A microelectronic device dynamic reliability test apparatus

Abstract

The application relates to the technical field of electronic device testing devices, and discloses a microelectronic device dynamic reliability testing device, which comprises a test plate, a limiting base connected to the test plate, and test groove positions arranged on the limiting base; two fixing buckles for pressing two rows of pins of a device to be tested on the test plate; two fixing assemblies arranged on the limiting base; an ejection assembly arranged on the limiting base; and a clamping assembly arranged in the test groove position of the limiting base. The limiting base, the fixing buckles and the fixing assemblies are matched, the limiting base preliminarily positions the device to be tested, the fixing buckles press the two rows of pins of the device to be tested on the test plate, the effective contact of the pins and the test plate is guaranteed, and the fixing assemblies fix the two fixing buckles in a magnetic attraction mode.

Description

Technical Field

[0001] This invention relates to the field of electronic device testing equipment, and more specifically to a dynamic reliability testing device for microelectronic devices. Background Technology

[0002] Reliability testing of microelectronic devices is a key means to verify the stable operation of microelectronic devices under complex working conditions, aiming to ensure the performance stability and safety of microelectronic devices during service. Live vibration testing is a dynamic reliability test in reliability testing. By conducting live vibration testing, potential structural defects and conductive foreign matter problems in the packaging of microelectronic devices can be effectively detected. The live vibration test device mainly consists of a vibration excitation system, a test circuit system, and a fixture assembly. The test board in the test circuit system integrates test pieces. After the test pieces make precise contact with the pins of the device under test, power is applied, thereby verifying the vibration reliability of the device under energized conditions.

[0003] However, the existing technology has the following problems:

[0004] In existing live vibration testing processes, operators typically manually connect the device under test (DUT) to the test piece on the test board and then use clamps to fix the DUT. This manual connection method can easily lead to poor connection accuracy between the pins and the test piece. Furthermore, although the DUT is fixed, the clamping force is usually not strong enough to protect it, resulting in limited clamping stability. During the test, the DUT is easily affected by vibration and may shift, causing some pins to lose contact with the test piece, thus affecting the test results. Summary of the Invention

[0005] The purpose of this invention is to provide a dynamic reliability testing device for microelectronic devices in order to solve the above-mentioned problems. It aims to overcome the shortcomings of the prior art, which has poor accuracy when manually connecting the device under test and the test piece, and the weak clamping mechanism is prone to insufficient fixation stability, causing the device to be displaced by vibration during testing. Details are described below.

[0006] To achieve the above objectives, the present invention provides the following technical solution:

[0007] This invention provides a dynamic reliability testing device for microelectronic devices, comprising a test board with a limiting base connected to it. The limiting base has two test slots for positioning the device under test (DUT). The test board has two sets of test pieces. It also includes two fixing buckles for pressing the two rows of pins of the DUT onto the test pieces of the test board. The limiting base has two fixing components for magnetically connecting the two fixing buckles. The limiting base has an ejection component for ejecting the DUT after testing. A clamping component is provided within the test slots of the limiting base for positioning and clamping the DUT.

[0008] Preferably, the test board is connected to the limiting base by bolts, and a set of test pieces is divided into two rows, with the two rows of test pieces corresponding to the two rows of pin positions of the device under test.

[0009] Preferably, the fixing buckle has two legs, and the legs are connected to rubber pads. The two rubber pads are used to press the two rows of pins of the device under test. The top of the fixing buckle has a handle.

[0010] Preferably, the fixing component includes two magnetic rings, and mounting holes are respectively opened at both ends of the test slot of the limiting base. The two magnetic rings are respectively connected to the top edge of the mounting holes at both ends of the test slot. Two magnetic blocks are connected to the bottom of the fixing buckle, and the positions of the two magnetic rings and the two magnetic blocks correspond to each other.

[0011] Preferably, the fixing assembly further includes a slide, two fixed shafts, and two push rods. The two fixed shafts are respectively connected to two mounting holes, and the two push rods are respectively slidably sleeved on the two fixed shafts. The push rods pass through the inner side of the magnetic ring. A damping mechanism is provided inside the connection between the push rod and the fixed shaft. The slide is horizontally slidably connected to the limiting base. The slide is U-shaped. Triangular plates are respectively connected to both ends of the slide. A sliding tongue is connected to the bottom of the push rod. A push plate is connected to the slide. The end of the push plate away from the slide protrudes from the limiting base.

