Energy supply circuit for x-ray device, x-ray device and method for operating x-ray device

Abstract

The invention relates to an energy supply circuit for an X-ray device, an X-ray device and a method for operating an X-ray device. The invention relates to an energy supply circuit for an X-ray device, comprising a power supply unit having an operating path and an acquisition path, the operating path being designed to feed a plurality of components of the X-ray device for normal operation, the acquisition path being designed to feed a subset of the plurality of components of the X-ray device for acquisition operation, and a monitoring unit, wherein the monitoring unit is designed to detect an input voltage at a power supply input of the power supply unit by means of the sensor, and wherein the power supply unit is designed to provide an operating voltage via an operating path or a detection voltage via a detection path to the respective component depending on the input voltage.

Description

TECHNICAL FIELD

[0001] The invention relates to an energy supply circuit for an X-ray device, to an X-ray device and to a method for operating an X-ray device. BACKGROUND

[0002] Computed tomography systems, for short CT systems, are used for medical imaging examinations of patients. Other terms for CT systems are also CT devices or CT facilities. Here, an examination region is loaded with X-rays from different directions by means of an X-ray source fixed on a rotating part of the CT system, and the attenuated X-ray radiation is detected by means of a jointly rotating X-ray detector or count rate detector.

[0003] New generations of photon-counting detectors of CT systems mostly comprise a semiconductor material as sensor material, which has, for example, CdTe, CdZnTe, CdTeSe, CdZnTeSe, CdMnTe, GaAs, Si or Ge. Usually, an electric field is generated in the sensor material by means of an applied bias voltage. The electric field can enable a radiation flux in the sensor material under X-ray irradiation, which can then be evaluated by means of a directly connected application-specific integrated circuit (ASIC). The electric field can cause the sensor material to heat up. Temperature differences of the X-ray sensor layer, in particular of the sensor material, for example by switching on or off the bias voltage, can cause unwanted drifts and / or image artifacts. In order to bring the detector, in particular the sensor material, again into a steady state, in particular a thermal state, after switching off and on the bias voltage, it can take up to 24 hours. At the same time, no measurement can be carried out or only with reduced image quality. For this reason, the bias voltage is switched off as little as possible, which in turn leads to an increase in the energy consumption of the CT system. SUMMARY

[0004] It is therefore the task of the present invention to specify an energy-saving possibility for bringing a photon-counting detector into a steady state, in particular a thermal state.

[0005] According to the invention, this task is solved by the subject matter of the invention. Advantageous embodiments with suitable refinements are the subject matter of the description.

[0006] The application relates in a first aspect to an energy supply circuit for an X-ray device. The energy supply circuit has a supply unit and a monitoring unit. The supply unit has here a run path and an acquisition path. The run path is configured for feeding a plurality of components of the X-ray device for normal operation. Furthermore, the acquisition path is configured for feeding a subset of the plurality of components of the X-ray device for acquisition operation. The monitoring unit is configured for detecting an input voltage on a supply input of the supply unit by means of a sensor. Furthermore, the supply unit is configured for providing a run voltage via the run path or an acquisition voltage via the acquisition path to the respective components depending on the detected input voltage.

[0007] The plurality of components of the X-ray device can comprise, for example, an X-ray source and / or an X-ray detector.

[0008] The supply unit can be configured for being fed by at least one voltage source. To this end, the supply unit can have a supply input for receiving electrical energy. Advantageously, the at least one voltage source can provide an input voltage to the supply unit, in particular to the supply input, in a run state of the energy supply circuit.

[0009] The monitoring unit can have a sensor, for example a voltage sensor, which is configured for detecting an input voltage, in particular a value of the input voltage, on the supply input of the supply unit. The monitoring unit can be configured, for example, for providing a control signal depending on the input voltage detected by means of the sensor, which has in particular qualitative or quantitative information about the value of the detected input voltage. The monitoring unit can in particular be configured for providing the control signal to the supply unit depending on the detected input voltage.

[0010] The run path can represent an energy transmission path, in particular for transmitting electrical energy, for normal operation of the X-ray device. Normal operation can comprise a regular operation, in particular a shooting operation, of the X-ray device, for example for imaging an examination object. Advantageously, the run path can be configured for providing the run voltage provided by the supply unit to all components of the X-ray device required for normal operation.

