Piezoresistor residual life prediction method, device, equipment and medium

Abstract

The embodiment of the invention discloses a piezoresistor residual life prediction method and device, equipment and a medium, and relates to a piezoresistor safety protection technology. The method comprises the following steps: judging whether a high-voltage impact event occurs in the piezoresistor or not; if the high-voltage impact event occurs in the piezoresistor, acquiring a temperature rise value of the piezoresistor in the high-voltage impact event; acquiring the current residual life of the piezoresistor before the high-voltage impact event occurs; and obtaining a life loss value of the piezoresistor based on the current residual life and the temperature rise value, and determining the residual life of the piezoresistor after the high voltage impact event according to the current residual life and the life loss value. According to the invention, the life loss value of the piezoresistor can be accurately determined based on the current residual life of the piezoresistor and the temperature rise value after the piezoresistor suffers from the high-voltage impact event, so that the residual life of the piezoresistor after the high-voltage impact event can be accurately predicted.

Description

Technical Field

[0001] The present invention relates to the technical field of varistor safety protection, and particularly to a method, device, equipment and medium for predicting the remaining life of a varistor. Background Art

[0002] As a core device in the field of lightning protection, varistors are widely used in the overvoltage protection systems of various electronic devices due to their excellent high-current conduction ability and high stability. However, during long-term operation, this device is vulnerable to transient overvoltage shocks and environmental factors, and the internal grain boundary structure will gradually undergo irreversible deterioration, resulting in a continuous decline in electrical performance. This progressive deterioration will cause two types of safety hazards: on the one hand, as the resistive leakage current generated by material aging increases, the temperature of the device body may rise abnormally, posing a risk of fire; on the other hand, the decline in insulation resistance value will directly affect the overvoltage suppression ability, resulting in a significant reduction in the protection efficiency.

[0003] Currently, the commonly used thermal trip device in the industry cuts off the circuit connection when the temperature of the varistor exceeds the limit. Although it can effectively prevent the device from being damaged by overheating and issue a fault alarm through mechanical indication or a communication interface, this solution essentially belongs to a post-protection mechanism. It can only trigger an action when the device reaches the critical failure state and cannot perform early monitoring and life assessment on the performance degradation process, resulting in the risk that the lightning protection system may be in a state of insufficient protection ability in the middle stage of device deterioration.

[0004] Regarding the problem of life prediction, there are mainly two technical routes in the existing technology: the first is the phase angle detection method based on leakage current, which requires real-time acquisition of the device terminal voltage and leakage current signals, and infers the degree of material aging through the calculation of the phase difference. However, this method has strict requirements for signal acquisition accuracy and calculation models, and has defects such as high equipment complexity, high implementation cost, and large discreteness of prediction results. The second solution monitors the temperature rise trend of the device to infer the change of leakage current. However, due to the hysteresis of temperature response, when obvious temperature rise is detected, the device is often in the late stage of deterioration and cannot provide effective early warning in the early and middle stages of life decline. The above technical bottlenecks make it difficult for the existing solutions to achieve the state assessment of the entire life cycle, restricting the initiative and reliability of the maintenance of the lightning protection system. Summary of the Invention

[0005] Embodiments of the present invention provide a method, device, equipment and medium for predicting the remaining life of a varistor, aiming to solve the problem that the existing technology cannot accurately estimate the life of a varistor.

[0006] In a first aspect, embodiments of the present invention provide a method for predicting the remaining life of a varistor, which includes:

[0007] Determine whether a high-voltage impact event has occurred to the varistor;

[0008] If a high - voltage impact event occurs to the varistor, obtain the temperature rise value of the varistor during the high - voltage impact event;

[0009] Obtain the current remaining life of the varistor before the high - voltage impact event occurs;

[0010] Based on the current remaining life and the temperature rise value, obtain the life loss value of the varistor, and determine the remaining life of the varistor after the high - voltage impact event according to the current remaining life and the life loss value.

[0011] A further technical solution thereof is that the judgment of whether a high - voltage impact event occurs to the varistor includes:

[0012] Judge whether the rising amplitude of the temperature of the varistor within a specified time exceeds a preset threshold;

[0013] If the rising amplitude of the temperature of the varistor within a specified time exceeds the preset threshold, it is determined that a high - voltage impact event occurs to the varistor.

[0014] A further technical solution thereof is that the obtaining of the temperature rise value of the varistor during the high - voltage impact event includes:

[0015] Starting from the starting moment of the high - voltage impact event, obtain the difference between the highest temperature of the varistor within a preset time period and the temperature before the high - voltage impact event occurs, and obtain the temperature rise value.

[0016] A further technical solution thereof is that the obtaining of the life loss value of the varistor based on the current remaining life and the temperature rise value includes:

[0017] Obtain a preset first mapping relationship, where the first mapping relationship is used to represent the corresponding relationship between the life loss value of the varistor, the current remaining life, and the temperature rise value;

[0018] Based on the first mapping relationship, the current remaining life, and the temperature rise value, determine the life loss value of the varistor.

[0019] A further technical solution thereof is that the obtaining of the life loss value of the varistor based on the current remaining life and the temperature rise value includes:

[0020] Obtain the second mapping relationship corresponding to the current remaining life, where the second mapping relationship is used to represent the corresponding relationship between the life loss value of the varistor and the temperature rise value when the current remaining life of the varistor is the current remaining life;

[0021] Determine the life loss value of the varistor based on the second mapping relationship and the temperature rise value.

