Testing device and circuit board production line

Abstract

The invention belongs to the field of circuit board testing, and particularly relates to a testing device and a circuit board production line. The testing device is provided with a feeding station and a testing station located above the feeding station, the testing device comprises a conveying structure used for conveying materials, a driving structure used for driving the conveying structure and a testing structure arranged on the testing station, and the driving structure is used for driving the conveying structure to move between the feeding station and the testing station in a reciprocating mode. The testing structure comprises a box body with a containing cavity, a carrier which is connected to the box body in a sliding mode and used for bearing materials and a testing assembly arranged in the containing cavity, the box body is provided with an opening communicated with the containing cavity, and the carrier enters and exits the containing cavity through the opening; the conveying structure receives the materials at the feeding station and moves the materials to the testing station; the carrier receives the materials from the conveying structure and conveys the materials into the containing cavity, and the testing assembly detects the materials. The testing accuracy can be improved, and the occupied space of the testing device can be reduced.

Description

Technical Field

[0001] The present invention belongs to the field of circuit board testing, and in particular relates to a testing device and a circuit board production line. Background Art

[0002] In the electronics manufacturing industry, circuit boards (PCBs) are core components whose performance and reliability directly determine the quality of end products. Therefore, PCBs undergo multiple performance tests during the production process. PCB test lines typically utilize multiple test stations operating in parallel to improve testing efficiency.

[0003] Currently, common circuit board testing methods include bed-of-nails testing, flying probe testing, and functional testing. These testing methods usually require the circuit board to be fixed in a test fixture and connected to the test equipment through probes or connectors. However, existing test equipment often has the following limitations during the loading and testing process: insufficient control of the test environment, circuit board testing is more sensitive to temperature, humidity, and electromagnetic interference, but the existing open test stations lack effective environmental isolation measures; the existing loading and testing processes are all arranged in sequence along the long strip assembly line through a variety of single-function mechanisms to achieve a series of operations such as loading, testing, and unloading of circuit boards. This results in a large number of mechanisms, difficulty in installation and maintenance, and occupies a large amount of space, which is not conducive to the optimized layout of the production line, and has low automation and integration. Summary of the Invention

[0004] The purpose of the embodiments of the present application is to provide a testing device and a circuit board production line, aiming to solve the problems of how to improve the accuracy of the test and how to reduce the space occupied by the testing device.

[0005] To achieve the above objectives, the technical solution adopted in this application is: In a first aspect, a testing device is provided, which is provided with a loading station and a testing station located above the loading station, the testing device includes a conveying structure for conveying materials, a driving structure for driving the conveying structure, and a testing structure provided at the testing station, the driving structure is used to drive the conveying structure to move back and forth between the loading station and the testing station, the testing structure includes a box body with a accommodating cavity, a carrier slidably connected to the box body and used to carry the material, and a testing component provided in the accommodating cavity, the box body is provided with an opening connected to the accommodating cavity, and the carrier enters and exits the accommodating cavity through the opening; the conveying structure receives the material at the loading station and moves the material to the testing station; the carrier receives the material at the conveying structure and transfers the material to the accommodating cavity, and the testing component detects the material.

[0006] In some embodiments, the conveying structure has a material transfer area, the carrier has an avoiding slot for the conveying structure to pass through, the material transfer area corresponds to the carrier when the carrier slides to the outside of the box, the driving structure drives the conveying structure to ascend and at least partially pass through the carrier to make the conveying surface of the material transfer area above the carrier, the material on the conveying structure is conveyed to the material transfer area, and the driving structure drives the conveying structure to descend to release the material in the material transfer area to the carrier.

[0007] In some embodiments, the conveying structure comprises a first conveying line and a second conveying line arranged in sequence along a first direction, the material transfer area is arranged on the second conveying line, the first conveying line is used to receive the material from the feeding station, and the second conveying line is used to receive the material from the first conveying line, the first conveying line and the carrier are vertically staggered.

[0008] In some embodiments, the conveying structure further comprises a third conveying line arranged on a side of the second conveying line away from the first conveying line, the third conveying line and the carrier are vertically staggered, the carrier drives the tested material to move to the outside of the box, the driving structure drives the conveying structure to ascend to make the second conveying line pass through the avoiding slot and lift the material to be separated from the carrier, the second conveying line conveys the material to the third conveying line, and the third conveying line is used to unload the material.

[0009] In some embodiments, the testing device further comprises a rack, the conveying structure is vertically arranged in the rack, the testing device further comprises an unloading station, the feeding station and the unloading station are arranged on opposite sides of the rack along the first direction, and the driving structure is further used to drive the conveying structure to move to the unloading station, and the third conveying line unloads the material at the unloading station.

[0010] In some embodiments, the second conveying line has a plurality of material transfer areas arranged at intervals along the first direction, the second conveying line is used to drive the material to move to any of the material transfer areas, a plurality of testing structures are arranged at intervals along the first direction, and each of the material transfer areas vertically corresponds to each of the testing structures.

