Multi-phase power supply time sequence control circuit and automatic testing device
By designing a multiphase power supply timing control circuit and an automated testing device, the problem of relying on manual operation for multiphase power supply testing was solved, realizing automated testing, improving testing efficiency and accuracy, reducing costs, and enhancing the flexibility and reliability of the circuit.
Patent Information
- Authority / Receiving Office
- CN · China
- Patent Type
- Applications(China)
- Current Assignee / Owner
- INSPUR (SHANDONG) COMPUTER TECH CO LTD
- Filing Date
- 2026-01-26
- Publication Date
- 2026-05-08
AI Technical Summary
In existing automated testing systems, testing of multiphase power supplies relies on manual operation, resulting in low testing efficiency and high labor costs, which cannot meet the needs of high-density, high-power scenarios.
Design a multiphase power supply timing control circuit, including a motherboard circuit, a DC power supply and an automated test system. By reserving circuitry to delay the timing of the enable signal in the test scenario, the timing of the signal is ensured to conform to the working scenario. Combined with a switch control circuit, automated path switching is achieved, avoiding manual intervention.
It improves the efficiency and accuracy of PI testing for multiphase power supplies, shortens the testing cycle, reduces labor costs, and enhances the flexibility and reliability of the circuit.
Smart Images
Figure CN122000851A_ABST
Abstract
Description
Technical Field
[0001] This invention relates to the field of integrated circuit technology, and in particular to a multiphase power supply timing control circuit and an automated testing device. Background Technology
[0002] With the surge in demand in the domestic IT innovation market and the rapid expansion of the domestic server and PC (Personal Computer Market) markets, the reliability of core components such as domestic CPUs (Central Processing Units), operating systems, and databases is gradually improving. Products need to meet the requirements of high-density, high-power scenarios (such as cloud data centers and AI (Artificial Intelligence) computing clusters). As the "power core," the reliability of the power supply directly affects the availability of the entire system. Multiphase power supplies consist of a controller and DrMOS (Driver-MOSFET, a power module that integrates a driver chip and a metal-oxide-semiconductor field-effect transistor (MOSFET) in the same package). They adopt an interleaved Buck topology (DC-DC buck converter) to distribute the load current, reduce output voltage ripple and thermal stress, and support dynamic adjustment of the number of phases to match load requirements. They are used to directly power the most critical modules such as the CPU. During the design phase, a complete PI (Power Integrity) test is required for multiphase power supplies to ensure power quality.
[0003] Currently, automated testing systems can run multiple test items with a single click and automatically collect and record data, avoiding the risk of errors from manual recording, thereby shortening the testing cycle and saving labor costs. When performing PI testing alone, there is no need to build a complete system. After the motherboard is powered on, the CPLD (Complex Programmable Logic Device) provides the enable signal EN for the multi-phase power supply (the VR (Voltage Regulator) circuit under test), and connects the corresponding signals of the multi-phase power supply to an oscilloscope. The automated testing system can then be operated to begin testing. The overall operating framework is as follows: Figure 1 .in, Figure 1 The DC-source (DC Power Supply) in the multiphase power supply is mainly used to provide the input voltage VIN to the multiphase power supply. The electronic load serves as an analog load to simulate different parameters. The oscilloscope is used to determine the parameter state of the multiphase power supply based on the test signal output by the multiphase power supply.
[0004] Because the current automated testing system shuts down the DC source (input voltage VIN) after each test item and turns it back on when starting the next test item, while the motherboard remains powered throughout this period (meaning the VCC of the VR under test and the enable signal EN are always active), the timing waveforms of the input voltage VIN provided by the DC source and the enable signal EN provided by the CPLD during automated testing are as follows: Figure 2 In this situation, the controller will determine that the input is undervoltage and trigger the protection, which will cause the power supply to fail to start. The error can only be cleared by re-energizing the EN enable signal or changing the protection mode. In addition, the timing of the EN enable signal of the multiphase power supply being energized earlier than VIN does not conform to the logic of the whole machine during normal operation. Therefore, the testing of multiphase power supplies currently relies on manual testing, manually capturing test waveforms and recording data, which is inefficient.
[0005] It is evident that how to shorten the testing cycle and save labor costs in power supply automation testing systems is a problem that needs to be solved by those skilled in the art. Summary of the Invention
[0006] The purpose of this invention is to provide a multiphase power supply timing control circuit and an automated testing device, which can solve the problems of low automation, cumbersome testing process and high labor costs in existing automated testing.
[0007] To solve the above-mentioned technical problems, on the one hand, embodiments of the present invention provide a multiphase power supply timing control circuit, including: a motherboard circuit, a DC power supply and an automated testing system, wherein the motherboard circuit includes: a complex programmable logic device, a multiphase power supply and reserved circuits; The automated testing system is connected to the DC power supply and is used to send corresponding start / stop signals to the DC power supply according to the working scenario. The DC power supply is connected to the multi-phase power supply through the power pins in the motherboard circuit, and is used to provide the corresponding input voltage to the multi-phase power supply according to the start / stop signal. The complex programmable logic device is connected to the enable pin of the multiphase power supply to provide the first enable signal to the multiphase power supply when the motherboard circuit is powered on and the working scenario is in an untested state. The power supply terminal of the reserved circuit is connected to the power supply pin in the motherboard circuit, and the output terminal of the reserved circuit is connected to the enable pin of the multiphase power supply. It is used to provide a second enable signal to the multiphase power supply when the DC power supply provides the corresponding input voltage and the working scenario is in test state, so that the timing of the multiphase power supply acquiring the second enable signal is later than the timing of the input voltage.
