Intelligent optimized transistor layout method of standard cell circuit

Abstract

The invention relates to the technical field of integrated circuits, and discloses an intelligent optimized transistor layout method for a standard cell circuit, which comprises the following steps: establishing a functional difference model, and accurately identifying a transistor set needing to be adjusted; based on the functional difference model, constructing layout difference mapping, and determining a reconstruction scheme with minimum influence; according to the functional difference and the layout mapping result, a predefined layout template library is established, and an optimized switching path is preset; based on the layout template library, constructing a hierarchical snapshot data structure, and storing key node state information; incremental layout updating is executed, the minimum necessary transistor position is dynamically adjusted, and microsecond-level layout reconstruction is achieved; the performance and the energy efficiency are improved, and the performance and the energy efficiency of the standard unit circuit are improved by accurately analyzing functional differences and minimizing transistor adjustment.

Description

Technical Field

[0001] The present invention relates to the field of integrated circuit technology, and more specifically, it relates to a method for transistor layout of an intelligent optimized standard cell circuit. Background Art

[0002] Standard cells are basic components in integrated circuit design, and the layout of transistors directly affects key indicators such as the performance, power consumption, and area of the circuit. With the diversification of integrated circuit application scenarios, especially in fields such as dynamic reconfigurable computing and real-time communication, higher requirements are put forward for the flexibility and efficiency of transistor layout in standard cell circuits.

[0003] The existing transistor layout of standard cell circuits mainly has the following problems: The layout is statically fixed. Once the transistor layout of traditional standard cells is designed, it is fixed and difficult to be dynamically adjusted according to the changes in functional requirements during operation; the reconstruction speed is slow. When the circuit function needs to be changed, traditional methods usually require a complete redesign of the layout, resulting in a long reconstruction time and unable to meet the fast response requirements of milliseconds or even microseconds; the template switching overhead is large. Some existing layout switching technologies are mainly based on overall template replacement, which will cause a large number of unnecessary transistor position changes during switching and high resource overhead; the resource consumption of layout reconstruction is high. Traditional layout reconstruction methods need to completely rebuild the layout, with high computational complexity and low energy efficiency, and it is difficult to support low-power and high-performance applications.

[0004] Therefore, there is an urgent need for a method for transistor layout of an intelligent optimized standard cell circuit that can quickly and efficiently adjust the layout according to changes in functional requirements, while minimizing resource consumption and reconstruction overhead. Summary of the Invention

[0005] The present invention provides a method for transistor layout of an intelligent optimized standard cell circuit, which solves the technical problems of statically fixed layout, slow reconstruction speed, large template switching overhead, and high resource consumption of layout reconstruction in related technologies.

[0006] The present invention provides a method for transistor layout of an intelligent optimized standard cell circuit, including: Establish a function difference model, analyze the minimum influence range of function changes through a mathematical model, and accurately identify the set of transistors that need to be adjusted; Based on the function difference model, construct a layout difference mapping, convert the function difference into a physical layout change, calculate the minimum set of transistor adjustments, and determine a reconstruction scheme with minimized influence; According to the function difference and the layout mapping result, establish a predefined layout template library, pre-construct an optimized set of transistor layout templates for common functions, analyze the common transistors and different transistors between templates, and preset optimized switching paths; Based on the layout template library, construct a hierarchical snapshot data structure to save the key node status information, supporting nanosecond-level status rollback and forward roll operations; Comprehensively utilize the difference model, layout mapping, template library, and snapshot data to perform incremental layout updates, dynamically adjust the positions of the minimum necessary transistors, while keeping the boundary interface parameters of the fixed area and the reconfigurable area unchanged, and achieve microsecond-level layout reconstruction.

[0007] Furthermore, the steps of establishing the functional difference model include: Construct a functional description vector to vectorize the description of the old and new functional configurations; Calculate the functional difference vector, and use the weighted Euclidean distance algorithm to calculate the functional difference vector; Determine the functional impact threshold. When the absolute value of the functional difference vector element is greater than the threshold, it is considered that the corresponding functional feature needs to be adjusted.

