Chip test board for integrated circuit chip test

Abstract

The utility model discloses a chip testboard based on integrated circuit chip testing, which belongs to the technical field of integrated circuit chip testing, and comprises a testboard, an integrated circuit chip testing probe and a display screen, the top of the testboard is provided with a hollow support plate, the top of the testboard is fixedly connected with a top block, and the top block is fixedly connected with the integrated circuit chip testing probe. A supporting and jacking mechanism is arranged on the top of the hollow supporting plate. The integrated circuit chip test probe solves the problems that after most of existing integrated circuit chip test equipment is used for testing an integrated circuit chip, the flatly-placed integrated circuit chip is inconvenient to take down, and in the process that the integrated circuit chip is placed at the bottom of the integrated circuit chip test probe for testing, the integrated circuit chip cannot be taken down easily. The problems that an integrated circuit chip and an integrated circuit chip test probe are easily scratched accidentally, the integrated circuit chip and the integrated circuit chip test probe are easily damaged, economic loss is caused, and the use effect is affected are solved.

Description

Technical Field

[0001] The utility model relates to the technical field of integrated circuit chip testing, in particular to a chip testing platform based on integrated circuit chip testing. Background Art

[0002] An integrated circuit chip is an electronic component that includes a silicon substrate, at least one circuit, a fixed sealing ring, a grounding ring and at least one guard ring. After the integrated circuit chip is produced, an integrated circuit chip testing device is needed to test the integrated circuit chip.

[0003] At present, a Chinese patent with announcement number CN220650816U discloses a chip test bench, which relates to the technical field of chip test benches. The utility model includes a chip test bench base, a bracket is fixedly connected to the top of the chip test bench base, the cylinder is fixedly connected to the top of the bracket, the output end of the cylinder is connected to the top of the bracket, and the output end of the cylinder is fixedly connected to a test probe board. A plurality of control keys are arranged on one side of the chip test bench base, and an ejection device is arranged on the top of the chip test bench base. The utility model provides an ejection device. After the test is completed, one end of the threaded rod can be manually held to rotate it in the circular hole to a certain position, driving the sliding trapezoidal block to slide to one side in the groove, and then one side of its inclined surface is squeezed and pushed on the inclined surface of the arc groove trapezoidal block, so that it drives the ejection plate to slide upward from the groove to eject the tested chip, making it convenient for the operator to take it out and improving the test efficiency.

[0004] After most of the existing integrated circuit chip testing equipment is used to test the integrated circuit chip, it is inconvenient to remove the integrated circuit chip that is placed flat, and in the process of placing the integrated circuit chip at the bottom of the integrated circuit chip test probe for testing, it is easy to cause the integrated circuit chip and the integrated circuit chip test probe to be accidentally scratched, which is easy to cause the integrated circuit chip and the integrated circuit chip test probe to be damaged, causing economic losses. Utility Model Content

[0005] The utility model provides a chip test bench for testing integrated circuit chips, aiming to solve the problem that after most of the existing integrated circuit chip testing equipment is used to test the integrated circuit chip, it is inconvenient to remove the integrated circuit chip that is placed flat, and in the process of placing the integrated circuit chip at the bottom of the integrated circuit chip test probe for testing, it is easy to cause the integrated circuit chip and the integrated circuit chip test probe to be accidentally scratched, which is easy to cause the integrated circuit chip and the integrated circuit chip test probe to be damaged, causing economic losses, thereby affecting the use effect.

[0006] The utility model is implemented as follows: a chip test bench for integrated circuit chip testing, comprising a test bench, an integrated circuit chip test probe and a display screen, a hollow support plate is arranged on the top of the test bench, a top block is fixedly connected to the top of the test bench, and a supporting lifting mechanism is arranged on the top of the hollow support plate;

[0007] The support and lifting mechanism includes two support rings, a plurality of notches and a lifting port, the bottom of the support ring is fixedly connected to the top of the hollow support plate, the notches are opened inside the support ring, and the lifting port is opened inside the hollow support plate.

