184] Specifically, 930 (e.g., triangular mesh of an air-filled cylinder with a triangular cross-section) has triangular cells with side lengths of 608 μm, constituting a cell area of 160069 μm 2 When the internal triangular side length is 456 μm, the dielectric volume fraction of 930 is 43.75%, or when the internal triangular side length is 486.4 μm, the dielectric volume fraction becomes 36%. In both cases, the mesh is rotated 15° about z, e.g., along the z-direction.

[0185] In the first case (e.g., dielectric volume fraction of 43.75%), the measured values are -12.9 dB and -13.4 dB, resulting in feed reflection coefficients of Γ = 0.226e j 195° and Γ = 0.214e j 197.5° , resulting in changes in feed reflection of |Γ - Γ1| = 0.288 and |Γ - Γ1| = 0.276.

[0186] In the second case (e.g., dielectric volume fraction of 36%), the measured values are -14.1 dB and -14.5 dB, resulting in feed reflection coefficients of Γ = 0.198e j 205° and Γ = 0.188e j 208° , resulting in changes in feed reflection of |Γ - Γ1| = 0.259 and |Γ - Γ1| = 0.248.

[0187] After examining the table, it can be concluded that a higher dielectric constant dielectric material with a smaller volume fraction is more advantageous than one with a larger volume fraction. Additionally, in Figure 9 Table 900 of Figure 9 , the triangular grid with cylindrical holes has an advantage (e.g., more transparent) over other variants. Also, compared to other simulation cases to be discussed below, smaller cells have a slightly better effect, that is, a structure with smaller cells will make the structure slightly more transparent.

[0188] Simulation of combination of different design concepts according to Figure 10

[0189] Figure 10a Simulations of four different structures of the simulation pusher are shown. In particular, pushers with the following structures: a) square grid 1010 with a dielectric volume fraction of 43.75%, b) isosceles triangular grid 1020 with a dielectric volume fraction of 43.75%, c) square grid 1030 with a dielectric volume fraction of 36%, and d) isosceles triangular grid 1040 with a dielectric volume fraction of 36%.

[0190] Figure 10b -e shows the results of measuring the simulated input reflection coefficient of pushers with different structures 1010, 1020, 1030, 1040. Each simulated pusher includes a spacer and a dielectric plate with a thickness of λ / 2 or a λ / 2 plate. In all simulations, the relative dielectric constant of the spacer is 1.3, and the relative dielectric constant of the higher dielectric constant material of the structure and the dielectric plate is 3.6.

[0191] The results of the simulated input reflection coefficient measurements on the pusher are shown in the following figure and Figure 10b the Smith chart of -e. Additionally, Figure 10b -e also shows the radiation patterns of a selected polarization of the dual-polarized antenna in two exemplary vertical cross-sections.

[0192] Figure 10b The results of the simulated input reflection coefficient measurements on the pusher with a square grid structure having a dielectric volume fraction of 43.75% are shown. The markings of ports 1 and 2 of Figure 1052 and Smith chart 1054 are approximately -12.9 dB and (24.0 - j 3.1) Ω at 28 GHz (0.225exp(+j195.6°)). The radiation patterns of a selected polarization of the dual-polarized antenna in two exemplary vertical cross-sections are shown in Figures 1056 and 1058.

[0193] The radiation pattern results for the first cross-section are:

[0194] Frequency: 28 GHz,

[0195] Main lobe amplitude: 9.88 dBi,

[0196] Main lobe direction: 4.0 degrees,

[0197] Angular width (3dB): 57.7 degrees, and

[0198] Side lobe level: -13.0 dB.

[0199] The radiation pattern results for the second cross-section are:

[0200] Frequency: 28 GHz,

[0201] Main lobe amplitude: 9.83 dBi,

[0202] Main lobe direction: 0.0 degrees,

[0203] Angular width (3dB): 52.3 degrees,

[0204] Side lobe level: -12.3 dB.

[0205] Figure 10c The results of the simulated input reflection coefficient measurement on the pusher with an isosceles triangular grid having a dielectric volume fraction of 43.75% are shown. The markings for ports 1 and 2 of Figure 1062 and Smith chart 1064 are approximately -13.35 dB and (24.4 - j1.9) Ω at 28 GHz (0.215exp(+j 190°)). The radiation patterns of a selected polarization of the dual-polarized antenna in two exemplary vertical cross-sections are shown in Figures 1066 and 1068.

