Self-adjusting SSD aging test method and device

Abstract

The invention relates to a self-adjusting SSD aging test method and equipment, and the method sequentially comprises the steps: S1, loading an SSD DUT device in a tool disc, so as to carry the control information of an electrical testing region to an aging region, and to transmit the test result of the aging region to the electrical testing region; s2, executing all data blocks of the whole-region aging SSD DUT device by an external burn-in program so as to remove potential bad data blocks in the early stage; and S3, executing a first self-adjusting mode by the internal burn-in program to age the reliability data blocks of the SSD DUT device so as to distinguish and mark stable data blocks and unstable data blocks of the residual reliability data blocks. In a preferred example, the method further comprises the step S5 of correcting an external burn-in program based on reading of the first test result in the electrical test area so as to improve the rejection quantity of the next marked early-stage potential bad data blocks. Therefore, RDT card activation using RDT test equipment can be omitted, transplanting between the RDT and the BIT can be reduced, and self-circulation data storage and reset adjustable BIT aging can be carried out on the reliability data block of the SSD DUT device.

Description

TECHNICAL FIELD

[0001] The present application relates to the technical field of SSD testing, and particularly to a self-adjusting SSD aging test method and device. BACKGROUND

[0002] In the prior art of the SSD (Solid State Disk) test process, RDT card opening, RDT high-temperature aging, and then BIT card opening and BIT normal-temperature aging are performed in cycles. The devices used are different, so the SSD DUT device (solid state disk product to be tested) needs to be loaded on different boards or adapter cards, and a large amount of transfer time is spent on changing the fixture and moving between the RDT test equipment and the BIT test equipment. The RDT card opening equipment and the RDT high-temperature aging cabinet are used to verify the reliability of the SSD product. Through the high-temperature aging cabinet, extreme temperature and harsh working conditions are simulated to accelerate the failure of weak NAND flash blocks. The BIT card opening equipment and the BIT normal-temperature aging cabinet are used to verify the stability of the SSD product. They are used to start the initialization test and detect the performance stability of the SSD DUT device under normal working load.

[0003] The implementation of RDT test (Reliability Demonstration Test) is to verify the reliability of the SSD product. It focuses on detecting and shielding bad blocks. By writing data and heating for a period of time, the impact of long-term data storage on flash memory is simulated, and then data verification is performed to identify data blocks with poor reliability. The poor reliability of the data block is damaged in advance in the early stage and is marked. RDT heating for a long time at high temperature requires heating power consumption.

[0004] The implementation of BIT test (Built In Test) is to verify the stability of the SSD product. It detects potential unstable blocks by writing data with high load and reading it back after a certain period of time. It focuses on marking data blocks that cannot be read. BIT high-load writing and reading require computing power consumption.

[0005] In order to achieve the required fixture transfer time in automatic testing and reduce the transfer time, a technical method for sharing fixtures between different devices of RDT and BIT is proposed. For example, the invention patent publication No. CN112151106A discloses a SSD aging test method, which comprises: receiving fixture in place information, electrically connecting the test fixture carrying the to-be-tested SSD at the first card opening device of RDT high temperature aging test, and burning the first test program to each to-be-tested SSD, after burning, disconnecting the electrical connection with the test fixture; control the test fixture to move to the first temperature box in idle state, execute the first test program in the first temperature box according to the first preset parameter, and after detecting that the test is completed, control the test fixture to move to the second card opening device of BIT normal temperature aging test; then, as above, complete the second card opening and the second test, and then burn the factory program to each to-be-tested SSD, complete the SSD aging test, that is, realize the automatic SSD aging test. In the general knowledge of related art, the setting conditions of each device are defined in advance or input from outside the machine, the information source is single, and the data storage capacity of SSD DUT device cannot be determined and utilized before testing. It is the inherent thinking in the field that the transfer ability of data storage of SSD DUT device before testing cannot be determined and utilized. Although the foregoing prior art attempts to burn the test program (or machine burning program) into the to-be-tested SSD device, the data block in the to-be-tested SSD device has not been verified for reliability and stability, and once the test program is burned into the damaged or damaged data block in the test process, the RDT test and the BIT test cannot be well executed. If the test program cannot run well, the SSD DUT device that may be qualified will be misjudged as a whole area damage. SUMMARY

[0006] The main purpose of the present application is to provide a self-adjusting SSD aging test method, which further breaks the inherent thinking that the transfer ability of data storage of SSD DUT device before testing cannot be determined and utilized, and can perform self-circulating data storage and reset adjustment BIT aging on the reliability data block of SSD DUT device, solving the problem that burning the machine program into the damaged data block during automatic SSD aging test will cause the RDT test and the BIT test to be unable to be well executed.

[0007] The second main purpose of the present application is to provide a self-adjusting SSD aging test device, which can use a set of integrated device to realize the reliability verification of RDT test and the stability verification of BIT test.

[0008] The first main purpose of the present application is achieved by the following technical scheme: A self-adjusting SSD aging test method is proposed, comprising the following steps: S1, load several SSD DUT devices in a fixture tray, the fixture tray is movable between the electrical measurement area and the aging area; S2, all blocks of the SSD DUT device are aged, step S2 includes: S21, performing external BIT opening card, performing all blocks of the SSD DUT device in the electrical measurement area; S22, performing high-temperature RDT aging, aging the SSD DUT device in the aging area; S23, performing reliability BIT reading, verifying all blocks of the SSD DUT device in the electrical measurement area to distinguish and mark early potential bad blocks and reliable blocks; S3, the first self-regulating mode of aging the reliable blocks of the SSD DUT device, step S3 includes: S31, performing the first internal BIT opening card, loading the internal burner program into the reliable blocks in the electrical measurement area, the reliable blocks include spare reliable blocks that do not store the internal burner program; S32, performing the first regulated BIT aging, performing self-circulating data storage and resetting of the spare reliable blocks of the SSD DUT device in the aging area, and storing the first test result; S33, performing the first stability BIT reading, reading the first test result of the SSD DUT device in the electrical measurement area to distinguish and mark the first stable blocks and the first unstable blocks of the spare reliable blocks.

[0009] By adopting the technical scheme of the above method, by steps S1 to S3, the fixture tray plays the role of a communication bridge between the electrical measurement area and the aging area, based on the external burner program of step S21, all blocks of the SSD DUT device are stored in the electrical measurement area, and the fixture tray carries the control information of the electrical measurement area to the aging area, and based on the internal burner program of step S31, the first test result generated and stored in the aging area is transmitted back to the electrical measurement area by the fixture tray, and the same set of aging test equipment in the BIT device area is enabled to complete the reliability verification and stability verification of the SSD DUT device, the RDT opening card using the RDT test equipment is omitted, and the SSD DUT device is omitted between the RDT and the BIT, the regulated BIT aging of the self-circulating data storage and resetting of the reliable blocks of the SSD DUT device is performed, and the effect of self-optimizing the test parameters of the stability verification is achieved.

