Equipment control method and device, storage medium and program product

Abstract

The invention relates to an equipment control method and device, a storage medium and a program product, and belongs to the technical field of intelligent manufacturing. Controlling a production object to display the limit sample image; equipment is adjusted until the similarity between the limit sample image and a target image is larger than a similarity threshold value, and the target image is an image acquired by the equipment on a screen of the production object. According to the scheme, point inspection repair is performed based on the limit sample image without manually selecting a real object, so that higher efficiency and speed are achieved.

Description

Technical Field

[0001] This disclosure relates to the field of intelligent manufacturing technology, and in particular to control methods, devices, storage media and program products for equipment. Background Technology

[0002] In smart manufacturing scenarios, AOI (Automated Optical Inspection) technology can be used to inspect products, thereby improving production quality. For example, an AOI system can be used to inspect products and identify defective ones. However, in some scenarios, the AOI system may experience a decrease in detection accuracy, requiring optimization. In such cases, the optimization process can be time-consuming and labor-intensive. Summary of the Invention

[0003] To overcome the problems existing in the related technologies, this disclosure provides a control method, apparatus, storage medium and program product for a device.

[0004] According to a first aspect of the present disclosure, a method for controlling a device is provided, comprising: Obtain the limit sample image; The control device displays the limit sample image; The device is adjusted until the similarity between the limit sample image and the target image is greater than a similarity threshold, wherein the target image is the image captured by the device from the screen of the production object.

[0005] Optionally, adjusting the device includes: Adjust the parameters of the device; The current target image is obtained by acquiring images of the production object through the adjusted equipment; Calculate the similarity between the current target image and the limit sample image displayed by the production object.

[0006] Optionally, the parameters of the device can be adjusted in one or more of the following ways: Adjust the camera height of the device; Adjust the accuracy of the colorimeter in the device; Adjust the brightness of the light source of the device; Adjust the camera parameters of the device.

[0007] Optionally, the control of the production object to display the limit sample image includes: Acquire the data collected by the acquisition device from the equipment; If the data is determined to be abnormal based on a reference value, the device is controlled to enter an inspection state. When the equipment is in inspection mode, the control device displays the limit sample image.

[0008] Optionally, acquiring the limit sample image includes: Determine the screen information of the production object; Determine the type of screen display defect; The limit sample image is generated based on the screen information and the type of screen display defect.

[0009] Optionally, the type of screen display defect includes dot and line display defect types, and generating the limit sample image based on the screen information and the type of screen display defect includes: The first image range is determined based on the screen information; Draw dotted and line-type defects within the first image range to obtain a first limit sample image, wherein the limit sample image includes the first limit sample image.

[0010] Optionally, the type of screen display defect includes one or more of the following: speckle-type display defect, Mura-type display defect, and color unevenness display defect. Generating the limit sample image based on the screen information and the type of screen display defect includes: The range of the second image is determined based on the screen information; Based on the type of screen display defect, one or more of the following are drawn in the second image range: spot-type display defects, Mura-type display defects, and color unevenness display defects, to obtain a second limit sample image, which includes the second limit sample image.

[0011] According to a second aspect of the present disclosure, a control device for an apparatus is provided, comprising: The first module is configured to acquire a limit sample image; The second module is configured to control the display of the limit sample image on the production object; The third module is configured to adjust the device until the similarity between the limit sample image and the target image is greater than a similarity threshold, wherein the target image is an image captured by the device from the screen of the production object.

[0012] Optionally, the third module includes: The first submodule is configured to adjust the parameters of the device; The second submodule is configured to acquire images of the production object through the adjusted equipment to obtain the current target image; The third submodule is configured to calculate the similarity between the current target image and the limit sample image displayed by the production object.

[0013] Optionally, the first submodule is configured to adjust the parameters of the device in one or more of the following ways: Adjust the camera height of the device; Adjust the accuracy of the colorimeter in the device; Adjust the brightness of the light source of the device; Adjust the camera parameters of the device.