[0022] A further technical solution thereof is that the obtaining of the second mapping relationship corresponding to the current remaining life includes:

[0023] Determine whether the current remaining life is a characteristic remaining life in a preset characteristic remaining life relationship record table, where the characteristic remaining life relationship record table is used to record the second mapping relationships corresponding to multiple characteristic remaining lives;

[0024] If the current remaining life is a characteristic remaining life in the preset characteristic remaining life relationship record table, read the second mapping relationship corresponding to the current remaining life from the characteristic remaining life relationship record table;

[0025] If the current remaining life is not a characteristic remaining life in the preset characteristic remaining life relationship record table, select the second mapping relationship corresponding to the characteristic remaining life with the smallest difference from the current remaining life in the characteristic remaining life relationship record table as the second mapping relationship corresponding to the current remaining life.

[0026] A further technical solution thereof is that the obtaining of the current remaining life of the varistor before the high-voltage impact event includes:

[0027] Obtain a pre-stored life record table, and read the current remaining life recorded in the life record table as the current remaining life of the varistor before the high-voltage impact event;

[0028] After determining the remaining life of the varistor after the high-voltage impact event according to the current remaining life and the life loss value, the method further includes:

[0029] Update the value of the current remaining life recorded in the life record table to the remaining life.

[0030] In a second aspect, an embodiment of the present invention further provides a varistor remaining life prediction device, which includes a unit for executing the above method.

[0031] In a third aspect, an embodiment of the present invention further provides a computer device, which includes a memory and a processor, and a computer program is stored on the memory, and when the processor executes the computer program, the above method is implemented.

[0032] Fourthly, an embodiment of the present invention further provides a computer-readable storage medium storing a computer program, which can implement the above method when executed by a processor.

[0033] An embodiment of the present invention provides a method, device, equipment and medium for predicting the remaining life of a varistor. The method includes: determining whether a high-voltage impact event occurs to the varistor; if the high-voltage impact event occurs to the varistor, obtaining the temperature rise value of the varistor in the high-voltage impact event; obtaining the current remaining life of the varistor before the high-voltage impact event occurs; obtaining the life loss value of the varistor based on the current remaining life and the temperature rise value, and determining the remaining life of the varistor after the high-voltage impact event according to the current remaining life and the life loss value. Based on the current remaining life of the varistor and the temperature rise value after it suffers a high-voltage impact event, the present invention can accurately determine its life loss value, thereby accurately predicting its remaining life after the high-voltage impact event. BRIEF DESCRIPTION OF THE DRAWINGS

[0034] In order to more clearly illustrate the technical solutions of the embodiments of the present invention, the drawings required for the description of the embodiments will be briefly introduced below. Obviously, the drawings in the following description are some embodiments of the present invention. For those of ordinary skill in the art, other drawings can be obtained based on these drawings without creative efforts.

[0035] Figure 1 It is a schematic flowchart of a method for predicting the remaining life of a varistor provided by an embodiment of the present invention;

[0036] Figure 2 It is a schematic diagram of the principle for determining the second mapping relationship corresponding to the current remaining life in a method for predicting the remaining life of a varistor provided by an embodiment of the present invention;

[0037] Figure 3 It is for a method for predicting the remaining life of a varistor provided by an embodiment of the present invention, where M1, M2,..., M n is a schematic diagram of the first mapping relationship;

[0038] Figure 4 It is a schematic block diagram of a computer device provided by an embodiment of the present invention. DETAILED DESCRIPTION OF THE EMBODIMENTS

[0039] Next, the technical solutions in the embodiments of the present invention will be clearly and completely described in conjunction with the accompanying drawings in the embodiments of the present invention. Obviously, the described embodiments are part of the embodiments of the present invention, rather than all the embodiments. All other embodiments obtained by those of ordinary skill in the art based on the embodiments of the present invention without creative efforts shall fall within the protection scope of the present invention.

[0040] It should be understood that when used in this specification and the appended claims, the terms "comprises" and "comprising" indicate the presence of the described features, wholes, steps, operations, elements, and / or components, but do not preclude the presence or addition of one or more other features, wholes, steps, operations, elements, components, and / or their combinations.

[0041] It should also be understood that the terms used in this specification of the present invention are only for the purpose of describing specific embodiments and are not intended to limit the present invention. As used in this specification of the present invention and the appended claims, unless the context clearly indicates otherwise, the singular forms "a", "an", and "the" are intended to include the plural forms.

[0042] It should be further understood that the term "and / or" used in this specification of the present invention and the appended claims refers to any combination and all possible combinations of one or more of the associated listed items, and includes these combinations.

[0043] As used in this specification and the appended claims, the term "if" can be interpreted as "when", "once", "in response to determining", or "in response to detecting" depending on the context. Similarly, the phrase "if determined" or "if [the described condition or event] is detected" can be interpreted as meaning "once determined", "in response to determining", "once [the described condition or event] is detected", or "in response to detecting [the described condition or event]" depending on the context.

