Rapid test equipment for semiconductor laser
By designing an automated semiconductor laser rapid testing device, automatic testing of the laser is achieved, solving the problem of low efficiency in manual plugging and unplugging of optical fibers, improving testing efficiency and reducing the labor intensity of operators.
Patent Information
- Application Number
- CN202510965582.5
- Authority / Receiving Office
- CN · China
- Patent Type
- Applications(China)
- Current Assignee / Owner
- Filing Date
- 2025-07-14
- Publication Date
- 2025-09-26
AI Technical Summary
During the existing semiconductor laser testing process, optical fibers need to be frequently plugged and unplugged manually, which is inefficient and labor-intensive for operators.
A semiconductor laser rapid testing equipment was designed, which adopted automated loading, unloading, test assembly and conveying assembly. The automatic testing of the laser was realized through the rotating conveying component. The equipment included the integration of indexing rotating component, rotating conveying component, test assembly and power supply component, and realized the automatic docking and testing of optical fibers.
It improves test efficiency, reduces the labor intensity of operators, and reduces the problems of optical fiber and laser compatibility caused by human factors.
Smart Images
Figure CN120702728A_ABST
Abstract
Description
Technical Field
[0001] The invention relates to the technical field of semiconductor laser testing, in particular to a semiconductor laser rapid testing device. Background Art
[0002] Semiconductor laser parameter testing generally requires a suitable optical fiber transmission system to complete the test. Specifically, the laser to be tested is connected to the tester via an FC fiber adapter. The laser is then inserted into the test socket and powered on before testing begins.
[0003] Currently, most testing processes use manual fiber optic insertion testing, which not only requires frequent manual insertion and removal of optical fibers, resulting in low efficiency, but also places high labor intensity on operators. Summary of the Invention
[0004] In response to the above problems, the present application provides a semiconductor laser rapid testing device that can replace manual labor to automatically test the laser, effectively improving testing efficiency and reducing labor intensity.
[0005] The technical solution adopted by the present invention to solve the technical problem is: A semiconductor laser rapid testing device comprises a workbench, wherein a conveying device is provided on the workbench; The conveying assembly includes an indexing rotating component and a rotating conveying component arranged on the indexing rotating component; The rotating conveying component includes a rotating disk, and a plurality of test seats are arranged on the rotating disk along the circumferential direction; The workbench is provided with a loading part, a unloading part and a testing part around the rotating disk; The loading part includes a loading robot, and the unloading part includes a unloading robot; The test assembly includes a test frame and a test component, and a driving member for driving the test component to move up and down is provided between the test component and the test frame; The test assembly includes, from bottom to top, an optical fiber adapter, a connector, and a tester, wherein the optical fiber adapter is installed with an optical fiber; On the workbench, a power supply component is provided directly below the test component. The power supply component includes two electrodes. When the test socket moves directly below the test component, the two pins of the test socket respectively contact the two electrodes of the power supply component.
[0006] Furthermore, the indexing rotation component includes a slewing support and a drive motor, and the power output shaft of the drive motor is connected to the outer ring of the slewing support through a transmission mechanism.
[0007] Furthermore, the rotating disk is provided with a first groove corresponding one-to-one to the test socket, and the bottom surface of the first groove is provided with a first avoidance hole for avoiding the pins of the test socket. The test socket is connected to the rotating disk through a clamping assembly.
[0008] Furthermore, the clamping assembly includes two clamping plates, one end of which is hinged to the rotating disk through a hinge shaft, and a locking mechanism is provided between the two clamping plates at the other end of the clamping plates. Under the locking action of the locking mechanism, the test seat is clamped and fixed between the two clamping plates.
[0009] Furthermore, a locking rod is provided on the splint, and a threaded structure is provided at the lower end of the locking rod. An arc-shaped groove is provided on the rotating disk. The lower end of the locking rod passes through the arc-shaped groove and extends to the lower side of the rotating disk. When the two splints are in a locked state, the two locking rods form a locking column in the shape of a stepped shaft, and a locking nut is provided on the locking column at the lower side of the rotating disk.
[0010] Furthermore, the upper end portion of the main body of the test seat is in a conical structure. When the two clamping plates are in a clamping state, the two clamping plates are clamped at the conical structure of the main body of the test seat.
