Fast correlation RF extension for automatic hardware interface switching

Abstract

The invention relates to fast related RF extension for automatic hardware interface switching. Embodiments of the present disclosure provide a fast association (FASTCO) extension module that can couple various components for device testing and quickly associate measurements of table equipment with measurements of ATE to achieve more accurate and more efficient device testing. Furthermore, the FASTCO module disclosed herein allows both the ATE and table devices to use the same test fixture and load board, which greatly simplifies the associated process. Furthermore, commands and data may be generated using a high-level programming language to control the FASTCO module for routing signals to various components, such as automatic test equipment (ATE), any table equipment (e.g., signal generator, spectrum analyzer, etc.), DUT, etc., and for example, the routing may advantageously be automatically managed by the ATE according to a test program.

Description

Technical Field

[0001] Embodiments of this disclosure relate to the field of device testing. More specifically, embodiments relate to techniques for automatically coupling automated test equipment, benchtop equipment, or other devices. Background Technology

[0002] Devices under test (DUTs) are typically tested before being sold to determine their performance and conformity. For example, a large number of test cases can be used to test the DUT, and the results of these test cases can be compared to expected outputs. When the results of the test cases do not match satisfactory expected values ​​or the expected range, the device can be considered a non-conforming device or an outlier, and can be discarded based on performance parameters, etc. As is well known, DUTs generally refer to electronic devices.

[0003] DUTs are typically tested by automated or automated test equipment (ATE) or automated test system (ATS), which can be used to perform complex tests using software and automation techniques to improve testing efficiency. A DUT can be any type of semiconductor device, wafer, or component intended for integration into a final product, such as a computer, network interface, memory, or other hardware component like a solid-state drive (SSD). Removing defective or unsatisfactory chips during manufacturing using ATE and ATS can significantly improve the quality of the finished product.

[0004] Testing devices in this manner typically involves the use of a wide variety of equipment, known as benchtop instruments, which can include spectrum analyzers, signal generators, and so on. Connecting and disconnecting devices from benchtop instruments and systems at various stages of testing is a time-consuming process that introduces various types and sizes of wires and connections, potentially leading to human error and confusion during test setup and configuration. Furthermore, different devices, wires, and connectors may require characterization and de-embedding to ensure test accuracy, further complicating device testing when using different types of benchtop equipment to test multiple devices.

[0005] To debug and correlate test results generated by the test system with those from different types of benchtop equipment, it is essential to measure and understand the effects of the benchtop equipment and its wiring / connectors (e.g., losses). De-embedding refers to the process of mathematically removing the influence of cables, test fixtures, or other structures from measurement results to accurately characterize a specific DUT. This process is crucial for ensuring that test measurements reflect the true performance and characteristics of the DUT (without significant alterations due to the characteristics of connecting cables or fixtures). Accurate de-embedding requires precise characterization, enabling the isolation and elimination of these effects from the measurement data as mathematically as possible.

[0006] Correlation refers to the process of ensuring that measurements and data obtained from RF testing using an ATE / ATS system are consistent with and directly comparable to results obtained from testing with external benchtop equipment. Unfortunately, current methods for correlation and de-embedding benchtop equipment used with test systems are time-consuming processes, requiring repetition for example, when using new equipment or wires, or whenever a component is disconnected and reconnected to a new load board. Using benchtop equipment during device testing may involve using different test fixtures and load boards than the test system, further increasing the time, cost, and complexity of the testing and correlation processes. This is particularly evident for some benchtop equipment that is typically soldered directly to the load board, as different load boards are required for different test phases. Changing load boards during device testing is an extremely expensive and time-consuming process, significantly reducing test throughput and efficiency.

[0007] The inherent complexity introduced when using external workbench devices for device testing has led to several solutions involving complex interfaces. These solutions utilize switch matrix logic to manually select ports for device testing with different workbench devices, such as... Figure 1 As shown, Figure 1 This represents a typical commercial switch matrix 100.

[0008] exist Figure 1In the example, exemplary switch circuit 100 may be positioned between the DUT and the test system (e.g., mounted on the front panel of the ATE or placed on top of the ATE) and uses, for example, 1 to 4 switches to bidirectionally route information between 4 different locations. For example, switch circuit 100 may be used to selectively route 4 different ports of automated test equipment or benchtop equipment 110 to 4 different device ports 105 for device testing. However, using one or more of these switch circuits significantly increases test complexity because these switches are typically housed in small boxes placed around existing test equipment and typically require separate carrier boards and / or sockets to connect to the DUT. In addition to the new load board and switches, additional cables are required, and these cables are typically stacked on top of the test equipment, adding additional mechanical structure for support, and critical RF paths are routed through and around the modified load board.

[0009] Unfortunately, these electrical and mechanical challenges can affect the results generated using standard production load boards and sockets, and may cause ATE results to deviate from expected benchtop results. A simpler and more automated approach to device testing using benchtop instruments and automated test equipment is desired, with faster and more accurate correlations. Summary of the Invention

[0010] Therefore, embodiments of this disclosure provide a fast correlation (FASTCO) extension module that can selectively couple various components for device testing and quickly correlate benchtop equipment with the ATE (Automatic Test Equipment), thereby enabling more accurate and efficient device testing. Furthermore, the FASTCO module disclosed herein allows both the ATE and the benchtop equipment to use the same test fixtures and load boards, which greatly simplifies the correlation and testing process. Additionally, high-level programming languages ​​can be used to generate commands and data to control the FASTCO module for routing signals to various components, such as the ATE, any benchtop equipment (e.g., signal generator, spectrum analyzer, etc.), and the DUT (Device Under Test). Further, for example, the routing performed by the FASTCO module can be automatically managed by the ATE according to the test procedure.

[0011] According to one embodiment, an apparatus for selectively coupling devices in a test system is disclosed. The apparatus includes: a plurality of switches; and a communication port operable to receive control commands to control the plurality of switches to selectively couple devices in the test system. A first set of the plurality of switches is communicatively coupled to a load board for receiving a device under test (DUT) for device testing.

[0012] According to some embodiments, the ATE is operable to control multiple switches via a communication channel through a communication port.

[0013] According to some embodiments, a first set of multiple switches may also be operable to selectively couple a signal path from the load board to the ATE to perform device testing on a DUT mounted on the load board according to a test procedure executed by the ATE.

[0014] According to some embodiments, the device includes a microcontroller operable to receive control commands via a communication channel and to control a plurality of switches according to the control commands.

[0015] According to some embodiments, a first set of multiple switches may also be operable to selectively and communicatively couple a load board to a bench instrument for bench testing of the DUT while it is mounted on the load board.

[0016] According to some embodiments, the communication port includes an Ethernet port, and the test program includes a Java test program operable to access an external instrument driver library to control the workbench instrument via Ethernet.

[0017] According to some embodiments, multiple switches are operable for control by a test program executed by the ATE, and the test program accesses information mapping the ATE's pogo pins to ports to automatically couple components using the ports to control the switches.

[0018] According to some embodiments, multiple switches are operable to provide a loopback communication path for measuring path loss, and the ATE is operable to perform an automatic correlation procedure to correlate the ATE's measurements with those of the stage instrument based on the path loss.

[0019] According to some embodiments, the ATE can also be operated to automatically verify the results of an automatic correlation procedure by coupling the ATE to a workbench device using multiple switches, and to receive input RF signals generated by the workbench device and to be measured at the ATE.

