Multistage interconnected high-sensitivity piezoelectric vibration sensing chip based on hexagonal cantilever beam structure and preparation method thereof
By employing a hexagonal cantilever beam structure design and differential series electrode lead technology, the high-frequency sensitivity and adaptability to complex environments of the piezoelectric MEMS vibration sensor are enhanced, solving the bottleneck problems in existing technologies and achieving a balance between high sensitivity and stability.
Patent Information
- Application Number
- CN202610540773.1
- Authority / Receiving Office
- CN · China
- Patent Type
- Applications(China)
- Current Assignee / Owner
- Filing Date
- 2026-04-22
- Publication Date
- 2026-07-24
AI Technical Summary
Existing piezoelectric MEMS vibration sensors have bottlenecks in terms of high-frequency sensitivity, adaptability to complex environments, and long-term service stability, and the application of traditional bulk vibration sensors is limited in large-scale, distributed, and strong interference monitoring scenarios.
The design employs a hexagonal cantilever beam structure. By increasing stress concentration at the cantilever beam connection end and achieving electrode potential superposition through differential series connection of electrode leads, the piezoelectric effect and output sensitivity are enhanced.
This improves the sensor's ability to capture weak high-frequency vibration signals, enhances its robustness and output sensitivity in complex environments, and maintains structural stability.