System and method for automatic detection of spectrometer sample accessories

Abstract

Embodiments of the present invention relate to a sample compartment subassembly for a spectrometer. The subassembly includes a sample support adapted to support one or more sample holders for use in a sample compartment. The sample support is associated with one or more magnets. The subassembly further includes a sensor assembly configured to detect the one or more magnets associated with the sample support to identify a mode of operation of the spectrometer corresponding to the sample support.

Description

Technical Field

[0001] The present invention relates to systems and methods for the automatic detection of spectrometer sample accessories, a sample compartment subassembly for a spectrometer, and a spectrometer having automatic detection capabilities. Background Art

[0002] Spectrometers such as UV-Vis-IR or UV-Vis-NIR spectrophotometers are typically packaged with a range of different sample accessories having sample handling characteristics to handle different types of samples. Generally, different types of samples may require different types of analysis and thus different operating modes of the spectrometer to be used. For example, different quantitative methods (including nucleic acid quantification, protein quantification, Lowry method, BCA method, CBB method, biuret method, or UV absorption method, etc.) can be used to analyze DNA and protein samples. Other types of solid and / or liquid samples may need to be analyzed by measuring absorbance or transmittance at a single wavelength or multiple wavelengths, or by measuring the change of absorbance, transmittance, or energy over time.

[0003] Conventionally, once an operator sets a sample accessory for processing one or more samples, the appropriate operating mode of the spectrometer is manually selected each time a new sample accessory setting is used. This can be time-consuming and is prone to manual handling errors.

[0004] Embodiments of the present invention may provide a sample component subassembly, a spectrometer, a system and method for determining the operating mode of a spectrometer, which overcome or ameliorate one or more of the above disadvantages or problems, or at least provide a useful option for consumers.

[0005] The citation of any patent document or any other matter identified as prior art herein should not be construed as an admission that said document or other matter is known or that the information contained therein is part of the common general knowledge as of the priority date of any claim. Summary of the Invention

[0006] According to one aspect of the present invention, there is provided a sample compartment subassembly for a spectrometer, the subassembly comprising a sample support adapted to support one or more sample racks for use in the sample compartment, the sample support being associated with one or more magnets, and a sensor assembly configured to detect the one or more magnets associated with the sample support in order to identify the mode of operating the spectrometer corresponding to the sample support.

[0007] Advantageously, the sensor assembly enables the automatic detection of one or more magnets to determine the specific type of sample support, the specific setup of the sample support, and / or the specific sample carried by one or more sample holders deployed in the sample compartment of the spectrometer, such that the spectrometer's processor can determine the appropriate operating mode of the spectrometer. The automatic detection reduces manual operation and provides improved equipment setup efficiency and accuracy.

[0008] In one embodiment, the sensor assembly can include one or more magnetic field sensors for detecting one or more magnets. Any suitable type of magnetic field sensor can be used. For example, the magnetic field sensor can include any one or more of a Hall effect sensor, a reed contact switch, a semiconductor magnetoresistor, a ferromagnetic magnetoresistor, a magnetic encoder, a magnetoresistive position sensor. Alternatively, one or more optical sensors can be used in the sensor assembly. In other embodiments, electrical contacts or electromechanical switches can be used in the sensor assembly. In this embodiment, one or more terminals can be provided in place of the one or more magnets. The electrical contacts or electromechanical switches can contact one or more of the terminals to determine the operating mode of the spectrometer.

[0009] The subassembly can further include a base mount for mounting to the base of the sample compartment of the spectrometer. The base mount can be associated with the sensor assembly. Specifically, the sensor assembly can be mounted in the base mount. Alternatively, the sensor assembly can be mounted to the wall or floor of the sample compartment.

[0010] The base mount can define an aperture for exposing the sensor portion of the sensor assembly such that the sensor portion is aligned with the one or more magnets in use to facilitate detection of the one or more magnets by the sensor assembly.

[0011] In use, the sample support can be fixed to the base mount via any suitable fastening means. For example, clamps, brackets, screws, nuts, rivets, or any combination thereof can be used. In one embodiment, the sample support can include mounting magnets for fixing the sample support to the base mount.

[0012] The one or more magnets can be mounted to the underside of the sample support for detection by the sensor assembly. Additionally, the one or more magnetic field sensors can be arranged such that the position of each magnetic field sensor corresponds to the position of the magnet.

[0013] The magnets can be arranged in any suitable manner. For example, the magnets can be arranged in one or more arrays, rows, and / or columns, aligned or misaligned, or in any random configuration.