[0020] According to another disclosed embodiment, a test system for device testing is disclosed. The system includes: an automated test apparatus (ATE); a load board including multiple receptacles; and a radio frequency (RF) expansion module including multiple operable switches. The RF expansion module is operable to receive commands sent by the ATE to control the operation of the multiple switches to couple the ATE to a device under test (DUT) that can be positioned in the multiple receptacles for device testing.

[0021] According to some embodiments, the RF expansion module can also be operated to control multiple switches to couple the DUT to a bench instrument for testing the DUT.

[0022] According to some embodiments, the RF extension module can also be operated to control the operation of multiple switches to couple the ATE to a stage instrument for performing path loss calibration and verification operations.

[0023] According to some embodiments, the RF extension module can also be operated to control the operation of multiple switches to provide a loopback communication path for performing path loss calibration and verification operations of the RF extension module.

[0024] According to some embodiments, the RF expansion module also includes an Ethernet interface, which is operable to receive commands via the Ethernet interface to control the operation of multiple switches according to a test procedure that maps the spring pins of the ATE to the DUT ports coupled to the load board.

[0025] According to various embodiments, a method for automated hardware interface switching for device testing using a radio frequency (RF) expansion module is disclosed. The method includes: receiving a command from an automated test equipment (ATE) for coupling a first test system component to a second test system component; controlling the operation of a plurality of switches of the RF expansion module to couple the first test system component to the second test system component; generating an RF signal using the first test system component; automatically routing the RF signal to the second test system component via the plurality of switches; and measuring the RF signal at the second test system component.

[0026] According to some embodiments, a first test system component includes an ATE (Automatic Test Equipment), and a second test system component includes a load board with multiple sockets operable to receive a device under test (DUT) for device testing of the DUT by the ATE.

[0027] According to some embodiments, the first test system component includes an ATE (Automatic Test Equipment), and the second test system component includes a bench instrument.

[0028] According to some embodiments, the ATE is operable to verify path loss calibration between the ATE and the stage instrument by measuring the RF signal generated by the stage instrument at the ATE.

[0029] According to some embodiments, commands from the ATE are received by the microcontroller of the RF expansion module via Ethernet.

[0030] According to some embodiments, a first test system component includes a first device under test (DUT) component, a second test system component includes a second DUT component, and controls the operation of a plurality of switches to form a loop path operable to receive RF signals from the first DUT component and transmit RF signals back for the second DUT component to receive. Attached Figure Description

[0031] The accompanying drawings, which are incorporated in and form part of this specification, illustrate embodiments of the present disclosure and, together with the specification, serve to explain the principles of the present disclosure:

[0032] Figure 1 An exemplary bidirectional RF switching module in the prior art, as described above, is depicted.

[0033] Figure 2 This is a block diagram of an exemplary test system that uses a FASTCO module to selectively couple a DUT to an ATE or bench instrument to test or characterize components of a test system, according to embodiments of this disclosure.

[0034] Figure 3 This is a block diagram of an exemplary test system depicting embodiments of the present disclosure, which uses FASTCO modules to selectively couple a load plate to an ATE or bench instrument for testing multiple DUTs and / or characterizing components of a test system.

[0035] Figure 4 This is an illustration of an exemplary FASTCO module depicting a load board coupled to an ATE according to an embodiment of the present disclosure. The exemplary FASTCO module is used to selectively couple the ATE to a DUT and / or a stage instrument.

[0036] Figure 5 An exemplary schematic diagram of an instrument switching module according to an embodiment of the present disclosure is depicted, which couples multiple workbench ports to four inputs of an RF expansion module for selective switching, thereby providing device testing or characterization / association of test components.

[0037] Figure 6 An exemplary schematic diagram of an RF expansion module according to an embodiment of the present disclosure is depicted, which couples four ISM inputs to 16 DUT ports for selective switching, thereby providing device testing or characterization / association of test system components.

[0038] Figure 7 This is an illustration of an exemplary instrument switching module having a trigger input disposed in a housing, according to an embodiment of the present disclosure.

[0039] Figure 8 This is an illustration of an exemplary RF expansion module including multiple ATE ports and DUT ports according to embodiments of the present disclosure.

[0040] Figure 9 This is an illustration of an exemplary RF extension module coupled to an exemplary ATE for device testing or characterization / association of test system components, according to embodiments of this disclosure.

[0041] Figure 10 This is a block diagram of an exemplary RF extension module that performs an automatic 2x loopback loss measurement process to determine the loss associated with the ATE according to embodiments of the present disclosure.

[0042] Figure 11 This is a block diagram of an exemplary RF expansion module that performs an automatic loss measurement process to determine the loss between the RF expansion module and the ISM according to embodiments of the present disclosure.

[0043] Figure 12 This is a block diagram of an exemplary RF extension module that performs an automatic calibration and verification process based on RF signals received by the ISM and routed to the ATE RF interface board, according to embodiments of the present disclosure.

[0044] Figure 13 This is a block diagram of an exemplary RF extension module that receives RF signals from the RF interface board of an ATE and routes the signals to a measuring instrument for calibration verification, according to an embodiment of the present disclosure.

[0045] Figure 14 This is an illustration of an exemplary FASTCO programming architecture according to embodiments of the present disclosure, including a testprogram workspace executed by a computer system that communicates with FASTCO extension modules to control their operation.

[0046] Figure 15 This is a flowchart depicting an exemplary sequence of computer-controlled steps for automatically and selectively coupling test system components (e.g., ATE or ATS, DUT mounted on a load plate, bench instrument) according to embodiments of the present disclosure.

[0047] Figure 16 This is a flowchart depicting an exemplary sequence of computer-controlled steps for automatically and selectively coupling ports of a load board to ports of an ATE for device testing, according to embodiments of the present disclosure.

[0048] Figure 17 This is a flowchart depicting an exemplary sequence of computer-controlled steps for automatically and selectively coupling a benchtop instrument to a DUT for instrument testing, according to embodiments of the present disclosure.

[0049] Figure 18 This is a flowchart depicting an exemplary sequence of computer-controlled steps for automatically and selectively coupling a stage instrument to characterize or verify the signal path of a test system according to embodiments of the present disclosure. Detailed Implementation

[0050] Reference will now be made in detail to several embodiments. While the subject matter will be described in conjunction with alternative embodiments, it will be understood that they are not intended to limit the claimed subject matter to these embodiments. Rather, the claimed subject matter is intended to cover alternatives, modifications, and equivalents that may be included within the spirit and scope of the claimed subject matter as defined in the appended claims.

[0051] Furthermore, numerous specific details are set forth in the following detailed description in order to provide a thorough understanding of the claimed subject matter. However, those skilled in the art will recognize that embodiments may be practiced without these specific details or with their equivalents. In other instances, well-known methods, procedures, elements, and circuits have not been described in detail to avoid unnecessarily obscuring aspects and features of the subject matter.

[0052] The following detailed description is presented and discussed according to one method. Although the diagrams describing the operation of this method (e.g., Figure 15-18 The steps and sequence thereof are disclosed in the accompanying drawings, but these steps and sequences are exemplary. The embodiments are well adapted to perform various other steps or variations thereof as enumerated in the flowcharts of the accompanying drawings, and to perform them in a different order than that depicted and described herein.

