EL test device for solar cell

Abstract

The utility model discloses an EL testing device for a solar cell, which relates to the field of cell testing, and comprises a testing support seat, a first testing piece and a second testing piece, and a testing part of the tested solar cell comprises a first to-be-tested section and a second to-be-tested section. The first test end, the second test end and a first to-be-tested section of the tested solar cell form a current loop, and the third test end, the fourth test end and a second to-be-tested section of the tested solar cell form a current loop; when the EL testing device is used for testing, the current is small and the corresponding EL is dark when a broken gate or poor local contact exists; meanwhile, due to the fact that the grid lines are designed at equal intervals, under the condition that the grid lines are in good contact, the brightness only depends on the intensity of the excitation capacity of internal electrons, and therefore the electrical defects caused by the manufacturing process can be recognized more accurately; the battery EL not only can reflect the problem of the current battery end manufacturing process, but also can select the problems of bright and dark pieces in the module EL, slight broken grid at the fish fork tail and the like.

Description

Technical Field

[0001] The utility model relates to the field of battery testing, in particular to an EL testing device for solar cells. Background Art

[0002] With the rapid development of solar power generation, the quality of components has received more and more attention. As the core working part of the component, the cell is the technical focus of related companies if it can provide higher quality cells. In terms of ensuring the quality of cells, the industry currently mainly achieves this through cell luminescence (EL) and photoluminescence (PL). PL testing is mainly used to evaluate the optical properties in solar cells. It can detect defects, impurities and non-uniformity in the material, which can affect the efficiency and long-term stability of the cell.

[0003] PL testing provides information about the internal quality of a battery by exciting the material and measuring its light-emitting properties. For example, defect states in a battery may act as recombination centers for electrons and holes, reducing the battery's lifetime. PL testing can help identify the location and density of these defects, thereby optimizing the battery's design and manufacturing process.

[0004] EL testing focuses on the electrical performance of the battery. It applies voltage to make the battery emit light, and then analyzes the light-emitting image to detect problems such as poor electrode contact, uneven current flow, and crystal defects. EL testing can reveal the actual performance of the battery under operating conditions, including current collection efficiency and overall efficiency;

[0005] However, the existing EL test devices on the market still have problems such as light and dark inside the chip, slight broken grid at the tail of the harpoon, etc. These abnormalities cannot be effectively identified at the battery EL end, but are easily found in the component EL. If these EL at the battery end cannot be effectively identified, it will cause abnormal rework at the component end. Utility Model Content

[0006] The purpose of the utility model is to design an EL testing device for solar cells in order to solve the above problems.

[0007] The utility model achieves the above-mentioned purpose through the following technical solutions:

[0008] EL test equipment for solar cells, including:

[0009] Test support seat;

[0010] A first test piece; a test portion of the tested solar cell includes a first section to be tested and a second section to be tested, a first test end of the first test piece contacts a pad point of a first end of a first side surface of the first section to be tested, a second test end of the first test piece contacts a pad point of a second end of a second side surface of the first section to be tested, and the first test end, the second test end and the first section to be tested of the tested solar cell form a current loop;

[0011] A second test piece; the third test end of the second test piece contacts the pad point of the first end of the first side of the second section to be tested, the fourth test end of the second test piece contacts the pad point of the second end of the second side of the second section to be tested, and the third test end, the fourth test end and the second section to be tested of the solar cell under test form a current loop.

[0012] The beneficial effects of the utility model are: when the EL test device is used for testing, when there is a broken grid or local poor contact, the current will be small, and the corresponding EL will be dark; at the same time, because the grid lines are designed with equal spacing, when the grid lines are in good contact, the brightness only depends on the strength of the internal electronic excitation ability, so that the electrical defects caused by the process can be more accurately identified; the battery EL can not only reflect the current battery end process problems, but also select the light and dark pieces in the component EL, the slight broken grid of the harpoon tail, and other problems, and the stability is further improved during the test process. By providing higher quality products to component customers, the cost of component customers is greatly reduced. BRIEF DESCRIPTION OF THE DRAWINGS

[0013] Figure 1 It is a structural schematic diagram of an EL testing device for solar cells of the utility model;

[0014] Figure 2 is a schematic diagram of the structure of the solar cell under test;

[0015] The corresponding figures are as follows:

[0016] 1-test support seat, 2-solar cell, 3-first test end, 4-second test end, 5-third test end, 6-fourth test end, 7-pad point, 8-conductive probe, 9-first support end, 10-second support end, 11-third support end, 12-fourth support end, 13-support probe. DETAILED DESCRIPTION

[0017] In order to make the purpose, technical scheme and advantages of the embodiments of the present invention clearer, the technical scheme in the embodiments of the present invention will be clearly and completely described below in conjunction with the drawings in the embodiments of the present invention. Obviously, the described embodiments are part of the embodiments of the present invention, not all of the embodiments. Generally, the components of the embodiments of the present invention described and shown in the drawings here can be arranged and designed in various different configurations.