[0011] The acquisition path can represent a further energy transmission path, in particular for transmitting electrical energy, for acquisition operation of the X-ray device. Acquisition operation can advantageously comprise an operation for acquiring and / or stabilizing and / or regulating at least a subset of the components of the X-ray device. Advantageously, the acquisition path can be configured for providing the acquisition voltage provided by the supply unit to the subset of the plurality of components of the X-ray device for acquisition operation.

[0012] The acquisition path can be a sub-path of the run path or can differ from the run path in addition to feeding the subset of the plurality of components of the X-ray device.

[0013] The acquisition path can have a lower voltage, in particular a lower voltage demand and / or a lower energy demand, relative to the operating path. In particular, the operating voltage and / or the energy demand of the operating path can at least correspond to the acquisition voltage and / or the energy demand of the acquisition path.

[0014] The supply unit can be configured to provide, depending on the detected input voltage, in particular depending on the control signal, in a first operating state an operating voltage via the operating path to the plurality of components of the X-ray device or in a second operating state an acquisition voltage via the acquisition path to the subset of the plurality of components of the X-ray device.

[0015] The proposed energy supply circuit can advantageously enable an energy-efficient acquisition of a steady state, in particular a thermal state, of the subset of the plurality of components of the X-ray device. In particular, the proposed energy supply circuit can ensure that the subset of the plurality of components of the X-ray device is supplied with power for an acquisition operation, in particular even in the event of a short energy interruption, for example in the event of a switch between a supply of the power grid and an emergency supply. Here, the energy supply circuit can be realized hardware-efficiently, in particular with minimal additional hardware expenditure and / or without additional digital functionality. In particular, the proposed energy supply circuit is configured to detect an energy-saving operation in which components of the X-ray device, for example components of a gantry, are switched off and the subset of the components, for example a detection unit, loses an operating point. Thereby, a particularly stable acquisition of a steady state of the subset of the plurality of components of the X-ray device can advantageously be realized.

[0016] In a further advantageous embodiment of the proposed energy supply circuit, the operating path can be configured to feed at least one digital component and at least one analog component of the X-ray device for a normal operation. Furthermore, the acquisition path can be configured to feed at least one of the at least one analog component of the X-ray device for an acquisition operation.

[0017] The X-ray device can have at least one digital component, in particular a plurality of digital components, and at least one analog component, in particular a plurality of analog components. The at least one digital component may, for example, comprise an application-specific integrated circuit (ASIC) and / or a field-programmable integrated circuit (FPGA). The at least one analog component may, for example, comprise a regulation unit configured to provide energy for an acquisition state of a detection unit of the X-ray device.

[0018] Advantageously, the operating path can be configured to supply the operating voltage provided by the power supply unit to at least one digital component, particularly multiple digital components, and at least one analog component, particularly multiple analog components, of the X-ray equipment for normal operation. Furthermore, the acquisition path can be configured to supply the acquisition voltage provided by the power supply unit to at least one analog component, particularly at least one of multiple analog components, particularly multiple or each analog component, of the X-ray equipment for acquisition operation. In particular, the acquisition path can be configured to power at least one of the at least one analog component of the X-ray equipment for acquisition operation and not power the remaining components, particularly the digital components, during acquisition operation.

[0019] The proposed power supply circuit can advantageously achieve energy-efficient acquisition of the steady state, especially the thermal state, of at least one analog component of an X-ray device. In particular, it can provide the acquisition voltage for operation independently of the startup and / or configuration process of at least one digital component.

[0020] In another advantageous embodiment of the proposed power supply circuit, the operating path and the acquisition path are different except for feeding a subset of multiple components of the X-ray device.

[0021] Advantageously, the operating path and the acquisition path can be different, except for corresponding, particularly different or consistent contacts used to power a subset of multiple components of the X-ray device, such as at least one of at least one analog component. In particular, the operating path and the acquisition path can include different, particularly non-intersecting circuits, except for corresponding contacts used to power a subset of multiple components of the X-ray device. Furthermore, the acquisition path and the operating path can be configured to be powered by the same power supply unit, specifically by the acquisition voltage or the operating voltage.

[0022] The power supply unit can be configured to provide operating voltage to multiple components of the X-ray equipment via an operating path in a first operating state based on the detected input voltage, particularly based on a control signal. Furthermore, the power supply unit can be configured to provide acquisition voltage to a subset of the multiple components of the X-ray equipment via an acquisition path in a second operating state based on the detected input voltage, particularly based on a control signal.

