SSD full-automatic test system and SSD production line

Abstract

The utility model provides an SSD full-automatic test system and an SSD production line, and relates to the technical field of hard disks. The SSD full-automatic test system comprises a test mechanism, a feeding mechanism, a discharging mechanism, a first clamping mechanism, a shape detection mechanism, a card mounting mechanism and a stacking mechanism. The test mechanism can detect performance parameters of SSD cards. The feeding mechanism can convey SSD cards. The discharging mechanism is used for receiving and sorting SSD cards. The first clamping mechanism can clamp the SSD card conveyed by the feeding mechanism to a detection position; the appearance detection mechanism can obtain appearance parameters of the SSD card; the clamping mechanism can bear and convey a test carrier; the first clamping mechanism can insert the SSD card detected by the appearance detection mechanism into the test carrier; the stacking mechanism can receive the test carriers conveyed by the clamping mechanism and convey the test carriers to the test mechanism. The device can replace manual work to complete feeding and discharging, manual participation is not needed, and the production efficiency is effectively improved.

Description

Technical Field

[0001] The utility model relates to the technical field of hard disks, and in particular to an SSD fully automated testing system and an SSD production line. Background Art

[0002] Before SSDs leave the factory, manufacturers need to simulate a normal temperature environment and provide a stable voltage to perform read and write tests on the SSDs. By testing the SSDs in this high temperature environment and stable voltage, products with hidden dangers and instability can be screened out, thereby ensuring that the performance and parameters of the products leaving the factory meet industry usage requirements.

[0003] At present, the market mostly manually inserts SSD cards into test carriers, and then manually loads the test carriers with SSD cards into the card opening cabinet, RDT test cabinet, and BIT test cabinet for testing. The entire test process requires manual handling of test carriers multiple times and inserting the gold fingers of the test carriers into the connectors in the test cavity of the cabinet. This method makes the entire test process time-consuming and labor-intensive, and has low production efficiency. Utility Model Content

[0004] In view of this, the purpose of the utility model is to overcome the deficiencies in the prior art and provide a fully automated SSD testing system that can replace manual loading and unloading without manual participation, thereby effectively improving production efficiency;

[0005] In addition, an SSD production line using the above-mentioned SSD fully automated testing system is provided.

[0006] The utility model provides the following technical solutions:

[0007] According to a first aspect of the present utility model, a fully automated SSD testing system is provided, the fully automated SSD testing system comprising:

[0008] A testing mechanism, wherein a plurality of the testing mechanisms are arranged in sequence along a first direction and form a testing channel, and the testing mechanism can detect performance parameters of the SSD card;

[0009] A feeding mechanism, wherein the feeding mechanism is capable of conveying the SSD card;

[0010] A first clamping mechanism, wherein the first clamping mechanism can clamp the SSD card conveyed by the feeding mechanism to a detection position;

[0011] An appearance detection mechanism, wherein the appearance detection mechanism is capable of acquiring appearance parameters of the SSD card located at the detection position;

[0012] A card loading mechanism, the card loading mechanism can carry and transport the test carrier at the card insertion position to the transfer position; wherein the first clamping mechanism can insert the SSD card detected by the appearance detection mechanism into the test carrier at the card insertion position;

[0013] A stacking mechanism, the stacking mechanism being capable of receiving the test carrier transported to the intermediate transfer position by the clamping mechanism and transporting the test carrier to the testing mechanism;

[0014] A material unloading mechanism, which can receive the test carrier conveyed by the stacking mechanism and sort the SSD card on the test carrier.

[0015] Further, the feeding mechanism comprises:

[0016] A movable loading platform, wherein the movable loading platform has a multi-layer accommodating cavity, wherein the accommodating cavity is used to place a material tray loaded with the SSD card, and the movable loading platform can be moved to a loading position;

[0017] The first clamping member can clamp the material tray on the movable loading platform located at the upper material position to the material extraction position; wherein the first clamping mechanism can clamp and move the SSD card on the material tray located at the material extraction position.

[0018] Further, the feeding mechanism comprises:

[0019] A sorting platform, the sorting platform having a material unloading position and a plurality of sorting positions, the plurality of sorting positions are respectively used to receive the SSD cards of different quality grades, and the material unloading position is used to receive the test carrier transported by the stacking mechanism;

[0020] The second clamping member can clamp the SSD card in the test carrier located at the unloading position to the sorting position corresponding to the quality grade.

[0021] Further, the testing mechanism comprises:

[0022] A plurality of test cabinets, each of which has a plurality of test cavities, each of which is provided with a connector that can be plugged into the test carrier;

[0023] A plurality of testing mechanisms are arranged in sequence along a testing channel, the testing channel is provided with a material transfer position, and each of the testing cabinets has a corresponding material transfer position; the stacking mechanism includes:

[0024] A movable vehicle body, wherein the movable vehicle body is movable along the test channel;

[0025] a third clamping member, the third clamping member being capable of clamping the test carrier;

[0026] A driving member, wherein the third clamping member is connected to the movable vehicle body through the driving member, and the driving member can drive the third clamping member located at the material transfer position to enter and exit the corresponding test cavity to plug and unplug the test carrier.