[0014] The sample support can be associated with a plurality of magnets. The plurality of magnets can be arranged in rows. The subassembly can further include a magnetic keeper for masking one or more of the plurality of magnets so as to provide a plurality of unique combinations of exposed magnets for detection by a sensor assembly. Each combination can be associated with a specific operating mode of the spectrometer.

[0015] Advantageously, the keeper can be arranged to provide a specific combination of exposed magnets associated with a specific operating mode that corresponds to and is adapted for analyzing a specific sample arranged in a specific manner relative to the sample support. This enables automatic detection of the appropriate operating mode of the spectrometer once the sample support carrying the specific sample is loaded into the sample compartment of the spectrometer.

[0016] The magnetic keeper can include a mask that defines a plurality of apertures therein. Movement of the mask relative to the plurality of magnets can change the combination of magnets exposed through the apertures, thereby providing a plurality of unique combinations of exposed magnets. Specifically, the movement of the mask can include any combination of one or more of translation, rotation, and inversion of the mask.

[0017] The mask can have any suitable shape and size. In one embodiment, the mask is a substantially rectangular plate. The mask can be made of a ferromagnetic material such as iron.

[0018] The sensor assembly can be coupled to a controller of the spectrometer to determine or facilitate the determination of the operating mode of the spectrometer corresponding to the sample support. Specifically, when the sensor assembly detects a specific combination of exposed magnets, the sensor assembly generates a signal and transmits it to the controller of the spectrometer. The signal can be any suitable signal. In one embodiment, the signal is a unique binary code corresponding to the detected unique combination of exposed magnets. The controller can determine the operating mode of the spectrometer corresponding to the signal received from the sensor assembly. The controller can transmit the signal to an external processor for determining the appropriate operating mode of the spectrometer.

[0019] According to another aspect of the present invention, there is provided a spectrometer that includes a sample compartment subassembly as described herein.

[0020] According to a further invention, there is provided a spectrometer having a sample compartment, the spectrometer comprising: a sample support adapted to support one or more sample holders for use in the sample compartment, the sample support being associated with one or more magnets, A base mount adapted to be mounted to the base of the sample compartment of the spectrometer, the base mount having an associated sensor assembly configured to detect one or more magnets associated with the sample support to identify the mode of operating the spectrometer corresponding to the sample support.

[0021] The spectrometer may include a plurality of sample supports, each sample support being adapted to support one or more sample holders for holding a type of sample and / or facilitating a particular type of sample analysis.

[0022] In one embodiment, the spectrometer may be a UV-Vis-IR or UV-Vis-NIR spectrophotometer. In another embodiment, the spectrometer may be a Laser Direct Infrared (LDIR) spectrometer. In yet another embodiment, the spectrometer may be a Fourier Transform Infrared (FTIR) spectrometer.

[0023] According to another aspect of the present invention, there is provided an automatic identification system for a sample accessory of a spectrometer, the system comprising: A plurality of magnets associated with the sample accessory, and A sensor assembly mounted in the sample compartment of the spectrometer, the sensor assembly being configured to detect the plurality of magnets when the sample accessory is used in the sample compartment to determine the mode of operating the spectrometer corresponding to the sample accessory.

[0024] The system may further include a magnetic retainer configured to mask one or more of the plurality of magnets to provide a plurality of unique combinations of exposed magnets for detection by the sensor assembly, each combination being associated with a particular operating mode of the spectrometer.

[0025] The sensor assembly may be configured to generate a unique binary code corresponding to the unique combination of exposed magnets detected by the sensor assembly.

[0026] The system may further include a processor. The processor may be configured to receive the unique binary code, determine the operating mode based on the received unique binary code, and set the operating parameters and data collection method for the spectrometer based on the determined operating mode. The processor may receive the unique binary code via the controller of the spectrometer.

[0027] According to yet another aspect of the present invention, there is provided a method of determining the operating mode of a spectrometer, the method comprising Providing a sample support for supporting one or more sample racks for use in the sample compartment, the sample support being associated with one or more magnets, and Detecting the one or more magnets using a sensor assembly to identify a mode of operating the spectrometer corresponding to the sample support.

[0028] The method may further comprise: mounting a magnetic retainer above the one or more magnets such that a unique combination of the one or more magnets is exposed via one or more apertures of the magnetic retainer, the unique combination being associated with a particular operating mode of the spectrometer, wherein detecting the one or more magnets comprises detecting the unique combination using the sensor assembly.

[0029] The method may further comprise moving the magnetic retainer relative to the one or more magnets such that different unique combinations of the one or more magnets are exposed via the one or more apertures of the magnetic retainer, the different unique combinations being associated with different operating modes of the spectrometer.

[0030] Moving the magnetic retainer relative to the one or more magnets may comprise one or more of: translating, rotating, and / or inverting the magnetic retainer.