[0008] In some embodiments, the reserved circuit includes: a delay circuit, an adjustment circuit, a voltage divider circuit, and a filter circuit; The first end of the delay circuit is connected to the first end of the adjustment circuit, and together they serve as the input end of the reserved circuit and are connected to the power pin in the motherboard circuit. The second terminal of the delay circuit is connected to the second terminal of the adjustment circuit, and the third terminal of the delay circuit is connected to the first terminal of the voltage divider circuit. The second terminal of the voltage divider circuit is connected to the first terminal of the filter circuit; The second terminal of the filter circuit is connected to the enable pin of the multiphase power supply as the output terminal of the reserved circuit. The third terminal of the regulating circuit is connected to the third terminal of the voltage divider circuit and the third terminal of the filter circuit, and is grounded.
[0009] In some embodiments, the delay circuit is a MOSFET; In this circuit, the source of the MOSFET is connected to the first terminal of the delay circuit, the first terminal of the adjustment circuit, and the power supply pin in the motherboard circuit. The gate of the MOSFET is connected to the second terminal of the delay circuit and the second terminal of the adjustment circuit. The drain of the MOSFET is connected to the first terminal of the voltage divider circuit as the third terminal of the delay circuit.
[0010] In some embodiments, the regulating circuit includes: a first resistor and a first capacitor; Among them, the first end of the first resistor is connected to the first end of the adjustment circuit, the first end of the delay circuit, and the power supply pin in the motherboard circuit. The second end of the first resistor is connected to the first end of the first capacitor, and together they serve as the second end of the adjustment circuit connected to the second end of the delay circuit. The second terminal of the first capacitor is connected to the third terminal of the regulating circuit, the third terminal of the voltage divider circuit, and the third terminal of the filter circuit, and is grounded.
[0011] In some embodiments, the voltage divider circuit includes: a second resistor and a third resistor; In this circuit, the first end of the second resistor is connected to the third end of the delay circuit as the first end of the voltage divider circuit. The second end of the second resistor is connected to the first end of the third resistor, and together they form the second end of the voltage divider circuit connected to the first end of the filter circuit. The second terminal of the third resistor is connected to the third terminal of the voltage divider circuit, the third terminal of the regulating circuit, and the third terminal of the filter circuit, and is grounded.
[0012] In some embodiments, the filter circuit includes: a fourth resistor and a second capacitor; Among them, the first end of the fourth resistor is connected to the second end of the voltage divider circuit as the first end of the filter circuit. The first terminal of the second capacitor is connected to the third terminal of the filter circuit, the third terminal of the voltage divider circuit, and the third terminal of the adjustment circuit, and is grounded. The second terminal of the fourth resistor is connected to the second terminal of the second capacitor, and together they form the second terminal of the voltage divider circuit, which is connected to the enable pin of the multiphase power supply.
[0013] In some embodiments, it further includes: a fifth resistor, a first switching assembly, and a second switching assembly; Among them, the first end of the fifth resistor is connected to the complex programmable logic device, and the second end of the fifth resistor is connected to the first end of the first switching assembly. The second terminal of the first switching assembly is connected to the enable pin of the multiphase power supply; The first terminal of the second switching assembly is connected to the second terminal of the filter circuit; The second terminal of the second switching assembly is connected to the enable pin of the multiphase power supply.
[0014] In some embodiments, it further includes: a switch control circuit; The input terminal of the switch control circuit is connected to the automated testing system, and the output terminal of the switch control circuit is connected to the control terminal of the first switch component and the control terminal of the second switch component, which is used to control the on / off state of the first switch component and the second switch component according to the working scenario.
[0015] In some embodiments, the switch control circuit is specifically used to control the first switch component to close and the second switch component to open when the working scenario is in an untested state; and to control the first switch component to open and the second switch component to close when the working scenario is in a test state.
[0016] On the other hand, the present invention also provides an automated testing device, including the multiphase power supply timing control circuit described above.
[0017] As can be seen from the above technical solution, the multiphase power supply timing control circuit provided by this invention includes a motherboard circuit, a DC power supply, and an automated testing system. Compared to traditional PI testing, which includes a complex programmable logic device (CPL) and a multiphase power supply, the motherboard circuit also includes a reserved circuit. The automated testing system is mainly used to send corresponding start / stop signals to the DC power supply according to the working scenario. The DC power supply is used to provide the corresponding input voltage to the multiphase power supply based on the start / stop signal. The CPL provides a first enable signal to the multiphase power supply when the motherboard circuit is powered on and the working scenario is in an untested state. The reserved circuit provides a second enable signal to the multiphase power supply when the DC power supply provides the corresponding input voltage and the working scenario is in a test state, so that the timing of the multiphase power supply acquiring the second enable signal is later than the timing of the input voltage. In other words, in an untested scenario, since there is no signal timing issue, the CPL provides the enable signal (first enable signal) to the multiphase power supply. In testing scenarios, to ensure the normal operation of automatic testing, the timing of the enable signal needs to be later than the timing of the input voltage. Therefore, switching to a reserved circuit to provide the enable signal (second enable signal) for the multi-phase power supply is sufficient. The main reason for this is that the input terminal of the reserved circuit is connected to the power supply pin in the motherboard circuit, i.e., connected to the DC power supply. In other words, the reserved circuit will only work and provide the enable signal (second enable signal) after the DC power supply is powered on. Thus, the multi-phase power supply timing control circuit provided by this invention ensures that the timing of the enable signal conforms to various working scenarios. The circuit is simple and effective, improving the efficiency and accuracy of multi-phase power supply PI testing. Attached Figure Description
[0018] To more clearly illustrate the embodiments of the present invention, the accompanying drawings used in the embodiments will be briefly introduced below. Obviously, the drawings described below are only some embodiments of the present invention. For those skilled in the art, other drawings can be obtained based on these drawings without creative effort.
