Electrified solid state disk testing method, device and equipment and storage medium

Abstract

The invention discloses a testing method, device and equipment for an electrified solid state disk and a storage medium. The testing method comprises the steps that the solid state disk in an electrified state is placed in a high and low temperature damp heat test box; adjusting the test box to reach a test environment based on the first temperature and the first humidity, and configuring the test box to reach temperature balance and humidity balance; placing the solid state disk for a first preset duration, and obtaining a first operation parameter in real time; taking out the solid state disk from the test box, and placing the solid state disk in the standard environment for a second preset duration; the solid state disk is connected to the test mainboard, the test mainboard is powered on for function stability detection lasting for a third preset duration, and a second operation parameter is monitored; and comparing a detection result of the function stability detection with an initial parameter of the solid state disk, and evaluating durability and function stability according to a comparison result and the first operation parameter. According to the method and the device, performance evaluation of the solid state disk in an extreme environment is realized, and the identification capability of the solid state disk on intermittent faults is remarkably improved.

Description

Technical Field

[0001] This application relates to the field of storage device technology, specifically to a testing method, apparatus, device, and storage medium for a charged solid-state drive. Background Technology

[0002] Solid-state drives (SSDs), as core data storage components, have their reliability under harsh environments such as high temperature and humidity as a key quality indicator. Currently, there are various standard testing methods in the field of environmental reliability testing for electronic components, such as relevant specifications developed by international standards organizations like JEDEC and IEC. These testing methods primarily focus on changes in the physical characteristics of products under extreme environmental conditions, simulating various environmental stresses to assess the product's lifespan and failure modes. However, the unique characteristic of storage products is that their functional failures are often not simple physical damage, but rather manifest as complex issues such as decreased data integrity, degraded read / write performance, and increased response latency. These all require comprehensive evaluation under the product's actual operating conditions.

[0003] Therefore, traditional testing methods still have certain limitations in terms of the repeatability of solid-state drive test results and their relevance to practical applications. In particular, for intermittent failures that only manifest under specific environmental conditions, the detection rate and predictive accuracy of existing testing methods still need to be improved. Summary of the Invention

[0004] In view of the above problems, this application provides a testing method, apparatus, device and storage medium for charged solid-state drives to solve the above technical problems.

[0005] Firstly, this application provides a testing method for a charged solid-state drive, comprising: Place the powered solid-state drive in a high and low temperature humidity test chamber; The high and low temperature humidity test chamber is adjusted to a preset test environment based on a preset first temperature and a preset first humidity, and the high and low temperature humidity test chamber is configured to achieve temperature and humidity balance under the test environment. The solid-state drive is placed for a first preset time, and the first operating parameters of the solid-state drive are obtained in real time; The solid-state drive is removed from the high and low temperature humidity test chamber and placed in a preset standard environment for a second preset time. The solid-state drive is connected to the test motherboard, and the test motherboard is powered on to perform a functional stability test for a third preset duration. The second operating parameters of the solid-state drive are monitored. The functional stability test includes the test system identification test, data read and write test, and status monitoring test of the solid-state drive. The test results of the functional stability test are compared with the initial parameters of the solid-state drive. The durability and functional stability of the solid-state drive are evaluated based on the comparison results and the first operating parameters. The initial parameters are the second operating parameters before the solid-state drive is placed in the high and low temperature humidity test chamber.

[0006] Secondly, this application provides a testing apparatus for a charged solid-state drive, comprising: The sample placement module is used to place a powered solid-state drive in a high and low temperature humidity test chamber. An environmental control module is used to adjust the high and low temperature humidity test chamber to a preset test environment based on a preset first temperature and a preset first humidity, and to configure the high and low temperature humidity test chamber to achieve temperature and humidity balance under the test environment. The first test module is used to place the solid-state drive for a first preset time and acquire the first operating parameters of the solid-state drive in real time. The sample cooling module is used to remove the solid-state drive from the high and low temperature humidity test chamber and place it in a preset standard environment for a second preset time. The second test module is used to connect the solid-state drive to the test motherboard, perform a continuous third preset duration of functional stability test on the test motherboard after powering it on, and monitor the second operating parameters of the solid-state drive. The functional stability test includes the solid-state drive's test system identification test, data read / write test, and status monitoring test. An evaluation module is used to evaluate the durability of the solid-state drive based on the first operating parameters, and to compare the detection results of the functional stability test with the initial parameters of the solid-state drive, and to evaluate the functional stability of the solid-state drive based on the comparison results. The initial parameters are the second operating parameters set before the solid-state drive is placed in the high and low temperature humidity test chamber.