[0011] Furthermore, the workbench is provided with a loading rack and an unloading rack with the same structure, the loading rack includes a support plate, a base plate and a first column, the support plate is provided with a second groove for accommodating the test seat, the bottom surface of the second groove is provided with a second avoidance hole for avoiding the pins of the test seat, the workbench is provided with a positioning protrusion, and the base plate is provided with a positioning groove matching the positioning protrusion.
[0012] Furthermore, an information code is provided on the laser, and a code scanner is provided on the test frame. When the laser is located directly below the test component, the information code of the laser is within the scanning and reading range of the code scanner.
[0013] Furthermore, the test frame includes a mounting plate, a second column is provided at one end of the mounting plate, a third column is provided at the other end of the mounting plate, the lower end of the third column is rotatably connected to the rotating disk through a bearing assembly, the connecting member includes a connecting plate, guide columns are provided at both ends of the connecting plate, the upper end of the guide column passes through the mounting plate and is connected to the lifting plate, a guide member matching the guide column is provided on the mounting plate, the fixed side of the driving member is provided on the mounting plate, and the movable side of the driving member passes through the mounting plate upward and is connected to the lifting plate.
[0014] Furthermore, the electrode includes an electrode seat, an electrode sheet is provided on the inner side of the electrode seat, the electrode sheet includes an elastic part with an arc-shaped structure, and plug-in parts are provided at both ends of the elastic part. A plug-in slot is provided on the electrode seat, and the plug-in part is inserted into the plug-in slot. In a free state, the minimum distance between the two electrode sheets is less than the pin spacing of the test seat.
[0015] The beneficial effects of the present invention are: The semiconductor laser rapid testing equipment provided in the embodiment of the present application realizes automatic testing of semiconductor lasers that require matching optical fibers through loading and unloading parts, testing parts, and conveying parts, replacing the traditional manual testing method. It not only effectively improves the testing efficiency and reduces the labor intensity of the operator, but also eliminates the compatibility problems between the optical fiber and the laser caused by human factors compared to the traditional manual testing method. BRIEF DESCRIPTION OF THE DRAWINGS
[0016] Figure 1 A schematic diagram of the three-dimensional structure of a semiconductor laser rapid testing device provided in an embodiment of the present application; Figure 2 for Figure 1 Schematic diagram of the enlarged structure of part A; Figure 3 for Figure 1 Schematic diagram of the enlarged structure of part B; Figure 4 Exploded views of the test assembly and delivery assembly; Figure 5 for Figure 4 Schematic diagram of the enlarged structure of part C; Figure 6 This is a schematic diagram of the installation structure of the indexing and rotating components; Figure 7 for Figure 6 Schematic diagram of the enlarged structure of part D; Figure 8 This is an exploded view of the electrode; Figure 9 Schematic diagram of the working principle of the electrode; Figure 10 It is a schematic diagram of the three-dimensional structure when the rotating conveying component is in an open state; Figure 11 Schematic diagram of the installation structure of the clamping assembly; Figure 12 Exploded view of the test assembly; Figure 13 Schematic diagram of the three-dimensional structure of the connecting piece; Figure 14Schematic diagram of the three-dimensional structure of the loading rack.
[0017] In the figure: 1, workbench; 11, positioning protrusion; 2. Conveyor assembly; 211. Slewing support; 212. Drive motor; 2131. Driving gear; 2132. Driven gear; 221. Rotating plate; 2211. First groove; 2212. First avoidance hole; 2213. Arc-shaped slide; 222. Test socket; 2221. Pin; 223. Clamping assembly; 2231. Clamping plate; 22311. Locking rod; 2232. Articulated shaft; 2233. Locking nut; 224. Connecting ring plate; 225. Fixing nut; 31. Loading manipulator; 32. Loading rack; 321. Support plate; 3211. Second groove; 3212. Second avoidance hole; 322. Bottom plate; 3221. Positioning groove; 323. First column; 41. Unloading robot; 42. Unloading rack; 5. Test assembly; 511. Mounting plate; 512. Second column; 513. Anchor plate; 514. Third column; 515. Thrust ball bearing; 52. Test assembly; 531. Fiber optic adapter; 532. Connector; 5321. Connecting plate; 5322. Light hole; 5323. First connecting tube; 5324. Second connecting tube; 533. Tester; 534. Fiber optic; 53. Driver; 54. Barcode scanner; 541. Bracket; 55. Guide column; 551. Guide member; 56. Lifting plate; 6. Electrode; 61. Electrode seat; 611. Seat plate; 612. Vertical plate; 6121. Connecting slot; 6122. Wire hole; 62. Electrode sheet; 621. Elastic portion; 622. Connecting portion; 623. Terminal block; 7. Laser; 71. Pin; 72. Light output hole. DETAILED DESCRIPTION
[0018] In order to enable those skilled in the art to better understand the technical solutions in this application, the technical solutions in the embodiments of this application will be described in detail below in conjunction with the drawings in the embodiments of this application. The described embodiments are only part of the embodiments of this application, not all of the embodiments. All other embodiments obtained by those skilled in the art without creative work based on the embodiments of this application should fall within the scope of protection of this application.