[0012] Preferably, the triangular plate is provided with a hypotenuse, and the hypotenuses of the two triangular plates respectively contact the two sliding tongues. When the triangular plate moves, the sliding tongues can be used to lift the top rod. A first spring is provided between the slide and the inner wall of the limiting base.

[0013] Preferably, the ejection assembly includes two slide blocks and a lifting plate. The two slide blocks are vertically slidably connected to the inner walls of the two test slots on the side away from each other. The lifting plate is connected between the two slide blocks and has a notch for fitting two devices under test. During the test, the bottom of the notch of the lifting plate is clamped between the device under test and the test plate. The two slide blocks are each hinged with a first connecting rod. The ends of the two first connecting rods away from the slide blocks are respectively hinged to two push plates. When the two push plates approach each other, they drive the two slide blocks and the lifting plate to move upward through the two first connecting rods.

[0014] Preferably, the clamping assembly includes two optical rods, both of which are connected to the test slots of the limiting base. Two sliders are slidably connected to the optical rods, and clamping blocks are connected to the sliders. A second connecting rod is hinged to the clamping block, and a protrusion is hinged to the end of the second connecting rod away from the clamping block. The protrusion is slidably connected perpendicularly to the limiting base. Four levers are connected to the outer wall of the fixing buckle. When the four levers move down, they respectively contact and press the four protrusions. A second spring is sleeved on the outside of the optical rod, and the two ends of the second spring are respectively connected to the two sliders on the optical rod.

[0015] Preferably, the two optical rods are located at the two ends of the device under test (DUT) without pins, and the four clamping blocks can synchronously approach the DUT and clamp and position it stably.

[0016] The beneficial effects are:

[0017] 1. This dynamic reliability testing device for microelectronic devices uses a limiting base, fixing buckles, and fixing components to cooperate. The limiting base initially positions the device under test, the fixing buckles press the two rows of pins of the device under test onto the test piece to ensure effective contact between the pins and the test piece, and the fixing components use magnetic attraction to fix the two fixing buckles to ensure the stability of the fixing buckles and the device under test. In addition, pressing the two push plates can cause the two push rods to lift the fixing buckles to reduce the influence of magnetic force on the removal of the fixing buckles, making it easy for the operator to remove the two fixing buckles.

[0018] 2. The dynamic reliability testing device for microelectronic devices, through the setting of the ejection component, causes the two slide blocks to move upward while the fixing buckle is lifted. When the ejection block moves upward, it causes the two devices under test to move upward, so that the top of the devices under test protrudes out of the test slot, making it easier for the staff to take out the devices under test.

[0019] 3. This dynamic reliability testing device for microelectronic devices, through the setting of the clamping components, allows the four clamping blocks to simultaneously apply force to the device under test while the fixing buckle is magnetically connected. This ensures that the device under test is centered and upright and is stably clamped by the four clamping blocks, further improving the accuracy of the connection between the pins of the device under test and the test piece, as well as the stability during the testing process. Attached Figure Description

[0020] To more clearly illustrate the technical solutions in the embodiments of the present invention or the prior art, the drawings used in the description of the embodiments or the prior art will be briefly introduced below. Obviously, the drawings described below are only some embodiments of the present invention. For those skilled in the art, other drawings can be obtained based on these drawings without creative effort.

[0021] Figure 1 This is a schematic diagram of the overall structure of the present invention;

[0022] Figure 2 This is a schematic diagram of the limiting base structure of the present invention;

[0023] Figure 3 This is a schematic diagram of the test board structure of the present invention;

[0024] Figure 4 This is a schematic diagram of the fixed component structure of the present invention;

[0025] Figure 5 This is a schematic diagram of the push plate structure of the present invention;

[0026] Figure 6 This is a schematic diagram of the magnetic block structure of the present invention;

[0027] Figure 7 This is a schematic diagram of the sliding tongue structure of the present invention;

[0028] Figure 8 This is a schematic diagram of the ejector component structure of the present invention;

[0029] Figure 9 This is a schematic diagram of the support plate structure of the present invention;

[0030] Figure 10 This is a schematic diagram of the clamping component structure of the present invention;

[0031] Figure 11 This is a schematic diagram of the clamping block structure of the present invention.