[0007] Thirdly, this application provides an electronic device, including a memory and a processor, wherein: The memory is used to store computer programs; The processor is used to read the program in the memory and execute the steps of the test method for a charged solid-state drive as provided in the first aspect above.

[0008] Fourthly, this application provides a computer-readable storage medium having a readable computer program stored thereon, which, when executed by a processor, implements the steps of the test method for a charged solid-state drive as described in the first aspect above.

[0009] The present application provides a testing method, apparatus, equipment, and storage medium for charged solid-state drives (SSDs). The testing method involves placing a charged SSD in a high-low temperature and humidity test chamber. The chamber is adjusted to a preset test environment based on a first temperature and humidity setting, and the chamber is configured to achieve temperature and humidity equilibrium within the test environment. The SSD is placed for a first preset duration, and its first operating parameters are acquired in real time. The SSD is then removed from the chamber and placed in a preset standard environment for a second preset duration. The SSD is connected to a test motherboard, and the motherboard is powered on for a third preset duration to perform a continuous functional stability test while monitoring the SSD's second operating parameters. The results of the functional stability test are compared with the SSD's initial parameters, and the durability and functional stability of the SSD are evaluated based on the comparison results and the first operating parameters. This method addresses the technical problem of existing testing methods that primarily focus on changes in the physical characteristics of the product while neglecting functional performance evaluation under actual working conditions. It also addresses the difficulty in effectively detecting complex failure modes such as decreased data integrity, reduced read / write performance, and response latency, particularly the insufficient detection rate of intermittent faults triggered only under specific temperature and humidity conditions. It can simulate real working environment conditions to achieve comprehensive performance evaluation of solid-state drives in extreme environments, significantly improve the solid-state drive's ability to identify intermittent failures, enhance the correlation and repeatability of test results with actual application scenarios, and provide more accurate technical basis for product reliability design and quality control.

[0010] These or other aspects of this application will become more apparent in the following description of the embodiments. Attached Figure Description

[0011] To more clearly illustrate the technical solutions in the embodiments of this application or the prior art, the drawings used in the description of the embodiments will be briefly introduced below. Obviously, the drawings described below are only some embodiments of this application. For those skilled in the art, other drawings can be obtained based on these drawings without creative effort.

[0012] Figure 1 A flowchart illustrating the testing method for a charged solid-state drive provided in an embodiment of this application is shown.

[0013] Figure 2 A flowchart of step S100 of the testing method for a charged solid-state drive provided in an embodiment of this application is shown.

[0014] Figure 3 A flowchart of step S200 of the testing method for a charged solid-state drive provided in an embodiment of this application is shown.

[0015] Figure 4Another flowchart of the testing method for a charged solid-state drive provided in an embodiment of this application is shown.

[0016] Figure 5 A schematic diagram of the apparatus provided in an embodiment of this application is shown.

[0017] Figure 6 A schematic diagram of an electronic device provided in an embodiment of this application is shown.

[0018] Figure 7 A schematic diagram of a computer storage medium provided in an embodiment of this application is shown. Detailed Implementation

[0019] To enable those skilled in the art to better understand the solutions of this application, the technical solutions of the embodiments of this application will be clearly and completely described below with reference to the accompanying drawings. Obviously, the described embodiments are only a part of the embodiments of this application, and not all of them. All other embodiments obtained by those skilled in the art based on the embodiments of this application without creative effort are within the scope of protection of this application.

[0020] In the embodiments of this application, it should be noted that, in this document, relational terms such as first and second are used only to distinguish one entity or operation from another entity or operation, and do not necessarily require or imply any such actual relationship or order between these entities or operations.

[0021] Furthermore, the terms "comprising," "including," or any other variations thereof are intended to cover non-exclusive inclusion, such that a process, method, article, or apparatus that comprises a list of elements includes not only those elements but also other elements not expressly listed, or elements inherent to such a process, method, article, or apparatus. Without further limitation, an element defined by the phrase "comprising one..." does not exclude the presence of other identical elements in the process, method, article, or apparatus that includes said element.

[0022] Furthermore, in the embodiments of this application, "multiple" refers to two or more. Therefore, in the embodiments of this application, "multiple" can also be understood as "at least two". "At least one" can be understood as one or more, such as one, two, or more. For example, including at least one means including one, two, or more, and is not limited to which ones are included. For example, including at least one of A, B, and C, then it could include A, B, C, A and B, A and C, B and C, or A and B and C.