[0206] The radiation pattern results for the first cross-section are:

[0207] Frequency: 28 GHz,

[0208] Main lobe amplitude: 9.9 dBi,

[0209] Main lobe direction: 4.0 degrees,

[0210] Angular width (3dB): 57.9 degrees, and

[0211] Side lobe level: -13.0 dB.

[0212] The radiation pattern results for the second cross-section are:

[0213] Frequency: 28 GHz,

[0214] Main lobe amplitude: 9.82 dBi,

[0215] Main lobe direction: 0.0 degrees,

[0216] Angular width (3dB): 52.0 degrees,

[0217] Sidelobe level: -12.6 dB.

[0218] Figure 10d Results of simulated input reflection coefficient measurements on a pusher with a square grid structure having a dielectric volume fraction of 36.0% are shown. The markings for ports 1 and 2 of plots 1072 and Smith chart 1074 are approximately -14.3 dB and (26.1 - j4.45) Ω at 28 GHz (0.193exp(+j205°)). Radiation patterns for a selected polarization of the dual-polarized antenna in two exemplary vertical cross-sections are shown in plots 1076 and 1078.

[0219] The radiation pattern results for the first cross-section are:

[0220] Frequency: 28 GHz,

[0221] Main lobe amplitude: 9.95 dBi,

[0222] Main lobe direction: 3.0 degrees,

[0223] Angular width (3 dB): 57.8 degrees, and

[0224] Sidelobe level: -13.3 dB.

[0225] The radiation pattern results for the second cross-section are:

[0226] Frequency: 28 GHz,

[0227] Main lobe amplitude: 9.91 dBi,

[0228] Main lobe direction: 1.0 degrees,

[0229] Angular width (3 dB): 51.7 degrees,

[0230] Sidelobe level: -12.3 dB.

[0231] Figure 10e Results of simulated input reflection coefficient measurements on a pusher with an isosceles triangle grid having a dielectric volume fraction of 36.0% are shown. The markings for ports 1 and 2 of plots 1082 and Smith chart 1084 are approximately -15.0 dB and (26.5 - j3.02) Ω at 28 GHz (0.178exp(+j198°)). Radiation patterns for a selected polarization of the dual-polarized antenna in two exemplary vertical cross-sections are shown in plots 1086 and 1088.

[0232] The radiation pattern results for the first cross-section are:

[0233] Frequency: 28 GHz,

[0234] Main lobe amplitude: 9.93 dBi,

[0235] Main lobe direction: 4.0 degrees,

[0236] Angular width (3dB): 58.3 degrees, and

[0237] Sidelobe level: -13.4 dB.

[0238] The radiation pattern results for the second cross-section are:

[0239] Frequency: 28 GHz,

[0240] Main lobe amplitude: 9.87 dBi,

[0241] Main lobe direction: 0.0 degrees,

[0242] Angular width (3dB): 51.6 degrees,

[0243] Sidelobe level: -12.5 dB.

[0244] Further measurement results are presented in Figure 11 Table 1100, which compares the variation of the feed reflection coefficient.

[0245] According to Figure 11 measurement results

[0246] Figure 11 Table 1100 related to the variation of the feed reflection coefficient is shown. That is, for different cases described in the "Description" column, the table indicates the 28 GHz feed reflection coefficient and the variation of the feed reflection. The notes related to the cases indicated by letters in the last column of the table are as follows:

[0247] There are minor differences between the simulations of the "antenna only" structure (i.e., without any pusher), which may be due to the different sizes of the "air volume" in the computational domain and the different meshes.

[0248] B According to the measurement with a pusher made of a homogeneous foam dielectric with a dielectric constant ε rel = 1.2, this variation of the feed reflection is acceptable, but it is not known to what extent (slightly) larger changes are also acceptable.

[0249] C When a material with a dielectric constant ε rel = 3.6 such as PEEK is used for the homogeneous pusher, it will cause completely unacceptable interference to the antenna.