[0032] The annotations in the attached figures are explained as follows:

[0033] 1. Test board; 2. Limiting base; 3. Fixing buckle; 31. Rubber pad;

[0034] 4. Fixing assembly; 41. Magnetic ring; 42. Magnetic block; 43. Push plate; 44. Carriage; 45. Triangular plate; 46. Fixing shaft; 47. Push rod; 48. Sliding tongue;

[0035] 5. Ejector assembly; 51. Slide; 52. Lifting plate; 53. First connecting rod;

[0036] 6. Clamping assembly; 61. Guide rod; 62. Slider; 63. Clamping block; 64. Protrusion; 65. Second connecting rod; 66. Lever. Detailed Implementation

[0037] To make the objectives, technical solutions, and advantages of this invention clearer, the technical solutions of this invention will be described in detail below. Obviously, the described embodiments are merely some embodiments of this invention, and not all embodiments. Based on the embodiments of this invention, all other implementation methods obtained by those skilled in the art without creative effort are within the scope of protection of this invention.

[0038] One embodiment of the present invention is as follows:

[0039] Please see Figure 1 - Figure 4 A dynamic reliability testing device for microelectronic devices includes a test board 1, a limiting base 2 connected to the test board 1, and two test slots on the limiting base 2 for positioning the device under test (DUT). The test slots are adapted to the shape of the DUT, and the DUT can be initially positioned after being placed in the test slot. The test board 1 has two sets of test pieces. After the test pieces contact the pins of the DUT, power is applied to perform reliability testing. The device also includes two fixing buckles 3 for pressing the two rows of pins of the DUT onto the test pieces of the test board 1. After the DUT is placed in the test slot, the fixing buckles 3 are placed in the test slot, pressing the two rows of pins of the DUT onto the test pieces to ensure effective contact between the pins and the test pieces.

[0040] Furthermore, the limiting base 2 is equipped with two fixing components 4 for magnetically connecting two fixing buckles 3. The two fixing components 4 are used for connecting the two fixing buckles 3 respectively. The limiting base 2 is equipped with an ejection component 5 for ejecting the device under test after the test is completed. The testing slot of the limiting base 2 is equipped with a clamping component 6 for positioning and clamping the device under test. Before the test, the two devices under test are placed in the two testing slots, and then the two fixing buckles 3 are placed in the two testing slots. The fixing components 4 use magnetic attraction to fix the two fixing buckles 3 to ensure the stability of the fixing buckles 3 and the device under test. At the same time, the two clamping components 6 clamp and position the two devices under test respectively to further improve the accuracy of the position of the device under test and ensure its stability. After the test, the two fixing buckles 3 are removed, and the two devices under test are ejected by the ejection component 5. Then the device under test is removed.

[0041] Furthermore, the test board 1 and the limiting base 2 are connected by bolts. The bolt connection facilitates the disassembly and installation of the test board 1 and the limiting base 2. A set of test pieces is divided into two rows, and the two rows of test pieces correspond to the two rows of pin positions of the device under test. The limiting base 2 is similar to a fixture, which meets the positioning requirements of devices under test of the same specification. There are multiple test boards 1 and limiting bases 2 according to different specifications of devices under test, and the staff can flexibly assemble them according to actual usage needs.

[0042] In addition, the fixing buckle 3 has two legs. The shape of the fixing buckle 3 is similar to a bridge, and the two legs are similar to bridge piers. The fixing buckle 3 can be set on the device under test. The legs of the fixing buckle 3 are connected to rubber pads 31. The two rubber pads 31 are used to press the two rows of pins of the device under test. The top of the fixing buckle 3 has a handle, which makes it easy for the staff to pick up the fixing buckle 3. When the fixing buckle 3 is placed in the test slot, the two rubber pads 31 contact the two rows of pins. The rubber pads 31 are made of flexible insulating material. After the rubber pads 31 contact the pins, they produce elastic deformation and fill the gaps between the pins. While protecting the pins, they improve the stability of the pins and avoid deformation and displacement of the pins during the reliability test.

[0043] Based on the above embodiments, another embodiment of the present invention is as follows:

[0044] Please see Figure 2 - Figure 7 The fixing component 4 includes two magnetic rings 41. The test slot of the limiting base 2 has mounting holes at both ends. The two magnetic rings 41 are connected to the top edge of the mounting holes at both ends of the test slot. The magnetic rings 41 do not block the mounting holes. The inner side of the magnetic rings 41 coincides with the inner edge of the mounting holes. The bottom of the fixing buckle 3 is connected to two magnetic blocks 42. The positions of the two magnetic rings 41 and the two magnetic blocks 42 are corresponding. The fixing buckle 3 is fixed in the test slot by the magnetic attraction of the two magnetic rings 41 and the two magnetic blocks 42. When the fixing buckle 3 is placed in the test slot, the two magnetic rings 41 are attracted to the two magnetic blocks 42 respectively, thereby fixing the fixing buckle 3 and enabling the two rubber pads 31 of the fixing buckle 3 to stably press the two rows of pins of the device under test.

