Preparation method and device of detection sample and electronic equipment

Abstract

The invention discloses a preparation method and device for a detection sample and electronic equipment, and the method comprises the steps: obtaining a first label of target strip steel, and determining a performance detection item of the target strip steel and a laser cleaning parameter corresponding to the performance detection item based on the product information of the target strip steel borne by the first label; providing a sample base material with the same product information as the target strip steel; and based on the laser cleaning parameters, carrying out laser cleaning on the sample base material to obtain a detection sample corresponding to the performance detection item. The detection items and the corresponding laser cleaning parameters required by the target strip steel are determined on the basis of the product information of the target strip steel, and then the sample wafer is cleaned according to the corresponding laser cleaning parameters, so that the corresponding detection items can be carried out.

Description

Technical Field

[0001] The present invention relates to Laser Application The technical field relates particularly to a method, device and electronic equipment for preparing a test sample. Background Art

[0002] During the production process of strip steel, samples need to be prepared for various performance tests to verify whether the various properties of the strip steel are qualified. Among them, the implementation of some performance test items requires cleaning the oil stains and impurities on the surface of the sample to avoid inaccurate test results caused by stains.

[0003] Existing technologies usually use alcohol, acetone and ultrasonic cleaning processes to clean the samples to be tested, and then manually wipe them after cleaning. With the application of automation and intelligence in performance testing, the biggest problem with the cleaning method used in the existing technology is that the washed samples cannot be dried in time, affecting the next step of the test rhythm and the stability of the test data. Summary of the Invention

[0004] In view of the above problems, the present application is proposed to provide a method, device and electronic device for preparing a test sample that overcome the above problems or at least partially solve the above problems.

[0005] In a first aspect, the present application provides a method for preparing a test sample, comprising:

[0006] Obtaining a first tag of the target steel strip, and determining performance test items of the target steel strip and laser cleaning parameters corresponding to the performance test items based on product information of the target steel strip carried by the first tag;

[0007] Provide sample base material with the same product information as the target steel strip;

[0008] Based on the laser cleaning parameters, the sample substrate is laser cleaned to obtain a test sample corresponding to the performance test item.

[0009] Optionally, a detection area is provided on the surface of the sample substrate, and laser cleaning is performed on the sample substrate based on laser cleaning parameters, including:

[0010] performing a first laser cleaning on the detection area of ​​the sample substrate based on the laser cleaning parameters;

[0011] The cleanliness of the inspection area is detected. If the cleanliness detection result does not reach a preset threshold, a second laser cleaning is performed on the inspection area of ​​the sample substrate based on the laser cleaning parameters.

[0012] Optionally, before laser cleaning the sample substrate based on the laser cleaning parameters, the method further includes:

[0013] Based on the product information of the target steel strip, the sample substrate is laser marked to form a second label on the sample substrate.

[0014] Optionally, after laser cleaning the sample substrate based on the laser cleaning parameters, the method further includes:

[0015] Based on the product information of the target steel strip, the sample substrate is laser marked to form a third label on the sample substrate.

[0016] Optionally, based on the product information of the target steel strip carried by the first tag, determining the performance test items of the target steel strip and the laser cleaning parameters corresponding to the performance test items includes:

[0017] Based on the preset first matching rule, target performance detection items that match the product information of the target strip are screened out from multiple candidate performance detection items, and target laser cleaning parameters that match the product information of the target strip and the target performance detection items are determined from multiple sets of candidate laser cleaning parameters.

[0018] Optionally, product information of the target steel strip includes the steel grade, plate thickness, coating thickness, and coating type of the target steel strip.

[0019] Optionally, the multiple candidate performance testing items include roughness testing, mechanical property testing, and quality testing.

[0020] In the second aspect, the present application provides a device for preparing a test sample, including: a laser cleaning device and a control mechanism, the control mechanism being electrically connected to the laser cleaning device, and being used to obtain a first label of a target strip, and determine the performance test items of the target strip and the laser cleaning parameters corresponding to the performance test items based on the product information of the target strip carried by the first label; and based on the laser cleaning parameters, controlling the laser cleaning device to perform laser cleaning on a sample substrate to obtain a test sample corresponding to the performance test item, wherein the product information of the sample substrate is the same as that of the target strip.