[0044] Please refer to Figure 1 , an embodiment of the present invention provides a method for predicting the remaining life of a varistor. The method can accurately predict the remaining life of the varistor. The method includes the following steps:

[0045] S1, determine whether a high-voltage impact event occurs to the varistor.

[0046] In specific implementation, the high-voltage impact event usually includes a lightning strike event, that is, determine whether the varistor is struck by lightning. When a lightning strike event occurs, the varistor will withstand an instantaneous high-voltage impact.

[0047] In some preferred embodiments, such as the present embodiment, the above step of "judging whether a high-voltage impact event occurs to the varistor" specifically includes the following steps: judging whether the rising amplitude of the temperature of the varistor within a specified time exceeds a preset threshold; if the rising amplitude of the temperature of the varistor within the specified time exceeds the preset threshold, it is determined that a high-voltage impact event occurs to the varistor; if the rising amplitude of the temperature of the varistor within the specified time does not exceed the preset threshold, it is determined that no high-voltage impact event occurs to the varistor.

[0048] In specific implementation, the temperature of the varistor is detected in real time, that is, the temperature of the varistor is collected at every preset sampling time interval. Judge whether the rising amplitude of the temperature of the varistor within a specified time exceeds a preset threshold; the sampling time and the preset threshold of the temperature rise can be set by those skilled in the art, and the present invention does not specifically limit this.

[0049] If the rising amplitude of the temperature of the varistor within a specified time exceeds the preset threshold, it is determined that a high-voltage impact event occurs to the varistor; if the rising amplitude of the temperature of the varistor within the specified time does not exceed the preset threshold, it is determined that no high-voltage impact event occurs to the varistor.

[0050] S2, if a high-voltage impact event occurs to the varistor, obtain the temperature rise value of the varistor in the high-voltage impact event.

[0051] In specific implementation, the inventors of the present invention have found through research that when a high-voltage impact event occurs, the life of the varistor will be reduced, and the life loss value of the varistor is related to the temperature rise value of the varistor caused by the high-voltage impact event.

[0052] Therefore, in the embodiments of the present invention, if a high-voltage impact event occurs to the varistor, the temperature rise value of the varistor in the high-voltage impact event is obtained. That is, collect the temperature rise value of the varistor caused by this high-voltage impact event.

[0053] For example, in some preferred embodiments, such as the present embodiment, the above step of "obtaining the temperature rise value of the varistor in the high-voltage impact event" specifically includes the following steps: starting from the starting moment of the high-voltage impact event, obtain the difference between the highest temperature of the varistor within a preset duration and the temperature before the high-voltage impact event (in actual experiments, it is found that the temperature of the varistor will rise rapidly within 1 second after a high-voltage impact, so it is easy to judge the time of the high-voltage impact and the temperature before the impact), and obtain the temperature rise value.

[0054] In specific implementation, starting from the start time of the high-voltage impact event, within a preset duration, the temperature of the varistor is collected at every preset sampling time interval, obtaining a plurality of temperature sampling values; based on the plurality of temperature sampling values, the temperature change curve of the varistor within the preset duration is fitted, and the maximum value of the temperature change curve corresponds to the highest temperature of the varistor, that is, when the temperature starts to drop, it can be determined that the temperature before the drop is the highest value, or after the temperature drops to the ambient temperature, record the highest temperature value during the period from the start of this impact to the temperature dropping to the normal temperature. Theoretically, by setting a reasonable preset duration, the temperature curve should show a trend of rising first and then falling.

[0055] The temperature before the high-voltage impact event occurs can specifically be the temperature corresponding to the start time of the high-voltage impact event, or the temperature at the nearest temperature acquisition time before the start time of the high-voltage impact event, or the average temperature of the most recent period (such as 10 s).

[0056] S3. Obtain the current remaining life of the varistor before the high-voltage impact event occurs.

[0057] In specific implementation, if the varistor is brand new and has not suffered from a high-voltage impact event, the current remaining life of the varistor is the initial value, which can be set to 100%.

[0058] Every time a high-voltage impact event occurs, determine the life loss value of the varistor and update the current remaining life of the varistor.

[0059] For example, in some preferred embodiments, such as this embodiment, the above step "Obtain the current remaining life of the varistor before the high-voltage impact event occurs" specifically includes the following steps: obtain the pre-stored life record table, and read the currently recorded remaining life in the life record table as the current remaining life of the varistor before the high-voltage impact event occurs.

[0060] In specific implementation, set up a life record table to record the current remaining life of the varistor, and after each high-voltage impact event, determine the life loss value of the varistor and update the current remaining life of the varistor in the life record table.

[0061] Therefore, when a new high-voltage impact event occurs, the current remaining life of the varistor before the high-voltage impact event occurs can be obtained by querying the life record table.

[0062] S4. Obtain the life loss value of the varistor based on the current remaining life and the temperature rise value, and determine the remaining life of the varistor after the high-voltage impact event according to the current remaining life and the life loss value.

[0063] In specific implementation, the life loss value caused by the high-voltage impact event of the varistor is related to the current remaining life and the temperature rise value of the varistor. Therefore, obtain the life loss value of the varistor according to the current remaining life and the temperature rise value. Further, calculate the difference between the current remaining life and the life loss value to obtain the remaining life of the varistor after the high-voltage impact event. Further, update the value of the current remaining life recorded in the life record table to the remaining life.