[0014] Optionally, the second module includes: The fourth submodule is configured to acquire data collected by the acquisition device from the device. The fifth submodule is configured to control the device to enter an inspection state when the data is determined to be abnormal based on a reference value of the data. The sixth submodule is configured to control the production object to display the limit sample image when the equipment is in an inspection state.

[0015] Optionally, the first module includes: The seventh submodule is configured to determine the screen information of the production object; The eighth submodule is configured to determine the type of screen display defect; The ninth submodule is configured to generate the limit sample image based on the screen information and the type of the screen display defect.

[0016] Optionally, the types of screen display defects include dot and line display defects, and the ninth submodule is configured as follows: The first image range is determined based on the screen information; Draw dotted or line-type defects within the first image range to obtain a first limit sample image, wherein the limit sample image includes the first limit sample image.

[0017] Optionally, the screen display defect type includes one or more of the following: spot-type display defect type, Mura-type display defect type, and color unevenness display defect type. The ninth submodule is configured to: The range of the second image is determined based on the screen information; Based on the type of screen display defect, one or more of the following are drawn in the second image range: spot-type display defects, Mura-type display defects, and color unevenness display defects, to obtain a second limit sample image, which includes the second limit sample image.

[0018] According to a third aspect of the present disclosure, a control device for an apparatus is provided, comprising: processor; Memory used to store processor-executable instructions; The processor is configured to perform the method described in any one of the first aspects.

[0019] According to a fourth aspect of the present disclosure, a computer-readable storage medium is provided having a computer program stored thereon that, when executed by a processor, implements the method described in any one of the first aspects.

[0020] According to a fifth aspect of the present disclosure, a computer program product is provided, including a computer program that, when executed by a processor, implements the method described in any one of the first aspects.

[0021] Using the above scheme, a limit sample image can be acquired, and the production object can be controlled to display the limit sample image. Thus, the similarity between the target image and the limit sample image can be determined based on the target image captured by the device on the screen of the production object. The device can then be adjusted until the similarity between the limit sample image and the target image exceeds a similarity threshold. When the similarity between the limit sample image and the target image exceeds the similarity threshold, the accuracy of the device is high. Therefore, the above scheme can effectively perform point-by-point inspection and repair of the device's accuracy. Furthermore, since the above scheme performs point-by-point inspection and repair based on the limit sample image, it eliminates the need for manual selection of physical objects, thus offering higher efficiency and speed.

[0022] It should be understood that the above general description and the following detailed description are exemplary and explanatory only, and are not intended to limit this disclosure. Attached Figure Description

[0023] The accompanying drawings, which are incorporated in and form a part of this specification, illustrate embodiments consistent with this disclosure and, together with the description, serve to explain the principles of this disclosure.

[0024] Figure 1 This is a flowchart illustrating an equipment inspection according to an exemplary embodiment.

[0025] Figure 2 This is a flowchart illustrating a control method for a device according to an exemplary embodiment.

[0026] Figure 3 This is a flowchart illustrating an implementation of step S21 according to an exemplary embodiment.

[0027] Figure 4 This is a schematic diagram illustrating the generation of a limit sample image according to an exemplary embodiment.

[0028] Figure 5 This is a schematic diagram illustrating a second limit sample image according to an exemplary embodiment.

[0029] Figure 6 This is a schematic diagram illustrating an equipment inspection system according to an exemplary embodiment.

[0030] Figure 7 This is a block diagram illustrating a control device for an apparatus according to an exemplary embodiment.

[0031] Figure 8 This is a block diagram illustrating an apparatus for device control according to an exemplary embodiment. Detailed Implementation

[0032] Exemplary embodiments will now be described in detail, examples of which are illustrated in the accompanying drawings. When the following description relates to the drawings, unless otherwise indicated, the same numerals in different drawings denote the same or similar elements. The embodiments described in the following exemplary embodiments do not represent all embodiments consistent with this disclosure. Rather, they are merely examples of apparatuses and methods consistent with some aspects of this disclosure as detailed in the appended claims.

[0033] The embodiments described in the following examples of this disclosure are not representative of all embodiments consistent with this disclosure. Rather, they are merely examples of apparatuses and methods consistent with some aspects of this disclosure as detailed in the appended claims.

