Novel 0BB testing four-station mechanism

Abstract

The invention discloses a novel 0BB testing four-station mechanism which comprises a conveying guide rail and a rotating disc, a voice coil motor is installed at the rear end of the conveying guide rail, the driving end of the voice coil motor is vertically and upwards connected with a jacking frame, lower suction nozzles are arranged on the two sides of the jacking frame, four stations are formed on the outer side of the rotating disc, and adsorption assemblies are installed on the two sides of each station. The adsorption assembly extends towards the middle of the station, a plurality of upper suction nozzles are installed at the lower end of the adsorption assembly, and a rotary disc air pipe connector is installed in the middle of the rotary disc and communicated with the upper suction nozzles after passing through the interior of the rotary disc and the interior of the adsorption assembly. The novel 0BB testing four-station mechanism acts on IV detection of 0BB silicon wafers, the 0BB silicon wafers are adsorbed and jacked through conveying of the guide rail, the rotating disc above can be in butt joint downwards and transferred to an IV detection part to be detected, the accuracy of the 0BB silicon wafers in the conveying process is effectively improved, and the deviation possibility is reduced.

Description

TECHNICAL FIELD

[0001] The present application relates to the technical field of silicon wafer detection, and particularly to a novel test four-station mechanism for 0BB. BACKGROUND

[0002] Photovoltaic solar silicon wafers (hereinafter referred to as silicon wafers) are the core part of a solar power generation system and the most valuable part of the solar power generation system. The function of the silicon wafer is to convert solar energy into electrical energy, which is stored by a storage battery or directly loaded for work. In the existing silicon wafers, the front surface has a main grid line, which will block the surface of the solar cell, affecting the light absorption of the cell wafer, and thus affecting the power generation efficiency. In the subsequent new type of silicon wafer, the front surface main grid line is cancelled to form a 0BB silicon wafer. The quality of the 0BB silicon wafer needs to be detected during the production process. The conventional guide rail and turntable are unstable in the butt joint structure, so that the transfer position of the 0BB silicon wafer cannot be accurately butt jointed. SUMMARY

[0003] An object of the present application is to provide a novel test four-station mechanism for 0BB, which controls the lifting of the 0BB silicon wafer from the lifting structure on the conveying guide rail, cooperates with the upper turntable adsorption structure to transfer, and ensures the accurate position of the 0BB silicon wafer.

[0004] To achieve this purpose, the present application adopts the following technical scheme:

[0005] A novel test four-station mechanism for 0BB, comprising a conveying guide rail and a turntable, wherein the rear end of the conveying guide rail is provided with a voice coil motor, the driving end of the voice coil motor is vertically connected upward with a jacking frame, the two sides of the jacking frame are provided with lower suction nozzles, the outer side of the turntable is formed with four stations, the two sides of each station are provided with adsorption assemblies, the adsorption assemblies extend to the middle part of the station, the lower end of the adsorption assembly is provided with a plurality of upper suction nozzles, the middle part of the turntable is provided with a turntable gas pipe joint, the turntable gas pipe joint is in communication with the upper suction nozzles through the inside of the turntable and the inside of the adsorption assembly.

[0006] As a preferred technical scheme, one end of the conveying guide rail is provided with a conveying motor, the driving end of the conveying motor is connected with a conveying synchronous wheel, the conveying synchronous wheels are transmissionally connected with a conveying synchronous belt, the two ends of the conveying guide rail are rotationally connected with conveying rotating wheels, the conveying synchronous wheels and the conveying rotating wheels are connected with a transmission shaft, the conveying rotating wheels are transmissionally provided with a conveying belt, and the conveying belt is located on the two sides of the conveying guide rail.

[0007] As a preferred technical scheme, the centering and deviation rectifying motor is installed below the conveying guide rail, the driving end of the centering and deviation rectifying motor is connected with a centering and deviation rectifying synchronous wheel, the centering and deviation rectifying synchronous wheels are transmissionally connected with a centering and deviation rectifying synchronous belt, the centering and deviation rectifying synchronous belt is fixed with a centering and deviation rectifying support, and a pair of the centering and deviation rectifying supports are located on the two sides of the conveying guide rail.

[0008] As a preferred technical scheme, the centering and deviation rectifying support is installed with a centering and deviation rectifying guide wheel.