[0011] In some embodiments, a plurality of testing stations are arranged at intervals along the vertical direction, a plurality of testing structures are arranged, each of the testing structures is arranged on each of the testing stations, and the driving structure is used to drive the conveying structure to move to any of the testing stations.

[0012] In some embodiments, the conveying structure includes a support plate slidingly arranged in a vertical direction, a first wire body arranged on the support plate, and a second wire body arranged on the support plate and spaced apart from the first wire body along a second direction. The first wire body and the second wire body both extend along the first direction, and the first wire body and the second wire body are respectively used to support the opposite ends of the material, and the second direction is set at an angle to the first direction.

[0013] In some embodiments, the conveying structure also includes a first frame connected to the support plate and a second frame connected to the support plate and spaced apart from the first frame along the second direction. The first frame and the second frame are used to support the first wire body and the second wire body, respectively. The second frame is slidably arranged relative to the first frame along the second direction to adjust the distance between the first wire body and the second wire body.

[0014] In a second aspect, a circuit board production line is provided, which includes the testing device of the above solution. The beneficial effects of the present application are: when the testing device of the present application is in use, the driving structure drives the conveying structure to move to the loading station to receive the material, and drives the conveying structure to move to the testing station after the conveying structure receives the material, the carrier slides to the outside of the accommodating chamber and receives the material at the conveying structure, and transfers the material to the accommodating chamber, and the test component in the accommodating chamber tests the material. The accommodating chamber provides a stable and isolated testing environment for the material, effectively shielding external electromagnetic interference, reducing the impact of temperature and humidity fluctuations on the test results, and improving the accuracy of the test; and by arranging the loading station and the testing station in the vertical space, the testing device is compactly installed in the vertical space, reducing the space occupied by the feeding device. BRIEF DESCRIPTION OF THE DRAWINGS

[0015] In order to more clearly illustrate the technical solutions in the embodiments of the present application, the following briefly introduces the drawings required for use in the embodiments or exemplary technical descriptions. Obviously, the drawings described below are only some embodiments of the present application. For ordinary technicians in this field, other drawings can be obtained based on these drawings without any creative work.

[0016] Figure 1 This is a schematic diagram of the structure of a testing device provided in one embodiment of the present application; Figure 2 This is a schematic diagram of the structure of a test structure provided in one embodiment of the present application; Figure 3 This is a partial structural diagram of the testing device provided in an embodiment of the present application; Figure 4 It is a structural schematic diagram of the conveying structure provided in an embodiment of the present application; Figure 5 is a structural schematic diagram of a test device provided by another embodiment of the present application; Figure 6 is a structural schematic diagram of a test structure provided by another embodiment of the present application.

[0017] In the drawings, various reference numbers refer to: 10, rack; 11, bottom plate; 12, guide structure; 121, guide column; 122, bearing; 20, driving structure; 21, lifting driving piece; 22, driving wheel; 23, driven wheel; 24, synchronous belt; 25, transmission shaft; 26, shaft coupling; 30, conveying structure; 310, first conveying line; 320, second conveying line; 321, material moving area; 330, third conveying line; 31, first line body; 32, second line body; 33, support plate; 34, first rack body; 35, second rack body; 361, driver; 362, screw rod; 363, nut seat; 37, slide rail; 38, mounting rack; 40, test structure; 41, box body; 411, accommodating cavity; 412, opening; 42, carrier; 421, avoiding slot; 422, sliding frame; 423, carrier plate; 43, test assembly; 431, probe plate; 432, jacking mechanism; 50, code scanning structure; 200, material; 300, feeding station; 400, discharging station; 500, test station. DETAILED DESCRIPTION

[0018] In order to make the objectives, technical solutions and advantages of the embodiments of the present application clearer, the technical solutions in the embodiments of the present application will be described clearly and completely below with reference to the drawings in the embodiments of the present application. Obviously, the described embodiments are only some of the embodiments of the present application, but not all the embodiments of the present application. Based on the embodiments in the present application, all other embodiments obtained by those of ordinary skill in the art without creative work fall within the scope of protection of the present application. Therefore, the following detailed description of the embodiments of the present application provided in the drawings is not intended to limit the scope of the claimed present application, but only represents selected embodiments of the present application. Based on the embodiments in the present application, all other embodiments obtained by those of ordinary skill in the art without creative work fall within the scope of protection of the present application.

[0019] In the description of the present application, it needs to be understood that the terms "center", "longitudinal", "transverse", "length", "width", "thickness", "upper", "lower", "front", "rear", "left", "right", "vertical", "horizontal", "top", "bottom", "inner", "outer", "clockwise", "counterclockwise" and the like indicate the orientation or positional relationship based on the orientation or positional relationship shown in the drawings, which are only for the convenience of describing the present application and simplifying the description, and do not indicate or imply that the devices or elements referred to must have a particular orientation, be constructed and operated in a particular orientation, and therefore cannot be understood as limiting the present application.

[0020] In addition, the terms "first", "second" are only for descriptive purposes and cannot be understood as indicating or implying relative importance or implicitly indicating the number of the technical features indicated. Therefore, the features defined with "first", "second" can explicitly or implicitly include one or more of the features. In the description of the present application, the meaning of "multiple" is two or more, unless otherwise explicitly specified and limited.