[0021] In a third aspect, the present application also provides an electronic device, comprising a memory, a processor, and a computer program stored in the memory and executable on the processor. When the processor executes the computer program, the electronic device executes the method provided in the first aspect.

[0022] In a fourth aspect, the present application further provides a computer-readable storage medium, which stores a computer program. When the computer program is executed by a processor, the computer executes the method provided in the first aspect.

[0023] In a fifth aspect, the present application also provides a computer program product, comprising a computer program, which, when executed by a computer, enables the computer to execute the method provided in the first aspect.

[0024] The technical solution provided by this application has at least the following technical effects or advantages:

[0025] This application determines the performance test items and corresponding laser cleaning parameters of the target strip based on the product information of the target strip carried by the first label of the target strip; based on the laser cleaning parameters, laser cleaning is performed on the sample substrate with the same product information as the target strip to obtain a test sample corresponding to the performance test item, thereby eliminating the time required for drying the liquid cleaning sample and improving the inspection efficiency. On the other hand, based on the product information of the target strip, it is determined which test items and corresponding laser cleaning parameters are required for the target strip, and then the sample is cleaned with the corresponding laser cleaning parameters so as to perform the corresponding test items.

[0026] The above description is only an overview of the technical solution of the present application. In order to more clearly understand the technical means of the present application, it can be implemented in accordance with the contents of the specification. In order to make the above and other purposes, features and advantages of the present application more obvious and easy to understand, the specific implementation methods of the present application are listed below. BRIEF DESCRIPTION OF THE DRAWINGS

[0027] Various other advantages and benefits will become apparent to those skilled in the art upon reading the detailed description of the preferred embodiment below. The accompanying drawings are for illustration purposes only and are not to be considered as limiting the present application. The same reference symbols are used throughout the drawings to represent the same components. In the drawings:

[0028] Figure 1 A flow chart of the method for preparing a test sample provided in an embodiment of the present application;

[0029] Figure 2 A wireframe diagram of a test sample preparation device in an embodiment of the present application;

[0030] Figure 3 This is a structural diagram of the laser cleaning equipment in the embodiment of this application;

[0031] Figure 4 This is a schematic diagram of an electronic device in an embodiment of the present application. DETAILED DESCRIPTION

[0032] Exemplary embodiments of the present disclosure will be described below in more detail with reference to the accompanying drawings.

[0033] The accompanying drawings illustrate various schematic diagrams of structures according to embodiments of the present application. These figures are not drawn to scale, and for the purpose of clarity, some details are exaggerated and some details may be omitted. The shapes of the various regions and layers shown in the figures, as well as their relative sizes and positional relationships, are merely exemplary and may deviate in practice due to manufacturing tolerances or technical limitations. Those skilled in the art may design regions / layers with different shapes, sizes, and relative positions as needed.

[0034] In order to clearly describe the technical solutions of the embodiments of the present application, in the embodiments of the present application, words such as "first" and "second" are used to distinguish between identical or similar items with substantially the same functions and effects. For example, the first value and the second value are merely used to distinguish different values ​​and do not limit their order. Those skilled in the art will understand that words such as "first" and "second" do not limit the quantity and execution order, and words such as "first" and "second" do not necessarily limit different values.

[0035] It should be noted that, in this application, words such as "exemplary" or "for example" are used to indicate examples, illustrations, or descriptions. Any embodiment or design described in this application as "exemplary" or "for example" should not be construed as being preferred or advantageous over other embodiments or designs. Rather, the use of words such as "exemplary" or "for example" is intended to present the relevant concepts in a concrete manner.

[0036] In this application, "at least one" means one or more, and "more" means two or more. "And / or" describes the association relationship of associated objects, indicating that three relationships may exist. For example, A and / or B can mean: A exists alone, A and B exist at the same time, and B exists alone, where A and B can be singular or plural. The character " / " generally indicates that the previous and next associated objects are in an "or" relationship. "At least one of the following items" or similar expressions refers to any combination of these items, including any combination of single items or plural items. For example, at least one of a, b, or c can mean: a, b, c, ab, ac, bc, or abc, where a, b, c can be single or multiple.

[0037] In order to better understand the above technical solution, the above technical solution will be described in detail below in combination with specific implementation methods. It should be understood that the embodiments of the present disclosure and the specific features in the embodiments are detailed descriptions of the technical solution of the present application, rather than limitations on the technical solution of the present application. In the absence of conflict, the embodiments of the present application and the technical features in the embodiments can be combined with each other.