[0019] In order to facilitate the understanding of the specific implementation of this application, the coordinate system is defined as follows: Figure 1 As shown, the left-right direction is the horizontal direction, the front-back direction is the longitudinal direction, and the up-down direction is the vertical direction.
[0020] like Figure 1 、 Figure 3 、 Figure 4 and Figure 6 As shown, a semiconductor laser rapid testing device includes a workbench 1, on which a conveying device 2 is provided.
[0021] The conveying unit 2 includes a graduated rotating component and a rotating conveying component mounted on the graduated rotating component. The rotating conveying component includes a rotating disk 221, on which a plurality of detachable test holders 222 are evenly distributed along the circumference at the edge of the rotating disk 221. Driven by the graduated rotating component, the rotating disk 221 rotates at a predetermined angle along the circumference. After each rotation through a predetermined angle, the rotating disk 221 stops for a period of time. When the time the rotating disk 221 stops rotating reaches a preset value, the rotating disk 221 rotates again through a predetermined angle driven by the graduated rotating component, thereby achieving stepwise rotation of the rotating disk 221. The angle of each rotation of the rotating disk 221 is the same as the central angle corresponding to the line connecting the centers of two adjacent test holders 222.
[0022] As a specific embodiment, the rotating disk 221 in this embodiment has 12 test seats 222 evenly distributed along the circumference, and the rotating disk 221 rotates by an angle of 30 degrees each time. After each rotation by a certain angle, the rotation stops for 10 seconds.
[0023] The workbench 1 is provided with a loading part, a unloading part and a testing part 5 around the rotating disk 221 .
[0024] As a specific implementation method, according to Figure 1 In the coordinate system shown, the loading unit is located on the left side of the conveying unit 2 , the unloading unit is located on the right side of the conveying unit 2 , and the testing unit 5 is located at the rear side of the conveying unit 2 .
[0025] The loading unit includes a loading robot 31 , and the unloading unit includes a unloading robot 41 .
[0026] As a specific implementation, the working ends of the loading robot 31 and the unloading robot 41 in this embodiment are provided with a gripper cylinder. The gripper cylinder is a prior art and can be directly obtained by purchasing. Its specific structure will not be described in detail here.
[0027] The test assembly 5 includes a test frame and a test component 52. The test component 52 can move up and down relative to the test frame, and a driving member 53 for driving the test component 52 to move up and down is provided between the test component 52 and the test frame.
[0028] The test assembly 52 comprises, from bottom to top, an optical fiber 534 adapter, a connector 532, and a tester 533. The optical fiber 534 is mounted on the optical fiber 534 adapter. For example, the optical fiber 534 adapter is an FG optical fiber 534 adapter, and the tester 533 uses a standard photodiode power sensor. Both the FG optical fiber 534 adapter and the standard photodiode power sensor are currently available and can be directly purchased. Their internal structures will not be elaborated upon here.
[0029] On the workbench 1 , a power supply component is provided directly below the test assembly 52 , and the power supply component includes two electrodes 6 .
[0030] As the rotating disk 221 rotates at a predetermined angle, the test socket 222 passes directly beneath the test assembly 52 and stops there to perform the test. When the test socket 222 is directly beneath the test assembly 52, its two pins 2221 contact the two electrodes 6 of the power supply, thereby energizing the power supply.
[0031] During operation, the loading robot 31 inserts the pin 71 of the laser 7 to be tested into the socket of the test socket 222. The laser 7 to be tested then rotates circumferentially at a predetermined angle, driven by the indexing rotary component. When the laser 7 to be tested is directly below the test assembly 52, the two pins 2221 of the test socket 222 contact the two electrodes 6 of the power supply component, connecting the power supply. The test assembly 52 then moves downward, driven by the driver 53, allowing the optical fiber 534 to be inserted into the light exit hole 72 of the laser 7, completing the test of the laser 7. After the test is complete, the test assembly 52 moves upward and resets, driven by the driver 53. The tested laser 7 then continues to rotate circumferentially at a predetermined angle, driven by the indexing rotary component. When it reaches the unloading position, the unloading robot 41 removes the tested laser 7 from the test socket 222.