[0023] This application provides a testing method for a charged solid-state drive (SSD), which is applied to the reliability verification scenario of SSD under extreme environmental conditions. It is particularly suitable for evaluating the durability and functional stability of SSD under high temperature and high humidity environmental stress during continuous powered operation.

[0024] Figure 1 A flowchart illustrating the testing method for a charged solid-state drive provided in an embodiment of this application is shown, such as... Figure 1 As shown, the testing method for a charged solid-state drive provided in this application embodiment includes: Step S100: Place the powered solid-state drive (SSD) in a high and low temperature humidity test chamber. Optionally, in this embodiment, the SSD is kept powered on in the high and low temperature humidity test chamber, and then placed in the test area inside the chamber. This ensures that the SSD remains powered on during subsequent environmental testing, simulating the working conditions of the SSD in harsh environments during actual use. Preferably, the SSD is placed in the middle area of ​​the high and low temperature humidity test chamber.

[0025] Step S200: Adjust the high and low temperature humidity test chamber to reach the preset test environment based on the preset first temperature and first humidity, and configure the high and low temperature humidity test chamber to achieve temperature and humidity balance under the test environment. Optionally, this embodiment of the application controls the temperature and humidity adjustment system of the high and low temperature humidity test chamber to gradually adjust the environmental conditions inside the high and low temperature humidity test chamber according to the required target temperature (i.e., the first temperature) and target humidity (i.e., the first humidity). After the target temperature and target humidity are reached inside the low temperature humidity test chamber, it continues to run for a period of time to make the temperature and humidity distribution in each area inside the test chamber uniform and stable, thereby ensuring that there is temperature and humidity balance inside the high and low temperature humidity test chamber, providing stable and reliable test conditions for solid-state drives. In this embodiment of the application, the specific requirements for the first temperature and first humidity are not limited. The first temperature and first humidity are high temperature and high humidity, and the specific temperature and specific humidity are changed in real time according to the ambient temperature of the application scenario of the solid-state drive.

[0026] Step S300: Place the solid-state drive (SSD) for a first preset time and acquire the first operating parameters of the SSD in real time. Optionally, in this embodiment of the application, under the condition of maintaining a first temperature and a first humidity in a high and low temperature humidity test chamber, the SSD in a charged state is allowed to work continuously for a first preset time, while the operating status parameters of the SSD during this period are monitored and recorded in real time to obtain the first operating parameters, so as to obtain the real-time performance data of the SSD under extreme environmental conditions.

[0027] Step S400: Remove the solid-state drive from the high and low temperature humidity test chamber and place it in a preset standard environment for a second preset time. Optionally, in this embodiment of the application, after completing the high temperature and high humidity environment test, the solid-state drive is removed from the high and low temperature humidity test chamber and transferred to an environment where the temperature, humidity and other environmental parameters meet the standard requirements. It is then left to stand for a second preset time to allow the solid-state drive to gradually adapt to the standard environmental conditions and reach an environmental equilibrium state of temperature and humidity.

[0028] As one implementation method, in this embodiment of the application, the preset standard environment has a temperature of 25℃±5℃ and a humidity of 40%~60%.

[0029] Step S500: Connect the solid-state drive (SSD) to the test motherboard, power on the test motherboard, and perform a continuous functional stability test for a third preset duration. Monitor the second operating parameters of the SSD. The functional stability test includes the SSD's test system identification test, data read / write test, and status monitoring test. Optionally, in this embodiment, the SSD that has undergone environmental testing and recovery is connected to the test motherboard to perform a long-term functional verification test in a standard environment. The system identification test verifies whether the SSD can be correctly identified and initialized. The data read / write test evaluates whether the SSD's data storage and reading functions are normal. The status monitoring test continuously observes the SSD's working status, comprehensively evaluating the functional integrity of the SSD after undergoing extreme environment testing.

[0030] Step S600: Compare the functional stability test results with the initial parameters of the solid-state drive (SSD). Evaluate the durability and functional stability of the SSD based on the comparison results and the first operating parameters. The initial parameters are the second operating parameters used before the SSD is placed in the high and low temperature humidity test chamber. Optionally, this embodiment compares the functional stability test results with the baseline parameters of the SSD before testing, combined with the first operating parameters recorded during the high temperature and humidity environment test, to comprehensively analyze the performance changes of the SSD from multiple dimensions, including functional performance stability, data integrity, and environmental adaptability, thereby obtaining an objective evaluation conclusion on the durability and functional stability of the SSD under extreme environmental conditions.

