Metal sheet sealed atomic gas chamber device, direct-current voltage measuring equipment and method

Abstract

The invention discloses an atomic gas chamber device sealed by a metal sheet, a direct current voltage measuring device and a direct current voltage measuring method. The atomic gas chamber device comprises a first outer polar plate, a second outer polar plate, a first tungsten rod, a second tungsten rod, a first glass bead, a second glass bead, a first inner polar plate, a second inner polar plate and an atomic gas chamber, the direct-current voltage measuring equipment comprises a first laser, a dichroscope, a photoelectric detector, a second laser, a controller and an atomic gas chamber device. The direct-current voltage measuring method comprises the following steps: performing frequency locking on first laser output by a first laser and second laser output by a second laser; detecting an electromagnetically induced transparency spectrum by using a photoelectric detector; acquiring a direct-current voltage output by an external voltage source by using an atomic gas chamber device, so that the electromagnetically-induced transparent spectrum is changed; and determining the frequency shift of the first laser transmission peak based on the electromagnetic induction transparent spectrum by using a controller, obtaining the frequency shift amount, and determining the voltage value of the direct-current voltage based on the frequency shift amount.

Description

Technical Field

[0001] The present invention relates to the field of quantum precision measurement technology, and more particularly to a metal sheet sealed atomic gas chamber device, a DC voltage measurement device and a method. Background Art

[0002] The application of electric field measurement technology is crucial in the power industry, significantly impacting the design and safe operation of power equipment, the stability of power systems, and the fairness of power trading. However, traditional electric field measurement techniques suffer from issues such as being easily affected by the installation environment, insufficient equipment stability and linearity requiring frequent calibration to ensure measurement accuracy, and a limited dynamic range. Therefore, exploring new electric field measurement technologies is crucial for promoting the construction of new power systems.

[0003] With the development of technology, new electric field measurement technologies such as electric field measurement technology based on Rydberg atoms are developing rapidly. It utilizes the high sensitivity of Rydberg atoms to electric fields and measures electric fields through principles such as quantum interference effect, with higher sensitivity and accuracy.

[0004] Rydberg atoms, generally referred to as highly excited atoms with a principal quantum number n greater than 10, possess long energy level lifetimes, large polarizability, and electric dipole moments, offering significant potential for measurement. Compared to traditional electric field measurement techniques, new electric field measurement techniques based on Rydberg atoms offer advantages such as traceability, high sensitivity, strong interference resistance, and wide-band measurement capabilities. These techniques are expected to complement or even replace traditional electric field measurement techniques in the future.

[0005] Currently, electric field measurements based on Rydberg atoms are primarily performed using electrode plates and an alkali metal atom gas cell. This involves placing the alkali metal atom gas cell between a pair of parallel electrode plates, introducing a voltage through the electrode plates, and exploiting the electric field interaction between the Rydberg atoms and the electrode plates to generate electromagnetically induced transparency spectroscopy, thereby achieving voltage measurement. However, this measurement scheme presents challenges such as interference from external electromagnetic fields in the atom gas cell and the inability to precisely control the voltage between the plates, which can affect the accuracy and stability of voltage measurements.

[0006] Therefore, a metal sheet sealed atomic gas chamber device, a DC voltage measurement device and a method are needed. Summary of the Invention

[0007] The present invention proposes a metal sheet-sealed atomic gas chamber device, a DC voltage measurement device, a method and a system to solve the problem of how to perform DC voltage quantum measurement efficiently and accurately.

[0008] In order to solve the above problems, according to one aspect of the present invention, a metal sheet sealed atomic gas chamber device is provided, wherein the atomic gas chamber device comprises: a first outer electrode plate, a second outer electrode plate, a first tungsten rod, a second tungsten rod, a first glass bead, a second glass bead, a first inner electrode plate, a second inner electrode plate and an atomic gas chamber; wherein,

[0009] The first tungsten rod and the second tungsten rod are symmetrically distributed on both sides of the central axis of the atomic gas chamber. The first tungsten rod and the second tungsten rod are perpendicular to the busbar on the side of the atomic gas chamber and are located at the center, and are fixed to the side of the atomic gas chamber by the first glass bead and the second glass bead respectively. The two bottom surfaces of the first tungsten rod are respectively welded to the first inner pole plate and the first outer pole plate which are parallel to each other, and the two bottom surfaces of the second tungsten rod are respectively welded to the second inner pole plate and the second outer pole plate which are parallel to each other; the first inner pole plate and the second inner pole plate are symmetrically distributed in the atomic gas chamber, and the first outer pole plate and the second outer pole plate are distributed outside the atomic gas chamber; wherein, the first outer pole plate, the second outer pole plate, the first inner pole plate and the second inner pole plate are all made of metal.