[0019] Figure 1 An automated testing structure diagram provided for existing technologies; Figure 2 This is a timing diagram corresponding to automated testing in existing technologies; Figure 3 A structural diagram of a multiphase power supply timing control circuit provided in an embodiment of the present invention; Figure 4 A timing diagram of a multiphase power supply timing control circuit provided in an embodiment of the present invention; Figure 5 The circuit diagram is provided for a multiphase power supply timing control circuit according to an embodiment of the present invention. Detailed Implementation
[0020] The technical solutions of the embodiments of the present invention will be clearly and completely described below with reference to the accompanying drawings. Obviously, the described embodiments are only some embodiments of the present invention, and not all embodiments. Based on the embodiments of the present invention, all other embodiments obtained by those of ordinary skill in the art without creative effort are within the protection scope of the present invention.
[0021] The terms "comprising" and "having," and any variations thereof, in the specification and accompanying drawings of this invention are intended to cover non-exclusive inclusion. For example, a process, method, system, product, or apparatus that includes a series of steps or units is not limited to the steps or units listed, but may include steps or units not listed.
[0022] To enable those skilled in the art to better understand the present invention, the present invention will be further described in detail below with reference to the accompanying drawings and specific embodiments.
[0023] Next, we will describe in detail the multiphase power supply timing control circuit and automated testing device provided by the embodiments of the present invention.
[0024] Figure 3 A structural diagram of a multiphase power supply timing control circuit provided in an embodiment of the present invention is shown below. Figure 3 As shown, the multiphase power supply timing control circuit includes: a mainboard circuit 1, a DC power supply 2, and an automated testing system 3. The mainboard circuit 1 includes: a complex programmable logic device 11, a multiphase power supply 12, and reserved circuitry 13. In addition, Figure 1 The circuit shown also includes: an oscilloscope 4 and an electronic load 5.
[0025] The specific connection relationships of each circuit in its multiphase power supply timing control circuit are as follows: the automated test system 3 is connected to the DC power supply 2, the electronic load 5, and the oscilloscope 4; the DC power supply 2 is connected to the multiphase power supply 12 through the power supply pin in the motherboard circuit 1; the complex programmable logic device 11 is connected to the enable pin of the multiphase power supply 12; the power supply terminal of the reserved circuit 13 is connected to the power supply pin in the motherboard circuit 1; the output terminal of the reserved circuit 13 is connected to the enable pin of the multiphase power supply 12; and the output terminal of the multiphase power supply 12 is connected to the electronic load 5 and the oscilloscope 4.
[0026] In this embodiment, the main function of the automated testing system 3 connected to the DC power supply 2 is to send corresponding start / stop signals to the DC power supply 2 according to the current working scenario state. Specifically, when the current working scenario state is an untested state, it sends a corresponding stop signal to the DC power supply 2; and when the current working scenario state is a test state, it sends a corresponding start signal to the DC power supply 2. The DC power supply 2 is connected to the multiphase power supply 12 through the power supply pin in the motherboard circuit 1. Its function is to prevent the supply of the corresponding input voltage to the multiphase power supply 12 when the start / stop signal is a stop signal; and to supply the corresponding input voltage VIN to the multiphase power supply 2 when the start / stop signal is a signal. The main function of the complex programmable logic device 11 connected to the enable pin of the multiphase power supply 12 is to provide a first enable signal EN1 to the multiphase power supply 12 when the motherboard circuit 1 is powered on and the working scenario state is an untested state. The power supply terminal of the reserved circuit 13 is connected to the power supply pin in the motherboard circuit 1. The main function of the output terminal of the reserved circuit 13, which is connected to the enable pin of the multiphase power supply 12, is to provide a second enable signal EN2 to the multiphase power supply 12 when the DC power supply 2 provides the corresponding input voltage VIN and the working scenario is in test mode. This ensures that the timing of the multiphase power supply 12 acquiring the second enable signal EN2 is later than the timing of the input voltage VIN. It is easy to understand that the first enable signal EN1 sent by the complex programmable logic device 11 to the multiphase power supply 12 and the second enable signal EN2 sent by the reserved circuit 13 to the multiphase power supply 12 are essentially both enable signals of the multiphase power supply 12, only from different sources.
[0027] Based on the connection relationships and functions of the circuits described above, it is easy to understand that the operating principle of the multi-phase power supply timing control circuit provided by this invention is as follows: through automated control and hardware signal interaction, the function of the multi-phase power supply 12 on the motherboard circuit 1 is verified. First, after the system starts up, the complex programmable logic device 11 of the motherboard circuit 1 directly outputs the first enable signal EN1 to the multi-phase power supply 12. This process does not require the complex programmable logic device 11 to perform additional logic judgment, ensuring that the multi-phase power supply 12 can quickly enter the working state. At the same time, under the control of the automated test system 3, the DC power supply 2 frequently switches the VIN voltage input to the multi-phase power supply 12 on / off according to the preset test items, thereby simulating the power fluctuation scenarios that the multi-phase power supply 12 may face in actual working conditions.