[0008] Furthermore, the steps of constructing the layout difference mapping include: Establish a functional transistor correspondence matrix to represent the correlation between functional features and transistors; Map the functional differences to transistor changes, and calculate the transistor change vector based on the functional difference vector and the functional transistor correspondence matrix; Identify the minimum transistor adjustment set. When the absolute value of the transistor change vector element is greater than the threshold, include the corresponding transistor in the adjustment set.

[0009] Furthermore, the steps of establishing the predefined layout template library include: Generate a functional frequency statistics, conduct a statistical analysis on the functional requirements of the actual application scenarios, and construct a functional frequency matrix; Construct an optimized transistor layout template. Based on the functional frequency matrix, construct a set of optimized layout templates, and each template corresponds to the optimal transistor layout configuration for a class of common functions; Analyze the commonalities and differences between the templates, calculate the similarity matrix between the templates, and identify the common transistor set and the different transistor set between the templates.

[0010] Furthermore, the objective function used for constructing the optimized transistor layout template is expressed as: ; where represents taking the layout template that minimizes the objective function for all possible layout templates ; respectively represent the power consumption index, delay index, and area index of the layout template ; Weight coefficients representing power consumption, latency, and area respectively.

[0011] Furthermore, the steps of constructing the hierarchical snapshot data structure include: Construct a multi-level snapshot data structure, define the multi-level snapshot data structure and its constituent elements; Implement incremental snapshot storage, adopt an incremental storage algorithm, and only record the difference information between adjacent snapshots to reduce storage overhead; Construct a snapshot index and access system, establish a snapshot index tree, and support fast positioning and access to the status information of any snapshot point.

[0012] Furthermore, the steps of performing incremental layout update include: Select the optimal starting layout template, and select the optimal starting layout template from the template library based on the current functional requirements and target functional requirements; Calculate the minimum transistor adjustment scheme, and calculate the minimum transistor adjustment scheme based on the minimum transistor adjustment set and the optimal starting layout template; Perform incremental layout update, and sequentially perform transistor position and parameter adjustments according to the minimum transistor adjustment scheme, while keeping the boundary interface parameters of the fixed area and the reconfigurable area unchanged.

[0013] Furthermore, the minimum transistor adjustment scheme includes transistor ID, target position, and electrical parameters.

[0014] Furthermore, the process of performing incremental layout update adopts parallel processing technology, and realizes microsecond-level layout reconstruction through multi-core accelerated computing.

[0015] The present invention provides a transistor layout system for an intelligent optimized standard cell circuit, which is used to execute the above-mentioned transistor layout method for an intelligent optimized standard cell circuit, and includes: A function difference model construction module, which is used to analyze the minimum influence range of function changes through a mathematical model and accurately identify the set of transistors that need to be adjusted; A layout difference mapping module, which is used to convert function differences into physical layout changes, calculate the minimum transistor adjustment set, and determine the reconstruction scheme for minimizing the impact; A predefined layout template library, which is used to store a set of optimized transistor layout templates pre-constructed for common functions; A hierarchical snapshot storage module, which is used to save the status information of key nodes and support nanosecond-level status rollback and forward roll operations; An incremental layout update execution module, which is used to dynamically adjust the minimum necessary transistor positions based on the difference model and snapshot data, while keeping the boundary interface parameters of the fixed area and the reconfigurable area unchanged, and realizes microsecond-level layout reconstruction.

[0016] The beneficial effects of the present invention are as follows: improving performance and energy efficiency, enhancing the performance and energy efficiency of the standard cell circuit by precisely analyzing functional differences and minimizing transistor adjustments; speeding up the reconstruction speed, adopting incremental layout update and hierarchical snapshot data structure, reducing the layout reconstruction time from milliseconds to microseconds, and improving the reconstruction speed; reducing resource consumption, reducing the resource overhead in the layout reconstruction process through the calculation and incremental update of the minimum transistor adjustment set; enhancing the adaptability to dynamic scenarios, combining the predefined layout template library with the difference mapping, enabling the circuit to quickly adapt to the dynamically changing functional requirements, and being applicable to scenarios such as real-time communication and reconfigurable computing; realizing fine control at the transistor level, based on the functional difference model and layout difference mapping, enabling precise positioning and adjustment of individual transistors, and improving the layout accuracy. BRIEF DESCRIPTION OF THE DRAWINGS