[0031] The method may further comprise generating, via the sensor assembly, a unique binary code corresponding to the unique combination of the exposed magnets detected by the sensor assembly.

[0032] According to a further aspect of the invention, there is provided a system for determining an operating mode of a spectrometer, the system comprising: One or more magnets mounted to a sample support adapted to support one or more sample racks for use in a sample compartment of the spectrometer; and A sensor assembly for detecting the one or more magnets and generating a signal; and a controller for receiving the signal and identifying, based on the signal, a mode of operating the spectrometer corresponding to the sample support.

[0033] For a better understanding and implementation of the present invention, one or more preferred embodiments of the present invention will now be described by way of example only with reference to the accompanying drawings.

[0034] It will be understood that, for simplicity and clarity of illustration, where considered appropriate, reference numerals may be repeated in the drawings to indicate corresponding or analogous elements. BRIEF DESCRIPTION OF THE DRAWINGS

[0035] Figure 1A and Figure 1BShows a spectrometer with a sample compartment according to an embodiment of the present invention.

[0036] Figures 2A to 2C Shows a sample support of a sub - assembly with a magnet associated therewith according to an embodiment of the present invention.

[0037] Figures 3A to 3D Shows associated with as Figure 2A to the sample support shown in FIGS. 2D.

[0038] Figure 4A and Figure 4B Shows a base mount of a sub - assembly with a sensor assembly associated therewith according to an embodiment of the present invention.

[0039] Figure 5 Shows a cross - sectional view of a sub - assembly including the sample support and the base mount as shown in Figures 2A to 3D .

[0040] Figure 6 Is a schematic diagram showing a system for determining the operating mode of a spectrometer according to an embodiment of the present invention.

[0041] Figure 7 Is a flowchart showing a method for determining the operating mode of a spectrometer according to an embodiment of the present invention. Detailed Description

[0042] In Figure 1A and Figure 1B is shown a spectrometer 100 having a sample compartment 102. The sample compartment 102 provides space in the spectrometer for loading one or more samples for analysis by the spectrometer 100. As Figure 1A more clearly shown, the spectrometer 100 further includes a base mount 104 adapted to be mounted to the base portion of the spectrometer 100. As Figure 1B more clearly shown, the spectrometer 100 further includes a sample support 106 adapted to support sample holders 108, 110. Although Figure 1B shows the sample support 106 supporting two sample holders 108, 110, it should be understood that the sample support 106 can be configured to support any suitable number of sample holders simultaneously. Generally, the type and total number of sample holders 108, 110 mounted on the sample support 106 can be varied to accommodate the specific type of analysis to be performed in the spectrometer 100.

[0043] The spectrometer 100 can be a UV-Vis-IR or UV-Vis-NIR spectrophotometer. Alternatively, the spectrometer 100 can be a Laser Direct Infrared (LDIR) spectrometer or a Fourier Transform Infrared (FTIR) spectrometer.

[0044] Figures 2A to 2C The sample support 106 with the sample holders 108, 110 removed is shown more clearly. The sample support 106 has a generally rectangular base 112 shaped and sized to fit into the sample compartment 102 of the spectrometer 100. The sample support 106 further includes a handle 114 mounted to the base 112 to facilitate insertion and removal of the sample support 106 into and out of the sample compartment 102. Generally, the spectrometer 100 can include a plurality of different sample supports 106 and a plurality of different sample holders 108, 110 (collectively also referred to herein as sample accessories) that can be used in any combination to enable the desired sample analysis to be performed by the spectrometer 100.

[0045] As Figure 2B shown, the sample support 106 provides a plurality of magnets 200a, 200b, 200c, 200d mounted to the underside of the sample support 106. In the specific embodiment shown, the plurality of four magnets 200a, 200b, 200c, 200d are arranged in a row and fixed to corresponding recesses in the base 112 of the sample support 106. As described in further detail below with reference to Figures 4A to 5 a particular combination of magnets (from a plurality of combinations of magnets) can be detected by the sensor assembly to determine the appropriate operating mode of the spectrometer 100.

[0046] To provide a plurality of combinations of magnets, a magnetic retainer 202 is provided to mask one or more of the plurality of magnets 200a, 200b, 200c, 200d. In the specific embodiment shown, the magnetic retainer 202 is a generally rectangular mask having a plurality of apertures 204 defined therein. The apertures 204 are positioned adjacent to the perimeter of the mask and are spaced along each of the four edges / sides of the mask 202.