[0010] In a preferred embodiment, the present invention can be further configured as follows: the self-adjusting SSD aging test method further includes: S4, aging the reliability data block of the SSD DUT device in a second self-adjusting mode, wherein step S4 includes: S41, performing a second internal BIT unlocking, loading the internal burn-in program into the first stable data block in the electrical test area; S42, performing a second adjustable BIT aging, performing self-circulating data storage and reset of the previously occupied reliability data block of the SSD DUT device in the aging area, and storing the second test result; S43, performing a second stability BIT reading, reading the second test result from the SSD DUT device BIT in the electrical test area; wherein the second test result distinguishes and marks the second stable data block and the second unstable data block that were previously occupied by the reliability data block.

[0011] By employing the aforementioned preferred technical features, and utilizing the specific operation of step S4 of the second self-adjusting aging process, the second stable data block and the second unstable data block marked with the first occupied reliability data block are identified. The first occupied reliability data block is occupied by the internal burn-in program in step S3 and cannot be used for stability verification. Therefore, the reliability data blocks not occupied by the internal burn-in program in steps S3 and S4 will undergo two self-adjusting aging processes. The reliability data blocks are divided into three categories: the first category undergoes the first self-adjusting aging process (corresponding to step S32), the second category undergoes the second self-adjusting aging process (corresponding to step S42), and the third category undergoes both the first and second self-adjusting aging processes (corresponding to steps S32 and S42). The failure rates and changes of these three categories can be used to verify whether there is insufficient or excessive conditions in the first and second self-adjusting aging processes. This allows for energy-efficient self-training to adjust reasonable self-adjusting aging parameters and gradually optimize the burning of the internal burn-in program into the reliability data blocks that are predicted to be less prone to failure.

[0012] In a preferred embodiment, the present invention can be further configured as follows: In step S31 of the first internal BIT activation in step S3, the internal burn-in program is also mapped to a backup burn-in program in the reliability data block; after a predetermined time of the first cycle BIT aging process in step S32 or when the internal burn-in program cannot be executed, the backup burn-in program replaces or repairs the internal burn-in program, repeatedly storing and resetting the previously occupied reliability data block in the reliability data block occupied by the internal burn-in program, and storing a third test result including the first test result; in step S33, the third test result is read, and the common stable data block and the common unstable data block of the reliability data block are identified and marked.

[0013] By employing the aforementioned preferred technical features, in step S31 of the first internal BIT activation in step S3, the internal burn-in program is mapped to a backup burn-in program in the reliability data block, i.e., mapped in the aging burn-in phase of the aging zone. After a predetermined time in the first cycle of BIT aging process, the internal burn-in program is mapped (moved) from the previously occupied reliability data block to other tested reliability data blocks, becoming a backup burn-in program, and the internal burn-in program is deleted, replacing the internal burn-in program with the backup burn-in program, thus enabling stability verification of the previously occupied reliability data block; or / and, the mapping is pre-implemented in the electrical test zone, and when the internal burn-in program cannot be executed, the backup burn-in program is activated to replace or repair it; if the backup burn-in program cannot be executed, it is enabled to determine that the SSD DUT device has experienced an overall failure, and the power-consuming load is stopped; if the backup burn-in program can be executed, it indicates that the internal burn-in program is damaged, even so, the first adjustable BIT aging can still be executed.

[0014] In a preferred embodiment of the invention, all data blocks of the full-area aging SSD DUT device in step S2 include redundant data blocks.

[0015] By adopting the above-mentioned preferred technical features, and utilizing all data blocks including redundant data blocks, early potentially defective data blocks in the redundant data blocks can also be pre-removed after step S2. The reliability data blocks of the redundant data blocks are for backup performance in the product stage. Compared with the functional area, the reading and storage frequency of the redundant data blocks is relatively small. The control instruction information about the aging heating cabinet in the internal burn-in program of step S3 or / and step S4 can be stored in the reliability data block of the redundant data blocks (corresponding to step S31 or / and step S41).

[0016] In a preferred embodiment of the present invention, the reliability data block in step S23 may further include a first reliability data block located in the functional area and a second reliability data block located in the redundant data block, and the internal burn-in program in step S31 is preferentially loaded into the second reliability data block of the redundant data block.

[0017] By adopting the above-mentioned preferred technical features, after step S23, the first reliability data block located in the functional area and the second reliability data block located in the redundant data block are obtained. Compared with the first reliability data block, the internal burn-in program in step S31 loads the second reliability data block first. Therefore, the first reliability data block in the functional area can be trained by the first self-adjusting aging method in step S3. Step S4 can be omitted as a step that can be omitted in the long-term training of the SSD DUT device in the self-adjusting SSD aging test method. That is, step S4 needs to be executed at the beginning to collect test result information. After multiple continuous aging tests until a condition is met, step S4 will not be executed.

[0018] In a preferred embodiment, the present invention can be further configured such that the internal burn-in program in step S31 has a self-running function and a self-adjusting function under training iteration, and provides control parameters for the aging zone via the electrical connection of the fixture disk.

[0019] By adopting the above-mentioned preferred technical features, the internal burn-in program in step S31 provides control parameters for the aging zone via the electrical connection of the fixture disk, and automatically runs BIT aging in the aging zone and automatically adjusts BIT card opening under training iteration in the electrical test zone.

[0020] In a preferred embodiment, the present invention can be further configured as follows: a tested standard SSD device is also installed in the fixture tray of step S1, mixed in with the SSD DUT device; after step S2, the standard SSD device marks the early potentially defective data blocks and reliability data blocks as corresponding to the tested results, then the difference between the standard test results obtained by aging the reliability data blocks of the standard SSD device in step S3 using the first self-adjustment mode and the first test results can establish a node for a distinction curve, which is used to verify the reliability of the self-adjustment parameters of the high-load heat-up mode in step S32.

[0021] By employing the aforementioned preferred technical features and utilizing the hybrid nature of standard SSD devices, when the test results of the standard SSD devices measured after step S2 correspond to the measured results of the standard SSD devices already installed, it indicates that the installation position of the standard SSD devices is correct and they can be used as a reference. The node data of the difference curve established in step S3 can verify the reliability of the parameters of the high-load, heat-generating mode in step S32.

[0022] In a preferred embodiment, the present invention may be further configured such that step S32 of the first adjustable BIT aging includes: S321. Read multiple set parameters from the internal burn-in program in the initial high-load temperature-increasing mode in the aging zone, and perform adjustable BIT aging on the SSD DUT device and the standard SSD device. If the difference curve established in the first time period of the test time is stable, stop the enhanced adjustment of parameters. S322. If the difference curve established in step S321 during the first time period of the test cannot be stabilized, the multiple parameters of the initial high-load heatable mode are adjusted progressively until the difference curve established during the second time period of the test is stable. S323. If the difference curve established in step S321 or step S322 is stable, adjust one or some parameters of the high-load heatable mode in a weakened manner so that the difference curve established in the second time period of the test time can remain stable. S324. Determine the parameter changes of the weakening difference curve established within the test time, and perform time-weighted averaging to optimize the internal burn-in program, which will serve as multiple setting parameters for the next initial high-load heat-up mode.

[0023] By adopting the above-mentioned preferred technical features, and utilizing steps S321 to S324, the first adjustable BIT aging step S32 can be specifically executed in the aging zone, and the setting parameters of the internal burn-in program can be optimized.

[0024] In a preferred embodiment, the present invention may be further configured as follows: the self-adjusting SSD aging test method further includes: S5, based on the reading of the first test result in the electrical test area, modifying the external burn-in program of step S21 to increase the rejection rate of the next batch of SSD DUT devices in marking potentially defective data blocks in the early stages.