[0021] In the present application, unless otherwise explicitly specified and limited, the "upper" or "lower" of the first feature to the second feature can include that the first and second features are in direct contact, or that the first and second features are not in direct contact but are in contact through another feature between them. Moreover, the "above", "over" and "on" of the first feature to the second feature includes that the first feature is directly above and obliquely above the second feature, or only indicates that the horizontal height of the first feature is higher than that of the second feature. The "below", "under" and "under" of the first feature to the second feature includes that the first feature is directly below and obliquely below the second feature, or only indicates that the horizontal height of the first feature is less than that of the second feature.

[0022] Please refer to Figures 1 to 6 The embodiment of the present application provides a test device, which is provided with a feeding station 300 and a test station 500 located above the feeding station 300. The test device comprises a conveying structure 30 for conveying materials 200, a driving structure 20 for driving the conveying structure 30 to move reciprocally between the feeding station 300 and the test station 500, and a test structure 40 arranged in the test station 500. The test structure 40 comprises a box body 41 provided with a containing cavity 411, a carrier 42 slidingly connected to the box body 41 and used for carrying the materials 200, and a test assembly 43 arranged in the containing cavity 411. The box body 41 is provided with an opening 412 communicating with the containing cavity 411, and the carrier 42 enters and exits the containing cavity 411 through the opening 412. The conveying structure 30 receives the materials 200 at the feeding station 300 and moves the materials 200 to the test station 500. The carrier 42 receives the materials 200 from the conveying structure 30 and conveys the materials 200 into the containing cavity 411, and the test assembly 43 detects the materials 200.

[0023] It should be noted that the material 200 provided in the embodiment of the present application is a circuit board, and the conveying structure 30 is arranged to slide in the vertical direction. The carrier 42 is slidably connected to the box body 41. Optionally, the sliding direction of the carrier 42 is horizontal, that is, the sliding direction of the carrier 42 is perpendicular to the moving direction of the conveying structure 30. It can be understood that the linear motion in the two directions is independent of each other, the vertical motion is responsible for the height switching of different workstations, and the horizontal sliding is responsible for the carrier 42 entering and exiting the test box body 41. The orthogonality of the two directions fully utilizes the three-dimensional space, reduces mechanical interference, and the overall structure of the equipment is more compact and occupies a small area. It is particularly suitable for deployment in production lines with limited space.

[0024] In an embodiment of the present application, the loading station 300 is used to load the material 200 to be tested onto the conveying structure 30. The loading station 300 can be docked with a transfer cart or a robot, etc. After the material 200 is loaded onto the conveying structure 30, it can move along the conveying direction of the conveying structure 30 and can be moved to any position on the conveying structure 30.

[0025] When the testing device of the present application is in use, the driving structure 20 drives the conveying structure 30 to move to the loading station 300 to receive the material 200, and drives the conveying structure 30 to move to the testing station 500 after the conveying structure 30 receives the material. The carrier 42 slides to the outside of the accommodating chamber 411 and receives the material 200 at the conveying structure 30, and transfers the material 200 to the accommodating chamber 411. The test component 43 in the accommodating chamber 411 tests the material 200. The accommodating chamber 411 provides a stable and isolated testing environment for the material 200, effectively shielding external electromagnetic interference, reducing the impact of temperature and humidity fluctuations on the test results, and improving the accuracy of the test; and by arranging the loading station 300 and the testing station 500 in the vertical space, the testing device is compactly installed in the vertical space, reducing the space occupied by the feeding device.

[0026] It can be understood that the embodiment of the present application also includes a control system (not shown in the figure), and the conveying structure 30, the driving structure 20 and the testing structure 40 are all communicatively connected to the control system. The control system can control the automatic coordination and operation of the conveying structure 30, the driving structure 20 and the testing structure 40. The entire process is automatically coordinated and operated by the conveying structure 30, the driving structure 20 and the testing structure 40, and the degree of automation is greatly improved, which reduces manual operation and greatly improves the loading and testing efficiency.

[0027] In some embodiments, as Figure 2 and Figure 6As shown, the test assembly 43 includes a probe plate 431 and a jacking mechanism 432, the probe plate 431 is always located above the carrier 42, the carrier 42 includes a sliding frame 422 connected to the box 41 in a sliding manner and a loading plate 423 placed on the top surface of the sliding frame 422, the sliding frame 422 supports the loading plate 423, and the loading plate 423 is used to carry the material 200. The jacking mechanism 432 is located below the probe plate 431, the probe plate 431 is provided with test probes on the side facing the jacking mechanism 432, the sliding frame 422 can drive the loading plate 423 to slide between the probe plate 431 and the jacking mechanism 432, the middle of the sliding frame 422 is a hollow structure, and the jacking mechanism 432 can pass through the hollow structure to contact and jack up the loading plate 423, so that the material 200 can move towards the probe plate 431 and be connected with the test probes on the probe plate 431, thereby detecting the material 200. Optionally, the jacking mechanism 432 is a jacking cylinder.

