Electronic load for power supply high load current change rate test scene

Abstract

The invention relates to an electronic load for a power supply high-load current change rate test scene, belongs to the technical field of electronic load design, and solves the problem that the electronic load in the prior art is relatively slow in response speed and cannot realize a power supply high-current change rate test. Comprising a test control module used for generating a current control signal and a reference voltage signal according to a received target current and voltage error signal of a power supply to be tested; the controller is also used for controlling the output voltage of the external power supply according to the received target current and current slew rate value of the to-be-tested power supply; the current generation module is used for testing the to-be-tested power supply based on the received current control signal of the test control module and the output voltage of the external power supply, and outputting a voltage sampling signal of the to-be-tested power supply; and the error feedback module is used for generating a voltage error signal based on the received sampling voltage signal of the current generation module and the reference voltage signal of the test control module and sending the voltage error signal to the test control module.

Description

Technical Field

[0001] The present invention relates to the technical field of electronic load design, and in particular, to an electronic load for a test scenario of high load current change rate of a power supply. Background Art

[0002] Existing electronic load products are widely used in the testing and evaluation of power supply equipment, storage batteries, photovoltaic equipment, LED drivers and other fields. However, with the diversified development of electronic devices, especially the increasing demand for high power and high dynamic response, some limitations of existing electronic load products have also emerged.

[0003] Currently, the most important limitation of electronic loads is their limited dynamic response ability. Although most electronic loads support multiple working modes such as constant current, constant voltage, and constant resistance, under dynamic load conditions, such as rapidly changing load current requirements, they perform poorly, with a relatively slow response speed, and cannot meet the requirements of high-frequency dynamic testing, affecting the accuracy and reliability of test results. For example, when testing a DC-DC converter, the electronic load cannot quickly adjust to simulate an instantaneous load mutation, resulting in misjudgment of the power supply output performance.

[0004] Due to the low manufacturing process of discrete transistors and the use of PWM modulation in traditional electronic loads, the response speed is slow and high current change rate cannot be achieved. Therefore, there is an urgent need for an electronic load to meet the requirements of the test scenario of high load current change rate of a power supply. Summary of the Invention

[0005] In view of the above analysis, an embodiment of the present invention aims to provide an electronic load for a test scenario of high load current change rate of a power supply, so as to solve the problem that existing electronic loads have a relatively slow response speed and cannot achieve high current change rate testing of a power supply.

[0006] An embodiment of the present invention provides an electronic load for a test scenario of high load current change rate of a power supply, including a test control module, a current generation module, and an error feedback module:

[0007] The test control module is configured to generate a current control signal and a reference voltage signal according to the received target current and voltage error signal of the power supply under test; and is further configured to control the output voltage of the external power supply according to the received target current and current slew rate value of the power supply under test.

[0008] The current generation module is configured to perform testing on the power supply under test based on the received current control signal of the test control module and the output voltage of the external power supply, and output a voltage sampling signal of the power supply under test.

[0009] The error feedback module is used to generate a voltage error signal based on the sampled voltage signal of the current generation module and the reference voltage signal of the test control module and send it to the test control module. Further, the current generation module includes a digital-to-analog converter, a reference current branch, a current mirror sampling module, and multiple load branches;

[0010] The digital-to-analog converter is used to generate voltage control signals for each load branch according to the current control signal received from the test control module;

[0011] The reference current branch is used to provide a reference current to each load branch based on the output voltage of an external power supply;

[0012] Each of the load branches is respectively used to connect the power supply under test to the corresponding load branch based on the received voltage control signal of each load branch;

[0013] The current mirror sampling module is used to sample the total load current of the power supply under test and convert it into a voltage sampling signal for output.

[0014] Further, the reference current branch includes a reference transistor and a reference current source; the input end of the reference current source is connected to the external power supply, the output end is connected to the drain of the reference transistor, and it also serves as the connection end of the reference current branch to be connected to the load branch; the drain and gate of the reference transistor are connected, and the source is grounded.