[0053] Some parts of the detailed description are presented according to the procedures, steps, logic blocks, processes, and other symbolic representations of operations performed on data bits that can be executed on computer memory. These descriptions and representations are the means by which those skilled in the art of data processing most effectively communicate their work to others skilled in the art. Here, programs, computer-executed steps, logic blocks, processes, etc., are generally considered as a self-consistent sequence of steps or instructions that lead to a desired result. These steps are those that require physical operations on physical quantities. Typically, although not essential, these quantities take the form of electrical or magnetic signals that can be stored, transmitted, combined, compared, and otherwise manipulated in a computer system. Primarily for common use, it is sometimes convenient to refer to these signals as bits, values, elements, symbols, characters, terms, numbers, parameters, etc.

[0054] However, it should be remembered that all these and similar terms are associated with appropriate physical quantities and are merely convenient labels applicable to those quantities. Unless explicitly stated in the discussion below, it should be understood that throughout the discussion, the use of terms such as “access,” “write,” “include,” “store,” “transfer,” “associate,” “identify,” “encode,” and “tag” refers to the actions and processes of a computer system or similar electronic computing device that manipulate and convert data represented as physical (electronic) quantities in the registers and memories of the computer system, and convert them into other data similarly represented as physical quantities in the computer system’s memory or registers or other such information storage, transmission, or display devices.

[0055] Some embodiments can be described in the general context of computer-executable instructions, such as program modules, that are executed by one or more computers or other devices. Typically, program modules include routines, algorithms, programs, objects, components, data structures, etc., that perform specific tasks or implement specific abstract data types. Typically, in various embodiments, the functionality of program modules can be combined or distributed as needed.

[0056] Fast Associated RF Extensions for Automated Coupling of Test Systems with Devices and Bench Instruments

[0057] Embodiments of this disclosure provide a Fast Association (FASTCO) extension module capable of connecting various components for device testing and rapidly associating benchtop equipment measurements with ATE measurements, thereby enabling more accurate and efficient device testing. Furthermore, the FASTCO module disclosed herein allows both the ATE and benchtop equipment to use the same test fixtures and load boards, significantly simplifying the association process. Further, high-level programming languages ​​can be used to generate commands and data to control the FASTCO module for routing signals to various components, such as automated test equipment (ATE), arbitrary benchtop equipment (e.g., signal generators, spectrum analyzers, etc.), DUTs, etc., and this routing can, for example, be advantageously managed automatically by the ATE according to the test procedure.

[0058] Figure 2This is a block diagram of an exemplary test system 200 including a FASTCO module 204 according to embodiments of the present disclosure. The FASTCO module 204 is advantageously used to selectively couple a DUT 202 to an ATE 206 or a bench instrument to test, characterize, and / or correlate the results of components of the test system 200. The FASTCO module 204 may include multiple components, one or more of which are positioned proximate to a load board coupled to the ATE 206, the load board including a socket for testing the DUT 202. Advantageously, the test system 200 can selectively couple the ATE 206 or the bench instrument 208 to the DUT 202 for testing without replacing the load board. Furthermore, the FASTCO module 204 can provide a loopback path between the ATE 206 and the bench instrument 208 for automated path loss measurement of FASTCO components. In this way, the FASCO module 204 significantly improves the speed and accuracy of device testing using automated device testing and path loss characterization techniques without the need to replace (e.g., swap in or out) load boards, cables, fasteners, etc.

[0059] Figure 3 This is a block diagram depicting an exemplary test system 300 including a FASTCO module 302, according to embodiments of the present disclosure. The FASTCO module 302 is advantageously used to selectively couple a load plate 304 to an ATE 308 or a bench instrument 306 for testing multiple DUTs and characterizing test components of the test system 300. Figure 3 In the example, FASTCO module 302 includes six bench ports that can be selectively routed to either ATE 308 or load board 304 ports. According to some embodiments, any number of bench ports may be included. Bench instruments may include, for example, vector signal generators (VSGs), vector signal analyzers (VSAs), spectrum analyzers, frequency generators, etc.

[0060] Load board 304 includes 32 DUT ports (in this example) coupled to FASTCO module 302. Load board 304 may include more or fewer DUT ports depending on the embodiment. ATE 308 may control FASTCO module 302 (e.g., its internal switches) to automatically couple bench instrument 306 to the DUTs on load board 304 (e.g., serially), and may automatically route signals to another bench instrument to test the DUT, etc. Figure 3In the example, 32 DUTs can be selectively coupled to one of six different benchtop instruments for bench testing, and the DUTs can be automatically disconnected from the benchtop instrument and coupled to the ATE 308 for device testing at any time. The specific number of DUTs and benchtop instruments given above are merely exemplary.

[0061] FASTCO module 302 also includes, for example, 32 ATE ports for communicating with ATE 308, for example, for automated RF testing of the DUT set on load board 304, and / or for correlating the results of ATE 308 with the results of benchtop instrument 306 to ensure test accuracy. Figure 3 In the example, 32 DUTs (e.g.) can be selectively coupled to ATE 308 via FASTCO module 302. FASTCO module 302 can be automatically controlled by the test program to perform automatic hardware interface switching. For example, the ATE can control FASTCO module 302 according to the test program to switch between different benchtop devices and automatically stop the test at a specified test point after performing measurements (e.g., for debugging purposes).

[0062] Figure 4 This is an illustration of an exemplary FASTCO module 400 coupled to a load board 450 of an ATE according to an embodiment of the present disclosure. The exemplary FASTCO module 400 is used for selectively coupling test system components and DUTs. Furthermore, the FASTCO module 400 includes two remote extension modules (REMs) 402 and 404 disposed on the load board 450; and a separate instrument switching module (ISM) 406 capable of communicating with bench instruments coupled to the ISM 406 (e.g., via USB or Ethernet).

[0063] The ATE can send commands to the ISM 406 to control switches 408, 410, 412, and 414 of REM 402 and 404 to perform hardware interface switching, thereby automatically controlling the coupling of test components as needed for testing, characterization, debugging, etc. Figure 4 As shown, expansion modules 402 and 404 can be mirror images of each other and work in the same way using commands and data generated by the ATE to automatically control internal switches for coupling devices and routing signals as needed (e.g., according to test programs executed by the ATE).

[0064] exist Figure 4In the example, ISM 406 provides access to a total of six benchtop instrument ports 416, including three source instrument ports 418 for providing input RF signals and three measurement instrument ports 420 for measuring output RF signals. Of course, the specific number of benchtop instrument ports described above is merely exemplary. Advantageously, instruments connected to the benchtop instrument ports 416 can be coupled to the ATE or individual DUTs mounted on the load board 450 via configuration switches 408, 410, 412, and 414 without changing the load board, which significantly improves test efficiency and accuracy. Furthermore, the process of individually disassembling components can be avoided, as these components remain in place regardless of which components are used during testing.

[0065] Expansion module 404 includes a DUT port 422 that allows the ATE to connect to individual DUTs mounted on a load board 450 of the ATE, enabling the ATE to perform device testing. In this example, RF expansion modules 402 and 404 can be used to selectively connect to 16 DUTs. FASTCO ATE port 424 couples REM 404 to the ATE's RF interface module (RFIM) 426, and similarly, REM 402 couples to RFIM 428. Switches 408, 410, 412, and 414 can be configured to connect RFIM 426 to a DUT mounted on the load board 450 of the ATE via ports 422 and 424, allowing the ATE to perform testing operations on the DUTs without altering the load board 450 or running long cables that might require characterization prior to testing. Furthermore, for example, switches 408, 410, 412, and 414 of REM402 and 404 can be automatically controlled by the ATE according to the test procedure, and the test procedure can be seamlessly switched between the ATE and the bench instrument during the testing of the DUT.