[0028] In the embodiment of the application, through the integrated conveying structure 30, driving structure 20 and test structure 40, the full-process automation of the circuit board from feeding, conveying to testing is realized. The driving structure 20 precisely controls the lifting of the conveying structure 30, so that the circuit board quickly reciprocates between the feeding station 300 and the test station 500 without manual intervention, the single test cycle is shortened, and it is especially suitable for large-batch continuous production scenes.

[0029] In some embodiments, as Figures 1 to 3 As shown, the conveying structure 30 has a material moving area 321, and the carrier 42 has an avoiding groove 421 for the conveying structure 30 to pass through, the material moving area 321 corresponds to the carrier 42 when the carrier 42 slides to the outside of the box 41, the driving structure 20 drives the conveying structure 30 to rise and at least partially pass through the carrier 42, so that the conveying surface of the material moving area 321 is located above the carrier 42, the material 200 on the conveying structure 30 is conveyed to the material moving area 321, and the driving structure 20 drives the conveying structure 30 to descend, so that the material 200 in the material moving area 321 is released on the carrier 42.

[0030] It can be understood that the conveying structure 30 can be a belt line or a roller line, which has the material moving area 321 and other areas separated from the material moving area 321, and the other areas can be used for the external structure to load the material 200 to the conveying structure 30 or unload the material 200 to the external structure, and the other areas of the conveying structure 30 do not correspond to the carrier 42. When the carrier 42 is located outside the box 41, since the material moving area 321 corresponds to the carrier 42 in the vertical direction, when the driving structure 20 drives the conveying structure 30 to rise, the conveying structure 30 at least partially passes through the carrier 42, so that the conveying surface of the material moving area 321 is located above the carrier 42, that is, the conveying surface of the material moving area 321 is located above the carrying surface of the carrier 42 at this time. At this time, the conveying of the material 200 on the conveying structure 30 can be normally carried out, and the material 200 in the other areas of the conveying structure 30 can be transferred to the material moving area 321, and the conveying surface of the material moving area 321 is located above the carrier 42, so that the material 200 in the material moving area 321 is located above the carrier 42 at this time, and when the driving structure 20 drives the conveying structure 30 to descend, the conveying structure 30 passes through the avoidance groove 421 again, and the material 200 is limited by its own size and does not pass through the avoidance groove 421, but is supported by the carrying surface of the carrier 42, so as to realize the release of the material 200 on the carrier 42.

[0031] In the embodiment of the application, the material moving area 321 of the conveying structure 30 and the avoidance groove 421 on the carrier 42 cooperate with each other to realize the automatic transfer process of the material 200 from the conveying structure 30 to the carrier 42 without direct contact, and finally the material 200 is stably released on the carrier 42, and there is no risk of grabbing, pushing or falling of a mechanical hand in the whole process, which effectively prevents scratching of the surface of the precision circuit board or collision damage of components; and the avoidance groove 421 provides a precise guide space for the rising of the conveying structure 30, ensures that the conveying surface of the material moving area 321 can accurately pass through the carrier 42 and rise to a predetermined height, keeps the relative position of the material 200 and the carrier 42 consistent, eliminates the secondary positioning error, and the high-precision release position ensures that the circuit board is placed at the same position of the carrier 42 each time, which is crucial for the accurate docking of the test probe or interface, and directly improves the reliability and repeatability of the test. In addition, the embodiment of the application does not need additional transfer mechanism or manual intervention, significantly shortens the single loading time, uses the vertical space for the transfer of the material 200, avoids adding a transfer mechanism in the horizontal direction, makes the equipment layout more compact, and reduces the floor area of the whole test device.

[0032] In some embodiments, the conveying structure 30 includes a first conveyor line 310 and a second conveyor line 320 arranged in sequence along a first direction, a material transfer area 321 is provided on the second conveyor line 320, the first conveyor line 310 is used to receive the material 200 from the loading station 300, and the second conveyor line 320 is used to receive the material 200 from the first conveyor line 310, and the first conveyor line 310 and the carrier 42 are staggered with each other in the vertical direction. It can be understood that the first conveyor line 310 and the second conveyor line 320 are docked, but there is an avoidance space between the first conveyor line 310 and the second conveyor line 320. The avoidance space allows the second conveyor line 320 to avoid the carrier 42 when passing through the avoidance groove 421, thereby avoiding interference with the carrier 42, such as collision with the carrier 42, etc., thereby improving the reliability and safety of the equipment operation.

[0033] By setting up the first conveyor line 310 and the second conveyor line 320, a more refined functional division and space utilization are achieved. The first conveyor line 310 is responsible for continuously receiving materials 200 from the loading station 300, while the second conveyor line 320 is responsible for accurate transfer at the testing station 500, which facilitates local maintenance and rapid replacement, reduces the downtime of the entire machine, and improves the maintainability and availability of the equipment.