[0038] Surface roughness testing is a crucial aspect of steel performance testing. National standards stipulate that the surface of the steel sample must be cleaned of oil, dirt, and impurities before testing. Existing techniques typically use alcohol, acetone, and ultrasonic cleaning, followed by manual wiping.

[0039] With the application of automation and intelligence in inspection and testing, the biggest problem with the cleaning method used in the early stage is that the washed samples cannot be dried in time, affecting the next inspection rhythm and the stability of the inspection data.

[0040] In view of this, the present invention provides a method for preparing a test sample. Figure 1 , Figure 1 A flow chart of a method for preparing a test sample provided in an embodiment of the present application, the method comprising:

[0041] S101. Obtain a first tag of a target steel strip, and determine performance test items of the target steel strip and corresponding laser cleaning parameters based on product information of the target steel strip carried by the first tag;

[0042] S102. Provide a sample base material with the same product information as the target steel strip;

[0043] S103 . Based on the laser cleaning parameters, laser cleaning is performed on the sample substrate to obtain a test sample corresponding to the performance test item.

[0044] The test sample preparation method provided in the embodiments of the present application determines the performance test items and corresponding laser cleaning parameters of the target steel strip based on the product information of the target steel strip carried by the first label of the target steel strip. Based on the laser cleaning parameters, a sample substrate with the same product information as the target steel strip is laser cleaned to obtain a test sample corresponding to the performance test item. This eliminates the time required to dry the sample after liquid cleaning, thereby improving inspection efficiency. Furthermore, based on the product information of the target steel strip, the target steel strip is determined to have the required test items and corresponding laser cleaning parameters, and the sample is then cleaned according to the corresponding laser cleaning parameters to perform the corresponding test items.

[0045] In some optional embodiments, a detection area is provided on the surface of the sample substrate, and laser cleaning of the sample substrate is performed based on laser cleaning parameters, including:

[0046] The first step is to perform a first laser cleaning on the detection area of ​​the sample substrate based on the laser cleaning parameters;

[0047] The second step is to detect the cleanliness of the detection area. If the cleanliness detection result does not reach the preset threshold, the detection area of ​​the sample substrate is subjected to a second laser cleaning based on the laser cleaning parameters.

[0048] In this way, by testing the cleanliness after cleaning and cleaning again if the cleanliness does not meet expectations, it is ensured that the test area reaches the expected cleanliness, avoiding errors in the test results caused by unsatisfactory cleanliness.

[0049] In some optional embodiments, before laser cleaning the sample substrate based on the laser cleaning parameters, the method further includes:

[0050] Based on the product information of the target steel strip, the sample substrate is laser marked to form a second label on the sample substrate.

[0051] In this way, the laser cleaning device can obtain the product information of the target steel strip corresponding to the sample substrate by identifying the second tag, thereby determining the parameters for laser cleaning the sample substrate.

[0052] In some optional embodiments, after laser cleaning the sample substrate based on the laser cleaning parameters, the method further includes:

[0053] Based on the product information of the target steel strip, the sample substrate is laser marked to form a third label on the sample substrate.

[0054] In this way, by identifying the third tag, it is possible to obtain which laser parameters have been cleaned on the sample substrate, thereby facilitating subsequent execution of corresponding performance testing operations.

[0055] In some optional embodiments, determining the performance test items of the target steel strip and the laser cleaning parameters corresponding to the performance test items based on the product information of the target steel strip carried by the first tag includes:

[0056] Based on the preset first matching rule, target performance detection items that match the product information of the target strip are screened out from multiple candidate performance detection items, and target laser cleaning parameters that match the product information of the target strip and the target performance detection items are determined from multiple sets of candidate laser cleaning parameters.

[0057] Possible tests for target steel strips include chemical composition, mechanical properties, heat treatment properties, surface properties, roughness, and quality. Different strips may require different tests, taking into account factors such as product standards and specifications, operating environment and application, production process and quality control requirements, and customer needs.

