Laser test fixture
By setting pin grooves on the socket of the laser test fixture and setting corresponding probes on the probe row, the stable electrical connection between the laser pins and the test equipment is achieved, and the problem of poor positioning and contact in the prior art is solved. Improves the accuracy of test results.
Patent Information
- Application Number
- CN202323661420.8
- Authority / Receiving Office
- CN · China
- Patent Type
- Utility models(China)
- Current Assignee / Owner
- Filing Date
- 2023-12-29
- Publication Date
- 2025-01-07
- Estimated Expiration
- 2033-12-29
AI Technical Summary
The existing laser test fixtures cannot effectively locate the laser, and the laser contact with the test equipment due to poor contact with the pins and fixtures, which affects the test results.
A laser test fixture is designed. By setting the pin groove corresponding to the laser pin on the socket and setting the probe corresponding to the pin on the probe row, the one-to-one insertion of the probe and the pin is realized. and press-fit connection to ensure electrical contact.
It effectively avoids the problem of virtual connection or poor contact between the laser and the test equipment, realizes accurate positioning and stable connection of the laser, and improves the accuracy of the test results.
Smart Images
Figure CN222318988U_ABST
Abstract
Description
Technical Field
[0001] The utility model relates to the technical field of laser equipment, in particular to a laser testing fixture. Background Art
[0002] Lasers have high reliability and high stability. Before they are put into use, they need to be tested. During the test, the laser needs to be fixed on a test fixture and connected to the test equipment through the test fixture. The general test fixture uses a butterfly clamp to press the two sets of pins of the laser onto the test fixture in a row. This method cannot position the laser well, and the poor contact between the pins and the test fixture will also cause poor contact between the laser and the test equipment, thus affecting the test results of the laser. Utility Model Content
[0003] To this end, the utility model provides a laser test fixture to try to solve or at least alleviate at least one of the above problems.
[0004] According to one aspect of the utility model, a laser test fixture is provided, characterized in that it includes:
[0005] Base;
[0006] Sockets, there are two sockets, the two sockets are fixedly mounted on the upper surface of the base, the two sockets are respectively used to connect with two groups of pins of the laser to be tested, and each socket is provided with pin grooves corresponding to the pins of the laser to be tested;
[0007] Probe rows, there are two probe rows, the two probe rows are connected to the testing equipment, each probe row is provided with probes corresponding to the pins of the laser to be tested, the probe row is constructed to be inserted into the socket in a direction perpendicular to the upper surface of the base, and the probes can be inserted into the pin grooves one by one, so that when testing the laser to be tested, the probes are electrically connected to the laser pins one by one.
[0008] Optionally, in the laser test fixture according to the utility model, fixing blocks for fixing the probe row inserted into the socket are respectively provided at both ends of the socket, probe row end sliders are respectively provided at both ends of the probe row, and the fixing block is provided with a slide rail matching the probe row end slider on the side close to the socket.
[0009] Optionally, in the laser test fixture according to the present invention, the slider at the end of the probe row is constructed as a structure with an arc-shaped outer cross-section, and the slide rail on the fixed block is constructed as an arc-shaped groove matching the slider structure at the end of the probe row.
[0010] Optionally, in the laser test fixture according to the utility model, a fixing mechanism is provided on the fixing block, and the fixing mechanism is used to fix the probe row inserted into the fixing block.
[0011] Optionally, in the laser test fixture according to the utility model, the fixing mechanism is a fixing bolt.
[0012] Optionally, in the laser test fixture according to the utility model, the probe row is connected with a lead wire for connecting a test device, and the lead wire includes wire cores which correspond one-to-one to the probes on the probe row and are insulated from each other.
[0013] Optionally, in the laser test fixture according to the utility model, the probe has an insulating protective cover at one end connected to the probe row.
[0014] Optionally, in the laser test fixture according to the utility model, a positioning hole for fixedly connecting the socket and the base is provided on the socket.
[0015] Optionally, in the laser test fixture according to the utility model, the socket is fixedly mounted on the base through bolts and positioning holes.
[0016] Optionally, the laser test fixture according to the utility model further includes a heat sink, wherein the heat sink is located between the two sockets and is fixedly connected to the base.