[0015] Further, the load branch includes a switching circuit and a load transistor; the first connection end of the switching circuit serves as the connection end of the load branch and is connected to the reference current branch; the second connection end of the switching circuit is connected to the gate of the load transistor, and the control end serves as the receiving end of the load branch to receive the voltage control signal of this load branch; the drain of the load transistor serves as the power supply end of the load branch and is connected to the power supply under test through the current mirror sampling module, and the source of the load transistor is grounded.

[0016] Further, the test control module generates a current control signal in the following manner:

[0017] Based on the target current and the rated load current of each load branch, obtain the number of load branches to be connected to the power supply under test, and then generate an initial current control signal;

[0018] Based on the voltage error signal and the set conversion ratio, obtain a current error, and then adjust the initial current control signal to obtain a current control signal.

[0019] Further, the number of load branches n to be connected to the power supply under test is determined by the following formula:

[0020]

[0021] Among them, I bra = K × I ref ;

[0022] In the formula, I tar represents the target current, I bra represents the rated load current of the load branch, I ref represents the reference current, and K represents the load factor of the load branch.

[0023] Furthermore, the load factor K of the load branch is expressed as:

[0024]

[0025] In the formula, W1 and L1 respectively represent the width and length of the gate of the reference transistor, and W2 and L2 respectively represent the width and length of the gate of the load transistor.

[0026] Furthermore, the initial current control signal is adjusted in the following manner:

[0027] If the current error is greater than the set upper limit of the current error, then based on the current error, the number of load branches to be disconnected from the power supply under test is obtained, and then the initial current control signal is adjusted to obtain the current control signal;

[0028] If the current error is less than the set lower limit of the current error, based on the current error, the number of load branches to be connected to the power supply under test is obtained, and then the initial current control signal is adjusted to obtain the current control signal;

[0029] Otherwise, the initial current control signal is used as the current control signal.

[0030] Furthermore, the error feedback module includes an analog-to-digital converter and a current mirror feedback module;

[0031] The analog-to-digital converter is used to convert the received voltage sampling signal into a voltage digital signal;

[0032] The current mirror feedback module is used to generate a voltage error signal based on the received voltage digital signal and the reference voltage signal.

[0033] Furthermore, the test control module obtains the reference voltage signal based on the target current and the set conversion ratio.

[0034] Compared with the prior art, the present invention can at least achieve one of the following beneficial effects:

[0035] An electronic load for a power supply high-load current change rate test scenario provided by the present invention includes a test control module for generating a current control signal and a reference voltage signal according to a target current and a voltage error signal of a power supply to be measured, and for controlling an output voltage of an external power supply according to the target current and a current slew rate value of the power supply to be measured, a current generation module for testing the power supply to be measured based on the current control signal of the received test control module and the output voltage of the external power supply, and outputting a voltage sampling signal of the power supply to be measured, and an error feedback module for generating a voltage error signal based on the sampled voltage signal of the received current generation module and the reference voltage signal of the test control module and sending it to the test control module. This electronic load provides precise current generation, detection, feedback, and control functions, solves the problem that the existing electronic load has a slow response speed and cannot achieve the test of the high current change rate of the power supply, and meets the requirements of the test of the high current change rate scenario of the power supply.

[0036] In the present invention, the above technical solutions can also be combined with each other to achieve more preferred combination schemes. Other features and advantages of the present invention will be described in the following description, and some advantages can be made obvious from the description, or understood by implementing the present invention. The purpose and other advantages of the present invention can be achieved and obtained through the content specifically pointed out in the description and the drawings. BRIEF DESCRIPTION OF THE DRAWINGS

[0037] The drawings are only for the purpose of showing specific embodiments and are not considered to be a limitation of the present invention. Throughout the drawings, the same reference signs represent the same components.