[0027] Further, the third clamping member includes a support arm and a clamping portion, the support arm has a slot capable of accommodating the test carrier, the clamping portion is installed on the support arm, and the clamping portion can drive the test carrier located in the slot to approach the side wall of the slot;

[0028] The driving member includes a mechanical arm, an execution end of the mechanical arm is connected to the supporting arm, and the mechanical arm can drive the supporting arm to move along a set path so as to enable the test carrier part to enter and exit the card slot.

[0029] Furthermore, the blanking mechanism further comprises:

[0030] A first conveying member, wherein the first conveying member is used to receive the test carrier conveyed by the stacking mechanism and convey it to the unloading position and the card insertion position in sequence.

[0031] Furthermore, the first conveying member comprises:

[0032] A first conveyor belt is provided, wherein the first conveyor belt is extended from the material unloading position to the card insertion position.

[0033] Further, the appearance detection mechanism includes:

[0034] A first camera, wherein the first camera is used to obtain the appearance of the SSD card;

[0035] The second camera is used to obtain the posture of the gold finger of the SSD card.

[0036] Furthermore, the first camera comprises:

[0037] A first camera, wherein the first camera is located on a side of the SSD card;

[0038] a first driving unit, the first driving unit is connected to the first camera, and the first driving unit is used to drive the first camera to rotate around the SSD card located at the detection position;

[0039] And / or, the second imaging device includes a second camera, and the second camera is located below the SSD card.

[0040] Further, the card loading mechanism comprises:

[0041] The second conveying member is used to receive the test carrier conveyed to the card insertion position by the first conveying member, and can convey the test carrier to the transfer position.

[0042] Furthermore, the second conveying member comprises:

[0043] Limiting chute;

[0044] A second driving unit, wherein the second driving unit is used to push the test carrier to move along the limiting sliding groove.

[0045] According to a second aspect of the present utility model, there is provided an SSD production line, wherein the SSD production line comprises any one of the SSD fully-automatic testing systems described above.

[0046] The embodiments of the present utility model have the following advantages:

[0047] The fully automated SSD testing system provided by the utility model continuously delivers SSD cards through the feeding mechanism, and uses the first clamping mechanism to clamp the SSD card to the detection position, detects the shape of the SSD card through the shape detection mechanism, and identifies the direction of the gold finger of the SSD card, and then controls the first clamping mechanism to insert the SSD card into the test carrier on the card loading mechanism according to the direction of the gold finger of the SSD card, and after the test carrier is full of SSD cards, the test carrier is delivered to the stacking mechanism by the card loading mechanism, and the test carrier is delivered to the test mechanism through the stacking mechanism, so as to connect the test carrier through the test mechanism for testing; and after the test mechanism is tested, the stacking mechanism takes out the test carrier and delivers it to the unloading mechanism, and finally the SSD card is pulled out through the unloading mechanism and sorted according to the test quality. The entire testing process is unmanned, and can replace manual loading and unloading, without manual participation, and effectively improve production efficiency.

[0048] In addition, the utility model also relates to an SSD production line. Since the above-mentioned SSD fully-automatic testing system has the above-mentioned technical effects, the SSD production line including the SSD fully-automatic testing system should have the same technical effects, which will not be repeated here.

[0049] In order to make the above-mentioned objects, features and advantages of the present invention more obvious and understandable, preferred embodiments are given below and described in detail with reference to the accompanying drawings. BRIEF DESCRIPTION OF THE DRAWINGS

[0050] In order to more clearly illustrate the technical solutions of the embodiments of the utility model, the drawings required for use in the embodiments will be briefly introduced below. It should be understood that the following drawings only show certain embodiments of the utility model and therefore should not be regarded as limiting the scope. For ordinary technicians in this field, other relevant drawings can be obtained based on these drawings without paying creative work.

[0051] Figure 1 The structure diagram of the fully automated SSD testing system provided by the embodiment of the utility model is shown;

[0052] Figure 2 A schematic structural diagram of a movable loading platform provided in an embodiment of the utility model is shown;

[0053] Figure 3 The schematic diagram of the structure of the loading position provided by the embodiment of the utility model is shown;

[0054] Figure 4 A schematic diagram of the structure of a test cabinet provided by an embodiment of the utility model is shown;

[0055] Figure 5 A schematic diagram of the structure of the appearance detection mechanism provided by an embodiment of the utility model is shown;

[0056] Figure 6 The structure diagram of the feeding mechanism provided by the embodiment of the utility model is shown;

[0057] Figure 7 A structural schematic diagram showing a perspective view of the interior of a feeding mechanism provided by an embodiment of the utility model;

[0058] Figure 8 A structural schematic diagram showing another perspective of the interior of the feeding mechanism provided by an embodiment of the utility model;

[0059] Fig. 9 The structure diagram of the feeding mechanism provided by the embodiment of the utility model is shown;

[0060] Fig.10 A structural schematic diagram showing a perspective view of the interior of a material discharging mechanism provided by an embodiment of the utility model;

[0061] Fig.11 A structural schematic diagram showing another perspective of the interior of the feeding mechanism provided by an embodiment of the utility model;

[0062] Fig.12 A structural schematic diagram showing a stacking mechanism provided by an embodiment of the utility model from one perspective;

[0063] Fig.13A structural schematic diagram showing another perspective of the stacking mechanism provided by an embodiment of the utility model;

[0064] Fig.14 A structural schematic diagram showing another perspective of the stacking mechanism provided by an embodiment of the utility model;

[0065] Fig.15 A structural schematic diagram from one perspective of a third clamping member in a stacking mechanism provided in an embodiment of the utility model is shown.