[0047] The recessed portion 206 in the sample support 106 is shaped and sized to receive the magnetic retainer 202 therein. As Figure 2CAs shown more clearly in, when the magnets 200a, 200b, 200c, 200d and the magnetic force retainer 202 are all fixed to the lower side of the sample support 106, the magnetic force retainer 202 is placed above the rows of the magnets 200a, 200b, 200c, 200d. When the magnetic force retainer 202 is placed above the magnets 200a, 200b, 200c, 200d, one or more of the plurality of magnets 200a, 200b, 200c, 200d are exposed through one or more apertures of the magnetic force retainer 202.

[0048] The apertures are positioned along each edge of the magnetic force retainer 202. Further, when the magnetic force retainer 202 is moved relative to the magnets 200a, 200b, 200c, 200d, the apertures are positioned to align with different ones of the plurality of magnets 200a, 200b, 200c, 200d. Specifically, the sample support 106 includes markings 208 near the rows of the magnets 200a, 200b, 200c, 200d to facilitate the correct positioning and alignment of the magnetic force retainer 202 relative to the magnets 200a, 200b, 200c, 200d. For example, when the first side 210 of the magnetic force retainer 202 is aligned with the marking 208, as Figure 2C shown, the aperture 218 near the first side 210 is aligned with one of the magnets, magnet 200a, and only the aligned magnet 200a is exposed through the aperture 218, and the remaining magnets 200b, 200c, 200d of the magnets are covered by the magnetic force retainer 202 such that the magnetic fields of the covered magnets 200b, 200c, 200d cannot be detected by the magnetic field sensor assembly. In this position, only the magnetic field of the exposed magnet 200a can be detected by the magnetic field sensor assembly. Thus, in this scenario, the only combination of exposed magnets that can be detected by the sensor assembly is the single magnet 200a. When the only combination (i.e., the single magnet 200a) is detected, the sensor assembly can generate the unique binary code "1000".

[0049] Similarly, when the magnetic retainer 202 rotates such that the second side 216 of the magnetic retainer 202 aligns with the marker 208, the orifice corresponding to the second side 216 will align with a different magnet 200b in the magnet array and only the aligned magnet 200b will be exposed via the orifice 220, and the remaining magnets 200a, 200c, 200d in the magnet array will be covered by the magnetic retainer 202 such that the magnetic fields of the covered magnets 200a, 200c, 200d cannot be detected by the magnetic field sensor assembly. In this position, only the magnetic field of the exposed magnet 200b can be detected by the magnetic field sensor assembly. Thus, in this scenario, the only combination of exposed magnets that can be detected by the sensor assembly is the single magnet 200b. When the said unique combination (i.e., the single magnet 200b) is detected, the sensor assembly can generate the unique binary code "0100".

[0050] When the magnetic retainer 202 rotates further such that the third side 214 of the magnetic retainer 202 aligns with the marker 208, two orifices 222, 224 corresponding to the third side 214 will align with two magnets 200a, 200b in the magnet array and only the aligned magnets 200a, 200b will be exposed via the orifices 222, 224 respectively. The remaining magnets 200c, 200d in the magnet array will be covered by the magnetic retainer 202 such that the magnetic fields of the covered magnets 200c, 200d cannot be detected by the magnetic field sensor assembly. In this position, only the magnetic fields of the exposed magnets 200a, 200b can be detected by the magnetic field sensor assembly. Thus, in this scenario, the only combination of exposed magnets that can be detected by the sensor assembly includes the magnets 200a, 200b. When the said unique combination (i.e., the magnets 200a, 200b) is detected, the sensor assembly can generate the unique binary code "1100".

[0051] When the magnetic retainer 202 rotates further such that the fourth side 212 of the magnetic retainer 202 aligns with the marker 208, two orifices 226, 228 corresponding to the fourth side 212 will align with two different magnets 200a, 200c in the magnet array, and only the aligned magnets 200a, 200c will be exposed via the orifices 228, 226 respectively. The remaining magnets 200b, 200d in the magnet array will be covered by the magnetic retainer 202 such that the magnetic fields of the covered magnets 200b, 200d cannot be detected by the magnetic field sensor assembly. In this position, only the magnetic fields of the exposed magnets 200a, 200c can be detected by the magnetic field sensor assembly. Thus, in this scenario, the only combination of exposed magnets that can be detected by the sensor assembly includes the magnets 200a, 200c. When the said unique combination (i.e., the magnets 200a, 200c) is detected, the sensor assembly can generate the unique binary code "1010".

[0052] In the above example, the magnetic retainer 202 can be rotated to provide four unique combinations of the exposed magnets from the plurality of magnets 200a, 200b, 200c, 200d. The magnetic retainer 202 can be reversed and rotated to provide four additional unique combinations of the exposed magnets. As Figures 3A to 3D shown, a plurality of magnetic retainers 202 can be provided to provide any suitable number of unique combinations of the exposed magnets.