[0064] In some preferred embodiments, such as this embodiment, the above step "obtain the life loss value of the varistor based on the current remaining life and the temperature rise value" specifically includes the following steps: obtain a preset first mapping relationship, where the first mapping relationship is used to represent the corresponding relationship between the life loss value of the varistor, the current remaining life, and the temperature rise value; determine the life loss value of the varistor based on the first mapping relationship, the current remaining life, and the temperature rise value.

[0065] In specific implementation, calibrate the first mapping relationship through experiments in advance. The first mapping relationship is used to represent the corresponding relationship between the life loss value of the varistor, the current remaining life, and the temperature rise value, and store the first mapping relationship.

[0066] Therefore, when a high-voltage impact event occurs, directly read the first mapping relationship, and determine the life loss value of the varistor based on the first mapping relationship, the current remaining life, and the temperature rise value.

[0067] The first mapping relationship can specifically be a binary function relationship of the life loss value with respect to the current remaining life and the temperature rise value.

[0068] Or, in some preferred embodiments, such as this embodiment, the above step "obtain the life loss value of the varistor based on the current remaining life and the temperature rise value" specifically includes the following steps:

[0069] S41. Obtain the second mapping relationship corresponding to the current remaining life, where the second mapping relationship is used to represent the corresponding relationship between the life loss value of the varistor and the temperature rise value when the varistor has the current remaining life.

[0070] In specific implementation, obtain the second mapping relationship corresponding to the current remaining life, where the second mapping relationship is used to represent the corresponding relationship between the life loss value and the temperature rise value of the varistor when the varistor is at the current remaining life.

[0071] For example, in some preferred embodiments, such as this embodiment, the above step of "obtaining the second mapping relationship corresponding to the current remaining life" specifically includes the following steps:

[0072] S411, determine whether the current remaining life is a characteristic remaining life in a preset characteristic remaining life relationship record table, where the characteristic remaining life relationship record table is used to record the second mapping relationships corresponding to multiple characteristic remaining lives.

[0073] Previously, calibrate the second mapping relationships corresponding to multiple characteristic remaining lives through experiments, that is, each characteristic remaining life corresponds to a second mapping relationship, and the second mapping relationships corresponding to each characteristic remaining life are different. The second mapping relationship is used to represent the corresponding relationship between the life loss value and the temperature rise value of the varistor when the varistor is at the current remaining life.

[0074] And record each characteristic remaining life and its corresponding second mapping relationship in the characteristic remaining life relationship record table. The multiple characteristic remaining lives can be 100%, 95%, 90%... 20%, 15%, 10%, etc., and the present invention does not specifically limit.

[0075] Therefore, when a high-voltage impact event occurs, first, determine whether the current remaining life is a characteristic remaining life in a preset characteristic remaining life relationship record table.

[0076] S412, if the current remaining life is a characteristic remaining life in a preset characteristic remaining life relationship record table, read the second mapping relationship corresponding to the current remaining life from the characteristic remaining life relationship record table.

[0077] In specific implementation, if the current remaining life is a characteristic remaining life in a preset characteristic remaining life relationship record table, the second mapping relationship corresponding to the current remaining life can be directly read from the characteristic remaining life relationship record table.

[0078] S413, if the current remaining life is not a characteristic remaining life in a preset characteristic remaining life relationship record table, select the second mapping relationship corresponding to the characteristic remaining life with the smallest difference from the current remaining life in the characteristic remaining life relationship record table as the second mapping relationship corresponding to the current remaining life.

[0079] In specific implementation, if the current remaining life is not one of the characteristic remaining lives in the preset characteristic remaining life relationship record table, select the second mapping relationship corresponding to the characteristic remaining life with the smallest difference from the current remaining life in the characteristic remaining life relationship record table as the second mapping relationship corresponding to the current remaining life.

[0080] For example, referring to Figure 2 , the current remaining life Mc is between Mt and Mt-1. If the difference between Mc and Mt is less than the difference between Mc and Mt-1, select the second mapping relationship corresponding to Mt, ΔM = FMt(Δt), to calculate the life loss value; otherwise, select the mapping relationship of Mt-1, ΔM = FMt-1(Δt).

[0081] S42. Determine the life loss value of the varistor based on the second mapping relationship and the temperature rise value.

[0082] In specific implementation, after determining the second mapping relationship corresponding to the current remaining life, determine the life loss value of the varistor based on the second mapping relationship and the temperature rise value.

[0083] An embodiment of the present invention provides a method for predicting the remaining life of a varistor, including: determining whether a high-voltage impact event occurs to the varistor; if the high-voltage impact event occurs to the varistor, obtaining the temperature rise value of the varistor in the high-voltage impact event; obtaining the current remaining life of the varistor before the high-voltage impact event; obtaining the life loss value of the varistor based on the current remaining life and the temperature rise value, and determining the remaining life of the varistor after the high-voltage impact event according to the current remaining life and the life loss value. Based on the current remaining life of the varistor and the temperature rise value after it suffers a high-voltage impact event, the present invention can accurately determine its life loss value, so as to accurately predict its remaining life after the high-voltage impact event.

