Test bench for electronic information engineering

Abstract

The utility model discloses a test bed for electronic information engineering, which belongs to the technical field of teaching equipment and comprises a cabinet body, a test bed plate is arranged above the cabinet body, a height adjusting component for supporting the test bed plate and adjusting the height of the test bed plate is arranged at the top end of the cabinet body, and an anti-covering component is arranged at the top end of the test bed plate. The height position of the test bed plate is adjusted through the height adjusting assembly, so that the test bed plate can meet the requirements of users with different heights, experiment operation can be better concentrated, the experiment efficiency can be improved, the overall practicability is improved, and when the test bed is not used for a long time, the test bed is convenient to use. Components on the test bed plate can be protected through the anti-covering assembly, and dust is prevented from falling into the components, so that damage and performance reduction of the components are avoided, the service life of the components is prolonged, reliability is improved, the cleaning frequency is reduced, and the cleaning workload is reduced.

Description

Technical Field

[0001] The utility model relates to the technical field of teaching equipment, in particular to a test bench for electronic information engineering. Background Art

[0002] Electronic information engineering is a discipline that uses modern technologies such as computers to control and process electronic information. It mainly studies the acquisition and processing of information, and the design, development, application and integration of electronic equipment and information systems. The major of electronic information engineering mainly involves learning basic circuit knowledge and mastering methods of processing information using computers. When learning basic circuit knowledge, relevant electrical tests must be carried out, and thus a test bench for electronic information engineering must be used.

[0003] During the teaching process, electronic information equipment is often used for experimental learning. When the existing electronic information teaching test bench is not in use, the test bench is often exposed, and dust is easily accumulated on the components of the test bench, which can easily cause damage to the components and performance degradation, affecting the service life of the components. In addition, the height of the test bench is often fixed, which is not convenient for users of different heights to perform experimental operations, affecting the overall convenience of use.

[0004] Therefore, it is necessary to provide a test bench for electronic information engineering to solve the above technical problems. Utility Model Content

[0005] The purpose of the utility model is to provide a test bench for electronic information engineering, so as to solve the problems that dust easily accumulates on the components of the existing electronic information teaching test bench when not in use, which easily leads to damage and performance degradation of the components, affecting the service life of the components; and the height of the test bench is often fixed, which is not convenient for users of different heights to perform test operations, affecting the overall convenience of use.

[0006] To achieve the above-mentioned purpose, the utility model solves the above-mentioned technical problems as follows: a test bench for electronic information engineering, including a cabinet, a test bench board is arranged above the cabinet, a height adjustment component for supporting the test bench board and adjusting the height of the test bench board is arranged on the top of the cabinet, and a protective cover component for covering and protecting components on the test bench board is arranged on the top of the test bench board.

[0007] As a further scheme of the present invention, the height adjustment component includes a slide groove opened on the top side of the cabinet, and a double-rotation threaded rod arranged along the length direction of the slide groove is provided in the slide groove, and the two ends of the double-rotation threaded rod are rotatably connected to the two ends of the slide groove. Two sliders are slidably connected in the slide groove, and nut sleeves threadedly connected to the double-rotation threaded rod are fixed in the two sliders. A support rod is fixed on the top side of the slider, and two hinge seats located at the two ends of the test bench are fixed to the bottom end of the test bench plate, and the top ends of the two support rods are hinged to the two hinge seats accordingly.

[0008] As a further solution of the utility model, one end of the double-rotation threaded rod extends out from the slide groove and is fixed with a joint plate, and a handle rod is fixed on the side of the joint plate.

[0009] As a further solution of the utility model, a rubber sleeve is fitted on the surface of the handle rod, and the length of the rubber sleeve is equal to the length of the handle rod.

[0010] As a further solution of the utility model, the anti-cover assembly includes a T-shaped slide groove opened on the top side of the test bench plate, a protective cover is provided on the top side of the test bench plate, and a T-shaped joint that is slidably adapted to the T-shaped slide groove is fixed to the bottom end of the protective cover.

[0011] As a further solution of the present invention, two T-shaped joints and two T-shaped chutes are provided, and the two T-shaped joints and two T-shaped chutes are symmetrically distributed.

[0012] Compared with the prior art, the beneficial effects of the utility model are:

[0013] 1. The height of the test bench can be adjusted by adjusting the height of the components, so that people of different heights can use the test bench to perform experimental operations. The test bench can adapt to the needs of users of different heights, ensuring the comfort and convenience of the experimenter during the operation, so that users of different heights can find the most suitable experimental height for themselves, so as to better concentrate on the experimental operation, reduce the experimental errors caused by discomfort, help improve the experimental efficiency, and improve the overall practicality;

[0014] 2. When not in use for a long time, the protective cover assembly can protect the components on the test bench board and prevent dust from falling into it, thereby avoiding damage to the components and performance degradation, extending the service life of the components and improving reliability, reducing the number of cleaning times and reducing the cleaning workload. BRIEF DESCRIPTION OF THE DRAWINGS

[0015] The utility model is further described below in conjunction with the accompanying drawings and embodiments:

[0016] Figure 1It is a three-dimensional diagram of the overall structure of the utility model;

[0017] Figure 2 This is a front view structural diagram of the height adjustment component of the utility model;

[0018] Figure 3 This is a schematic diagram of the local structure of the height adjustment component of the utility model;

[0019] Figure 4 It is a schematic diagram of the local structure of the T-shaped slideway of the utility model;

[0020] Figure 5 It is a schematic diagram of the local structure of the T-shaped joint of the utility model.