[0028] During the dynamic switching of power signals, the multiphase power supply 12 outputs the corresponding Vout voltage based on the input VIN and EN1 signals. At this time, the electronic load 5 simulates the actual load condition of the multiphase power supply 12, applying load pull to Vout, while the oscilloscope 4 synchronously acquires the test signals of the multiphase power supply 12 (such as the voltage waveform and ripple of Vout) and feeds the data back to the automated test system 3. In the entire process, the automated test system 3 acts as the control center, coordinating the voltage switching of the DC power supply 2 and the load adjustment of the electronic load 5. Through the signal acquisition of the oscilloscope 4, it completes the performance test of the multiphase power supply 12 under different power input and load conditions, and finally verifies the working stability and voltage output accuracy of the multiphase power supply 12.
[0029] In addition, during PI testing (working scenario state is test state), the connection between the complex programmable logic device 11 and the multiphase power supply 12 is disconnected, and the connection between the reserved circuit 13 and the multiphase power supply 12 is connected. That is, the channel through which the complex programmable logic device 11 sends the first enable signal EN1 to the multiphase power supply 12 is disconnected; conversely, the channel through which the reserved circuit 13 sends the second enable signal EN2 to the multiphase power supply 12 is connected. Since the input terminal of the reserved circuit 12 is connected to the power pin in the motherboard circuit 1, i.e., connected to the DC power supply 2, the reserved circuit 13 will only work and provide the enable signal (second enable signal) after the DC power supply 2 is powered on. Therefore, it is easy to understand that the timing of the multiphase power supply 12 acquiring the second enable signal EN2 is always later than the timing of the input voltage VIN. Figure 4 As shown.
[0030] As can be seen from the above technical solution, the multiphase power supply timing control circuit provided by this invention includes a motherboard circuit, a DC power supply, and an automated testing system. Compared to traditional PI testing, which includes a complex programmable logic device (CPL) and a multiphase power supply, the motherboard circuit also includes a reserved circuit. The automated testing system is mainly used to send corresponding start / stop signals to the DC power supply according to the working scenario. The DC power supply is used to provide the corresponding input voltage to the multiphase power supply based on the start / stop signal. The CPL provides a first enable signal to the multiphase power supply when the motherboard circuit is powered on and the working scenario is in an untested state. The reserved circuit provides a second enable signal to the multiphase power supply when the DC power supply provides the corresponding input voltage and the working scenario is in a test state, so that the timing of the multiphase power supply acquiring the second enable signal is later than the timing of the input voltage. In other words, in an untested scenario, since there is no signal timing issue, the CPL provides the enable signal (first enable signal) to the multiphase power supply. In testing scenarios, to ensure the normal operation of automatic testing, the timing of the enable signal needs to be later than the timing of the input voltage. Therefore, switching to a reserved circuit to provide the enable signal (second enable signal) for the multi-phase power supply is sufficient. The main reason for this is that the input terminal of the reserved circuit is connected to the power supply pin in the motherboard circuit, i.e., connected to the DC power supply. In other words, the reserved circuit will only work and provide the enable signal (second enable signal) after the DC power supply is powered on. Thus, the multi-phase power supply timing control circuit provided by this invention ensures that the timing of the enable signal conforms to various working scenarios. The circuit is simple and effective, improving the efficiency and accuracy of multi-phase power supply PI testing.
[0031] In some embodiments, the reserved circuit 13 includes: a delay circuit, an adjustment circuit, a voltage divider circuit, and a filter circuit.
[0032] The connection relationship of its reserved circuit is as follows: the first end of the delay circuit is connected to the first end of the adjustment circuit, and together they serve as the input end of the reserved circuit 13 and are connected to the power supply pin in the main board circuit 1; the second end of the delay circuit is connected to the second end of the adjustment circuit; the third end of the delay circuit is connected to the first end of the voltage divider circuit; the second end of the voltage divider circuit is connected to the first end of the filter circuit; the second end of the filter circuit serves as the output end of the reserved circuit 13 and is connected to the enable pin of the multiphase power supply 12; the third end of the adjustment circuit is connected to the third end of the voltage divider circuit and the third end of the filter circuit, and is grounded.
[0033] In an embodiment, such as Figure 5As shown, its delay circuit is a MOSFET Q. The connection relationship of the delay circuit is as follows: the source of MOSFET Q is connected to the first terminal of the delay circuit and the first terminal of the adjustment circuit and the power supply pin in the main board circuit 1; the gate of MOSFET Q is connected to the second terminal of the delay circuit and the second terminal of the adjustment circuit; the drain of MOSFET Q is connected to the first terminal of the voltage divider circuit and the third terminal of the delay circuit.
[0034] What is not difficult to understand is that Figure 5 The MOSFET Q in the circuit forms a delay circuit: when VIN is powered on, the gate voltage of MOSFET Q rises slowly as it charges. Only when the gate voltage reaches the turn-on threshold of MOSFET Q will MOSFET Q turn on, thus providing signals or power to subsequent circuits.
[0035] It should be noted that the embodiments provided by the present invention are only one possible implementation method, but are not limited to this only implementation method. Users can set their own implementation methods according to their needs.