[0053] Specifically, Figure 3A a close-up view of the magnetic retainer 202 is shown in Figure 3B The reverse side of the magnetic retainer 202 is shown, where four additional unique combinations of the exposed magnets can be provided when each of the four corresponding sides 240, 242, 244, 246 is aligned with the marker 208 in use.

[0054] In Figure 3C and Figure 3D different magnetic retainers 300 are shown. Figure 3C The first side of the magnetic retainer 300 is shown, where different numbers and arrangements of apertures 302 are provided along each of the four sides 304, 306, 308, 310. When the first side of the magnetic retainer 300 faces outward when attached to the base 112 of the sample support 106, four additional unique combinations of the exposed magnets can be provided when each of the four corresponding sides 304, 306, 308, 310 is aligned with the marker 208 in use.

[0055] As Figure 3D shown, the second side of the magnetic retainer 300 opposite the first side provides additional options for the unique combinations of the exposed magnets in use. Specifically, when the retainer 300 is mounted to the base 112 of the sample support 106 with the second side facing outward, two additional unique combinations of the exposed magnets can be provided when each of the two corresponding sides 314, 316 is aligned with the marker 208. Regardless of whether the first side or the second side of the retainer 300 faces outward when attached to the sample support 106, side 306 provides the same combination of the exposed magnets. Similarly, regardless of whether the first side or the second side of the retainer 300 faces outward when attached to the sample support 106, side 308 also provides the same combination of the exposed magnets.

[0056] In other embodiments, the sample support 106 can provide more than four magnets to allow for a higher number of unique combinations when placed together with the magnetic retainer, to allow for a higher range of operating modes to be selected for the spectrometer when needed.

[0057] As Figure 4AAs shown, the spectrometer 100 further includes a sensor assembly 400 configured to detect one or more magnets 200a, 200b, 200c, 200d associated with the sample support 106 to identify the mode of operating the spectrometer 100 corresponding to the sample support 106. In the illustrated embodiment, the sensor assembly 400 includes a plurality of magnetic field sensors 402a, 402b, 402c, 402d. Specifically, the sensor assembly 400 includes four magnetic field sensors 402a, 402b, 402c, 402d for detecting different combinations of exposed magnets provided by the interaction between the magnetic mask 202 and the magnets 200a, 200b, 200c, 200d mounted to the underside of the sample support 106.

[0058] Any suitable magnetic field sensors 402a, 402b, 402c, 402d can be used. In one embodiment, Hall effect sensors can be used to detect the magnets 200a, 200b, 200c, 200d.

[0059] The sensor assembly 400 includes a printed circuit board (PCB) 404. The four magnetic field sensors 402a, 402b, 402c, 402d are provided by the PCB 404. The PCB 404 is protected and held in place between the cover 406 and the seat 408. The assembly including the cover 406, PCB 404, and seat 408 is mounted to the underside of the base mount 104. The base mount 104 defines an opening 410 to expose the magnetic field sensors 402a, 402b, 402c, 402d and facilitate the detection of the magnets 200a, 200b, 200c, 200d.

[0060] Figure 4B The underside of the cover 406 is shown. The cover 406 includes a plurality of recesses, each sized and positioned to respectively align with each of the magnetic field sensors 402a, 402b, 402c, 402d. The cover 406 is typically made of a non-magnetic material and is used to protect the magnetic field sensors 402a, 402b, 402c, 402d from the ingress of dust and liquid.

[0061] The PCB 404 further includes a port 412 to facilitate a wired connection of the PCB 412 to the controller 610 of the spectrometer 100, as will be described in further detail below with reference to Figure 6 The seat 408 defines an opening 414 to accommodate the port 412 and the wired connection from the PCB 404 to the controller 610.

[0062] In use, the sample support 106 is fixed to the base mount 104 via the mounting magnet 116 (see Figure 2C and Figure 2B), but it should be understood that any suitable fastening means can be used to fix the sample support 106 to the base mount 104. As Figure 5 shown, each of the magnetic field sensors 402a, 402b, 402c, 402d is aligned with a corresponding one of the magnets 200a, 200b, 200c, 200d. In Figure 5 the embodiment shown, the magnetic keeper 200 is covering three of the magnets 200b, 200c, 200d, and only one of the magnets 200a is exposed via the aperture 218. In this scenario, only one of the magnetic field sensors 402a in the magnetic field sensors of the sensor assembly 400 will detect the presence of the magnetic field. A corresponding unique binary code (i.e., "1000") is generated by the sensor assembly 400 and sent to the controller 610.