[0250] E The thin structured spacer layer is made of foam (ε rel = 1.3), the foam is very soft, but it has sufficient hardness when the thickness is small (0.3 mm). This spacer layer will be specially processed according to the layout of the antenna (array) aperture surface.

[0251] H For the dual-polarization structure, the previous one-dimensional periodic lamellar pusher becomes a two-dimensional periodic pusher. As a result, it loses the main electromagnetic characteristic, i.e., avoiding the generation of tangential electric fields at the dielectric-air boundary. Different from Case #16, Case #17 uses a triangular grid instead of a square grid, thus weakening the "electric field parallelism problem" and achieving better performance under the same volume fraction. Although the holes are assumed to be cylindrical holes (considering manufacturability), holes with a triangular cross-section would be better but are not feasible.

[0252] I For the dual-polarization structure and all structures, reducing the volume fraction of the dielectric, e.g., increasing the volume fraction of air, helps to reduce the level of change in the reflection coefficient caused by the pusher.

[0253] Regarding the radiation pattern, the dielectric pusher causes a focusing effect, such as higher directivity and a narrower beam in the direction perpendicular to the antenna surface. As long as this effect is small, it will not have a significant negative impact on test applications. Except for the schematic Case #3, such as a completely uniform PEEK pusher, all other pushers only cause minor pattern changes.

[0254] In summary, for the bilinear polarization antenna, the proposed electromagnetic characteristics are very valuable. The pusher may not be completely transparent, some antenna interference may be acceptable, or a reduction in the dielectric volume fraction may be achieved in the structure or structured part of the pusher. The more the dielectric volume is reduced, the more problematic the manufacturability becomes.

[0255] Implement alternative solutions

[0256] Although some aspects are described in the context of a device, it is clear that these aspects also represent a description of the corresponding method, where a block or device corresponds to a method step or a feature of a method step. Similarly, aspects described in the context of a method step also represent a description of the corresponding block or item or feature of the corresponding device. Some or all of the method steps can be performed by (or using) a hardware device. In some embodiments, one or more of the most important method steps can be performed by such a device.

[0257] The above embodiments are only used to illustrate the principle of the present invention. It should be understood that modifications and variations of the arrangements and details described herein will be apparent to other technicians in the art. Therefore, the scope of the present invention is only limited by the scope of the upcoming patent claims, rather than by the specific details presented herein through the description and explanation of the embodiments.

Claims

1. A pusher (140, 240, 340, 520, 720) for use in an automated test device to mechanically push a device under test (110) into a device under test socket (130). Wherein, The pusher (140, 240, 340, 520, 720) includes a high dielectric constant dielectric region (160a, 260a, 560a) and a low dielectric constant dielectric region (160b, 260b, 560b), forming a high dielectric constant dielectric column (160a, 260a, 560a), a structure (150, 250, 550, 910, 920, 930, 1010, 1020, 1030, 1040) having a low dielectric constant dielectric region (160b, 260b, 560b) between the columns, or a structure (150, 250, 550, 910, 920, 930, 1010, 1020, 1030, 1040) of a high dielectric constant dielectric block having low dielectric constant dielectric holes (160b, 260b, 560b), wherein the high dielectric constant dielectric column (160a, 260a, 560a) or hole (160b, 260b, 560b) extends in a first direction (170, 270), and the first direction is within + / -45° of the pushing direction (170, 270).

2. The pusher (140, 240, 340, 520, 720) according to claim 1, wherein, The high dielectric constant dielectric column (160a, 260a, 560a) or hole (160b, 260b, 560b) is circular or square or triangular or cross-shaped.

3. The pusher (140, 240, 340, 520, 720) according to any one of the preceding claims, wherein, The structure (150, 250, 550, 910, 920, 930, 1010, 1020, 1030, 1040) includes 5 to 50 high dielectric constant dielectric columns (160a, 260a, 560a) or holes (160b, 260b, 560b) per free space wavelength of the electromagnetic wave transmitted or received by the antenna (120, 220, 500, 600, 710, 810) of the device under test (110).