[0084] In order to more fully elaborate the technical solution of the present invention, the fitting methods of the above first mapping relationship and second mapping relationship are described in detail as follows:

[0085] First, define the following parameters:

[0086] Δt: The temperature rise value of the varistor in the high-voltage impact event;

[0087] ΔM: The life loss value of the varistor in the high-voltage impact event;

[0088] Mc: The current remaining life of the varistor, with an initial value of 100%;

[0089] Δα: The change in the non - linear coefficient α of a varistor during a high - voltage impact event.

[0090] ΔV: The decrease in the varistor voltage of a varistor during a high - voltage impact event.

[0091] Step 1: Sample selection and grouping

[0092] Step 11, Sample selection

[0093] Extract multiple samples from varistors of the same type (the same formulation, manufacturing process batch) to ensure that the initial electrical characteristics of the samples are consistent.

[0094] The number of samples should meet the requirements of statistical significance (for example, at least 3 - 5 samples in each group).

[0095] Step 12, Determination of the total life length L

[0096] Use the nominal discharge current I n (for type T2 or type T1 + T2 varistors) to conduct continuous impact tests on some samples.

[0097] Termination condition: When the varistor voltage V drops by more than 10% or the non - linear coefficient α drops by more than 70%, record the maximum number of impacts L of the sample, that is, the total life length.

[0098] Step 2: Multi - stage remaining life test

[0099] Segmentation of the remaining life

[0100] Divide the total life length L into n segments (for example, M1 = 100%, M2 = 80%, M3 = 60%, etc.), corresponding to the remaining life percentage intervals.

[0101] Each segmentation point corresponds to a different remaining life stage of the varistor (such as the initial stage, the middle stage, and the final stage).

[0102] Selection of the impact current

[0103] Use multi - gradient currents (such as 0.35I n, 0.5I n, 0.7I n, I n, 1.4I n, 1.7I n, 2I n) to simulate different lightning strike or transient high - voltage scenarios.

[0104] Each current gradient corresponds to a different energy input to cover the energy range in the actual working conditions.

[0105] Test method 1:

[0106] First, use one or more varistor samples and perform an impact with the nominal discharge current \(I_n\) (type T2 or T + T2). After the varistor temperature returns to room temperature, perform a second impact until the varistor fails (the varistor voltage drops by more than 10% or the non - linear coefficient drops by more than 70%); record the temperature rise, non - linear coefficient, and varistor voltage after each impact, and at the same time record the maximum number of impacts as \(L\). Establish a relationship curve between the non - linear coefficient \(\alpha\) and the number of impacts. Based on this relationship curve, the life loss value \(\Delta M\) can be determined according to the change \(\Delta\alpha\) of the non - linear coefficient.

[0107] For example, based on this curve, before the impact, the non - linear coefficient is \(\alpha_1\), the number of impacts is \(L_1\), after the impact, the non - linear coefficient is \(\alpha_2\), and the number of impacts is \(L_2\). Then, the life loss value

[0108] Further, prepare multiple groups of samples, and the initial remaining life (characteristic remaining life) \(M_c\) of each group is \(M_1,M_2,\cdots,M\) n 。

[0109] Apply multi - gradient current impacts (such as \(0.35I_n\), \(0.5I_n\), \(0.7I_n\), \(I_n\), \(1.4I_n\), \(1.7I_n\), \(2I_n\)) to each group of samples respectively, record \(\Delta t\), \(\Delta V\), \(\Delta\alpha\) for each impact. Further, determine the life loss value \(\Delta M\) caused by each impact based on \(\Delta\alpha\).

[0110] Termination condition: When the varistor voltage \(V\) drops by more than 10% or the non - linear coefficient \(\alpha\) drops by more than 70%, stop.

[0111] Test method two:

[0112] Prepare multiple groups of samples, and the initial remaining life of each group is \(M_1,M_2,\cdots,M\) n The termination condition for the test is: When the varistor voltage \(V\) drops by more than 10% or the non - linear coefficient \(\alpha\) drops by more than 70%, stop.

[0113] Taking the group with the initial remaining life of \(M_1\) as an example, assume that this group contains a total of 7 varistors \(R_1\), \(R_2\), \(R_3\), \(R_4\), \(R_5\), \(R_6\) and \(R_7\).

[0114] For \(R_1\), impact with \(0.35I_n\), record \(\Delta t\), \(\Delta V\), \(\Delta\alpha\); then perform multiple impacts with the nominal discharge current \(I_n\), record \(\Delta t\), \(\Delta V\), \(\Delta\alpha\) for each impact until it fails, and record the total number of impacts \(L\) R1 . Then, after the impact with \(0.35I_n\), the remaining life of \(R_1\) Then, the \(\Delta M\) corresponding to the impact with \(0.35I_n\) = \(M_1 - M\) R1 。

[0115] For R2, impact it with 0.5In, and record Δt, ΔV, and Δα; then conduct multiple impacts with the nominal discharge current In, and record Δt, ΔV, and Δα for each impact until failure, and record the total number of impacts L R2 , then the remaining life of R2 after being impacted with 0.35In Then the ΔM corresponding to the impact with 0.5In = M1 - M R2 .

[0116] For R3, impact it with 0.7In, and record Δt, ΔV, and Δα; then conduct multiple impacts with the nominal discharge current In, and record Δt, ΔV, and Δα for each impact until failure, and record the total number of impacts L R3 , then the remaining life of R3 after being impacted with 0.7In Then the ΔM corresponding to the impact with 0.7In = M1 - M R3 .