[0023] The proposed implementation method can advantageously adapt the corresponding components to the corresponding operation, especially normal operation or power supply for operation. In particular, the proposed implementation method can eliminate the need for operation path adaptation.

[0024] In another advantageous embodiment of the proposed power supply circuit, the acquisition path may be a sub-path of the operating path.

[0025] Advantageously, the acquisition path can be a sub-path of the operating path, particularly a part of the circuitry. The operating path can additionally have selectively activated, particularly switchable, circuitry sections configured to provide operating voltages to the remaining components of the X-ray apparatus, particularly the digital components of the X-ray apparatus. For example, the operating path can have circuitry elements configured to activate or deactivate portions of the operating path that extend beyond the acquisition path based on detected input voltages, particularly control signals and / or voltages provided by the power supply unit, particularly the operating voltage or acquisition voltage.

[0026] The power supply unit can be configured to provide operating voltage to multiple components of the X-ray equipment via an operating path in a first operating state based on the detected input voltage, particularly based on a control signal. Furthermore, the power supply unit can be configured to provide acquisition voltage to a subset of the multiple components of the X-ray equipment via an acquisition path in a second operating state based on the detected input voltage, particularly based on a control signal.

[0027] In particular, by means of the acquisition path, the corresponding voltage can be provided to a subset of multiple components of the X-ray device in the first and second operating states.

[0028] This allows for the advantageous minimization of circuit costs.

[0029] In another advantageous embodiment of the proposed power supply circuit, the monitoring unit can be configured to compare the input voltage with a preset voltage threshold. Furthermore, the power supply unit can provide an operating voltage via an operating path when the voltage threshold is reached or exceeded, or provide an acquisition voltage via an acquisition path when the voltage is below the voltage threshold.

[0030] The monitoring unit may include a comparator, such as a voltage comparator, configured to compare an input voltage, particularly its value, with a preset voltage threshold, said input voltage being present, especially at the power supply unit. The input voltage value may characterize, for example, the peak value, amplitude, intermediate value, particularly the root mean square (RMS) value, or a corrected value. The input voltage may be configured as a DC voltage or an AC voltage. The comparator may include, for example, an operational amplifier, an analog-to-digital converter, a (shunt) reference, an LED, and / or an optocoupler.

[0031] Advantageously, the monitoring unit can be configured to provide control signals to the power supply unit based on comparisons. Specifically, the monitoring unit can provide control signals to the power supply unit when the voltage is below a voltage threshold, causing the power supply unit to be prompted to provide the acquisition voltage via the acquisition path. Furthermore, the monitoring unit can provide control signals to the power supply unit when the voltage threshold is reached or exceeded, causing the power supply unit to be prompted to provide the operating voltage via the operating path.

[0032] The proposed implementation can advantageously ensure, in particular, the stable state, especially the thermal state, of a subset of multiple components of the X-ray equipment, acquired, especially automatically and energy-efficiently. In particular, the input voltage can be used as a control signal to provide a corresponding voltage via a corresponding path, especially an operating voltage via an operating path, or an acquisition voltage via an acquisition path.

[0033] In another advantageous embodiment of the proposed power supply circuit, the X-ray device may have a detection unit and a modulation unit. Here, the modulation unit may be configured to provide energy to acquire the detection unit's acquisition state. Furthermore, the acquisition path may be configured to at least feed power to the modulation unit.

[0034] The detection unit can be configured to detect, in particular, photon-counting X-ray radiation arriving at an X-ray-sensitive surface of the detection unit. The detection unit may have an X-ray-sensitive surface, particularly an X-ray detection layer, on its upper side. This surface can be arranged to face the X-ray source, at least in the operating state. Furthermore, the X-ray detection layer can be configured to detect X-rays emitted by the X-ray source.

