Electronic equipment electrical performance testing device and method based on voltage signal processing

Abstract

The invention relates to the technical field of electrical variable measurement, in particular to an electronic equipment electrical performance testing device and method based on voltage signal processing. The method comprises the following steps: acquiring an eye pattern; processing the eye pattern to obtain a signal connected domain, and obtaining a shaking condition and an eye opening degree based on the signal connected domain and the eye pattern center opening area; acquiring a line in the circuit diagram, acquiring circuit complexity based on the area and the edge of the line, constructing a curve for eye diagram characteristics, and determining an accumulated residual value based on the difference between the curve and a fitting straight line; obtaining a change trend; screening standard points, and obtaining an unstable coefficient according to the variation trend difference of parameter iteration and the eye pattern feature difference to screen an optimal oscilloscope parameter; and carrying out performance test through the optimal oscilloscope parameters. The problem that the electrical performance of the equipment is poor due to the parameter setting problem of the oscilloscope during the electrical performance test is avoided.

Description

Technical Field

[0001] This application relates to the technical field of electrical variable measurement, and particularly to an electrical performance test device and method for electronic devices based on voltage signal processing. Background Art

[0002] Electrical performance testing is to detect the signal quality of a PCB board during signal transmission through an oscilloscope. The oscilloscope is used to observe and measure the waveform of an electrical signal, and can display information such as the amplitude, frequency, and phase of the signal. The electrical performance of the PCB board can be tested by analyzing the above characteristic conditions. Eye diagram analysis is used in the above signal quality analysis. The eye diagram is a graph displayed by accumulating a series of digital signals on an oscilloscope. Therefore, eye diagram analysis is the core of signal integrity analysis for high-speed interconnect systems.

[0003] When testing the obtained PCB board as described above, it is necessary to contact specific points on the PCB board of the oscilloscope. By transmitting the waveform of the electrical signal through a probe and receiving the electrical signal by another probe, the signal transmission situation of the PCB board can be determined. However, when conducting the test, it is necessary to adjust the parameters in the oscilloscope to ensure that problems with the eye diagram caused by unreasonable parameter settings are not misinterpreted as problems with the electrical performance of the device. When automatically adjusting the parameters, it is necessary to analyze the adjustment of the parameters through the eye diagram, and determine whether there is a problem with the electrical performance of the device or a parameter setting error through the eye diagram analysis after the probe moves in the PCB circuit. Summary of the Invention

[0004] In order to solve the technical problem that inaccurate electrical performance testing is caused by incorrect parameter settings, this application provides an electrical performance test device and method for electronic devices based on voltage signal processing. The specific technical solutions adopted are as follows: In a first aspect, this application proposes an electrical performance test method for electronic devices based on voltage signal processing. The method includes the following steps: Obtain a circuit diagram, and collect the eye diagram of the voltage signal in the circuit diagram through a probe; Remove the background area of the eye diagram to obtain the signal connection domain and the maximum width of the signal connection domain; calculate the jitter situation of the signal connection domain based on the number of pixel points, gray values, and the maximum width of the signal connection domain in the signal connection domain; obtain the eye opening degree according to the maximum longitudinal and transverse distances and the area of the central opening area in the eye diagram; Multiple lines are obtained by moving the probe in the circuit diagram, the oscilloscope parameters are iterated, and the eye diagram under the oscilloscope parameters is obtained; the points collected by the probe are recorded as target points, and the circuit complexity is obtained based on the area and edge length of the lines around the target points; the jitter situation and eye opening degree are recorded as eye diagram features, and a feature curve is obtained for each eye diagram feature of each line; the feature curve is linearly fitted, and the cumulative residual value of each feature curve in each line is obtained based on the difference between the fitted line and the feature curve and the circuit complexity of the target points; the change trend of the corresponding eye diagram feature is obtained based on the cumulative residual value and the slope of the fitted line; standard points are screened based on the difference between the target points and the points on the fitted line and the circuit complexity screening criteria; the instability coefficient is obtained based on the difference in the change trend corresponding to the oscilloscope parameters of adjacent iterations and the eye diagram feature difference of the standard points; the instability coefficient is compared with a preset threshold to screen the optimal oscilloscope parameters; The eye diagram is obtained by using the optimal oscilloscope parameters, and the performance is tested by comparing the jitter situation and eye opening degree of the eye diagram with a preset threshold.