[0117] For R4, impact it with In, and record Δt, ΔV, and Δα; then conduct multiple impacts with the nominal discharge current In, and record Δt, ΔV, and Δα for each impact until failure, and record the total number of impacts L R4 , then the remaining life of R4 after being impacted with In Then the ΔM corresponding to the impact with In = M1 - M R4 .

[0118] For R5, impact it with 1.4In, and record Δt, ΔV, and Δα; then conduct multiple impacts with the nominal discharge current In, and record Δt, ΔV, and Δα for each impact until failure, and record the total number of impacts L R5 , then the remaining life of R5 after being impacted with 1.4In Then the ΔM corresponding to the impact with 1.4In = M1 - M R5 .

[0119] For R6, impact it with 1.7In, and record Δt, ΔV, and Δα; then conduct multiple impacts with the nominal discharge current In, and record Δt, ΔV, and Δα for each impact until failure, and record the total number of impacts L R6 , then the remaining life of R6 after being impacted with 1.7In Then the ΔM corresponding to the impact with 1.7In = M1 - M R6 .

[0120] For R7, impact it with 2In, and record Δt, ΔV, and Δα; then conduct multiple impacts with the nominal discharge current In, and record Δt, ΔV, and Δα for each impact until failure, and record the total number of impacts L R7, then after the 2In impact, the remaining life of R7 Then the ΔM corresponding to the 2In impact is ΔM = M1 - M R7 .

[0121] Step 3, fitting the first mapping relationship and the second mapping relationship.

[0122] The first mapping relationship is a binary function ΔM = F(Mc, Δt). 1. Input all experimental data (Mc, Δt, ΔM) into a statistical analysis tool (such as MATLAB or Scikit-learn in Python). Use non-linear regression analysis to fit the binary function to obtain the first mapping relationship.

[0123] The first mapping relationship is a unary function ΔM = FMc(Δt), and a first mapping relationship is fitted for each Mc.

[0124] For each Mc, through the experimental data (Mc, Δt, ΔM) obtained from its corresponding test, fit its corresponding unary function ΔM = FMc(Δt), and the first mapping relationship corresponding to Mc can be obtained.

[0125] Specifically, for M1, M2,..., M n the first mapping relationship can be seen in Figure 3 as shown.

[0126] Corresponding to the above method for predicting the remaining life of a varistor, the present invention also provides a device for predicting the remaining life of a varistor. The device for predicting the remaining life of a varistor includes units for performing the above method for predicting the remaining life of a varistor, and the device for predicting the remaining life of a varistor can be configured in terminals such as desktop computers, tablet computers, laptops, etc. Specifically, the device for predicting the remaining life of a varistor includes:

[0127] A judgment unit for judging whether a high-voltage impact event occurs to the varistor;

[0128] A first acquisition unit for, if the high-voltage impact event occurs to the varistor, acquiring the temperature rise value of the varistor in the high-voltage impact event;

[0129] A second acquisition unit for acquiring the current remaining life of the varistor before the high-voltage impact event occurs;

[0130] A determination unit for obtaining the life loss value of the varistor based on the current remaining life and the temperature rise value, and determining the remaining life of the varistor after the high-voltage impact event according to the current remaining life and the life loss value.

[0131] In some preferred embodiments, such as this embodiment, determining whether a high-voltage impact event has occurred to the varistor includes:

[0132] Judging whether the rising amplitude of the temperature of the varistor within a specified time exceeds a preset threshold;

[0133] If the rising amplitude of the temperature of the varistor within a specified time exceeds the preset threshold, it is determined that a high-voltage impact event has occurred to the varistor.

[0134] In some preferred embodiments, such as this embodiment, obtaining the temperature rise value of the varistor during the high-voltage impact event includes:

[0135] Starting from the starting moment of the high-voltage impact event, obtaining the difference between the highest temperature of the varistor within a preset duration and the temperature before the high-voltage impact event, to obtain the temperature rise value.

[0136] In some preferred embodiments, such as this embodiment, obtaining the life loss value of the varistor based on the current remaining life and the temperature rise value includes:

[0137] Obtaining a preset first mapping relationship, where the first mapping relationship is used to represent the corresponding relationship between the life loss value of the varistor, the current remaining life, and the temperature rise value;

[0138] Determining the life loss value of the varistor based on the first mapping relationship, the current remaining life, and the temperature rise value.

[0139] In some preferred embodiments, such as this embodiment, obtaining the life loss value of the varistor based on the current remaining life and the temperature rise value includes:

[0140] Obtaining a second mapping relationship corresponding to the current remaining life, where the second mapping relationship is used to represent the corresponding relationship between the life loss value of the varistor and the temperature rise value when the varistor has the current remaining life;

[0141] Determining the life loss value of the varistor based on the second mapping relationship and the temperature rise value.