[0063] Figure 6 A schematic diagram of a system 600 for determining the operating mode of the spectrometer 100 is shown. The system 600 includes a plurality of magnets 602 mounted to the sample support 106. A magnetic keeper 604 can be removably mounted above the magnets 602 to provide a plurality of unique combinations of the exposed magnets 602, as described above with reference to Figures 2B to 3D described.

[0064] The system 600 further includes a sensor assembly 606 disposed in the sample compartment of the spectrometer 100. The sensor assembly 606 can be mounted to the base mount 104. Alternatively, the sensor assembly 606 can be disposed elsewhere in the spectrometer. For example, the sensor assembly 606 can be directly mounted to the bottom plate of the sample compartment.

[0065] The sensor assembly 606 includes a plurality of magnetic field sensors 608. Each magnetic field sensor 608 corresponds to a magnet 602. The magnets 602 and the magnetic field sensors 608 are positioned such that each magnet is aligned with a corresponding magnetic field sensor to facilitate detection of the magnetic field associated with each magnet by the corresponding aligned magnetic field sensor 608. As mentioned, the interoperability between the magnetic keeper 604 and the magnets 602 provides a plurality of unique combinations of the exposed magnets 602 for detection by the sensor assembly 400.

[0066] The system further includes a controller 610. When each unique combination of the exposed magnets 602 is detected, the sensor assembly 606 generates a unique binary code, which is transmitted to the controller 610 to determine the appropriate operating mode of the spectrometer 100. Then the determined operating mode is transmitted from the controller 610 to an external processor 612. Alternatively, the controller 610 can directly transmit the unique binary code to the processor 612, and the processor 612 determines the corresponding operating mode of the spectrometer 100. The external processor 612 is configured to set and control the operation of the spectrometer 100 based on the determined operating mode.

[0067] Reference will now be made to Figure 7 method 700 for determining the operating mode of the spectrometer 100.

[0068] In practice, the spectrometer 100 can have multiple different types of sample supports 106 and associated sample holders 110 (collectively referred to herein as sample accessories). The sample accessories can be used in any combination to provide a specific setup suitable for analyzing one or more specific types of samples in the spectrometer 100. Each sample accessory can have different sample handling characteristics. For example, different sample accessories can be adapted to handle solids and / or liquids for measurement in transmission or reflection modes by a UV-Vis-IR spectrometer.

[0069] At step 702, the operator sets the sample accessory by selecting a specific sample support 106 and one or more sample holders 110 for mounting to the sample support 106.

[0070] At step 704, the operator selects an appropriate magnetic holder 202 to be used with the sample accessory. As Figures 3A to 3C shown, each side of the magnetic holder 202 is numbered, and each number is associated with a specific operating mode, such that the operator can determine the appropriate side of the holder 202 for alignment with the marker 208 to enable automatic detection of the desired operating mode.

[0071] At step 706, the operator sets the sample accessory for a specific sample analysis. To this end, the operator moves the magnetic holder 202 such that the relevant edge / side of the holder 202 is aligned with the marker 208 on the sample support 106 to provide the desired operating mode. Once the magnetic holder 202 is properly aligned and fixed in place, the configured sample accessory is loaded into the sample compartment 102. Mounting the magnet 116 secures the sample support 106 to the base mount 104 in the sample compartment 102.

[0072] At step 708, the sensor assembly 400 detects a unique combination of exposed magnets from the sample attachment and generates a unique binary code for transmission to the controller 610. For example, for each magnetic field sensor 608 that detects the presence of a magnetic field from the corresponding magnet 602, the sensor assembly 400 generates a binary number "1" corresponding to the magnetic field sensor 608. Otherwise, the sensor assembly 400 generates a binary number "0" for the magnetic field sensor. The combination of binary numbers from each magnetic field sensor 608 provides a unique binary code for transmission to the controller 610.

[0073] At step 710, the controller 610 (e.g., a microprocessor) receives the binary code and transmits the binary code to the processor 612. Generally, the processor 612 includes specialized software applications for setting and controlling the operating parameters of the spectrometer 100 and for collecting photometric data from the spectrometer 100. The processor 612 determines the operating mode corresponding to the received unique binary code. A lookup table with the combinations of unique binary codes and their corresponding operating modes can be stored in the memory. When the processor 612 receives the unique binary code from the sensor assembly 400, the processor 612 can determine the corresponding operating mode of the spectrometer 100 based on the lookup table.

[0074] When the sample attachment is removed and replaced with a new sample attachment associated with a different unique binary code, the detection of the new unique combination of magnets by the sensor assembly 400 and the generation of the new code automatically trigger a new operating mode, in which different operating parameters and data collection methods can be set by the processor 612. This reduces the manual settings and calibrations by the operator, thus reducing the operation time and manual handling errors.