[0038] Figure 1 It is a schematic structural diagram of an electronic load for a power supply high-load current change rate test scenario provided by an embodiment of the present invention;

[0039] Figure 2 It is a schematic connection diagram of a switching circuit provided by an embodiment of the present invention;

[0040] Figure 3 It is a schematic diagram of the on-chip specific setting of an electronic load provided by an embodiment of the present invention. DETAILED DESCRIPTION OF THE EMBODIMENTS

[0041] The following will specifically describe the preferred embodiments of the present invention in conjunction with the drawings. The drawings form a part of this application and are used together with the embodiments of the present invention to explain the principles of the present invention, and are not used to limit the scope of the present invention.

[0042] A specific embodiment of the present invention discloses an electronic load for a power supply high-load current change rate test scenario, as Figure 1 shown, including a test control module, a current generation module, and an error feedback module:

[0043] A test control module, configured to generate a current control signal and a reference voltage signal according to the target current and the voltage error signal of the power supply under test received; and further configured to control the output voltage of the external power supply according to the target current and the current slew rate value of the power supply under test received.

[0044] A current generation module, configured to perform a test on the power supply under test based on the current control signal of the received test control module and the output voltage of the external power supply, and output a voltage sampling signal of the power supply under test.

[0045] An error feedback module, configured to generate a voltage error signal based on the sampled voltage signal of the received current generation module and the reference voltage signal of the test control module, and send it to the test control module.

[0046] Specifically, the target current and the current slew rate value of the power supply under test are set according to specific power supply test requirements and transmitted to the test control module through the host computer.

[0047] Specifically, the current generation module performs a test on the load-carrying capacity of the power supply under test based on the current control signal and the output voltage of the external power supply; the output voltage sampling signal is the voltage sampling signal of the total load current provided to the power supply under test.

[0048] Specifically, the current slew rate value of the power supply under test is determined by the external voltage slew rate of the voltage input to the current generation module by the external power supply. The current slew rate value is adjusted by adjusting the external voltage slope, and the corresponding external voltage slope of the external power supply can be obtained according to the current slew rate value and the target current; among them, the external power supply is a general term, which includes all electrical signals provided by external devices to make the system work normally and supplies power to the entire electronic load.

[0049] More specifically, the external voltage slope of the voltage input to the current generation module is set by a signal generator. It should be noted that the external power supply voltage value and the external power supply voltage rise time determine the external voltage slope, and the setting of the external voltage in the signal generator does not exceed the maximum external voltage value; among them, the maximum external voltage value is determined by the maximum generable current value of the current generation module. During implementation, as Figure 1 shown, the current generation module includes a digital-to-analog converter, a reference current branch, a current mirror sampling module, and multiple load branches.

[0050] The digital-to-analog converter is configured to generate a voltage control signal for each load branch according to the current control signal of the received test control module.

[0051] The reference current branch is configured to provide a reference current to each load branch based on the output voltage of the external power supply.

[0052] Each of the load branches is respectively configured to connect the power supply under test to the corresponding load branch based on the voltage control signal received by each load branch;

[0053] The current mirror sampling module is configured to sample the total load current of the power supply under test and convert it into a voltage sampling signal for output. Specifically, the number of load branches is set according to actual requirements.

[0054] Specifically, the digital-to-analog converter is selected according to specific requirements, such as an R-2R type DAC. It can be understood that the current control signal received by the digital-to-analog converter is a binary signal, which is converted into the voltage control signals of each load branch and output to the corresponding load branches.

[0055] In specific implementation, the reference current branch includes a reference transistor and a reference current source; the input end of the reference current source is connected to an external power supply, the output end is connected to the drain of the reference transistor, and also serves as the connection end of the reference current branch to be connected to the load branch; the drain and the gate of the reference transistor are connected, and the source is grounded.

[0056] In specific implementation, the load branch includes a switching circuit and a load transistor; the first connection end of the switching circuit serves as the connection end of the load branch and is connected to the reference current branch; the second connection end of the switching circuit is connected to the gate of the load transistor, and the control end serves as the receiving end of the load branch to receive the voltage control signal of this load branch; the drain of the load transistor serves as the power supply end of the load branch and is connected to the power supply under test through the current mirror sampling module, and the source of the load transistor is grounded.

