Testing device for SFP (Small Form-factor Pluggable) optical module

Abstract

The utility model provides a test device for an SFP optical module, which comprises an optical module test board, a bit error tester, a DC stabilized power supply and a PC terminal, and is characterized in that the optical module test board is provided with an optical module socket, a radio frequency connector and a plurality of functional circuits; the plurality of functional circuits comprise a control circuit, a power supply circuit, a voltage and current detection circuit and a power supply bias circuit. Wherein the power supply circuit converts an input voltage into two paths through two power converters, one path supplies power to an electric device on the optical module test board, and the other path supplies power to the SFP optical module; the power supply bias circuit adjusts the power supply voltage of the SFP optical module through a 16-bit digital-to-analog converter. The voltage and current detection circuit detects the working voltage and current of the SFP optical module through a 16-bit analog-to-digital converter; and the control circuit realizes communication with a PC (Personal Computer) end, monitors the state of the optical module, reads the working voltage and current of the optical module and controls the bias of the power supply through the microcontroller and the USB interface. The testing device is low in cost, small in size, high in compatibility and high in testing precision.

Description

Technical Field

[0001] The utility model relates to the technical field of optical communication, in particular to a testing device for an SFP optical module. Background Art

[0002] The high-frequency performance test of optoelectronic devices includes two aspects: small signal frequency response characteristic test and large signal dynamic characteristic test. The small signal frequency response describes the transmission and reflection characteristics of the device at different frequencies, which reflects the linear responsiveness of the device; the large signal test is the transmission characteristics of the device at different rates, which reflects the nonlinear characteristics of the device.

[0003] As the application scenarios of optical communication networks continue to grow, the demand for optical modules continues to grow, and the testing requirements for optical modules are becoming more and more stringent. This has brought huge challenges to global optical module manufacturers. How to test as many optical module-related items as possible in the early stages of manufacturing and increase the reliability of optical module products has become an urgent problem to be solved. Utility Model Content

[0004] The purpose of the utility model is to provide a test device for SFP optical modules, which has the functions of SFP optical module low-speed IO monitoring, RF signal switching, module working current, voltage detection, and voltage deviation testing. The specific technical solution is as follows:

[0005] A test device for an SFP optical module, the test device comprising an optical module test board, a bit error meter, a DC regulated power supply and a PC terminal; the optical module test board is provided with an optical module socket, a radio frequency connector and a plurality of functional circuits; the plurality of functional circuits comprises a power supply circuit, a power bias circuit, a control circuit, a voltage and current detection circuit and a module interface circuit.

[0006] Furthermore, the control circuit, the voltage and current detection circuit and the power biasing circuit are all electrically connected to the power supply circuit, the module interface circuit is connected to the power biasing circuit, the voltage and current detection circuit is electrically connected to the module interface circuit and the control circuit, the power supply circuit is externally connected to a DC regulated power supply, and the control circuit is externally connected to a PC terminal.

[0007] Furthermore, the power supply circuit includes a low linear voltage regulator and a DC converter, and the low linear voltage regulator and the DC converter are both connected to a plurality of capacitor devices.

[0008] Furthermore, the power bias circuit includes a digital-to-analog converter and a reference source.

[0009] Furthermore, the control circuit includes a microcontroller and a USB interface, the D+ end of the microcontroller is connected to the D+ end of the USB interface, the D- end of the microcontroller is connected to the D- end of the USB interface U2, and the microcontroller is connected to multiple capacitors and resistors.

[0010] Furthermore, the voltage and current detection circuit includes an analog-to-digital converter, and the analog-to-digital converter can be a 16-bit SGM58031.

[0011] Furthermore, the module interface circuit includes the optical module socket and the radio frequency connector, and the optical module socket is connected to the radio frequency connector through a module gold finger.

[0012] Furthermore, the low linear voltage regulator adopts SGM2203L-3.3V, and the DC converter adopts SGM6132YPS8G / TR.

[0013] Furthermore, the digital-to-analog converter adopts the 16-bit SGM5355-16XMS8G / TR, and the reference source adopts the SGM431BXN3LG / TR.

[0014] Furthermore, the microcontroller adopts C8051 F347.