[0075] In practice, for example, if the associated sample support 106 is intended for a specific operating mode when used in the spectrometer 100, the magnetic holder 202 can be preset to provide a specific unique combination of exposed magnets. In other cases, the operator can set a specific operating mode by moving the magnetic holder 202 as described herein. Explanation

[0076] This specification, including the claims, is intended to be interpreted as follows:

[0077] The embodiments or examples described in the specification are intended to illustrate the invention and not limit its scope. As will be readily apparent to those skilled in the art, the invention can be implemented with various modifications and additions. Therefore, it should be understood that the scope of the invention is not limited to the exact construction and operation described or illustrated, but is defined only by the appended claims.

[0078] The mere disclosure of method steps or product elements in the specification should not be construed as essential to the invention claimed herein, unless expressly stated or recited in the claims.

[0079] The terms in the claims have the broadest scope of meaning that would have been given by a person of ordinary skill in the art as of the relevant date.

[0080] Unless expressly stated otherwise, the terms "a" and "an" mean "one or more".

[0081] Neither the title nor the abstract of this application should be regarded as limiting the scope of the claimed invention in any way.

[0082] When the preamble of a claim recites the purpose, benefit, or possible use of the claimed invention, it does not limit the claimed invention to only having the stated purpose, benefit, or possible use.

[0083] It should be noted that degree terms such as "substantially", "essentially", "about", and "approximate" as used herein mean a reasonable deviation of the modified term such that the end result is not significantly changed. These degree terms should be construed to include deviations of the modified term if such deviations do not negate the meaning of the term being modified.

[0084] In the specification (including the claims), the term "comprising" and variations of the term (such as "including" or "which includes") are used to mean "including but not limited to", unless expressly stated otherwise, or unless an exclusive interpretation of the term is required by the context or usage.

[0085] In addition, the recitation of any numerical range by endpoints herein includes all numbers and fractions subsumed within the said range (e.g., 1 to 5 includes 1, 1.5, 2, 2.75, 3, 3.90, 4, and 5). It should also be understood that all numbers and their fractions are considered to be modified by the term "about", which means the maximum variation of the recited number such that the end result is not significantly changed.

[0086] As used herein, the phrase "and / or" is intended to denote inclusive "or". That is, for example, "X and / or Y" is intended to mean X or Y or both. As a further example, "X, Y, and / or Z" is intended to mean X or Y or Z or any combination thereof.

[0024] The disclosure of any document cited herein is incorporated by reference as part of this disclosure into this patent application, but only for purposes of written description and practice, and should in no way be used to limit, define, or otherwise interpret any term of this application where the application would not otherwise be capable of having a determinable meaning. Any document incorporated by reference does not itself constitute an admission or approval of any statement, opinion, or argument contained in any incorporated document.

Claims

1. A sample compartment sub - assembly for a spectrometer, the sub - assembly comprising a sample support adapted to support one or more sample holders for use in the sample compartment, the sample support being associated with one or more magnets, and a sensor assembly configured to detect the one or more magnets associated with the sample support in order to identify the mode of operating the spectrometer corresponding to the sample support.

2. The sub-component according to claim 1, wherein, The sensor assembly includes one or more magnetic field sensors for detecting the one or more magnets.

3. The sub - assembly according to any one of the preceding claims, the sub - assembly further comprising a base mount adapted for mounting to the base of the sample compartment of the spectrometer, the base mount being associated with the sensor assembly.

4. The subassembly according to claim 3, wherein, The base mount defines an aperture for exposing the sensor portion of the sensor assembly such that the sensor portion is aligned with the one or more magnets in use to facilitate detection of the one or more magnets by the sensor assembly.

5. The subassembly according to claim 3 or 4, wherein, The sample support includes a mounting magnet for securing the sample support to the base mount.

6. The sub-assembly according to any one of the preceding claims, wherein, The one or more magnets are mounted to the underside of the sample support for detection by the sensor assembly.

7. The subassembly according to claim 2, wherein, The one or more magnetic field sensors are arranged such that the position of each magnetic field sensor corresponds to the position of a magnet.

8. The subassembly according to any one of the preceding claims, wherein, The sample support is associated with a plurality of magnets, and the sub - assembly further includes a magnetic keeper for masking one or more of the plurality of magnets in order to provide a plurality of unique combinations of exposed magnets for detection by the sensor assembly, each combination being associated with a particular operating mode of the spectrometer.

9. The subassembly according to claim 8, wherein, The magnetic keeper includes a mask defining a plurality of apertures therein, wherein movement of the mask relative to the plurality of magnets changes the combination of magnets exposed through the apertures, thereby providing a plurality of unique combinations of exposed magnets.