[0025] By adopting the above-mentioned preferred technical features, and utilizing the reading step S5 of the first test result in the electrical test area, the parameters of the external burn-in program in step S21 are corrected under preset rules. As a result, the amount of data blocks marked as potentially defective in the early stages of the next batch of SSD DUT devices can be eliminated in step S2, and the parameters of the internal burn-in program used in the first self-adjusting aging process in step S3 can be further optimized towards energy saving.

[0026] The second main objective of this invention is achieved through the following technical solution: A self-adjusting SSD aging test device is proposed, which can be used to perform a self-adjusting SSD aging test method for any of the above-mentioned technical solutions or appropriate combinations thereof. It is suitable for intelligent self-adjusting reliability and stability verification of several SSD DUT devices mounted in a fixture. The self-adjusting SSD aging test device includes: A test machine is located in the electrical testing area. The test machine is configured to be electrically connected to the fixture disk and execute an external burn-in program on the SSD DUT device. It is used to perform external BIT card opening and reliability BIT reading of several SSD DUT devices to mark the reliability data blocks after high-temperature RDT aging. The test machine is also configured to be electrically connected to the fixture disk and load an internal burn-in program on the SSD DUT device. An aging heating cabinet, configured in the aging zone and located on one or both sides of the testing machine, is used to perform high-temperature RDT aging and adjustable BIT aging on the SSDDUT device; A transport mechanism is configured to move the fixture disk, enabling the fixture disk to move between the electrical testing area and the aging area; The aging heating cabinet in the aging zone can communicate the control command information between the external burn-in program and the internal burn-in program through the fixture plate. When the idle reliability data blocks of the SSD DUT device are subjected to self-circulating data storage and reset of the regulated BIT aging and the first test result after regulated BIT aging is stored, the test machine is also configured to read the first test result to mark the first stable data block and the first unstable data block of the idle reliability data block.

[0027] By adopting the above-described device technology, and integrating the testing machine, aging heating cabinet, and transport mechanism into a single set of equipment, intelligent self-adjusting aging testing of SSD DUT devices is achieved. This invention eliminates the need for additional RDT testing equipment, reduces the number of transfers between RDT and BIT devices, thereby simplifying the testing process and improving testing efficiency. Simultaneously, an adjustable BIT aging process is implemented, utilizing the transport mechanism to move the fixture tray to achieve self-circulating data storage and reset, enabling more accurate differentiation between stable and unstable data blocks, thus improving testing accuracy and reliability. Furthermore, the external burn-in program can be modified, increasing the amount of early-stage potentially defective data blocks removed in subsequent tests, thereby continuously improving testing performance.

[0028] In a preferred embodiment, the present invention can be further configured such that: in the electrical testing zone, the testing machine can read the first test result and correct the high-temperature RDT aging parameters of the external burn-in program, and store them in the fixture tray; in the aging zone, the aging heating cabinet can also read the high-temperature RDT aging parameters in the SSD DUT device through the fixture tray.

[0029] By employing the aforementioned preferred device technology, and utilizing the combined structure of the testing machine as the main control terminal, the aging heating cabinet as the controlled terminal, and the transport mechanism, fixture tray, and SSD DUT device (or standard SSD device) as parameter transmission media, the system can automatically correct and transmit test parameters for high-temperature RDT aging and BIT aging, achieving efficient and accurate self-adjusting SSD aging testing. Furthermore, the monitoring module and user interface connected to the aging heating cabinet can be located in the aging area to achieve real-time monitoring and forced parameter intervention.

[0030] In a preferred embodiment, the present invention can be further configured such that: the testing machine includes a BIT card opening device, the aging heating cabinet is an RDT high-temperature aging cabinet, and the fixture tray is provided with BIT contacts and RDT contacts, so that the SSD DUT device can carry the control command information of the testing machine to the aging heating cabinet and can transmit the test result information of the aging heating cabinet to the testing machine.

[0031] By adopting the above-mentioned preferred device technology features, utilizing the specific architecture of the test machine and the aging heating cabinet, and the fact that the fixture tray is equipped with BIT and RDT contacts, the stability and efficiency of data interaction in SSD aging tests can be improved. The fixture tray carrying the SSD DUT device, as the main parameter transmission medium, should have better flexibility and scalability without wiring, and be able to adapt to the SSD testing and aging needs in different scenarios.

[0032] In a preferred embodiment, the present invention may be further configured such that the transport mechanism includes a moving track and a robotic arm that moves on the moving track and has a flipping suction cup, the robotic arm being used to flip the fixture tray to suspend the SSD DUT device downwards in the aging heating cabinet and to load the SSD DUT device upwards into the testing machine.

[0033] By employing the aforementioned preferred device technology, a robotic arm equipped with a flipping suction cup and a transport mechanism with a moving track can achieve automatic flipping and efficient transfer of the SSD DUT device between the aging heating cabinet and the testing machine, thus improving testing efficiency. Simultaneously, by equipping the robotic arm with sensors connected to the control system, the accuracy of fixture tray flipping and positioning, as well as the automation level of the entire SSD aging test process, are further improved, reducing manual operation costs and error rates.

[0034] In summary, the present invention includes at least one of the following technical effects that contribute to the prior art: 1. To realize the intelligent development of automated SSD aging test, improve test efficiency, reduce migration time, and enable the adjustment-type BIT aging that performs self-circulating data storage and reset of the reliability data blocks of the SSD DUT device, thereby achieving the effect of self-optimizing the test parameters for stability verification. 2. It does not require a BIT aging chamber or an RDT testing machine. It can integrate the RDT high-temperature aging chamber and the BIT testing machine into the same set of testing equipment, eliminating the transfer stroke between the BIT testing equipment and the RDT testing equipment, greatly reducing the transfer time between equipment and improving the testing efficiency of SSD DUT devices; 3. An aging heating cabinet can be used to perform both RDT aging and BIT aging. The heat generated by the high-load writing and reading of BIT aging can be used for the high-temperature utilization of RDT aging, so as to save the energy consumed by SSD aging test. 4. Under the step of using the fixture tray as the information communication bridge between the electrical testing area and the aging area, the test machine including the BIT card opening equipment and the RDT high temperature aging cabinet do not need a large number of electrical connection cables for information communication, and can be integrated into the same set of self-adjusting SSD aging test equipment. 5. It avoids misjudging the SSD DUT as a complete failure due to internal burn-in program corruption during BIT aging; breaking with traditional thinking, it achieves adjustable BIT aging by self-circulating data storage and resetting of reliability data blocks in the SSD DUT, effectively solving the problem of internal burn-in program burning to damaged data blocks. This not only improves testing efficiency and accuracy but also reduces the risk of data corruption, bringing significant progress to the field of automated SSD aging testing. 6. This method partially replaces the burn-in testing of NAND flash memory chips. It allows the use of relatively low-cost, simple-to-test or no-test NAND flash memory chips, which are then assembled into an SSD DUT device before the identification, marking, and subsequent masking of defective data blocks in the flash memory chips are performed. If the solid-state drive product tested according to the self-adjusting SSD aging test method of this invention is found to have insufficient hard drive storage area, NAND flash memory chips can be added using the built-in expansion slot to supplement the storage capacity. Attached Figure Description