[0010] Preferably, the atomic gas chamber comprises: a first light window, a second light window and a gas chamber cylinder, wherein the first light window and the second light window are respectively sealed with two circular bottom surfaces of the gas chamber cylinder through flames.

[0011] Preferably, the air chamber cylinder is made of high silicon boron material.

[0012] Preferably, the first outer electrode plate, the second outer electrode plate, the first inner electrode plate and the second inner electrode plate are all made of copper.

[0013] Preferably, the interior of the atomic gas chamber is filled with Cs atomic vapor and nitrogen as a buffer gas.

[0014] Preferably, the atomic gas chamber is cylindrical.

[0015] According to another aspect of the present invention, a DC voltage measuring device based on a metal sheet sealed atomic gas cell device is provided, the DC voltage measuring device comprising: a first laser, a dichroic mirror, a photodetector, a second laser, a controller, and the atomic gas cell device as described above; wherein,

[0016] The atomic gas chamber device is connected to an external voltage source and is used to obtain a DC voltage output by the external voltage source;

[0017] The first laser is used to output a first laser to the atomic gas cell of the atomic gas cell device, and the first laser is then projected onto the photodetector through the dichroic mirror;

[0018] The second laser is configured to output a second laser to the dichroic mirror, and after being reflected by the dichroic mirror, the second laser is collinear with the first laser between the first inner plate and the second inner plate of the atomic gas chamber;

[0019] The photodetector is used to detect electromagnetically induced transparency spectrum; wherein the first laser and the second laser are collinearly emitted into the atomic gas chamber in opposite directions to excite the atoms in the atomic gas chamber to Rydberg states, thereby generating electromagnetically induced transparency spectrum;

[0020] The controller is connected to the photodetector and is configured to determine a frequency shift of the first laser transmission peak based on the electromagnetically induced transparency spectrum, obtain an amount of the frequency shift, and determine a voltage value of the DC voltage based on the amount of the frequency shift;

[0021] Wherein, the first laser and the second laser both pass through the center of the atomic gas chamber and the dichroic mirror.

[0022] Preferably, the atomic gas chamber device and the voltage source are connected via a BNC connector to alligator clip cable, the BNC connector is connected to the output end of the voltage source, and the alligator clip clamps the first external electrode plate and the second external electrode plate of the atomic gas chamber device.

[0023] According to another aspect of the present invention, a method for measuring a DC voltage based on the DC voltage measuring device as described above is provided, the method comprising:

[0024] frequency-locking a first laser output by the first laser and a second laser output by the second laser;

[0025] The electromagnetically induced transparency spectrum is detected using a photodetector; wherein the first laser and the second laser are collinearly injected into the atomic gas chamber in opposite directions to excite the atoms in the atomic gas chamber to a Rydberg state, thereby generating the electromagnetically induced transparency spectrum;

[0026] The atomic gas cell device is used to obtain a DC voltage outputted by an external voltage source, so that the atoms in the atomic gas cell are placed in a DC electric field, thereby causing the electromagnetically induced transparency spectrum to change;

[0027] A controller is used to determine a frequency shift of the first laser transmission peak based on the electromagnetically induced transparency spectrum, obtain a frequency shift amount, and determine a voltage value of the DC voltage based on the frequency shift amount.

[0028] Preferably, the frequency locking of the first laser output by the first laser and the second laser output by the second laser comprises:

[0029] The first laser frequency is locked within the resonant frequency range of the atomic ground state energy level |g> and the atomic intermediate state energy level |e>, and the second laser frequency is locked within the resonant frequency range of the atomic intermediate state energy level |e> and the Rydberg state energy level |r>.

[0030] Preferably, determining the voltage value of the DC voltage based on the frequency shift comprises:

[0031]

[0032] Wherein, U is the voltage value of the DC voltage; α is the atomic polarizability; and Δf is the frequency shift.

[0033] According to another aspect of the present invention, there is provided a DC voltage quantum measurement system based on the DC voltage measurement device described above, the DC voltage quantum measurement system comprising:

[0034] A frequency locking module, configured to lock the frequencies of a first laser output by the first laser and a second laser output by the second laser;

[0035] A detection module is used to detect the electromagnetically induced transparency spectrum using a photodetector; wherein the first laser and the second laser are collinearly emitted into the atomic gas chamber in opposite directions to excite the atoms in the atomic gas chamber to a Rydberg state, thereby generating the electromagnetically induced transparency spectrum;

[0036] A voltage acquisition module is used to enable the atomic gas chamber device to obtain the DC voltage output by the external voltage source, so that the atoms in the atomic gas chamber are in a DC electric field, thereby changing the electromagnetically induced transparency spectrum;

[0037] The voltage value determination module is used to use a controller to determine the frequency shift of the first laser transmission peak based on the electromagnetically induced transparency spectrum, obtain the frequency shift amount, and determine the voltage value of the DC voltage based on the frequency shift amount.