10. The sub-component according to claim 9, wherein, Movement of the mask includes rotation of the mask and inversion of the mask.

11. The sub-assembly according to any one of the preceding claims, wherein, The sensor assembly is coupled to a controller of the spectrometer to determine the mode of operation of the spectrometer corresponding to the sample support.

12. A spectrometer comprising the sample compartment sub - assembly according to any one of the preceding claims.

13. A spectrometer having a sample compartment, the spectrometer comprising a sample support adapted to support one or more sample holders for use in the sample compartment, the sample support being associated with one or more magnets, a base mount adapted for mounting to the base of the sample compartment of the spectrometer, the base mount having an associated sensor assembly for detecting the one or more magnets associated with the sample support in order to identify the mode of operating the spectrometer corresponding to the sample support.

14. The spectrometer according to claim 13, wherein, The sensor assembly includes one or more magnetic field sensors for detecting the one or more magnets.

15. The spectrometer according to claim 13 or 14, wherein, The base mount defines an aperture for exposing the sensor portion of the sensor assembly such that the sensor portion is aligned with the one or more magnets in use to facilitate detection of the one or more magnets by the sensor assembly.

16. The spectrometer according to any one of claims 13 to 15, wherein, The sample support includes mounting magnets for securing the sample support to the base mount in use.

17. The spectrometer according to any one of claims 13 to 16, wherein, The one or more magnets are mounted to the underside of the sample support for detection by the sensor assembly.

18. The spectrometer according to claim 14, wherein, The one or more magnetic field sensors are arranged such that the position of each magnetic field sensor corresponds to the position of a magnet.

19. The spectrometer according to any one of claims 13 to 18, wherein, The sample support is associated with a plurality of magnets, and the subassembly further includes a magnetic keeper for masking one or more of the plurality of magnets to provide a plurality of unique combinations of exposed magnets for detection by the sensor assembly, each combination being associated with an operating mode of the spectrometer.

20. The spectrometer according to claim 19, wherein, The magnetic keeper includes a mask defining a plurality of apertures therein, wherein movement of the mask relative to the plurality of magnets changes the combination of magnets exposed through the apertures to provide a plurality of unique combinations of exposed magnets.

21. The spectrometer according to claim 20, wherein, Movement of the mask includes rotation of the mask and inversion of the mask.

22. The spectrometer according to any one of claims 13 to 21, wherein, The sensor assembly is coupled to a controller for determining the operating mode of the spectrometer corresponding to the sample support.

23. The spectrometer according to any one of claims 13 to 22, wherein, The spectrometer is a UV-Vis-IR spectrophotometer.

24. An automatic identification system for a sample accessory of a spectrometer, the system including a plurality of magnets associated with the sample accessory, and a sensor assembly mounted in a sample compartment of the spectrometer, the sensor assembly being configured to detect the plurality of magnets when the sample accessory is used in the sample compartment to determine the mode of operating the spectrometer corresponding to the sample accessory.

25. The system according to claim 24, the system further including a magnetic keeper configured to mask one or more of the plurality of magnets to provide a plurality of unique combinations of exposed magnets for detection by the sensor assembly, each combination being associated with a particular operating mode of the spectrometer.

26. The system according to claim 25, wherein, The sensor assembly is configured to generate a unique binary code corresponding to the unique combination of exposed magnets detected by the sensor assembly.

27. The system according to claim 26, the system further including a processor configured to receive the unique binary code, determine the operating mode based on the received unique binary code, and set operating parameters and data collection methods for the spectrometer based on the determined operating mode.

28. A method of determining an operating mode of a spectrometer, the method including providing a sample support for supporting one or more sample holders for use in the sample compartment, the sample support being associated with one or more magnets, and detecting the one or more magnets using a sensor assembly to identify the mode of operating the spectrometer corresponding to the sample support.

29. The method according to claim 28, the method further comprising mounting a magnetic retainer above the one or more magnets such that a unique combination of the one or more magnets is exposed via one or more apertures of the magnetic retainer, the unique combination being associated with a particular operating mode of the spectrometer, Among them, detecting the one or more magnets includes detecting the unique combination using the sensor assembly.

30. The method according to claim 29, the method further comprising moving the magnetic retainer relative to the one or more magnets such that different unique combinations of the one or more magnets are exposed via the one or more apertures of the magnetic retainer, the different unique combinations being associated with different operating modes of the spectrometer.

31. The method according to claim 30, wherein, Moving the magnetic retainer relative to the one or more magnets includes one or both of: rotating and inverting the magnetic retainer.

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