[0058] This application is based on a preset first matching rule to determine the target performance test items and target laser cleaning parameters that match the product information of the target steel strip, which can ensure that the test items are closely related to the characteristics of the steel strip, thereby accurately reflecting the performance status of the steel strip. For example, for steel strips used in automobile manufacturing, according to their use, material, specifications and other product information, test items such as tensile strength and surface roughness are screened out, so as to accurately detect whether the steel strips meet the high standards required for automobile production. At the same time, determining the target laser cleaning parameters based on the product information of the target steel strip and the target performance test items can make the laser cleaning process more targeted. Different surface conditions and performance requirements of steel strips require different laser parameters to achieve the best cleaning effect, avoid damage to the surface of the steel strip due to improper cleaning, and affect the accuracy of subsequent detection. At the same time, it can also improve production efficiency, reduce costs, ensure the stability of product quality, and facilitate traceability and management.

[0059] In some optional implementations, the product information of the target steel strip includes the steel type, plate thickness, coating thickness, and coating type of the target steel strip.

[0060] In a second aspect, the present application provides a test sample preparation device, such as Figure 2 As shown, Figure 2 A wireframe diagram of a test sample preparation device provided in an embodiment of the present application, wherein the test sample preparation device 200 comprises: a laser cleaning device 201 and a control mechanism 202, wherein the control mechanism is electrically connected to the laser cleaning device and is configured to obtain a first label of a target steel strip, determine performance test items of the target steel strip and laser cleaning parameters corresponding to the performance test items based on the product information of the target steel strip carried on the first label; and control the laser cleaning device to perform laser cleaning on a sample substrate based on the laser cleaning parameters to obtain a test sample corresponding to the performance test item, wherein the sample substrate has the same product information as the target steel strip.

[0061] The test sample preparation device provided in the embodiment of the present application can be used to perform operations S101 to S103 provided in the above embodiment, automatically call corresponding cleaning parameters for samples of different specifications, and quickly clean oil and impurities on the sample surface, ensuring the automation of the entire performance testing process, eliminating the time required to dry the liquid cleaning sample, and improving inspection efficiency.

[0062] The following combination Figure 3 , introduces how to apply the preparation method of the test sample provided in the embodiment of the present application to realize laser cleaning of the sample for strip roughness inspection, and improve the efficiency of sample detection while ensuring the stability of sample performance detection.

[0063] Considering that traditional rough surface cleaning methods always leave a certain amount of cleaning fluid on the sample surface, which requires manual wiping, the current automated inspection process basically eliminates human intervention. Using this application solution, the parameters of the laser marking machine are adjusted according to the thickness of the sample, the thickness of the coating, and the type of coating, ensuring that the laser can clean the sample surface without damaging the substrate.

[0064] Laser cleaning equipment such as Figure 3 As shown, it includes a host computer 301 and a laser marking machine 302; the laser marking machine 302 includes a marking lens 303. When in use, the robot arm of the automated equipment automatically delivers the sample 304 to be cleaned to the bottom of the marking lens 303, scans the QR code on the surface of the sample 304 with a scanner, and identifies the steel type and thickness information of the sample 304. The host computer 301 calls the corresponding cleaning parameters of the marking machine from Table 1 based on the information of the sample 304 identified by the scanned code, controls the laser marking machine 302 to call the cleaning parameters of the corresponding specifications, and then realizes the rapid and efficient cleaning of oil stains and impurities on the surface of the sample 304.

[0065] Sample thickness Marking speed (mm / s) Marking power (%) 0.5 3000 20 1 3000 23 1.5 2800 25 2 2500 30 2.5 2800 35 3 2400 37 3.5 2000 37 4 1800 40

[0066] Table 1 Cleaning parameters of 30W marking machine for samples of different specifications

[0067] Thus, the method provided by the embodiment of the present application solves the problem that the sample surface cannot be automatically cleaned during the automatic inspection of the roughness sample. The cleaning parameters can be automatically switched according to the different sample specifications, ensuring that the sample substrate will not be damaged during the laser cleaning process.

[0068] An embodiment of the present application further provides a computer-readable storage medium, which stores a computer program. When the computer program is executed by a computer, the computer executes the method provided in the above embodiment.

[0069] The present application also provides an electronic device, such as Figure 4 As shown, the electronic device 400 includes a memory 401, a processor 402, and a computer program 403 stored in the memory 401 and executable on the processor 402. When the processor 402 executes the computer program 403, the electronic device 400 executes the method provided in the above embodiment.