[0142] In some preferred embodiments, such as this embodiment, obtaining the second mapping relationship corresponding to the current remaining life includes:

[0143] Judging whether the current remaining life is a characteristic remaining life in a preset characteristic remaining life relationship record table, where the characteristic remaining life relationship record table is used to record second mapping relationships corresponding to multiple characteristic remaining lives;

[0144] If the current remaining life is a characteristic remaining life in a preset characteristic remaining life relationship record table, read the second mapping relationship corresponding to the current remaining life from the characteristic remaining life relationship record table;

[0145] If the current remaining life is not a characteristic remaining life in the preset characteristic remaining life relationship record table, select the second mapping relationship corresponding to the characteristic remaining life with the smallest difference from the current remaining life in the characteristic remaining life relationship record table as the second mapping relationship corresponding to the current remaining life.

[0146] In some preferred embodiments, such as this embodiment, the obtaining of the current remaining life of the varistor before the high-voltage impact event includes:

[0147] Obtain a pre-stored life record table, and read the currently recorded remaining life in the life record table as the current remaining life of the varistor before the high-voltage impact event;

[0148] In some preferred embodiments, such as this embodiment, the varistor remaining life prediction device further includes:

[0149] An update unit, configured to update the value of the currently recorded remaining life in the life record table to the remaining life.

[0150] It should be noted that those skilled in the art can clearly understand that the specific implementation processes of the above varistor remaining life prediction device and each unit can refer to the corresponding descriptions in the foregoing method embodiments. For the convenience and conciseness of description, they are not elaborated herein.

[0151] The above varistor remaining life prediction device can be implemented in the form of a computer program, and the computer program can run on a computer device as shown in Figure 4 shown.

[0152] Please refer to Figure 4 , Figure 4 which is a schematic block diagram of a computer device provided by an embodiment of the present invention. The computer device 500 can be a terminal or a server. Among them, the terminal can be an electronic device with a communication function such as a smart phone, a tablet computer, a notebook computer, a desktop computer, a personal digital assistant, and a wearable device. The server can be an independent server or a server cluster composed of multiple servers.

[0153] The computer device 500 includes a processor 502, a memory, and a network interface 505 connected through a system bus 501. Among them, the memory can include a non-volatile storage medium 503 and an internal memory 504.

[0154] The non-volatile storage medium 503 can store an operating system 5031 and a computer program 5032. When the computer program 5032 is executed, it can cause the processor 502 to execute a method for predicting the remaining life of a varistor.

[0155] The processor 502 is used to provide computing and control capabilities to support the operation of the entire computer device 500.

[0156] The internal memory 504 provides an environment for the operation of the computer program 5032 in the non-volatile storage medium 503. When the computer program 5032 is executed by the processor 502, it can cause the processor 502 to execute a method for predicting the remaining life of a varistor.

[0157] The network interface 505 is used for network communication with other devices. Those skilled in the art can understand that the above structure is only a block diagram of some structures related to the solution of the present invention, and does not constitute a limitation on the computer device 500 to which the solution of the present invention is applied. The specific computer device 500 may include more or fewer components than those shown in the figure, or combine some components, or have a different component layout.

[0158] Among them, the processor 502 is used to run the computer program 5032 stored in the memory to implement the steps of a method for predicting the remaining life of a varistor provided in any of the above embodiments.

[0159] It should be understood that in the embodiments of the present invention, the processor 502 may be a central processing unit (CPU). The processor 502 may also be other general-purpose processors, digital signal processors (DSPs), application-specific integrated circuits (ASICs), field-programmable gate arrays (FPGAs), or other programmable logic devices, discrete gate or transistor logic devices, discrete hardware components, etc. Among them, the general-purpose processor may be a microprocessor or the processor may also be any conventional processor, etc.

[0160] Those of ordinary skill in the art can understand that all or part of the processes in the methods of the above-described embodiments can be completed by instructing relevant hardware through a computer program. The computer program can be stored in a storage medium, and the storage medium is a computer-readable storage medium. The computer program is executed by at least one processor in the computer system to implement the process steps of the embodiments of the above method.

[0161] Therefore, the present invention also provides a storage medium. The storage medium can be a computer-readable storage medium. The storage medium stores a computer program. When the computer program is executed by a processor, the processor is caused to execute the steps of a method for predicting the remaining life of a varistor as provided in any of the above embodiments.

[0162] The storage medium is a physical, non-transitory storage medium, such as a USB flash drive, a mobile hard disk, a read-only memory (ROM), a magnetic disk, or an optical disc, etc., which are various physical storage media that can store program codes. The computer-readable storage medium can be non-volatile or volatile.

[0163] Those of ordinary skill in the art can realize that the units and algorithm steps of the examples described in combination with the embodiments disclosed herein can be implemented by electronic hardware, computer software, or a combination of the two. To clearly illustrate the interchangeability of hardware and software, the components and steps of the examples have been generally described according to functions in the above description. Whether these functions are executed in a hardware or software manner depends on the specific application and design constraints of the technical solution. Professional technicians can use different methods to implement the described functions for each specific application, but such implementation should not be considered to exceed the scope of the present invention.

[0164] In several embodiments provided by the present invention, it should be understood that the disclosed devices and methods can be implemented in other ways. For example, the device embodiments described above are merely illustrative. For example, the division of each unit is only a logical function division, and there can be other division methods in actual implementation. For example, multiple units or components can be combined or integrated into another system, or some features can be ignored or not executed.

[0165] The steps in the method embodiments of the present invention can be adjusted, combined, and deleted according to actual needs. The units in the device embodiments of the present invention can be combined, divided, and deleted according to actual needs. In addition, the functional units in each embodiment of the present invention can be integrated into one processing unit, or each unit can exist physically alone, or two or more units can be integrated into one unit.