[0035] Figure 1 A schematic diagram illustrating the main steps of a self-adjusting SSD aging test method according to an embodiment of the present invention is shown. Figure 2 Draw Figure 1 A schematic diagram of the specific sub-steps of a full-area aging SSD DUT device that implements step S2; Figure 3 Draw Figure 1A schematic diagram of the specific sub-steps for aging the spare reliability data block of the SSD DUT device in a first self-adjusting mode to implement step S3. Figure 4 Draw Figure 1 A flowchart illustrating the specific sub-steps of aging the pre-occupied reliability data block of the SSD DUT device in a first self-adjusting mode to implement step S4. Figure 5 Draw Figure 3 A schematic diagram illustrating the detailed steps of implementing step S32 in performing the first regulated BIT aging in the aging zone; Figure 6 A schematic diagram illustrating the layout of a self-adjusting SSD aging test device according to an embodiment of the present invention is shown. Figure 7 Illustrations of embodiments of the present invention Figure 1 A schematic diagram of a jig tray in step S1 on which several SSD DUT devices are loaded ((A) is a side view, (B) is a top view). Figure 8 Illustrations of embodiments of the present invention Figure 1 A schematic diagram of all data blocks of a single SSD DUT device in step S1; Figure 9 Draw Figure 8 A schematic diagram showing the status of a data block after step S2; Figure 10 Draw Figure 8 A schematic diagram showing the status of a data block after step S3; Figure 11 Draw Figure 8 A schematic diagram showing the status of a data block after step S4; Figure 12 A schematic diagram of the system operating in step S5 is shown. Figure 13 Draw Figure 6 A side view diagram showing the central transport mechanism moving the fixture disk between the electrical testing area and the aging area.

[0036] Reference numerals: 10, jig tray; 11, mating slot; 12, BIT contact; 13, RDT contact; 20, SSD DUT device; 20A, standard SSD device; 21, data block; N, early potential defective data block; R, reliability data block; RO, first occupied reliability data block; 1RS, first stable data block; 1RN, first unstable data block; 2RS, second stable data block; 2RN, second unstable data block; 30, test machine; 31, electrical testing area; 40, aging heating cabinet; 41, aging area; 50, transport mechanism; 51, moving track; 52, robotic arm; 53, suction cup. Detailed Implementation

[0037] The technical solutions of the embodiments of the present invention will be clearly and completely described below with reference to the accompanying drawings. Obviously, the described embodiments are only some embodiments for understanding the inventive concept of the present invention, and cannot represent all embodiments, nor are they interpreted as the only embodiments. Based on the embodiments of the present invention, all other embodiments obtained by those skilled in the art under the premise of understanding the inventive concept of the present invention are within the scope of protection of the present invention.

[0038] It should be noted that if directional indicators (such as up, down, left, right, front, back, etc.) are involved in the embodiments of the present invention, these directional indicators are only used to explain the relative positional relationships and movement of the components in a specific posture. If the specific posture changes, the directional indicators will also change accordingly. To better understand the technical solution of the present invention, the self-adjusting SSD aging test method and equipment of the present invention will be described and explained in further detail below, but this should not be construed as limiting the scope of protection of the present invention.

[0039] The accompanying drawings only illustrate the commonalities among multiple embodiments; differences or distinctions are described in words or presented in comparison with the drawings. Therefore, those skilled in the art, based on industry characteristics and the nature of the technology, should correctly and reasonably understand and judge whether the individual technical features or any combination thereof described below can characterize the same embodiment, or whether multiple mutually exclusive technical features can only characterize different variations of the embodiment.

[0040] Reference Figure 1 It can be used in conjunction with a control group. Figure 6 and Figure 7 This invention discloses a self-adjusting SSD aging test method, comprising main steps S1 to S5, wherein main steps S4 and S5 are optional steps. Figure 1 The dashed box in the figure indicates that S1-S3 of the method are as follows.

[0041] Regarding the main step S1, several SSD DUT devices 20 are loaded into the jig disk 10 (e.g., ...). Figure 7 As shown), the jig disk 10 can be moved between the electrical testing zone 31 and the aging zone 41 using the transport mechanism 50 (e.g., Figure 6 (As shown); where SSD DUT device 20 is the solid-state drive product under test, fixture tray 10 is the circuit board that electrically connects SSD DUT device 20 to the device, test machine 30 can be installed in electrical testing area 31, and aging heating cabinet 40 can be installed in aging area 41; each SSD DUT device 20 has multiple data blocks 21 (such as... Figure 8(As shown). SSD stands for Solid State Drive, and DUT stands for Device Under Test.

[0042] Regarding the main step S2, all data blocks 21 of the full-area aging SSD DUT device 20 (such as...) Figure 8 As shown); refer to Figure 2 The main step S2 includes the following sub-steps: S21, performing external BIT card opening to store all data of the SSD DUT device 20 in the external burn-in program in the electrical test area 31; S22, performing high-temperature RDT aging to age the SSD DUT device 20 in the aging area 41; S23, performing reliability BIT reading to verify the full data of the SSD DUT device 20 in the electrical test area 31 to identify and mark early potentially defective data blocks N and reliability data blocks R (e.g., ...). Figure 9 (As shown); After step S23, the early potentially defective data block N is covered and does not participate in subsequent tests (such as main steps S3, S4, or repeated BIT aging). The covering operation is based on the external burn-in program executed in the electrical test area 31 (corresponding to step S23). Here, data block 21 is generally the electronic memory storage area in the NAND flash memory chip; the external burn-in program is a computer program that can store and read data block 21 and runs in the electrical test area 31; "high temperature RDT aging" is generally under the condition that data block 21 is not running in a static environment, and the data block 21 is in a temperature-increasing environment for a specific time. High temperature refers to a temperature above 40°C in an abnormal temperature state; the data stored in data block 21 using the external burn-in program may include the control instruction information required by the aging area 41 in step S22, specifically including the control parameters of RDT aging, for example, the control parameters of the SSD in the aging area 41 in step S22. The control temperature and time of the DUT device 20 are specifically, but not limited to, 70℃ and 24h, and can be adjusted in multiple segments from 0℃ to 100℃ and from 1h to 24h. The adjustment modes for the reliability verification of full-area aging in this application embodiment include high-temperature aging test, low-temperature aging test, high and low temperature cycle test, and data retention test. The adjustment mode can be switched and the parameters adjusted as needed.