[0005] In the above solution, the advantage of the present application over the prior art is that the quantization of parameter adjustment is carried out through the feature differences at different positions under the same parameters and the feature change differences at the same position under different parameters, the optimization situation under each parameter change is quantified through the constructed change curve of the eye diagram features, the oscilloscope parameters can be selected according to the parameter adjustment situation to improve the robustness of the device during detection, and it is avoided that when performing electrical performance testing, it is directly determined that there is a problem with the electrical performance of the obtained device based on the abnormalities captured in the obtained eye diagram. At the same time, the direction of moving the probe can not only determine the optimal parameters but also locate the area in the PCB board where problems occur.

[0006] In one embodiment, the jitter situation of the signal connection domain is positively correlated with the number of pixel points in the signal connection domain and the maximum width of the signal connection domain; the jitter situation of the signal connection domain is negatively correlated with the gray value of the pixel points.

[0007] In one embodiment, the eye opening degree is positively correlated with the maximum longitudinal distance, the maximum transverse distance, and the area of the central opening region.

[0008] In one embodiment, the method for obtaining the circuit complexity is as follows: A window is constructed with each target point as the center. The circuit complexity is negatively correlated with the area of the lines in the window and positively correlated with the length of the edges of the lines in the window.

[0009] In one embodiment, the abscissa of the feature curve is the target point, and the ordinate is the eye diagram feature.

[0010] In one embodiment, the method for obtaining the cumulative residual value of each characteristic curve in each line based on the difference between the fitting line and the characteristic curve and the circuit complexity of the target point is as follows: Let the difference in eye opening degree of the same target point on the characteristic curve and the fitting line be used as the residual of the target point; The expression of the cumulative residual value is: , represents the residual of the c-th target point in the a-th line, represents the circuit complexity of the c-th target point in the a-th line, represents the number of target points in the a-th line, represents the cumulative residual value of the a-th characteristic curve.

[0011] In one embodiment, the change trend is positively correlated with the cumulative residual value and the slope of the fitting line.

[0012] In one embodiment, the method for screening standard points is as follows: Compare with a preset threshold. If it is greater than the preset threshold, mark this target point as a standard point.

[0013] In one embodiment, the method for obtaining the instability coefficient based on the difference in the change trend of the oscilloscope parameters corresponding to adjacent iterations and the difference in the eye diagram characteristics of the standard points is as follows: , represents the difference in the change trend of the eye opening degree curve corresponding to the j-th and (j - 1)-th iterations of the a-th line, represents the difference in the change trend of the jitter curve corresponding to the j-th and (j - 1)-th iterations of the a-th line, represents the difference in the jitter situation corresponding to the j-th and (j - 1)-th iterations of the r-th standard point on the a-th line, represents the difference in the eye opening degree corresponding to the j-th and (j - 1)-th iterations of the r-th standard point on the a-th line, M represents the number of standard points, represents the instability coefficient of the a-th line at the j-th iteration; the eye opening degree curve and the jitter curve are collectively referred to as the characteristic curve.

[0014] In the second aspect, the test device includes a probe, a clamping tool, a servo motor, a connecting wire, a display, an external button, a probe housing, a data processing center, and an oscilloscope.

[0015] The beneficial effects of the present application are: The advantages of this application over the prior art lie in quantifying the parameter adjustment situation through the feature differences at different positions under the same parameters and the feature change differences at the same position under different parameters. By constructing the change curve of the eye diagram features, the preferred situation under each parameter change is quantified. According to the parameter adjustment situation, the oscilloscope parameters can be selected to improve the robustness of the device during detection, avoiding problems with the electrical performance of the device due to issues with the oscilloscope parameter settings during electrical performance testing. At the same time, the direction of the moving probe can not only determine the preferred parameters but also locate the area in the PCB board where problems occur. The test accuracy can be improved through the preferred parameters. Brief Description of the Drawings

[0016] To more clearly illustrate the technical solutions and advantages in the embodiments of this application or the prior art, the following will briefly introduce the drawings required for use in the description of the embodiments or the prior art. Obviously, the drawings in the following description are only some embodiments of this application. For those of ordinary skill in the art, without creative efforts, other drawings can be obtained based on these drawings.