[0018] Therefore, the following detailed description of the embodiments of the present invention provided in the accompanying drawings is not intended to limit the scope of the present invention to be protected, but merely represents selected embodiments of the present invention. Based on the embodiments of the present invention, all other embodiments obtained by ordinary technicians in this field without creative work are within the scope of protection of the present invention.

[0019] It should be noted that similar reference numerals and letters denote similar items in the following drawings, and therefore, once an item is defined in one drawing, further definition and explanation thereof is not required in subsequent drawings.

[0020] In the description of the present utility model, it should be understood that the terms "upper", "lower", "inside", "outside", "left", "right", etc. indicate directions or positional relationships based on the directions or positional relationships shown in the accompanying drawings, or are directions or positional relationships in which the utility model product is usually placed when in use, or are directions or positional relationships that are usually understood by those skilled in the art. These directions or positional relationships are only for the convenience of describing the present utility model and simplifying the description, and do not indicate or imply that the device or component referred to must have a specific direction, be constructed and operated in a specific direction, and therefore should not be understood as a limitation on the present utility model.

[0021] Furthermore, the terms “first”, “second”, etc. are merely used for distinguishing descriptions and are not to be understood as indicating or implying relative importance.

[0022] In the description of the present invention, it is also necessary to explain that, unless otherwise clearly specified and limited, the terms such as "setting" and "connection" should be understood in a broad sense. For example, "connection" can be a fixed connection, a detachable connection, or an integral connection; it can be a mechanical connection or an electrical connection; it can be a direct connection, or an indirect connection through an intermediate medium, or it can be the internal communication of two components. For ordinary technicians in this field, the specific meanings of the above terms in the present invention can be understood according to specific circumstances.

[0023] The specific implementation of the utility model is described in detail below in conjunction with the accompanying drawings.

[0024] like Figure 1 , Figure 2 As shown, the EL testing device for solar cell 2 includes:

[0025] Test support seat 1;

[0026] A first test piece; the test portion of the tested solar cell 2 includes a first section to be tested and a second section to be tested, a first test end 3 of the first test piece contacts a pad point 7 of a first end of a first side surface of the first section to be tested, and a second test end 4 of the first test piece contacts a pad point 7 of a second end of a second side surface of the first section to be tested, the first test end 3, the second test end 4 and the first section to be tested of the tested solar cell 2 form a current loop, the tested solar cell 2 has N rows of pad points 7, the first section to be tested is the 1st row to the mth row, the second section to be tested is the m+1th row to the Nth row, N is a positive integer, m is a positive integer greater than 1 and less than N, and N=12 and m=6 in this embodiment;

[0027] The second test piece; the third test end 5 of the second test piece contacts the pad point 7 at the first end of the first side surface of the second section to be tested, the fourth test end 6 of the second test piece contacts the pad point 7 at the second end of the second side surface of the second section to be tested, the third test end 5, the fourth test end 6 and the second section to be tested of the solar cell 2 to be tested form a current loop, and the first test piece and the second test piece are mounted on the test support 1.

[0028] The number of the conductive probes 8 on the first test terminal 3 , the second test terminal 4 , the third test terminal 5 and the fourth test terminal 6 is the same as the number of the main grid lines of the solar cell 2 to be tested.

[0029] The EL testing device also includes a supporting member, which includes a first supporting end 9, a second supporting end 10, a third supporting end 11 and a fourth supporting end 12. The first supporting end 9 and the first test end 3 are respectively located at the first side surface of the first section to be tested and the first end of the second surface. The second supporting end 10 and the second test end 4 are respectively located at the first side surface of the first section to be tested and the second end of the second surface. The third supporting end 11 and the third test end 5 are respectively located at the first side surface of the second section to be tested and the first end of the second surface. The fourth supporting end 12 and the fourth test end 6 are respectively located at the first side surface of the second section to be tested and the second end of the second surface.