[0034] Before introducing the control method, apparatus, storage medium and program product of the device disclosed herein, the relevant scenarios of the embodiments of the present disclosure will be introduced first.

[0035] In smart manufacturing scenarios, AOI (Action Inspection) technology can be used to inspect products, thereby improving production quality. For example, an AOI system can be used to identify defective products. It should be noted that after prolonged use, AOI systems may experience fluctuations in test values ​​and a decrease in accuracy. In such cases, the equipment within the AOI system can be inspected and repaired.

[0036] Figure 1 This is a flowchart illustrating an exemplary embodiment of the present disclosure, with reference to... Figure 1 The equipment can be inspected and repaired through the following process.

[0037] In step S11, defective screens are manually selected as gold-plated machines.

[0038] It should be noted that screens may have various defects, so multiple screens with defects can be manually selected as gold-plated machines.

[0039] In step S12, the equipment is manually operated, the inspection process is switched, and the tools are turned on for inspection.

[0040] In step S13, after obtaining the inspection results, the inspection results are manually reviewed.

[0041] The inspection results may include, for example, production objects with screen defects identified and intercepted by the equipment. After obtaining the inspection results, it can be manually verified whether the equipment has identified all production objects with screen defects.

[0042] In step S14, the equipment error is manually corrected, and the inspection is performed again.

[0043] For example, if the equipment fails to identify all production objects with screen defects during manual verification, the equipment can be manually adjusted and the inspection repeated. For instance, steps S13 and S14 can be repeated until the equipment meets the set conditions (such as identifying all production objects with screen defects).

[0044] In step S15, the inspection is completed.

[0045] The above solution enables equipment inspection and repair. However, it requires manual selection and labeling of various metal detectors, manual operation of the equipment for inspection, manual verification of inspection results, and manual adjustment of the equipment. The entire process is labor-intensive and time-consuming. Furthermore, the solution uses the screen of a physical object as a limited sample, but each screen may have multiple defects, and manual labeling may result in missed defects. In addition, the training and debugging level of the AOI equipment in the above solution depends on the skill of manual inspection, and the stability and consistency of different devices cannot be guaranteed.

[0046] Therefore, this disclosure provides a method for controlling a device. The method can be applied to devices, such as those in the AOI system described above. The method can also be applied to other devices that are independently configured relative to the described device. Figure 2 This is a flowchart illustrating a control method for a device according to an exemplary embodiment of this disclosure, with reference to... Figure 2 The method includes: In step S21, a limit sample image is obtained.

[0047] In step S22, the control of the production object displays a limit sample image.

[0048] In step S23, the device is adjusted until the similarity between the sample image and the target image is greater than the similarity threshold. The target image is the image captured by the device on the screen of the production object.

[0049] The following provides an exemplary description of steps S21 to S23.

[0050] Figure 3 This is a flowchart illustrating an implementation of step S21 as shown in an exemplary embodiment of this disclosure, with reference to... Figure 3 The acquisition of the limit sample image includes: In step S211, the screen information of the production object is determined.

[0051] For example, the production object can be various terminals, such as mobile phones, tablets, wearable devices, etc. The screen information of the production object can include the screen size, resolution, etc.

[0052] In step S212, the type of screen display defect is determined.

[0053] For example, in one implementation, the types of screen display defects include dotted line display defect types.

[0054] In one embodiment, the types of screen display defects include speckle-type display defects.

[0055] In one implementation, the screen display defect type includes the Mura-type display defect type.

[0056] In one embodiment, the types of screen display defects include color unevenness display defects.

[0057] In one embodiment, the type of screen display defect may also include one or more of the following: dotted line display defect type, speckled display defect type, Mura type display defect type, and uneven color display defect type.

[0058] In step S213, a limit sample image is generated based on the screen information and the type of screen display defect.

[0059] As an example, the type of screen display defect may include dotted line display defect types, and the step of generating a limit sample image based on screen information and the type of screen display defect includes: The first image range is determined based on the screen information; Draw dotted or line-type defects within the first image range to obtain a first limit sample image, wherein the limit sample image includes the first limit sample image.

