Nondestructive test fixture for high-temperature resistivity of material

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By designing test fixtures for semicircular tube body and sliding grooves, the flexibility and accuracy of test fixtures at high temperatures in the prior art are solved, and the resistivity test of high-temperature materials of different lengths and positions is realized, reducing cost and processing difficulty.

CN222337219UActive Publication Date: 2025-01-10CHINA BUILDING MATERIAL TEST & CERT GRP (ZIBO) CO LTD

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Patent Information

Application Number: CN202420368687.3
Authority / Receiving Office: CN · China
Patent Type: Utility models(China)
Current Assignee / Owner
Filing Date: 2024-02-28
Publication Date: 2025-01-10
Estimated Expiration: 2034-02-28

AI Technical Summary

Technical Problem

Existing test fixtures cannot be flexibly measured at high temperatures, and the processing is difficult and costly. Insulating materials fail at high temperatures, making it impossible to achieve non-destructive testing.

Method used

A test fixture including a semicircular tube body, a sliding groove, a slidable electrode sleeve and a telescopic mechanism was designed. The electrode sleeve in the sliding groove was freely slided, and the electrode position was flexibly adjusted to avoid drilling and positioning. High temperature resistant insulation material was used to ensure that Fixture stability and accuracy.

Benefits of technology

The resistivity test of high-temperature materials of different lengths and positions is realized, which improves measurement accuracy, reduces detection costs, avoids hole punching operations, and ensures the flexibility and accuracy of the test.

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Abstract

The utility model discloses a nondestructive test fixture for high-temperature resistivity of materials, which comprises a semicircular tube body, a plurality of supports are arranged on the lower side of the semicircular tube body, a fixed baffle is fixedly arranged at one end of the semicircular tube body, and a slidable baffle is slidably arranged at the other end of the semicircular tube body. Telescopic mechanisms are movably arranged on the fixed baffle and the slidable baffle, a sliding groove is formed in the bottom of the semicircular pipe body, the sliding groove is in sliding connection with at least two first sliding electrode sleeves and at least two second sliding electrode sleeves, and the second sliding electrode sleeves are located between the fixed baffle and the sliding baffle. The first sliding electrode sleeve and the second sliding electrode sleeve are arranged in the sliding groove in a sliding mode, the electrodes are driven to move in the sliding groove through free sliding of the electrode sleeves in the sliding groove, the position can be flexibly adjusted according to the size and the length of a to-be-tested sample, the resistivity of any section of the sample can be tested, the measurement precision is improved, and the detection cost is reduced.

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Description

Technical Field

[0001] The utility model relates to a testing fixture, in particular to a nondestructive testing fixture used for high-temperature resistivity of materials. Background Art

[0002] Many materials require a four-probe test method when testing resistivity. The principle of the four-probe method is that one pair of potential probes contacts the two ends of the sample, and the other pair of current probes contacts the middle part of the sample.

[0003] At present, the resistivity test of materials at room temperature is achieved by using hand-held probes or test fixtures to hold probes to achieve four-probe contact with the sample. Obviously, hand-held probes are not feasible at high temperatures; existing test fixtures require drilling to test samples, and cannot achieve flexible measurements. The processing difficulty and cost are high, and insulating polymer test fixtures will fail at high temperatures due to their low melting point. Utility Model Content

[0004] In view of the above problems, the utility model designs a nondestructive testing fixture for high-temperature resistivity of materials, including a semicircular tube body, a plurality of brackets are arranged on the lower side of the semicircular tube body, a fixed baffle is fixedly arranged at one end of the semicircular tube body, a slidable baffle is slidably arranged at the other end of the semicircular tube body, a telescopic mechanism is movably arranged on the fixed baffle and the slidable baffle, a sliding groove is opened at the bottom of the semicircular tube body, at least two first sliding electrode sleeves and at least two second sliding electrode sleeves are slidably connected in the sliding groove, the second sliding electrode sleeve is located between the fixed baffle and the slidable baffle, and the second sliding electrode sleeve is located on both sides of the first sliding electrode sleeve.