[0036] This design uses the conduction threshold of the MOSFET Q in conjunction with the charging time characteristics to precisely control the circuit's startup delay, preventing multi-phase power supplies from starting before the input voltage VIN is stable, reducing instantaneous impact, and allowing each circuit to work sequentially according to a preset timing sequence, thus improving startup reliability.
[0037] In an embodiment, such as Figure 5 As shown, its adjustment circuit includes a first resistor R1 and a first capacitor C1. The connection relationship of the adjustment circuit is as follows: the first end of the first resistor R1 serves as the first terminal of the adjustment circuit, connected to the first terminal of the delay circuit and the power supply pin in the main board circuit 1; the second end of the first resistor R1 is connected to the first end of the first capacitor C1, and together they serve as the second terminal of the adjustment circuit, connected to the second terminal of the delay circuit; the second end of the first capacitor C1 serves as the third terminal of the adjustment circuit, connected to the third terminal of the voltage divider circuit and the third terminal of the filter circuit, and grounded.
[0038] It is easy to understand that the first resistor R1 and the first capacitor C1 constitute a regulating circuit. The resistance value of the first resistor R1 determines the charging efficiency or discharging rate of the first capacitor C1, while the capacitance value of the first capacitor C1 affects the smoothness of voltage changes. The first capacitor C1 and the first resistor R1 work together to regulate the voltage change rhythm of the input voltage VIN to the subsequent circuits. At the same time, the control signal of the complex programmable logic device 11 can combine this RC (first resistor R1 and first capacitor C1) characteristic to indirectly adjust the dynamic characteristics of the input voltage of the multiphase power supply 12.
[0039] It should be noted that the embodiments provided by the present invention are only one possible implementation method, but are not limited to this only implementation method. Users can set their own implementation methods according to their needs.
[0040] This design utilizes the passive characteristics of RC (first resistor R1 and first capacitor C1) to achieve low-cost voltage variation regulation, which allows the input voltage variation of the multiphase power supply 12 to better meet the dynamic requirements of actual working conditions and improve the working stability of the multiphase power supply 12 under dynamic voltage.
[0041] In an embodiment, such as Figure 5 As shown, its voltage divider circuit includes a second resistor R2 and a third resistor R3. The connection relationship of the voltage divider circuit is as follows: the first terminal of the second resistor R2 is connected to the third terminal of the delay circuit as the first terminal of the voltage divider circuit; the second terminal of the second resistor R2 is connected to the first terminal of the third resistor R3, and together they serve as the second terminal of the voltage divider circuit, connected to the first terminal of the filter circuit; the second terminal of the third resistor R3 serves as the third terminal of the voltage divider circuit, connected to the third terminal of the adjustment circuit and the third terminal of the filter circuit, and is grounded.
[0042] It's easy to understand that the second resistor R2 and the third resistor R3, connected in series, form a voltage divider circuit. This divides the input voltage VIN according to the ratio "4.7K / (12.7K+4.7K)" (in reality, the output terminal is connected to the upper end of 4.7K), and the output signal is transmitted to the detection port of the multiphase power supply 12. Here, 4.7K is the resistance value of the third resistor R3, and 12.7K is the resistance value of the second resistor R2.
[0043] It should be noted that the embodiments provided by the present invention are only one possible implementation method, but are not limited to this only implementation method. Users can set their own implementation methods according to their needs.
[0044] This design achieves precise voltage division through simple resistor ratios, without the need for complex components. It provides a sampling signal that conforms to the voltage tolerance range of the multiphase power supply 12, ensuring the detection accuracy of the input voltage VIN by the multiphase power supply 12, thereby improving the accuracy of the output voltage of the multiphase power supply 12.
[0045] In an embodiment, such as Figure 5 As shown, its filter circuit includes: a fourth resistor R4 and a second capacitor C2. The connection relationship of the filter circuit is as follows: the first end of the fourth resistor R4 is connected to the second end of the voltage divider circuit as the first end of the filter circuit; the first end of the second capacitor C2 is connected to the third end of the voltage divider circuit and the third end of the regulating circuit as the third end of the filter circuit, and is grounded; the second end of the fourth resistor R4 and the second end of the second capacitor C2 are connected, and together they serve as the second end of the voltage divider circuit, connected to the enable pin of the multiphase power supply 2.
[0046] It is not difficult to understand that the fourth resistor R4, together with the second capacitor C2 below, forms a filter circuit. The second capacitor C2 can filter out the high-frequency noise signal of the control port of the multiphase power supply 12, while the fourth resistor R4 helps to fix the connection path of the capacitor (without introducing additional impedance).
[0047] It should be noted that the embodiments provided by the present invention are only one possible implementation method, but are not limited to this only implementation method. Users can set their own implementation methods according to their needs.
[0048] This design achieves noise suppression using low-cost resistors and capacitors, and the fourth resistor R4 does not affect signal transmission efficiency. It allows for cleaner control signals transmitted from the complex programmable logic device 11 to the multiphase power supply 12, reducing noise interference with the control logic of the multiphase power supply 12 and improving the stability of its operation.
[0049] besides, Figure 5 It also includes a fifth resistor R5. The two ends of the fifth resistor R5 are connected to the complex programmable logic device 11 and the multiphase power supply 12.