[0031] The testing method for charged solid-state drives (SSDs) provided in this application addresses the technical problem that existing testing methods primarily focus on changes in the physical characteristics of the product while neglecting functional performance evaluation under actual working conditions. This makes it difficult to effectively detect complex failure modes such as data integrity degradation, read / write performance decline, and response latency, and is particularly problematic in terms of insufficient detection rate for intermittent faults triggered only under specific temperature and humidity conditions. By simulating real-world working environment conditions, this method enables comprehensive performance evaluation of SSDs in extreme environments, significantly improving the SSD's ability to identify intermittent faults, enhancing the correlation and repeatability of test results with actual application scenarios, and providing more accurate technical basis for product reliability design and quality control.

[0032] In some embodiments, Figure 2 A flowchart of step S100 of the testing method for a charged solid-state drive provided in an embodiment of this application is shown, as follows: Figure 2 As shown, step S100: placing the energized solid-state drive in a high and low temperature humidity test chamber includes: Step S110: Detect the integrity and connectivity of the solid-state drive (SSD). Optionally, in this embodiment, the integrity of the SSD can be visually inspected to confirm whether there are physical damages such as cracks or deformations in the casing. The connectivity of the SSD can be tested using a multimeter or other testing instruments to ensure the electrical connections of all signal lines and power lines are normal.

[0033] Step S120: Place the solid-state drive (SSD) in a high and low temperature humidity test chamber and connect it to an external test motherboard via the chamber's dedicated interface channel to power on the SSD. Optionally, the high and low temperature humidity test chamber has a sealed dedicated interface channel on its wall, which effectively prevents environmental exchange between the inside and outside of the chamber. In this embodiment, the SSD's connector is connected to the data cable and power cable of the external test motherboard via this dedicated interface channel. The external test motherboard provides a stable operating voltage of 5V±0.1V to the SSD through the dedicated interface channel, and the current is set to approximately 1A according to the SSD's specifications to ensure that the SSD maintains continuous operation under high temperature and high humidity test conditions. Exemplarily, the inside of this dedicated interface channel can be filled with waterproof and moisture-proof material, and the connection point uses a sealing ring and locking mechanism to ensure environmental sealing.

[0034] In some embodiments, Figure 3 A flowchart of step S200 of the testing method for a charged solid-state drive provided in an embodiment of this application is shown, as follows: Figure 3 As shown, step S200: adjusting the high and low temperature humidity test chamber to reach the preset test environment based on the preset first temperature and first humidity, and configuring the high and low temperature humidity test chamber to achieve temperature and humidity balance under the test environment, includes: Step S210: Adjust the relative temperature and relative humidity of the high and low temperature humidity test chamber according to the heating and humidification systems. Optionally, in this embodiment, the environmental parameters inside the chamber are gradually adjusted by controlling the heating and humidification systems of the high and low temperature humidity test chamber according to preset heating and humidification rates. For example, the temperature control accuracy of the heating system is made to ±1℃ with a response time of less than 5 minutes, and the humidity control accuracy of the humidification system is made to ±2% with a response time of less than 10 minutes, thereby ensuring that the environmental parameters of the high and low temperature humidity test chamber smoothly transition to the target first temperature and first humidity, avoiding the impact of drastic changes in temperature and humidity on the test sample.

[0035] Step S220: After the relative temperature and relative humidity of the high and low temperature humidity test chamber reach the first temperature and the first humidity respectively, the temperature distribution and humidity distribution in the high and low temperature humidity test chamber are configured according to the circulating air system configuration of the high and low temperature humidity test chamber until the high and low temperature humidity test chamber reaches temperature and humidity balance. Optionally, in this embodiment, after the temperature and humidity parameters reach the set first temperature and the first humidity, the circulating air system inside the high and low temperature humidity test chamber is activated to adjust the airflow speed inside the high and low temperature humidity test chamber. Exemplarily, in this embodiment, the airflow rate is maintained at 2-3 m / s by adjusting the circulating air system, and the airflow direction is horizontal circulation. This promotes the uniform distribution of temperature and humidity fields in each area of ​​the high and low temperature humidity test chamber, eliminates local hot spots or uneven humidity, and controls the difference in environmental parameters in the entire test space within the allowable range, thereby achieving temperature and humidity balance.