[0017] Figure 1 Flowchart of a method for testing the electrical performance of an electronic device based on voltage signal processing provided by an embodiment of this application; Figure 2 Schematic diagram of the test device. Detailed Embodiments

[0018] To further elaborate on the technical means and effects adopted by this application to achieve the intended invention purpose, the following, in combination with the drawings and preferred embodiments, details the specific embodiments, structures, features, and effects of a device and method for testing the electrical performance of an electronic device based on voltage signal processing proposed according to this application. In the following description, different "one embodiment" or "another embodiment" do not necessarily refer to the same embodiment. In addition, the specific features, structures, or characteristics in one or more embodiments can be combined in any suitable form.

[0019] Unless otherwise defined, all technical and scientific terms used herein have the same meaning as commonly understood by those of ordinary skill in the technical field to which this application belongs.

[0020] An embodiment of a device and method for testing the electrical performance of an electronic device based on voltage signal processing: The following specifically describes the specific solutions of a device and method for testing the electrical performance of an electronic device based on voltage signal processing provided by this application in combination with the drawings.

[0021] Please refer to Figure 1, which shows a flowchart of an electronic device electrical performance testing method based on voltage signal processing provided by an embodiment of the present application. The method includes the following steps: Step S001, create a circuit diagram and control the probe to collect the eye diagram.

[0022] Use the JLCPCB platform to construct the circuit diagram for the PCB board; according to the obtained circuit diagram of the PCB board, the servo can be used to control the probe according to the obtained circuit diagram, so that the probe slides in the circuit of the PCB board. The probe collects the corresponding electrical signals, and the electrical signals collected by the probe are transmitted to the data processing center through the connecting wire. If the waveform of the electrical signal is directly analyzed, the quality of information processing in the circuit cannot be determined. Therefore, after normalizing the electrical signal, the unit interval (UI) is determined through a phase-locked loop (PLL) or zero-crossing detection, and UI alignment: the data is segmented according to the trigger edge or clock signal, and the segmented waveform data is superimposed to form eye diagram data. At this time, the eye diagram data is displayed on the display. In the present application, the electrical signal is represented by voltage.

[0023] So far, the eye diagram data has been obtained.

[0024] Step S002, process the eye diagram to obtain the signal connected domain, and obtain the jitter situation and eye opening degree based on the signal connected domain and the center opening area of the eye diagram.

[0025] The eye diagram data is the waveform of the electrical signal after processing. The quality of the signal can be analyzed through the characteristics in the eye diagram data. When there are obvious problems in the obtained signal quality, there may be two situations. One is that the original oscilloscope parameter settings are unreasonable, and the other is that there are problems with the obtained device electrical performance. When performing subsequent electrical performance tests, it is necessary to ensure that the obtained parameters are reasonable. During the process of parameter adjustment, it is necessary to extract the characteristic changes in the eye diagram and analyze based on the eye diagram.

[0026] The obtained eye diagram forms a curve with a larger range through the superposition of waveform data in multiple time periods. The more times the superposition area, the greater the gray value it shows, and the smaller the superposition times, the smaller the gray value. Set a threshold in the eye diagram, and use the points with gray values less than the threshold as background points; remove all background points in the eye diagram, that is, remove the background area and retain the signal connected domain. In this embodiment, the obtained eye diagram is processed using the Otsu threshold method to obtain the threshold.

[0027] In the case of crosstalk, jitter will occur in the signal part of the eye diagram. In the signal connectivity domain, it is reflected as an increase in the area of the signal connectivity domain. The total number of signals is fixed. When crosstalk occurs, the superimposed gray value will also be smaller. Therefore, the smaller the gray value of each pixel, the more pixel points there are, and the more serious the jitter. In addition, for the signal connectivity domain, draw a vertical line. The part of the vertical line passing through the connectivity domain is recorded as the width, and the maximum width of the signal connectivity domain is obtained. In the case of no crosstalk, the width is smaller, while in the case of crosstalk, the width is larger. Therefore, the larger the maximum width, the more serious the jitter. Therefore, the jitter of the signal connectivity domain is calculated based on the number of pixel points, the gray value in the signal connectivity domain, and the maximum width of the signal connectivity domain.