[0015] The utility model provides a test device for an SFP optical module, which has the following beneficial effects:

[0016] The utility model provides a test device for an SFP optical module, which has the test functions of SFP optical module low-speed IO monitoring, RF signal switching, module working current and voltage detection, voltage deviation, etc., and the test device has low cost, small size, high compatibility and high test accuracy. BRIEF DESCRIPTION OF THE DRAWINGS

[0017] Figure 1 It is a structural schematic diagram of a testing device for an SFP optical module provided by the utility model;

[0018] Figure 2 This is a partial circuit diagram of a test device for an SFP optical module provided by the utility model;

[0019] Figure 3 This is a partial circuit diagram of a test device for an SFP optical module provided by the utility model;

[0020] Figure 4 This is a partial circuit diagram of a device for testing an SFP optical module provided by the utility model;

[0021] Figure 5The utility model is a partial circuit diagram of a testing device for an SFP optical module. DETAILED DESCRIPTION

[0022] The following will be combined with the accompanying drawings provided by the utility model to clearly and completely describe the technical solutions in the embodiments of the utility model. According to the following description, the advantages and features of the utility model will be clearer. It should be noted that the drawings are all in a very simplified form and are not in precise proportions, which are only used to conveniently and clearly assist in explaining the purpose of the embodiments of the utility model.

[0023] In the description of the present invention, unless otherwise clearly specified and limited, the terms "connection" and "connected" should be interpreted in a broad sense. For example, it can be a fixed connection, a detachable connection, or an integrated connection; it can be a mechanical connection or an electrical connection; it can be a direct connection or an indirect connection through an intermediate medium, it can be the internal connection of two elements or the interaction relationship between two elements. For ordinary technicians in this field, the specific meanings of the above terms in the present invention can be understood according to specific circumstances.

[0024] In the description of the present invention, terms such as "upper", "lower", "left", "right", "front", "back", "center", "horizontal", "vertical", "top", "bottom", "inside" and "outside" and other orientations or positional relationships are based on the orientations or positional relationships shown in the accompanying drawings and are only for the convenience of description and simplification of operation, and do not indicate or imply that the referred device or element must have a specific orientation, be constructed and operated in a specific orientation, and therefore cannot be understood as a limitation on the present invention.

[0025] Embodiment: This embodiment provides a test device for SFP optical module, see Figure 1 As shown, the device includes an optical module test board 1, a bit error meter 2, a DC regulated power supply 3 and a PC terminal 4. The optical module test board 1 is provided with an optical module socket 11, a radio frequency connector 12 and multiple functional circuits. The optical module SFP to be tested is inserted into the optical module socket 11 and connected with the radio frequency connector 12. The radio frequency connection socket of the radio frequency connector is connected to the bit error meter 2 through a radio frequency line, so that the optical module SFP to be tested is electrically connected to the optical module test board, so as to realize the bit error test of the SFP optical module through the test board.

[0026] Among them, multiple functional circuits include a power supply circuit, a power supply bias circuit, a control circuit, a voltage and current detection circuit and a module interface circuit. The control circuit, the voltage and current detection circuit and the power supply bias circuit are all electrically connected to the power supply circuit, the module interface circuit is connected to the power supply bias circuit, the voltage and current detection circuit is electrically connected to the module interface circuit and the control circuit, the power supply circuit is externally connected to a DC voltage-stabilized power supply 3, and the control circuit is externally connected to a PC terminal 4. The power supply circuit is used to convert the input voltage and then supply power to the electrical devices and the SFP optical module on the optical module test board 1; the power supply bias circuit is used to realize biasing of the power supply voltage of the SFP optical module; the voltage and current detection circuit is used to detect the working voltage and current of the SFP optical module; the control circuit is used to realize communication with the PC terminal 4, monitor the state of the optical module, read the working voltage and current of the optical module, and control the power supply bias; the module interface circuit is used to input a modulation signal to the SFP optical module through the radio frequency connector 12 and test the eye diagram of the electrical signal transmitted by the SFP optical module, etc.

[0027] See also Figure 2 The figure shows the connection diagram of the power supply circuit and the power supply biasing circuit. The power supply circuit includes a low linear voltage regulator U2 and a DC converter U3. Multiple capacitors are connected around the linear voltage regulator U2 and the DC converter U3. The input voltage of the power supply is converted into 3.3V through the low linear voltage regulator U2 to power the electrical devices on the optical module test board 1, and the input voltage is converted into 3.3V through the DC converter U3 to power the SFP optical module. The power supply biasing circuit includes a digital-to-analog converter U4 and a reference source U5. By changing the output of the digital-to-analog converter U4, the output of the DC converter U3 is changed, thereby realizing the biasing of the power supply voltage of the SFP optical module.