[0038] Preferably, the frequency locking module locks the frequencies of the first laser output by the first laser and the second laser output by the second laser, including:

[0039] The first laser frequency is locked within the resonant frequency range of the atomic ground state energy level |g> and the atomic intermediate state energy level |e>, and the second laser frequency is locked within the resonant frequency range of the atomic intermediate state energy level |e> and the Rydberg state energy level |r>.

[0040] Preferably, the voltage value determining module determines the voltage value of the DC voltage based on the frequency shift, including:

[0041]

[0042] Wherein, U is the voltage value of the DC voltage; α is the atomic polarizability; and Δf is the frequency shift.

[0043] The present invention provides a metal-sheet-sealed atomic gas chamber device, comprising: a first outer plate, a second outer plate, a first tungsten rod, a second tungsten rod, a first glass bead, a second glass bead, a first inner plate, a second inner plate, and an atomic gas chamber. The provision of the outer plate facilitates the application of a DC voltage and avoids damage to the sintered junction of the tungsten rod and glass bead, which could lead to gas leakage.

[0044] The present invention also provides a DC voltage measurement device based on a metal-seal atomic gas chamber device, comprising: a first laser, a dichroic mirror, a photodetector, a second laser, a controller, and an atomic gas chamber device. By using the metal-seal atomic gas chamber as a sensing element, the device of the present invention can effectively reduce the shielding effect of the atomic gas chamber itself on the DC electric field to be measured, thereby improving measurement accuracy and sensitivity. Compared to placing the gas chamber in the middle of the electrode plate, placing the electrode plate inside the gas chamber allows the electric field to be directly applied to the Rydberg atoms in the gas chamber, thereby more accurately controlling the electric field strength and direction. Through the organic combination of the electrode plate and the atomic gas chamber, the volume of the sensing portion of the measuring device is reduced, promoting the miniaturization of the voltage measurement system.

[0045] The present invention also provides a DC voltage measurement method and system based on the DC voltage measurement device described above, comprising: frequency-locking a first laser output by a first laser and a second laser output by a second laser; detecting an electromagnetically induced transparency spectrum using a photodetector; obtaining a DC voltage output by an external voltage source using an atomic gas chamber device, so that the atoms in the atomic gas chamber are in a DC electric field, thereby causing the electromagnetically induced transparency spectrum to change; and determining the frequency shift of the first laser transmission peak based on the electromagnetically induced transparency spectrum using a controller, obtaining the frequency shift amount, and determining the voltage value of the DC voltage based on the frequency shift amount. The method of the present invention has the advantages of traceability and high sensitivity, can realize DC voltage measurement, and provides certain reference value for the comprehensive practical implementation of quantum precision measurement technology in power systems. BRIEF DESCRIPTION OF THE DRAWINGS

[0046] A more complete understanding of exemplary embodiments of the present invention may be obtained by referring to the following drawings:

[0047] Figure 1 Schematic diagram of the structure of a metal sheet sealed atomic gas chamber device 100 according to an embodiment of the present invention;

[0048] Figure 2 Schematic diagram of the structure of a DC voltage measuring device 200 based on a metal sheet sealed atomic gas cell device according to an embodiment of the present invention;

[0049] Figure 3 Flowchart of a DC voltage measurement method 300 based on a DC voltage measurement device according to an embodiment of the present invention;

[0050] Figure 4 4 is a schematic structural diagram of a DC voltage quantum measurement system 400 based on a DC voltage measurement device according to an embodiment of the present invention. DETAILED DESCRIPTION

[0051] Exemplary embodiments of the present invention will now be described with reference to the accompanying drawings. However, the present invention may be embodied in many different forms and is not limited to the embodiments described herein. These embodiments are provided to provide a thorough and complete disclosure of the present invention and to fully convey the scope of the present invention to those skilled in the art. The terminology used in the exemplary embodiments shown in the accompanying drawings is not intended to limit the present invention. In the accompanying drawings, identical elements are denoted by the same reference numerals.

[0052] Unless otherwise specified, the terms used herein (including technical terms) have the meanings commonly understood by those skilled in the art. In addition, it is understood that terms defined in commonly used dictionaries should be understood to have the same meanings as those in the context of the relevant fields, and should not be understood as idealized or overly formal meanings.