[0043] Regarding main step S3, the reliability data block R of the first self-adjusting aging SSD DUT device 20; refer to Figure 3The main step S3 includes the following sub-steps: S31, performing the first internal BIT activation, loading the internal burn-in program into the reliability data block R in the electrical testing area 31, the reliability data block R including spare reliability data blocks that are not stored by the internal burn-in program; S32, performing the first adjustable BIT aging, performing self-circulating data storage and reset of the spare reliability data blocks of the SSD DUT device 20 in the aging area 41, and storing the first test result; S33, performing the first stability BIT read, reading the first test result of the SSD DUT device 20 in the electrical testing area 31 to distinguish and mark the first stable data block 1RS and the first unstable data block 1RN of the spare reliability data blocks (e.g., ...). Figure 10 As shown in the figure, the reliability data block occupied by the internal burn-in program is marked as RO; after the next step S33, the first unstable data block 1RN is covered and does not participate in subsequent tests (such as the main step S4 or repeated BIT aging). The covering operation can be performed in the aging zone 41 based on the internal burn-in program (corresponding to the next step S32); wherein, the free reliability data block refers to the part of the reliability data block R that is not occupied by the internal burn-in program. The internal burn-in program is a computer program that can store and read the free reliability data block. It runs in the aging zone 41, so that the free reliability data block in the next step S32 is under high load (90%~100%); the data stored in the reliability data block R by the internal burn-in program can include the control instruction information required by the aging zone 41 in the next step S32, specifically including the control parameters of BIT aging, such as the control temperature, time, computing load rate, number of computing cycles and computing interval time of the SSD DUT device 20 in the aging zone 41 in the next step S32, to verify the stability of the SSD product. In step S32, the control temperature for the first adjustable BIT aging is generally lower than the high-temperature setting temperature for performing high-temperature RDT aging in step S22. The low-temperature setting temperature for high-temperature RDT aging can be lower than the control temperature for BIT aging.

[0044] The basic implementation principle of this embodiment is as follows: Utilizing main steps S1 to S3, the fixture disk 10 acts as an information communication bridge between the electrical testing area 31 and the aging area 41. Based on the external burn-in program in sub-step S21, the SSD DUT device 20 performs full-area data storage in the electrical testing area 31. The fixture disk 10 carries the control information of the electrical testing area 31 to the aging area 41. Based on the internal burn-in program in sub-step S31, through sub-steps S32 and S33, the fixture disk 10 transmits the first test result generated and stored in the aging area 41 back to the electrical testing area 31. The same aging test equipment is used in the BIT equipment area to complete the reliability and stability verification of the SSD DUT device 20. The RDT card opening of the RDT test equipment is omitted, as is the transfer of the SSD DUT device 20 between the RDT and BIT. The adjustable BIT aging, which can perform self-circulating data storage and reset of the reliability data block R of the SSD DUT device 20, achieves the effect of self-optimizing the test parameters for stability verification. Furthermore, it can be understood that, within the aging zone 41, the high load heat generated during the first regulated BIT aging process in step S32 can also be used for temperature energy saving during the high-temperature RDT aging process in step S22.

[0045] To facilitate a better understanding of the technical solution of the present invention, but not as a limitation thereof, the following more specific description is provided. In this embodiment, see [reference needed]. Figure 1 , Figure 10 and Figure 11 The self-adjusting SSD aging test method further includes: an optional main step S4, and a second self-adjusting mode aging test of the reliability data block R of the SSD DUT device 20; refer to Figure 4 The main step S4 includes the following sub-steps: S41, performing the second internal BIT activation, loading the internal burn-in program into the first stable data block 1RS in the electrical test area 31; S42, performing the second adjustable BIT aging, performing self-circulating data storage and reset of the first occupied reliability data block RO of the SSD DUT device 20 in the aging area 41, and storing the second test result; S43, performing the second stability BIT read, reading the second test result of the SSD DUT device 20 BIT in the electrical test area 31; wherein, the second test result distinguishes and marks the second stable data block 2RS and the second unstable data block 2RN (e.g., the first occupied reliability data block RO) of the first occupied reliability data block RO. Figure 11As shown in the diagram, the data block occupied by the internal burn-in program in the first stable data block 1RS is marked as 1RS-P. After step S43, the second unstable data block 2RN is covered and is no longer used as a storage unit of the SSD product. The covering operation is based on the internal burn-in program executing in the aging area 41 (corresponding to step S42). The previously occupied reliability data block RO refers to the part of the reliability data block R occupied by the internal burn-in program in the main step S3. The internal burn-in program is still running in the aging area 41. The data of the first stable data block 1RS stored in the reliability data block R by the internal burn-in program may include the control instruction information required by the aging area 41 in step S42.

[0046] Therefore, the second stable data block 2RS and the second unstable data block 2RN, marked with the first occupied reliability data block RO, are occupied by the internal burn-in program in main step S3 and cannot be used for stability verification. Thus, the reliability data block 21, which is not occupied by the internal burn-in program in main steps S3 and S4, will undergo two self-adjusting aging processes. The reliability data blocks R are divided into three categories: the first category is those that only undergo the first self-adjusting aging process (corresponding to step S32), which are not occupied in main step S3 but are occupied in main step S4 (which can correspond to...). Figure 11 The first type is data block 1RS-P, which only undergoes the second self-adjustment aging process (corresponding to step S42) and is the first-occupied reliability data block RO (which can correspond to...). Figure 11 The second stable data block 2RS and the second unstable data block 2RN), the third type is the reliability data block R that has undergone both the first self-adjustment aging method and the second self-adjustment aging method (corresponding to sub-steps S32 and S42) and has not been occupied in the main steps S3 and S4 (which can correspond to the second stable data block 2RS and the second unstable data block 2RN). Figure 11 The failure rates and changes of the first stable data block 1RS in the model can be used based on probability analysis to verify whether there is insufficient or excessive supply of conditions for the first and second self-adjusting aging methods. This allows for energy-efficient self-training to adjust reasonable self-adjusting aging parameters and gradually optimize the internal burn-in program by burning it into reliable data blocks R that are predicted to be less prone to failure. Specifically, the self-adjusting method accounts for an increasingly larger proportion under the aging conditions of main steps S3 and S4, ensuring that as many first unstable data blocks 1RN as possible are selected in main step S3, and as few second unstable data blocks 2RN as possible are selected in main step S4. Ultimately, this achieves the effect of eliminating the need for main step S4 without affecting the test results. In a specific embodiment, main step S4 is implemented in the early stages of model training, but can be omitted or changed to a sampling mode in the later stages. Whether main step S4 is implemented typically depends on whether the first test result of main step S3 produces an adverse change.

[0047] In this embodiment, see Figure 1 , Figure 11 and Figure 12 The self-adjusting SSD aging test method further includes: an optional main step S5, in which the external burn-in program of the secondary step S21 is modified based on the reading of the first test result in the electrical test area 31, so as to improve the rejection rate of the next batch of SSD DUT devices 20 in marking potentially defective data blocks N in the early stage. By using the main step S5 of reading the first test result in the electrical test area 31, the parameters of the external burn-in program of the secondary step S21 are incrementally modified under preset rules. When the rejection rate of the next batch of SSD DUT devices 20 in the main step S2 is improved, the rejection rate of the first unstable data block 1RN in the main step S3 is relatively reduced. Therefore, the parameters of the internal burn-in program used in the first self-adjusting aging method in the main step S3 can be further optimized in the direction of energy saving. For example, the aging temperature and aging time of the main step S2 can be gradually increased, and the load efficiency, aging temperature and aging time of the main step S3 can be gradually decreased. The power consumption can be reduced while the aging detection rate is roughly the same.