[0066] Description of main component symbols:

[0067] 100-feeding mechanism; 200-feeding mechanism; 300-test channel; 400-test cabinet; 410-test chamber; 500-stacking mechanism; 510-first horizontal linear module; 520-movable vehicle body; 530-third clamping member; 531-clamping part; 532-supporting arm; 533-slot; 540-first lifting linear module; 550-horizontal rotating module; 600-movable loading platform; 610-capacitor Nanocavity; 700-tray; 800-test carrier; 900-SSD card; 1000-loading position; 1100-second clamping piece; 1200-first camera; 1300-first driving unit; 1400-second camera; 1500-detection position; 1600-first clamping mechanism; 1700-unloading position; 1800-sorting position; 1900-card insertion position; 2000-limiting slide; 2100-first conveyor belt. DETAILED DESCRIPTION

[0068] The embodiments of the present invention are described in detail below, and examples of the embodiments are shown in the accompanying drawings, wherein the same or similar reference numerals throughout represent the same or similar elements or elements having the same or similar functions. The embodiments described below with reference to the accompanying drawings are exemplary and are only used to explain the present invention, and cannot be understood as limiting the present invention.

[0069] It should be noted that when an element is referred to as being "fixed to" another element, it may be directly on the other element or there may be a central element. When an element is considered to be "connected to" another element, it may be directly connected to the other element or there may be a central element at the same time. In contrast, when an element is referred to as being "directly on" another element, there is no intermediate element. The terms "vertical", "horizontal", "left", "right" and similar expressions used herein are for illustrative purposes only.

[0070] In the present invention, unless otherwise clearly specified and limited, the terms "install", "connect", "connect", "fix" and the like should be understood in a broad sense, for example, it can be a fixed connection, a detachable connection, or an integral connection; it can be a mechanical connection or an electrical connection; it can be a direct connection or an indirect connection through an intermediate medium, it can be the internal connection of two elements or the interaction relationship between two elements. For ordinary technicians in this field, the specific meanings of the above terms in the present invention can be understood according to specific circumstances.

[0071] In addition, the terms "first" and "second" are used for descriptive purposes only and should not be understood as indicating or implying relative importance or implicitly indicating the number of the indicated technical features. Therefore, the features defined as "first" and "second" may explicitly or implicitly include one or more of the features. In the description of the present utility model, the meaning of "plurality" is two or more, unless otherwise clearly and specifically defined.

[0072] Unless otherwise defined, all technical and scientific terms used herein have the same meaning as those commonly understood by those skilled in the art to which this application belongs. The terms used in the specification of the template herein are only for the purpose of describing specific embodiments and are not intended to limit the present invention. The term "and / or" used herein includes any and all combinations of one or more of the related listed items.

[0073] In the related art, SSD card 900 generally refers to a solid state drive, a solid state drive (Solid State Disk or Solid State Drive, referred to as SSD), commonly known as a solid state drive, a solid state drive is a hard disk made of a solid-state electronic storage SSD card 900 array, and the SSD card 900 is composed of a control unit and a storage unit (FLASH chip, DRAM chip). Before the solid state drive leaves the factory, the manufacturer needs to simulate a normal temperature environment and provide a stable voltage to perform read and write tests on the SSD. The SSD solid state drive is tested in this high temperature environment and stable voltage to screen out products with hidden dangers and instability, thereby ensuring that the performance and parameters of the products shipped meet the industry requirements.

[0074] In the market, the SSD card 900 is mostly inserted into the test carrier 800 manually, and then the test carrier 800 with the SSD card 900 inserted is manually loaded into the card opening cabinet, RDT test cabinet 400, and BIT test cabinet 400 for testing. Since each cabinet is provided with a multi-layer test cavity 410, it is necessary to manually carry the test carrier 800 and align the gold finger of the test carrier 800 with the connector in the test cavity 410 in the cabinet to ensure that the test carrier 800 can be connected to the connector. This manual docking method makes the entire testing process time-consuming and labor-intensive, affecting production efficiency.

[0075] Among them, the RDT test (Reliability Demonstration Test) verifies the mean time between failures (MTBF) of the product through a large sample in product testing. It is also close to the actual usage scenario, ensuring that the product does not have large-scale software and hardware abnormalities during mass production. The RDT test refers to the JEDEC standard: JESD218: Solid-State Drive (SSD) Requirements and Endurance Test Method, which defines the usage conditions and corresponding endurance (lifespan) verification requirements for consumer-grade and enterprise-grade SSDs.