[0032] In actual operation, after each rotation of the turntable through a certain angle, the rotating disk 221 stops rotating for a period of time. During this period of stopping, the testing work, loading work and unloading work of the test assembly 52 are carried out simultaneously, thereby realizing continuous testing operation.
[0033] like Figure 4 and Figure 6As shown, the indexing rotating component includes a slewing support 211. The inner ring of the slewing support 211 is fixedly connected to the top plate of the workbench 1 via a first bolt, and the outer ring of the slewing support 211 is fixedly connected to the rotating disk 221 via a second bolt. A drive motor 212 is provided on the top plate of the workbench 1 below the top plate of the workbench 1. The power output shaft of the drive motor 212 passes through the top plate of the workbench 1 and extends to the top of the top plate of the workbench 1. It is then connected to the outer ring of the slewing support 211 via a transmission mechanism. When the drive motor 212 drives the outer ring of the slewing support 211 to rotate, the rotating disk 221 can rotate along with the outer ring of the slewing support 211.
[0034] As a specific embodiment, the transmission mechanism described in this embodiment employs a gear transmission. A driving gear 2131 is provided on the power output shaft of the drive motor 212, and a driven gear 2132 is provided on the outer ring of the slewing support 211 to mesh with the driving gear 2131. Alternatively, the outer surface of the outer ring of the slewing support 211 has a toothed structure that meshes with the driving gear 2131. During operation, the drive motor 212 rotates a certain number of times, thereby causing the outer ring of the slewing support 211 to rotate a certain angle. The drive motor 212 then stops for a period of time. When the period of inactivity reaches a preset value, the drive motor 212 drives the driving gear 2131 to rotate a certain number of times again.
[0035] As a specific implementation method, Figure 10 As shown, the rotating disk 221 of this embodiment is provided with a first groove 2211 corresponding one-to-one with the test socket 222. The bottom surface of the first groove 2211 is provided with a first avoidance hole 2212 for avoiding the pins 2221 of the test socket 222. The lower end of the test socket 222 is inserted into the first groove 2211, and the pins 2221 of the test socket 222 extend through the first avoidance hole 2212 to the bottom of the rotating disk 221, with the sockets of the pins 2221 of the test socket 222 facing upward.
[0036] As a specific implementation, the test socket 222 described in this embodiment adopts a 3-pin circular laser diode test socket 222, model FU-CSZ001-LV-YX.
[0037] Furthermore, the test seat 222 is fixedly connected to the rotating disk 221 via a clamping assembly 223 .
[0038] like Figure 5 、 Figure 10 and Figure 11As shown, the clamping assembly 223 includes two clamping plates 2231, one end of each clamping plate 2231 is hinged to the rotating disk 221 via a hinge shaft 2232, and the rotation axis of each clamping plate 2231 is perpendicular to the rotating disk 221. A locking mechanism is provided between the two clamping plates 2231 at the other end of each clamping plate 2231. Under the locking action of the locking mechanism, the test socket 222 is clamped and fixed between the two clamping plates 2231.
[0039] Furthermore, a clamping groove for accommodating the test socket 222 is provided on the inner side of the clamping plate 2231 (the side opposite to the two clamping plates 2231 is the inner side).
[0040] The two clamping plates 2231 can be hinged to the rotating disk 221 via different hinge shafts 2232, or can be hinged to the rotating disk 221 via the same hinge shaft 2232. As a specific embodiment, in this embodiment, the two clamping plates 2231 are hinged to the rotating disk 221 via the same hinge shaft 2232.
[0041] As a specific embodiment, the other end of the clamping plate 2231 in this embodiment is provided with a locking rod 22311 extending downwardly perpendicular to the clamping plate 2231. The locking rod 22311 has a semicircular cross-section, with the flat surface of the locking rod 22311 facing inward (with the side opposite the two clamping plates 2231 as the inward side), and a threaded structure is provided at the lower end of the curved surface of the locking rod 22311. The rotating disk 221 is provided with an arcuate slot 2213 for accommodating the locking rod 22311. The lower end of the locking rod 22311 extends through the arcuate slot 2213 to the underside of the rotating disk 221. When the two clamping plates 2231 are in a locked state, the two locking rods 22311 fit together to form a complete locking column with a circular cross-section. A locking nut 2233 is provided on the locking column at the lower side of the rotating disk 221. The threaded structure at the lower end of the arcuate surface forms a complete external thread that matches the locking nut 2233. Preferably, the locking nut 2233 is a butterfly nut.