[0060] For example, a first image range can be determined based on the screen size and resolution, and OpenCV's dot and line module can be used to draw within the first image range, thereby forming a first limit image with dot and line defects.

[0061] In one embodiment, the screen display defect type includes one or more of the following: speckle-type display defect type, Mura-type display defect type, and color unevenness display defect type. The step of generating a limit sample image based on screen information and the type of screen display defect includes: The range of the second image is determined based on the screen information; Based on the type of screen display defect, one or more of the following are drawn in the second image range: spot-type display defects, Mura-type display defects, and color unevenness display defects, to obtain a second limit sample image, which includes the second limit sample image.

[0062] For example, the second image range can be determined based on the screen's size and resolution. (Refer to...) Figure 4 The diagram illustrates the generation of a limit sample image. When generating the limit sample image, points can be randomly generated cyclically within the second image area to form a dot matrix 401, thereby simulating actual spots, mura, or color unevenness defects. Furthermore, since the transition between normal and defect areas is relatively smooth in spot-type, mura-type, and color unevenness defects, a Gaussian probability density function can be used to further smooth the transition between defect and normal areas. This allows for the simulation of more accurate spot-type, mura-type, and color unevenness defects, resulting in the second limit sample image. It should be noted that these rendering operations can be implemented, for example, based on the Gaussian probability density function (Normal distribution) and the random.normal module in OpenCV.

[0063] It should also be noted that in some embodiments, one or more of the following display defect types—dotted line type, spot type, Mura type, and color unevenness type—can be drawn simultaneously within the image area; this disclosure does not limit this. Furthermore, the same display defect type can also include multiple subtypes and multiple defect levels. For example, by adjusting the grayscale value and the number of dots in the image, the severity of the screen defect can be adjusted to obtain different defect levels, thus meeting the equipment inspection needs in different scenarios. For example, Figure 5 This is a schematic diagram of a second limit sample image shown in an exemplary embodiment of the present disclosure, wherein the second limit sample image includes cyan dark spot level, magenta dark spot level, cyan dark spot level and dark spot level.

[0064] Reference Figure 2 In step S22, the production object is controlled to display a limit sample image.

[0065] For example, in one possible implementation, the control of the production object to display a limit sample image includes: Acquire the data collected by the acquisition device from the equipment; If the data is determined to be abnormal based on a reference value, the device is controlled to enter an inspection state. When the equipment is in inspection mode, the control device displays the limit sample image.

[0066] For example, Figure 6 This is a schematic diagram of an equipment inspection system according to an exemplary embodiment of this disclosure. (Refer to...) Figure 6 The environment of the equipment can be monitored by equipping it with sensors. For example, pressure sensors, brightness sensors, colorimeter sensors, and other sensors can be used to collect data from the equipment, such as camera height, light source brightness, and colorimeter accuracy.

[0067] In addition, the data can also be uploaded to the data processing terminal ( Figure 6 (Illustration of data being uploaded to the factory's MES). The data processing end can filter and screen the data, and determine whether the data is abnormal based on the filtered data.

[0068] For example, anomalies in the data can be determined based on reference values ​​for various types of data. Taking camera height as an example, if the camera height in the data exceeds a reference value, it can be determined that the camera height data is abnormal. Similarly, if the light source brightness exceeds a reference value, it can be determined that the light source brightness data is abnormal. In this case, an instruction can be issued to a relevant tool, which can then control the device to enter an inspection state, such as switching the device's mode from production mode to inspection mode. While the device is in inspection mode, the production object is controlled to display the limit sample image.

[0069] It should be noted that since the above solution can perform spot checks based on the limit sample image, when a production object on the production line displays the limit sample image, that production object can be used as a finishing machine. In other words, the above solution eliminates the need for manual selection of finishing machines. Furthermore, since the limit sample image can describe various screen defects, the above solution eliminates the need to select multiple finishing machines. This improves efficiency.