[0008] In order to achieve the effect of protecting the integrated circuit chip, as a preferred chip test bench for integrated circuit chip testing of the utility model, a protective pad is fixedly connected to the top of the top block, and the shape of the top block is triangular.

[0009] In order to achieve the effect of adsorbing the integrated circuit chip and preventing the integrated circuit chip from moving backward excessively, as a preferred chip testing bench for integrated circuit chip testing based on the utility model, through grooves are opened on both sides of the top of the hollow pallet, and the rear side of the top of the hollow pallet is fixedly connected to a limiting strip.

[0010] In order to achieve the effect of connecting the fixed box with the hollow support plate, as a preferred chip test bench for integrated circuit chip testing of the utility model, the rear side of the hollow support plate is fixedly connected with a connecting pipe, and the rear side of the connecting pipe is fixedly connected with the fixed box.

[0011] In order to achieve the effect of generating suction at the through groove, as a preferred chip test bench for integrated circuit chip testing of the utility model, fans are provided on both sides of the rear side of the fixing box, and the fans are embedded in the interior of the fixing box.

[0012] In order to facilitate the movement of the hollow pallet, as a preferred chip testing platform for integrated circuit chip testing of the utility model, both sides of the top of the testing platform are fixedly connected with sliding bars, both sides of the hollow pallet are provided with sliding grooves, and the surface of the sliding bar is movably connected to the inner wall of the sliding groove.

[0013] In order to achieve the effect of limiting the hollow pallet, as a preferred chip testing platform for integrated circuit chip testing of the utility model, the rear sides of both sides of the hollow pallet are fixedly connected with a first limit block, and the front sides of the tops of the two slide bars are fixedly connected with a second limit block.

[0014] In order to facilitate the pulling of the hollow support plate, as a preferred embodiment of the chip testing platform for integrated circuit chip testing of the utility model, both sides of the front side of the hollow support plate are fixedly connected with pull rings.

[0015] Compared with the prior art, the beneficial effects of the utility model are:

[0016] The chip test bench based on integrated circuit chip testing moves the hollow supporting plate forward, then places the integrated circuit chip to be tested on the top of the protective pad at an angle, and then moves the hollow supporting plate backward. At this time, the integrated circuit chip slides down from the inclined surface of the triangular top block to the top of the supporting ring. At this time, the supporting ring can horizontally support the integrated circuit chip, and then the integrated circuit chip can be stably moved to the bottom of the integrated circuit chip test probe, and then the fan is controlled to generate suction to adsorb and limit the integrated circuit chip, so that the integrated circuit chip can be tested using the integrated circuit chip test probe. After the integrated circuit chip test is completed, the fan is turned off, and the hollow supporting plate is pulled forward so that the triangular top block lifts the integrated circuit chip from the top of the hollow supporting plate, so that the integrated circuit chip can be easily removed, thereby avoiding the problem that most of the existing integrated circuit chip testing equipment is used to test the integrated circuit chip, and it is inconvenient to remove the flatly placed integrated circuit chip, and in the process of placing the integrated circuit chip on the bottom of the integrated circuit chip test probe for testing, it is easy to cause the integrated circuit chip and the integrated circuit chip test probe to be accidentally scratched, which is easy to cause the integrated circuit chip and the integrated circuit chip test probe to be damaged, resulting in economic losses. BRIEF DESCRIPTION OF THE DRAWINGS

[0017] Figure 1 This is an overall structural diagram of a chip test bench for integrated circuit chip testing according to the present utility model;

[0018] Figure 2 It is a three-dimensional connection schematic diagram of the supporting jacking mechanism in the utility model;

[0019] Figure 3 For this utility model Figure 2 A partial enlarged view of the middle A;

[0020] Figure 4 It is a schematic diagram of the three-dimensional structure of the rear side of the fixing box in the utility model;

[0021] Figure 5 It is a schematic diagram of the three-dimensional connection between the slide bar and the second limit block in the utility model;

[0022] Figure 6 It is a schematic diagram of the three-dimensional connection between the hollow support plate and the limit strip in the utility model;

[0023] Figure 7 It is a schematic diagram of the three-dimensional connection between the top block and the protective pad in the utility model.