[0076] JESD219: Solid State Drive (SSD) Endurance Workloads. This standard defines the workloads for SSD endurance testing. Enterprise-class SSD workloads are used in conjunction with the operating conditions defined in JESD218;

[0077] JESD 22-A108: Temperature, Bias, and Operating Life, defines the high temperature operating life (HTOL) test to determine the reliability of devices operating under high temperature conditions for a long time;

[0078] RDT testing uses a mixed IO load of sequential and random reads and writes (this work is complex and is close to real user scenarios through big data capture and analysis), and through theoretical deduction, it is concluded that the TBW acceleration factor corresponds to the amount of data written each day. The test is carried out continuously with power off every day, and some key projects are strictly monitored.

[0079] BIT test (Built-in Test), built-in test (BIT) is a self-diagnostic function embedded in the system or device to detect and report internal faults or abnormal conditions. BIT test mainly tests the power consumption / performance compliance test of SSD products, full disk read and write of each IO, power bias test, power management test, etc.

[0080] The BIB vehicle (BURN IN BOARD, aging test vehicle) is a process that applies external stimuli such as temperature and voltage to solid-state drive (SSD) products in order to detect early failure of products in advance.

[0081] As shown in Figures 1, 2 and Figure 3 As shown, in order to solve the above technical problems, according to the first aspect disclosed by the utility model, a fully automated SSD testing system is provided, the SSD fully automated testing system comprises a plurality of testing mechanisms, a feeding mechanism 200, a first clamping mechanism 1600, an appearance detection mechanism, a card loading mechanism, a stacking mechanism 500 and a feeding mechanism 100, the plurality of testing mechanisms are sequentially arranged along a first direction and form a testing channel 300, the testing mechanisms are capable of detecting performance parameters of an SSD card 900; the feeding mechanism 200 is capable of conveying the SSD card 900; the first clamping mechanism 1600 is capable of clamping the SSD card 900 conveyed by the feeding mechanism 200 to the detection position 1500. ; The appearance detection mechanism can obtain the appearance parameters of the SSD card 900 located at the detection position 1500; the card loading mechanism can transport the test carrier 800 located at the card insertion position 1900 to the transfer position; wherein, the first clamping mechanism 1600 can insert the SSD card 900 detected by the appearance detection mechanism into the test carrier 800 located at the card insertion position 1900; the stacking mechanism 500 can receive the test carrier 800 transported to the transfer position by the card loading mechanism, and transport the test carrier 800 to the testing mechanism; the unloading mechanism 100 can receive the test carrier 800 transported by the stacking mechanism 500, and sort the SSD card 900 on the test carrier 800.

[0082] The fully automated SSD testing system provided by the present invention continuously delivers the SSD card 900 through the feeding mechanism 200, and clamps the SSD card 900 to the testing position 1500 through the first clamping mechanism 1600. The appearance of the SSD card 900 is detected by the appearance detection mechanism, and the orientation of the gold finger of the SSD card 900 is identified, and then the first clamping mechanism 1600 is controlled according to the orientation of the gold finger of the SSD card 900 to insert the SSD card 900 into the test carrier 8 on the card loading mechanism. 00, and after the test carrier 800 is filled with SSD cards 900, the test carrier 800 is transported to the stacking mechanism 500 by the card loading mechanism, and the test carrier 800 is transported to the testing mechanism by the stacking mechanism 500, so as to connect the test carrier 800 to the testing mechanism for testing; and after the test mechanism is finished, the stacking mechanism 500 takes out the test carrier 800 and transports it to the unloading mechanism 100, and finally the SSD card 900 is pulled out by the unloading mechanism 100 and sorted according to the test quality. The entire testing process is unmanned, which can replace manual loading and unloading, without manual participation, and effectively improves production efficiency.

[0083] Compared with the method of relying on operators to manually carry SSD products to complete the whole process of testing, the number of operators on a single production line has been reduced from 15 to 1, the consistency of SSD product test results has become more stable, the production test cost has been reduced by 80%, and the site area has been reduced by 53%. At the same time, the MES intelligent system with real-time data transmission and monitoring automatically binds IDs, records and monitors yield failure information, and warns maintenance in advance, reducing sudden failures and line stoppage rates.

[0084] Based on the above embodiments, the testing organization can implement full-process testing and single-plugging of the full-process testing flow, thereby reducing the risk of surface scratches on the gold finger plating of the SSD product due to multiple plugging with the connector.

[0085] like Figure 6 , Figure 7 and Figure 8 As shown, based on the above-mentioned embodiment, the loading mechanism 200 includes a movable loading platform 600 and a first clamping member, the movable loading platform 600 has a multi-layer accommodating cavity 610, the accommodating cavity 610 is used to place the material tray 700 loaded with the SSD card 900, and the movable loading platform 600 can be moved to the loading position 1000; the first clamping member can clamp the material tray 700 on the movable loading platform 600 located at the loading position 1000 to the material removal position; wherein, the first clamping mechanism 1600 can clamp the SSD card 900 on the material tray 700 located at the material removal position.

