Annealing device for reducing display defects of array tester

Abstract

The utility model discloses an annealing device for reducing display defects of an array tester, and relates to the technical field of auxiliary devices for array testers, a heat conduction inner plate is arranged at the upper part in an annealing main body, one side of the heat conduction inner plate is provided with a temperature rising mechanism and a PLC control module, a time relay is arranged below the PLC control module, and the PLC control module is connected with the time relay. A temperature displayer is arranged in the middle of the upper portion of one side of the annealing body, a buzzer is arranged below the temperature displayer, a high-temperature resistance sensor is arranged at one end of the upper portion in the annealing body, and the high-temperature resistance sensor is electrically connected with the temperature displayer, the buzzer, a heating mechanism and a PLC control module. According to the annealing device capable of reducing the display defects of the array tester, the temperature control of the annealing device can be more accurate through the design of the high-temperature resistance sensor, and the display error of the array tester is reduced by controlling the annealing temperature and time.

Description

Technical Field

[0001] The utility model relates to the technical field of auxiliary devices for array testers, in particular to an annealing device for reducing display defects of array testers. Background Art

[0002] The array detector is a detection device based on infrared spectroscopy technology. It can detect the infrared spectrum information of the substance being detected through a group of miniaturized detection devices installed on a special substrate, thereby realizing the analysis and detection of the material composition. When processing the array tester, an annealing device will be used to reduce the defects displayed by the array tester.

[0003] Chinese patent authorization announcement number CN111312624A, authorization announcement date June 19, 2020, an annealing device, comprising: an annealing device, characterized in that it comprises: an annealing chamber, used to accommodate a substrate to be processed and anneal the substrate to be processed, the annealing chamber having an air inlet end and an air outlet end; a gas supply device, used to provide a target gas to the annealing chamber, the gas supply device comprising a plurality of heating pipes, the plurality of heating pipes are arranged in an array, and the connection ports of the plurality of heating pipes are dispersed at the air inlet end, and each heating pipe is connected to the annealing chamber through the connection port; a controller, used to control the heating pipes to heat the target gas respectively, so that the target gas entering the heating pipe is heated and then transported to the annealing chamber.

[0004] Although the above scheme can control each heating pipe separately through the controller to control the temperature of the target gas input into the annealing chamber by each heating pipe, and the target gas with different temperatures is transported to different areas of the annealing chamber so that the heated target gas adjusts the temperature in the annealing chamber, it often leads to poor quality of the finished product of the array tester due to inaccurate control of temperature and time during use. In this regard, we propose an annealing device that reduces the display defects of the array tester. Utility Model Content

[0005] The purpose of the utility model is to provide an annealing device for reducing display defects of an array tester, so as to solve the problem that the existing annealing device for reducing display defects of an array tester mentioned in the above background technology often leads to poor quality of the finished array tester due to inaccurate control of temperature and time during use.

[0006] To achieve the above-mentioned purpose, the utility model provides the following technical solution: an annealing device for reducing display defects of an array tester, comprising: an annealing body,

[0007] A heat-conducting inner plate is arranged above the inside of the annealing body, a heating mechanism is arranged on one side of the heat-conducting inner plate, and at least two heating mechanisms are arranged, and the heating mechanism and the heat-conducting inner plate are fixedly connected with the annealing body through a slot;

[0008] A PLC control module is arranged below one side of the annealing body, and the PLC control module is fixedly connected to the annealing body through a transverse plate, a time relay is arranged below the PLC control module, a temperature display is arranged at a middle position above one side of the annealing body, a buzzer is arranged below the temperature display, and the temperature display and the buzzer are an integrated structure with the annealing body, a high-temperature resistance sensor is arranged at one end above the inside of the annealing body, and the high-temperature resistance sensor is electrically connected to the temperature display, the buzzer, the heating mechanism and the PLC control module.

[0009] Preferably, sliding ball blocks are provided at the four corners below the annealing body, and the sliding ball blocks are fixedly connected to the annealing body through a slot, and vertical levers are provided at the four corners of the annealing body, and the vertical levers are fixedly connected to the annealing body through a slot, and a heat insulation baffle is provided below the buzzer, and the heat insulation baffle is fixedly connected to the annealing body through a slot.

[0010] Preferably, an auxiliary placement plate is provided below the heat insulation baffle, and the auxiliary placement plate is fixedly connected to the annealing body, an upper fixed square cover is provided above the annealing body, both ends of the upper fixed square cover are provided with lever grooves, and there are more than two lever grooves.