[0021] In the accompanying drawings, the components represented by the reference numerals are listed as follows:

[0022] 1. Height adjustment assembly; 101. Double-rotation threaded rod; 102. Sliding block; 103. Nut sleeve; 104. Connector plate; 105. Handle rod; 106. Slide groove; 107. Support rod; 108. Articulated seat; 2. Anti-cover assembly; 201. Protective cover; 202. T-shaped joint; 203. T-shaped slide groove; 3. Test bench plate; 4. Cabinet. DETAILED DESCRIPTION

[0023] The utility model is further described below in conjunction with embodiments.

[0024] See also Figure 1-5 The utility model provides a test bench for electronic information engineering, including a cabinet 4, a test bench board 3 is arranged above the cabinet 4, a height adjustment component 1 for supporting the test bench board 3 and adjusting the height of the test bench board 3 is arranged on the top of the cabinet 4, and a cover protection component 2 for covering and protecting the components on the test bench board 3 is arranged on the top of the test bench board 3; when in use, the height position of the test bench board 3 is adjusted by rotating the input end of the height adjustment component 1, so as to adapt to people of different heights to perform experimental operations on the test bench board 3, so that the test bench board 3 can It can adapt to the needs of users of different heights, ensure the comfort and convenience of the experimenter during the operation, and enable users of different heights to find the most suitable experimental height for themselves, so as to better concentrate on the experimental operation and reduce the experimental errors caused by discomfort, which is helpful to improve the experimental efficiency and the overall practicality. When not in use for a long time, the anti-cover assembly 2 can protect the components on the test bench plate 3 to prevent dust from falling, thereby avoiding damage and performance degradation of the components, extending the service life of the components and improving reliability, reducing the number of cleaning times and reducing the cleaning workload.

[0025] Further as Figure 1 , Figure 2 and Figure 3 As shown, it is worth explaining in detail that the height adjustment component 1 includes a slide groove 106 opened on the top side of the cabinet 4, and a double-rotation threaded rod 101 is arranged along the length direction of the slide groove 106. The two ends of the double-rotation threaded rod 101 are rotatably connected to the two ends of the slide groove 106, and two sliders 102 are slidably connected in the slide groove 106. Nut sleeves 103 threadedly connected to the double-rotation threaded rod 101 are fixed in the two sliders 102. A support rod 107 is fixed on the top side of the slider 102, and two hinge seats 108 located at the two ends of the test bench plate 3 are fixed to the bottom end of the test bench plate 3, and the top ends of the two support rods 107 are correspondingly hinged to the two hinge seats 108; when in use, the double-rotation threaded rod 101 is rotated to guide and limit the slider 102 through the slide groove 106, so that the screw The cooperation between the female sleeve 103 and the double-rotation threaded rod 101 drives the two sliders 102 to slide in the slide groove 106 in opposite directions, and the two sliders 102 drive the bottom ends of the two support rods 107 to move. Through the hinged cooperation between the top end of the support rod 107 and the hinge seat 108, the support rod 107 drives the test bench 3 to rise and fall, and adjusts the height position of the test bench 3 to adapt to the experimental operations of people of different heights on the test bench 3, so that the test bench 3 can adapt to the needs of users of different heights, ensuring the comfort and convenience of the experimenter during the operation, so that users of different heights can find the most suitable experimental height for themselves, so as to better concentrate on the experimental operations, reduce experimental errors caused by discomfort, help improve experimental efficiency, and improve overall practicality.

[0026] Further as Figure 1 , Figure 2 , Figure 4 and Figure 5 As shown, it is worth specifically explaining that the anti-cover assembly 2 includes a T-shaped slot 203 opened on the top side of the test bench plate 3, a protective cover 201 is arranged on the top side of the test bench plate 3, and a T-shaped joint 202 slidably adapted to the T-shaped slot 203 is fixed to the bottom end of the protective cover 201; the movement of the protective cover 201 is guided and limited by the cooperation of the T-shaped joint 202 and the T-shaped slot 203. When the test bench plate 3 is in use, the protective cover 201 is pulled to one end of the test bench plate 3 to expose the test bench plate 3 for use. When it is not in use for a long time, the protective cover 201 is pulled to cover the top of the test bench plate 3, so that the components on the test bench plate 3 can be protected by the protective cover 201 to prevent dust from falling into them, thereby avoiding damage and performance degradation of the components, extending the service life of the components and improving reliability, reducing the number of cleaning times and reducing the cleaning workload.