[0066] Figure 4 The depicted embodiments are also operable to perform loopback tests via diagnostic control and setup of the ISM 406 and external benchtop devices to verify signal paths. For example, a signal generator may be coupled to source instrument port 418, and the signal may be routed to RF interface module 426 to characterize the path between the ISM 406 and RF interface module 426. Further details regarding the characterization and verification procedures between the ATE, ISM, and REM will be provided below. Figure 10-13 Other embodiments of this disclosure are described below.

[0067] Figure 5This is a schematic diagram of an exemplary ISM 500 according to an embodiment of the present disclosure, which is used for automatic selective switching to provide device testing or characterization / association of test system components. The left side of the ISM 500 includes six bench ports (e.g., IPort 1, IPort 2, IPort 3, IPort 4, IPort 5, IPort 6) for coupling various bench instruments for device testing and / or association purposes. The bench ports are routed via multiple controllable switches (e.g., ADRF semiconductor chips) to route signal paths as needed during testing. Figure 5 The signal path depicted is bidirectional. Different numbers of workstation ports can be considered.

[0068] exist Figure 5 In the example, the RF signal input (stim) 506 is coupled to a 4:1 switch_01, and the RF signal output (meas) 508 is coupled to a 4:1 switch_02. The ports of switch_01 and switch_02 are coupled to 1:2 switches switch_03 and switch_04, respectively. The ports of switch_03 and switch_04 are coupled to 1:4 switches switch_05, switch_06, and switch_07 and switch_08, respectively, and these switches can be coupled to (for example) a total of 16 ports to interact with, for example... Figure 6 The REM 600 interface connection is shown. This allows the ISM 500 switch to automatically toggle, enabling bench instruments coupled to bench ports IPort 1, IPort 2, IPort 3, IPort 4, IPort 5, and IPort 6 to selectively couple to the REM 600 ports. For example, the REM 600 can also route these paths to an ATE or a DUT mounted on a load board for device testing or path loss characterization. Figure 5 In the example, two measurement paths RX_A1 and RX_A2 and two stimulation paths TX_A1 and TX_A2 are routed to REM 600.

[0069] The ISM 500 includes a processor 502 (e.g., a microcontroller (MCU)) and a LAN or USB interface that communicates with an RF interface board (RFIB) 504. The RFIB 504 communicates with REM's RFIB FIB module (e.g., Figure 6The RFIB module 606 communicates with the REM 600 to control the REM 600 (e.g., control the REM's switch) for routing RF signals as needed during testing / characterization. For example, the switching of the ISM 500 and REM 600 can be automatically controlled by the MCU according to the test program executed by the ATE communicating with the ISM 500. The ISM 500 can communicate with the ATE via any connection type and can be a wired connection, such as USB, Ethernet, etc. According to an embodiment, the RFIB 504 is also responsible for performing power supply, diagnostics, monitoring, and maintenance functions for the ISM 500 and REM.

[0070] Figure 6 This is a schematic diagram of an exemplary REM 600 (as described above) according to an embodiment of the present disclosure, which is used for automatic selective switching to provide device testing or characterization / association of test system components. The left side of the REM 600 includes four ports coupled to signal paths RX_A1, RX_A2, TX_A1, and TX_A2 of an instrument switching module (e.g., ISM 500), for selectively coupling a benchtop instrument to the DUT for device testing, or selectively coupling a benchtop instrument to an ATE to determine path loss information or verify compensation factors of test system components. Figure 6 The signal path depicted is bidirectional, and the number of ports mentioned above is merely illustrative.

[0071] exist Figure 6 In the example, the RX_A1 or TX_A1 port can be selectively coupled to RFIM ports 1-8 and DUT ports 1-8 by controlling switch_09, switch_10, switch_11, switch_12, switch_13, and switch_14. Typically, ports RX_A1 and RX_A2 receive signals from the instrument that generates the RF output signal (stim), and ports TX_A1 and TX_A2 send signals to the instrument that receives the RF input signal (e.g., for measurement).

[0072] Switch_13 is a 1:4 switch that selectively couples either RX_A1 or TX_A1 to RFIM / DUT ports 1-4. Similarly, switch_14 selectively couples either RX_A1 or TX_A1 to RFIM / DUT ports 5-8. This allows bench instruments coupled to ISM ports RX_A1 and TX_A1 to automatically couple to RFIM / DUT ports 1-8 during testing without requiring cabling or loadboard changes, significantly reducing testing costs and improving testing efficiency.

[0073] Switches 09 and 10 can be configured to: provide a loopback path 608 when both switches are configured to position 1; provide DUT / ATE coupling when configured to positions 2-3; and ground or "off" when configured to position 4. Switches 09 and 10 are selectively coupled to switches 13 and 14 via switches 11 and 12. Switches 15, 16, 17, 18, 19, 20, 21, and 22 can be configured to couple switches 13 and 14 to the corresponding RFIM or DUT ports. For example, switch 16 can selectively couple switch 13 to RFIM port 1 (602) or DUT port 1 (604), and so on.

[0074] RX_A2 and TX_A2 can be selectively coupled to RFIM port 9-16 or DUT port 9-16 using an internal switch controlled by ISM 500, in the same manner as described above for RFIM port 1-8 and DUT port 1-8.

[0075] RFIB FIB module 606 and RFIB (e.g., Figure 5 The ISM 500 communicates with the RFIB 504 to receive control commands from the ISM (e.g., for controlling the switch of the REM), to route RF signals as needed during testing / characterization, and for other maintenance operations, power control, etc.

[0076] Figure 7 This is a schematic diagram of an exemplary instrument switching module 700 according to an embodiment of the present disclosure, having a trigger input 702 and a workbench port 704 disposed in a housing 706. The ISM 700 can advantageously selectively route signals between a workbench instrument coupled to the workbench port 704 and a remote extension module of the FASTCO module for device testing, and the workbench instrument can be activated or controlled according to a trigger signal 702 sent from the ISM 700 to the workbench instrument. For example, the trigger signal 702 can be provided to the workbench instrument via the ISM 700 to initiate an RF measurement or activate an input RF signal. In this way, multiple workbench instruments can be controlled and coupled according to a test procedure for device testing, path characterization, correlation, etc. The ISM 700 can be controlled via a network interface 706.

[0077] Figure 8This is an illustration of an exemplary RF expansion module 800 of a FASTCO module according to an embodiment of the present disclosure. The exemplary RF expansion module 800 includes an ATE port 802 and a DUT port 804 for selectively coupling the ATE to a DUT disposed on a load board. The ATE port 802 may be coupled to an RFIM interface of the ATE (e.g., a pogo pad or spring pin), and the FASTCO module may be controlled to map the RFIM interface to a specific REM and its ATE port 802. The DUT port 804 may be coupled to the ATE load board and may route signals to / from the DUT disposed in a socket on the load board.

[0078] Figure 9 This is an illustration of an exemplary RF extension module (REM) 902 disposed in an ATE 900 according to an embodiment of the present disclosure, the exemplary REM 902 being used for device testing, characterization of test system components, and / or association. Figure 9 The diagram shows the REM 902 (open state) separated from the ATE 900, and the REM 902 (closed state) coupled to the ATE 900, allowing for visualization of the different components of the REM 902. Specifically, in the closed state, the REM 902 is inserted into an opening in the ATE 900 (e.g., in the test head of the ATE 900 located below the load board), which is designed to provide a pogo interface for coupling the ISM port 904 to a separate instrument switching module. The REM 902 is positioned close to the RFIM 910 of the ATE 900 and can be coupled to the RFIM 910 using one or more cables for transmitting signals between the ATE 900 and the REM 902. The bottom of the RF expansion module 902 includes a DUT port 906 and an ATE port 908, as described above regarding... Figure 8 As described, the RF expansion module can be securely coupled to the ATE and DUT, and can also be coupled to the ISM 912 for interface connections with benchtop instruments. Any cables used for coupling ports 904, 906, and 908 can be characterized / de-embedded first and then remain in place throughout the testing process, which greatly reduces the complexity of coupling various components and allows testing to be completed using a single load board.