[0045] It is worth noting that the fixing assembly 4 also includes a slide 44, two fixed shafts 46, and two push rods 47. The two fixed shafts 46 are respectively connected to two mounting holes, and the two push rods 47 are respectively slidably sleeved on the two fixed shafts 46. The push rods 47 pass through the inner side of the magnetic ring 41. A damping mechanism is provided inside the connection between the push rods 47 and the fixed shafts 46. The slide 44 is horizontally slidably connected to the limiting base 2. The slide 44 is U-shaped, and triangular plates 45 are respectively connected to both ends of the slide 44. A sliding tongue 48 is connected to the bottom of the push rods 47. A push plate 43 is connected to the slide 44, and the end of the push plate 43 away from the slide 44 protrudes from the limiting base 2. The damping mechanism between the push rods 47 and the fixed shafts 46 causes the push rods 47 to slide horizontally. Without external force, it can hover on the fixed shaft 46, and under external force, it can delay the extension and retraction. Before the fixing buckle 3 is placed, the push rod 47 is in the state of protruding from the magnetic ring 41. When the fixing buckle 3 is placed, after the magnetic ring 41 and the magnetic block 42 generate magnetic attraction, the push rod 47 contacts the magnetic block 42 and is moved downward and retracted by the force of the magnetic block 42. The damping structure delays the downward retraction of the push rod 47, so that the fixing buckle 3 and the magnetic block 42 will not be quickly attracted to the two magnetic rings 41. This avoids the fixing buckle 3 and the rubber pad 31 from quickly hitting the device under test and the pin, thus preventing damage to the device under test. The fixing process of the fixing buckle 3 is more gentle, which plays a protective role for the device under test.

[0046] It is worth noting that the triangular plates 45 are provided with inclined sides, and the inclined sides of the two triangular plates 45 respectively contact the two sliding tongues 48. When the triangular plates 45 move, they can use the sliding tongues 48 to lift the push rods 47. A first spring is provided between the slide 44 and the inner wall of the limiting base 2. After the test is completed, the staff presses the push plates 43 in the two fixed components 4 towards the middle. The two push plates 43 drive the two slides 44 to move towards the test slot. Taking one of the fixed components 4 as an example, when the slide 44 moves towards the test slot, the triangular plates 45 at both ends of the slide 44 are in continuous contact with the sliding tongues 48 of the two push rods 47. When the test slot moves in the direction of movement, it can use its inclined surface to apply force to the sliding tongue 48, thereby converting the horizontal movement power into the vertical upward power of the sliding tongue 48 and the push rod 47. This causes the two push rods 47 to lift the fixing buckle 3 and the two magnetic blocks 42 upward by moving upward, so that the two magnetic blocks 42 are separated from the two magnetic rings 41, thereby reducing the influence of magnetic force on the removal of the fixing buckle 3 and making it easier for the staff to remove the two fixing buckles 3. After the staff releases the two push plates 43, the two slides 44 are reset by the elastic force of the first spring, and the two push plates 43 are reset accordingly. The first spring is equipped with a rebound damping rod, so that the push plates 43 and slides 44 are slowly reset.

[0047] Based on the above embodiments, another embodiment of the present invention is as follows:

[0048] Please see Figure 1 , Figure 8, Figure 9 The ejector assembly 5 includes two slide blocks 51 and a lifting plate 52. The two slide blocks 51 are vertically slidably connected to the inner walls of two test slots on opposite sides. The lifting plate 52 is connected between the two slide blocks 51 and has a notch for fitting two devices under test (DUTs). The lifting plate 52 has a certain elasticity. During testing, the bottom of the notch of the lifting plate 52 is sandwiched between the DUT and the test plate 1. The lifting plate 52 only contacts the bottom of the DUT and does not affect the contact between the pins and the test plate. The two slide blocks 51 are each hinged with a first connecting rod 53. The ends of the two first connecting rods 53 away from the slide blocks 51 are respectively hinged to two push plates 43. When the two push plates 43 approach each other, the two slide blocks 51 and the lifting plate 52 are moved upward through the two first connecting rods 53. The test slots are provided with The vertical mounting slot has a slider on the slide 51 that matches the mounting slot. The slide 51 is vertically connected to the mounting slot of the test slot through the slider. The slide 51 is limited to sliding vertically. When the operator pushes the two push plates 43, the two push plates 43 respectively use the two first connecting rods 53 to drive the two slides 51 to move upward, so that the two slides 51 drive the lifting piece 52 to move upward. When the lifting piece 52 moves upward, it drives the two devices under test to move upward, so that the top of the device under test protrudes out of the test slot, making it easier for the operator to remove the device under test. At the same time, the fixing buckle 3 is also lifted by the two push rods 47. When the two push plates 43 are reset, the two first connecting rods 53 drive the two slides 51 to reset, so that the lifting piece 52 moves downward and resets. After the lifting piece 52 is reset, its concave bottom surface contacts the test plate 1.

[0049] Based on the above embodiments, another embodiment of the present invention is as follows:

[0050] Please see Figure 1 , Figure 10 , Figure 11The clamping assembly 6 includes two optical rods 61, both of which are connected to the test slots of the limiting base 2. Two sliders 62 are slidably connected to the optical rods 61, and clamping blocks 63 are connected to the sliders 62. A second connecting rod 65 is hinged to the clamping block 63, and a protrusion 64 is hinged to the end of the second connecting rod 65 away from the clamping block 63. The protrusion 64 is slidably connected to the limiting base 2 perpendicularly. Four levers 66 are connected to the outer wall of the fixing buckle 3. When the four levers 66 move down, they contact and press the four protrusions 64 respectively. A second spring is sleeved on the outside of the optical rod 61. The two ends of the second spring are respectively connected to the two sliders 62 on the optical rod 61. The two optical rods 61 are located at the two ends of the device under test without pins. The four clamping blocks 63 can synchronously approach the device under test and clamp and position it stably. During the process of placing the fixing buckle 3 into the test slot, the four levers 66 on the fixing buckle 3 move down synchronously and contact the four protrusions 64 of the clamping assembly 6 respectively. When the fixing buckle 3 moves down under the action of magnetic force, the four levers 66 drive the four protrusions 64 to move down, so that the four protrusions 64 drive the four clamping blocks 63 to move towards the device under test through the second connecting rod 65. The smooth rod 61 and the slider 62 form a sliding engagement. When the clamping blocks 63 move, they drive the slider 62 to slide on the smooth rod 61 to ensure the stability of the sliding between the slider 62 and the clamping blocks 63. When the four clamping blocks 63 approach the device under test synchronously, they contact the four corners of the device under test respectively. Two of the clamping blocks 63 contact the two front ends of the device under test, and the other two clamping blocks 63 contact the two rear ends of the device under test (e.g., Figure 10 As shown), the four clamping blocks 63 simultaneously apply force to the device under test (DUT), ensuring the DUT is centered and properly aligned before being stably clamped by the four clamping blocks 63. This further improves the accuracy of the DUT pin-to-test interface and the stability during the test. After the test is completed, when the retaining clip 3 is removed, the second spring on the optical rod 61 applies an elastic force to reset the connected slider 62. When the slider 62 resets, it drives the clamping blocks 63, the second connecting rod 65, and the protrusion 64 to reset as well. The contact surface between the clamping blocks 63 and the DUT is a smooth surface. As the device is lifted by the lifting piece 52, the fixing buckle 3 also moves upward. The clamping force of the clamping block 63 on the device under test is relaxed and then reset. During the initial period when the device under test is lifted, if the device under test cannot move upward due to being temporarily clamped by the clamping block 63, the lifting piece 52 will use its elastic properties to generate a small deformation to compensate for the displacement difference between the slide block 51 and the device under test. When the clamping block 63 is relaxed, the lifting piece 52 springs back to reset, and then the device under test is lifted normally, so that the clamping of the clamping block 63 on the device under test will not affect the process of the device under test being pushed out.

[0051] The above description is merely a specific embodiment of the present invention, but the scope of protection of the present invention is not limited thereto. Any variations or substitutions that can be easily conceived by those skilled in the art within the technical scope disclosed in the present invention should be included within the scope of protection of the present invention. Therefore, the scope of protection of the present invention should be determined by the scope of the claims.