[0005] Compared with the prior art, the utility model has the following beneficial effects: by arranging a sliding groove at the bottom of the semicircular tube body, a first sliding electrode sleeve and a second sliding electrode sleeve are slidably arranged in the sliding groove, and by arranging two pairs of electrode sleeves, both can slide freely in the sliding groove, thereby driving the first sliding electrode and the second sliding electrode to move in the sliding groove, and the position can be flexibly adjusted according to the size and length of the material to be tested, so as to realize the test of the resistivity of any section on the material to be tested, thereby improving the measurement accuracy and reducing the detection cost; by arranging at least two first sliding electrode sleeves, the positive and negative electrodes of the first sliding electrode are placed in the two first sliding electrode sleeves, and by arranging at least two second sliding electrode sleeves, the positive and negative electrodes of the second sliding electrode are placed in the two first sliding electrode sleeves. The positive electrode and the negative electrode are placed in two second sliding electrode sleeves; the two ends of the material to be tested of different lengths are fixed to the second electrode in the second sliding electrode sleeve by moving the slidable baffle and the telescopic device and sliding the second sliding electrode sleeve, so that the test of the two ends of the material to be tested is more accurate under the action of the pressing force; the first sliding electrode sleeve is slidably connected to the semicircular tube body, so that the first electrode in the first sliding electrode sleeve is below the material to be tested, and under the action of the pressure of the material to be tested, one end of the first electrode is in close contact with the material to be tested for measurement, so that the measurement of the material to be tested is more accurate, and it is avoided to punch holes on the material to be tested to position the electrode, and any position and length of the material to be tested of different lengths can be detected, and the operation is simple.

[0006] Furthermore, the first sliding electrode sleeve includes a first detection part, a first sliding part is arranged at the lower side of the first detection part, the first detection part slides in cooperation with the sliding groove, a accommodating space 1 is arranged inside the first sliding electrode sleeve, and the first detection part is provided with a first opening connected to the accommodating space 1.

[0007] The beneficial effect of adopting the above-mentioned further technical solution is: by setting the first detection part to slide in cooperation with the sliding groove, the first detection part is provided with a first opening connected to the accommodating space one, so that the first electrode is placed in the accommodating space one, and the end of the first electrode leaks out from the first opening. The first detection part slides in cooperation with the sliding groove to drive the first electrode to slide in the sliding groove, so that the first electrode can flexibly contact different positions of the bottom of the material to be tested.

[0008] Furthermore, the second sliding electrode sleeve includes a second detection part, a second sliding part is arranged at the lower side of the second detection part, a second accommodating space is arranged inside the second sliding electrode sleeve, and the second detection part is provided with a second opening connected to the second accommodating space.

[0009] The beneficial effect of adopting the above-mentioned further technical solution is as follows: a second sliding part is provided on the lower side of the second detection part, and the second detection part is provided with a second opening connected to the second accommodating space, so that the second electrode is placed in the accommodating space of the second detection part, and the end of the second electrode leaks out through the second opening and moves through the second sliding part, so that the second electrode contacts the two ends of the material to be tested.

[0010] Furthermore, the sliding groove comprises a sliding groove deep portion, and the first sliding portion and the second sliding portion are slidably connected to the sliding groove deep portion.

[0011] The beneficial effect of adopting the above further technical solution is: the first sliding part and the second sliding part are slidably connected with the deep part of the sliding groove, thereby driving the first electrode and the second electrode to slide in the sliding groove, and by setting the deep part of the sliding groove, the electrode wire placed in the first sliding part and the second sliding part passes through the sliding groove and is connected to the current.

[0012] Furthermore, the sliding groove also includes a shallow portion of the sliding groove, and the first detection portion is slidably connected to the shallow portion of the sliding groove.

[0013] Preferably, the sliding groove is T-shaped.

[0014] More preferably, the top of the first detection portion matches the shape of the shallow portion of the sliding groove, and the second detection portion is wider than the shallow portion of the sliding groove.

[0015] The beneficial effects of adopting the above-mentioned further technical scheme are as follows: by setting a shallow portion of the sliding groove, the shallow portion of the sliding groove is slidably connected with the first detection portion, so that the first electrode moves in the sliding groove, so that the first electrode is located at the bottom of the material to be tested; by setting the sliding groove to be T-shaped, the first sliding electrode sleeve and the second sliding electrode sleeve can be firmly placed and slid, and the sliding groove does not penetrate the semicircular tube body along the length direction, thereby ensuring the integrity of the entire semicircular tube body and ensuring that the entire test fixture is firm and stable; the top of the first detection portion matches the shape of the shallow portion of the sliding groove, so that the material to be tested is stably placed on the first detection portion, so that the first electrode head of the first detection portion contacts the bottom of the material to be tested, and the second detection portion is wider than the shallow portion of the sliding groove, so that the second sliding electrode sleeve is placed in the sliding groove and will not fall, and the second detection portion is located above the sliding groove and contacts the two ends of the material to be tested, thereby facilitating detection.