[0166] When the integrated unit is implemented in the form of a software functional unit and sold or used as an independent product, it can be stored in a storage medium. Based on such understanding, the technical solution of the present invention, in essence, or the part that makes a contribution to the prior art, or all or part of the technical solution can be embodied in the form of a software product. The computer software product is stored in a storage medium and includes several instructions for causing a computer device (which may be a personal computer, a terminal, or a network device, etc.) to execute all or part of the steps of the methods described in various embodiments of the present invention.

[0167] In the above embodiments, the descriptions of the various embodiments have their own emphases. For the parts not detailed in a certain embodiment, reference can be made to the relevant descriptions of other embodiments.

[0168] Obviously, those skilled in the art can make various changes and modifications to the present invention without departing from the spirit and scope of the present invention. Thus, provided that these modifications and variations of the present invention fall within the scope of the claims of the present invention and their equivalent technologies, the present invention also intends to include these changes and modifications.

[0169] As described above, the above are only the specific embodiments of the present invention, but the protection scope of the present invention is not limited thereto. Any person skilled in the art within the technical scope disclosed by the present invention can easily think of various equivalent modifications or substitutions, and these modifications or substitutions should all be covered within the protection scope of the present invention. Therefore, the protection scope of the present invention shall be subject to the protection scope of the claims.

Claims

1. A method for predicting the remaining life of a varistor, characterized in that, Including: Determine whether a high-voltage impact event occurs to the varistor; If the high-voltage impact event occurs to the varistor, obtain the temperature rise value of the varistor during the high-voltage impact event; Obtain the current remaining life of the varistor before the high-voltage impact event occurs; Based on the current remaining life and the temperature rise value, obtain the life loss value of the varistor, and determine the remaining life of the varistor after the high-voltage impact event according to the current remaining life and the life loss value.

2. The method for predicting the remaining life of a varistor according to claim 1, wherein The determination of whether a high-voltage impact event occurs to the varistor includes: Determine whether the rising amplitude of the temperature of the varistor within a specified time exceeds a preset threshold; If the rising amplitude of the temperature of the varistor within a specified time exceeds the preset threshold, determine that the high-voltage impact event occurs to the varistor.

3. The method for predicting the remaining life of a varistor according to claim 1, characterized in that, The obtaining of the temperature rise value of the varistor during the high-voltage impact event includes: Starting from the starting moment of the high-voltage impact event, obtain the difference between the highest temperature of the varistor within a preset duration and the temperature before the high-voltage impact event occurs, to obtain the temperature rise value.

4. The method for predicting the remaining life of a varistor according to claim 1, wherein The obtaining of the life loss value of the varistor based on the current remaining life and the temperature rise value includes: Obtain a preset first mapping relationship, where the first mapping relationship is used to represent the corresponding relationship between the life loss value of the varistor, the current remaining life, and the temperature rise value; Based on the first mapping relationship, the current remaining life, and the temperature rise value, determine the life loss value of the varistor.

5. The method for predicting the remaining life of a varistor according to claim 1, wherein The obtaining of the life loss value of the varistor based on the current remaining life and the temperature rise value includes: Obtain the second mapping relationship corresponding to the current remaining life, where the second mapping relationship is used to represent the corresponding relationship between the life loss value of the varistor and the temperature rise value when the current remaining life of the varistor is the current remaining life; Based on the second mapping relationship and the temperature rise value, determine the life loss value of the varistor.

6. The method for predicting the remaining life of a varistor according to claim 5, characterized in that, The obtaining of the second mapping relationship corresponding to the current remaining life includes: Determine whether the current remaining life is a characteristic remaining life in a preset characteristic remaining life relationship record table, where the characteristic remaining life relationship record table is used to record the second mapping relationships corresponding to multiple characteristic remaining lives; If the current remaining life is a characteristic remaining life in the preset characteristic remaining life relationship record table, read the second mapping relationship corresponding to the current remaining life from the characteristic remaining life relationship record table; If the current remaining life is not a characteristic remaining life in the preset characteristic remaining life relationship record table, select the second mapping relationship corresponding to the characteristic remaining life with the smallest difference from the current remaining life in the characteristic remaining life relationship record table as the second mapping relationship corresponding to the current remaining life.

7. The method for predicting the remaining life of a varistor according to claim 1, characterized in that, The obtaining of the current remaining life of the varistor before the high-voltage impact event occurs includes: Obtain the pre-stored life record table, and read the current remaining life recorded in the life record table as the current remaining life of the varistor before the high-voltage impact event occurs; After determining the remaining life of the varistor after the high-voltage impact event according to the current remaining life and the life loss value, the method further includes: Update the value of the current remaining life recorded in the life record table to the remaining life.

8. A device for predicting the remaining life of a varistor, characterized in that, It includes a unit for executing the method according to any one of claims 1-7.

9. A computer device, characterized in that, The computer device includes a memory and a processor, and a computer program is stored on the memory. When the processor executes the computer program, the method according to any one of claims 1-7 is implemented.

10. A computer-readable storage medium, characterized in that, The storage medium stores a computer program, and when the computer program is executed by a processor, the method according to any one of claims 1-7 can be implemented.

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