[0086] That is, each accommodating cavity 610 of the movable loading platform 600 can hold a material tray 700, thereby realizing one-time transport of multiple SSD cards 900, thereby improving production efficiency. In addition, the first clamping member can clamp the material tray 700 to the loading position 1000, and then the SSD card 900 in the material tray 700 located at the loading position 1000 can be clamped to the shape detection mechanism through the first clamping mechanism 1600.

[0087] like Fig. 9 , Fig.10 and Fig.11 As shown, based on the above embodiment, the unloading mechanism 100 includes a sorting table and a second clamping member 1100, the sorting table has a unloading position 1700 and a plurality of sorting positions 1800, the plurality of sorting positions 1800 are respectively used to receive the SSD cards 900 of different quality grades, the unloading position 1700 is used to receive the test carrier 800 transported by the stacking mechanism 500; the second clamping member 1100 can clamp the SSD card 900 in the test carrier 800 to the sorting position 1800 of the corresponding quality grade.

[0088] That is, the unloading position 1700 is used to receive the test carrier 800 after the test is completed, and the SSD card 900 on the test carrier 800 is pulled out through the second clamping member 1100, and the SSD card 900 is placed in the sorting position 1800 of the corresponding quality level according to the detection result.

[0089] For example, each sorting position 1800 is equipped with a silo, and an empty tray 700 is placed in the silo. The SSD card 900 can then be clamped into the tray 700 through the second clamping member 1100 to facilitate subsequent transportation.

[0090] On the basis of the above embodiment, the test mechanism includes a plurality of test cabinets 400 , each of which has a plurality of test chambers 410 , each of which can store a test carrier 800 , and each of which forms a test station;

[0091] Each test station is provided with a connector, and the connector is used to connect the gold finger of the test carrier 800. Obviously, by setting a plurality of test stations in the test cabinet 400, batch testing of SSD cards 900 can be achieved to improve production efficiency. Exemplarily, the second clamping member 1100 includes a six-axis manipulator, and the execution end of the six-axis manipulator is an electric gripper.

[0092] like Figure 1 and Figure 4 As shown, based on the above embodiment, the test mechanism includes a plurality of test cabinets 400, each test cabinet 400 has a plurality of test cavities 410, and a connector capable of being plugged into a test carrier 800 is disposed in the test cavity 410;

[0093] A plurality of testing mechanisms are arranged in sequence along the testing channel 300 , the testing channel 300 is provided with a plurality of material transfer positions, and each testing cabinet 400 corresponds to a material transfer position, that is, the material transfer positions correspond to the testing cabinets 400 one by one;

[0094] Alternatively, if Fig.12 , Fig.13 , Fig.14 and Fig.15 As shown, the stacking mechanism 500 includes:

[0095] The movable vehicle body 520 can be moved along the test channel 300, and can then pass through each material transfer position in sequence; illustratively, the test channel 300 extends in a straight line, which can effectively save floor space.

[0096] The third clamping member 530 can clamp the test carrier 800 . In other words, the third clamping member 530 can clamp or release the test carrier 800 .

[0097] The driving member, the third clamping member 530 is connected to the movable body 520 through the driving member, and the driving member can drive the third clamping member 530 located at the transfer position to enter and exit the corresponding test cavity 410 to plug and unplug the test carrier 800. Obviously, the third clamping member 530 can move with the movable body 520 so as to be able to move to the transfer position at the target, and when the third clamping member 530 moves the transfer position, the driving member can drive the third clamping member 530 to move so that the test carrier 800 enters the test cavity 410, thereby realizing the insertion of the gold finger of the test carrier 800 into the connector, and the two are plugged and unplugged. Of course, when the test is completed, the driving member can drive the third clamping member 530 to enter the test cavity 410 to re-clamp the test carrier 800, and drive the third clamping member 530 to exit the test cavity 410, thereby unplugging the test carrier 800 from the connector.

[0098] Exemplarily, the test cavity 410 has an open end, and the connector is installed on a side wall of the test cavity 410 opposite to the open end, so that the gold finger of the test vehicle 800 can be inserted into or removed from the connector by driving the test vehicle 800 in and out of the test cavity 410 from the open end.

[0099] It should be noted that the test vehicle 800 is electrically connected to the connector via a gold finger to achieve electrical connection between the test vehicle 800 and the test cabinet 400 .

[0100] Optionally, to ensure precise docking, a guide hole may be provided on the test carrier 800, and a guide rod may be provided in the test cavity 410. The position of the test carrier 800 may be adjusted by a driving member so that the guide rod is inserted into the guide rod, and the test carrier 800 may be driven by the driving member to move along the guide rod, thereby enabling the gold finger to precisely dock with the connector.

[0101] In addition, a camera may be disposed on the third clamping member 530 to obtain the position of the test carrier 800 , thereby facilitating the driving member to adjust the position of the test carrier 800 for precise docking.