[0024] In the figure, 1. test bench; 2. top block; 3. hollow support plate; 4. integrated circuit chip test probe; 5. limit bar; 6. fixing box; 7. connecting pipe; 8. support lifting mechanism; 801. support ring; 802. notch; 803. lifting port; 9. pull ring; 10. through groove; 11. fan; 12. slide bar; 13. display screen; 14. second limit block; 15. first limit block; 16. slide groove; 17. protective pad. DETAILED DESCRIPTION

[0025] In order to make the purpose, technical solution and advantages of the utility model more clear, the utility model is further described in detail below in conjunction with the accompanying drawings and embodiments. It should be understood that the specific embodiments described here are only used to explain the utility model and are not used to limit the utility model.

[0026] In the description of the present invention, it should be understood that the terms "length", "width", "up", "down", "front", "back", "left", "right", "vertical", "horizontal", "top", "bottom", "inside", "outside" and the like indicate positions or positional relationships based on the positions or positional relationships shown in the accompanying drawings, and are only for the convenience of describing the present invention and simplifying the description, rather than indicating or implying that the device or element referred to must have a specific orientation, be constructed and operated in a specific orientation, and therefore cannot be understood as a limitation on the present invention. In addition, in the description of the present invention, "multiple" means two or more, unless otherwise clearly and specifically defined.

[0027] See also Figure 1-7 The utility model provides a technical solution: a chip test bench based on integrated circuit chip testing, comprising a test bench 1, an integrated circuit chip test probe 4 and a display screen 13, a hollow support plate 3 is arranged on the top of the test bench 1, a top block 2 is fixedly connected to the top of the test bench 1, and a supporting lifting mechanism 8 is arranged on the top of the hollow support plate 3;

[0028] The supporting lifting mechanism 8 includes two supporting rings 801 , a plurality of notches 802 and a lifting port 803 . The bottom of the supporting ring 801 is fixedly connected to the top of the hollow support plate 3 . The notches 802 are opened inside the supporting ring 801 , and the lifting port 803 is opened inside the hollow support plate 3 .

[0029] In this embodiment: by moving the hollow support plate 3 forward, and then placing the integrated circuit chip to be tested obliquely on the top of the protective pad 17, and then moving the hollow support plate 3 backward, the integrated circuit chip slides down from the inclined surface of the triangular top block 2 to the top of the support ring 801, and the support ring 801 can horizontally support the integrated circuit chip, and then the integrated circuit chip can be stably moved to the bottom of the integrated circuit chip test probe 4, and then the fan 11 is controlled to work to generate suction to adsorb and limit the integrated circuit chip, and the integrated circuit chip can be tested using the integrated circuit chip test probe 4. After the integrated circuit chip test is completed, Turn off the fan 11 and pull the hollow support plate 3 forward so that the triangular top block 2 can lift the integrated circuit chip from the top of the hollow support plate 3, so that the integrated circuit chip can be easily removed, avoiding the problem that after most of the existing integrated circuit chip testing equipment is used to test the integrated circuit chip, it is inconvenient to remove the flatly placed integrated circuit chip, and in the process of placing the integrated circuit chip at the bottom of the integrated circuit chip test probe 4 for testing, it is easy to cause the integrated circuit chip and the integrated circuit chip test probe 4 to be accidentally scratched, which is easy to cause the integrated circuit chip and the integrated circuit chip test probe 4 to be damaged, causing economic losses.

[0030] As a technical optimization solution of the present invention, a protective pad 17 is fixedly connected to the top of the top block 2, and the shape of the top block 2 is a triangle.

[0031] In this embodiment, by fixing and connecting the protection pad 17 on the top of the triangular top block 2, the protection pad 17 can protect the integrated circuit chip, thereby achieving the effect of protecting the integrated circuit chip.