[0035] Advantageously, the adjustment unit can be configured to provide energy to acquire the acquisition state of the detection unit. The acquisition state can describe a state in which the detection unit is temperature-adjusted within a predefined temperature range or at a predefined temperature, particularly above a predefined minimum temperature. The adjustment unit can advantageously be configured to provide energy for temperature-adjusting the detection unit to a predefined temperature, particularly above a predefined minimum temperature, or to a temperature within a predefined temperature range. The adjustment unit can, for example, be configured to provide electromagnetic and / or thermal energy for acquiring the acquisition state of the detection unit. For this purpose, the adjustment unit can be arranged on the detection unit, particularly at least partially integrated into the detection unit. Alternatively, the adjustment unit can be arranged spaced apart from the detection unit, advantageously positioned outside the direction of X-ray radiation incident with respect to the X-ray-sensitive surface of the detection unit.

[0036] Advantageously, the acquisition path, and especially the operating path, can be configured to at least power the regulating unit. In particular, the power supply unit can be configured to provide the acquisition voltage to the regulating unit via the acquisition path in a second operating state. The regulating unit can be selectively activated for acquisition operation and deactivated for normal operation via the acquisition path.

[0037] The proposed implementation method can achieve energy-saving acquisition of the stable state of the detection unit, especially the improved thermal state.

[0038] In another advantageous embodiment of the proposed power supply circuit, the detection unit may have a semiconductor material and be configured for detecting photon counting of X-ray radiation. The adjustment unit may be configured to adjustably maintain the semiconductor material in an acquisition state using the provided energy.

[0039] The X-ray detection layer may include a directly converted (semiconductor) X-ray sensor layer, which may have, for example, CdTe, CdZnTe, CdTeSe, CdZnTeSe, CdMnTe, GaAs, Si, or Ge as the semiconductor material. Furthermore, the X-ray detection layer may include a layer with an analog-to-digital converter (A / D converter) onto which the X-ray sensor layer is applied, wherein the A / D converter layer may be implemented in one or more ASICs. Incident X-ray radiation, or photons, can be converted into electrical pulses by a suitable conversion material in the X-ray sensor layer. The incident X-ray radiation is converted into charge carriers in the conversion material of the X-ray sensor layer according to the energy of the locally deposited X-ray photons, wherein the charge carriers in pixel-based pixel electronics can generate signals, typically electrical pulses, which are typically further processed pixel by pixel. The electrical pulses can be evaluated by evaluation electronics, such as ASICs. For example, the incident X-ray radiation can be measured by counting the electrical pulses, which are triggered by the absorption of X-ray photons in the conversion material. The height or length of the resulting electrical pulses is also typically proportional to the energy of the absorbed X-ray photons. Spectral information can thus be extracted by comparing the height or length of the electrical pulse with an energy threshold. Photon counting detection units typically have multiple settable energy thresholds for comparing the generated electrical pulses, enabling energy-resolved measurements across multiple energy ranges defined by these thresholds. A pixel element can be understood as a pixel-by-pixel electronics, or electronic pixel, of the evaluation unit. This pixel electronics is signal-technically coupled to the X-ray sensor layer via pixel electrodes and further processes signals arriving from the X-ray sensor layer through the corresponding pixel electrodes. Pixel elements can be associated with corresponding detection volumes within the X-ray sensor layer, constructed by the electric field between the corresponding sensor pixel electrode and a top electrode applied to the opposite side of the X-ray sensor layer, and this detection volume forms the sensitive detection volume of the pixel element. An electric field can be provided by applying a bias voltage to the corresponding sensor pixel electrode and the top electrode. This electric field can cause heating of the semiconductor material in the X-ray sensor layer. Temperature differences in the X-ray sensor layer, for example, generated by turning the bias voltage on or off, can lead to undesirable drift and / or image artifacts.

[0040] The proposed implementation method can achieve energy savings by improving the stable state of semiconductor materials, especially their thermal state.

[0041] In another advantageous embodiment of the proposed power supply circuit, the regulating unit can be configured to provide energy for acquiring the acquisition state via heat transfer and / or irradiation of the detection unit.

[0042] The adjustment unit may have a heating element, such as a heating wire, configured to provide thermal energy to the detection element via heat transfer for acquiring the acquisition state. The provision of thermal energy can be achieved through direct heat transfer between the heating element and the detection unit or by means of a thermally conductive medium, such as a fluid and / or a thermally conductive material. Alternatively or additionally, the adjustment unit may have a light source, particularly an infrared light source, for emitting light, particularly infrared light, for irradiating the detection unit, particularly the X-ray sensor layer and / or semiconductor material. Here, the detection unit, particularly the X-ray sensor layer, can be heated by converting the incident infrared light.