[0102] like Fig.15 As shown, based on the above embodiment, the third clamping member 530 includes a support arm 532 and a clamping portion 531, the support arm 532 has a slot 533 capable of accommodating the test carrier 800, the clamping portion 531 is installed on the support arm 532, and the clamping portion 531 can drive the test carrier 800 located in the slot 533 to approach the side wall of the slot 533;

[0103] The driving member includes a mechanical arm, the execution end of which is connected to the support arm 532 , and the mechanical arm can drive the support arm 532 to move along a set path so as to enable the test carrier 800 to partially enter and exit the card slot 533 .

[0104] For example, a slot 533 is provided at the upper end of the support arm 532, and the opening of the slot 533 faces upward, so that the bottom of the test carrier 800 can at least partially enter and exit the slot 533 by lifting the support arm 532 by a mechanical arm; it should be noted that each test cavity 410 has enough space for the support arm 532 to be inserted into the bottom of the test carrier 800 and to be able to be lifted and lowered. The slot 533 has a pair of oppositely arranged side walls, and a clamping portion 531 is provided on a side of the slot 533 away from the connection test end, so that the clamping portion 531 can be controlled to cooperate with the side wall opposite to it to clamp the test carrier 800 located in the slot 533.

[0105] Optionally, the clamping portion 531 includes an electric push rod and a pressure block, and the pressure block is connected to the support arm 532 via the electric push rod, and then the electric push rod drives the pressure block to move to clamp the test carrier 800.

[0106] The robot arm may be a six-axis robot arm. Alternatively, in other embodiments, such as Fig.13 As shown, the robot arm includes a first lifting linear module 540, a first horizontal linear module 510 and a horizontal rotation module 550; the third clamping member 530 is connected to the movable vehicle body 520 through the first horizontal linear module 510, the first lifting linear module 540 and the horizontal rotation module 550 in sequence. Among them, the first lifting linear module 540 is used to drive the third clamping member 530 to lift vertically; the first horizontal linear module 510 is used to drive the third clamping member 530 to move along a horizontal straight line; the horizontal rotation module 550 is used to drive the third clamping member 530 to rotate horizontally.

[0107] like Figure 1As shown, based on the above embodiment, a plurality of test cabinets 400 are arranged in sequence along the length direction on both sides of the test channel 300, and the test cabinets 400 on both sides of the test channel 300 can be installed or removed by the above-mentioned robotic arm.

[0108] It should be noted that the connector is set in the moving path of the gold finger of the test carrier 800, and the gold finger of the test carrier 800 clamped by the third clamping member 530 is facing the connector. The gold finger and the connector can be connected and separated by pushing the third clamping member 530 to move.

[0109] Based on the above embodiment, multiple test chambers 410 are arranged vertically, thereby reducing the floor space of the test cabinet 400 and reducing production costs. Of course, it is not limited to this embodiment, and they can also be arranged in sequence in the horizontal direction as long as there is enough space.

[0110] On the basis of the above-mentioned embodiment, the test carrier 800 is provided with guide wheels, and the guide wheels are used to abut against the side wall of the test cavity 410 .

[0111] Exemplarily, guide wheels are respectively provided at the four corners of the test vehicle 800 so that the test vehicle 800 can contact the inner wall of the test cavity 410 through the guide wheels, which can both play a guiding role and reduce the friction resistance of pushing.

[0112] like Figure 2 As shown, based on the above embodiment, the test carrier 800 is a BIB carrier, and the BIB carrier includes a main circuit board, a transfer circuit board and a fixture. The main circuit board and the transfer circuit board are connected through a connector, and a single main circuit board and 16 transfer circuit boards are combined into a single BIB carrier hardware component, and the BIB carrier hardware component is installed in the fixture.

[0113] like Fig.10 As shown, based on the above embodiment, the unloading mechanism 100 further includes a first conveying member, which is used to receive the test carrier 800 conveyed by the stacking mechanism 500 and convey it to the unloading position 1700 and the loading position 1000 in sequence.

[0114] That is to say, the tested test carrier 800 can be transferred to the first conveyor through the stacking mechanism 500, and the first conveyor receives the test carrier 800 and conveys it to the unloading position 1700. Then, the SSD card 900 on the test carrier 800 can be sorted at the unloading position 1700, and the empty test carrier 800 can be conveyed to the loading position 1000 for recycling.

[0115] On the basis of the above-mentioned embodiment, the first conveying member includes a first conveying belt 2100 , and the first conveying belt 2100 is extended from the lower material position 1700 to the upper material position 1000 .

[0116] That is, the test carrier 800 is received by the first conveyor belt 2100, and after the test carrier 800 moves to the first conveyor belt 2100, it is conveyed to the unloading position 1700 by the first conveyor belt 2100, and after sorting, the empty test carrier 800 is conveyed to the loading position 1000 by the first conveyor belt 2100 to achieve recycling. Obviously, it is not limited to the conveyor belt, and it can also be set to a roller conveyor, etc.

[0117] like Figure 5 As shown, based on the above embodiment, the appearance detection mechanism includes a first camera and a second camera, the first camera is used to obtain the appearance of the SSD card 900; the second camera is used to obtain the posture of the gold finger of the SSD card 900.