[0053] Figure 1 FIG. 1 is a schematic structural diagram of a metal sheet sealed atomic gas chamber device 100 according to an embodiment of the present invention. Figure 1As shown, the metal sheet-sealed atomic gas chamber device provided in an embodiment of the present invention can facilitate the application of DC voltage by providing an external electrode plate, and can avoid damaging the sintering point of the tungsten rod and glass bead, which may cause leakage. The metal sheet-sealed atomic gas chamber device 100 provided by the present invention includes: a first external electrode plate 1, a first tungsten rod 2, a first glass bead 3, an atomic gas chamber 4, a first inner electrode plate 5, a second inner electrode plate 6, a second glass bead 7, a second tungsten rod 8, and a second outer electrode plate 9. In which, the atomic gas chamber 4 is cylindrical, the first tungsten rod 2 and the second tungsten rod 8 are symmetrically distributed on both sides of the central axis of the atomic gas chamber 4, the first tungsten rod 2 and the second tungsten rod 8 are perpendicular to the busbar on the side of the atomic gas chamber 4 and are located at the center, and are fixed to the side of the atomic gas chamber 4 by the first glass bead 3 and the second glass bead 7 respectively, the two bottom surfaces of the first tungsten rod 2 are respectively welded to the first inner pole plate 5 and the first outer pole plate 1 which are parallel to each other, and the two bottom surfaces of the second tungsten rod 8 are respectively welded to the second inner pole plate 6 and the second outer pole plate 9 which are parallel to each other; the first inner pole plate 5 and the second inner pole plate 6 are symmetrically distributed in the atomic gas chamber 4, and the first outer pole plate and the second outer pole plate are distributed outside the atomic gas chamber; wherein, the first outer pole plate 1, the second outer pole plate 9, the first inner pole plate 5 and the second inner pole plate 6 are all made of metal.

[0054] Preferably, the atomic gas chamber 4 comprises a first light window 41, a second light window 42 and a gas chamber cylinder 43, wherein the first light window 41 and the second light window 42 are respectively sealed with two circular bottom surfaces of the gas chamber cylinder 43 by flame.

[0055] Preferably, the air chamber cylinder 43 is made of high silicon boron material.

[0056] Preferably, the first outer electrode plate 1 , the second outer electrode plate 9 , the first inner electrode plate 5 and the second inner electrode plate 6 are all made of copper.

[0057] Preferably, the atomic gas chamber 4 is filled with Cs atomic vapor and nitrogen as a buffer gas.

[0058] Preferably, the atomic gas chamber 4 is cylindrical.

[0059] Figure 2 FIG. 2 is a structural diagram of a DC voltage measuring device 200 based on a metal sheet sealed atomic gas chamber device according to an embodiment of the present invention. Figure 2As shown, the DC voltage measuring device based on the atomic gas chamber device sealed with a metal sheet provided in an embodiment of the present invention, by using the atomic gas chamber sealed with a metal sheet as a sensing element, can effectively reduce the shielding effect of the atomic gas chamber itself on the DC electric field to be measured, thereby improving the measurement accuracy and sensitivity; compared with placing the gas chamber in the middle of the electrode plate, placing the electrode plate inside the gas chamber can directly apply an electric field to the Rydberg state atoms in the gas chamber, thereby more accurately controlling the electric field strength and direction; through the organic combination of the electrode plate and the atomic gas chamber, the volume of the sensing part of the measuring device is reduced, and the voltage measurement system is miniaturized. The DC voltage measuring device 200 based on the atomic gas chamber device sealed with a metal sheet provided in an embodiment of the present invention includes: a first laser 201, a dichroic mirror 202, a photodetector 204, a second laser 203, a controller 205 (not shown in the figure) and an atomic gas chamber device 206.

[0060] Preferably, the atomic gas chamber device 206 is connected to an external voltage source to obtain a DC voltage output by the external voltage source.

[0061] Preferably, the atomic gas chamber device and the voltage source are connected via a BNC connector to alligator clip cable, the BNC connector is connected to the output end of the voltage source, and the alligator clip clamps the first external electrode plate and the second external electrode plate of the atomic gas chamber device.

[0062] Preferably, the first laser 201 is used to output a first laser to the atomic gas cell of the atomic gas cell device, and the first laser is then projected onto the photodetector through the dichroic mirror.

[0063] Preferably, the second laser 203 is used to output a second laser to the dichroic mirror, which is then reflected by the dichroic mirror and is collinear with the first laser between the first inner plate and the second inner plate of the atomic gas chamber; wherein both the first laser and the second laser pass through the center position of the atomic gas chamber and the dichroic mirror.

[0064] Preferably, the wavelength of the laser emitted by the first laser is 852 nm, and the wavelength of the laser emitted by the second laser is 512 nm.

[0065] Preferably, the photodetector 204 is used to detect electromagnetically induced transparency spectrum; wherein, the first laser and the second laser are collinearly emitted into the atomic gas chamber in opposite directions to excite the atoms in the atomic gas chamber to the Rydberg state, thereby generating electromagnetically induced transparency spectrum.

[0066] Preferably, the controller 205 is connected to the photodetector, and is configured to determine the frequency shift of the first laser transmission peak based on the electromagnetically induced transparency spectrum, obtain the frequency shift amount, and determine the voltage value of the DC voltage based on the frequency shift amount.