[0057] Specifically, the switching circuit is implemented by selecting components or circuits that can be turned on and off according to the received voltage control signal.

[0058] Exemplarily, as Figure 2 shown, the switching circuit includes an NPN transistor, a PNP transistor, a first resistor, a second resistor, a capacitor, and an N-type MOSFET;

[0059] One end of the first resistor serves as the control end of the switching circuit to receive the voltage control signal; the other end of the first resistor is respectively connected to the bases of the NPN transistor and the PNP transistor; the emitter of the NPN transistor is grounded; the collector of the NPN transistor is connected to the collector of the PNP transistor, and is also connected to one end of the capacitor, one end of the second resistor, and the gate of the N-type MOSFET; the emitter of the PNP transistor is connected to the external power supply; the other end of the capacitor is grounded; the source of the N-type MOSFET is connected to the other end of the second resistor and also serves as the second connection end of the switching circuit; the drain of the N-type MOSFET serves as the first connection end of the switching circuit.

[0060] It can be understood that the N-type MOSFET functions as a switch, and the NPN-type and PNP-type triodes form a push-pull amplifier circuit structure to amplify the driving signal to drive the on / off of the N-type MOSFET; the capacitor is used for high-frequency filtering to filter out high-frequency clutter interference; the first resistor is used for current limiting, and the second resistor is mainly used to provide the gate bias voltage for the MOSFET to set the operating point.

[0061] Specifically, the voltage control signals of each load branch are high and low level signals, and the on / off of the switch circuits in each load branch is controlled by the voltage control signals of each load branch. When the switch circuit is connected, the transistor in the load branch conducts, allowing current to flow through the load branch; when the switch circuit is disconnected, the load branch is disconnected and no current flows through, enabling each load branch to be independently controlled, which is suitable for test scenarios that require multiple different load currents.

[0062] Specifically, both the load transistor and the reference transistor adopt MOSFETs.

[0063] Exemplarily, the electronic load in this embodiment can generate a maximum current of 200A.

[0064] It can be understood that the current generation module utilizes the matching characteristics of two or more transistors to copy the input reference current to the output end. The reference current is provided by the reference current source in the reference current branch. The reference current source can input voltage from an external power supply device, can be generated through a voltage-to-current circuit, or can be generated by adding a bandgap reference circuit on the chip. The reference current depends on specific requirements; the reference current branch provides the reference current for each load branch, and it is a constant current source that does not fluctuate with the load, power supply voltage, or temperature; the function of each load branch is to generate a rated load current proportional to the reference current on each load branch; each switch circuit controls whether each load branch conducts. This integration of transistors and switch circuits on the chip has an extremely fast response speed and is suitable for test scenarios with a high current change rate.

[0065] During specific implementation, the current mirror sampling module is a current-controlled voltage source; the control end of the current-controlled voltage source is connected to the power supply under test; the common end of the current-controlled voltage source serves as the common end of the current mirror sampling module and is connected to the power supply ends of each load branch; the output end of the current-controlled voltage source serves as the output end of the current mirror sampling module to output a voltage sampling signal.

[0066] Specifically, the current in the current-controlled voltage source is converted into voltage according to the conversion ratio set by the test control module.

[0067] Preferably, the conversion ratio is set to 1, that is to say, the sampled voltage and current values are equal.

[0068] It is understandable that directly using current for subsequent sampling and feedback is greatly affected by the outside world, while voltage signals can be more easily processed precisely. Therefore, voltage sampling is performed.

[0069] Specifically, the test control module obtains a reference voltage signal based on the target current and a set conversion ratio.

[0070] During implementation, the error feedback module includes an analog-to-digital converter and a current mirror feedback module;

[0071] The analog-to-digital converter is used to convert the received voltage sampling signal into a voltage digital signal;

[0072] The current mirror feedback module is used to generate a voltage error signal based on the received voltage digital signal and the reference voltage signal.