[0118] The appearance of the SSD card 900 is obtained through the first camera to perform appearance inspection to determine whether there are quality problems such as deformation and bending. The posture of the gold finger of the SSD card 900 is obtained through the first camera, and the posture of the gold finger of the SSD card 900 is adjusted through the first clamping mechanism 1600, so that the gold finger of the SSD card 900 can be inserted into the test carrier 800 to achieve communication between the two.

[0119] like Figure 5 As shown, based on the above embodiment, the first camera includes a first camera 1200 and a first driving unit 1300, and the first camera 1200 is located on the side of the SSD card 900; the first driving unit 1300 is connected to the first camera 1200, and the first driving unit 1300 is used to drive the first camera 1200 to rotate around the SSD card 900 located at the detection position 1500;

[0120] That is to say, the first driving unit 1300 drives the first camera 1200 to rotate around the SSD card 900 located at the detection position 1500 to obtain the shape of the SSD card 900; exemplarily, the first driving unit 1300 may be an electric circular track; or, the first driving unit 1300 includes a driving motor and a swing arm, the main shaft of the driving motor is connected to one end of the swing arm, and the first camera 1200 is installed at the other end of the swing arm, and then the swing arm is driven to rotate by the driving motor to drive the first camera 1200 to rotate around the SSD card 900.

[0121] like Figure 5 As shown, based on the above embodiment, the second camera element includes a second camera 1400 , and the second camera 1400 is located below the detection position 1500 .

[0122] By installing the second camera 1400 below the detection position 1500 , that is, below the SSD card 900 at the detection position 1500 , the orientation of the gold finger of the SSD card 900 can be directly obtained.

[0123] By way of example, both the first camera 1200 and the second camera 1400 are CCD cameras.

[0124] Obviously, the first camera can quickly intercept the SSD card 900 product that is severely bent due to the previous process, thereby improving the yield and production efficiency of the whole process test.

[0125] If an SSD card 900 with a defective appearance appears, the defective SSD card 900 is transported to a waste tray.

[0126] like Figure 8 As shown, based on the above embodiment, the card loading mechanism includes a second conveying member, which is used to receive the test carrier 800 conveyed to the card insertion position 1900 by the first conveying member and can convey the test carrier 800 to the transfer position.

[0127] That is to say, the support arm 532 of the stacking mechanism 500 can receive the test carrier 800 moved to the intermediate transfer position; specifically, the support arm 532 moves to the intermediate transfer position, and the test carrier 800 is transported to the intermediate transfer position through the first conveying member, so that the test carrier 800 can fall into the card slot 533.

[0128] like Figure 8 As shown, based on the above embodiment, the second conveying member includes a limiting slide groove 2000 and a second driving unit. The second driving unit is used to drive and push the test carrier 800 to move along the limiting slide groove 2000.

[0129] That is, the test carrier 800 is pushed to move by the second driving unit to transport the test carrier 800 to the intermediate transfer position. Specifically, when the test carrier 800 on the first conveyor belt 2100 is full of SSD cards 900, the second driving unit is used to push the test carrier 800 to move to the limiting slide groove 2000 and move along the limiting slide groove 2000, and finally the test carrier 800 thereon is transported to the card slot 533.

[0130] For example, the upper end surface of the support arm 532 at the intermediate position is flush with the bottom of the limiting slide groove 2000 , and the support arm 532 and the limiting slide groove 2000 are both arranged horizontally, thereby ensuring that the test carrier 800 can be pushed horizontally to move into the slot 533 .

[0131] Exemplarily, the second driving part may be an electric push rod.

[0132] On the basis of the above embodiment, the test cabinet 400 is divided into a card opening cabinet, an RDT test cabinet 400 and a BIT test cabinet 400. It should be noted that the stacking mechanism 500 can insert the test carrier 800 after the card is inserted into the card opening cabinet, and after the card is opened by the card opening cabinet, it is transferred to the RDT test cabinet 400 for testing, and after the RDT test cabinet 400 is tested, it is transferred to the card opening cabinet by the stacking mechanism 500 for secondary card opening, and then the test carrier 800 after the secondary card opening is transferred to the BIT test cabinet 400 for testing by the stacking mechanism 500, and after the BIT test cabinet 400 test is completed, it is transported to the unloading mechanism 100 by the stacking mechanism 500.

[0133] According to a second aspect of the present utility model, there is provided an SSD production line, which includes an SSD fully automated testing system.

[0134] Since the above-mentioned SSD fully-automatic testing system has the above-mentioned technical effects, the SSD production line including the SSD fully-automatic testing system should have the same technical effects, which will not be repeated here.

[0135] In all examples shown and described herein, any specific values ​​should be interpreted as merely exemplary and not as limiting, and thus other examples of the exemplary embodiments may have different values.

[0136] It should be noted that similar reference numerals and letters denote similar items in the following drawings, and therefore, once an item is defined in one drawing, further definition and explanation thereof is not required in subsequent drawings.