[0017] Figure 1 is a flowchart of a method for transistor layout of an intelligent optimized standard cell circuit of the present invention; Figure 2 is a flowchart of the steps for constructing a functional difference model of the present invention; Figure 3 is a flowchart of the steps for constructing a layout difference mapping of the present invention; Figure 4 is a flowchart of the steps for establishing a predefined layout template library of the present invention; Figure 5 is a flowchart of the steps for constructing a hierarchical snapshot data structure of the present invention; Figure 6 is a flowchart of the steps for executing incremental layout update of the present invention. DETAILED DESCRIPTION OF THE EMBODIMENTS

[0018] Now, the subject matter described herein will be discussed with reference to exemplary embodiments. It should be understood that discussing these embodiments is only to enable those skilled in the art to better understand and thus implement the subject matter described herein. Without departing from the scope of protection of the content of this specification, changes can be made to the functions and arrangements of the elements discussed. Each example can omit, substitute, or add various processes or components as needed. Additionally, the features described in some examples can also be combined in other examples.

[0019] In at least one embodiment of the present invention, a method for transistor layout of an intelligent optimized standard cell circuit is disclosed, as Figures 1 to 6 shown, including the following steps: Step 1: Establish a functional difference model. Analyze the minimum impact range of functional changes through a mathematical model to accurately identify the set of transistors that need to be adjusted. In this step, analyze the minimum impact range of functional changes through a mathematical model to accurately identify the set of transistors that need to be adjusted, avoiding unnecessary global reconstruction. The specific steps are as follows: Step 1.1: Construct a functional description vector. Perform vector quantization on the old and new functional configurations to construct a functional description vector. Where: ; Where represents the feature vector of the original functional configuration, represent the first, second, and nth eigenvalue of the original functional configuration respectively, represents the dimension of the functional feature. The dimension of the functional feature includes features such as calculation type, data flow pattern, and storage access pattern; ; Where represents the feature vector of the new functional configuration, where represent the first, second, and nth eigenvalue of the new functional configuration respectively, represents the dimension of the functional feature.

[0020] Step 1.2: Calculate the functional difference vector. Use the weighted Euclidean distance algorithm to calculate the functional difference vector : ; Where represents the functional difference vector, which is the difference between the new and old functional feature vectors; represents the feature vector of the new functional configuration; represents the feature vector of the original functional configuration, represent the differences between the first, second, and nth eigenvalue of the new and old functional configurations respectively, represents the dimension of the functional feature; At the same time, introduce an importance weight vector to calculate the weighted functional difference degree: ; Where represents the importance weight vector, represent the importance weights of the first, second, and nth functional features respectively, represents the dimension of the functional feature; ; Where Represents the weighted functional difference degree, which is used to measure the overall difference between the new and old functions; Represents the importance weight of the th functional feature, and the value range is from 1 to summation operation; Represents the th eigenvalue of the new function configuration; Represents the th eigenvalue of the original function configuration; Represents the square root function.

[0021] Step 1.3, determine the functional impact threshold; Set the functional impact threshold functional features need to be adjusted; Among them Represents the functional impact threshold, which is used to judge whether the change of the functional feature is sufficient to require adjustment; Represents absolute value of Represents the th element of the functional difference vector, that is .

[0022] The output of this step is the functional difference vector and the set of functional features marked as needing adjustment. These data describe the functional-level changes required to transform from the current function configuration to the target function configuration, providing an input basis for subsequent layout difference mapping.

[0023] Step 2, based on the functional difference model, construct a layout difference mapping, convert the functional difference into a physical layout change, calculate the minimum set of transistor adjustments, and determine the reconstruction scheme with minimized impact; This step converts the functional difference information obtained in Step 1 into a physical layout change, calculates the minimum set of transistor adjustments, and determines the reconstruction scheme with minimized impact. By establishing the association relationship between functional features and transistors, the mapping transformation from the functional domain to the physical domain is realized. Specifically, it includes the following steps: Step 2.1, establish a functional transistor correspondence matrix; Construct a functional transistor correspondence matrix Among them: ; Among them Represents the functional transistor correspondence matrix; Represents the th functional feature and the th transistor association degree, and the value range is Represents the number of functional features; Indicates the total number of transistors; A matrix of columns.