[0011] Preferably, an anti-sway lower ring block is provided below the upper fixed square cover, and the anti-sway lower ring block is fixedly connected to the upper fixed square cover. A fixed lower block is provided below the inside of the annealing body, and the fixed lower block is fixedly connected to the annealing body through an electric push rod, and there are more than two electric push rods.

[0012] Preferably, a thermal insulation transverse plate is arranged above the fixed lower block, and the thermal insulation transverse plate and the fixed lower block are an integrated structure, and a friction increasing block is arranged above the thermal insulation transverse plate, and the friction increasing block and the thermal insulation transverse plate are an integrated structure.

[0013] Preferably, outer sliding ball blocks are provided on both sides below the thermal insulation horizontal plate, and the outer sliding ball blocks are fixedly connected to the thermal insulation horizontal plate and the fixed lower block. The set temperature of the heating mechanism is 330°C, and the set value of the time relay is 15min.

[0014] Preferably, a rotating push handle is provided on both sides above the other end of the annealing body, and one end of the rotating push handle is rotatably connected to the annealing body through a rotating shaft, and a protective rear pad is provided below the rotating push handle, and the protective rear pad is fixedly connected to the annealing body through a slot.

[0015] Compared with the prior art, the beneficial effects of the utility model are:

[0016] 1. Compared with the existing auxiliary devices for array testers, this annealing device for reducing display defects of array testers is equipped with a high-temperature resistance sensor, a temperature display, a buzzer, a heating mechanism and a PLC control module. The design of the high-temperature resistance sensor can make the temperature control of the annealing device more accurate. The combined design of the above schemes can make the annealing process control of the array display more accurate during preparation. By controlling the annealing temperature and time, the error of the array tester during display is reduced, which solves the problem that the existing annealing device for reducing display defects of array testers is often used due to inaccurate temperature and time control, resulting in poor quality of the finished array tester.

[0017] 2. Compared with the existing auxiliary devices for array testers, this annealing device for reducing defects displayed on array testers is equipped with a fixed lower block, an electric push rod and a sliding ball block. The design of the electric push rod can make the movement of the fixed lower block more convenient. The combined design of the above-mentioned original parts can make it more convenient for workers to remove the materials after annealing, which solves the problem that the existing annealing device for reducing defects displayed on array testers is often difficult to remove during use, which increases the difficulty of operation for workers. BRIEF DESCRIPTION OF THE DRAWINGS

[0018] Figure 1 This is the overall structural front view of the utility model;

[0019] Figure 2 It is a schematic diagram of the internal structure of the utility model;

[0020] Figure 3 For this utility model Figure 2 A partial enlarged view of area A;

[0021] Figure 4 It is the overall structural rear view of the utility model.

[0022] In the figure: 1. Annealing body; 2. Heat insulation baffle; 3. Auxiliary placement plate; 4. Temperature display; 5. Buzzer; 6. Upper fixed square cover; 7. Pull groove; 8. High temperature resistance sensor; 9. Heating mechanism; 10. Heat conduction inner plate; 11. Anti-shake lower circle block; 12. Friction increase block; 13. Heat insulation horizontal plate; 14. PLC control module; 15. Time relay; 16. Electric push rod; 17. Fixed lower block; 18. Sliding ball block; 19. External sliding ball block; 20. Protective rear pad; 21. Rotating push handle. DETAILED DESCRIPTION

[0023] The technical solutions in the embodiments of the present invention will be described clearly and completely below in conjunction with the drawings in the embodiments of the present invention. Obviously, the described embodiments are only part of the embodiments of the present invention, rather than all of the embodiments.

[0024] See also Figure 1-4 The utility model provides an embodiment: an annealing device for reducing display defects of an array tester, comprising: an annealing body 1,

[0025] A heat-conducting inner plate 10 is arranged above the inside of the annealing body 1. A heating mechanism 9 is arranged on one side of the heat-conducting inner plate 10. There are two or more heating mechanisms 9. The heating mechanism 9 and the heat-conducting inner plate 10 are fixedly connected to the annealing body 1 through a slot.

[0026] A PLC control module 14 is arranged below one side of the annealing body 1, and the PLC control module 14 is fixedly connected to the annealing body 1 through a horizontal plate, a time relay 15 is arranged below the PLC control module 14, a temperature display 4 is arranged at the middle position above one side of the annealing body 1, a buzzer 5 is arranged below the temperature display 4, and the temperature display 4 and the buzzer 5 are an integrated structure with the annealing body 1, a high-temperature resistance sensor 8 is arranged at one end above the inside of the annealing body 1, and the high-temperature resistance sensor 8 is electrically connected to the temperature display 4, the buzzer 5, the heating mechanism 9 and the PLC control module 14.