[0050] It is not difficult to understand that the core function of the fifth resistor R5 lies in two dimensions: hardware protection and signal optimization. First, it can act as a current-limiting resistor, limiting the instantaneous current of the output pin of the complex programmable logic device 11 when a short circuit or overcurrent abnormality occurs at the control port of the multiphase power supply 12, preventing the core device from being burned out, and providing hardware-level overcurrent protection for the complex programmable logic device 11. At the same time, the fifth resistor R5 can act as an impedance matching element, alleviating the impedance mismatch problem between the complex programmable logic device 11 and the multiphase power supply 12, reducing signal reflection and ringing effects, making the rising and falling edges of the control signal smoother, thereby suppressing the generation of high-frequency noise and improving the stability of signal transmission.
[0051] In addition, the fifth resistor R5 also provides added value in terms of debugging redundancy and noise isolation. It can reduce spike noise in the control signal, play a preliminary buffering and filtering role, and isolate the reverse interference of voltage fluctuations of the multiphase power supply 12 to the complex programmable logic device 11, preventing noise back-propagation from affecting the logic operation of the complex programmable logic device 11. During the circuit debugging and mass production stages, the fifth resistor R5, as a replaceable component, supports flexible adjustment of the drive strength of the control signal by changing different resistance values, which significantly improves the debuggability and scalability of the circuit.
[0052] In addition, Figure 5In the circuit shown, it's important to note that when the resistances of the fourth resistor R4 and the fifth resistor R5 are both 0, they function as channels. In a normal motherboard design, the fifth resistor R5 is present, and the fourth resistor R4 is not. However, before PI automated testing, the fifth resistor R5 can be swapped to the fourth resistor R4. In other words, when the resistances of the fourth resistor R4 and the fifth resistor R5 are 0, in a normal motherboard design, the fifth resistor R5 is present, and the fourth resistor R4 is not; however, during PI automated testing, the fourth resistor R4 is present, and the fifth resistor R5 is not.
[0053] When the fourth resistor R4 and the fifth resistor R5 serve as signal channels between the complex programmable logic device 11, the reserved circuit 13, and the multiphase power supply 12, respectively, the core benefits of the circuit design lie in two key aspects: improved wiring flexibility and optimized ease of later maintenance and debugging. On one hand, the fourth resistor R4 and the fifth resistor R5 function as 0Ω resistors, which, compared to direct wire connections, effectively solves spatial conflicts and trace crossing problems in PCB (Printed Circuit Board) wiring. Especially in scenarios where the complex programmable logic device 11 and the multiphase power supply 12 are densely distributed, the 0Ω resistors can act as "wiring bridges," flexibly adjusting signal routing and avoiding trace congestion caused by direct wire connections. Simultaneously, it reduces electromagnetic interference between signals, ensuring the purity of control signal transmission. On the other hand, this design endows the circuit with strong maintainability and scalability. During the debugging phase, if it is necessary to disconnect a certain control signal to troubleshoot, simply remove the fourth resistor R4 and the fifth resistor R5 at the corresponding position. There is no need to cut PCB wires, which greatly reduces the debugging difficulty. In subsequent function iterations, the fourth resistor R4 and the fifth resistor R5 can be directly replaced with resistors of different resistance values to quickly realize additional functions such as current limiting and impedance matching. There is no need to redesign the PCB layout, which significantly shortens the product iteration cycle and reduces R&D costs.
[0054] As can be seen from the above, the fourth resistor R4 and the fifth resistor R5 can be used as channels or not. When they are used as channels, manual operation is required during switching. Therefore, based on this, the multiphase power supply timing control circuit also includes: a first switching assembly, a second switching assembly, and a switching control circuit.
[0055] The first switch assembly is connected to the fifth resistor R5 and the multiphase power supply 12; the second switch assembly is connected to the filter circuit and the multiphase power supply 12; and the switch control circuit is connected to the automated test system 3 and the first and second switch assemblies.
[0056] It is easy to understand that the switch control circuit is specifically used to control the first switch component to close and the second switch component to open when the working scenario is in an untested state; and to control the first switch component to open and the second switch component to close when the working scenario is in a test state.
[0057] In other words, to address the drawback of manually removing and installing resistors to switch paths when the fourth resistor R4 and the fifth resistor R5 are used as channels, the channel function of the fourth resistor R4 and the fifth resistor R5 is eliminated. In the two paths corresponding to the original fourth resistor R4 and the fifth resistor R5, switching components (the second switching component and the first switching component) driven by the switching control circuit are added respectively to build an automated path switching mechanism.
[0058] Specifically, each of the two paths is connected in series with a controlled switching component (such as a MOSFET, relay, or analog switch chip), and the control terminal of the switching component is connected to the switching control circuit. The switching control circuit has pre-stored path switching logic and can output high and low level signals to control the conduction and cutoff of the switching device according to test requirements or changes in operating conditions, thereby realizing automatic switching between the two paths. When the first path needs to be turned on, the switching control circuit outputs a drive signal to close the corresponding switch, and the first enable signal EN1 output by the complex programmable logic device 11 is transmitted to the multiphase power supply 12 through this path; when switching to the second path needs to be done, the switching control circuit first turns off the first switch and then turns on the second switch to ensure that the two paths will not be turned on simultaneously and cause signal conflicts. At the same time, to ensure the stability of signal transmission, a current-limiting resistor and a filter capacitor can be connected in parallel across the switching component to avoid voltage spikes generated at the moment of switching interference with the normal operation of the complex programmable logic device 11 and the multiphase power supply 12.