[0048] In this embodiment, see again Figure 3 and Figure 10 In the sub-step S31 of the first internal BIT card opening in the main step S3, the internal burn-in program also maps a backup burn-in program in the reliability data block R (which can correspond to...). Figure 10 The first stable data block 1RS in the middle part and Figure 11 In step S32, after the predetermined time of the first cycle of BIT aging process or when the internal burn-in program cannot be executed, the backup burn-in program replaces or repairs the internal burn-in program, repeatedly storing and resetting the previously occupied reliability data block RO in the reliability data block R that was occupied by the internal burn-in program, and storing the third test result including the first test result; in step S33, the third test result is read, and the common stable data block (equivalent to) the reliability data block R is identified and marked. Figure 11 The sum of the first stable data block 1RS and the second stable data block 2RS) and the commonly unstable data block (equivalent to Figure 11The sum of the first unstable data block 1RN and the second unstable data block 2RN. In the sub-step S31 of the first internal BIT activation in the main step S3, the internal burn-in program is mapped to a backup burn-in program in the reliability data block R, i.e., mapped in the aging zone 41. After a predetermined time in the first cycle of BIT aging process, the internal burn-in program is mapped (moved) from the previously occupied reliability data block RO to another measured reliability data block R, becoming a backup burn-in program, and the internal burn-in program is deleted and replaced by the backup burn-in program, so that the stability of the previously occupied reliability data block RO can be verified; or / and, the mapping is pre-implemented in the electrical test zone 31. When the internal burn-in program cannot be executed, the backup burn-in program is started to replace or repair it; if the backup burn-in program cannot be executed, it is enabled to determine that the SSD DUT device 20 has a general failure and the power-consuming load is stopped; if the backup burn-in program can be executed, it indicates that the internal burn-in program is damaged. Even so, the main step S3 of the first adjustable BIT aging can still be executed.

[0049] In this embodiment, all data blocks 21 of the full-area aging SSD DUT device 20 in main step S2 include redundant data blocks. By utilizing the inclusion of redundant data blocks in all data blocks 21, early potentially defective data blocks N in the redundant data blocks can be pre-emptively removed after main step S2. The reliability data blocks of the redundant data blocks serve as backup performance during the product stage. Compared to the functional areas, the reading and storage frequency of the redundant data blocks is relatively low. The control command information regarding the aging heating cabinet 40 in the internal burn-in program of main step S3 or / and main step S4 can be stored in the reliability data blocks of the redundant data blocks (corresponding to sub-step S31 or / and sub-step S41). The reliability data block R in sub-step S23 also includes a first reliability data block located in the functional area and a second reliability data block located in the redundant blocks. The internal burn-in program in sub-step S31 preferentially loads the second reliability data block of the redundant blocks. After using step S23, the first reliability data block located in the functional area and the second reliability data block located in the redundant data block of the reliability data block R are obtained. Compared with the first reliability data block, the internal burn-in program in step S31 can preferentially load the second reliability data block. Therefore, the first reliability data block in the functional area can be trained by the first self-adjusting aging method in the main step S3. The main step S4 can be omitted as a step that can be omitted under the long-term training of the SSD DUT device 20 in the self-adjusting SSD aging test method. That is, the main step S4 needs to be executed at the beginning to collect test result information. After multiple continuous aging tests to a condition that is met, the main step S4 can be omitted.

[0050] In this embodiment, the internal burn-in program in step S31 has a self-running function and a self-adjusting function under training iteration, and provides control parameters for the aging zone 41 via the electrical connection of the fixture disk 10. Using the internal burn-in program in step S31, the control parameters for the aging zone 41 are provided via the electrical connection of the fixture disk 10, enabling self-running BIT aging in the aging zone 41 and self-adjusting BIT card opening under training iteration in the electrical testing zone 31.

[0051] In this embodiment, see Figure 7 In the main step S1, the fixture tray 10 also contains a tested standard SSD device 20A, mixed in with the SSD DUT device 20. After the main step S2, the standard SSD device 20A marks the early potentially defective data blocks and reliability data blocks corresponding to the measured results. Then, in the main step S3, the difference between the standard test results obtained by aging the reliability data blocks of the standard SSD device 20A using the first self-adjustment method and the first test results can establish a node on the distinction curve, used to verify the reliability of the self-adjustment parameters in the high-load, heat-scalable mode in the next step S32. Utilizing the mixed presence of the standard SSD device 20A, when the measured test results of the standard SSD device 20A after the main step S2 correspond to the same known test results of the standard SSD device 20A, it indicates that the installation position of the standard SSD device 20A is correct and it can be used as a reference. The node data of the distinction curve established in the main step S3 can verify the reliability of the parameters in the high-load, heat-scalable mode in the next step S32. The first test result specifically includes SMART information from the BIT aging test, such as temperature, number of read / write cycles, power-on time, etc.

[0052] Reference Figure 5 In this embodiment, the sub-step S32 of the first adjustable BIT aging includes the following detailed steps: S321, see reference Figure 6 and Figure 7 In the aging zone 41, multiple set parameters of the internal burn-in program in the initial high load temperature-increasing mode are read, and the SSD DUT device 20 and the standard SSD device 20A are subjected to adjustable BIT aging. If the difference curve established in the first time period of the test time is stable, the enhanced adjustment of parameters is stopped. S322. If the difference curve established in the first time interval of the test in detailed step S321 cannot be stabilized, adjust multiple parameters of the initial high load temperature-increasing mode in an increasingly progressive manner until the difference curve established in the second time interval of the test is stable. S323. If the difference curve established by detailed step S321 or detailed step S322 is stable, adjust one or some parameters of the high-load heatable mode in a weakened manner so that the difference curve established during the second time period of the test can remain stable. S324. Determine the parameter changes of the weakening difference curve established within the test time, and perform time-weighted averaging to optimize the internal burn-in program, which will serve as multiple setting parameters for the next initial high-load heat-up mode.

[0053] Therefore, by using detailed steps S321 to S324, the sub-step S32 of the first adjustable BIT aging can be specifically executed in the aging zone 41, and the setting parameters of the internal burn-in program can be optimized.

[0054] In addition, please refer to Figure 6 Another embodiment of the present invention provides a self-adjusting SSD aging test device corresponding to the above-described self-adjusting SSD aging test method, including a test machine 30, an aging heating chamber 40, and a transport mechanism 50. This device is used to perform a self-adjusting SSD aging test method as described above, and is suitable for intelligent self-adjusting reliability and stability verification of several SSD DUT devices 20 mounted in the fixture tray 10. (Refer to...) Figure 7 In a specific example, the jig disk 10 is provided with a plurality of mating slots 11, and the SSD DUT device 20 is mated to the mating slots 11.

[0055] The test machine 30 is located in the electrical testing area 31. The test machine 30 is configured to be electrically connected to the fixture disk 10 and execute an external burn-in program on the SSD DUT device 20. This program is used to perform external BIT unlocking and reliability BIT reading of several SSD DUT devices 20 to mark the reliability data block R after high-temperature RDT aging. The test machine 30 is also configured to be electrically connected to the fixture disk 10 and load an internal burn-in program on the SSD DUT device 20.

[0056] The aging heating cabinet 40 is configured in the aging zone 41 and located on one or both sides of the test machine 30, and is used to perform high-temperature RDT aging and adjustable BIT aging on the SSD DUT device 20.

[0057] The transport mechanism 50 is configured to move the fixture disk 10, so that the fixture disk 10 can move between the electrical testing area 31 and the aging area 41.