[0073] Specifically, the analog-to-digital converter is selected according to specific requirements, such as a successive approximation ADC, a Σ-Δ ADC. It is understandable that the analog-to-digital converter is responsible for converting the analog signal (the voltage value obtained from the current mirror sampling module) into a digital signal for the control module to process and analyze.

[0074] During specific implementation, the current mirror feedback module includes a full subtractor; the minuend end of the full subtractor serves as the first input end of the current mirror feedback module to receive the reference voltage signal; the subtrahend end of the full subtractor serves as the second input end of the current mirror feedback module to receive the voltage digital signal; the output end of the full subtractor serves as the output end of the current mirror feedback module to output the voltage error signal.

[0075] It is understandable that the current mirror sampling module and the current mirror feedback module are key modules to ensure that the high current change rate electronic load system can accurately control and adjust the current output; the high current change rate electronic load needs to be able to quickly respond to external current changes. The current mirror sampling module and the current mirror feedback module can enable the system to obtain the feedback signal (voltage error signal) of the output current in real time, so that the current generation module can quickly adjust the output according to the requirements. This real-time feedback mechanism helps to reduce current fluctuations, ensure that the system can quickly respond and maintain stable load behavior, and adapt to current changes under different working conditions; when the system detects that the output current exceeds the set safety range, the feedback signal (voltage error signal) can trigger the protection mechanism to limit the current output, avoid overloading of the electronic load or current out-of-control, and prevent damage to circuit components.

[0076] During implementation, the test control module generates a current control signal in the following manner:

[0077] Based on the target current and the rated load current of each load branch, the number of load branches to be connected to the power supply to be tested is obtained, and then an initial current control signal is generated;

[0078] Based on the voltage error signal and the set conversion ratio, the current error is obtained, and then the initial current control signal is adjusted to obtain the current control signal.

[0079] In specific implementation, the number of load branches n to be connected to the power supply to be measured is determined by the following formula:

[0080]

[0081] Where, I bra = K × I ref ;

[0082] In the formula, I tar represents the target current, I bra represents the rated load current of the load branch, I ref represents the reference current, and K represents the load coefficient of the load branch.

[0083] Specifically, the load coefficient K of the load branch is expressed as:

[0084]

[0085] In the formula, W1 and L1 respectively represent the width and length of the gate of the reference transistor, and W2 and L2 respectively represent the width and length of the gate of the load transistor.

[0086] Specifically, the initial current control signal is a binary signal. Among them, the number of bits of the binary signal is the total number of load branches, and each bit corresponds to a load branch one by one; among them, the number of "1"s in the binary signal represents the number of load branches to be connected to the power supply to be measured.

[0087] Exemplarily, if the number of load branches to be connected to the power supply to be measured is 3 and the total number of load branches is 6, the initial current control signal can be set to 111000.

[0088] In specific implementation, the initial current control signal is adjusted in the following manner:

[0089] If the current error is greater than the set upper limit of the current error, the number of load branches to be disconnected from the power supply to be measured is obtained based on the current error, and then the initial current control signal is adjusted to obtain the current control signal;

[0090] If the current error is less than the set lower limit of the current error, the number of load branches to be connected to the power supply to be measured is obtained based on the current error, and then the initial current control signal is adjusted to obtain the current control signal;

[0091] Otherwise, the initial current control signal is used as the current control signal.

[0092] Specifically, divide the current error by the rated load current of the load branch, and round down to obtain the number of load branches that need to be disconnected from the power supply under test or the number of load branches that need to be connected to the power supply under test, thereby reducing or increasing the number of "1"s in the initial current control signal to obtain the current control signal.

[0093] Specifically, the test control module employs a high-performance processor based on DSP or FPGA.