4. The pusher (140, 240, 340, 520, 720) according to any one of the preceding claims, wherein, The structure (150, 250, 550, 910, 920, 930, 1010, 1020, 1030, 1040) includes a matrix of high dielectric constant dielectric columns (160a, 260a, 560a) or a regular grid of high dielectric constant dielectric columns (160a, 260a, 560a) or holes (160b, 260b, 560b).

5. The pusher (140, 240, 340, 520, 720) according to any one of the preceding claims, wherein, The structure (150, 250, 550, 910, 920, 930, 1010, 1020, 1030, 1040) includes a high dielectric constant dielectric region (160a, 260a, 560a) with a volume fraction between 9% and 66.6% or between 20% and 60%, and a low dielectric constant dielectric region (160b, 260b, 560b) with a volume fraction between 91% and 33.3% or between 80% and 40%.

6. The pusher (140, 240, 340, 520, 720) according to any one of the preceding claims, wherein, The surface of the pusher (140, 240, 340) configured to contact the device under test (110) is formed such that the pusher (140, 240, 340, 520, 720) avoids contacting or approaching the conductive edge of the antenna (120, 220, 500, 600, 710, 810) of the device under test (110) within a distance of 1 / 10 of the wavelength of the electromagnetic wave transmitted or received by the antenna (120, 220, 500, 600, 710, 810) of the device under test (110).

7. The pusher (140, 240, 340, 520, 720) according to any one of claims 1 to 5 of the preceding claims, wherein, The pusher (140, 240, 340, 520, 720) includes a spacer (290, 590, 830) configured to be between the structure (150, 250, 550, 910, 920, 930, 1010, 1020, 1030, 1040) and the device under test (110). Wherein, the spacer is perpendicular to the post or hole, with a tolerance within + / -15°, and / or the spacer is parallel to the surface of the device under test to be pushed by the pusher (140, 240, 340), with a tolerance within + / -15°.

8. The pusher (140, 240, 340, 520, 720) according to claim 7, wherein, The spacer (290, 590, 830) is also configured to contact the device under test (110) such that the spacer (290, 590, 830) avoids contacting or approaching the conductive edge of the antenna (120, 220, 500, 600, 710, 810) of the device under test (110) within a distance of 1 / 10 of the wavelength of the electromagnetic wave transmitted or received by the antenna (120, 220, 500, 600, 710, 810) of the device under test (110).

9. The pusher (140, 240, 340, 520, 720) according to claim 7 or 8, wherein, The relative dielectric constant of the spacer (290, 590, 830) is less than or equal to 1.

5.

10. The pusher (140, 240, 340, 520, 720) according to any one of claims 7 - 9 of the preceding claims, wherein, The thickness of the spacer (290, 590, 830) is between 50 microns and 500 microns.

11. The pusher (140, 240, 340, 520, 720) according to claim 10, wherein, The thickness of the spacer (290, 590, 830) is between 100 microns and 350 microns.

12. The pusher (140, 240, 340, 520, 720) according to any one of the preceding claims, wherein, The pusher (142, 240, 350, 520, 730) includes a dielectric plate (280, 580) transverse or perpendicular to the pushing direction (170, 270), with a tolerance within + / -15°. Wherein, the dielectric plate (280, 580) is configured to mechanically support a higher dielectric constant dielectric post (160a, 260a, 560a) or a higher dielectric constant dielectric block.

13. The pusher (140, 240, 340, 520, 720) according to claim 12, wherein, The thickness of the dielectric plate (280, 580) is an integer multiple of half the wavelength of the electromagnetic wave transmitted or received by the antenna (120, 220, 500, 600, 710, 810) of the device under test (110) in the dielectric material of the dielectric plate (280, 580), with a tolerance within 1 / 10 of the wavelength of the electromagnetic wave transmitted or received by the antenna (120, 220, 500, 600, 710, 810) of the device under test (110). Among them, the distance between the dielectric plates (280, 580) and the surface of the antennas (120, 220, 500, 600, 710, 810) of the device under test (110) is at least one wavelength of the electromagnetic wave transmitted or received by the antennas (120, 220, 500, 600, 710, 810) of the device under test (110).