[0028] The jitter of the signal connectivity domain is positively correlated with the number of pixel points and the maximum width of the signal connectivity domain; the jitter of the signal connectivity domain is negatively correlated with the gray value of the pixel points.

[0029] It should be noted that positive correlation means that when one variable increases, the other variable also increases, and the change directions of the two variables are the same. When one variable changes from large to small or from small to large, the other variable also changes from large to small or from small to large; the specific relationship is determined by the actual application, and this application does not make special restrictions.

[0030] It should be noted that negative correlation means that when one variable increases, the other variable decreases, and the change directions of the two variables are opposite. When one variable changes from large to small or from small to large, the other variable also changes from small to large or from large to small; the specific relationship is determined by the actual application, and this application does not make special restrictions.

[0031] Preferably, in this embodiment, the expression for the jitter of the signal connectivity domain is: , represents the maximum width of the signal connectivity domain, represents the gray value of the z-th pixel point in the signal connectivity domain, represents the number of pixel points in the signal connectivity domain, represents the jitter of the signal connectivity domain. The jitter of the signal connectivity domain is the jitter of the eye diagram.

[0032] In the eye diagram, the eye opening is associated with jitter and the bit error rate BER; the eye opening is obtained from the height in the vertical direction, the width in the horizontal direction, and the eye opening area respectively. The vertical height is the maximum distance in the longitudinal direction of the central opening area, the horizontal width is the maximum distance in the transverse direction of the central opening area, and the eye opening area is the area of the central opening area; the eye opening is positively correlated with the height in the vertical direction, the width in the horizontal direction, and the eye opening area; Preferably, in this embodiment, the expression for the eye opening degree is: , represents the maximum horizontal distance of the central opening area of the eye diagram, represents the maximum vertical distance of the central opening area of the eye diagram, represents the area of the central opening area of the eye diagram; represents the eye opening degree in the eye diagram.

[0033] So far, the eye opening degree of the eye diagram and the jitter situation of the eye diagram have been obtained.

[0034] Step S003: Obtain the circuit lines in the circuit diagram, obtain the circuit complexity based on the line area and the edge, construct a curve for the eye diagram features, determine the cumulative residual value based on the difference between the curve and the fitted straight line; and obtain the change trend therefrom; then screen the standard points, and obtain the instability coefficient and screen the optimal oscilloscope parameters according to the difference in the change trend of parameter iteration and the difference in eye diagram features.

[0035] According to the above operations, the construction of the features of the eye diagram data can be carried out. There are certain interferences in directly determining the electrical performance of the obtained PCB through the constructed features. It is necessary to consider the change situation of the above constructed features. For example, when the probe slides on the PCB board, due to the different electrical components connected by the lines on the PCB board, the electrical performance in the lines is different, and at the same time, the corresponding impedance (line) is different, and the oscilloscope adjustment parameters required are also different; therefore, when testing the electrical performance of the obtained PCB board, it is necessary to consider the complexity of the circuit where the probe point is located at that moment. For the detection data in the area with dense line distribution, the obtained data is more susceptible to external interference. For the area with complex circuits, the situation is more complex when electrical performance problems occur, and the corresponding abnormal conditions are also more obvious; for the circuits in complex areas, the influence on the oscilloscope parameters is not obvious. In complex circuits, although it will be interfered by the multi-path effect, as long as the parameters are set reasonably, the influence on itself is not obvious.

[0036] By moving the probe on the surface of the PCB, the PCB board can be divided into multiple lines. At this time, set the initial oscilloscope parameters and move on the current line for each line using the initial oscilloscope parameters; one line is the connection between electronic components, and in the circuit diagram, an electrical signal is collected every 10 pixel points moved.

[0037] The complexity of the circuit refers to the dense layout of the lines in the PCB board, and the area of the line connection domain corresponding to the dense distribution is relatively large; at the same time, the problem of line thickness also needs to be considered. For example, the area of the connection domain of multiple thin lines and one thick line is the same, but the thin lines are more complex; Based on the above analysis, the complexity of the circuit is solved. First, the pixel points for the probe to collect electrical signals are denoted as target points. A window is constructed centered on each target point, and the circuit complexity corresponding to each target point is obtained based on the area of the circuit in the window and the length of the circuit edge in the window. The edge is obtained by using an edge detection algorithm on the circuit diagram.