[0030] The number of the support probes 13 on the first support end 9 , the second support end 10 , the third support end 11 and the fourth support end 12 is the same as the number of the main grids of the solar cell 2 to be tested, and the support probes 13 are made of non-conductive material.

[0031] The support probe 13 is made of rubber material, and the rubber support probe 13 is used as a support for the other side of the conductive probe 8. When the force between the conductive probe 8 and the solar cell 2 under test is large, since the other side is made of rubber material and has elasticity, the cell can undergo slight elastic deformation, thereby avoiding excessive force between the cell and the conductive probe 8, which may cause damage to the contact point of the cell or the conductive probe 8.

[0032] The working principle of the EL testing device for solar cell 2 of the utility model is as follows:

[0033] During the test, the conductive probe 8 is pressed on the pad point 7, and the position of the probe row corresponds to Figure 2 At the positions of the 1st, 6th, 7th and 12th rows of pad points 7, the conductive probes 8 are metal conductive probes 8, which play a role in current transmission; the current passing above the positions of the 1st and 12th rows of pad points 7 above respectively forms a current loop with the positions of the 6th and 7th rows of pad points 7 below.

[0034] The supporting probe 13 of the supporting member is only used for balancing the process and does not participate in the conduction work of any circuit.

[0035] During the actual test process, the magnitude of the input current can be adjusted as needed.

[0036] During the test, when there is a broken gate or partial poor contact, the current will be too small and the corresponding EL will be too dark. At the same time, because the gate lines are designed with equal spacing, when the gate lines are in good contact, the brightness only depends on the strength of the internal electron excitation ability, so that the electrical defects caused by the process can be more accurately identified;

[0037] The method effectively avoids the problem that when the prior art performs EL testing, the brightness will be higher than the normal level due to the large current on both sides of the main grid, and some defects cannot be identified; and solves the problem that the probes of the prior test device are pressed on the main grid line of the battery cell, and the upper and lower probes form a loop. As the main grid becomes thinner and thinner, the probes may press on the silicon nitride film in the actual process, causing inconsistency in the local excitation current, thereby avoiding deviations caused by abnormal identification.

[0038] The technical solution of the present utility model is not limited to the above-mentioned specific embodiments, and all technical variations made according to the technical solution of the present utility model fall within the protection scope of the present utility model.

Claims

1. An EL testing device for solar cells, characterized in that: include: Test support seat; The first test piece; The test section of the solar cell to be tested comprises a first section to be tested and a second section to be tested, a first test end of the first test piece contacts a pad point of a first end of a first side surface of the first section to be tested, a second test end of the first test piece contacts a pad point of a second end of a second side surface of the first section to be tested, and the first test end, the second test end and the first section to be tested of the solar cell to be tested form a current loop; A second test piece; The third test end of the second test piece contacts the pad point of the first end of the first side of the second section to be tested, and the fourth test end of the second test piece contacts the pad point of the second end of the second side of the second section to be tested. The third test end, the fourth test end and the second section to be tested of the solar cell under test form a current loop.

2. The EL testing device for solar cells according to claim 1, characterized in that: The number of the conductive probes on the first test end, the second test end, the third test end and the fourth test end is the same as the number of the main grid lines of the solar cell to be tested.

3. The EL testing device for solar cells according to claim 1, characterized in that: The EL testing device also includes a supporting member, which includes a first supporting end, a second supporting end, a third supporting end and a fourth supporting end, the first supporting end and the first test end are respectively located at the first side surface of the first section to be tested and the first end of the second surface, the second supporting end and the second test end are respectively located at the first side surface of the first section to be tested and the second end of the second surface, the third supporting end and the third test end are respectively located at the first side surface of the second section to be tested and the first end of the second surface, and the fourth supporting end and the fourth test end are respectively located at the first side surface of the second section to be tested and the second end of the second surface.

4. The EL testing device for solar cells according to claim 3, characterized in that: The number of the supporting probes on the first supporting end, the second supporting end, the third supporting end and the fourth supporting end is the same as the number of the main grids of the solar cell to be tested, and the supporting probes are made of non-conductive material.

5. The EL testing device for solar cells according to claim 4, characterized in that: The support probe is made of rubber.

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