[0043] Advantageously, the conditioning unit can be configured to heat the detection unit, particularly the X-ray sensor layer, to a predefined temperature or a temperature within a predefined temperature range via heat transfer and / or irradiation. This advantageously ensures the acquisition of conditioning for the detection unit.

[0044] In a second aspect, the present invention relates to an X-ray apparatus comprising an X-ray source, a detection unit, at least one voltage source, and a proposed power supply circuit. Here, the at least one voltage source selectively provides an acquisition voltage as an input voltage to the power supply circuit in a first operating state or provides an operating voltage as an input voltage to the power supply circuit in a second operating state. In the first operating state, the power supply unit provides an operating voltage to the X-ray source and the detection unit via an operating path based on the input voltage for normal operation, such that X-ray radiation for irradiating the detection unit can be transmitted by means of the X-ray source and the X-ray radiation can be detected by means of the detection unit. In the second operating state, the power supply unit provides an acquisition voltage to a subset of multiple components of the X-ray apparatus via an acquisition path based on the input voltage for acquisition operation.

[0045] The advantages of the proposed X-ray device substantially correspond to the advantages of the proposed power supply circuit. The features, advantages, or alternative embodiments mentioned herein can also be applied to other claimed subjects, and vice versa.

[0046] In another advantageous embodiment of the proposed X-ray apparatus, the X-ray apparatus may have first and second voltage sources. Here, the first voltage source may be configured to provide the operating voltage as an input voltage to the power supply circuit in a first operating state, and the second voltage source may be configured to provide the acquired voltage as an input voltage to the power supply circuit in a second operating state.

[0047] The proposed implementation can advantageously achieve a smaller implementation of the second voltage source compared to the first voltage source. In particular, the first voltage source can be adapted to provide operating voltage requirements and the second voltage source can be adapted to provide voltage acquisition requirements.

[0048] In another advantageous embodiment of the proposed X-ray device, the power supply circuit may include a detection unit and an adjustment unit. Here, in the second operating state, the power supply unit is capable of providing an acquisition voltage to the adjustment unit via an acquisition path based on the input voltage.

[0049] In another advantageous embodiment of the proposed X-ray device, the X-ray device can be configured as a computed tomography system. Here, the X-ray source and detector unit can be rotatably supported in a defined arrangement.

[0050] In a third aspect, the present invention relates to a method for operating an X-ray apparatus having the proposed power supply circuit. In a first step, an input voltage is supplied to the power supply circuit using at least one voltage source. In a further step, the input voltage at the power supply input terminal of the power supply unit is detected using a sensor. In yet another step, based on the detected input voltage, an operating voltage is supplied to a corresponding component of the X-ray apparatus via an operating path or an acquisition voltage is supplied to a corresponding component of the X-ray apparatus via an acquisition path.

[0051] The advantages of the proposed method substantially correspond to the advantages of the proposed power supply circuit and / or the proposed X-ray device. The features, advantages, or alternative embodiments mentioned herein can also be applied to other claimed subjects, and vice versa.

[0052] In another advantageous embodiment of the proposed method, the X-ray device may have a power supply circuit, which includes a detection unit and a regulating unit. Here, the power supply unit can provide an operating voltage or an acquisition voltage to the regulating unit based on the detected input voltage. In any case, the regulating unit can provide energy for acquiring the acquisition state of the detection unit. Attached Figure Description

[0053] Embodiments of the present invention are shown in the accompanying drawings and are described in more detail below. In the different drawings, the same reference numerals are used for the same features. Wherein:

[0054] Figures 1 to 3 Schematic diagrams illustrating different advantageous embodiments of the proposed power supply circuit for an X-ray device are shown.

[0055] Figure 4 A schematic diagram illustrating an advantageous embodiment of the proposed method for operating an X-ray device, which includes a power supply circuit, is shown.