[0034] In some embodiments, as Figures 1 to 3 As shown, the conveying structure 30 also includes a third conveying line 330 provided on the side of the second conveying line 320 away from the first conveying line 310. The third conveying line 330 and the carrier 42 are staggered in the vertical direction. The carrier 42 drives the tested material 200 to move to the outside of the box 41. The driving structure 20 drives the conveying structure 30 to rise, so that the second conveying line 320 passes through the avoidance groove 421 and lifts the material 200 to be separated from the carrier 42. The second conveying line 320 conveys the material 200 to the third conveying line 330, and the third conveying line 330 is used to unload the material 200. It can be understood that the first conveying line 310, the second conveying line 320 and the third conveying line 330 are connected in sequence, but there is also an avoidance space between the third conveying line 330 and the second conveying line 320. This avoidance space allows the carrier 42 to avoid the second conveying line 320 when it passes through the avoidance groove 421, thereby improving the reliability and safety of the equipment operation.

[0035] In the embodiment of the present application, material 200 is loaded from the first conveyor line 310, transferred and tested via the second conveyor line 320, and finally unloaded from the third conveyor line 330. The entire process requires no human intervention, achieving fully automated operation, significantly reducing labor costs and avoiding human error. Furthermore, the presence of the third conveyor line 330 ensures the unidirectional and continuous flow of material 200. After testing, material 200 is immediately removed, freeing up space for the carrier 42 to quickly return to the box 41 for the next test. This ensures a compact and smooth production rhythm and avoids production interruptions caused by material unloading blockages.

[0036] In the embodiment of the present application, after the material 200 is tested, the carrier 42 moves to the outside of the accommodating chamber 411 through the opening 412. At this time, the carrier 42 carries the tested material 200, and the material 200 is located directly above the second conveyor line 320. At this time, the driving structure 20 drives the conveying structure 30 to rise, and the second conveyor line 320 passes through the avoidance groove 421, and lifts the material 200 accordingly, so that the material 200 is separated from the carrying surface of the carrier 42, thereby realizing the transfer of the material 200 from the carrier 42 to the second conveyor line 320. The material 200 is separated from the carrier 42 by the rising and lifting of the second conveyor line 320, and then conveyed to the third conveyor line 330. This non-contact, non-clamping transfer method provides the best protection for the finished circuit boards that have completed the test, especially the qualified products, and completely avoids the scratches, falls or stress damage that may be caused by the robot grasping or pushing mechanism.

[0037] Furthermore, the third conveyor line 330 and the first conveyor line 310 are located on either side of the second conveyor line 320 and are vertically staggered relative to the carrier 42, forming a symmetrical and compact layout. Material 200 enters from one side and exits from the other, creating a clear and direct flow path. This avoids complex rotation or U-turn mechanisms, reduces equipment footprint, and makes the overall motion logic more concise and reliable.

[0038] It should be noted that when the material 200 is being tested, the conveying structure 30 can first move to the loading station 300, and the first conveyor line 310 is loaded, that is, at this time, the first conveyor line 310 has the material 200 to be tested. After the test of the material 200 is completed, the carrier 42 moves to the outside of the accommodating cavity 411 through the opening 412, and the second conveyor line 320 passes through the avoidance groove 421 and lifts the material 200 off the bearing surface of the carrier 42. At this time, the first conveyor line 310 and the third conveyor line 330 are also located above the carrier 42. After the second conveyor line 320 transfers the tested material 200 to the third conveyor line 330, the first conveyor line 310 can immediately transfer another material 200 to be tested above it to the second conveyor line 320, and then the driving structure 20 drives the first conveyor line 310, the second conveyor line 320 and the third conveyor line 330 to descend, thereby dropping the material 200 on the second conveyor line 320 onto the carrier 42. Therefore, in one lifting stroke of the conveying structure 30 , the unloading of the tested material 200 is completed, and the next material 200 to be tested can be loaded, further improving the testing efficiency.

[0039] Specifically, the first conveyor line 310, the second conveyor line 320 and the third conveyor line 330 of the embodiment of the present application can all be belt transmission structures. The belt transmission structure includes a driving pulley structure, a driven pulley structure and an annular belt tensioned on the two pulleys. Due to the tensioning, a compressive force is generated at the contact part between the belt and the pulley. When the driving pulley structure is running, it relies on friction to drive the belt, and the belt drives the driven pulley structure to operate. Because the belt transmission relies on friction to work, it can effectively alleviate the impact of the load and run smoothly and noiselessly.

[0040] In some embodiments, as Figure 3 and Figure 4 As shown, the feeding device also includes a code scanning structure 50 provided on the first conveyor line 310. The code scanning structure 50 is used to scan the material 200 located on the first conveyor line 310 to read the information of the material 200. It is understandable that the material 200 may have an identification code such as a one-dimensional code, a barcode, a serial number, etc., which is used to reflect the relevant information of the material 200. The code scanning structure 50 is used to scan and identify the identification code to obtain the information of the material 200, facilitating subsequent testing of the material 200. Optionally, a mounting bracket 38 is provided on the support plate 33, and the code scanning structure 50 is mounted on the mounting bracket 38, thereby stabilizing the state of the code scanning structure 50. Optionally, the code scanning structure 50 is a code scanner.