[0070] During inspection, the target image captured by the equipment on the screen of the production object (when the limit sample image is displayed) can be obtained. Since the production object displays the limit sample image, the accuracy of the equipment can be determined by comparing the limit sample image and the target image. For example, when the similarity between the limit sample image and the target image is high, the accuracy of the equipment is also high.

[0071] In step S23, the device is adjusted until the similarity between the sample image and the target image is greater than the similarity threshold. The target image is the image captured by the device on the screen of the production object.

[0072] For example, in one embodiment, adjusting the device includes: The parameters of the device can be adjusted. For example, in one embodiment, the camera height of the device can be adjusted; in another embodiment, the accuracy of the colorimeter of the device can be adjusted; in yet another embodiment, the brightness of the light source of the device can be adjusted; and in still another embodiment, camera parameters of the device, such as exposure time, can be adjusted.

[0073] After adjustment, an image of the production object can be acquired using the adjusted device to obtain the current target image. In this way, the similarity between the current target image and the sample image displayed on the production object can be calculated.

[0074] If the similarity is less than or equal to the similarity threshold, the following steps can be repeated: adjust the parameters of the device; acquire an image of the production object through the adjusted device to obtain the current target image; calculate the similarity between the current target image and the limit sample image displayed by the production object.

[0075] If the similarity is greater than the similarity threshold, the equipment inspection can be completed, and the accuracy of the equipment is high at this time.

[0076] Using the above scheme, a limit sample image can be acquired, and the production object can be controlled to display the limit sample image. Thus, the similarity between the target image and the limit sample image can be determined based on the target image captured by the device on the screen of the production object. The device can then be adjusted until the similarity between the limit sample image and the target image exceeds a similarity threshold. When the similarity between the limit sample image and the target image exceeds the similarity threshold, the accuracy of the device is high. Therefore, the above scheme can effectively perform point-by-point inspection and repair of the device's accuracy. Furthermore, since the above scheme performs point-by-point inspection and repair based on the limit sample image, it eliminates the need for manual selection of physical objects, thus offering higher efficiency and speed.

[0077] Based on the same inventive concept, embodiments of this disclosure provide a control device for an apparatus. Figure 7 This is a block diagram of a control device for an apparatus according to an exemplary embodiment of the present disclosure, the device comprising: The first module 701 is configured to acquire a limit sample image; The second module 702 is configured to control the production object to display the limit sample image; The third module 703 is configured to adjust the device until the similarity between the limit sample image and the target image is greater than a similarity threshold, wherein the target image is an image captured by the device from the screen of the production object.

[0078] Using the above scheme, a limit sample image can be acquired, and the production object can be controlled to display the limit sample image. Thus, the similarity between the target image and the limit sample image can be determined based on the target image captured by the device on the screen of the production object. The device can then be adjusted until the similarity between the limit sample image and the target image exceeds a similarity threshold. When the similarity between the limit sample image and the target image exceeds the similarity threshold, the accuracy of the device is high. Therefore, the above scheme can effectively perform point-by-point inspection and repair of the device's accuracy. Furthermore, since the above scheme performs point-by-point inspection and repair based on the limit sample image, it eliminates the need for manual selection of physical objects, thus offering higher efficiency and speed.

[0079] Optionally, the third module 703 includes: The first submodule is configured to adjust the parameters of the device; The second submodule is configured to acquire images of the production object through the adjusted equipment to obtain the current target image; The third submodule is configured to calculate the similarity between the current target image and the limit sample image displayed by the production object.

[0080] Optionally, the first submodule is configured to adjust the parameters of the device in one or more of the following ways: Adjust the camera height of the device; Adjust the accuracy of the colorimeter in the device; Adjust the brightness of the light source of the device; Adjust the camera parameters of the device.

[0081] Optionally, the second module 702 includes: The fourth submodule is configured to acquire data collected by the acquisition device from the device. The fifth submodule is configured to control the device to enter an inspection state when the data is determined to be abnormal based on a reference value of the data. The sixth submodule is configured to control the production object to display the limit sample image when the equipment is in an inspection state.