[0017] According to the laser test fixture of the utility model, pin grooves corresponding to the laser pins to be tested are arranged on the socket, and probes corresponding to the laser pins to be tested are arranged on the probe row. When testing the laser to be tested, the laser pins to be tested are inserted into the pin grooves, and the probes of the probe row are inserted into the pin grooves. The probes on the probe row are pressed against the laser pins to be tested in a one-to-one correspondence to ensure electrical connection. The problem of poor contact between the laser pins and the laser test fixture in the prior art can be effectively avoided. Furthermore, the positioning of the laser can be achieved. BRIEF DESCRIPTION OF THE DRAWINGS
[0018] To achieve the above and related purposes, certain illustrative aspects are described herein in conjunction with the following description and accompanying drawings, which indicate various ways in which the principles disclosed herein can be practiced, and all aspects and their equivalents are intended to fall within the scope of the claimed subject matter. The above and other purposes, features and advantages of the present disclosure will become more apparent by reading the following detailed description in conjunction with the accompanying drawings. Throughout the present disclosure, the same reference numerals generally refer to the same parts or elements.
[0019] Figure 1A schematic diagram of a laser test fixture 100 according to an embodiment of the present utility model from a first viewing angle is shown;
[0020] Figure 2 A second viewing angle schematic diagram of a laser test fixture 100 according to an embodiment of the utility model is shown;
[0021] Figure 3 A schematic diagram of a socket according to an embodiment of the utility model from a first perspective is shown;
[0022] Figure 4 A schematic diagram of a probe row according to an embodiment of the utility model from a first viewing angle is shown;
[0023] Figure 5 A second viewing angle schematic diagram of a probe row according to an embodiment of the utility model is shown;
[0024] Figure 6 A schematic diagram of a fixing block according to an embodiment of the utility model from a first perspective is shown;
[0025] Figure 7 A schematic diagram from a first viewing angle after the probe row is inserted according to an embodiment of the utility model is shown.
[0026] Icons: 110, base; 120, socket; 121, pin groove; 122, positioning hole; 130, probe row; 131, probe; 132, slider at the end of the probe row; 133, insulating protective cover; 140, fixing block; 141, slide rail; 142, fixing mechanism; 150, heat sink; 160, laser to be tested; 161, pin. DETAILED DESCRIPTION
[0027] The exemplary embodiments of the present disclosure will be described in more detail below with reference to the accompanying drawings. Although the exemplary embodiments of the present disclosure are shown in the accompanying drawings, it should be understood that the present disclosure can be implemented in various forms and should not be limited by the embodiments set forth herein. On the contrary, these embodiments are provided to enable a more thorough understanding of the present disclosure and to fully convey the scope of the present disclosure to those skilled in the art.
[0028] In order to illustrate the technical solution of the utility model, the following Figures 1 to 7 The invention is described by means of specific examples.
[0029] A laser test fixture according to an embodiment of the present invention includes a base 110 , two sockets 120 and two probe rows 130 .
[0030] The two sockets are fixedly mounted on the upper surface of the base. In a specific example, the socket 120 is provided with a positioning hole 122 (see Figure 1 ), further, the socket can be fixedly mounted on the base by bolts and positioning holes. The two sockets are respectively used to connect to the two groups of pins 161 of the laser 160 to be tested (see Figure 2 Each socket 120 is provided with a pin groove 121 corresponding to the laser pin 161 to be tested (see Figures 1 to 3 ).
[0031] The two probe rows 130 are provided with probes 131 corresponding to the pins 161 of the laser 160 to be tested (see Figures 4 to 5 ), the two probe rows 130 can be inserted into the socket 120 along a direction perpendicular to the upper surface of the base 110, and the probes 131 on the probe rows 130 can be inserted into the pin grooves 121 on the socket 120 one by one.
[0032] According to one embodiment of the utility model, when testing a laser to be tested, two probe rows 130 are connected to a test device (not shown in the figure) through leads (not shown in the figure), and firstly, the laser to be tested 160 is placed on the laser test fixture 100, so that the two groups of pins 161 of the laser to be tested 160 are respectively inserted into the pin grooves 121 of the two sockets 120 in a one-to-one correspondence, and further, the two probe rows 130 are inserted into the sockets 120, and the probes 131 of the two probe rows 130 are also inserted into the two socket pin grooves 121 in a one-to-one correspondence, so that the probes 131 of the probe rows are pressed and contacted with the laser pins 161 to be tested in the socket pin grooves (see Figure 7 ) to achieve electrical connection, which can avoid false connection or poor contact between the laser to be tested and the test equipment.