[0036] Step S230: Monitor the relative temperature and relative humidity of the high and low temperature humidity test chamber at a preset frequency, and adjust the heating system, humidification system, and circulating air system of the high and low temperature humidity test chamber in real time according to a preset PID control algorithm to configure the error of the relative temperature and relative humidity of the high and low temperature humidity test chamber within a preset range. Exemplarily, this application embodiment can use high-precision sensors distributed in multiple locations inside the test chamber to collect temperature and humidity data in real time at a frequency of once per minute. The collected data is compared with the set first temperature and first humidity. When the deviation exceeds ±2%, the preset PID control algorithm is automatically activated to dynamically adjust the heating power, humidification amount, and wind speed parameters of the high and low temperature humidity test chamber, thereby maintaining the environmental parameters within a set stable range and ensuring the accuracy and consistency of the test environment.

[0037] In this embodiment, the first temperature is between 70°C and 85°C, and the first humidity is between 85% and 95%. This simulates the working environment of a solid-state drive in extreme application scenarios. For example, the internal temperature of automotive electronic devices can reach over 70°C after prolonged exposure to high temperatures in summer. In tropical rainforest climates or coastal high-humidity areas, the relative humidity can remain above 85% for extended periods. When industrial control equipment operates continuously in a sealed cabinet, due to the combined effects of poor heat dissipation and high external humidity, the internal working environment is often under extreme conditions of 70°C-85°C and 85%-95% RH humidity.

[0038] In some embodiments, in step S300: placing the solid-state drive for a first preset time and obtaining the first operating parameters of the solid-state drive in real time, the first preset time is 12 hours to 24 hours, and the first operating parameters of the solid-state drive include one or more of the following: solid-state drive failure, error, restart, and abnormal data read / write phenomena.

[0039] Optionally, in this embodiment, the first preset duration is set to 12 to 24 hours to fully simulate the long-term working state of the solid-state drive under extreme environmental conditions, effectively exposing potential reliability issues and intermittent failures. The solid-state drive is connected to an external testing system within a high and low temperature humidity test chamber via a dedicated sealed interface channel on the chamber. Exemplarily, this interface channel is sealed with waterproof and moisture-proof materials to ensure the stability of the internal environment. The external testing system can collect and record the operating status of the solid-state drive at a fixed frequency in real time. When a disk failure, error, system restart, or data anomaly is detected, the system automatically records the time, type, and related parameters of the anomaly. The external testing system is a test motherboard that runs the system placed inside the solid-state drive.

[0040] In some embodiments, in step S400, where the solid-state drive is removed from the high and low temperature humidity test chamber and placed in a preset standard environment for a second preset time, the second preset time is 0.5 hours to 1 hour. Optionally, the placement time of 0.5 hours to 1 hour in this embodiment is to allow the solid-state drive to gradually transition from a high temperature and high humidity environment to a standard environment (typically referring to a temperature of 25℃±5℃ and a humidity of 40%~60%), ensuring that the internal temperature of the solid-state drive is evenly distributed and reaches a thermal equilibrium state, while allowing the internal moisture to dissipate fully, avoiding test deviations caused by sudden temperature changes or residual moisture.

[0041] In some embodiments, in step S500: connecting the solid-state drive (SSD) to the test motherboard, powering on the test motherboard, performing a continuous functional stability test for a third preset duration, and monitoring the second operating parameters of the SSD, the third preset duration is 6 to 8 hours. Optionally, setting a functional stability test duration of 6 to 8 hours can comprehensively verify the long-term operational reliability of the SSD after undergoing extreme environment testing. This time range covers the entire process of the SSD from initial startup to stable operation, and can effectively discover potential defects that only appear after long-term operation. It is particularly important for evaluating key indicators such as data retention capability and read / write performance stability. Experimental data shows that a test duration of 6 to 8 hours can obtain sufficient reliability data within a reasonable test cycle.

[0042] The solid-state drive (SSD) testing system identification and detection includes: detecting whether the test motherboard correctly identifies the test system and whether the test system initialization is complete, wherein the test system is stored on the SSD. Optionally, the test system identification and detection process automatically scans the connected SSD during test motherboard startup, verifying whether the SSD's device identifier, capacity information, interface protocol, and other basic parameters can be correctly read, as well as verifying the SSD's firmware version, partition structure, file system integrity, and whether the operating system or test program stored on the SSD can be successfully loaded. During the detection process, the identification response time and initialization completion status are recorded, and any identification failure or initialization timeout is considered abnormal.