[0024] Step 2.2, map the functional differences to transistor changes; Utilize the functional difference vector output by Step 1 and the functional transistor correspondence matrix to calculate the transistor change vector ; ; Where: Indicates the transistor change vector; respectively represent the change degrees of the 1st, 2nd, and t-th transistors, Indicates the total number of transistors; Indicates the functional difference vector; Indicates the functional transistor correspondence matrix.

[0025] Step 2.3, identify the minimum transistor adjustment set; Set the transistor adjustment threshold Incorporate the transistors into the adjustment set : ; Where Indicates the set of transistors to be adjusted; Indicates the transistor adjustment threshold, used to determine whether the transistor change is sufficient to require adjustment; The change degrees of the transistors, The absolute value of; The set composed of the values, where Indicates "such that", used for conditional limitation in set notation, The value range of is from 1 to All integers, Indicates the total number of transistors.

[0026] The output of this step is the transistor change vector and the minimum transistor adjustment set These data determine the minimum set of transistors that need to be adjusted at the physical layout level, providing an accurate adjustment target for subsequent layout updates, reducing unnecessary transistor movement, and optimizing the reconstruction efficiency.

[0027] Step 3, based on the functional differences and layout mapping results, establish a predefined layout template library, pre-construct an optimized set of transistor layout templates for common functions, analyze the common transistors and different transistors among the templates, and preset optimized switching paths; This step is based on the statistical analysis of functional requirements, pre-constructs a set of optimized transistor layout templates, and analyzes the commonalities and differences among the templates to provide an efficient starting template for the incremental layout update in step 5. The establishment of the template library takes into account the frequency and pattern of functional changes and pre-sets optimized paths for common function switches. It specifically includes the following steps: Step 3.1, generate function frequency statistics; Through the statistical analysis of the functional requirements in the actual application scenario, construct a function frequency matrix: ; Where represents the function frequency matrix, respectively represent the frequencies of the 1st, 2nd, th function categories, represents the total number of function categories.

[0028] Step 3.2, construct optimized transistor layout templates; Based on the function frequency matrix construct a set of optimized layout templates: ; Where respectively represent the 1st, 2nd, th layout templates, represents the total number of layout templates; Each layout template corresponds to the optimal transistor layout configuration for a class of common functions. The template uses an optimization problem-solving algorithm, and the objective function is: ; Where represents taking the layout template that minimizes the objective function for all possible layout templates ; respectively represent the power consumption index, delay index, and area index of the layout template ; respectively represent the weight coefficients of power consumption, delay, and area.

[0029] Step 3.3, analyze the commonalities and differences among the templates; Calculate the similarity matrix among the templates: ; Where represents the similarity matrix among the templates, represents the dimension of the matrix, represents the similarity of the layout template , and the calculation formula is: ; Among them represents the number of elements in the intersection of the layout templates , represents the intersection operation of taking the intersection of two sets; represents the layout template the number of elements in the union of represents the union operation of taking the union of two sets; Further identify the common transistor set between layout templates and the differential transistor set : ; ; Among them represents the common transistor set between templates; represents the differential transistor set between templates; represents the configuration of the template with transistors, where the universal quantifier of the existential quantifier of the value range of is from 1 to all integers of

[0030] The output of this step is the optimized layout template set the common transistor set and the differential transistor set . These data provide an optimized starting point and switching path for the incremental layout update in Step 5, improving the efficiency of layout reconstruction.

[0031] Step 4, based on the layout template library, construct a hierarchical snapshot data structure to save the key node status information, supporting nanosecond-level status rollback and forward roll operations; This step creates a multi-level layout status snapshot data structure for saving the key node status information, supporting efficient status rollback and forward roll operations. This step provides the ability to save and restore the status for the incremental layout update in Step 5 and is the key support for achieving microsecond-level reconstruction. Specifically, it includes the following steps: Step 4.1, construct a hierarchical snapshot data structure; Construct a multi-level snapshot data structure: ; ; Among them represents the multi-level snapshot data structure, respectively represent the first layer, the second layer, and the represents the total number of snapshot levels; respectively represent the status information of the first, second, ... snapshots at the th layer, representing the total number of snapshot points at the th layer.