[0009] As a preferred technical scheme, the conveying sensor is installed in the middle part of the conveying guide rail.

[0010] As a preferred technical scheme, the side of the rotating disc is provided with an air path groove, the outer end of the adsorption assembly is connected to the air path groove, the air path groove is covered with a sealing plate, and the rotating disc air pipe joint is located at the end of the air path groove away from the adsorption assembly.

[0011] The 0BB novel test four-station mechanism provided by the application is used in IV detection of 0BB silicon wafers, the 0BB silicon wafers are adsorbed and lifted through conveying of the guide rail, the rotating disc above can be downwardly connected and transferred to the IV detection part for detection, the accuracy of the 0BB silicon wafers in the conveying process is effectively improved, and the possibility of deviation is reduced. BRIEF DESCRIPTION OF DRAWINGS

[0012] The application will be further described in detail below according to the drawings and embodiments.

[0013] Figure 1 The overall structure schematic view of the 0BB novel test four-station mechanism described in the embodiments;

[0014] Figure 2 The first structure schematic view of the conveying guide rail described in the embodiments;

[0015] Figure 3 The second structure schematic view of the conveying guide rail described in the embodiments;

[0016] Figure 4 The structure schematic view of the rotating disc described in the embodiments.

[0017] Figures 1 to 4 In the center:

[0018] 1. Conveyor rail; 2. Turntable; 3. Voice coil motor; 4. Lifting frame; 5. Lower suction nozzle; 6. Workstation; 7. Adsorption assembly; 8. Upper suction nozzle; 9. Turntable air pipe connector; 10. Conveyor motor; 11. Conveyor synchronous pulley; 12. Conveyor synchronous belt; 13. Conveyor impeller; 14. Drive shaft; 15. Conveyor belt; 16. Centering and correction motor; 17. Centering and correction synchronous pulley; 18. Conveyor slide rail; 19. Centering and correction bracket; 20. Centering and correction guide wheel; 21. Sealing plate. Detailed Implementation

[0019] The technical solution of the present invention will be further described below with reference to the accompanying drawings and specific embodiments.

[0020] like Figures 1 to 4 As shown in this embodiment, a novel four-station OBB testing mechanism includes a conveyor rail 1 and a turntable 2. A voice coil motor 3 is installed at the rear end of the conveyor rail 1. A lifting frame 4 is vertically connected to the drive end of the voice coil motor 3. Lower suction nozzles 5 are provided on both sides of the lifting frame 4. Four stations 6 are formed on the outer side of the turntable 2. Adsorption components 7 are installed on both sides of each station 6. The adsorption components 7 extend towards the middle of the station 6. Several upper suction nozzles 8 are installed at the lower end of the adsorption components 7. A turntable air pipe connector 9 is installed in the middle of the turntable 2. The turntable air pipe connector 9 communicates with the upper suction nozzles 8 after passing through the interior of the turntable 2 and the interior of the adsorption components 7.

[0021] The conveyor rail 1 moves the silicon wafer backward. When it reaches the last end, the voice coil motor 3 controls the lifting frame 4 to rise. The two sides of the lifting frame 4 pick up the silicon wafer from the two sides of the conveyor rail 1 through the lower suction nozzle 5 and move it upward until it reaches the station 6 position of the turntable 2. At this time, the suction component 7 of the turntable 2 controls the upper suction nozzle 8 to pick up the silicon wafer, the lower suction nozzle 5 releases the silicon wafer, and then the turntable 2 rotates to transfer the picked-up silicon wafer to the IV detection section for testing.

[0022] A conveyor motor 10 is installed at one end of the conveyor guide rail 1. The drive end of the conveyor motor 10 is connected to a conveyor synchronous pulley 11. A conveyor synchronous belt 12 is connected between the conveyor synchronous pulleys 11. Both ends of the conveyor guide rail 1 are rotatably connected to conveyor wheels 13. A drive shaft 14 is connected between the conveyor synchronous pulleys 11 and the conveyor wheels 13. A conveyor belt 15 is driven on the conveyor wheels 13. The conveyor belt 15 is located on both sides of the conveyor guide rail 1. Furthermore, a conveyor sensor is installed in the middle of the conveyor guide rail 1.