[0038] The circuit complexity has a negative correlation with the area of the circuit in the window and a positive correlation with the length of the circuit edge in the window. Preferably, in this embodiment, the size of the constructed window is 10*10, and the expression of the circuit complexity is: , represents the length of the circuit edge in the window corresponding to the c-th target point, represents the area of the circuit in the window corresponding to the c-th target point, represents the circuit complexity corresponding to the c-th target point.

[0039] Among them, if the area of the circuit in the window is larger, it means that the area of the circuit connected domain in the window is larger, the circuit is denser, and the denser it is, the fewer the circuits and the less complex the circuit. In addition, if the length of the circuit edge is more, it means that there are more circuits and the circuit is more complex.

[0040] Since the eye opening degree of the eye diagram and the jitter situation of the eye diagram are the features extracted from each target point, the features of all target points on a circuit are thus composed of two curves. Taking the order of the target points as the abscissa and the eye opening degree of the eye diagram and the jitter situation of the eye diagram as the ordinates respectively, the opening degree curve and the jitter curve are obtained.

[0041] Analyze the change situation of the eye diagram features in the two obtained curves, and obtain the stability situation of the eye diagram features for different target points, where the target points need to consider the complex situation of the circuit obtained above. , for example, there are some target points for which the change of the eye diagram features obtained is unstable. For this part, it may be that the set parameters are unreasonable or there are problems in the circuit design of the current area of the PCB board.

[0042] When distinguishing the above operations, the oscilloscope parameters on the same circuit need to be adjusted. The curves constructed on the same circuit are obtained by means of iterative adjustment. Let the oscilloscope parameters start to iterate from small to large, and the oscilloscope parameters increase by 1 unit each time of iteration. Thus, multiple opening degree curves and jitter curves are obtained, and each one is obtained under different oscilloscope parameters. In this embodiment, the number of iterations is 10 times.

[0043] Record the opening degree curve and the jitter curve as characteristic curves. For each type of characteristic curve, perform a linear fit on the characteristic curve to obtain a fitting line. Let the difference in eye opening degree between the same target point on the characteristic curve and the fitting line be the residual of the target point. Based on the difference between the fitting line and the characteristic curve and the circuit complexity of the target point, obtain the cumulative residual value of each characteristic curve in each line. In this embodiment, the method for the fitting line is the least squares method.

[0044] Preferably, in this embodiment, the expression for the cumulative residual value is: , represents the residual of the c-th target point in the a-th line, represents the circuit complexity of the c-th target point in the a-th line, represents the number of target points in the a-th line, represents the cumulative residual value of the a-th characteristic curve.

[0045] Based on the cumulative residual value and the slope of the fitting line, obtain the change trend of the corresponding eye diagram feature; the change trend is positively correlated with the cumulative residual value and the slope of the fitting line.

[0046] The expression for the change trend is: , represents the cumulative residual value of the a-th line characteristic curve, represents the slope of the fitting line of the a-th line, represents the change trend of the characteristic curve of the a-th line.

[0047] Since there are two types of characteristic curves, the opening degree curve and the jitter curve, the calculated change trends are two, namely the change trend of the opening degree curve and the change trend of the jitter curve.

[0048] Among them, the greater the change trend, the more obvious the influence of the target point change, and the more likely there is a problem with the current electrical performance.

[0049] Compare with a preset threshold. If it is greater than the preset threshold, mark this target point as a standard point. The purpose is to determine whether the position of the current fluctuation area is a PCB design problem or whether the parameter settings are unreasonable due to the presence of a relatively dense circuit in this area. Its large residual indicates that the current position does not quite meet the consistency judgment. If it is not caused by circuit complexity, it is more likely that there is a problem with the electrical performance at the current position or the parameter settings at the current position are unreasonable. In this embodiment, the preset threshold is 0.8.

[0050] For different oscilloscope parameters in iterations, analyze the eye diagram data obtained for the parameters after each iteration to determine which parameter is more suitable for testing the electrical performance under the current circuit. When the obtained parameters are relatively reasonable, their variations in complex circuit regions and simple circuit regions tend to be consistent.

[0051] For each oscilloscope parameter, obtain the instability coefficient based on the difference in the change trend and the difference in eye diagram characteristics corresponding to the previous oscilloscope parameter.