[0079] Novel fast correlation RF extension path loss compensation and verification technology

[0080] Embodiments of this disclosure can use the described FASTCO extension module, controlled by a computer system or ATE, to automatically correlate and verify test system components and their configurations. Specifically, during device testing, the signal path (FRL) between the REM and ATE on the load board, and the signal path (FIL) between the stage instrument and the port of the REM module, can be determined and compensated. The FIL and FRL compensation factors can be verified by providing an RF input signal (stim) to the REM and by measuring this stim at the RFIM. De-embedding the signal path in this way significantly improves the accuracy of device measurements.

[0081] Figure 10 This is a block diagram of an exemplary RFIM 1002 according to an embodiment of the present disclosure, configured to coordinate with a FASTCO REM 1004 to perform an automated 2x closure loss measurement process for improved device testing. The loss measurement process can determine the characteristics of test system components so that these characteristics can be taken into account during device testing to ensure accurate and reliable device test results. Figure 10 In the example, the RF output signal (stim) 1006 is sent from RFIM 1002 to ATE port 1008 of FASTCO REM 1004, and then back via REM 1004 through DUT port 1010 to DUT port 1012. The signal is then routed out via ATE port 1014. Port 1014 is coupled to the measurement RF input port 1016 to perform a measurement characterizing the path taken by the signal, referred to as the FASTCO RFIM loss (FRL). FRL is equal to the difference between the measurement obtained at port 1016 and the stimulus 1006 provided at port 1006 minus half of any load plate loss (LBCL), as shown in the following formula:

[0082] FRL=((Meas–Stim)–LBCL) / 2dB

[0083] Figure 11 This is a block diagram of an exemplary REM 1102 according to an embodiment of the present disclosure, which is configured to perform an automatic loss measurement process to determine the loss between REM 1102 and ISM 1104. Figure 11In the example, the RF output signal (stim) 1106 is received by ISM 1104 and routed to ISM port 1108 of REM 1102. REM 1102 routes the signal out from DUT port 1110, and this signal is fed back as input to DUT port 1112 and provided to ISM port 1114 for routing back to ISM 1104. Measurements (meas) 1116 at stim 1106 and ISM 1104 can be performed by bench instruments coupled to the bench ports of SIGM 1104. For example, stim 1106 can be generated by a signal generator coupled to ISM 1104, and the loopback measurement can be performed by a signal analyzer coupled to ISM 1104. Figure 11 In this study, signal paths outside the calibration plane (cal plane 1150) are typically not characterized. Therefore, the loss (FIL) between FASTCO ISM 1104 and FASTCO REM 1102 before the calibration plane can be calculated as follows:

[0084] FIL = Stim@cal plane - Stim;

[0085] FIL = Meas - Meas@cal plane

[0086] Figure 12 This is a block diagram of an exemplary REM 1202 that performs an automatic verification process based on an RF signal (stim) 1220 received by ISM 1204 and routed to RFIM 1206, according to an embodiment of this disclosure. Figure 12 In the example, the FIL+FRL path loss is verified by comparing the input stim 1220 received by ISM 1204 with the measurement at RFIM 1206. For example, as Figure 12 As shown, the input stim 1220 can be generated by a signal generator or other benchtop instruments coupled to the instrument port of ISM 1204, and then routed to ISM port 1208 of REM 1202. The signal is returned via DUT ports 1210 and 1212, and then passed through ATE port 1214 to RFIM 1206 via port 1216, where the signal is measured by the ATE. The difference between the measurements at stim 1220 and 1216 represents the signal error. The signal error can be calculated as follows:

[0087] StimPower = StimPower + FIL

[0088] measPower=measPower.get(site)+FRL

[0089] MeasError=measPower-StimPower

[0090] In the above equation, measPower.get(site) refers to the actual signal measurement performed at a specific port of the RFIM 1206, and measPower is a measurement for FASTCO RFIM loss (FRL) adjustment. Figure 12 The verification process shown can be repeated for each of the (e.g.) 16 ATE ports of the RFIM 1206, where each ATE port measures stim 1220 provided via REM 1202 and generated by a bench instrument (e.g., a signal generator (not shown)) coupled to the ISM 1204.

[0091] Figure 13 This is a block diagram of an exemplary REM 1302 according to an embodiment of the present disclosure. The exemplary REM 1302 is configured to receive an RF input signal (stim) 1306 from an RFIM 1304 and route the signal 1306 to a DUT port 1308 to verify the FASTCO RFIM loss (FRL) calibration (without FIL compensation). The stim 1306 is routed from an ATE port 1310 to the DUT port 1308 and is measured outside the calibration plane 1312. It is noteworthy that cable loss outside the calibration plane 1312 can be compensated using cables with known characteristics or using a separate compensation process. An RF output 1314 is measured and compared to the stim 1306 to verify compensation factors (e.g., cable loss, FRL, RFIM stim error) for any application with high accuracy (e.g., within + / -1 dB of uncertainty).

[0092] Fast Associated RF Extended Programming Architecture

[0093] Some embodiments of this disclosure include executing test programs that access code, scripts, packets, routines, libraries, etc., for interfacing with the FASTCO extension module to coordinate and control its operation for efficient device testing. Testing may include executing associated programs and verifying their compensation factors. Some embodiments include accessing bench instrument library functions and drivers for interfacing with bench instruments of the ISM coupled to the FASTCO module. Some embodiments include accessing function libraries that interface with the FASTCO module.

[0094] Figure 14This is an illustration of an exemplary FASTCO programming architecture 1400 according to embodiments of the present disclosure, including a test program workspace 1402 executed by a computer system, which communicates, for example, via Ethernet with a FASTCO expansion module 1414 to control its operation. Figure 14 In the example, workspace 1402 is used to develop end-user test programs 1404 in Java using FASTCO project library 1406 (e.g.), which uses Java native interface 1408 to interface with C++ wrapper 1418 for communication with FASTCO extension module 1414 via API (including REM command 1410 and ISM command 1412). Of course, other suitable languages ​​can also be used. The API can communicate with the microcontroller (MCU) 1416 of FASTCO extension module 1414 to control hardware 1420 (e.g., switches, triggers, etc.). This allows for automatic hardware interface switching, enabling devices coupled to FASTCO extension module 1414 to be selectively coupled by the end user to other components of the test system (e.g., ATE or load board) according to the test program workspace 1402, for example, during device testing, characterization, etc.

[0095] According to some embodiments, a C++ wrapper 1418 communicates with a FASTCO extension module 1414 based on a model file 1422 that maps RFIM spring pins to ports for communication with various benchtop instruments or DUTs located in sockets on load boards, depending on the port. A test system executing the exemplary test procedure 1404 communicates with the FASTCO module 1414 via Ethernet and may be assigned a static IP address. Different REMs of the FASTCO module 1414 are assigned numbers and boards. A FASTCO module typically includes two REMs (1, 2), each with two boards (a, b), although other configurations with different numbers of REMs and / or boards are also considered within the scope of this disclosure. Ports are used in conjunction with REM numbers (e.g., 1 or 2) and board identifiers (e.g., a or b) to couple a specific ATE spring pin interface (e.g., an RFIM interface) to a specific DUT port or instrument port.