[0023] The conveyor motor 10 provides power. Under the transmission of the conveyor synchronous pulley 11 and the conveyor synchronous belt 12, the drive shaft 14 rotates, and the conveyor wheel 13 rotates in turn under the action of the drive shaft 14. The conveyor belt 15 can then convey the silicon wafer backward. During the conveying process, the presence of the silicon wafer is sensed by the conveyor sensor.

[0024] The lower part of the conveying guide rail 1 is provided with a centering and correcting motor 16, the driving end of the centering and correcting motor 16 is connected with a centering and correcting synchronous wheel 17, the centering and correcting synchronous wheel 17 is transmissionally connected with a centering and correcting synchronous belt, the centering and correcting synchronous belt is fixed with a centering and correcting support 19, a pair of centering and correcting supports 19 are located at the two sides of the conveying guide rail 1, and the centering and correcting support 19 is provided with a centering and correcting guide wheel 20.

[0025] When the silicon wafer moves to the rear of the conveying guide rail 1, the centering and correcting motor 16 drives the centering and correcting support 19 to move from the two sides to the middle along the conveying slide rail 18 through the centering and correcting synchronous wheel and the centering and correcting synchronous belt, so as to align the silicon wafer, wherein the centering and correcting guide wheel 20 reduces the friction.

[0026] The side of the rotating disc 2 is provided with an air channel groove, the outer end of the adsorption assembly 7 is connected to the air channel groove, the air channel groove is covered with a sealing plate 21, and the rotating disc air pipe joint 9 is located at the end of the air channel groove far from the adsorption assembly 7.

[0027] The adsorption assembly 7 used at the two sides of each work station 6 of the rotating disc 2 extends from the air channel groove on the outer side to the middle position of the rotating disc 2, and the rotating disc air pipe joint 9 is installed at the middle part of the rotating disc 2, which is more convenient for connection.

[0028] It should be noted that the above specific embodiments are only the preferred embodiments of the present application and the technical principles applied, and any changes or replacements that can be easily thought of by those skilled in the art within the technical range disclosed by the present application should be covered in the protection scope of the present application.

Claims

1. A novel four-station testing mechanism for OBB, characterized in that, The device includes a conveyor rail and a turntable. A voice coil motor is installed at the rear end of the conveyor rail. A lifting frame is vertically connected to the drive end of the voice coil motor. Lower suction nozzles are provided on both sides of the lifting frame. Four workstations are formed on the outer side of the turntable. Adsorption components are installed on both sides of each workstation. The adsorption components extend towards the center of the workstation. Several upper suction nozzles are installed at the lower end of the adsorption components. A turntable air pipe connector is installed in the center of the turntable. The turntable air pipe connector communicates with the upper suction nozzles after passing through the interior of the turntable and the interior of the adsorption components.

2. The novel four-station testing mechanism for OBB according to claim 1, characterized in that, A conveying motor is installed at one end of the conveying guide rail. The drive end of the conveying motor is connected to a conveying synchronous pulley. A conveying synchronous belt is connected between the conveying synchronous pulleys. Both ends of the conveying guide rail are rotatably connected to conveying wheels. A drive shaft is connected between the conveying synchronous pulley and the conveying wheels. A conveying belt drives the conveying wheels. The conveying belt is located on both sides of the conveying guide rail.

3. The novel four-station testing mechanism for OBB according to claim 1, characterized in that, A centering and correction motor is installed below the conveying guide rail. The drive end of the centering and correction motor is connected to a centering and correction synchronous pulley. A centering and correction synchronous belt is connected between the centering and correction synchronous pulleys. A centering and correction bracket is fixed on the centering and correction synchronous belt. A pair of centering and correction brackets are located on both sides of the conveying guide rail.

4. The novel four-station testing mechanism for OBB according to claim 3, characterized in that, The centering and correction bracket is equipped with centering and correction guide wheels.

5. The novel four-station testing mechanism for OBB according to claim 1, characterized in that, A conveying sensor is installed in the middle of the conveying guide rail.

6. The novel four-station testing mechanism for OBB according to claim 1, characterized in that, The turntable has an air passage groove on its side, the outer end of the adsorption component is connected to the air passage groove, the air passage groove is covered with a sealing plate, and the turntable air pipe connector is located at the end of the air passage groove away from the adsorption component.

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