[0094] Preferably, the electronic load in this embodiment further includes a storage module, including a cache module, a dynamic memory, and a read-only memory; the storage module is used to store or cache the temporary data and historical data generated during the control process; among them, the role of the cache is to improve the data processing speed of the electronic load and reduce the delay during data processing (the data can be temporarily stored in the cache and directly extracted from the cache when needed, instead of being extracted from the memory outside the chip); the dynamic memory is the main memory in the electronic load, used to store the control output current value and the slew rate value of the output current that need to be frequently read and written during operation; the read-only memory is mainly used to store the firmware and program code of the electronic load. When the electronic load is powered on, it is used to initialize the electronic load (mainly including the firmware code and preset parameters of the electronic load) and load the control program of the electronic load (referring to the program that controls the current generation module).

[0095] Preferably, the electronic load in this embodiment further includes a temperature sensing module and an over-temperature protection circuit; the temperature sensing module is used to monitor the temperature of the electronic load in real time. If the temperature of the electronic load exceeds the set safety threshold, the over-temperature protection circuit will start to cut off the connection between the on-chip system of the electronic load and the external power supply, causing the electronic load chip to stop working and preventing the electronic load from being damaged due to overheating; among them, the safety threshold of the temperature of the electronic load in this embodiment is 120 degrees Celsius. That is to say, the temperature of the electronic load does not exceed 120 degrees Celsius at most. When it reaches or exceeds this value, the electronic load will power off and stop working.

[0096] Preferably, the electronic load in this embodiment further includes a clock generation module; the clock generation module includes an oscillator and a frequency divider, and is responsible for providing timing signals for the entire electronic load to ensure that all parts of the electronic load can operate synchronously.

[0097] Preferably, the electronic load in this embodiment further includes a serial peripheral interface, a low-voltage differential signal interface, and a display module; the test control module communicates with the host computer through the serial peripheral interface, and transmits the data transmitted by the analog-to-digital converter to the display module in a low-noise, low-power, and high-speed manner through the low-voltage differential signal interface.

[0098] Exemplarily, such as Figure 3As shown, it is the structural block diagram of the electronic load in this embodiment, all of which are arranged on the chip. Among them, the serial peripheral interface, test control module, current generation module, error feedback module, low-voltage differential signal interface, and cache in the storage module, temperature sensor, and frequency divider fabricated on the chip constitute the system-on-chip of the electronic load, and the remaining modules are the peripheral systems fabricated on the printed circuit board where the chip is placed.

[0099] It should be noted that the electronic load in this embodiment is based on a thermal test chip with advanced manufacturing processes. With its characteristics of on-chip integration, low internal resistance, and high-speed response, it solves the problem that traditional discrete electronic loads are difficult to achieve a high current change rate and can simulate the working conditions of real processor chips and AI chips.

[0100] Compared with the prior art, this embodiment provides an electronic load for the test scenario of the high load current change rate of a power supply, including a test control module for generating a current control signal and a reference voltage signal according to the target current and voltage error signal of the power supply under test received, and for controlling the output voltage of an external power supply according to the target current and current slew rate value of the power supply under test received, a current generation module for testing the power supply under test based on the current control signal of the received test control module and the output voltage of the external power supply, and outputting a voltage sampling signal of the power supply under test, and an error feedback module for generating a voltage error signal based on the sampled voltage signal of the received current generation module and the reference voltage signal of the test control module and sending it to the test control module. This electronic load provides precise current generation, detection, feedback, and control functions, solves the problem that the existing electronic load has a slow response speed and cannot achieve the test of the high current change rate of the power supply, and meets the requirements of the test of the high current change rate scenario of the power supply.

[0101] Those skilled in the art can understand that all or part of the processes of implementing the methods in the above embodiments can be completed by instructing relevant hardware through a computer program, and the program can be stored in a computer-readable storage medium. Among them, the computer-readable storage medium is a disk, an optical disc, a read-only memory, or a random access memory, etc.

[0102] The above is only a preferred specific embodiment of the present invention, but the protection scope of the present invention is not limited thereto. Any changes or substitutions that can be easily thought of by those skilled in the art within the technical scope disclosed by the present invention should be covered by the protection scope of the present invention.