[0067] like Figure 2 As shown, in the present invention, the atomic gas chamber device 206 and the DC voltage measuring device 200 Figure 1 The same as the atomic gas chamber device 100 in the embodiment of the present invention, no further details are given here. In the present invention, the laser output by the first laser is used as the detection light, and the laser output by the second laser is used as the coupling light. The detection light is output in the form of spatial light, passes through the atomic gas chamber sealed by the metal sheet, and then transmits through the dichroic mirror to be projected onto the photodiode of the photodetector; the coupling light is also output in the form of spatial light, and after being reflected by the dichroic mirror, it is collinear with the detection light between the inner plates of the atomic gas chamber; the detection light and the coupling light need to pass through the center position of the atomic gas chamber and the dichroic mirror to ensure the beam quality. The wavelength of the laser emitted by the first laser is 852nm, and the wavelength of the laser emitted by the second laser is 512nm.

[0068] The present invention can realize electric field measurement based on electromagnetically induced transparency and the DC Stark effect. Rydberg state atoms can convert the modulation of the DC electric field into changes in physical quantities related to the detection light field, thereby realizing the measurement of DC voltage. The method of the present invention obtains highly excited Rydberg atoms by injecting coupling light and detection light into the metal sheet-sealed atomic gas chamber in opposite collinear directions. Furthermore, a DC voltage is applied to the metal sheet-sealed atomic gas chamber to obtain the frequency shift of the detection light transmission peak in the electromagnetically induced transparency spectrum, and then combined with the electric field strength formula between the two electrodes to realize the precise measurement of DC voltage.

[0069] Figure 3 FIG. 3 is a flow chart of a DC voltage measurement method 300 based on a DC voltage measurement device according to an embodiment of the present invention. Figure 3 As shown, the DC voltage measurement method based on the above-described DC voltage measurement device provided in an embodiment of the present invention has advantages such as traceability and high sensitivity, can realize DC voltage measurement, and provides certain reference value for the comprehensive practical implementation of quantum precision measurement technology in power systems. The DC voltage measurement method 300 based on the above-described DC voltage measurement device provided in an embodiment of the present invention begins at step 301. In step 301, the first laser output by the first laser and the second laser output by the second laser are frequency-locked.

[0070] Preferably, the frequency locking of the first laser output by the first laser and the second laser output by the second laser comprises:

[0071] The first laser frequency is locked within the resonant frequency range of the atomic ground state energy level |g> and the atomic intermediate state energy level |e>, and the second laser frequency is locked within the resonant frequency range of the atomic intermediate state energy level |e> and the Rydberg state energy level |r>.

[0072] In step 302, an electromagnetically induced transparency spectrum is detected using a photodetector. The first laser and the second laser are collinearly injected into the atomic gas chamber in opposite directions to excite the atoms in the atomic gas chamber to a Rydberg state, thereby generating an electromagnetically induced transparency spectrum.

[0073] In step 303, the atomic gas cell device is used to obtain a DC voltage outputted by an external voltage source, so that the atoms in the atomic gas cell are placed in a DC electric field, thereby changing the electromagnetically induced transparency spectrum.

[0074] In step 304 , a controller is used to determine a frequency shift of the first laser transmission peak based on the electromagnetically induced transparency spectrum, obtain a frequency shift amount, and determine a voltage value of the DC voltage based on the frequency shift amount.

[0075] Preferably, determining the voltage value of the DC voltage based on the frequency shift comprises:

[0076]

[0077] Wherein, U is the voltage value of the DC voltage; α is the atomic polarizability; and Δf is the frequency shift.

[0078] In the present invention, the specific process of the DC voltage measurement method based on the DC voltage measurement device includes:

[0079] Step 1: Construct a voltage measurement device, including: arranging an 852nm laser, a 512nm laser, an atomic gas chamber sealed with a metal sheet, a dichroic mirror, and a photodetector according to the designed optical path.

[0080] Among them, the atomic gas chamber sealed with a metal sheet is placed between an 852nm laser and a dichroic mirror. The coupled light is reflected by the dichroic mirror and is collinear with the detection light between the inner plates of the atomic gas chamber, while the detection light is transmitted through the dichroic mirror into the photodetector.

[0081] The metal-sealed atomic gas chamber's cylinder is made of high-silicon boron. The end face of the light window is flame-sealed to the circular bottom surface of the cylinder. A pair of equal-length cylindrical tungsten rods are symmetrically positioned on either side of the cylinder's central axis. The rods are perpendicular to the generatrix of the cylinder's side and located at the center. They are fixed to the cylinder's side using sintered glass beads. The bottom surfaces of the rods are welded to the inner and outer plates, respectively. The inner and outer plates are made of copper and are parallel to each other. The interior of the metal-sealed atomic gas chamber is filled with Cs atomic vapor and buffer gas under vacuum.