[0082] Optionally, the first module 701 includes: The seventh submodule is configured to determine the screen information of the production object; The eighth submodule is configured to determine the type of screen display defect; The ninth submodule is configured to generate the limit sample image based on the screen information and the type of the screen display defect.

[0083] Optionally, the types of screen display defects include dot and line display defects, and the ninth submodule is configured as follows: The first image range is determined based on the screen information; Draw dotted or line-type defects within the first image range to obtain a first limit sample image, wherein the limit sample image includes the first limit sample image.

[0084] Optionally, the screen display defect type includes one or more of the following: spot-type display defect type, Mura-type display defect type, and color unevenness display defect type. The ninth submodule is configured to: The range of the second image is determined based on the screen information; Based on the type of screen display defect, one or more of the following are drawn in the second image range: spot-type display defects, Mura-type display defects, and color unevenness display defects, to obtain a second limit sample image, which includes the second limit sample image.

[0085] This disclosure provides a control device for an apparatus, including: processor; Memory used to store processor-executable instructions; The processor is configured to execute the control method of the device provided in any embodiment of this disclosure.

[0086] This disclosure provides a computer-readable storage medium having a computer program stored thereon, which, when executed by a processor, implements the control method of the device provided in any embodiment of this disclosure.

[0087] This disclosure provides a computer program product, including a computer program that, when executed by a processor, is a method for controlling a device provided in any embodiment of this disclosure.

[0088] Regarding the apparatus in the above embodiments, the specific manner in which each module performs its operation has been described in detail in the embodiments related to the method, and will not be elaborated upon here.

[0089] Figure 8 This is a block diagram illustrating an apparatus 800 for device control according to an exemplary embodiment. For example, apparatus 800 may be a computer, a console, etc.

[0090] Reference Figure 8The device 800 may include one or more of the following components: a processing component 802, a memory 804, a power supply component 806, a multimedia component 808, an audio component 810, an input / output interface 812, a sensor component 814, and a communication component 816.

[0091] Processing component 802 typically controls the overall operation of device 800, such as operations associated with display, data communication, camera operation, and recording. Processing component 802 may include one or more processors 820 to execute instructions to complete all or part of the steps of the device control method described above. Furthermore, processing component 802 may include one or more modules to facilitate interaction between processing component 802 and other components. For example, processing component 802 may include a multimedia module to facilitate interaction between multimedia component 808 and processing component 802.

[0092] Memory 804 is configured to store various types of data to support the operation of device 800. Examples of this data include instructions, messages, pictures, videos, etc., for any application or method operating on device 800. Memory 804 can be implemented by any type of volatile or non-volatile storage device or a combination thereof, such as static random access memory (SRAM), electrically erasable programmable read-only memory (EEPROM), erasable programmable read-only memory (EPROM), programmable read-only memory (PROM), read-only memory (ROM), magnetic storage, flash memory, magnetic disk, or optical disk.

[0093] Power supply component 806 provides power to various components of device 800. Power supply component 806 may include a power management system, one or more power sources, and other components associated with generating, managing, and distributing power to device 800.

[0094] Multimedia component 808 includes a screen that provides an output interface between the device 800 and the user. In some embodiments, the screen may include a liquid crystal display (LCD) and a touch panel (TP). If the screen includes a touch panel, the screen may be implemented as a touchscreen to receive input signals from the user. The touch panel includes one or more touch sensors to sense touches, swipes, and gestures on the touch panel. The touch sensors may sense not only the boundaries of the touch or swipe action but also the duration and pressure associated with the touch or swipe operation. In some embodiments, multimedia component 808 includes one or more cameras. When the device 800 is in an operating mode, such as a shooting mode or a video mode, the cameras may receive external multimedia data. The cameras may be a fixed optical lens system or have focal length and optical zoom capabilities.

[0095] Audio component 810 is configured to output and / or input audio signals. For example, audio component 810 includes a microphone (MIC) configured to receive external audio signals when device 800 is in an operating mode, such as recording mode. The received audio signals may be further stored in memory 804 or transmitted via communication component 816. In some embodiments, audio component 810 also includes a speaker for outputting audio signals.