[0033] Furthermore, the probes 131 on the probe row 130 have an insulating protective cover 133 at one end connected to the probe row (see Figure 5 ) to ensure the insulation between the probes and the accuracy of the test results.
[0034] According to another embodiment of the present invention, in order to facilitate the insertion and removal of the probe row 130 from the socket 120, each socket 120 is provided with a fixing block 140 (see Figures 1 to 2 The fixing block 140 is movably connected to the socket 120, and each fixing block 140 is provided with a slide rail 141 matching the slider 132 at the end of the probe row on its side close to the socket 120. In a specific example, the slider 132 at the end of the probe row is constructed as a structure with an outer cross section of an arc (see Figures 4 to 5), the slide rail 141 on the fixed block 140 is a circular arc groove matching therewith (see Figure 6 ). Further, the end portion 132 of the probe row 130 with a circular arc cross section may be partially missing at the end of the probe row 130 inserted into the socket (see Figure 4 ), which makes it easier to insert and remove the probe row 130.
[0035] According to another embodiment of the present invention, a fixing mechanism 142 is provided on the fixing block 140 (see Figure 1 ), the fixing mechanism 141 is used to fix the probe row 130 inserted into the fixing block 140, that is, the probe row 130 inserted into the socket 120 connected to the fixing block, so that the probe row probes 131 can better press the laser pins 161 to be tested to ensure electrical connection. In a specific example, the fixing mechanism 141 can be a fixing bolt, and the fixing block 140 and the socket 120 can be movably connected. When the probe row 130 is inserted, the fixing blocks 140 at both ends of the socket 120 are adjusted to clamp the probe row 130.
[0036] The two probe rows 130 are connected to the test equipment through leads (not shown in the figure). The leads connecting the probe rows include wire cores that correspond to the probes on the probe rows one by one and are insulated from each other to ensure that the laser to be tested is electrically connected to the test equipment.
[0037] Furthermore, according to an embodiment of the present invention, the laser test fixture 100 also includes a heat sink 150, which is located between the two sockets 120. The heat sink 150 is fixedly mounted on the base 110. When the laser to be tested is placed on the laser test fixture, the heat sink 150 abuts against the laser to be tested 160 to help dissipate the heat generated by the laser to be tested during the test process.
[0038] According to the laser test fixture of the utility model, pin grooves corresponding to the laser pins to be tested are arranged on the socket, and probes corresponding to the laser pins to be tested are arranged on the probe row. When testing the laser to be tested, the laser pins to be tested are inserted into the pin grooves, and the probes of the probe row are inserted into the pin grooves, so that the probes on the probe row are electrically connected to the laser pins to be tested in a one-to-one correspondence. This can effectively avoid the problem of poor contact between the laser pins and the laser test fixture in the prior art, and further, the positioning of the laser can be achieved.
[0039] In the description of the embodiments of the present application, it should be understood that the terms "vertical", "horizontal", etc. indicate orientations or positional relationships based on the orientations or positional relationships shown in the accompanying drawings, and are only for the convenience of describing the present invention and simplifying the description, rather than indicating or implying that the device or element referred to must have a specific orientation, be constructed and operated in a specific orientation, and therefore should not be understood as a limitation on the present invention.
[0040] It should be understood that expressions such as "including" and "may include" that may be used in the present application indicate the existence of the disclosed functions, operations, or constituent elements, and do not limit one or more additional functions, operations, and constituent elements. In the present application, terms such as "including" and / or "having" may be interpreted as indicating specific characteristics, numbers, operations, constituent elements, components, or combinations thereof, but may not be interpreted as excluding the existence or possibility of adding one or more other characteristics, numbers, operations, constituent elements, components, or combinations thereof.
[0041] In the embodiments of the present application, expressions including ordinal numbers such as "first" and "second" can modify various elements. However, such elements are not limited by the above expressions. For example, the above expressions do not limit the order and / or importance of the elements. The above expressions are only used to distinguish one element from other elements.