[0059] Taking the multi-mode control test scenario of the multiphase power supply 12 as an example, this invention uses an N-channel MOSFET as the switching component and a controller as the switching control circuit, eliminating the channel function of the fourth resistor R4 and the fifth resistor R5 in the original circuit. The first path is connected in series with MOSFET Q1, and the second path is connected in series with MOSFET Q2. The drains of Q1 and Q2 are connected to the two control signal output pins of the controller, the sources are connected to the multiphase power supply 12, and the gates are connected to the complex programmable logic device 11 and the reserved circuit 13, respectively. The gate drive signal output by the controller controls the on and off states. At the same time, a current-limiting resistor is connected in parallel between the drain and source of Q1 and Q2, and a filter capacitor is connected in parallel between the gate and ground to suppress signal noise during switching.
[0060] During testing, when the operating scenario is in an untested state, the controller outputs a high-level signal to the gate of Q1, turning Q1 on. The first enable signal EN1 from the complex programmable logic device 11 is transmitted to the multiphase power supply 12 via the first path. Simultaneously, the controller outputs a low-level signal to the gate of Q2, turning Q2 off and disconnecting the second path. When the operating scenario is in a test state, the controller first pulls the gate signal of Q1 low, turning Q1 off, then pulls the gate signal of Q2 high, turning Q2 on. The second enable signal EN2 output by the reserved circuit 13 is transmitted to the multiphase power supply 12 via the second path, completing the mode switch. The entire switching process requires no manual operation and is automatically executed by the controller according to the preset test procedure. The switching response time can be controlled within microseconds.
[0061] Therefore, the multiphase power supply timing control circuit provided by the present invention has the following advantages: 1. Automates path switching, significantly improving operational efficiency and testing accuracy.
[0062] This solution uses a switch control circuit to drive the switching components to complete the path switching, completely eliminating the limitations of manual intervention. On the one hand, the switching process is automatically executed by the switch control circuit according to preset logic, with a response speed much faster than manual operation. Especially in scenarios where multiple test conditions are switched continuously, it can significantly shorten the test cycle and improve test efficiency. On the other hand, manual disassembly and assembly of resistors is prone to problems such as poor contact and incorrect installation, while automated switching can avoid human error, ensure the accuracy of path switching, and thus improve the transmission stability of multi-phase power supply control signals, ensuring the accuracy and reliability of test data.
[0063] 2. Enhance the flexibility and expandability of the circuit to adapt to diverse application needs.
[0064] The control logic of the switching components can be flexibly adjusted through programming, adapting to different path switching requirements without modifying the hardware circuit. For example, in the aging test of multiphase power supplies, the switching sequence can be preset, allowing two paths to alternately conduct at fixed intervals, simulating the long-term working state of multiphase power supplies under different control signals. If more control paths need to be added later, only the corresponding switching components need to be added to the circuit, and the corresponding drive logic needs to be added to the switching control circuit, without the need to redesign the PCB layout, which greatly reduces the cost and cycle of functional expansion.
[0065] 3. Improve the safety and reliability of the circuit and extend the service life of core components.
[0066] The resistors and capacitors in this invention effectively suppress voltage spikes and current surges generated during switch switching, preventing spike signals from impacting the pins of complex programmable logic devices and multi-phase power supplies, thus protecting core components. Furthermore, the switch control circuit can be pre-programmed with interlocking logic to ensure that the two paths do not conduct simultaneously, fundamentally avoiding the short-circuit risk caused by the superposition of two control signals and ensuring stable circuit operation. Simultaneously, the frequently disassembled fourth and fifth resistors are eliminated, reducing problems such as PCB pad detachment and circuit damage caused by repeated resistor insertion and removal, extending the lifespan of the entire circuit system.
[0067] 4. The enable signal conforms to the working environment, improving the efficiency and accuracy of multiphase power supply PI testing.
[0068] This invention designs a VIN voltage divider circuit so that when the automated test system is running, the multi-phase power supply can be powered on and run normally with VIN every time VIN is powered on and off. At the same time, the EN timing conforms to the normal working scenario. The circuit is simple and effective, improving the efficiency and accuracy of multi-phase power supply PI testing.
[0069] On the other hand, the present invention also provides an automated testing device, including the multiphase power supply timing control circuit described above.
[0070] The embodiments of the automated testing device provided in this invention are the same as those of the multiphase power supply timing control circuit described above, therefore, this invention will not be described in detail here.
[0071] The foregoing has provided a detailed description of a multiphase power supply timing control circuit and an automated testing device provided by embodiments of the present invention. The various embodiments are described in a progressive manner, with each embodiment focusing on its differences from other embodiments. Similar or identical parts between embodiments can be referred to interchangeably. For the device disclosed in the embodiments, since it corresponds to the method disclosed in the embodiments, the description is relatively simple; relevant parts can be referred to the description in the multiphase power supply timing control circuit section.
[0072] Those skilled in the art will further recognize that the units and algorithm steps of the various examples described in conjunction with the embodiments disclosed herein can be implemented in electronic hardware, computer software, or a combination of both. To clearly illustrate the interchangeability of hardware and software, the components and steps of the various examples have been generally described in terms of functionality in the foregoing description. Whether these functions are implemented in hardware or software depends on the specific application and design constraints of the technical solution. Those skilled in the art can use different methods to implement the described functions for each specific application, but such implementations should not be considered beyond the scope of this invention.
[0073] The foregoing has provided a detailed description of the multiphase power supply timing control circuit and automated testing device provided by the present invention. Specific examples have been used to illustrate the principles and implementation methods of the present invention. The descriptions of the above embodiments are merely for the purpose of helping to understand the method and core ideas of the present invention. It should be noted that those skilled in the art can make various improvements and modifications to the present invention without departing from its principles, and these improvements and modifications also fall within the protection scope of the claims of the present invention.