[0052] Preferably, in this embodiment, the expression of the instability coefficient is: , represents the difference in the change trend of the eye opening curve corresponding to the j-th iteration and the (j - 1)-th iteration of the a-th line, represents the difference in the change trend of the jitter curve corresponding to the j-th iteration and the (j - 1)-th iteration of the a-th line, represents the difference in the jitter situation corresponding to the j-th iteration and the (j - 1)-th iteration at the r-th standard point of the a-th line, represents the difference in the eye opening corresponding to the j-th iteration and the (j - 1)-th iteration at the r-th standard point of the a-th line, M represents the number of standard points, represents the instability coefficient of the a-th line at the j-th iteration.

[0053] The more the eye diagram characteristics change, the more obvious the influence of the device parameters at the current position may be, and at the same time, the more unreasonable the set parameters are.

[0054] Compare the instability coefficient with a preset threshold. If the instability coefficient is less than the preset threshold, it means that the change is more stable. At this time, the current oscilloscope parameter setting is relatively reasonable and subsequent electrical performance tests can be carried out. Record the current oscilloscope parameter as the optimal oscilloscope parameter. In this embodiment, the preset threshold is 0.3.

[0055] Thus, the optimal oscilloscope parameter is obtained.

[0056] Step S004, screen the eye diagrams through the optimal oscilloscope parameter for performance testing.

[0057] According to the above operations, the optimal oscilloscope parameter of each line can be obtained. Through the optimal oscilloscope parameter, obtain the eye diagram data of the PCB board at different positions. Re-obtain the jitter situation and eye opening through the optimized oscilloscope. After normalizing the current jitter situation and eye opening and comparing them with the preset threshold, if the jitter situation is greater than the preset threshold or the eye opening is less than the preset threshold, it means that there is a problem with the electrical performance of the current PCB board, and the PCB board circuit needs to be adjusted. In this embodiment, the preset threshold is 0.6.

[0058] The device for testing electrical performance includes: a probe, a clamping tool, a servo, a connecting wire, a display, an external button, a probe housing, a data processing center, and an oscilloscope.

[0059] Among them, the role of the probe is to contact specific points on the PCB board to obtain electrical signals; the role of the probe housing is to support the movement of the probe; the role of the clamping tool is to fix the PCB board to facilitate subsequent probe positioning; the role of the connecting wire is to transmit the electrical signals obtained by the probe back to the data processing center of the oscilloscope; the role of the display is to display the actual waveform and eye diagram of the oscilloscope; the role of the external button is to adjust the parameters of the oscilloscope; the role of the data processing center is to denoise the electrical signals obtained by the probe, automatically adjust the device parameters, control the movement of the servo, etc. The device for testing electrical performance is as Figure 2 shown. Figure 2 In the figure, 1 is the probe, 2 is the clamping tool, 3 is the servo, 4 is the connecting wire, 5 is the display, 6 is the external button, 7 is the probe housing, 8 is the data processing center, 9 is the oscilloscope, and its interior includes the display 5, the external button 6, and the data processing center 8.

[0060] It should be noted that: the above-described embodiments are only used to illustrate the technical solutions of the present application, and are not intended to limit them; although the present application has been described in detail with reference to the foregoing embodiments, those of ordinary skill in the art should understand that they can still modify the technical solutions described in the foregoing embodiments, or perform equivalent replacements for some of the technical features; and these modifications or replacements do not cause the essence of the corresponding technical solutions to deviate from the scope of the technical solutions of the various embodiments of the present application, and should all be included within the protection scope of the present application.

[0061] Each embodiment in this specification is described in a progressive manner. For the same or similar parts between the embodiments, reference can be made to each other. Each embodiment focuses on the differences from other embodiments.