[0042] In the embodiments of the present application, words such as "exemplary" or "for example" are used to indicate examples, illustrations or descriptions. Any embodiment or design described as "exemplary" or "for example" in the embodiments of the present application should not be interpreted as being more preferred or more advantageous than other embodiments or designs. Specifically, the use of words such as "exemplary" or "for example" is intended to present related concepts in a specific way.
[0043] In the description of the embodiments of the present application, unless otherwise specified, “plurality” means two or more.
[0044] In the description of the embodiments of the present application, when a component is referred to as being "connected" or "accessed" to other components, it should be understood that: the component is not only directly connected to or accessed to other components, but also another component may exist between the component and the other components. On the other hand, when a component is referred to as being "directly connected" or "directly accessed" to other components, it should be understood that there is no component between them. When a component is referred to as being "movably connected" to other components, it means that the positional relationship between the component and the other components is changeable, such as the relationship between a slide rail and a slider, the slider can slide on the slide rail, and the slide rail and the track are movably connected. When a component is referred to as being "fixedly connected" to other components, it means that the positional relationship between the component and the other components after being assembled together is relatively fixed.
[0045] Furthermore, those skilled in the art will appreciate that although some embodiments described herein include certain features included in other embodiments but not other features, the combination of features from different embodiments is meant to be within the scope of the present invention and to form different embodiments.
[0046] The above is only a specific implementation of the present application, but the protection scope of the present application is not limited thereto. Any technician familiar with the technical field can easily think of changes or replacements within the technical scope disclosed in the present application, which should be included in the protection scope of the present application. Although the present application is described according to a limited number of embodiments, it is understood by the technicians in the technical field that other embodiments can be envisioned within the scope of the present application described thereby, thanks to the above description. In addition, it should be noted that the language used in this specification is mainly selected for the purpose of readability and teaching, rather than for explaining or limiting the subject matter of the present application. Therefore, without departing from the scope and spirit of the attached claims, many modifications and changes are obvious to ordinary technicians in the technical field. For the scope of the present application, the disclosure made in the present application is illustrative, not restrictive, and the protection scope of this patent application shall be based on the protection scope of the claims.
Claims
1. A laser test fixture, characterized in that: include: Base; Sockets, there are two sockets, the two sockets are fixedly mounted on the upper surface of the base, the two sockets are respectively used to connect with two groups of pins of the laser to be tested, and each socket is provided with pin grooves corresponding to the pins of the laser to be tested; Probe rows, there are two probe rows, the two probe rows are connected to the testing equipment, each probe row is provided with probes corresponding to the pins of the laser to be tested, the probe row is constructed to be inserted into the socket in a direction perpendicular to the upper surface of the base, and the probes can be inserted into the pin grooves one by one, so that when testing the laser to be tested, the probes are electrically connected to the laser pins one by one.
2. The laser test fixture as claimed in claim 1, characterized in that: The two ends of the socket are respectively provided with fixing blocks for fixing the probe row inserted into the socket, the two ends of the probe row are respectively provided with probe row end sliders, and the fixing block is provided with a slide rail matching the probe row end slider on the side close to the socket.
3. The laser test fixture as claimed in claim 2, characterized in that: The slider at the end of the probe row is configured as a structure with an arc-shaped outer cross section, and the slide rail on the fixed block is configured as an arc-shaped groove matching the slider structure at the end of the probe row.
4. The laser test fixture as claimed in claim 2, characterized in that: The fixing block is provided with a fixing mechanism, and the fixing mechanism is used to fix the probe row inserted into the fixing block.
5. The laser test fixture as claimed in claim 4, characterized in that: The fixing mechanism is a fixing bolt.
6. The laser test fixture according to any one of claims 1 to 5, characterized in that: The probe row is connected with a lead wire for connecting a test device, and the lead wire includes wire cores which correspond to the probes on the probe row one by one and are insulated from each other.
7. The laser test fixture according to any one of claims 1 to 5, characterized in that: The probe has an insulating protective cover at one end connected to the probe row.
8. The laser test fixture according to any one of claims 1 to 5, characterized in that: The socket is provided with a positioning hole for fixedly connecting the socket and the base.
9. The laser test fixture as claimed in claim 8, characterized in that: The socket is fixedly mounted on the base through bolts and positioning holes.
10. The laser test fixture according to any one of claims 1 to 5, characterized in that: It also includes a heat sink block, which is located between the two sockets and is fixedly connected to the base.