[0016] Furthermore, the first detection part includes an arc-shaped plate 1, and the first sliding part includes a vertical plate 1, the arc-shaped plate 1 slides in cooperation with the shallow part of the sliding groove, and the vertical plate 1 slides in cooperation with the deep part of the sliding groove;

[0017] Preferably, the first sliding electrode sleeve is T-shaped;

[0018] More preferably, the accommodating space 1 is composed of a semi-spherical hole 1 and a cylindrical hole. The semi-spherical hole 1 is arranged in the middle of the upper part of the arc plate 1, and the cylindrical hole is arranged in the middle of the interior of the vertical plate 1.

[0019] The beneficial effects of adopting the above-mentioned further technical scheme are as follows: by setting the first detection part as an arc-shaped plate, the first sliding electrode sleeve can be fitted with the surface of the material to be tested, and can achieve close contact with the first electrode under the action of the sample's own weight; by setting the first sliding part with a vertical plate, the first sliding electrode sleeve can slide in the sliding groove, and the position of the first sliding electrode sleeve can be flexibly adjusted; by setting a semi-spherical hole in the middle of the upper part of the arc-shaped plate and a cylindrical hole in the middle of the interior of the vertical plate, the first electrode head is placed in the interior of the semi-spherical hole, and the first electrode wire is placed in the interior of the cylindrical hole, so that the first electrode is fixed as a whole inside the accommodating space to prevent the first electrode from falling off.

[0020] Further, the first detection part includes an arc-shaped plate 1, a screw is provided on the lower side of the arc-shaped plate 1, the first sliding part includes an arc-shaped plate 2, a vertical plate 2 is provided on the lower side of the arc-shaped plate 2, the screw passes through the arc-shaped plate 2 and is threadedly connected with the vertical plate 2, the lower surface of the arc-shaped plate 1 coincides with the upper surface of the arc-shaped plate 2, the arc-shaped plate 2 slides in cooperation with the shallow part of the sliding groove, and the vertical plate 2 slides in cooperation with the deep part of the sliding groove;

[0021] Preferably, a scale is provided on the second arc-shaped plate;

[0022] More preferably, the accommodating space 1 is composed of a semi-spherical hole 1, a cylindrical hole and a through hole. The semi-spherical hole 1 is arranged in the middle of the upper part of the arc plate 1, the cylindrical hole is arranged in the middle of the inside of the screw rod, and the through hole is arranged in the middle of the inside of the vertical plate 2.

[0023] The beneficial effects of adopting the above further technical solution are as follows: the first detection part is an arc plate 1, the first sliding part includes an arc plate 2, a vertical plate 2 is arranged on the lower side of the arc plate 2, a screw rod passes through the arc plate 2 and is threadedly connected with the vertical plate 2, and a scale is arranged on the arc plate 2, which can adjust the upper and lower distances between the arc plate 1 and the arc plate 2, so that before the material to be tested is tightened by the telescopic mechanism, the position of the contact point between the at least two first electrode sleeves and the material to be tested is on the same axis as the telescopic mechanism, so that the material to be tested can be placed on the at least two first sliding electrode sleeves first, so that the material to be tested is in contact with the first electrodes in the two first sliding electrode sleeves, and the axis of the material to be tested is The axes of the telescopic mechanism are the same, and then the material to be tested is tightened by the telescopic mechanism, so that the material to be tested is clamped in a horizontal state for testing, so that the detection accuracy is more accurate, and the lower surface of the arc plate one coincides with the upper surface of the arc plate two, so that the starting point of the arc plate one is aligned with the scale, so as to accurately measure the height of the arc plate one. The semi-spherical hole one is set in the middle of the upper part of the arc plate one, the cylindrical hole is set in the middle of the inside of the screw, and the through hole is set in the middle of the inside of the vertical plate two, so that the first electrode head is placed in the semi-spherical hole one, and the first electrode line is placed in the cylindrical hole and the through hole, so that the first electrode is fixed as a whole in the inside of the accommodating space one to prevent the first electrode from falling off.