[0032] Step 4.2: Implement incremental snapshot storage; Adopt an incremental storage algorithm to record only the difference information between adjacent snapshots, reducing storage overhead; For adjacent snapshots store the difference information: ; where represents the status difference information from the th snapshot point; from the th snapshot point to the th snapshot point at the

[0033] Step 4.3: Build a snapshot index and access system; Build a snapshot index tree (for quickly locating and accessing the status information of any snapshot point), supporting quick location and access to the status information of any snapshot point. The index tree adopts a B+ tree structure, with leaf nodes storing the physical addresses of snapshot status data and non-leaf nodes storing index key values. The output of this step is a hierarchical snapshot data structure and a snapshot index tree These data structures enable the system to restore to any historical layout state within nanoseconds, providing an efficient state saving and restoration mechanism for the incremental layout update in Step 5, supporting rollback or forward roll operations during the optimization process.

[0034] Step 5: Comprehensively utilize the difference model, layout mapping, template library, and snapshot data to perform incremental layout updates, dynamically adjust the positions of the minimum necessary transistors, while keeping the boundary interface parameters of the fixed area and the reconfigurable area unchanged, and achieve microsecond-level layout reconstruction; This step comprehensively utilizes the output results of the previous four steps, based on the functional difference model in Step 1, the layout difference mapping in Step 2, the predefined layout template library in Step 3, and the hierarchical snapshot data structure in Step 4, to achieve dynamic and efficient updates of the transistor layout. By minimizing the adjustment range and keeping key parameters unchanged, microsecond-level layout reconstruction is achieved. Specifically, it includes the following steps: Step 5.1: Select the optimal starting layout template; Based on the current functional requirements select the optimal starting layout template from the template library established in Step 3 : ; where represents the optimal starting layout template; represents the current functional requirement; represents the target functional requirement; represents the target functional requirement and the template represents the independent variable that makes the function take the minimum value, that is, to find the one that makes is an element from the template set in it.

[0035] Step 5.2, calculate the minimum transistor adjustment scheme; Combined with the set of minimum transistor adjustments identified in Step 2 and the optimal starting layout template selected in the previous step : ; where represents a triple, including the transistor number, the target position, and the electrical parameters, the target positions of the transistors, represents the set of transistors that need to be adjusted.

[0036] Step 5.3, perform incremental layout update; According to the calculated minimum transistor adjustment scheme sequentially perform transistor position and parameter adjustments. During the adjustment process, use the hierarchical snapshot data structure in Step 4 for state saving and rollback operations when necessary, while keeping the boundary interface parameters between the fixed area and the reconfigurable area unchanged: ; where the boundary interface parameters, represents the total number of boundary interface parameters.

[0037] The update process adopts parallel processing technology and accelerates the calculation through multi - cores to achieve micro - second - level layout reconstruction.

[0038] The output of this step is the adjusted transistor layout configuration, which minimizes the adjustment range and resource overhead while meeting the target functional requirements, and realizes high - efficiency layout reconstruction at the micro - second level.

[0039] A transistor layout system for an intelligent - optimized standard cell circuit, used to execute the above - mentioned transistor layout method for an intelligent - optimized standard cell circuit, includes: A functional difference model construction module, used to accurately identify the set of transistors that need to be adjusted by analyzing the minimum impact range of functional changes through a mathematical model; A layout difference mapping module, which is used to convert functional differences into physical layout changes, calculate the set of minimum transistor adjustments, and determine a reconstruction scheme for minimizing impacts; A predefined layout template library, which is used to store a set of optimized transistor layout templates pre-built for common functions; A hierarchical snapshot storage module, which is used to save key node status information and support nanosecond-level status rollback and forward roll operations; An incremental layout update execution module, which is used to dynamically adjust the positions of the minimum necessary transistors based on the difference model and snapshot data, while keeping the boundary interface parameters of the fixed area and the reconfigurable area unchanged, and achieve microsecond-level layout reconstruction.