[0096] The end-user test program 1404 accesses various libraries and drivers to issue commands to the FASTCO module 1414 to control its hardware 1420 (e.g., switches, triggers). According to some embodiments, the FASTCO module 1414 is recognized as an instrument by the ATE and can be interfaced and configured accordingly.

[0097] Table I below illustrates an exemplary API according to an embodiment of this disclosure, used to interface with a FASTCO extension module to coordinate and control its operation using the inputs “pogoNumber” and “connection”. The API can be used to couple a specific RFIM spring pin to a stage instrument port or ATE. In this example, values ​​from 1 to 6 correspond to six external instrument ports. For example, a value of 0 would restore the pogo connection to the ATE.

[0098] Input parameters

[0099] ·int pogoNumber

[0100] ·int connection

[0101] Output parameters

[0102] ·None

[0103] return

[0104] ·int status

[0105] Overload

[0106] ·int fastcoConnect(int pogoNumber,int connection);

[0107] C++ wrapper function calls

[0108] ·fastcoConnect(int pogoNumber,int connection);

[0109] C++ MCU driver function calls

[0110] ·int hwRemPortConnect(int sockfd,int sectionNumber,int portNumber,int

[0111] remModuleNumber,char*msg_sent,char*mcu_reply);

[0112] o Called if connection=1to 6

[0113] ·int hwlsmlnstConnect(int sockfd,int instNumber,int remModuleNumber,int

[0114] sectionNumber,char*msg_sent,char*mcu_reply);

[0115] o Called if connection=1to 6

[0116] ·int hwRemPortRfim(int sockfd,int portNumber,int remModuleNumber,char*

[0117] msg_sent, char*mcu_reply);

[0118] o Called if connection=0

[0119] Table 1

[0120] As shown in Table 1, the FASTCO RF extension module can be controlled by issuing commands based on the port number, pogo number, remModuleNumber, and other variables related to the extension module's operation. Of course, any suitable programming language can be used. The C++ wrapper that performs the function typically communicates with the FASTCO extension module based on a model file that maps RFIM spring pins to specific ports. This significantly reduces testing complexity because the ports can be automatically connected by the FASTCO module without manually swapping cables, load boards, etc. Furthermore, the ports can be automatically mapped by the test program, rather than based on model files, etc., and there is no need to manually modify the switch matrix, etc.

[0121] A novel approach to device testing and path loss compensation using fast correlated RF extension modules.

[0122] Embodiments of this disclosure provide a novel method for computer-controlled hardware interface switching operations to automatically couple signal paths used for device testing, path characterization, etc., thereby improving test accuracy and efficiency while significantly reducing costs. The method described herein avoids the need for separate load boards or connecting long wires to various components that may need to be replaced or compensated during testing.

[0123] Figure 15 This is a flowchart depicting an exemplary sequence of computer-controlled steps for a hardware interface switching process 1500 for selectively coupling test system components (e.g., ATE or ATS, DUT mounted on a load plate, bench instrument) according to embodiments of the present disclosure.

[0124] At step 1502, the RF extension module (e.g., the FASTCO module) receives instructions to perform hardware switching operations to control the operation of one or more of its switches. For example, step 1502 may include receiving instructions from the test system via a communication channel (e.g., an Ethernet connection) at the ISM of the FASTCO module.

[0125] At step 1504, one or more switches of the FASTCO module are controlled to couple the two test system components together via a bidirectional path, thereby enabling signals to propagate between the components.

[0126] At step 1506, one component provides a stimulus signal and propagates the stimulus signal to another component, where the stimulus signal can be measured. Step 1506 can be performed as part of a test procedure executed by an ATE or ATS to test a device or correlate system components based on their characteristics (e.g., loss).

[0127] At step 1508, the test program may optionally stop at a specified breakpoint, and debugging or analysis / comparison of results may be performed before the test program continues.

[0128] Figure 16 This is a flowchart depicting an exemplary sequence of computer-controlled steps for automatically and selectively coupling ports of a load board to ports of an ATE for device testing, according to embodiments of the present disclosure.

[0129] The steps of process 1600 can include a compensation factor based on the characteristics of the signal path used for the coupling component. For example, the compensation factor can be automatically determined by the ATE.

[0130] At step 1602, the RF expansion module (e.g., the FASTCO module) receives a command for performing a hardware interface switching operation (including controlling one or more switches of the RF expansion module to couple the two components). For example, step 1602 may include receiving instructions from the test system via, for example, an Ethernet connection at the ISM of the FASTCO module.

[0131] At step 1604, according to the command received in step 1602, one or more switches of the FASTCO module are controlled to communicatively couple the ports of the ATE (e.g., RFIM ports) and the ports of the load board (DUT ports) together, thereby enabling signals to propagate between components.

[0132] At step 1606, the ATE performs tests on the DUT execution device mounted on the load board via the RF expansion module.

[0133] Figure 17 This is a flowchart depicting an exemplary sequence of computer-controlled steps for automatically and selectively coupling a benchtop instrument to a device under test (DUT) for instrument testing, according to embodiments of the present disclosure. The instrument may be, for example, a vector signal generator, a vector signal analyzer, a spectrum analyzer, a frequency generator, or any other instrument suitable for RF testing purposes. Process 1700 can be executed automatically during device testing. For example, process 1700 can be executed simultaneously with process 1600 of the ATE performing device testing according to a test procedure. In other words, embodiments can automatically switch between process 1600 (ATE device testing) and process 1700 (benchtop testing) in real time.

[0134] The steps in process 1700 can include a compensation factor based on the characteristics of the signal path used for coupling components. For example, the compensation factor can be automatically determined by the ATE.

[0135] At step 1702, the RF expansion module (e.g., a FASTCO module) receives a command to perform a hardware interface switching operation to control the operation of one or more of its switches. For example, step 1702 may include receiving instructions from the test system via Ethernet at the ISM of the RF expansion module, and the ISM may control switches inside the RF expansion module (e.g., switches located in the ISM or REM of the RF expansion module).

[0136] At step 1704, one or more switches of the FASTCO module are controlled to communicatively couple the port of the stage instrument to the port of the load board (DUT port), thereby enabling signals to propagate between components.

[0137] At step 1706, the DUT mounted on the load board is tested by a bench instrument. Steps 1704 and 1706 can be repeated according to the test procedure to couple the DUT to different bench instruments for further testing. Step 1706 may also include sending a trigger signal (e.g., sequential manual triggering) from the ISM to the bench instrument to control the bench instrument during testing. For example, the trigger signal can be defined in the test procedure and can be automatically generated by the ATE during testing.

[0138] Figure 18This is a flowchart depicting an exemplary sequence of computer-controlled steps in process 1800, according to embodiments of the present disclosure, for automatically and selectively coupling a stage instrument to characterize the signal path of a test system. Measurements performed during process 1800 can be used to de-embed test system components (e.g., cables, connectors, switches, etc.) and verify path loss calibration, thereby ensuring accurate testing and measurement. Process 1800 may include verifying compensation factors for test system components with high accuracy (e.g., within + / - 1 dB).

[0139] At step 1802, the RF extension module (e.g., the FASTCO module) receives instructions for performing hardware interface switching operations (including operations controlling one or more of its switches). For example, step 1802 may include receiving instructions from the test system via, for example, an Ethernet connection at the ISM of the FASTCO module, and the ISM may control switches within the FASTCO module (e.g., switches located in the ISM or REM of the FASTCO module) to couple components of the test system.