[0042] Furthermore, when the two clamps 2231 are in a locked state, the locking column formed by the two locking rods 22311 is in the shape of a stepped shaft, which includes a first shaft segment and a second shaft segment from bottom to top, and the diameter of the first shaft segment is smaller than the diameter of the second shaft segment. The width of the arc-shaped groove 2213 is consistent with that of the first shaft segment, and the external thread matching the locking nut 2233 is located on the first shaft segment.
[0043] As a specific implementation, in this embodiment, the lower end of the hinge shaft 2232 is fixedly connected to the rotating disk 221 by welding.
[0044] Furthermore, the hinge shaft 2232 is a stepped shaft, comprising a third shaft section and a fourth shaft section from top to bottom, and the diameter of the third shaft section is smaller than the diameter of the fourth shaft section. A connecting ring plate 224 is provided above the rotating disk 221, and the connecting ring plate 224 is provided with through holes corresponding one to one with the hinge shaft 2232, and the diameter of the through holes is equal to that of the third shaft section. The upper end of the hinge shaft 2232 extends above the connecting ring plate 224 through the corresponding through holes. A fixing nut 225 is provided above the connecting ring plate 224 on the third shaft section, and the third shaft section is provided with an external thread that cooperates with the fixing nut 225.
[0045] By providing the connecting ring plate 224 , the plurality of hinge shafts 2232 can be connected into a whole, thereby increasing the overall structural rigidity.
[0046] Furthermore, the upper end of the main body of the test socket 222 has a tapered structure with a smaller diameter at the upper end and a larger diameter at the lower end. When the two clamping plates 2231 are in a clamped state, the two clamping plates 2231 clamp onto the tapered structure of the main body of the test socket 222. Preferably, the upper side of the clamping plates 2231 is flush with the upper side of the test socket 222.
[0047] In this way, when the locking nut 2233 is tightened, on the one hand, the two clamps 2231 can be clamped on the test seat 222 under the locking action of the locking nut 2233. On the other hand, in the process of tightening the locking nut 2233, the two clamps 2231 will move downward, thereby pressing the test seat 222 downward to achieve reliable fixation of the test seat 222.
[0048] Furthermore, the side surface of the clamping groove of the clamping plate 2231 is a tapered structure, and the side surface of the clamping groove is consistent with the tapered structure of the test seat 222 .
[0049] Further, if Figure 1 As shown, the workbench 1 is further provided with a loading rack 32 and a unloading rack 42 , the loading robot 31 is located between the loading rack 32 and the conveying part 2 , and the unloading robot 41 is located between the unloading rack 42 and the conveying part 2 .
[0050] The loading rack 32 and the unloading rack 42 have the same structure, and only the loading rack 32 is taken as an example to describe its specific structure in detail.
[0051] like Figure 2and Figure 14 As shown, the loading rack 32 includes, from top to bottom, a support plate 321 and a base plate 322. A first column 323 is provided between the support plate 321 and the base plate 322. The support plate 321 is fixedly connected to the upper end surface of the first column 323 by screws, and the base plate 322 is fixedly connected to the lower end surface of the first column 323 by screws. The support plate 321 is provided with a plurality of second grooves 3211 for accommodating the test socket 222. The bottom surface of the second groove 3211 is provided with second avoidance holes 3212 for avoiding the pins 2221 of the test socket 222. The lower end of the test socket 222 is inserted into the second groove 3211, and the pins 2221 of the test socket 222 extend through the second avoidance holes 3212 to the lower side of the support plate 321. The workbench 1 is provided with a positioning protrusion 11, and the bottom plate 322 is provided with a positioning groove 3221 that matches the positioning protrusion 11. When the loading rack 32 is placed on the workbench 1, the positioning protrusion 11 is inserted into the corresponding positioning groove 3221, thereby positioning the loading rack 32 and facilitating the grasping of the loading robot 31.
[0052] As a specific implementation, the second grooves 3211 described in this embodiment are arranged in a matrix, the support plate 321 and the base plate 322 are both square structures, four first columns 323 are arranged between the support plate 321 and the base plate 322, and the four first columns 323 are respectively located at the four corners.