[0027] When in use, first move the annealing device for reducing the defects displayed by the array tester to the position where it is needed. At this time, the inside of the annealing body 1 of the array tester to be prepared can be placed, and then the switch controlling the heating mechanism 9 can be turned on. When the heating temperature of the heating mechanism 9 reaches 330°C set by the high-temperature resistance sensor 8, the high-temperature resistance sensor 8 will transmit the signal to the heating mechanism 9 and the time relay 15. At this time, the heating mechanism 9 stops heating, and then the time relay 15 starts timing. When the time relay 15 sets 15 minutes, the time relay 15 will transmit the conduction signal to the buzzer 5, and then the buzzer 5 will sound, and the staff can anneal the prepared array tester.

[0028] See also Figure 1 , a heat insulation baffle 2 is arranged below the buzzer 5, and the heat insulation baffle 2 is fixedly connected to the annealing body 1 through a card slot, so that the connection between the heat insulation baffle 2 and the annealing body 1 is more firmly, an auxiliary placement plate 3 is arranged below the heat insulation baffle 2, and the auxiliary placement plate 3 is fixedly connected to the annealing body 1, so that the connection between the auxiliary placement plate 3 and the annealing body 1 is more firmly, and an upper fixed square cover 6 is arranged above the annealing body 1, and both ends of the upper fixed square cover 6 are provided with a pull groove 7, and the pull groove 7 is provided with more than two;

[0029] See also Figure 2-Figure 4, sliding ball blocks 18 are provided at the four corners below the annealing body 1, and the sliding ball blocks 18 are fixedly connected to the annealing body 1 through a slot, so that the connection between the sliding ball blocks 18 and the annealing body 1 is more secure, and the four corners of the annealing body 1 are provided with a pull column 22, and the pull column 22 is fixedly connected to the annealing body 1 through a slot, so that the connection between the pull column 22 and the annealing body 1 is more secure, and an anti-sway lower circle block 11 is provided below the upper fixed square cover 6, and the anti-sway lower circle block 11 is fixedly connected to the upper fixed square cover 6, and a fixed lower block 17 is provided below the inside of the annealing body 1, and the fixed lower block 17 is fixedly connected to the annealing body 1 through an electric push rod 16, so that the connection between the fixed lower block 17 and the annealing body 1 is more secure, and there are more than two electric push rods 16, and a temperature-insulating horizontal plate 13 is provided above the fixed lower block 17, and the temperature-insulating horizontal plate 13 and the fixed lower block 17 are integrated Structure, a friction increasing block 12 is arranged above the insulation horizontal plate 13, and the friction increasing block 12 and the insulation horizontal plate 13 are an integrated structure, outer sliding ball blocks 19 are arranged on both sides below the insulation horizontal plate 13, and the outer sliding ball block 19 is fixedly connected to the insulation horizontal plate 13 and the fixed lower block 17, so that the connection between the outer sliding ball block 19 and the insulation horizontal plate 13 and the fixed lower block 17 is more secure, the set temperature of the heating mechanism 9 is 330°C, the set value of the time relay 15 is 15min, and a rotating push handle 21 is arranged on both sides above the other end of the annealing main body 1, and one end of the rotating push handle 21 is rotatably connected to the annealing main body 1 through a rotating shaft, so that the connection between one end of the rotating push handle 21 and the annealing main body 1 is more secure, and a protective rear pad 20 is arranged below the rotating push handle 21, and the protective rear pad 20 is fixedly connected to the annealing main body 1 through a card slot, so that the connection between the protective rear pad 20 and the annealing main body 1 is more secure.

[0030] Working principle: when in use, first move the annealing device for reducing the defects displayed on the array tester to the position where it needs to be used. At this time, the inside of the annealing body 1 of the array tester to be prepared can be moved, and the switch of the control heating mechanism 9 can be turned on. When the heating temperature of the heating mechanism 9 reaches 330°C set by the high-temperature resistance sensor 8, the high-temperature resistance sensor 8 will transmit the signal to the heating mechanism 9 and the time relay 15. At this time, the heating mechanism 9 stops heating, and then the time relay 15 starts timing. When the 15 minutes set by the time relay 15 is reached, the time relay 15 will transmit the conduction signal to the buzzer 5, and then the buzzer 5 sounds, and the staff can anneal the prepared array tester. When the annealing device for reducing the defects displayed on the array tester is used, the electric push rod 16 set under the fixed lower block 17 and the sliding ball blocks 18 set on both sides thereof can make it more convenient for the staff to take out the annealed materials, thereby reducing the work intensity of the staff during processing.