[0070] An embodiment of the present application further provides a computer program product, including a computer program, which enables a computer to execute the method provided in the above embodiment when the computer program is executed.

[0071] Those skilled in the art will appreciate that all or part of the steps in the above-described method embodiments can be implemented using hardware associated with program instructions. The aforementioned program can be stored in a computer-readable storage medium. When executed, the program performs the steps of the above-described method embodiments. The aforementioned storage medium includes various media capable of storing program code, such as ROM, RAM, magnetic disks, or optical disks.

[0072] Finally, it should be noted that the above embodiments are only used to illustrate the technical solutions of the present application, rather than to limit them. Although the present application has been described in detail with reference to the aforementioned embodiments, those skilled in the art should understand that they can still modify the technical solutions described in the aforementioned embodiments, or replace some or all of the technical features therein with equivalents. However, these modifications or replacements do not cause the essence of the corresponding technical solutions to deviate from the scope of the technical solutions of the embodiments of the present application.

[0073] In the description provided herein, a large number of specific details are described. However, it is understood that the embodiments of the present application can be practiced without these specific details. In some instances, well-known methods, structures, and techniques are not shown in detail so as not to obscure the understanding of this description.

Claims

1. A method for preparing a test sample, characterized in that: include: Obtaining a first tag of a target steel strip, and determining, based on product information of the target steel strip carried by the first tag, performance test items of the target steel strip and laser cleaning parameters corresponding to the performance test items; Providing a sample base material having the same product information as the target steel strip; Based on the laser cleaning parameters, the sample substrate is laser cleaned to obtain a test sample corresponding to the performance test item.

2. The method for preparing a test sample according to claim 1, wherein: The surface of the sample substrate is provided with a detection area, and the laser cleaning of the sample substrate based on the laser cleaning parameters includes: performing a first laser cleaning on the detection area of ​​the sample substrate based on the laser cleaning parameters; The cleanliness of the detection area is detected. If the cleanliness detection result does not reach a preset threshold, a second laser cleaning is performed on the detection area of ​​the sample substrate based on the laser cleaning parameters.

3. The method for preparing a test sample according to claim 1, wherein: Before laser cleaning the sample substrate based on the laser cleaning parameters, the method further includes: Based on the product information of the target steel strip, the sample substrate is laser marked to form a second label on the sample substrate.

4. The method for preparing a test sample according to claim 1, wherein: After laser cleaning the sample substrate based on the laser cleaning parameters, the method further includes: Based on the product information of the target steel strip, the sample substrate is laser marked to form a third label on the sample substrate.

5. The method for preparing a test sample according to claim 1, wherein: The determining, based on the product information of the target steel strip carried by the first tag, performance test items of the target steel strip and laser cleaning parameters corresponding to the performance test items includes: Based on a preset first matching rule, a target performance detection item that matches the product information of the target strip is screened out from multiple candidate performance detection items, and a target laser cleaning parameter that matches the product information of the target strip and the target performance detection item is determined from multiple sets of candidate laser cleaning parameters.

6. The method for preparing a test sample according to claim 5, wherein: The product information of the target steel strip includes the steel type, plate thickness, coating thickness and coating type of the target steel strip.

7. The method for preparing a test sample according to claim 5 or 6, wherein: The multiple candidate performance testing items include roughness testing, mechanical property testing and quality testing.

8. A test sample preparation device, characterized in that: include: A laser cleaning device and a control mechanism, wherein the control mechanism is electrically connected to the laser cleaning device and is used to obtain a first label of a target steel strip, determine a performance test item of the target steel strip and a laser cleaning parameter corresponding to the performance test item based on the product information of the target steel strip carried by the first label; and control the laser cleaning device to perform laser cleaning on a sample substrate based on the laser cleaning parameters to obtain a test sample corresponding to the performance test item, wherein the sample substrate has the same product information as the target steel strip.

9. An electronic device comprising a memory, a processor, and a computer program stored in the memory and executable on the processor, wherein: When the processor executes the computer program, the electronic device is caused to perform the method according to any one of claims 1 to 6.

10. A computer-readable storage medium storing a computer program, characterized in that: When the computer program is executed by a processor, the computer is caused to perform the method according to any one of claims 1 to 6.

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