[0027] This solution has the following working process: when in use, by rotating the double-rotation threaded rod 101, the slider 102 is guided and limited by the slide groove 106, so that the two sliders 102 are driven to slide in the slide groove 106 in opposite directions through the cooperation of the nut sleeve 103 and the double-rotation threaded rod 101, and the two sliders 102 drive the bottom ends of the two support rods 107 to move, and the top end of the support rod 107 and the hinge seat 108 are hingedly cooperated, so that the test bench 3 is driven to rise and fall through the support rod 107, and the height position of the test bench 3 is adjusted to adapt to different body shapes. The test bench 3 is used by tall personnel to perform experimental operations, so that the test bench 3 can adapt to the needs of users of different heights. The movement of the protective cover 201 is guided and limited by the cooperation of the T-shaped joint 202 and the T-shaped slide groove 203. When the test bench 3 is used, the protective cover 201 is pulled to one end of the test bench 3 to expose the test bench 3 for use. When it is not used for a long time, the protective cover 201 is pulled to cover the top of the test bench 3, so that the components on the test bench 3 can be protected by the protective cover 201 to prevent dust from falling into it.

[0028] Further as Figure 2 and Figure 3 As shown, it is worth explaining in detail that one end of the double-rotational threaded rod 101 extends out from the slide groove 106 and is fixed with a joint plate 104, and a handle rod 105 is fixed on the side of the joint plate 104; during specific work, the double-rotational threaded rod 101 is driven to rotate by holding the handle rod 105, and the handle rod 105 has a longer force arm, which is convenient for operation.

[0029] Further as Figure 3 As shown, it is worth explaining in detail that a rubber sleeve is fitted on the surface of the handle rod 105, and the length of the rubber sleeve is set equal to the length of the handle rod 105; during specific work, the friction force when holding and rotating the handle rod 105 is increased by the set rubber sleeve to prevent slipping.

[0030] Further as Figure 4 and Figure 5 As shown, it is worth to explain in detail that two T-shaped joints 202 and two T-shaped slots 203 are provided, and the two T-shaped joints 202 and the two T-shaped slots 203 are symmetrically distributed.

[0031] In summary: the height position of the test bench 3 can be adjusted by adjusting the height adjustment component 1, so as to adapt to the experimental operations of people of different heights on the test bench 3, so that the test bench 3 can adapt to the needs of users of different heights, ensuring the comfort and convenience of the experimenter during the operation, so that users of different heights can find the most suitable experimental height for themselves, so as to better concentrate on the experimental operations, reduce experimental errors caused by discomfort, help to improve experimental efficiency, and improve overall practicality. When not in use for a long time, the anti-cover component 2 can protect the components on the test bench 3 to prevent dust from falling, thereby avoiding damage and performance degradation of the components, extending the service life of the components and improving reliability, reducing the number of cleaning times and reducing the cleaning workload.

Claims

1. A test bench for electronic information engineering, comprising a cabinet, characterized in that: A test bench is arranged above the cabinet, a height adjustment component for supporting and adjusting the height of the test bench is arranged on the top of the cabinet, and a cover protection component for covering and protecting components on the test bench is arranged on the top of the test bench.

2. The electronic information engineering test bench according to claim 1, characterized in that: The height adjustment component includes a slide groove opened on the top side of the cabinet body, and a double-rotation threaded rod arranged along the length direction of the slide groove is provided in the slide groove, and two ends of the double-rotation threaded rod are rotatably connected to the two ends of the slide groove. Two sliders are slidably connected in the slide groove, and nut sleeves threadedly connected to the double-rotation threaded rod are fixed in the two sliders. A support rod is fixed on the top side of the slider, and two hinge seats located at the two ends of the test bench plate are fixed to the bottom end of the test bench plate, and the top ends of the two support rods are hinged to the two hinge seats accordingly.

3. The electronic information engineering test bench according to claim 2, characterized in that: One end of the double-rotation threaded rod extends out from the slide groove and is fixed with a joint plate, and a handle rod is fixed on the side surface of the joint plate.

4. The electronic information engineering test bench according to claim 3, characterized in that: A rubber sleeve is fitted on the surface of the handle bar, and the length of the rubber sleeve is equal to the length of the handle bar.

5. The electronic information engineering test bench according to claim 1, characterized in that: The anti-cover assembly includes a T-shaped slide groove opened on the top side of the test bench plate, a protective cover is arranged on the top side of the test bench plate, and a T-shaped joint slidingly adapted to the T-shaped slide groove is fixed to the bottom end of the protective cover.

6. The electronic information engineering test bench according to claim 5, characterized in that: There are two T-shaped joints and two T-shaped chutes, and the two T-shaped joints and two T-shaped chutes are symmetrically distributed.

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