[0031] It is obvious to those skilled in the art that the present invention is not limited to the details of the exemplary embodiments described above, and that the present invention can be implemented in other specific forms without departing from the spirit or essential features of the present invention. Therefore, the embodiments should be regarded as exemplary and non-restrictive from any point of view, and the scope of the present invention is defined by the appended claims rather than the above description, and it is intended that all changes falling within the meaning and scope of the equivalent elements of the claims be included in the present invention. Any reference numeral in a claim should not be regarded as limiting the claim to which it relates.

Claims

1. An annealing device for reducing display defects of an array tester, comprising an annealing body (1), characterized in that: A heat-conducting inner plate (10) is arranged above the interior of the annealing body (1), a heating mechanism (9) is arranged on one side of the heat-conducting inner plate (10), and at least two heating mechanisms (9) are arranged, and the heating mechanism (9) and the heat-conducting inner plate (10) are fixedly connected to the annealing body (1) via a slot; A PLC control module (14) is arranged below one side of the annealing body (1), and the PLC control module (14) is fixedly connected to the annealing body (1) via a transverse plate; a time relay (15) is arranged below the PLC control module (14); a temperature display (4) is arranged at a middle position above one side of the annealing body (1); a buzzer (5) is arranged below the temperature display (4); the temperature display (4) and the buzzer (5) are an integrated structure with the annealing body (1); a high temperature resistance sensor (8) is arranged at one end above the inside of the annealing body (1); and the high temperature resistance sensor (8) is electrically connected to the temperature display (4), the buzzer (5), the temperature raising mechanism (9) and the PLC control module (14).

2. The annealing device for reducing display defects of an array tester according to claim 1, characterized in that: Sliding ball blocks (18) are provided at the four corners below the annealing body (1), and the sliding ball blocks (18) are fixedly connected to the annealing body (1) via a slot; vertical lever columns (22) are provided at the four corners of the annealing body (1), and the vertical lever columns (22) are fixedly connected to the annealing body (1) via a slot; and a heat insulation baffle (2) is provided below the buzzer (5), and the heat insulation baffle (2) is fixedly connected to the annealing body (1) via a slot.

3. The annealing device for reducing display defects of an array tester according to claim 2, characterized in that: An auxiliary placement plate (3) is provided below the heat insulation baffle (2), and the auxiliary placement plate (3) is fixedly connected to the annealing body (1). An upper fixed square cover (6) is provided above the annealing body (1), and both ends of the upper fixed square cover (6) are provided with lever grooves (7), and there are more than two lever grooves (7).

4. The annealing device for reducing display defects of an array tester according to claim 3, characterized in that: An anti-sway lower ring block (11) is provided below the upper fixed square cover (6), and the anti-sway lower ring block (11) is fixedly connected to the upper fixed square cover (6). A fixed lower block (17) is provided below the interior of the annealing body (1), and the fixed lower block (17) is fixedly connected to the annealing body (1) via an electric push rod (16), and at least two of the electric push rods (16) are provided.

5. The annealing device for reducing display defects of an array tester according to claim 4, characterized in that: A heat-insulating transverse plate (13) is arranged above the fixed lower block (17), and the heat-insulating transverse plate (13) and the fixed lower block (17) are an integral structure; a friction-increasing block (12) is arranged above the heat-insulating transverse plate (13), and the friction-increasing block (12) and the heat-insulating transverse plate (13) are an integral structure.

6. The annealing device for reducing display defects of an array tester according to claim 5, characterized in that: External sliding ball blocks (19) are provided on both sides below the thermal insulation horizontal plate (13), and the external sliding ball blocks (19) are fixedly connected to the thermal insulation horizontal plate (13) and the fixed lower block (17). The set temperature of the temperature increasing mechanism (9) is 330° C., and the set value of the time relay (15) is 15 minutes.

7. The annealing device for reducing display defects of an array tester according to claim 6, characterized in that: A rotating push handle (21) is provided on both sides above the other end of the annealing body (1), and one end of the rotating push handle (21) is rotatably connected to the annealing body (1) via a rotating shaft; a protective rear cushion block (20) is provided below the rotating push handle (21), and the protective rear cushion block (20) is fixedly connected to the annealing body (1) via a slot.

Images