[0096] The input / output interface 812 provides an interface between the processing component 802 and the peripheral interface module, which may be a keyboard, click wheel, button, etc.

[0097] Sensor assembly 814 includes one or more sensors for providing status assessments of various aspects of device 800. For example, sensor assembly 814 may detect the on / off state of device 800, the relative positioning of components such as the display and keypad of device 800, changes in the position of device 800 or a component of device 800, the presence or absence of user contact with device 800, the orientation or acceleration / deceleration of device 800, and temperature changes of device 800. Sensor assembly 814 may include a proximity sensor configured to detect the presence of nearby objects without any physical contact. Sensor assembly 814 may also include a light sensor, such as a CMOS or CCD image sensor, for use in imaging applications. In some embodiments, sensor assembly 814 may also include an accelerometer, a gyroscope, a magnetometer, a pressure sensor, or a temperature sensor.

[0098] Communication component 816 is configured to facilitate wired or wireless communication between device 800 and other devices. Device 800 can access wireless networks based on communication standards, such as WiFi, 4G, or 5G, or combinations thereof. In one exemplary embodiment, communication component 816 receives broadcast signals or broadcast-related information from an external broadcast management system via a broadcast channel. In one exemplary embodiment, communication component 816 also includes a near-field communication (NFC) module to facilitate short-range communication. For example, the NFC module may be implemented based on radio frequency identification (RFID) technology, Infrared Data Association (IrDA) technology, ultra-wideband (UWB) technology, Bluetooth (BT) technology, and other technologies.

[0099] In an exemplary embodiment, device 800 may be implemented by one or more application-specific integrated circuits (ASICs), digital signal processors (DSPs), digital signal processing devices (DSPDs), programmable logic devices (PLDs), field-programmable gate arrays (FPGAs), controllers, microcontrollers, microprocessors, or other electronic components to perform the control method of the above-described device.

[0100] In an exemplary embodiment, a non-transitory computer-readable storage medium including instructions is also provided, such as a memory 804 including instructions, which can be executed by a processor 820 of the device 800 to complete the control method of the device. For example, the non-transitory computer-readable storage medium may be a ROM, random access memory (RAM), CD-ROM, magnetic tape, floppy disk, and optical data storage device, etc.

[0101] It should be understood that, unless otherwise specifically indicated, features of various embodiments of this disclosure described herein can be combined with each other. As used herein, the term “and / or” includes any one of the relevant listed items and any combination of any two or more; similarly, “at least one of…” includes any one of the relevant listed items and any combination of any two or more.

[0102] Although terms such as “first,” “second,” and “third” may be used herein to describe various modules, these modules are not limited to these terms. Rather, these terms are used only to distinguish one module from another. Thus, without departing from the teachings of the examples described herein, the first module mentioned in the examples may also be referred to as the second module. Furthermore, the terms “first” and “second” are used for descriptive purposes only and should not be construed as indicating or implying relative importance or implicitly specifying the number of indicated technical features. Therefore, a feature defined as “first” or “second” may explicitly or implicitly include at least one of that feature. In the description herein, “multiple” means at least two, such as two, three, etc., unless otherwise explicitly specified.

[0103] Furthermore, the term “exemplary” is used herein to mean serving as an example, instance, or illustration. Any aspect or design described herein as “exemplary” is not necessarily to be construed as advantageous compared to other aspects or designs. Rather, the use of the term “exemplary” is intended to present the concept in a concrete manner. As used herein, the term “or” is intended to mean an inclusive “or” rather than an exclusive “or.” That is, unless otherwise specified or clear from the context, “X applies A or B” is intended to mean any of the natural inclusive arrangements. That is, “X applies A or B” satisfies any of the foregoing instances if X applies A; X applies B; or both X applies A and B. Additionally, unless otherwise specified or clear from the context to refer to the singular form, the articles “a” and “an” as used in this application and the appended claims are generally understood to mean “one or more.”