14. The pusher (140, 240, 340, 520, 720) according to claim 12 or 13, wherein, The length of the higher dielectric constant dielectric columns (160a, 260a, 560a) or holes (160b, 260b, 560b) in the pushing direction is between 0.5 and 2 times the free space wavelength of the electromagnetic wave transmitted or received by the antennas (120, 220, 500, 600, 710, 810) of the device under test (110).

15. The pusher (140, 240, 340, 520, 720) according to any one of the preceding claims, wherein, The relative dielectric constant of the higher dielectric constant dielectric regions (160a, 260a, 560a) is greater than 2.

16. The pusher (140, 240, 340, 520, 720) according to any one of the preceding claims, wherein, The higher dielectric constant dielectric regions (160a, 260a, 560a) are made of polymer or polycarbonate or quartz or polytetrafluoroethylene or PEEK material.

17. The pusher (140, 240, 340, 520, 720) according to any one of the preceding claims, wherein, The relative dielectric constant of the lower dielectric constant dielectric regions (160b, 260b, 560b) is less than or equal to 1.

5.

18. The pusher (140, 240, 340, 520, 720) according to any one of the preceding claims, wherein, The lower dielectric constant dielectric regions (160b, 260b, 560b) include air.

19. The pusher (140, 240, 340, 520, 720) according to any one of the preceding claims, wherein, The pushing directions (170, 270) are perpendicular to the far-field direction of the electric field in the main lobe of the antennas (120, 220, 500, 600, 710, 810) of the device under test (110), with a tolerance within + / -15°, or Among them, the pushing directions (170, 270) are perpendicular to the main surface of the device under test (110), with a tolerance within + / -15°, or Among them, the pushing directions (170, 270) are perpendicular to the main surface of the device under test socket (130), with a tolerance within + / -15°.

20. A test device (100) for testing a device under test (110), comprising a device under test (110) having an antenna (120, 220, 500, 600, 710, 810), and being pushed into a socket of the device under test by a pusher (140, 240, 340, 520, 720) according to any one of the preceding claims to test the device under test (110).

21. The test device (100) according to claim 20, wherein, The pusher (140, 240, 340, 520, 720) is the pusher (140, 240, 340, 520, 720) according to claim 12, and the thickness of the dielectric plates (280, 580) of the pusher (140, 240, 340, 520, 720) is an integer multiple of half the wavelength of the electromagnetic wave transmitted or received by the antennas (120, 220, 500, 600, 710, 810) of the device under test (110) in the dielectric material of the dielectric plates, with a tolerance within 1 / 10 of the wavelength of the electromagnetic wave transmitted or received by the antennas (120, 220, 500, 600, 710, 810) of the device under test (110), and Among them, the distance between the dielectric plates (280, 580) and the surface of the antennas (120, 220, 500, 600, 710, 810) of the device under test (110) is at least one wavelength of the electromagnetic wave transmitted or received by the antennas (120, 220, 500, 600, 710, 810) of the device under test (110).

22. The test device (100) according to claim 20 or 21, wherein, The length of the higher dielectric constant dielectric column (160a, 260a, 560a) or hole (160b, 260b, 560b) of the pusher (140, 240, 340, 520, 720) in the pushing direction (170, 270) is between 0.5 and 2 times the free space wavelength of the electromagnetic wave transmitted or received by the antenna (120, 220, 500, 600, 710, 810) of the device under test (110).

23. A method for mechanically pushing a device under test (110) into a socket (130) of an automated test equipment for the device under test, wherein, The method includes mechanically pushing the device under test (110) into the device under test socket (130) using a pusher (140, 240, 340), the pusher including a higher dielectric constant dielectric column (160a, 260a, 560a), a structure (150, 250, 550, 910, 920, 930, 1010, 1020, 1030, 1040) having a lower dielectric constant dielectric region (160b, 260b, 560b) between the columns, or a structure (150, 250, 550, 910, 920, 930, 1010, 1020, 1030, 1040) of a higher dielectric constant dielectric block having a lower dielectric constant dielectric hole (160b, 260b, 560b), wherein the higher dielectric constant dielectric column (160a, 260a, 560a) or the lower dielectric constant dielectric hole (160b, 260b, 560b) extends in a first direction (170, 270), the first direction being within + / - 45° of the pushing direction (170, 270).

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