Claims

1. An electronic load for a power supply high-load current change rate test scenario, characterized in that It includes a test control module, a current generation module, and an error feedback module: The test control module is used to generate a current control signal and a reference voltage signal according to the target current and voltage error signal of the power supply under test received; it is also used to control the output voltage of the external power supply according to the target current and current slew rate value of the power supply under test received; The current generation module is used to test the power supply under test based on the current control signal of the test control module received and the output voltage of the external power supply, and output a voltage sampling signal of the power supply under test; The error feedback module is used to generate a voltage error signal based on the sampled voltage signal of the current generation module received and the reference voltage signal of the test control module, and send it to the test control module.

2. The electronic load for the power supply high-load current change rate test scenario according to claim 1, wherein The current generation module includes a digital-to-analog converter, a reference current branch, a current mirror sampling module, and multiple load branches; The digital-to-analog converter is used to generate a voltage control signal for each load branch according to the current control signal of the test control module received; The reference current branch is used to provide a reference current to each load branch based on the output voltage of the external power supply; Each of the load branches is respectively used to connect the power supply under test to the corresponding load branch based on the voltage control signal of each load branch received; The current mirror sampling module is used to sample the total load current of the power supply under test and convert it into a voltage sampling signal for output.

3. The electronic load for the power high-load current change rate test scenario according to claim 2, wherein The reference current branch includes a reference transistor and a reference current source; the input end of the reference current source is connected to the external power supply, the output end is connected to the drain of the reference transistor, and it also serves as the connection end of the reference current branch to connect to the load branch; the drain and gate of the reference transistor are connected, and the source is grounded.

4. The electronic load for the power supply high-load current change rate test scenario according to claim 2, wherein The load branch includes a switch circuit and a load transistor; the first connection end of the switch circuit serves as the connection end of the load branch and is connected to the reference current branch; the second connection end of the switch circuit is connected to the gate of the load transistor, and the control end serves as the receiving end of the load branch to receive the voltage control signal of this load branch; the drain of the load transistor serves as the power supply end of the load branch, and is connected to the power supply under test through the current mirror sampling module, and the source of the load transistor is grounded.

5. The electronic load for the power high-load current change rate test scenario according to claim 4, wherein The test control module generates a current control signal in the following manner: Based on the target current and the rated load current of each load branch, obtain the number of load branches to be connected to the power supply under test, and then generate an initial current control signal; Based on the voltage error signal and the set conversion ratio, obtain a current error, and then adjust the initial current control signal to obtain a current control signal.

6. The electronic load for the power supply high load current change rate test scenario according to claim 5, wherein Determine the number n of load branches to be connected to the power supply under test through the following formula: Among them, I bra = K × I ref ; Wherein, I tar represents the target current, I bra represents the rated load current of the load branch, I ref represents the reference current, and K represents the load factor of the load branch.

7. The electronic load for the power supply high load current change rate test scenario according to claim 6, characterized in that The load coefficient K of the load branch is expressed as: In the formula, W1 and L1 respectively represent the width and length of the gate of the reference transistor, and W2 and L2 respectively represent the width and length of the gate of the load transistor.

8. The electronic load for the power supply high load current change rate test scenario according to claim 5, wherein Adjust the initial current control signal in the following manner: If the current error is greater than the set current error upper limit, based on the current error, obtain the number of load branches to be disconnected from the power supply under test, and then adjust the initial current control signal to obtain a current control signal; If the current error is less than the lower limit of the set current error, the number of load branches to be connected to the power supply under test is obtained based on the current error, and then the initial current control signal is adjusted to obtain the current control signal; Otherwise, the initial current control signal is used as the current control signal.

9. The electronic load for the power supply high-load current change rate test scenario according to claim 1, wherein The error feedback module includes an analog-to-digital converter and a current mirror feedback module; The analog-to-digital converter is configured to convert the received voltage sampling signal into a voltage digital signal; The current mirror feedback module is configured to generate a voltage error signal based on the received voltage digital signal and the reference voltage signal.

10. The electronic load for the power supply high-load current change rate test scenario according to claim 1, wherein The test control module obtains the reference voltage signal based on the target current and the set conversion ratio.

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