[0104] Similarly, although this disclosure has been shown and described with respect to one or more implementations, equivalent variations and modifications will occur to those skilled in the art upon reading and understanding the specification and drawings. This disclosure includes all such modifications and variations and is limited only by the scope of the claims. In particular, with respect to the various functions performed by the components described above, unless otherwise indicated, the terminology used to describe such components is intended to correspond to any component (functionally equivalent) that performs the specific function of the described component, even if structurally not equivalent to the disclosed structure. Furthermore, although specific features of this disclosure may have been disclosed with respect to only one of several implementations, such features may be combined with one or more other features of other implementations, as may be desired and advantageous to any given or particular application. Moreover, with regard to the terms “comprising,” “owning,” “having,” “having,” or variations thereof as used in the Detailed Description or the claims, such terms are intended to be inclusive in a manner similar to the term “including.”

[0105] Other embodiments of this disclosure will readily occur to those skilled in the art upon consideration of the specification and practice of the invention disclosed herein. This application is intended to cover any variations, uses, or adaptations of this disclosure that follow the general principles of this disclosure and include common knowledge or customary techniques in the art not disclosed herein. The specification and examples are to be considered exemplary only, and the true scope and spirit of this disclosure are indicated by the appended claims.

[0106] It should be understood that this disclosure is not limited to the precise structures described above and shown in the accompanying drawings, and various modifications and changes can be made without departing from its scope. The scope of this disclosure is limited only by the appended claims.

Claims

1. A method for controlling a device, characterized in that, include: Obtain the limit sample image; The control device displays the limit sample image; The device is adjusted until the similarity between the limit sample image and the target image is greater than a similarity threshold, wherein the target image is the image captured by the device from the screen of the production object.

2. The method according to claim 1, characterized in that, The adjustment of the equipment includes: Adjust the parameters of the device; The current target image is obtained by acquiring images of the production object through the adjusted equipment; Calculate the similarity between the current target image and the limit sample image displayed by the production object.

3. The method according to claim 2, characterized in that, The parameters of the device can be adjusted in one or more of the following ways: Adjust the camera height of the device; Adjust the accuracy of the colorimeter in the device; Adjust the brightness of the light source of the device; Adjust the camera parameters of the device.

4. The method according to any one of claims 1 to 3, characterized in that, The control of the production object to display the limit sample image includes: Acquire the data collected by the acquisition device from the equipment; If the data is determined to be abnormal based on a reference value, the device is controlled to enter an inspection state. When the equipment is in inspection mode, the control device displays the limit sample image.

5. The method according to any one of claims 1 to 3, characterized in that, The acquisition of the limit sample image includes: Determine the screen information of the production object; Determine the type of screen display defect; The limit sample image is generated based on the screen information and the type of screen display defect.

6. The method according to claim 5, characterized in that, The types of screen display defects include dot and line display defects. Generating the limit sample image based on the screen information and the types of screen display defects includes: The first image range is determined based on the screen information; Draw dotted and line-type defects within the first image range to obtain a first limit sample image, wherein the limit sample image includes the first limit sample image.

7. The method according to claim 5, characterized in that, The screen display defect types include one or more of the following: speckle-type display defect type, Mura-type display defect type, and color unevenness display defect type. Generating the limit sample image based on the screen information and the type of screen display defect includes: The range of the second image is determined based on the screen information; Based on the type of screen display defect, one or more of the following are drawn in the second image range: spot-type display defects, Mura-type display defects, and color unevenness display defects, to obtain a second limit sample image, which includes the second limit sample image.

8. A control device for an equipment, characterized in that, include: The first module is configured to acquire a limit sample image; The second module is configured to control the display of the limit sample image on the production object; The third module is configured to adjust the device until the similarity between the limit sample image and the target image is greater than a similarity threshold, wherein the target image is an image captured by the device from the screen of the production object.

9. A control device for an equipment, characterized in that, include: processor; Memory used to store processor-executable instructions; The processor is configured to perform the method according to any one of claims 1 to 7.

10. A computer-readable storage medium having a computer program stored thereon, characterized in that, When the computer program is executed by a processor, it implements the method of any one of claims 1 to 7.

11. A computer program product, characterized in that, Includes a computer program that, when executed by a processor, implements the method of any one of claims 1 to 7.

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