[0040] Here, the present invention provides an implementation example: dynamic reconstruction of standard cell circuits in a real-time communication system; In the real-time signal processing unit of a 5G communication base station, it is necessary to dynamically adjust the functional configuration of the signal processing circuit according to different communication protocols and signal types. The application process of this embodiment in this scenario is as follows: Analyze the functional differences between the OFDM and SCFDMA protocols; In a communication system, different communication protocols (such as OFDM, SCFDMA, etc.) have different functional requirements for standard cell circuits. Taking the example of switching from the OFDM protocol to the SCFDMA protocol, the construction of the functional description vector is shown in Table 1: Table 1: Example of functional description vectors for the OFDM and SCFDMA protocols ; Calculate the functional difference vector And according to the importance weight vector Calculate the weighted functional difference degree: ; Set the functional impact threshold It is necessary to reconstruct the circuit. The results of functional difference analysis are shown in Table 2: Table 2: Results of functional difference analysis; ; Construct a functional transistor mapping matrix; In the communication system example, a partial example of the functional transistor correspondence matrix The correlation degrees between some functional features and transistors are shown in Table 3: Table 3: Example of functional transistor correspondence matrix (partial data) ; Based on the functional difference vector Partial results are shown in Table 4 as follows: Table 4: Calculation Results of Transistor Change Vectors (Partial Data) ; Set the transistor adjustment threshold .

[0041] Select the optimal layout template; Through statistical analysis of the commonly used functions in the communication system, obtain the function frequency matrix as shown in Table 5: Table 5: Example of Function Frequency Matrix in Communication System

[0042] Based on this, 5 optimized layout templates are constructed: Through similarity analysis, obtain the similarity matrix between templates as shown in Table 6: Table 6: Layout Template Similarity Matrix

[0043] Determine the common transistor set through analysis The quantity statistics are shown in Table 7: Table 7: Quantity Statistics of Common Transistors and Different Transistors

[0044] Calculate the minimum adjustment plan; Based on the previous analysis results, in the scenario of switching from the OFDM protocol to the SC-FDMA protocol, it is necessary to determine the set of transistors to be adjusted and their optimal adjustment plans. Since the similarity between the two protocols is relatively high (0.7), efficient layout update can be achieved by minimizing the adjustment cost.

[0045] Through the optimization algorithm, calculate the position and parameter adjustment plans of the transistors, so as to minimize the adjustment cost while meeting the changes in functional requirements. This process takes into account the connection relationship between transistors, signal integrity constraints, and power consumption optimization goals.

[0046] Execute incremental layout update; In the scenario of switching from the OFDM protocol to the SCFDMA protocol, select as the optimal starting layout template, and the calculated minimum transistor adjustment plan Partial examples are shown in Table 8: Table 8: Example of Minimum Transistor Adjustment Plan (Partial Data)

[0047] The reconstruction speeds of this embodiment are compared with those of traditional global reconstruction methods and existing incremental reconstruction methods, and the results are shown in Table 9 as follows: Table 9: Comparison of reconstruction speeds of different reconstruction methods

[0048] In the application of the signal processing unit of a communication base station, the resource utilization rate and energy efficiency of this embodiment are compared with those of traditional static layout methods as shown in Table 10: Table 10: Comparison of resource utilization rate and energy efficiency

[0049] The embodiments of the present invention are described above. However, these embodiments are not limited to the above specific implementation manners. The above specific implementation manners are merely illustrative rather than restrictive. Under the inspiration of this embodiment, those of ordinary skill in the art can also make more equivalent embodiments in various forms, all of which fall within the protection scope of this embodiment.

Claims

1. A transistor layout method for an intelligent optimized standard cell circuit, characterized in that Including: Establish a functional difference model, analyze the minimum impact range of functional changes through a mathematical model, and accurately identify the set of transistors that need to be adjusted; Based on the functional difference model, construct a layout difference mapping, convert functional differences into physical layout changes, calculate the minimum set of transistor adjustments, and determine a reconstruction scheme for minimizing the impact; According to the functional differences and layout mapping results, establish a predefined layout template library, pre-construct an optimized set of transistor layout templates for common functions, analyze the common transistors and different transistors between templates, and preset optimized switching paths; Based on the layout template library, construct a hierarchical snapshot data structure, save the state information of key nodes, and support nanosecond-level state rollback and forward roll operations; Comprehensively utilize the difference model, layout mapping, template library, and snapshot data to perform incremental layout updates, dynamically adjust the positions of the minimum necessary transistors, and keep the boundary interface parameters of the fixed area and the reconfigurable area unchanged to achieve microsecond-level layout reconstruction.