[0082] Step 2: Frequency-lock the output laser, including: using the output light of the 852nm laser and the 512nm laser as the probe light and the coupling light, respectively, locking the probe light frequency within the resonant frequency range of the atomic ground state energy level |g and the atomic intermediate state energy level |e>, and locking the coupling light frequency within the resonant frequency range of the atomic intermediate state energy level |e> and the Rydberg state energy level |r>.

[0083] Among them, the Cs atom adopts the three-level Cs atom, where |g>, |e>, and |r> represent the 6S 1 / 2 、6P 3 / 2 and 30D 5 / 2 Three energy levels.

[0084] Step 3: Obtain the electromagnetically induced transparency spectrum. The atomic gas chamber sealed by the metal sheet is filled with alkali metal Cs atoms. The detection light and the coupling light are injected into the atomic gas chamber sealed by the metal sheet in opposite collinear directions, so that the atoms in the atomic gas chamber are excited to the Rydberg state, generating an electromagnetically induced transparency spectrum, which is detected by the photodetector. Among them, the detection light and the coupling light are adjusted to the appropriate power. After the detection light is locked, the electromagnetically induced transparency spectrum can be observed on the oscilloscope by adjusting the photodetector.

[0085] Step 4: Measuring the DC voltage includes: applying a DC voltage to the outer plate, and the Rydberg state Cs atoms in the atomic gas chamber sealed by the metal sheet are placed in a DC electric field. The electromagnetically induced transparency spectrum produces a Stark effect under the action of the DC electric field, which is manifested as a frequency shift of the detection light transmission peak in the electromagnetically induced transparency spectrum. The frequency shift Δf has a definite quantitative relationship with the DC electric field intensity E. Combined with the electric field intensity formula between the two parallel plates, the relationship between the DC voltage U and the frequency shift Δf can be obtained.

[0086] The relationship between the frequency shift Δf and the electric field strength E is:

[0087] The formula for the electric field strength between two parallel plates is:

[0088] Therefore, the relationship between the DC voltage U and the frequency shift Δf can be obtained as follows:

[0089]

[0090] Among them, α represents the atomic polarizability, and its value is proportional to n 7 (n is the principal quantum number); d represents the distance between the parallel inner plates.

[0091] Therefore, in the present invention, the voltage value of the DC voltage can be determined according to the frequency shift based on the relationship between the DC voltage U and the frequency shift Δf.

[0092] The DC voltage measurement method based on the DC voltage measurement device of the present invention provides a technical method for improving the accuracy and sensitivity of DC voltage measurement.

[0093] Figure 4 FIG. 4 is a schematic structural diagram of a DC voltage quantum measurement system 400 based on a DC voltage measurement device according to an embodiment of the present invention. Figure 4 As shown, the DC voltage quantum measurement system 400 based on the DC voltage measurement device described above provided in an embodiment of the present invention includes: a frequency locking module 401 , a detection module 402 , a voltage acquisition module 403 and a voltage value determination module 404 .

[0094] Preferably, the frequency locking module 401 is used to lock the frequencies of the first laser output by the first laser and the second laser output by the second laser.

[0095] Preferably, the frequency locking module 401 locks the frequencies of the first laser output by the first laser and the second laser output by the second laser, including:

[0096] The first laser frequency is locked within the resonant frequency range of the atomic ground state energy level |g> and the atomic intermediate state energy level |e>, and the second laser frequency is locked within the resonant frequency range of the atomic intermediate state energy level |e> and the Rydberg state energy level |r>.

[0097] Preferably, the detection module 402 is used to detect the electromagnetically induced transparency spectrum using a photodetector; wherein the first laser and the second laser are collinearly injected into the atomic gas chamber in opposite directions to excite the atoms in the atomic gas chamber to the Rydberg state, thereby generating the electromagnetically induced transparency spectrum.

[0098] Preferably, the voltage acquisition module 403 is used to enable the atomic gas cell device to acquire a DC voltage output by an external voltage source, so that the atoms in the atomic gas cell are in a DC electric field, thereby changing the electromagnetically induced transparency spectrum.

[0099] Preferably, the voltage value determination module 404 is configured to use a controller to determine the frequency shift of the first laser transmission peak based on the electromagnetically induced transparency spectrum, obtain the frequency shift amount, and determine the voltage value of the DC voltage based on the frequency shift amount.

[0100] Preferably, the voltage value determining module 404 determines the voltage value of the DC voltage based on the frequency shift, including:

[0101]

[0102] Wherein, U is the voltage value of the DC voltage; α is the atomic polarizability; and Δf is the frequency shift.

[0103] The DC voltage quantum measurement system 400 based on a DC voltage measurement device according to an embodiment of the present invention corresponds to the DC voltage measurement method 100 based on a DC voltage measurement device according to another embodiment of the present invention, and will not be described in detail herein.