[0041] In some embodiments, the testing device also includes a frame 10, and the conveying structure 30 is slidably arranged on the frame 10 along the vertical direction. The testing device also includes a unloading station 400, and the unloading station 400 and the loading station 300 are arranged on opposite sides of the frame 10 along the first direction; the driving structure 20 is also used to drive the conveying structure 30 to move to the unloading station 400, and the third conveyor line 330 unloads the material 200 at the unloading station 400. The frame 10 is respectively provided with a loading station 300 and an unloading station 400 on opposite sides along the first direction. The conveying structure 30 is always located between the loading station 300 and the unloading station 400 during the vertical sliding process. The material 200 enters from one side of the frame 10 and leaves from the opposite side, forming a continuous, unidirectional, non-crossing linear material 200 flow. This streamlined design avoids the material 200 from rotating, turning around or waiting in the equipment, greatly optimizes the production rhythm, eliminates process bottlenecks, and when the third conveyor line 330 is unloading at the unloading station 400, the first conveyor line 310 can simultaneously perform loading operations at the loading station 300. This parallel mode makes the loading and unloading time highly overlap with the testing time, further reducing the production cycle.

[0042] In some embodiments, as Figure 3 and Figure 5 As shown, the second conveyor line 320 has multiple material transfer areas 321 spaced apart along the first direction. The second conveyor line 320 is used to drive the material 200 to move to any material transfer area 321. Multiple test structures 40 are spaced apart along the first direction, and each material transfer area 321 corresponds to each test structure 40 in a one-to-one vertical direction. By providing multiple test structures 40, the spatial layout within the test station 500 can be optimized, the test density can be increased, and it is easy to integrate into the production line. In addition, each test structure 40 has a corresponding material transfer area 321, which can effectively reduce positioning errors and improve test accuracy.

[0043] In some embodiments, as Figure 5 As shown, multiple test stations 500 are arranged at intervals along the vertical direction, multiple test structures 40 are provided, and each test structure 40 is respectively provided at each test station 500. The drive structure 20 is used to drive the conveying structure 30 to move to any test station 500. By adopting the conveying structure 30 that slides along the vertical direction, the conveying structure 30 can dock with each test station 500 arranged along the vertical direction. While improving the test density, it is no longer necessary to configure a separate horizontal conveying mechanism for each layer of test stations 500. This greatly simplifies the structure of the test device and reduces the space occupied by the test device.

[0044] It can be understood that in the embodiment of the present application, multiple test structures 40 are arranged at intervals along the vertical direction, and multiple test structures 40 are also arranged at intervals along the first direction, that is, multiple test structures 40 form an array, which further achieves an increase in test density and facilitates integration in the production line.

[0045] In some embodiments, as Figure 4 As shown, the conveying structure 30 includes a support plate 33 slidingly arranged in the vertical direction, a first wire body 31 arranged on the support plate 33, and a second wire body 32 arranged on the support plate 33 and spaced apart from the first wire body 31 along the second direction. The first wire body 31 and the second wire body 32 both extend along the first direction, and the first wire body 31 and the second wire body 32 are respectively used to support the opposite ends of the material 200, and the second direction is set at an angle to the first direction.

[0046] The first and second wires 31, 32 are spaced apart along the second direction and support opposite ends of the circuit board, respectively. Thus, the first and second wires 31, 32 form a stable two-point support structure. This design ensures that long or thin circuit boards are uniformly stressed during horizontal transport and vertical lifting, effectively preventing bending, warping, or even breakage of the circuit boards caused by single-point support or mid-hanging. Optionally, the second direction is perpendicular to the first direction.

[0047] In some embodiments, the conveying structure 30 also includes a first frame 34 connected to the support plate 33 and a second frame 35 connected to the support plate 33 and spaced apart from the first frame 34 along the second direction. The first frame 34 and the second frame 35 are respectively used to support the first wire body 31 and the second wire body 32. The second frame 35 is slidably arranged relative to the first frame 34 along the second direction to adjust the distance between the first wire body 31 and the second wire body 32.

[0048] By sliding the second frame 35 relative to the first frame along the second direction, the distance between the first frame 34 and the second frame 35 can be adjusted, and then the spacing between the first wire body 31 and the second wire body 32 can be adjusted. Since the first wire body 31 and the second wire body 32 are both used to support the material 200, adjusting the spacing between the first wire body 31 and the second wire body 32 can make the conveying structure 30 adapt to materials 200 of different sizes, and can be adjusted according to materials 200 of different types or sizes. Therefore, the same set of feeding devices can quickly adapt to materials 200 of various specifications by replacing support plates 33 of different widths or adjusting the installation positions of the first wire body 31 and the second wire body 32, which greatly enhances the flexibility and application range of the equipment and reduces the cost of additional equipment investment due to product changes.

[0049] Optionally, a slide rail 37 is provided on the support plate 33, and the second frame 35 can be slidably connected to the slide rail 37, so that the second frame 35 can slide relative to the first frame 34 along the second direction, thereby improving the sliding efficiency and the smoothness of the sliding.