2. The transistor layout method of an intelligently optimized standard cell circuit according to claim 1, characterized in that The steps of establishing the functional difference model include: Construct a functional description vector to vectorize the description of the old and new function configurations; Calculate the functional difference vector, and use the weighted Euclidean distance algorithm to calculate the functional difference vector; Determine the functional impact threshold. When the absolute value of the functional difference vector element is greater than the threshold, it is considered that the corresponding functional feature needs to be adjusted.

3. The transistor layout method of an intelligently optimized standard cell circuit according to claim 1, characterized in that, The steps of constructing the layout difference mapping include: Establish a functional transistor correspondence matrix to represent the correlation between functional features and transistors; Map functional differences to transistor changes, and calculate the transistor change vector based on the functional difference vector and the functional transistor correspondence matrix; Identify the minimum set of transistor adjustments. When the absolute value of the transistor change vector element is greater than the threshold, include the corresponding transistor in the adjustment set.

4. The transistor layout method of an intelligently optimized standard cell circuit according to claim 1, characterized in that The steps of establishing the predefined layout template library include: Generate a functional frequency statistics, conduct statistical analysis on the functional requirements of the actual application scenario, and construct a functional frequency matrix; Construct optimized transistor layout templates. Based on the functional frequency matrix, construct an optimized set of layout templates, and each template corresponds to the optimal transistor layout configuration for a class of common functions; Analyze the commonalities and differences between templates, calculate the similarity matrix between templates, and identify the set of common transistors and different transistors between templates.

5. A method for transistor layout of an intelligently optimized standard cell circuit according to claim 4, characterized in that, The objective function used for constructing the optimized transistor layout template has the following expression: ； Among them represents all possible layout templates to obtain the layout template that minimizes the objective function; respectively represent the layout template in terms of power consumption index, latency index, and area index; respectively represent the weight coefficients of power consumption, latency, and area.

6. A transistor layout method for an intelligently optimized standard cell circuit according to claim 1, characterized in that, The steps of constructing the hierarchical snapshot data structure include: Construct a multi-level snapshot data structure, and define the multi-level snapshot data structure and its constituent elements; Implement incremental snapshot storage, use an incremental storage algorithm to only record the difference information between adjacent snapshots, and reduce the storage overhead; Construct a snapshot index and access system, establish a snapshot index tree, and support fast positioning and access to the state information of any snapshot point.

7. A transistor layout method for an intelligent optimized standard cell circuit according to claim 1, characterized in that The steps of performing incremental layout updates include: Select the optimal starting layout template. Based on the current functional requirements and target functional requirements, select the optimal starting layout template from the template library; Calculate the minimum transistor adjustment scheme. Based on the minimum set of transistor adjustments and the optimal starting layout template, calculate the minimum transistor adjustment scheme; Perform incremental layout updates. According to the minimum transistor adjustment scheme, sequentially perform transistor position and parameter adjustments while keeping the boundary interface parameters of the fixed region and the reconfigurable region unchanged.

8. A method for transistor layout of an intelligently optimized standard cell circuit according to claim 7, characterized in that, The minimum transistor adjustment scheme includes transistor ID, target position, and electrical parameters.

9. The transistor layout method of an intelligently optimized standard cell circuit according to claim 7, characterized in that The process of performing incremental layout updates uses parallel processing technology and achieves microsecond-level layout reconstruction through multi-core accelerated computing.

10. A transistor layout system for an intelligently optimized standard cell circuit, characterized in that, A method for transistor layout of a smart-optimized standard cell circuit for performing any one of claims 1-9 includes: A functional difference model construction module for accurately identifying the set of transistors that need to be adjusted by analyzing the minimum influence range of functional changes through a mathematical model. A layout difference mapping module for converting functional differences into physical layout changes, calculating the minimum set of transistor adjustments, and determining a reconstruction scheme with minimized impact. A predefined layout template library for storing a set of optimized transistor layout templates pre-built for common functions. A hierarchical snapshot storage module for saving key node status information and supporting nanosecond-level status rollback and forward roll operations. An incremental layout update execution module for dynamically adjusting the positions of the minimum necessary transistors based on the difference model and snapshot data, while keeping the boundary interface parameters of the fixed region and the reconfigurable region unchanged, to achieve microsecond-level layout reconstruction.

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