[0058] In the aging zone 41, the aging heating cabinet 40 can communicate the control command information between the external burn-in program and the internal burn-in program through the fixture plate 10. When the idle reliability data block of the reliability data block R of the SSD DUT device 20 is subjected to self-circulating data storage and reset adjustment BIT aging and the first test result after adjustment BIT aging is stored, the test machine 30 is also configured to read the first test result to mark the first stable data block 1RS and the first unstable data block 1RN of the idle reliability data block.

[0059] The basic implementation principle of this embodiment is as follows: by integrating the testing machine 30, the aging heating cabinet 40, and the transport mechanism 50 into the same set of equipment, intelligent self-adjusting aging testing of the SSD DUT device 20 is realized. This invention eliminates the need for additional RDT testing equipment, reduces the number of transfers between the RDT and BIT equipment, thereby simplifying the testing process and improving testing efficiency. Simultaneously, an adjustable BIT aging process is implemented, utilizing the transport mechanism 50 to transport the fixture disk 10 to achieve self-circulating data storage and reset, enabling more accurate differentiation between stable and unstable data blocks 21, improving testing accuracy and reliability. Furthermore, the external burn-in program can be corrected, increasing the amount of early potentially defective data blocks 21 removed in the next test, thereby continuously improving testing results.

[0060] In this embodiment, in the electrical testing zone 31, the testing machine 30 can read the first test result and correct the high-temperature RDT aging parameters of the external burn-in program, and store them in the fixture tray 10; in the aging zone 41, the aging heating cabinet 40 can also read the high-temperature RDT aging parameters in the SSD DUT device 20 through the fixture tray 10. Utilizing the combined structure of the testing machine 30 as the main control terminal, the aging heating cabinet 40 as the controlled terminal, and the carrier mechanism 50, fixture tray 10, and SSD DUT device 20 (or standard SSD device 20A) as parameter transmission media, the high-temperature RDT aging parameters and BIT aging parameters can be automatically corrected and the test parameters can be transmitted, achieving efficient and accurate self-adjusting SSD aging testing. Furthermore, the monitoring module and user interface connected to the aging heating cabinet 40 can be located in the aging zone 41 to achieve real-time monitoring and forced parameter intervention.

[0061] In this embodiment, the testing machine 30 includes a BIT card opening device, the aging heating cabinet 40 is an RDT high-temperature aging cabinet, and the fixture tray 10 is provided with BIT contacts 12 and RDT contacts 13, enabling the SSD DUT device 20 to carry control command information from the testing machine 30 to the aging heating cabinet 40 and to transmit test result information from the aging heating cabinet 40 to the testing machine 30. By utilizing the specific architecture of the testing machine 30 and the aging heating cabinet 40, and the BIT contacts 12 and RDT contacts 13 on the fixture tray 10, the stability and efficiency of data interaction in SSD aging testing are improved. The fixture tray 10, which carries the SSD DUT device 20, serves as the main parameter transmission medium and should have better flexibility and scalability without the need for wiring, adapting to the SSD testing and aging needs in different scenarios.

[0062] In this embodiment, see Figure 6 andFigure 13 The transport mechanism 50 includes a moving track 51 and a robotic arm 52 with a flipping suction cup 53 that moves on the moving track 51. The flipping suction cup 53 adheres to the back of the fixture tray 10. The robotic arm 52 is used to flip the fixture tray 10 to suspend the SSD DUT device 20 downwards in the aging heating chamber 40 and to load the SSD DUT device 20 upwards into the testing machine 30. The transport mechanism 50, consisting of the robotic arm 52 with the flipping suction cup 53 and the moving track 51, achieves automatic flipping and efficient transfer of the SSD DUT device 20 between the aging heating chamber 40 and the testing machine 30, improving testing efficiency. Simultaneously, by equipping the robotic arm 52 with sensors connected to the control system, the accuracy of the flipping and positioning of the fixture tray 10 and the automation level of the entire SSD aging test process are further improved, reducing manual operation costs and error rates.

[0063] Therefore, the self-adjusting SSD aging test method and equipment of this invention are typically applied in the SSD production process. Through the self-adjusting aging test method, potentially defective data blocks in the early stages can be more effectively identified and eliminated, improving the quality and reliability of SSD products. The effects include, but are not limited to, any of the following: 1. By adaptively adjusting the aging test parameters, the embodiments of the present invention can more accurately simulate the aging of SSDs in actual use, thereby improving the accuracy and reliability of the test; 2. By comparing the standard SSD device with the SSD DUT device, the embodiments of the present invention can verify the reliability of the self-adjusting parameters in real time, ensuring the effectiveness and reliability of the aging test; 3. By employing a progressive parameter adjustment strategy, this embodiment of the invention can find the optimal combination of aging test parameters in a short time, thereby improving testing efficiency and reducing production costs.

[0064] In terms of substantive characteristics, it includes, but is not limited to, any of the following: 1. Implement intelligent partition aging: In step S2, in addition to the external burn-in program performing full-area aging, intelligent partitioning technology can also be introduced; by intelligently partitioning the data blocks of the SSD, the intensity and strategy of aging can be dynamically adjusted according to the historical usage and performance data of the data blocks; in this way, potentially defective data blocks in the early stage can be eliminated more effectively, and the accuracy of the overall aging test can be improved. 2. Adaptive Internal Burn-in Program: In step S3, the internal burn-in program can be further upgraded to an adaptive mode. By monitoring the performance indicators of the SSD DUT device in real time, such as read / write speed and error rate, the internal burn-in program can dynamically adjust the aging strategy to more accurately distinguish and mark stable and unstable data blocks; this adaptive mechanism can improve the sensitivity and efficiency of testing. 3. Perform iterative optimization and feedback loop: The modified external burn-in program mentioned in step S5 can be further constructed into an iterative optimization and feedback loop mechanism, using the results and data of each test to continuously optimize the aging test methods and parameters; through machine learning and other technologies, the system can automatically analyze historical test data, discover potential problems, and propose improvement suggestions, thereby continuously improving the test effect; 4. Combining Cloud-Edge Collaborative Aging Testing: Aging testing can be combined with cloud computing and edge computing. Large-scale data analysis and model training can be performed in the cloud, while real-time aging testing and data processing can be carried out at the edge (i.e., where the SSD DUT device is located). This cloud-edge collaborative architecture can make full use of the resources of cloud computing and the low latency of edge computing, improving the efficiency and accuracy of aging testing. 5. Establish a visual test report and interface: To better display the results of aging tests and facilitate user operation, a visual test report and interface can be developed. Users can understand the performance status of the SSD, potential problems, and improvement suggestions through intuitive charts and statistical data. At the same time, the interface can also provide user-friendly operation options, such as custom test parameters and one-click testing, to lower the user threshold.

[0065] Therefore, the self-adjusting SSD aging test method and equipment of the present invention will be more complete, efficient and intelligent, providing strong support for SSD reliability testing.

[0066] The embodiments described herein are preferred embodiments for facilitating understanding or implementation of the technical solutions of the present invention, and are not intended to limit the scope of protection of the present invention. All equivalent changes made in accordance with the structure, shape, and principle of the present invention should be covered within the scope of protection claimed by the present invention.