[0043] Solid-state drive (SSD) data read / write testing includes: sequential and random read / write tests on small files, and sequential and random read / write tests on large files. Optionally, the small file test uses a file sample of 10MB or smaller, with sequential read / write tests performing data transfer according to consecutive addresses, and random read / write tests performing data access according to randomly generated address sequences. The large file test uses a file sample of 1GB or larger, and performs tests in both sequential and random access modes. During the test, the response time, transfer rate, and IOPS (input / output operations per second) are recorded for each read / write operation to ensure that the SSD meets performance requirements under different data sizes and access modes.

[0044] Based on the set verification algorithm, data integrity and accuracy are verified through sequential and random read / write tests on small files and sequential and random read / write tests on large files. For example, the verification can employ the CRC32 cyclic redundancy check algorithm. The test system generates and stores a checksum when writing data, and recalculates the checksum when reading data and compares it with the stored value. Simultaneously, a data comparison method is used to compare the read data byte-by-byte with the original data to ensure data consistency. For example, the data transmission error rate can be required to be less than 0.001%. Any transaction that fails verification is recorded and marked as an anomaly, including the error location, error type, and amount of erroneous data.

[0045] Solid-state drive (SSD) status monitoring includes real-time acquisition of SSD temperature, error codes, and SMART information. Optionally, temperature monitoring is achieved by reading temperature data reported internally by the SSD. Error code monitoring can capture various error information reported by the SSD controller in real time, including ECC errors, bad block errors, interface communication errors, etc., thereby establishing a statistical record of error types and frequencies. SMART (Self-Monitoring, Analysis, and Reporting Technology) information reading includes key parameters such as reallocation sector count, programming failure block count, erasure failure block count, wear leveling count, power-on time, and boot count. Specifically, these can be obtained periodically using tools provided by the SSD manufacturer or the smartctl command-line tool.

[0046] In some embodiments, Figure 4 Another flowchart of the testing method for a charged solid-state drive provided in an embodiment of this application is shown, such as... Figure 4 As shown, step S600: comparing the functional stability test results with the initial parameters of the solid-state drive, and evaluating the durability and functional stability of the solid-state drive based on the comparison results and the first operating parameters, includes: When the result of the functional stability test is within the preset error range compared to the initial parameters of the solid-state drive (SSD), and there are no abnormal parameters in the first operating parameters of the SSD acquired in real time, the durability and functional stability assessment of the SSD is passed. Optionally, the preset error range includes: SMART attribute changes not exceeding the normal fluctuation range; small file sequential read / write speed deviation from the initial value not exceeding ±10%; large file random read / write speed deviation from the initial value not exceeding ±15%; data transmission error rate maintained below 0.001%; ​​and temperature changes within ±5℃. Abnormal parameters include disk failure, system error codes, unplanned restarts, blue screen events, data read / write anomalies, and a significant increase in ECC error count. For example, the assessment process can use automated analysis software to compare the test data with preset standards (i.e., the initial parameters of the SSD) and generate an assessment report. When all test items meet the preset standards, the SSD is deemed to have passed the durability and functional stability assessment; otherwise, it is marked as failed, and the specific failure mode and parameter anomalies are recorded.

[0047] Based on the above-described testing method for charged solid-state drives (SSDs), this application provides a testing apparatus for charged SSDs. Figure 5 A schematic diagram of the apparatus provided in an embodiment of this application is shown, such as... Figure 5 As shown, the device includes: The sample placement module 100 is used to place a powered solid-state drive in a high and low temperature humidity test chamber.

[0048] The environmental control module 200 is used to adjust the high and low temperature humidity test chamber to achieve the preset test environment based on the preset first temperature and first humidity, and to configure the high and low temperature humidity test chamber to achieve temperature and humidity balance under the test environment.

[0049] The first test module 300 is used to place the solid-state drive for a first preset time and obtain the first operating parameters of the solid-state drive in real time.

[0050] The sample cooling module 400 is used to remove the solid-state drive from the high and low temperature humidity test chamber and place it in a preset standard environment for a second preset time.

[0051] The second test module 500 is used to connect the solid-state drive to the test motherboard, perform a continuous third preset duration of functional stability testing on the test motherboard after powering on, and monitor the second operating parameters of the solid-state drive. The functional stability testing includes solid-state drive test system identification testing, data read / write testing, and status monitoring testing.

[0052] Evaluation module 600 is used to evaluate the durability of the solid-state drive based on the first operating parameters, and to compare the test results of the functional stability test with the initial parameters of the solid-state drive, and evaluate the functional stability of the solid-state drive based on the comparison results. The initial parameters are the second operating parameters before the solid-state drive is placed in the high and low temperature humidity test chamber.