[0140] At step 1804, one or more switches of the FASTCO module are controlled to communicatively couple the first test system component to the second test system component. For example, the test system component may be an ATE or ATS, a load board, or a bench instrument.

[0141] At step 1806, an RF signal (stim) is provided to the first test system component, and a measurement is performed at the second test system component. Specifically, in step 1804, the ATE may be coupled to a bench instrument, and step 1806 may include using the bench instrument to generate the stim and using the ATE to measure the RF signal. In another example, in step 1804, the ATE is coupled to a load board, and step 1806 includes the ATE generating the RF signal (stim) and then measuring the signal at the load board.

[0142] At step 1808, path loss can be calculated, or existing calibrations (e.g., compensation factors) applied to mitigate path loss (e.g., de-embedding of devices, connectors, cables, etc.) can be verified according to the above embodiments.

[0143] According to some embodiments, step 1808 includes performing a loopback test to characterize the signal path of the components of the RF extension module. For example, step 1804 may include using a switch of the RF extension module to communicatively couple a first test system component (e.g., ATE or benchtop instrument) to itself to feed back an input RF signal generated by the first device to the first device for measurement. More specifically, according to embodiments, the signal may be fed back via the REM of the RF extension module (e.g., for determining RFIM loss (FRL)), or via the REM and ISM of the RF extension module (e.g., for determining ISM loss (FIL)).

[0144] In summary, the disclosed technology overcomes the limitations of conventional methods by providing an automated, software-controlled method for selective device coupling, which avoids the need to change wires, connectors, or load boards when testing devices using ATE and benchtop equipment. Furthermore, coupling can be automatically controlled by the test system without requiring manual port changes or matrix adjustments.

[0145] At least one technical advantage of the disclosed technology is that path loss can be mitigated more accurately, and system components can remain in place when various components are used during device testing. A major advantage is that a separate load board is not required, which significantly reduces cost and testing complexity. Furthermore, path loss can be measured and compensated more accurately using the associated procedures described herein.

[0146] 1. In some embodiments, an apparatus for selectively coupling devices of a test system, the apparatus comprising: a plurality of switches; and a communication port operable to receive control commands to control the plurality of switches to selectively couple devices of the test system, wherein a first set of the plurality of switches is communicatively coupled to a load board for receiving a device under test (DUT) for device testing.

[0147] 2. The apparatus according to Clause 1, wherein the Automatic Test Equipment (ATE) is operable to control the plurality of switches via a communication channel through the communication port.

[0148] 3. The apparatus according to Clause 2, wherein the first set of the plurality of switches is also operable to selectively couple a signal path from the load board to the ATE to test the DUT actuator disposed on the load board according to a test procedure performed by the ATE.

[0149] 4. The apparatus according to Clause 3 further includes: a microcontroller operable to receive the control command via the communication channel and to control the plurality of switches according to the control command.

[0150] 5. The apparatus according to clause 2 or 3, wherein the first set of the plurality of switches is also operable to selectively and communicatively couple the load board to a bench instrument operable to perform bench testing on the DUT when the DUT is mounted on the load board.

[0151] 6. The apparatus according to Clause 3, wherein the communication port includes an Ethernet port, and wherein the test program includes a Java test program operable to access an external instrument driver library to control the workbench instrument via Ethernet.

[0152] 7. The apparatus according to any one of clauses 2 to 6, wherein the plurality of switches are operable for control by a test procedure executed by the ATE, and wherein the test procedure accesses information mapping the spring pins of the ATE to port numbers to automatically couple components using the port numbers to control the plurality of switches.

[0153] 8. The apparatus according to any one of clauses 2 to 7, wherein the plurality of switches are operable to provide a loopback communication path for measuring path loss, and wherein the ATE is operable to perform an automatic correlation procedure to correlate the measurements of the ATE with those of the bench instrument based on the path loss.

[0154] 9. The apparatus according to Clause 8, wherein the ATE is also operable to automatically verify the results of the automatic correlation procedure by coupling the ATE to the workbench device using the plurality of switches, and to receive an input RF signal generated by the workbench device and measured at the ATE.

[0155] 10. In some embodiments, a test system for device testing includes: an automated test equipment (ATE); a load board including a plurality of sockets; and a radio frequency (RF) expansion module including a plurality of switches, wherein the RF expansion module is operable to receive commands sent by the ATE to control the operation of the plurality of switches to selectively couple the ATE to a device under test (DUT) that can be positioned in the plurality of sockets for device testing.

[0156] 11. The test system according to Clause 10 further includes: a bench instrument, wherein the RF extension module is also operable to control the operation of the plurality of switches to selectively couple the DUT to the bench instrument for testing the DUT.

[0157] 12. The test system according to Clause 10 further includes: a bench instrument, wherein the RF extension module is also operable to control the operation of the plurality of switches to couple the ATE to the bench instrument for performing path loss calibration and verification operations.

[0158] 13. The test system according to Clause 10, wherein the RF extension module is also operable to control the plurality of switches to provide a loopback communication path for performing path loss calibration and verification operations of the RF extension module.

[0159] 14. The test system according to any one of clauses 10 to 13, wherein the RF expansion module further includes an Ethernet interface, wherein the RF expansion module is operable to receive commands through the Ethernet interface to control the operation of the plurality of switches according to a test procedure that maps the pins of the ATE to DUT ports coupled to the load board.

[0160] 15. In some embodiments, a method for automated hardware interface switching for device testing using a radio frequency (RF) extension module, the method comprising: receiving a command from an automated test equipment (ATE) for coupling a first test system component to a second test system component; controlling the operation of a plurality of switches of the RF extension module to couple the first test system component to the second test system component; generating an RF signal using the first test system component; automatically routing the RF signal to the second test system component via the plurality of switches; and measuring the RF signal at the second test system component.

[0161] 16. The method according to Clause 15, wherein the first test system component includes the ATE, and wherein the second test system component includes a load board having a plurality of sockets operable to receive a device under test (DUT) for device testing of the DUT by the ATE.

[0162] 17. The method according to Clause 15, wherein the first test system component includes the ATE, and wherein the second test system component includes a bench instrument.

[0163] 18. The method according to Clause 17, wherein the ATE is operable to verify path loss calibration between the ATE and the stage instrument by measuring the RF signal generated by the stage instrument at the ATE.

[0164] 19. The method according to any one of clauses 15 to 18, wherein the command from the ATE is received by the microcontroller of the RF extension module via Ethernet.

[0165] 20. The method according to Clause 15, wherein the first test system component includes a first device under test (DUT) component, wherein the second test system component includes a second DUT component, and wherein controlling the operation of a plurality of switches of the RF extension module to couple the first test system component to the second test system component includes: controlling the operation of the plurality of switches to form a loopback path, the loopback path being operable to receive the RF signal from the first DUT component and to return the RF signal for reception by the second DUT component.

[0166] Any and all combinations of any claim element recited in any claim and / or any element described in this application in any manner fall within the scope and protection contemplated by this disclosure.

[0167] The description of various embodiments is for illustrative purposes only and is not intended to be exhaustive or limited to the disclosed embodiments. Many modifications and variations will be apparent to those skilled in the art without departing from the scope and spirit of the described embodiments.