Claims

1. A self-regulating SSD burn-in test method, characterized in that, Comprising: S1, loading a plurality of SSD DUT devices in a fixture tray, the fixture tray being movable between an electrical test area and an aging area; S2, aging all data blocks of the SSD DUT devices, step S2 comprising: S21, performing an external BIT opening card, to perform full-area data storage on the SSD DUT devices in the external burner program of the electrical test area; S22, performing high-temperature RDT aging, to age the SSD DUT devices in the aging area; S23, performing a reliability BIT read, to verify the full-area data blocks of the SSD DUT devices in the electrical test area, to distinguish and mark early potential bad data blocks and reliable data blocks; S3, first self-regulating mode aging of reliable data blocks of the SSD DUT devices, step S3 comprising: S31, performing a first internal BIT opening card, to load the internal burner program into the reliable data blocks in the electrical test area, the reliable data blocks including empty reliable data blocks that do not store the internal burner program; S32, performing a first regulated BIT aging, to perform self-circulating data storage and reset of the empty reliable data blocks of the SSD DUT devices in the aging area, and store a first test result; S33, performing a first stability BIT read, to read the first test result of the SSD DUT devices in the electrical test area, to distinguish and mark first stable data blocks and first unstable data blocks of the empty reliable data blocks.

2. The self-regulating SSD aging test method according to claim 1, characterized in that: The self-regulating SSD aging test method further comprises: S4, second self-regulating mode aging of the SSD DUT devices in the first occupied reliable data blocks that store the internal burner program in step S3, step S4 comprising: S41, performing a second internal BIT opening card, to load the internal burner program into the first stable data blocks in the electrical test area; S42, performing a second regulated BIT aging, to perform self-circulating data storage and reset of the first occupied reliable data blocks of the SSD DUT devices in the aging area, and store a second test result; S43, performing a second stability BIT read, to read the second test result of the SSD DUT devices in the electrical test area; wherein the second test result distinguishes and marks second stable data blocks and second unstable data blocks of the first occupied reliable data blocks; Or, in step S31 of the first internal BIT card opening in step S3, the internal burning program is also mapped with a standby burning program in the reliability data block; after a predetermined time of the first cycle BIT aging process in step S32 or when the internal burning program cannot be executed, the standby burning program is substituted or repaired for the internal burning program, the repeated data storage and reset of the preempted reliability data block area occupied by the internal burning program in the reliability data block are performed, and the third test result including the first test result is stored; in step S33, the third test result is read, and the common stable data block and the common unstable data block of the reliability data block are distinguished and marked.

3. The self-adjusting SSD burn-in test method of claim 1, wherein, All data blocks of the full-zone aged SSD DUT device in step S2 include redundant data blocks.

4. The self-adjusting SSD burn-in test method of claim 3, wherein, The reliability data block in step S23 further includes a first reliability data block located in a functional zone and a second reliability data block located in a redundant data block, and the internal burning program in step S31 is preferentially loaded in the second reliability data block of the redundant data block.

5. The self-adjusting SSD burn-in test method of claim 1, wherein, The internal burning program in step S31 has a self-running function and a self-adjusting function under training iteration, and provides control parameters of the aging zone through electrical connection of the fixture tray.

6. The self-adjusting SSD burn-in test method of claim 1, wherein, The fixture tray in step S1 is further provided with a measured standard SSD device mixed in the SSD DUT device; after step S2, when the standard SSD device marks the data block corresponding to the measured result as an early potential defective data block and the reliability data block, the standard test result obtained by synchronously first self-adjusting mode aging of the reliability data block of the standard SSD device in step S3 can be used to establish a node of a discrimination curve to verify the reliability of the self-adjusting parameters of the high-load temperature-rising mode in step S32.

7. The self-adjusting SSD burn-in test method of claim 6, wherein, The first self-adjusting BIT aging step S32 includes: S321, based on the multiple set parameters of the initial high-load temperature-rising mode provided by the internal burning program, the SSD DUT device and the standard SSD device are adjusted and aged by the BIT, and if the discrimination curve established in the first time period of the test time is stabilized, the parameter enhancement adjustment is stopped; S322, if the discrimination curve established in the first time period of the test time in step S321 cannot be stabilized, the multiple parameters of the initial high-load temperature-rising mode are adjusted with increasing intensity until the discrimination curve established in the second time period of the test time is stabilized; S323, if the discrimination curve established in step S321 or step S322 is stabilized, one or part of the parameters of the high-load temperature-rising mode is adjusted with decreasing intensity, and the discrimination curve established in the second time period of the test time remains stable; S324, the parameter change of the weakened discrimination curve established in the test time is determined, and the time-weighted average is performed to optimize the internal burning program as the multiple set parameters of the initial high-load temperature-rising mode for the next time.

8. The self-adjusting SSD burn-in test method of any one of claims 1-7, wherein, Further comprising: S5、in the electrical measurement area based on the first test result reading, the burn-in program of step S21 is corrected to improve the rejection amount of the next batch of SSD DUT devices in step S2 to mark the early potential bad data block or improve the efficiency of step S2 full area aging.

9. A self-adjusting SSD burn-in test apparatus, characterized by, The self-adjusting SSD aging test equipment is suitable for intelligent self-adjusting reliability verification and stability verification of a plurality of SSD DUT devices installed in a jig tray, and the self-adjusting SSD aging test equipment comprises: A test machine is arranged in an electrical measurement area, and the test machine is configured to be electrically connected with the jig tray and execute a burn-in program on the SSD DUT device, for executing external BIT opening card and reliability BIT reading of a plurality of SSD DUT devices to mark the reliability data block after high-temperature RDT aging; the test machine is also configured to be electrically connected with the jig tray and load an internal burn-in program on the SSD DUT device; An aging heating cabinet is arranged in an aging area and located on one side or both sides of the test machine, for executing high-temperature RDT aging and adjustable BIT aging of the SSD DUT device; A carrying mechanism is configured to move the jig tray, so that the jig tray can be moved between the electrical measurement area and the aging area; Wherein, the aging heating cabinet in the aging area can communicate the control instruction information of the external burn-in program and the internal burn-in program through the jig tray, when the empty reliability data block of the reliability data block of the SSD DUT device is self-circulated data storage and reset adjustable BIT aging and stores the first test result after adjustable BIT aging, the test machine is also configured to read the first test result to mark the first stable data block and the first unstable data block of the empty reliability data block.

10. The self-adjusting SSD burn-in test apparatus of claim 9, wherein, In the electrical measurement area, the test machine can read the first test result and correct the high-temperature RDT aging parameter of the burn-in program, and store it in the jig tray; in the aging area, the aging heating cabinet can also read the high-temperature RDT aging parameter in the SSD DUT device through the jig tray; specifically, the test machine comprises a BIT opening card device, the aging heating cabinet is an RDT high-temperature aging cabinet, the jig tray is provided with a BIT contact and an RDT contact, so that the SSD DUT device can carry the control instruction information of the test machine to the aging heating cabinet and can transmit the test result information in the aging heating cabinet to the test machine; the carrying mechanism comprises a moving track and a mechanical arm moving on the moving track and having a turnover suction cup, the mechanical arm is used for turning over the jig tray to hoist the SSD DUT device downward in the aging heating cabinet and load the SSD DUT device upward in the test machine.

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