[0028] See also Figure 3 The figure shows a connection diagram of the control circuit. The control circuit includes a microcontroller U1 and a USB interface. The D+ end of the microcontroller U1 is connected to the D+ end of the USB interface, and the D- end of the microcontroller U1 is connected to the D- end of the USB interface U2. According to actual needs, multiple capacitors, resistors and other devices can be connected around the microcontroller U1. The PC can communicate with the microcontroller U1 through the USB interface to monitor the status of the SFP optical module, read the operating voltage and current of the SFP optical module, and control the power supply deviation.

[0029] See also Figure 4 The figure shows a connection diagram of a voltage and current detection circuit. The voltage and current detection circuit includes an analog-to-digital converter U6 to detect the working voltage and current of the SFP optical module.

[0030] See also Figure 5The module interface circuit shown in the figure includes an SFP optical module socket and an RF connector. The SFP optical module socket is connected to the RF connector through the module gold finger. The modulated signal can be input to the SFP optical module through the RF connector and the eye diagram of the electrical signal transmitted by the SFP optical module can be tested.

[0031] Optionally, the low voltage linear regulator U2 can use SGM2203L-3.3V.

[0032] Optionally, the DC converter U3 can use SGM6132YPS8G / TR.

[0033] Optionally, the digital-to-analog converter U4 may use the 16-bit SGM5355-16XMS8G / TR.

[0034] Optionally, reference source U5 can use SGM431BXN3LG / TR.

[0035] Optionally, the microcontroller U1 may be C8051F347.

[0036] Optionally, the analog-to-digital converter U6 may use the 16-bit SGM58031.

[0037] Optionally, the RF connector can be FTEC0101-70G-SMA.

[0038] Those skilled in the art should understand that the present invention can be implemented in many other specific forms without departing from the spirit and scope of the present invention, and all other embodiments obtained by those of ordinary skill in the art based on the embodiments of the present invention without making any creative efforts shall fall within the scope of protection of the present invention.

Claims

1. A test device for SFP optical module, characterized in that: The testing device includes an optical module testing board, a bit error meter, a DC regulated power supply and a PC terminal. The optical module testing board is provided with an optical module socket, a radio frequency connector and multiple functional circuits. The multiple functional circuits include a power supply circuit, a power supply bias circuit, a control circuit, a voltage and current detection circuit and a module interface circuit.

2. The test device for SFP optical module according to claim 1, characterized in that: The control circuit, the voltage and current detection circuit and the power biasing circuit are all electrically connected to the power supply circuit, the module interface circuit is connected to the power biasing circuit, the voltage and current detection circuit is electrically connected to the module interface circuit and the control circuit, the power supply circuit is externally connected to a DC regulated power supply, and the control circuit is externally connected to a PC terminal.

3. The test device for SFP optical module according to claim 2, characterized in that: The power supply circuit includes a low linear voltage regulator and a DC converter, and both the low linear voltage regulator and the DC converter are connected to a plurality of capacitor devices.

4. The test device for SFP optical module according to claim 2, characterized in that: The power bias circuit includes a digital-to-analog converter and a reference source.

5. The test device for SFP optical module according to claim 2, characterized in that: The control circuit includes a microcontroller and a USB interface, the D+ end of the microcontroller is connected to the D+ end of the USB interface, the D- end of the microcontroller is connected to the D- end of the USB interface U2, and the microcontroller is connected to multiple capacitors and resistors.

6. The test device for SFP optical module according to claim 2, characterized in that: The voltage and current detection circuit includes an analog-to-digital converter, and the analog-to-digital converter can be a 16-bit SGM58031.

7. The test device for SFP optical module according to claim 2, characterized in that: The module interface circuit includes the optical module socket and the radio frequency connector, and the optical module socket is connected to the radio frequency connector through a module gold finger.

8. The test device for SFP optical module according to claim 3, characterized in that: The low linear voltage regulator adopts SGM2203L-3.3V, and the DC converter adopts SGM6132YPS8G / TR.

9. The test device for SFP optical module according to claim 4, characterized in that: The digital-to-analog converter adopts the 16-bit SGM5355-16XMS8G / TR, and the reference source adopts the SGM431BXN3LG / TR.

10. The test device for SFP optical module according to claim 5, characterized in that: The microcontroller adopts C8051F347.

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