[0056] Figure 5 A schematic diagram of a CT device is shown as an exemplary embodiment of the proposed X-ray device. Detailed Implementation

[0057] Figure 1 A schematic diagram illustrating an advantageous embodiment of the proposed power supply circuit for an X-ray device RG is shown. The power supply circuit may include a power supply unit VS and a monitoring unit SU. Furthermore, the power supply unit SU may have an operating path BP and an acquisition path EP. Here, the operating path BP may be configured to feed power to multiple components FC and CP of the X-ray device RG for normal operation. Furthermore, the acquisition path EP may be configured to feed power to a subset of the multiple components CP and FC of the X-ray device RG for acquisition operation. The monitoring unit SU may be configured to detect the input voltage at the power supply input terminal of the power supply unit VS using a sensor. Furthermore, the monitoring unit SU may be configured to provide a control signal SIG to the power supply unit VS based on the detected input voltage. The power supply unit VS may be configured to provide an operating voltage to the corresponding components FC and / or CP via the operating path BP or an acquisition voltage to the corresponding components FC and / or CP via the acquisition path EP, based on the detected input voltage, particularly the control signal SIG.

[0058] The operating path BP can be configured to power at least one digital component and at least one analog component of the X-ray device for normal operation. Furthermore, the acquisition path EP can be configured to power at least one of the at least one analog component of the X-ray device for acquisition operation.

[0059] Apart from feeding multiple components CP of the X-ray equipment RG and a subset of CP of FC, the operating path BP and the acquisition path EP can be different. Alternatively, the acquisition path EP can be a subpath of the operating path BP.

[0060] The monitoring unit SU can be configured to compare the input voltage with a preset voltage threshold. Furthermore, the power supply unit SV can provide operating voltage via operating path BP when the threshold is reached or exceeded, or provide acquisition voltage via acquisition path EP when the threshold is below. For example, the monitoring unit SU can be configured to provide a control signal SIG to the power supply unit SV based on the comparison.

[0061] The power supply unit SV may have a first voltage source PS.N and a second voltage source PS.E. Here, the first voltage source PS.N is configured to power the operating path for normal operation. Furthermore, the second voltage source PS.E is configured to power the acquisition path for acquisition operation. The power supply unit SV may, for example, have a switching element SE configured to switch between the first and second voltage sources PS.N and PS.E to power the corresponding path for the corresponding operation.

[0062] Figure 2 A schematic diagram showing another advantageous embodiment of the proposed power supply circuit for an X-ray device RG is shown.

[0063] The power supply unit SV may, for example, have a diode DS as a switching element, wherein the diode DS can switch between the first and second voltage sources PS.N and PS.E in order to feed power to the corresponding paths for the corresponding operation.

[0064] Figure 3 A schematic diagram illustrating another advantageous embodiment of the proposed power supply circuit for an X-ray device is shown. Here, the X-ray device may have a detection unit 1 and a modulation unit CU. The modulation unit CU may be configured to provide energy for acquiring the acquisition state of the detection unit 1. Furthermore, the acquisition path EP may be configured to at least feed power to the modulation unit CU.

[0065] The detection unit may have a semiconductor material and be configured for detecting photon counting of X-ray radiation. Furthermore, the adjustment unit CU may be configured to adjustably maintain the semiconductor material in an acquisition state using provided energy. The adjustment unit CU may also be configured to provide energy for acquiring the acquisition state through heat transfer and / or irradiation of the detection unit 1.

[0066] As in Figure 3 As shown, a first current source CS.N can be configured to feed power to the operating path for normal operation. Furthermore, a second current source CS.E can be configured to feed power to the acquisition path for acquisition operation. The power supply unit VS can also have a first voltage source PS.N for providing the operating voltage for normal operation and a second voltage source PS.E for providing the acquisition voltage for acquisition operation. Additionally, the power supply unit can have a third voltage source PS.C for providing an additional voltage to the regulation unit CU. A relay R can be used to switch between acquisition operation and normal operation, particularly between the acquisition path and the operating path. The regulation unit CU can, for example, ensure that the fundamental current in the semiconductor material of the detection unit, particularly the acquisition current, remains active even during acquisition operation under high voltage, especially under bias voltage.

[0067] Figure 4 A schematic diagram illustrating an advantageous embodiment of the proposed method for operating an X-ray device having the proposed power supply circuit is shown. In a first step, an input voltage, PROV-VI, can be supplied to the power supply circuit via at least one voltage source. In a subsequent step, the input voltage, DET-VI, at the power supply input terminal of the power supply unit can be detected by a sensor. In a further step, based on the detected input voltage, an operating voltage can be supplied via an operating path to PROV-VB to multiple components of the X-ray device, or an acquisition voltage can be supplied via an acquisition path to PROV-VE to at least one component of the X-ray device.