[0053] Furthermore, the laser 7 is provided with an information code (not shown in the figure), which may be a barcode or a two-dimensional code, and includes attribute information such as the serial number of the laser 7. Figure 3 and Figure 4 As shown, the test frame is equipped with a barcode scanner 54. When the laser 7 is located directly below the test assembly 52, the information code of the laser 7 is within the scanning and reading range of the barcode scanner 54. During operation, while the test assembly 52 is testing the laser 7, the barcode scanner 54 reads the laser 7 serial number and other attribute information and uploads it to the controller. When the test assembly 52 is tested, the tester 533 uploads the test results to the controller and associates the test results with the attribute information of the laser 7 within the controller, ensuring accurate recording of the test results.
[0054] like Figure 4 、 Figure 12 and Figure 13As shown, the test frame includes a mounting plate 511, and one end of the mounting plate 511 is provided with a second column 512 for supporting the mounting plate 511. The mounting plate 511 is fixedly connected to the upper end surface of the second column 512 by screws, and a base plate 513 is fixedly provided on the lower end surface of the second column 512 by screws, and the base plate 513 is fixedly connected to the workbench 1 by screws. The connecting member 532 includes a connecting plate 5321, and the connecting plate 5321 is provided with a light hole 5322 that allows the optical fiber 534 to pass through. A first connecting cylinder 5323 coaxially arranged with the light hole 5322 is provided on the upper side surface of the connecting plate 5321, and the first connecting cylinder 5323 is fixedly connected to the tester 533 by a threaded connection. A second connecting tube 5324 is provided on the lower side of the connecting plate 5321, coaxially arranged with the light-through hole 5322. The second connecting tube 5324 is threadedly connected to the optical fiber 534 adapter. Guide posts 55 are provided at each end of the connecting plate 5321. The lower ends of the guide posts 55 are detachably fixed to the connecting plate 5321. The upper ends of the guide posts 55 extend through the mounting plate 511 to the upper side of the mounting plate 511, where they are detachably fixed to the lifting plate 56. The mounting plate 511 is provided with a guide member 551 that cooperates with the guide posts 55.
[0055] As a specific implementation, the guide member 551 described in this embodiment adopts a linear bearing.
[0056] The driving member 53 is a pneumatic cylinder, an oil cylinder, or an electric push rod. The fixed side of the driving member 53 is detachably fixed to the lower side of the mounting plate 511, and the movable side of the driving member 53 passes upward through the mounting plate 511 and is detachably fixed to the lifting plate 56.
[0057] As a specific implementation, the driving member 53 described in this embodiment adopts a cylinder.
[0058] As a specific embodiment, the mounting plate 511 in this embodiment is provided with two second columns 512 at one end, with a bracket 541 disposed between the two second columns 512. The bracket 541 comprises a web, with wings extending downwardly perpendicularly from the web at each end. The web and wings together form a U-shaped structure with an opening facing downward. The two wings are fixedly connected to the inner side of the second columns 512 (with the inner side being the side opposite the two second columns 512) via screws. The barcode scanner 54 is fixed to the web of the bracket 541 via screws.
[0059] Furthermore, a third column 514 extending downwardly and perpendicularly from the mounting plate 511 is provided at the other end of the mounting plate 511. The third column 514 is cylindrical and coaxial with the rotating disk 221. The lower end of the third column 514 is rotatably connected to the rotating disk 221 via a bearing assembly.
[0060] As a specific embodiment, the upper end of the third column 514 in this embodiment is provided with a flange plate, and the flange plate is fixedly connected to the mounting plate 511 by screws. The third column 514 includes a fifth shaft segment and a sixth shaft segment from top to bottom, and the diameter of the fifth shaft segment is larger than the diameter of the sixth shaft segment, and a step surface is formed between the fifth shaft segment and the sixth shaft segment. A seat hole is provided at the center of the rotating disk 221. The bearing assembly adopts a thrust ball bearing 515, the seat ring of the thrust ball bearing 515 is installed in the seat hole, and is fixedly connected to the rotating disk 221 by an interference fit, and the sixth shaft segment of the third column 514 is inserted into the shaft ring of the thrust ball bearing 515, and is fixedly connected to the shaft ring of the thrust ball bearing 515 by an interference fit.