[0168] Aspects of the embodiments herein may be embodied as systems, methods, or computer program products. Therefore, aspects of this disclosure may take the form of entirely hardware embodiments, entirely software embodiments (including firmware, resident software, microcode, etc.), or combined software and hardware embodiments that may be collectively referred to herein as “modules,” “systems,” or “computers.” Furthermore, any hardware and / or software techniques, processes, functions, components, engines, modules, or systems described in this disclosure may be implemented as circuits or collections of circuits. Additionally, aspects of this disclosure may take the form of computer program products embodied in one or more computer-readable media, on which computer-readable program code is embodied.

[0169] Any combination of one or more computer-readable media may be used. A computer-readable medium can be a computer-readable signal medium or a computer-readable storage medium. A computer-readable storage medium can be, for example, but not limited to, an electrical, magnetic, optical, electromagnetic, infrared, or semiconductor system, apparatus, or device, or any suitable combination thereof. More specific examples (not an exhaustive list) of computer-readable storage media will include: an electrical connection having one or more wires, a portable computer disk, a hard disk, random access memory (RAM), read-only memory (ROM), erasable programmable read-only memory (EPROM or flash memory), optical fiber, portable compact disc read-only memory (CD-ROM), optical storage devices, magnetic storage devices, or any suitable combination thereof. In the context of this document, a computer-readable storage medium can be any tangible medium that may contain or store programs for use by or in connection with an instruction execution system, apparatus, or device.

[0170] The foregoing description of aspects of this disclosure refers to flowchart illustrations and / or block diagrams of methods, apparatus (systems), and computer program products according to embodiments of this disclosure. It will be understood that each block of the flowchart illustrations and / or block diagrams, and combinations of blocks in the flowchart illustrations and / or block diagrams, can be implemented by computer program instructions. These computer program instructions can be provided to a processor of a general-purpose computer, a special-purpose computer, or other programmable data processing apparatus to generate a machine. When executed via a processor of a computer or other programmable data processing apparatus, the instructions enable the implementation of the functions / actions specified in one or more blocks of the flowchart illustrations and / or block diagrams. Such a processor can be, but is not limited to, a general-purpose processor, a special-purpose processor, a special application processor, or a field-programmable gate array (FPGA).

[0171] The flowcharts and block diagrams in the accompanying drawings illustrate the architecture, functionality, and operation of possible implementations of systems, methods, and computer program products according to various embodiments of the present disclosure. In this regard, each block in a flowchart or block diagram may represent a module, segment, or portion of code, which includes one or more executable instructions for implementing one or more specified logical functions. It should also be noted that in some alternative implementations, the functions marked in the blocks may occur in a different order than those marked in the drawings. For example, depending on the functions involved, two blocks shown consecutively may actually be executed substantially simultaneously, or the blocks may sometimes be executed in reverse order. It should also be noted that each block in the block diagrams and / or flowcharts, and combinations of blocks in the block diagrams and / or flowcharts, may be implemented by a dedicated hardware-based system performing the specified functions or actions, or by a combination of dedicated hardware and computer instructions.

[0172] While the foregoing pertains to embodiments of this disclosure, other and additional embodiments of this disclosure may be devised without departing from its essential scope, the scope of which is defined by the appended claims.

Claims

1. An apparatus for selectively coupling devices in a test system, the apparatus comprising: Multiple switches; A communication port operable to receive control commands to control the plurality of switches to selectively couple devices of the test system, wherein a first set of the plurality of switches is communicatively coupled to a load board for receiving a device under test (DUT) for device testing, and wherein the DUT is tested by the test system via the first set of the plurality of switches.

2. The apparatus according to claim 1, wherein, An automated test equipment (ATE) is operable to control the plurality of switches via a communication channel through the communication port.

3. The apparatus according to claim 2, wherein, The first set of the plurality of switches is also operable to selectively couple a signal path from the load board to the ATE to test the DUT actuator mounted on the load board according to a test procedure executed by the ATE.

4. The apparatus according to claim 3, further comprising: A microcontroller operable to receive the control commands via the communication channel and to control the plurality of switches according to the control commands.

5. The apparatus according to claim 3, wherein, The communication port includes an Ethernet port, and the test program includes a Java test program operable to access an external instrument driver library to control the workbench instrument via Ethernet.

6. The apparatus according to claim 2, wherein, The first set of the plurality of switches is also operable to selectively and communicatively couple the load board to a bench instrument operable to perform bench testing on the DUT when the DUT is mounted on the load board.

7. The apparatus according to claim 2, wherein, The plurality of switches are operable to be controlled by a test program executed by the ATE, wherein the test program accesses information mapping the spring pins of the ATE to port numbers to automatically couple components using the port numbers to control the plurality of switches.

8. The apparatus according to claim 2, wherein, The plurality of switches are operable to provide a loopback communication path for measuring path loss, and wherein the ATE is operable to perform an automatic correlation procedure to correlate the measurements of the ATE with those of the bench instrument based on the path loss.

9. The apparatus according to claim 8, wherein, The ATE is also operable to automatically verify the results of the automatic correlation procedure by coupling the ATE to the stage instrument using the plurality of switches, and to receive input RF signals generated by the stage device and measured at the ATE.

10. A test system for device testing, the system comprising: Automated Test Equipment (ATE); A load board, including multiple sockets; as well as A radio frequency (RF) expansion module includes multiple switches, wherein the RF expansion module is operable to receive commands sent by the ATE to control the operation of the multiple switches to selectively couple the ATE to a DUT that can be set in the multiple sockets for device testing.

11. The testing system according to claim 10, further comprising: The workbench instrument, wherein the RF expansion module is also operable to control the operation of the plurality of switches to selectively couple the DUT to the workbench instrument for testing the DUT.

12. The testing system according to claim 10, further comprising: The workbench instrument, wherein the RF expansion module is also operable to control the operation of the plurality of switches to couple the ATE to the workbench instrument for performing path loss calibration and verification operations.

13. The testing system according to claim 10, wherein, The RF extension module is also operable to control the plurality of switches to provide a loopback communication path for performing path loss calibration and verification operations of the RF extension module.

14. The testing system according to claim 10, wherein, The RF expansion module also includes an Ethernet interface, wherein the RF expansion module is operable to receive commands through the Ethernet interface to control the operation of the plurality of switches according to a test program that maps the pins of the ATE to DUT ports coupled to the load board.

15. A method for automatic hardware interface switching for device testing using a radio frequency (RF) expansion module, the method comprising: Receive commands from the automated test equipment (ATE) for coupling the first test system component with the second test system component; The operation of multiple switches of the RF expansion module is controlled to couple the first test system component to the second test system component; RF signals are generated using the first test system component; The RF signal is automatically routed to the second test system component via the plurality of switches; and The RF signal is measured at the second test system component.

16. The method according to claim 15, wherein, The first test system component includes the ATE, and the second test system component includes a load board with multiple sockets operable to receive a device under test (DUT) for device testing by the ATE.

17. The method according to claim 15, wherein, The first test system component includes the ATE, and the second test system component includes a bench instrument.

18. The method according to claim 17, wherein, The ATE is operable to verify path loss calibration between the ATE and the stage instrument by measuring the RF signal generated by the stage instrument at the ATE.

19. The method according to claim 15, wherein, Commands from the ATE are received via Ethernet by the microcontroller of the RF extension module.

20. The method of claim 15, wherein, The first test system component includes a first device under test (DUT) component, wherein the second test system component includes a second DUT component, and wherein controlling the operation of a plurality of switches of the RF extension module to couple the first test system component to the second test system component includes: controlling the operation of the plurality of switches to form a loopback path, the loopback path being operable to receive the RF signal from the first DUT component and to return the RF signal for reception by the second DUT component.

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