[0050] In some embodiments, as Figure 4 As shown, the conveying structure 30 also includes a sliding drive component for driving the second frame 35 to slide, and the sliding drive component includes a driver 361 connected to the first frame 34, a screw rod 362 connected to the rotation output end of the driver 361, and a nut seat 363 sleeved on the screw rod 362 and threadedly connected to the screw rod 362. The second frame 35 is connected to the nut seat 363, the screw rod 362 extends along the second direction, and the driver 361 drives the screw rod 362 to rotate to drive the nut seat 363 and the second frame 35 to slide along the second direction.

[0051] It is understood that by driving the screw 362 to rotate, the screw's rotational motion is converted into linear motion of the nut seat 363, and the second frame 35 and the second linear body 32 move synchronously with the nut seat 363. The coordinated drive of the screw 362 and the nut seat 363 can achieve very high precision and reduce energy loss when transmitting force, thereby achieving higher transmission efficiency. In addition, the screw 362 and the nut have a compact structure, smooth transmission, and good stability. Whether operating at high speed or low speed, stable transmission performance can be maintained. Optionally, the driver 361 is a stepper motor.

[0052] Of course, in other possible implementations, the sliding drive member may also be an electric slide or electric guide rail, etc. Optionally, two sliding drives are arranged at intervals along the first direction, and the two sliding drives are connected to both ends of the second frame 35 respectively.

[0053] In some embodiments, as Figure 3 As shown, the drive structure 20 includes a synchronous belt 24, a driving wheel 22 rotatably connected to the frame 10, a driven wheel 23 rotatably connected to the frame 10, and a lifting drive member 21 for driving the driving wheel 22 to rotate. The driving wheel 22 and the driven wheel 23 are arranged in the vertical direction. The driving wheel 22 and the driven wheel 23 are respectively located at the two ends of the synchronous belt 24, and the support plate 33 is connected to the synchronous belt 24. The lifting drive member 21 accurately controls the rotation angle of the driving wheel 22, which can be directly and linearly converted into precise vertical displacement of the synchronous belt 24 and the conveying structure 30 connected thereto. This driving method has high positioning accuracy and small repeat positioning error, which can ensure that the conveying structure 30 can be quickly and accurately aligned with each layer of the test station 500. Optionally, the lifting drive member 21 is a servo motor.

[0054] Optionally, two synchronous belts 24, driving pulleys 22, and driven pulleys 23 are arranged at intervals along the first direction, and the ends of the support plate 33 are respectively connected to the two synchronous belts 24. Furthermore, each of the two driving pulleys 22 is connected to a transmission shaft 25, and both transmission shafts 25 extend along the first direction. The two transmission shafts 25 are connected by a coupling 26. The lifting drive member 21 can drive one of the transmission shafts 25 to rotate, thereby simultaneously driving the two driving pulleys 22 to rotate.

[0055] In some embodiments, the frame 10 includes a base plate 11 and a guide structure 12 connected to the base plate 11. The guide structure 12 is used to guide the support plate 33 to move in the vertical direction. Multiple guide structures 12 are arranged at circumferential intervals along the base plate 11; the guide structure 12 includes a guide column 121 connected to the base plate 11 and extending in the vertical direction, and a bearing 122 slidably connected to the guide column 121. The support plate 33 is connected to each bearing 122.

[0056] The coordinated arrangement of guide posts 121 and bearings 122 provides a highly precise guide path for the lifting and lowering motion of support plate 33, ensuring that conveying structure 30 can only move in a strictly vertical direction. Furthermore, multiple guide structures 12 are arranged at intervals along the circumference of base plate 11, ensuring that the conveying structure 30 and the material 200 it carries are evenly stressed during the lifting process. This effectively reduces the potential for deflection or rotation caused by a single guide point, ensuring smooth operation.

[0057] The present invention also proposes a circuit board production line, which includes a testing device. The specific structure of the testing device refers to the above-mentioned embodiment. Since this circuit board production line adopts all the technical solutions of all the above-mentioned embodiments, it also has all the beneficial effects brought by the technical solutions of the above-mentioned embodiments, which will not be repeated here.

[0058] To sum up, when the testing device of the present application is in use, the driving structure 20 drives the conveying structure 30 to move to the loading station 300 to receive the material 200, and drives the conveying structure 30 to move to the testing station 500 after the conveying structure 30 receives the material, and the carrier 42 slides to the outside of the accommodating chamber 411 and receives the material 200 at the conveying structure 30, and transfers the material 200 to the accommodating chamber 411, and the test component 43 in the accommodating chamber 411 tests the material 200. The accommodating chamber 411 provides a stable and isolated testing environment for the material 200, effectively shielding external electromagnetic interference, reducing the impact of temperature and humidity fluctuations on the test results, and improving the accuracy of the test; and by arranging the loading station 300 and the testing station 500 in the vertical space, the testing device is compactly installed in the vertical space, reducing the space occupied by the feeding device.

[0059] The above are merely optional embodiments of the present application and are not intended to limit the present application. For those skilled in the art, the present application may have various modifications and variations. Any modifications, equivalent substitutions, improvements, etc. made within the spirit and principles of the present application should be included within the scope of the claims of the present application.