[0068] Advantageously, the power supply unit can supply the operating voltage or the acquired voltage to the regulating unit CU based on the detected input voltage, especially based on the control signal SIG. Here, in any case, the regulating unit CU can provide energy for acquiring the state of the detection unit 1. (Opposite)

[0069] Figure 5 A schematic diagram of a CT system 33, as an exemplary embodiment of the proposed X-ray device RG, is shown. The CT system 33 may include an X-ray source 37, a detection unit 1, at least one voltage source SQ, the proposed power supply circuit, and a processing unit PRVS. Here, the X-ray source 37 and the detection unit 1, which includes, in particular, an X-ray detector, may be arranged opposite each other. The X-ray source 37 may be configured to irradiate the detection unit 1, and in particular the X-ray detector, with X-ray radiation along the X-ray incident direction.

[0070] At least one voltage source SQ can selectively provide the operating voltage as an input voltage to the power supply circuit in a first operating state or in a second operating state. Specifically, the CT system 33 may have first and second voltage sources (not shown here). Here, the first voltage source can be configured to provide the operating voltage as an input voltage to the power supply circuit in the first operating state, and the second voltage source can be configured to provide the acquired voltage as an input voltage to the power supply circuit in the second operating state.

[0071] In the first operating state, the power supply unit SV can provide operating voltage to the X-ray source 37 and the detection unit 1 via the operating path BP based on the detected input voltage for normal operation, so that X-ray radiation for irradiating the detection unit 1 can be emitted by the X-ray source 37 and the X-ray radiation can be detected by the detection unit 1. In the second operating state, the power supply unit SV can provide acquisition voltage to a subset of multiple components of the CT system 33 via the acquisition path EP based on the detected input voltage for acquisition operation.

[0072] Advantageously, the CT system 33 may also include an adjustment unit CU. The adjustment unit CU may be configured to provide energy for acquiring the acquisition state of the detection unit 1. Furthermore, the acquisition path EP may be configured to at least power the adjustment unit CU. In addition, the power supply unit SV may, in the second operating state, provide an acquisition voltage to the adjustment unit CU via the acquisition path EP based on the detected input voltage.

[0073] The CT system 33 may further include a gantry 32 with a rotor 35. The X-ray source 37 and the detector unit 1 may be arranged on the rotor 35 in a defined arrangement, particularly integrated into or fixed to the rotor 35. The rotor 35 may be rotatably supported about a rotation axis 43. The object to be imaged 39 may be supported on a patient support device 41 and may move along the rotation axis 43 through the gantry 32. A processing unit PRVS may be used to control the CT system 33 and to calculate cross-sectional or volumetric images of the object 39. Input devices 47 (e.g., a keyboard) and output devices 49 (e.g., a screen and / or display) may be connected to the processing unit PRVS, particularly coupled in signal technology. The input device 47 may advantageously be integrated into the output device 49, for example, in a resistive and / or capacitive input display.

[0074] The schematic diagrams included in the accompanying drawings do not depict scale or dimensional relationships.

[0075] Finally, it must be reiterated that the methods and apparatus described in detail above are merely embodiments and can be modified in different ways by those skilled in the art without departing from the scope of the invention. Furthermore, the use of the indefinite articles "a" or "an" does not preclude the existence of multiple features involved. Similarly, the terms "unit" and "element" do not preclude the possibility that a related component consists of multiple cooperating sub-components, which may, if necessary, be spatially distributed.

[0076] In the context of this application, the expression "based on" can be understood, in particular, in the sense of "using". In particular, the statement that the first feature is generated (alternatively: obtained, determined, etc.) based on the second feature does not preclude the first feature from being generated (alternatively: obtained, determined, etc.) based on the third feature.

Claims

1. A power supply circuit for an X-ray apparatus (RG), comprising a power supply unit (SV) and a monitoring unit (SU), in, The power supply unit (SV) has an operating path (BP) and an acquisition path (EP). The operating path (BP) is configured to power multiple components of the X-ray equipment (RG) for normal operation. The acquisition path (EP) is configured to power a subset of the plurality of components of the X-ray apparatus (RG) for acquisition operation. The monitoring unit (SU) is configured to detect the input voltage at the power supply input terminal of the power supply unit (SV) using a sensor. The power supply unit (SV) is configured to provide operating voltage to the corresponding component via the operating path (BP) or to provide acquired voltage to the corresponding component via the acquisition path (EP) based on the detected input voltage.