[0053] For further details regarding the implementation of the above-mentioned technical solutions by each module in the above-mentioned testing device for charged solid-state drives, please refer to the description in the testing method for charged solid-state drives provided in the above-mentioned embodiments of the invention, which will not be repeated here.

[0054] Based on the above-described testing method for charged solid-state drives, this application also provides an electronic device. Figure 6 A schematic diagram of an electronic device provided in an embodiment of this application is shown, such as... Figure 6 As shown, the electronic device provided in this application embodiment includes a processor 61 and a memory 62 coupled to the processor 61. The memory 62 stores a computer program, which, when executed by the processor 61, causes the processor 61 to perform the steps of the test method for the charged solid-state drive in the above embodiment.

[0055] For other details regarding the implementation of the above technical solution by the processor 61 in the above electronic device, please refer to the description in the test method of the charged solid-state drive provided in the above embodiments of the invention, which will not be repeated here.

[0056] The processor 61 can also be called a CPU (Central Processing Unit). The processor 61 may be an integrated circuit chip with signal processing capabilities. The processor 61 can also be a general-purpose processor, a DSP (Digital Signal Processor), an ASIC (Application Specific Integrated Circuit), an FPGA (Field Programmable Gate Array), or other programmable logic devices, discrete gate or transistor logic devices, or discrete hardware components. The general-purpose processor can be a microprocessor, or the processor 61 can be any conventional processor.

[0057] Based on the above-described testing method for charged solid-state drives, this application also provides a computer-readable storage medium. Figure 7 A schematic diagram of a computer storage medium provided in an embodiment of this application is shown, such as... Figure 7As shown, this application embodiment also provides a computer-readable storage medium storing a readable computer program 71. The computer program 71 can be stored in the storage medium in the form of a software product, including several instructions to cause a computer device (which may be a personal computer, server, or network device, etc.) or processor to execute all or part of the steps of the methods of various embodiments of this application. The aforementioned storage medium includes various media capable of storing program code, such as USB flash drives, portable hard drives, magnetic disks or optical disks, ROM (Read-Only Memory), RAM (Random Access Memory), or terminal devices such as computers, servers, mobile phones, and tablets.

[0058] The above description, in conjunction with specific embodiments, provides a further detailed explanation of this application and should not be construed as limiting the specific implementation of this application to these descriptions. For those skilled in the art, various simple deductions or substitutions can be made without departing from the concept of this application, and all such modifications and substitutions should be considered within the scope of protection of this application.

Claims

1. A testing method for a charged solid-state drive, characterized in that, include: Place the powered solid-state drive in a high and low temperature humidity test chamber; The high and low temperature humidity test chamber is adjusted to a preset test environment based on a preset first temperature and a preset first humidity, and the high and low temperature humidity test chamber is configured to achieve temperature and humidity balance under the test environment. The solid-state drive is placed for a first preset time, and the first operating parameters of the solid-state drive are obtained in real time; The solid-state drive is removed from the high and low temperature humidity test chamber and placed in a preset standard environment for a second preset time. The solid-state drive is connected to the test motherboard, and the test motherboard is powered on to perform a functional stability test for a third preset duration. The second operating parameters of the solid-state drive are monitored. The functional stability test includes the test system identification test, data read and write test, and status monitoring test of the solid-state drive. The test results of the functional stability test are compared with the initial parameters of the solid-state drive. The durability and functional stability of the solid-state drive are evaluated based on the comparison results and the first operating parameters. The initial parameters are the second operating parameters before the solid-state drive is placed in the high and low temperature humidity test chamber.

2. The testing method for a charged solid-state drive as described in claim 1, characterized in that, The step of placing the energized solid-state drive in a high and low temperature humidity test chamber includes: The integrity and connectivity of the solid-state drive are checked. The solid-state drive is placed in the high and low temperature humidity test chamber and connected to an external test motherboard through the dedicated interface channel of the high and low temperature humidity test chamber to power on the solid-state drive.