Claims

1. A testing device comprising a loading station (300) and a testing station (500) located above the loading station (300), characterized in that: The testing device comprises a conveying structure (30) for conveying a material (200), a driving structure (20) for driving the conveying structure (30), and a testing structure (40) provided at the testing station (500), wherein the driving structure (20) is used to drive the conveying structure (30) to move back and forth between the loading station (300) and the testing station (500), and the testing structure (40) comprises a box (41) having a receiving cavity (411), a carrier (42) slidably connected to the box (41) and used to carry the material (200), and a testing structure (40) provided in the receiving cavity (411). The test assembly (43) is provided with an opening (412) communicating with the accommodating chamber (411), and the carrier (42) enters and exits the accommodating chamber (411) through the opening (412); the conveying structure (30) receives the material (200) at the loading station (300) and moves the material (200) to the testing station (500); the carrier (42) receives the material (200) at the conveying structure (30) and transfers the material (200) to the accommodating chamber (411), and the test assembly (43) detects the material (200).

2. The testing device according to claim 1, wherein: The conveying structure (30) has a material transfer area (321), and the carrier (42) has an avoidance groove (421) for the conveying structure (30) to pass through. When the carrier (42) slides to the outside of the box (41), the material transfer area (321) corresponds to the carrier (42), and the driving structure (20) drives the conveying structure (30) to rise and at least partially pass through the carrier (42), so that the conveying surface of the material transfer area (321) is located above the carrier (42), and the material (200) on the conveying structure (30) is conveyed to the material transfer area (321), and the driving structure (20) drives the conveying structure (30) to descend, so that the material (200) in the material transfer area (321) is released to the carrier (42).

3. The testing device according to claim 2, wherein: The conveying structure (30) includes a first conveying line (310) and a second conveying line (320) arranged in sequence along a first direction, the material transfer area (321) is arranged on the second conveying line (320), the first conveying line (310) is used to receive the material (200) from the loading station (300), and the second conveying line (320) is used to receive the material (200) from the first conveying line (310), and the first conveying line (310) and the carrier (42) are staggered with each other in the vertical direction.

4. The testing device according to claim 3, wherein: The conveying structure (30) further comprises a third conveying line (330) provided on the side of the second conveying line (320) away from the first conveying line (310), and the third conveying line (330) and the carrier (42) are staggered with each other in the vertical direction; the carrier (42) drives the material (200) that has completed the test to move to the outside of the box (41), and the driving structure (20) drives the conveying structure (30) to rise, so that the second conveying line (320) passes through the avoidance groove (421) and lifts the material (200) to be separated from the carrier (42), and the second conveying line (320) conveys the material (200) to the third conveying line (330), and the third conveying line (330) is used to unload the material (200).

5. The testing device according to claim 4, wherein: The testing device further comprises a frame (10), the conveying structure (30) is slidably arranged on the frame (10) along a vertical direction, and the testing device further comprises a material unloading station (400), the material unloading station (400) and the material loading station (300) are arranged on opposite sides of the frame (10) along the first direction; the driving structure (20) is further used to drive the conveying structure (30) to move to the material unloading station (400), and the third conveying line (330) unloads the material (200) at the material unloading station (400).

6. The testing device according to claim 3, wherein: The second conveying line (320) has a plurality of material transfer areas (321) arranged at intervals along the first direction. The second conveying line (320) is used to drive the material (200) to move to any of the material transfer areas (321). A plurality of the test structures (40) are arranged at intervals along the first direction, and each of the material transfer areas (321) corresponds to each of the test structures (40) in a one-to-one manner along the vertical direction.

7. The testing device according to any one of claims 1 to 6, characterized in that: A plurality of the test stations (500) are arranged at intervals in the vertical direction, a plurality of the test structures (40) are provided, and each of the test structures (40) is respectively provided at each of the test stations (500), and the drive structure (20) is used to drive the conveying structure (30) to move to any of the test stations (500).

8. The testing device according to any one of claims 1 to 6, characterized in that: The conveying structure (30) includes a support plate (33) slidingly arranged in a vertical direction, a first wire body (31) arranged on the support plate (33), and a second wire body (32) arranged on the support plate (33) and spaced apart from the first wire body (31) in a second direction. The first wire body (31) and the second wire body (32) both extend in a first direction. The first wire body (31) and the second wire body (32) are respectively used to support opposite ends of the material (200), and the second direction is set at an angle to the first direction.

9. The testing device according to claim 8, wherein: The conveying structure (30) further includes a first frame (34) connected to the support plate (33) and a second frame (35) connected to the support plate (33) and spaced apart from the first frame (34) along the second direction. The first frame (34) and the second frame (35) are respectively used to support the first wire body (31) and the second wire body (32). The second frame (35) is slidably arranged relative to the first frame (34) along the second direction to adjust the spacing between the first wire body (31) and the second wire body (32).

10. A circuit board production line, characterized by: The test device comprises the test device according to any one of claims 1 to 9.

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