[0061] In this way, it can ensure that both ends of the mounting plate 511 are supported, which can effectively improve the stability and reliability of the structure compared to the cantilever structure, while not affecting the rotation of the rotating disk 221.
[0062] like Figure 7 、 Figure 8 and Figure 9 As shown, the electrode 6 includes an electrode holder 61, which is made of an insulating material and is fixedly connected to the workbench 1 in a detachable manner. An electrode sheet 62 is provided on the inner side of the electrode holder 61 (the inner side is the side opposite the two electrodes 6). The electrode sheet 62 includes an elastic portion 621 with an arc-shaped structure. The two ends of the elastic portion 621 are respectively provided with a plug-in portion 622, and the plug-in portion 622 is parallel to the line connecting the two ends of the elastic portion 621. The electrode holder 61 is provided with a plug-in slot 6121, and the plug-in portion 622 of the electrode sheet 62 is inserted into the plug-in slot 6121. In the free state, the minimum distance M between the two electrode sheets 62 is less than the pitch N between the pins 2221 of the test socket 222. The pitch N between the pins 2221 of the test socket 222 refers to the maximum distance between the positive pin 2221 and the negative pin 2221 of the test socket 222.
[0063] The plug-in portion 622 may extend outward (ie, extend in a direction away from the elastic portion 621) or inward (ie, extend toward the middle of the elastic portion 621). As a specific embodiment, the two plug-in portions 622 in this embodiment extend inward.
[0064] During operation, in the free state, the elastic portion 621 of the electrode sheet 62 naturally arches, and the minimum distance M between the two electrode sheets 62 is less than the spacing N between the pins 2221 of the test socket 222. When the test socket 222, driven by the rotating disk 221, enters between the two electrodes 6, the electrode sheet 62 of the electrode 6 undergoes elastic deformation under the squeezing action of the pins 2221 of the test socket 222. That is, the elastic portion 621 of the electrode sheet 62 is squeezed toward the side of the electrode socket 61, and the degree of arching of the elastic portion 621 becomes smaller, becoming flatter than in the free state. At the same time, the two plug-in portions 622 move away from each other to accommodate the deformation of the elastic portion 621. In this way, reliable contact between the pins 2221 of the test socket 222 and the electrode sheet 62 can be ensured, ensuring good power supply contact.
[0065] As a specific embodiment, the electrode holder 61 described in this embodiment includes a base plate 611, which is fixedly connected to the workbench 1 via screws. The base plate 611 is provided with a vertical plate 612 extending upward perpendicularly from the base plate 611. The base plate 611 and the vertical plate 612 together form an L-shaped structure. The upper end of the vertical plate 612 is provided with a plug-in slot 6121, which extends through the vertical plate 612 along the length direction of the vertical plate 612 and extends upward through the vertical plate 612. In this way, the mounting plate 511 of the electrode sheet 62 can be easily installed.
[0066] Furthermore, a wiring board 623 is provided on the lower side of the elastic portion 621 of the electrode plate 6, and a wire hole 6122 is provided on the vertical plate 612 of the electrode seat 61 to allow the wire to pass through.
[0067] Other embodiments obtained by those skilled in the art by combining, splitting, reorganizing, etc. the embodiments provided in this application do not exceed the scope of protection of this application.
[0068] The above specific implementation methods provide a detailed description of the purpose, technical solutions and beneficial effects of the embodiments of the present application. The above is only a specific implementation method of the embodiments of the present application and is not intended to limit the scope of protection of the embodiments of the present application. That is, any modifications, equivalent replacements, improvements, etc. made on the basis of the embodiments of the present application should be included in the scope of protection of the embodiments of the present application.
Claims
1. A semiconductor laser rapid testing device, characterized in that: It comprises a workbench (1), wherein a conveying device (2) is provided on the workbench (1); The conveying device (2) includes a graduated rotating component and a rotating conveying component arranged on the graduated rotating component; The rotating conveying component comprises a rotating disk (221), and a plurality of test seats (222) are arranged on the rotating disk (221) along the circumferential direction; The workbench (1) is provided with a loading part, a unloading part and a testing part (5) around the rotating disk (221); The loading assembly includes a loading robot (31), and the unloading assembly includes a unloading robot (41); The test assembly (5) includes a test frame and a test component (52), and a driving member (53) for driving the test component (52) to move up and down is provided between the test component (52) and the test frame; The test assembly (52) includes, from bottom to top, an optical fiber (534) adapter, a connector (532), and a tester (533), wherein the optical fiber (534) is mounted on the optical fiber (534); A power supply component is provided on the workbench (1) directly below the test assembly (52), and the power supply component includes two electrodes (6). When the test seat (222) moves directly below the test assembly (52), the two pins (2221) of the test seat (222) respectively contact the two electrodes (6) of the power supply component.