3. The testing method for a charged solid-state drive as described in claim 1, characterized in that, The steps of adjusting the high and low temperature humidity test chamber to a preset test environment based on a preset first temperature and a preset first humidity, and configuring the high and low temperature humidity test chamber to achieve temperature and humidity balance under the test environment, include: The relative temperature and relative humidity of the high and low temperature humidity test chamber are adjusted according to the heating system and humidification system of the high and low temperature humidity test chamber. When the relative temperature and relative humidity of the high and low temperature humidity test chamber reach the first temperature and the first humidity respectively, the temperature distribution and humidity distribution in the high and low temperature humidity test chamber are configured according to the circulating air system of the high and low temperature humidity test chamber until the high and low temperature humidity test chamber reaches the temperature balance and the humidity balance. The relative temperature and relative humidity of the high and low temperature humidity test chamber are monitored at a preset frequency, and the heating system, humidification system and circulating air system of the high and low temperature humidity test chamber are adjusted in real time according to a preset PID control algorithm, so as to configure the error of the relative temperature and relative humidity of the high and low temperature humidity test chamber to be within a preset range. The first temperature is between 70°C and 85°C, and the first humidity is between 85% and 95%.

4. The testing method for a charged solid-state drive as described in claim 1, characterized in that, In the step of placing the solid-state drive for a first preset time and acquiring the first operating parameters of the solid-state drive in real time, The first preset duration is 12 to 24 hours, and the first operating parameters of the solid-state drive include one or more of the following: disk failure, error reporting, restart, and abnormal data read / write phenomena of the solid-state drive.

5. The testing method for a charged solid-state drive as described in claim 1, characterized in that, In the step of removing the solid-state drive from the high and low temperature humidity test chamber and placing it in a preset standard environment for a second preset time, the second preset time is 0.5 hours to 1 hour.

6. The testing method for a charged solid-state drive as described in claim 1, characterized in that, In the steps of connecting the solid-state drive to the test motherboard, powering on the test motherboard, performing a functional stability test for a third preset duration, and monitoring the second operating parameters of the solid-state drive, the third preset duration is 6 to 8 hours. The testing system for the solid-state drive includes the following identification and detection methods: The test motherboard is checked to see if it correctly identifies the test system and whether it has completed the initialization of the test system, wherein the test system is stored in the solid-state drive. The data read / write detection of the solid-state drive includes: Perform sequential read / write and random read / write tests on small files on the solid-state drive, and perform sequential read / write and random read / write tests on large files on the solid-state drive. The data integrity and accuracy are verified by performing sequential read / write tests and random read / write tests on the small files and sequential read / write tests and random read / write tests on the large files according to the set verification algorithm. The status monitoring and detection of the solid-state drive includes: The temperature, error codes, and SMART information of the solid-state drive are acquired in real time.

7. The testing method for a charged solid-state drive as described in claim 1, characterized in that, The steps of comparing the functional stability test results with the initial parameters of the solid-state drive (SSD), and evaluating the durability and functional stability of the SSD based on the comparison results and the first operating parameters, include: When the result of the functional stability test is within the preset error range compared with the initial parameters of the solid-state drive, and there are no abnormal parameters in the first operating parameters of the solid-state drive obtained in real time, the durability and functional stability evaluation of the solid-state drive is passed.

8. A testing device for a charged solid-state drive, characterized in that, include: The sample placement module is used to place a powered solid-state drive in a high and low temperature humidity test chamber. An environmental control module is used to adjust the high and low temperature humidity test chamber to a preset test environment based on a preset first temperature and a preset first humidity, and to configure the high and low temperature humidity test chamber to achieve temperature and humidity balance under the test environment. The first test module is used to place the solid-state drive for a first preset time and acquire the first operating parameters of the solid-state drive in real time. The sample cooling module is used to remove the solid-state drive from the high and low temperature humidity test chamber and place it in a preset standard environment for a second preset time. The second test module is used to connect the solid-state drive to the test motherboard, perform a continuous third preset duration of functional stability test on the test motherboard after powering it on, and monitor the second operating parameters of the solid-state drive. The functional stability test includes the solid-state drive's test system identification test, data read / write test, and status monitoring test. An evaluation module is used to evaluate the durability of the solid-state drive based on the first operating parameters, and to compare the detection results of the functional stability test with the initial parameters of the solid-state drive, and to evaluate the functional stability of the solid-state drive based on the comparison results. The initial parameters are the second operating parameters set before the solid-state drive is placed in the high and low temperature humidity test chamber.

9. An electronic device, characterized in that, Includes memory and processor, wherein: The memory is used to store computer programs; The processor is used to read the computer program in the memory and execute the steps of the test method for the charged solid-state drive as described in any one of claims 1 to 7.

10. A computer-readable storage medium, characterized in that, It stores a readable computer program that, when executed by a processor, implements the steps of the test method for a charged solid-state drive as described in any one of claims 1 to 7.

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