[0104] The present invention has been described with reference to a few embodiments. However, it is apparent to those skilled in the art that other embodiments than the ones disclosed above are equally within the scope of the present invention.

[0105] Generally, all terms used in this disclosure are to be interpreted according to their ordinary meaning in the art, unless explicitly defined otherwise herein. All references to "a / the / the [device, component, etc.]" are to be interpreted openly as referring to at least one instance of the device, component, etc., unless explicitly stated otherwise. The steps of any method disclosed herein do not necessarily need to be performed in the exact order disclosed, unless explicitly stated otherwise.

[0106] Those skilled in the art will appreciate that the embodiments of the present application can be provided as methods, systems, or computer program products. Therefore, the present application can adopt the form of a complete hardware embodiment, a complete software embodiment, or an embodiment in combination with software and hardware. Moreover, the present application can adopt the form of a computer program product implemented on one or more computer-usable storage media (including but not limited to magnetic disk storage, CD-ROM, optical storage, etc.) that contain computer-usable program code.

[0107] The present application is described with reference to the flowcharts and / or block diagrams of the methods, devices (systems), and computer program products according to the embodiments of the present application. It should be understood that each process and / or box in the flowchart and / or block diagram, as well as the combination of the processes and / or boxes in the flowchart and / or block diagram, can be implemented by computer program instructions. These computer program instructions can be provided to a processor of a general-purpose computer, a special-purpose computer, an embedded processor, or other programmable data processing device to produce a machine, so that the instructions executed by the processor of the computer or other programmable data processing device generate instructions for implementing the steps in the process. Figure 1 a process or multiple processes and / or boxes Figure 1 A device that provides the functions specified in a block or multiple blocks.

[0108] These computer program instructions may also be stored in a computer readable memory that can direct a computer or other programmable data processing device to work in a specific manner, so that the instructions stored in the computer readable memory produce an article of manufacture comprising an instruction device, which implements the process Figure 1 a process or multiple processes and / or boxes Figure 1 The function specified in one or more boxes.

[0109] These computer program instructions can also be loaded onto a computer or other programmable data processing device so that a series of operating steps are executed on the computer or other programmable device to produce a computer-implemented process, thereby providing the instructions executed on the computer or other programmable device for implementing the process. Figure 1 a process or multiple processes and / or boxes Figure 1 A step that specifies a function in one or more boxes.

[0110] Finally, it should be noted that the above embodiments are only used to illustrate the technical solutions of the present invention and not to limit it. Although the present invention has been described in detail with reference to the above embodiments, ordinary technicians in the field should understand that the specific implementation methods of the present invention can still be modified or replaced by equivalents. Any modification or equivalent replacement that does not depart from the spirit and scope of the present invention should be covered by the scope of protection of the present invention.

Claims

1. A metal sheet sealed atomic gas chamber device, characterized in that: The atomic gas chamber device comprises: a first outer electrode plate, a second outer electrode plate, a first tungsten rod, a second tungsten rod, a first glass bead, a second glass bead, a first inner electrode plate, a second inner electrode plate and an atomic gas chamber; wherein, The first tungsten rod and the second tungsten rod are symmetrically distributed on both sides of the central axis of the atomic gas chamber. The first tungsten rod and the second tungsten rod are perpendicular to the busbar on the side of the atomic gas chamber and are located at the center, and are fixed to the side of the atomic gas chamber by the first glass bead and the second glass bead respectively. The two bottom surfaces of the first tungsten rod are respectively welded to the first inner pole plate and the first outer pole plate which are parallel to each other, and the two bottom surfaces of the second tungsten rod are respectively welded to the second inner pole plate and the second outer pole plate which are parallel to each other; the first inner pole plate and the second inner pole plate are symmetrically distributed in the atomic gas chamber, and the first outer pole plate and the second outer pole plate are distributed outside the atomic gas chamber; wherein, the first outer pole plate, the second outer pole plate, the first inner pole plate and the second inner pole plate are all made of metal.

2. The atomic gas chamber device according to claim 1, characterized in that The atomic gas chamber comprises a first light window, a second light window and a gas chamber cylinder, wherein the first light window and the second light window are respectively sealed with two circular bottom surfaces of the gas chamber cylinder through flames.

3. The atomic gas chamber device according to claim 2, characterized in that: The air chamber cylinder is made of high silicon boron material.

4. The atomic gas chamber device according to claim 1, characterized in that: The first outer electrode plate, the second outer electrode plate, the first inner electrode plate and the second inner electrode plate are all made of copper.

5. The atomic gas chamber device according to claim 1, characterized in that: The atomic gas chamber is filled with Cs atomic vapor and nitrogen as a buffer gas.