2. The semiconductor laser rapid testing device according to claim 1, characterized in that: The indexing rotation component comprises a slewing support (211) and a driving motor (212), and a power output shaft of the driving motor (212) is connected to the outer ring of the slewing support (211) via a transmission mechanism.
3. The semiconductor laser rapid testing device according to claim 1, characterized in that: The rotating disk (221) is provided with a first groove (2211) corresponding to the test seat (222) one by one, and a first avoidance hole (2212) for avoiding the pin (2221) of the test seat (222) is provided on the bottom surface of the first groove (2211). The test seat (222) is connected to the rotating disk (221) via a clamping assembly (223).
4. The semiconductor laser rapid testing device according to claim 3, characterized in that: The clamping assembly (223) includes two clamping plates (2231), one end of the clamping plate (2231) is hinged to the rotating disk (221) through a hinge shaft (2232), and a locking mechanism is provided between the two clamping plates (2231) at the other end of the clamping plate (2231). Under the locking action of the locking mechanism, the test seat (222) is clamped and fixed between the two clamping plates (2231).
5. The semiconductor laser rapid testing device according to claim 4, characterized in that: The clamping plate (2231) is provided with a locking rod (22311), and the lower end of the locking rod (22311) is provided with a threaded structure. The rotating disk (221) is provided with an arc-shaped sliding groove (2213). The lower end of the locking rod (22311) passes through the arc-shaped sliding groove (2213) and extends to the lower side of the rotating disk (221). When the two clamping plates (2231) are in a locked state, the two locking rods (22311) form a locking column in the shape of a stepped shaft. A locking nut (2233) is provided on the locking column at the lower side of the rotating disk (221).
6. The semiconductor laser rapid testing device according to claim 5, characterized in that: The upper end portion of the main body of the test seat (222) is in a conical structure, and when the two clamping plates (2231) are in a clamping state, the two clamping plates (2231) are clamped at the conical structure of the main body of the test seat (222).
7. The semiconductor laser rapid testing device according to claim 1, characterized in that: The workbench (1) is provided with a loading rack (32) and a unloading rack (42) having the same structure. The loading rack (32) includes a supporting plate (321), a bottom plate (322) and a first column (323). The supporting plate (321) is provided with a second groove (3211) for accommodating the test seat (222). The bottom surface of the second groove (3211) is provided with a second avoidance hole (3212) for avoiding the pin (2221) of the test seat (222). The workbench (1) is provided with a positioning protrusion (11), and the bottom plate (322) is provided with a positioning groove (3221) that matches the positioning protrusion (11).
8. The semiconductor laser rapid testing device according to claim 1, characterized in that: The laser (7) is provided with an information code, and the test frame is provided with a code scanner (54). When the laser (7) is located directly below the test assembly (52), the information code of the laser (7) is within the scanning and reading range of the code scanner (54).
9. The semiconductor laser rapid testing device according to claim 1, characterized in that: The test frame includes a mounting plate (511), one end of which is provided with a second column (512), and the other end of which is provided with a third column (514), the lower end of which is rotatably connected to the rotating disk (221) through a bearing assembly, the connecting member (532) includes a connecting plate (5321), both ends of which are provided with guide columns (55), the upper end of which passes through the mounting plate (511) and is connected to the lifting plate (56), the mounting plate (511) is provided with a guide member (551) that matches the guide column (55), the fixed side of the driving member (53) is provided on the mounting plate (511), and the movable side of the driving member (53) passes through the mounting plate (511) upward and is connected to the lifting plate (56).
10. The semiconductor laser rapid testing device according to claim 1, characterized in that: The electrode (6) includes an electrode base (61), an electrode sheet (62) is provided on the inner side of the electrode base (61), the electrode sheet (62) includes an elastic portion (621) with an arc-shaped structure, and plug-in portions (622) are provided at both ends of the elastic portion (621). A plug-in slot (6121) is provided on the electrode base (61), and the plug-in portion (622) is inserted into the plug-in slot (6121). In a free state, the minimum distance between the two electrode sheets (62) is less than the spacing between the pins (2221) of the test base (222).