[0032] As a technical optimization solution of the utility model, through grooves 10 are provided on both sides of the top of the hollow support plate 3 , and the rear side of the top of the hollow support plate 3 is fixedly connected to the limiting strip 5 .

[0033] In this embodiment: by controlling the operation of the fan 11, the fan 11 can generate suction force to pass the air through the gap 802 from the inside of the support ring 801 into the through groove 10 and suck it into the hollow support plate 3. At this time, a negative pressure will be formed inside the support ring 801 to generate adsorption force, which can adsorb and limit the integrated circuit chip. By contacting the rear side of the integrated circuit chip with the front side of the limit strip 5, the limit strip 5 can limit the integrated circuit chip to prevent the integrated circuit chip from moving backward excessively, thereby achieving the effect of adsorbing the integrated circuit chip and preventing the integrated circuit chip from moving backward excessively.

[0034] As a technical optimization solution of the utility model, a connecting pipe 7 is fixedly connected to the rear side of the hollow support plate 3 , and a fixing box 6 is fixedly connected to the rear side of the connecting pipe 7 .

[0035] In this embodiment, the fixing box 6 and the hollow support plate 3 are connected via the connecting pipe 7 , so that the fan 11 can suck the air inside the hollow support plate 3 , thereby achieving the effect of connecting the fixing box 6 and the hollow support plate 3 .

[0036] As a technical optimization solution of the present invention, fans 11 are provided on both sides of the rear side of the fixing box 6 , and the fans 11 are embedded in the fixing box 6 .

[0037] In this embodiment, by controlling the fan 11 to work, the fan 11 can generate suction, that is, suction is generated at the through groove 10 , thereby achieving the effect of generating suction at the through groove 10 .

[0038] As a technical optimization solution of the utility model, slide bars 12 are fixedly connected to both sides of the top of the test bench 1, and slide grooves 16 are opened on both sides of the hollow support plate 3. The surface of the slide bar 12 is movably connected to the inner wall of the slide groove 16.

[0039] In this embodiment, the hollow support plate 3 slides inside the slide groove 16 through the slide bar 12, so that the hollow support plate 3 can be moved, achieving the effect of facilitating the movement of the hollow support plate 3.

[0040] As a technical optimization solution of the utility model, the rear sides of both sides of the hollow support plate 3 are fixedly connected with the first limit blocks 15, and the front sides of the tops of the two slide bars 12 are fixedly connected with the second limit blocks 14.

[0041] In this embodiment: by moving the hollow pallet 3 forward until the first limit block 15 contacts the second limit block 14, the second limit block 14 can limit the first limit block 15 and the hollow pallet 3 to prevent the hollow pallet 3 from detaching from the slide bar 12, thereby achieving the effect of limiting the hollow pallet 3.

[0042] As a technical optimization solution of the present invention, pull rings 9 are fixedly connected to both sides of the front side of the hollow support plate 3 .

[0043] In this embodiment, the hollow support plate 3 can be pulled forward by holding the pull ring 9, so that the hollow support plate 3 can be pulled conveniently.