Claims
1. A multiphase power supply timing control circuit, characterized in that, include: The motherboard circuit, DC power supply, and automated testing system, wherein the motherboard circuit includes: a complex programmable logic device, a multi-phase power supply, and reserved circuitry; The automated testing system is connected to the DC power supply and is used to send corresponding start / stop signals to the DC power supply according to the working scenario status. The DC power supply is connected to the multi-phase power supply through a power pin in the motherboard circuit, and is used to provide the corresponding input voltage to the multi-phase power supply according to whether the start / stop signal is received. The complex programmable logic device is connected to the enable pin of the multiphase power supply and is used to provide a first enable signal to the multiphase power supply when the motherboard circuit is powered on and the working scenario state is untested. The power supply terminal of the reserved circuit is connected to the power supply pin in the motherboard circuit, and the output terminal of the reserved circuit is connected to the enable pin of the multiphase power supply. It is used to provide a second enable signal to the multiphase power supply when the DC power supply provides the corresponding input voltage and the working scenario state is test state, so that the timing of the multiphase power supply acquiring the second enable signal is later than the timing of the input voltage.
2. The multiphase power supply timing control circuit according to claim 1, characterized in that, The reserved circuit includes: a delay circuit, an adjustment circuit, a voltage divider circuit, and a filter circuit; The first end of the delay circuit is connected to the first end of the adjustment circuit, and together they serve as the input end of the reserved circuit and are connected to the power pin in the motherboard circuit. The second terminal of the delay circuit is connected to the second terminal of the adjustment circuit, and the third terminal of the delay circuit is connected to the first terminal of the voltage divider circuit. The second terminal of the voltage divider circuit is connected to the first terminal of the filter circuit; The second end of the filter circuit is connected to the enable pin of the multiphase power supply as the output end of the reserved circuit. The third terminal of the regulating circuit is connected to the third terminal of the voltage divider circuit and the third terminal of the filter circuit, and is grounded.
3. The multiphase power supply timing control circuit according to claim 2, characterized in that, The delay circuit is a MOSFET; The source of the MOS transistor serves as the first terminal of the delay circuit and is connected to the first terminal of the adjustment circuit and the power supply pin in the motherboard circuit. The gate of the MOS transistor is connected to the second terminal of the delay circuit and the second terminal of the adjustment circuit. The drain of the MOS transistor is connected to the first terminal of the voltage divider circuit as the third terminal of the delay circuit.
4. The multiphase power supply timing control circuit according to claim 2, characterized in that, The regulating circuit includes: a first resistor and a first capacitor; Wherein, the first end of the first resistor serves as the first end of the adjustment circuit and is connected to the first end of the delay circuit and the power pin in the motherboard circuit. The second end of the first resistor is connected to the first end of the first capacitor, and together they serve as the second end of the adjustment circuit and are connected to the second end of the delay circuit. The second terminal of the first capacitor is connected to the third terminal of the voltage divider circuit and the third terminal of the filter circuit, and is grounded.
5. The multiphase power supply timing control circuit according to claim 2, characterized in that, The voltage divider circuit includes: a second resistor and a third resistor; Wherein, the first end of the second resistor is connected to the third end of the delay circuit as the first end of the voltage divider circuit; The second end of the second resistor is connected to the first end of the third resistor, and together they serve as the second end of the voltage divider circuit connected to the first end of the filter circuit; The second end of the third resistor is connected to the third end of the voltage divider circuit, the third end of the adjustment circuit, and the third end of the filter circuit, and is grounded.
6. The multiphase power supply timing control circuit according to claim 2, characterized in that, The filter circuit includes: a fourth resistor and a second capacitor; Wherein, the first end of the fourth resistor serves as the first end of the filter circuit and is connected to the second end of the voltage divider circuit; The first terminal of the second capacitor serves as the third terminal of the filter circuit, connected to the third terminal of the voltage divider circuit and the third terminal of the adjustment circuit, and is grounded. The second end of the fourth resistor and the second end of the second capacitor are connected together, and together they serve as the second end of the voltage divider circuit, which is connected to the enable pin of the multiphase power supply.
7. The multiphase power supply timing control circuit according to any one of claims 2-6, characterized in that, Also includes: Fifth resistor, first switching assembly, and second switching assembly; Wherein, the first end of the fifth resistor is connected to the complex programmable logic device, and the second end of the fifth resistor is connected to the first end of the first switch assembly; The second end of the first switching assembly is connected to the enable pin of the multiphase power supply; The first terminal of the second switching assembly is connected to the second terminal of the filter circuit; The second terminal of the second switching assembly is connected to the enable pin of the multiphase power supply.
8. The multiphase power supply timing control circuit according to claim 7, characterized in that, Also includes: Switch control circuit; The input terminal of the switch control circuit is connected to the automated testing system, and the output terminal of the switch control circuit is connected to the control terminals of the first switch component and the second switch component, for controlling the on / off state of the first switch component and the second switch component according to the working scenario state.
9. The multiphase power supply timing control circuit according to claim 8, characterized in that, The switch control circuit is specifically used to control the first switch component to close and the second switch component to open when the working scenario state is the untested state; and to control the first switch component to open and the second switch component to close when the working scenario state is the test state.
10. An automated testing device, characterized in that, Includes the multiphase power supply timing control circuit according to any one of claims 1-9.