6. The atomic gas chamber device according to claim 1, characterized in that: The atomic gas chamber is cylindrical.

7. A DC voltage measuring device based on a metal sheet sealed atomic gas chamber device, characterized in that: The DC voltage measuring device comprises: a first laser, a dichroic mirror, a photodetector, a second laser, a controller and the atomic gas cell device according to any one of claims 1 to 6; wherein, The atomic gas chamber device is connected to an external voltage source and is used to obtain a DC voltage output by the external voltage source; The first laser is used to output a first laser to the atomic gas cell of the atomic gas cell device, and the first laser is then projected onto the photodetector through the dichroic mirror; The second laser is configured to output a second laser to the dichroic mirror, and after being reflected by the dichroic mirror, the second laser is collinear with the first laser between the first inner plate and the second inner plate of the atomic gas chamber; The photodetector is used to detect electromagnetically induced transparency spectrum; wherein the first laser and the second laser are collinearly emitted into the atomic gas chamber in opposite directions to excite the atoms in the atomic gas chamber to Rydberg states, thereby generating electromagnetically induced transparency spectrum; The controller is connected to the photodetector and is configured to determine a frequency shift of the first laser transmission peak based on the electromagnetically induced transparency spectrum, obtain an amount of the frequency shift, and determine a voltage value of the DC voltage based on the amount of the frequency shift; Wherein, the first laser and the second laser both pass through the center of the atomic gas chamber and the dichroic mirror.

8. The device according to claim 6, characterized in that The atomic gas cell device and the voltage source are connected via a BNC connector to alligator clip cable, wherein the BNC connector is connected to the output end of the voltage source, and the alligator clip clamps the first and second outer plates of the atomic gas cell device.

9. A method for measuring direct current voltage based on the direct current voltage measuring device according to any one of claims 6 to 8, characterized in that: The method comprises: frequency-locking a first laser output by the first laser and a second laser output by the second laser; The electromagnetically induced transparency spectrum is detected using a photodetector; wherein the first laser and the second laser are collinearly injected into the atomic gas chamber in opposite directions to excite the atoms in the atomic gas chamber to a Rydberg state, thereby generating the electromagnetically induced transparency spectrum; The atomic gas cell device is used to obtain a DC voltage outputted by an external voltage source, so that the atoms in the atomic gas cell are placed in a DC electric field, thereby causing the electromagnetically induced transparency spectrum to change; A controller is used to determine a frequency shift of the first laser transmission peak based on the electromagnetically induced transparency spectrum, obtain a frequency shift amount, and determine a voltage value of the DC voltage based on the frequency shift amount.

10. The method according to claim 9, characterized in that The frequency locking of the first laser output by the first laser and the second laser output by the second laser comprises: The first laser frequency is locked within the resonant frequency range of the atomic ground state energy level |g> and the atomic intermediate state energy level |e>, and the second laser frequency is locked within the resonant frequency range of the atomic intermediate state energy level |e> and the Rydberg state energy level |r>.

11. The method according to claim 9, characterized in that Determining a voltage value of the DC voltage based on the frequency shift includes: Wherein, U is the voltage value of the DC voltage; α is the atomic polarizability; and Δf is the frequency shift.

12. A DC voltage quantum measurement system based on the DC voltage measurement device according to any one of claims 6 to 8, characterized in that: The DC voltage quantum measurement system comprises: A frequency locking module, configured to lock the frequencies of a first laser output by the first laser and a second laser output by the second laser; A detection module is used to detect the electromagnetically induced transparency spectrum using a photodetector; wherein the first laser and the second laser are collinearly emitted into the atomic gas chamber in opposite directions to excite the atoms in the atomic gas chamber to a Rydberg state, thereby generating the electromagnetically induced transparency spectrum; A voltage acquisition module is used to enable the atomic gas chamber device to obtain the DC voltage output by the external voltage source, so that the atoms in the atomic gas chamber are in a DC electric field, thereby changing the electromagnetically induced transparency spectrum; The voltage value determination module is used to use a controller to determine the frequency shift of the first laser transmission peak based on the electromagnetically induced transparency spectrum, obtain the frequency shift amount, and determine the voltage value of the DC voltage based on the frequency shift amount.

13. The system according to claim 12, wherein: The frequency locking module locks the frequencies of the first laser output by the first laser and the second laser output by the second laser, including: The first laser frequency is locked within the resonant frequency range of the atomic ground state energy level |g> and the atomic intermediate state energy level |e>, and the second laser frequency is locked within the resonant frequency range of the atomic intermediate state energy level |e> and the Rydberg state energy level |r>.

14. The system according to claim 12, wherein: The voltage value determining module determines the voltage value of the DC voltage based on the frequency shift, including: Wherein, U is the voltage value of the DC voltage; α is the atomic polarizability; and Δf is the frequency shift.

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