Claims

1. An electrical performance testing method for an electronic device based on voltage signal processing, characterized in that, The method includes the following steps: Obtain a circuit diagram, and collect the eye diagram of the voltage signal in the circuit diagram through a probe; Remove the background area of the eye diagram to obtain the signal connection domain and the maximum width of the signal connection domain; calculate the jitter of the signal connection domain based on the number of pixel points, the gray value in the signal connection domain, and the maximum width of the signal connection domain; obtain the eye opening degree according to the maximum longitudinal and transverse distances and the area of the central opening area in the eye diagram; Obtain multiple lines by moving the probe in the circuit diagram, iterate the oscilloscope parameters, and obtain the eye diagram under the oscilloscope parameters; record the points collected by the probe as target points, and obtain the circuit complexity based on the area and edge length of the lines around the target points; record the jitter and the eye opening degree as eye diagram features, and obtain the feature curves for each eye diagram feature of each line; perform linear fitting on the feature curves, and obtain the cumulative residual value of each feature curve in each line based on the difference between the fitting line and the feature curve and the circuit complexity of the target points; obtain the change trend of the corresponding eye diagram feature based on the cumulative residual value and the slope of the fitting line; screen the standard points based on the difference between the target point and the points on the fitting line and the circuit complexity screening criteria; obtain the instability coefficient according to the difference in the change trend corresponding to the oscilloscope parameters of adjacent iterations and the difference in the eye diagram features of the standard points; compare the instability coefficient with the preset threshold to screen the optimal oscilloscope parameters; Obtain the eye diagram through the optimal oscilloscope parameters, and perform performance tests by comparing the jitter and the eye opening degree of the eye diagram with the preset threshold.

2. The method for testing the electrical performance of an electronic device based on voltage signal processing according to claim 1, wherein The jitter of the signal connection domain has a positive correlation with the number of pixel points and the maximum width of the signal connection domain in the signal connection domain; the jitter of the signal connection domain has a negative correlation with the gray value of the pixel points.

3. The method for testing the electrical performance of an electronic device based on voltage signal processing according to claim 1, wherein, The eye opening degree has a positive correlation with the maximum longitudinal distance, the maximum transverse distance, and the area of the central opening area.

4. A method for testing the electrical performance of an electronic device based on voltage signal processing according to claim 1, characterized in that, The method for obtaining the circuit complexity is as follows: Construct a window with each target point as the center. The circuit complexity has a negative correlation with the area of the lines in the window and a positive correlation with the length of the edges of the lines in the window.

5. A method for testing the electrical performance of an electronic device based on voltage signal processing according to claim 1, characterized in that, The abscissa of the feature curve is the target point, and the ordinate is the eye diagram feature.

6. The method for testing the electrical performance of an electronic device based on voltage signal processing according to claim 1, wherein, The method for obtaining the cumulative residual value of each feature curve in each line based on the difference between the fitting line and the feature curve and the circuit complexity of the target points is as follows: Let the difference in the eye opening degree between the feature curve and the fitting line at the same target point be the residual of the target point; The expression for the cumulative residual value is: , represents the residual of the c-th target point in the a-th line, represents the circuit complexity of the c-th target point in the a-th line, represents the number of target points in the a-th line, represents the cumulative residual value of the a-th characteristic curve.

7. A method for testing the electrical performance of an electronic device based on voltage signal processing according to claim 1, characterized in that, The change trend has a positive correlation with the cumulative residual value and the slope of the fitting line.

8. The method for testing the electrical performance of an electronic device based on voltage signal processing according to claim 6, wherein The method for screening the standard points is as follows: Compare with a preset threshold. If it is greater than the preset threshold, mark the target point as a standard point.

9. A method for testing the electrical performance of an electronic device based on voltage signal processing according to claim 1, characterized in that, The method for obtaining the instability coefficient according to the difference in the change trend corresponding to the oscilloscope parameters of adjacent iterations and the difference in the eye diagram features of the standard points is as follows: , represents the difference in the change trend of the eye opening degree curve corresponding to the j-th iteration and the (j - 1)-th iteration of the a-th line. represents the difference in the change trend of the jitter curve corresponding to the j-th iteration and the (j - 1)-th iteration of the a-th line. represents the difference in the jitter situation corresponding to the j-th iteration and the (j - 1)-th iteration of the r-th standard point on the a-th line. represents the difference in the eye opening degree corresponding to the j-th iteration and the (j - 1)-th iteration of the r-th standard point on the a-th line, and M represents the number of standard points. represents the instability coefficient of the a-th line at the j-th iteration; the eye opening degree curve and the jitter curve are collectively referred to as the characteristic curves.

10. A test device applied to the method according to any one of claims 1-6, characterized in that, The test device includes a probe, a clamping tool, a servo, a connecting wire, a display, an external button, a probe housing, a data processing center, and an oscilloscope.

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