[0137] The above-mentioned embodiments only express several implementation methods of the present invention, and the description is relatively specific and detailed, but it cannot be understood as limiting the scope of the present invention. It should be pointed out that for ordinary technicians in this field, several modifications and improvements can be made without departing from the concept of the present invention, which all belong to the protection scope of the present invention.

Claims

1. A fully automated SSD testing system, characterized in that: The SSD fully automated testing system comprises: A testing mechanism capable of detecting performance parameters of the SSD card; A feeding mechanism, wherein the feeding mechanism is capable of conveying the SSD card; A first clamping mechanism, wherein the first clamping mechanism can clamp the SSD card conveyed by the feeding mechanism to a detection position; An appearance detection mechanism, wherein the appearance detection mechanism is capable of obtaining appearance parameters of the SSD card located at the detection position; A card loading mechanism, the card loading mechanism can carry and transport the test carrier at the card insertion position to the transfer position; wherein the first clamping mechanism can insert the SSD card detected by the appearance detection mechanism into the test carrier at the card insertion position; A stacking mechanism, the stacking mechanism being capable of receiving the test carrier transported to the intermediate transfer position by the clamping mechanism and transporting the test carrier to the testing mechanism; A material unloading mechanism, which can receive the test carrier conveyed by the stacking mechanism and sort the SSD card on the test carrier.

2. The fully automated SSD testing system according to claim 1, characterized in that: The feeding mechanism comprises: A movable loading platform, wherein the movable loading platform has a multi-layer accommodating cavity, wherein the accommodating cavity is used to place a material tray loaded with the SSD card, and the movable loading platform can be moved to a loading position; The first clamping member can clamp the material tray on the movable loading platform located at the upper material position to the material extraction position; wherein the first clamping mechanism can clamp the SSD card on the material tray located at the material extraction position.

3. The SSD fully automated testing system according to claim 2, characterized in that: The unloading mechanism comprises: A sorting platform, the sorting platform having a material unloading position and a plurality of sorting positions, the plurality of sorting positions are respectively used to receive the SSD cards of different quality grades, and the material unloading position is used to receive the test carrier transported by the stacking mechanism; The second clamping member can clamp the SSD card in the test carrier to the sorting position corresponding to the quality level.

4. The SSD fully automated testing system according to claim 3, characterized in that: The testing organization includes: A plurality of test cabinets, each of which has a plurality of test cavities, each of which is provided with a connector that can be plugged into the test carrier; A plurality of testing mechanisms are arranged in sequence along a testing channel, the testing channel is provided with a material transfer position, and each of the testing cabinets has a corresponding material transfer position; the stacking mechanism includes: A movable vehicle body, wherein the movable vehicle body is movable along the test channel; a third clamping member, the third clamping member being capable of clamping the test carrier; A driving member, wherein the third clamping member is connected to the movable vehicle body through the driving member, and the driving member can drive the third clamping member located at the material transfer position to enter and exit the corresponding test cavity to plug and unplug the test carrier.

5. The fully automated SSD testing system according to claim 4, characterized in that: The third clamping member includes a support arm and a clamping portion, wherein the support arm has a slot capable of accommodating the test carrier, and the clamping portion is mounted on the support arm, and the clamping portion can drive the test carrier located in the slot to approach a side wall of the slot; The driving member includes a mechanical arm, an execution end of the mechanical arm is connected to the supporting arm, and the mechanical arm can drive the supporting arm to move along a set path so as to enable the test carrier part to enter and exit the card slot.

6. The fully automated SSD testing system according to claim 4, characterized in that: The unloading mechanism also includes: A first conveying member, wherein the first conveying member is used to receive the test carrier conveyed by the stacking mechanism and convey it to the lower material position and the upper material position in sequence.

7. The fully automated SSD testing system according to claim 6, characterized in that: The first conveying member includes a first conveying belt, and the first conveying belt is extended from the lower material position to the upper material position.

8. The fully automated SSD testing system according to claim 1, characterized in that: The appearance detection mechanism comprises: A first camera, wherein the first camera is used to obtain the appearance of the SSD card; The second camera is used to obtain the posture of the gold finger of the SSD card.

9. The fully automated SSD testing system according to claim 8, characterized in that: The first camera comprises: A first camera, wherein the first camera is located on a side of the SSD card; a first driving unit, the first driving unit is connected to the first camera, and the first driving unit is used to drive the first camera to rotate around the SSD card located at the detection position; And / or, the second imaging device includes a second camera, and the second camera is located below the SSD card.

10. The fully automated SSD testing system according to claim 6, characterized in that: The card loading mechanism comprises: The second conveying member is used for receiving the test carrier conveyed by the first conveying member and conveying the test carrier to the intermediate transfer position.

11. The fully automated SSD testing system according to claim 10, characterized in that: The second conveying member comprises: Limiting chute; A second driving unit, wherein the second driving unit is used to push the test carrier to move along the limiting sliding groove.

12. An SSD production line, characterized in that: The SSD production line comprises the SSD fully automated testing system according to any one of claims 1 to 11.

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