2. The power supply circuit according to claim 1, in, The operating path (BP) is configured to power at least one digital component and at least one analog component of the X-ray equipment (RG) for normal operation. The acquisition path (EP) is configured to power at least one of the at least one analog component of the X-ray apparatus (RG) for acquisition operation.

3. The power supply circuit according to any one of the preceding claims, in, Apart from feeding a subset of the plurality of components of the X-ray apparatus (RG), the operating path (BP) and the acquisition path (EP) are different.

4. The power supply circuit according to any one of claims 1 or 2, in, The acquisition path (EP) is a sub-path of the running path (BP).

5. The power supply circuit according to any one of the preceding claims, in, The monitoring unit (SU) is configured to compare the input voltage with a preset voltage threshold. The power supply unit (SV) provides the operating voltage via the operating path (BP) when the voltage threshold is reached or exceeded, or provides the acquisition voltage via the acquisition path (EP) when the voltage threshold is lower than the voltage threshold.

6. The power supply circuit according to any one of the preceding claims, in, The X-ray device (RG) has a detection unit (1) and a modulation unit (CU). The adjustment unit (CU) is configured to provide energy for acquiring the acquisition state of the detection unit (1). The acquisition path (EP) is configured to at least power the regulating unit (CU).

7. The power supply circuit according to claim 6, in, The detection unit (1) has a semiconductor material and is configured for detecting photon counting of X-ray radiation. The regulating unit (CU) is configured to maintain the semiconductor material in the acquired state by means of the provided energy.

8. The power supply circuit according to claim 6 or 7, in, The regulating unit (CU) is configured to provide energy for acquiring the acquisition state by means of heat transfer and / or irradiation of the detection unit (1).

9. An X-ray apparatus (RG) comprising an X-ray source (37), a detection unit (1), at least one voltage source (SQ), and a power supply circuit according to any one of the preceding claims. in, The at least one voltage source (SQ) selectively provides the operating voltage as an input voltage to the power supply circuit in a first operating state or provides the acquired voltage as an input voltage to the power supply circuit in a second operating state. In the first operating state: The power supply unit (SV) provides the operating voltage to the X-ray source (37) and the detection unit (1) via the operating path (BP) based on the input voltage for normal operation, so that X-ray radiation for irradiating the detection unit (1) can be emitted by the X-ray source (37) and the X-ray radiation can be detected by the detection unit (1). In the second operating state: The power supply unit (SV) provides the acquisition voltage to a subset of the plurality of components of the X-ray apparatus (RG) via the acquisition path (EP) based on the input voltage for acquisition operation.

10. The X-ray apparatus (RG) according to claim 9, comprising a first voltage source and a second voltage source. in, The first voltage source is configured to provide the operating voltage as the input voltage to the power supply circuit in the first operating state. The second voltage source is configured to provide the acquired voltage as the input voltage to the power supply circuit in the second operating state.

11. The X-ray apparatus (RG) according to claim 9 or 10, comprising a power supply circuit according to any one of claims 6 to 8, wherein, In the second operating state, the power supply unit (SV) provides the acquired voltage to the regulating unit (CU) via the acquisition path (EP) based on the input voltage.

12. The X-ray apparatus (RG) according to any one of claims 9 to 11, in, The X-ray device (RG) is configured as a computed tomography system (33). The X-ray source (37) and the detection unit (1) are rotatably supported in a defined arrangement.

13. A method for operating an X-ray apparatus (RG) having a power supply circuit according to any one of claims 1 to 8, comprising: - An input voltage (PROV-VI) is provided to the power supply circuit using at least one voltage source (SQ). - The sensor is used to detect the input voltage at the power supply input terminal of the power supply unit (SV). - Based on the detected input voltage, an operating voltage (PROV-VB) is provided to the corresponding component of the X-ray device (RG) via the operating path (BP) or an acquisition voltage (PROV-VE) is provided to the corresponding component of the X-ray device (RG) via the acquisition path (EP).

14. The method according to claim 13, in, The X-ray device (RG) has a power supply circuit according to any one of claims 6 to 8. The power supply unit (SV) provides the operating voltage or the acquired voltage to the regulation unit (CU) based on the detected input voltage. In any case, the adjustment unit provides energy for acquiring the acquisition state of the detection unit (1).

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