[0044] Working principle: First, hold the pull ring 9 and pull the hollow pallet 3 forward. The hollow pallet 3 slides inside the slide groove 16 through the slide bar 12, so that the hollow pallet 3 can move forward. Move the hollow pallet 3 forward until the first limit block 15 contacts the second limit block 14. At this time, the second limit block 14 can limit the first limit block 15 and the hollow pallet 3 to prevent the hollow pallet 3 from separating from the slide bar 12. Then, place the integrated circuit chip to be tested on the top of the protective pad 17 at an angle so that the rear side of the integrated circuit chip is in contact with the limit bar 14. 5, and then push the hollow support plate 3 backward. At this time, the integrated circuit chip slides down from the inclined surface of the triangular top block 2 to the top of the support ring 801. At this time, the support ring 801 can support the integrated circuit chip horizontally, and then the integrated circuit chip can be stably moved to the bottom of the integrated circuit chip test probe 4. Then the fan 11 is controlled to work. The fan 11 can generate suction to pass the gap 802 from the inside of the support ring 801 into the through groove 10 and suck the air into the hollow support plate 3. At this time, the inside of the support ring 801 The inner part will form a negative pressure to generate an adsorption force, which can adsorb and limit the integrated circuit chip, and then the integrated circuit chip can be tested by controlling the integrated circuit chip test probe 4. After the integrated circuit chip test is completed, the fan 11 is turned off and the hollow support plate 3 is pulled forward. At this time, the top block 2 will be inside the top lifting port 803. At this time, the triangular top block 2 will be able to obliquely lift the integrated circuit chip on the top of the support ring 801 upward, so that the integrated circuit chip can be easily taken out, avoiding the problem that most of the existing integrated circuit chip testing equipment is used to test the integrated circuit chip, and it is inconvenient to remove the flatly placed integrated circuit chip. In the process of placing the integrated circuit chip at the bottom of the integrated circuit chip test probe 4 for testing, it is easy to cause the integrated circuit chip and the integrated circuit chip test probe 4 to accidentally scratch each other, which is easy to cause the integrated circuit chip and the integrated circuit chip test probe 4 to be damaged, causing economic losses. It should be noted that the equipment and probes for testing the integrated circuit chip are both published mature technologies and will not be elaborated here.

[0045] The above are only preferred embodiments of the present invention and are not intended to limit the present invention. Any modifications, equivalent substitutions and improvements made within the spirit and principles of the present invention should be included in the protection scope of the present invention.

Claims

1. A chip test bench for testing integrated circuit chips, comprising a test bench (1), an integrated circuit chip test probe (4) and a display screen (13), characterized in that: A hollow supporting plate (3) is provided on the top of the test bench (1), a top block (2) is fixedly connected to the top of the test bench (1), and a supporting jacking mechanism (8) is provided on the top of the hollow supporting plate (3); The supporting and lifting mechanism (8) comprises two supporting rings (801), a plurality of notches (802) and a lifting port (803); the bottom of the supporting ring (801) is fixedly connected to the top of the hollow supporting plate (3); the notches (802) are provided inside the supporting ring (801); and the lifting port (803) is provided inside the hollow supporting plate (3).

2. The chip test bench for integrated circuit chip testing according to claim 1, characterized in that: A protective pad (17) is fixedly connected to the top of the top block (2), and the shape of the top block (2) is triangular.

3. The chip test bench for integrated circuit chip testing according to claim 1, characterized in that: Through slots (10) are provided on both sides of the top of the hollow support plate (3), and the rear side of the top of the hollow support plate (3) is fixedly connected to a limiting strip (5).

4. The chip test bench for integrated circuit chip testing according to claim 1, characterized in that: The rear side of the hollow support plate (3) is fixedly connected to a connecting pipe (7), and the rear side of the connecting pipe (7) is fixedly connected to a fixing box (6).

5. The chip test bench for integrated circuit chip testing according to claim 4, characterized in that: Fans (11) are provided on both sides of the rear side of the fixing box (6), and the fans (11) are embedded in the interior of the fixing box (6).

6. The chip test bench for integrated circuit chip testing according to claim 1, characterized in that: Both sides of the top of the test bench (1) are fixedly connected with slide bars (12), and both sides of the hollow support plate (3) are provided with slide grooves (16), and the surface of the slide bar (12) is movably connected to the inner wall of the slide groove (16).

7. The chip test bench for integrated circuit chip testing according to claim 6, characterized in that: The rear sides of both sides of the hollow support plate (3) are fixedly connected with first limit blocks (15), and the front sides of the tops of the two slide bars (12) are fixedly connected with second limit blocks (14).

8. The chip test bench for integrated circuit chip testing according to claim 1, characterized in that: Pull rings (9) are fixedly connected to both sides of the front side of the hollow support plate (3).

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