Claims

1. A dynamic reliability testing device for microelectronic devices, comprising a test board (1), characterized in that: The test board (1) is connected to a limiting base (2), the limiting base (2) is provided with two test slots for positioning the device under test, and the test board (1) is provided with two sets of test pieces; It also includes two fixing clips (3) for pressing the two rows of pins of the device under test onto the test piece of the test board (1); The limiting base (2) is provided with two fixing components (4) for magnetically connecting two fixing buckles (3); The limiting base (2) is provided with an ejection component (5) for ejecting the device under test after the test is completed; The test slot of the limiting base (2) is provided with a clamping component (6) for positioning and clamping the device under test; The fixing component (4) includes two magnetic rings (41). The test slot of the limiting base (2) is provided with mounting holes at both ends. The two magnetic rings (41) are respectively connected to the top edge of the mounting holes at both ends of the test slot. The bottom of the fixing buckle (3) is connected to two magnetic blocks (42). The positions of the two magnetic rings (41) and the two magnetic blocks (42) correspond to each other. The fixing assembly (4) also includes a slide (44), two fixed shafts (46) and two push rods (47). The two fixed shafts (46) are respectively connected to two mounting holes. The two push rods (47) are respectively slidably sleeved on the two fixed shafts (46). The push rods (47) penetrate the inner side of the magnetic ring (41). A damping mechanism is provided inside the connection between the push rods (47) and the fixed shafts (46). The slide (44) is horizontally slidably connected in the limiting base (2). The slide (44) is U-shaped. Triangular plates (45) are respectively connected to both ends of the slide (44). A sliding tongue (48) is connected to the bottom of the push rods (47). A push plate (43) is connected to the slide (44). The end of the push plate (43) away from the slide (44) protrudes from the limiting base (2). The ejection assembly (5) includes two slides (51) and a lifting plate (52). The two slides (51) are vertically slidably connected to the inner walls of the two test slots on the side away from each other. The lifting plate (52) is connected between the two slides (51). The lifting plate (52) is provided with a notch for fitting two devices under test. The bottom of the notch of the lifting plate (52) is sandwiched between the device under test and the test plate (1) during the test. The two slides (51) are respectively hinged with first connecting rods (53). The ends of the two first connecting rods (53) away from the slides (51) are respectively hinged to two push plates (43). When the two push plates (43) approach each other, the two slides (51) and the lifting plate (52) are moved upward through the two first connecting rods (53).

2. The dynamic reliability testing device for microelectronic devices according to claim 1, characterized in that: The test board (1) and the limiting base (2) are connected by bolts. A set of test pieces are divided into two rows, and the two rows of test pieces correspond to the two rows of pin positions of the device under test.

3. The dynamic reliability testing device for microelectronic devices according to claim 1, characterized in that: The fixing buckle (3) is provided with two legs, and the legs of the fixing buckle (3) are connected with rubber pads (31). The two rubber pads (31) are used to press the two rows of pins of the device under test. The top of the fixing buckle (3) is provided with a handle.

4. The dynamic reliability testing device for microelectronic devices according to claim 1, characterized in that: The triangular plate (45) has a hypotenuse, and the hypotenuses of the two triangular plates (45) respectively contact the two sliding tongues (48). When the triangular plate (45) moves, the sliding tongues (48) can lift the top rod (47). A first spring is provided between the slide (44) and the inner wall of the limiting base (2).

5. The dynamic reliability testing device for microelectronic devices according to claim 1, characterized in that: The clamping assembly (6) includes two light rods (61), both of which are connected to the test slot of the limiting base (2). Two sliders (62) are slidably connected to the light rods (61), and a clamping block (63) is connected to the sliders (62). A second connecting rod (65) is hinged to the clamping block (63). A protrusion (64) is hinged to the end of the second connecting rod (65) away from the clamping block (63). The protrusion (64) is slidably connected to the limiting base (2) perpendicularly. Four levers (66) are connected to the outer wall of the fixing buckle (3). When the four levers (66) move down, they contact and press the four protrusions (64) respectively. A second spring is sleeved on the outside of the light rod (61). The two ends of the second spring are connected to the two sliders (62) on the light rod (61) respectively.

6. The dynamic reliability testing device for microelectronic devices according to claim 5, characterized in that: The two optical rods (61) are located at the two ends of the device under test without pins, and the four clamps (63) can synchronously approach the device under test and clamp and position it stably.

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