[0024] Furthermore, the second detection part includes a semicircular table, and the second sliding part includes a vertical table, which is located at the lower side of the semicircular table. The semicircular table is wider than the shallow part of the sliding groove, and the vertical table is slidably matched with the deep part of the sliding groove.

[0025] Preferably, the second accommodating space is composed of a second semi-spherical hole and a groove. The second semi-spherical hole is opened at the center of the semi-circular table. The groove is connected to the second semi-spherical hole and is opened along the vertical table direction.

[0026] The beneficial effects of adopting the above further technical solution are as follows: by setting a semicircular table, the telescopic device is pressed against the second sliding electrode sleeve, so that the second sliding electrode sleeve is in closer contact with the material to be tested, thereby making the test at both ends of the material to be tested more accurate, by setting the width of the semicircular table wider than the shallow part of the sliding groove, the second sliding electrode sleeve is placed in the sliding groove and will not fall, and the movement of the second sliding electrode sleeve can be controlled by pushing and pulling the extension of the vertical table. By setting the second accommodating cavity, the second electrode can be placed in the second accommodating space, so that the second electrode is in close contact with the material to be tested under the action of the tightening force, the second accommodating space is composed of the second semicircular spherical hole and the groove, so that the second electrode head is placed in the second semicircular spherical hole, so that the second electrode line is placed in the groove, and the second electrode is fixed as a whole in the second accommodating space under the action of the tightening force, and the two second sliding electrode sleeves placed in the second electrode cooperate with each other to measure the current at both ends of the material to be tested, ensuring that the current signal can be read smoothly.

[0027] Furthermore, the semicircular tube body, the first sliding electrode sleeve, the second sliding electrode sleeve and the telescopic mechanism are all made of high temperature resistant insulating boron nitride materials, and the slidable baffle, the fixed baffle and the bracket are made of high temperature resistant boron nitride or graphite materials.

[0028] The beneficial effects of adopting the above further technical solution are: by adopting boron nitride material, boron nitride has good insulation and thermal conductivity similar to that of metal at high temperature, is resistant to high temperature of nearly 2000°C, is easy to process and shape, and meets the testing requirements well.

[0029] Furthermore, the slidable baffle is provided with a positioning hole, which is located on the upper side of the side of the semicircular tube body; the upper side of the side of the semicircular tube body is provided with a plurality of adjustment holes, and the adjustment holes and the positioning holes are used to cooperate with each other to fix the slidable baffle and the semicircular tube body at different positions.

[0030] The beneficial effects of adopting the above-mentioned further technical solution are: by setting a positioning hole on the slidable baffle, the slidable baffle is fixed to the semicircular tube body by means of bolts and nuts, and by opening a plurality of adjustment holes on the upper side of the side of the semicircular tube body, the placement space can be adjusted according to the length of the material to be tested. BRIEF DESCRIPTION OF THE DRAWINGS

[0031] Figure 1It is a three-dimensional structural diagram of a non-destructive test fixture for high-temperature resistivity of materials;

[0032] Figure 2 It is a three-dimensional structural diagram of a non-destructive test fixture for high-temperature resistivity of a material and a material to be tested;

[0033] Figure 3 It is a front view of a non-destructive test fixture for high temperature resistivity of materials;

[0034] Figure 4 is a three-dimensional structural diagram of the first sliding electrode sleeve in the first embodiment;

[0035] Figure 5 is a cross-sectional view of the first sliding electrode sleeve in the first embodiment;

[0036] Figure 6 is a three-dimensional structural diagram of the first sliding electrode sleeve in the second embodiment;

[0037] Figure 7 is a cross-sectional view of the first sliding electrode sleeve in the second embodiment;

[0038] Figure 8 is a three-dimensional structural diagram of the second sliding electrode sleeve;

[0039] Fig. 9 It is a side view of the semicircular tube body and the sliding groove;

[0040] Wherein: 1. semi-circular tube body; 11. adjustment hole; 12. sliding groove; 121. shallow part of sliding groove; 122. deep part of sliding groove; 2. fixed baffle; 3. slidable baffle; 31. positioning hole; 4. first sliding electrode sleeve; 41. arc plate one; 42. arc plate two; 43. screw; 44. vertical plate one; 45. vertical plate two; 46. ruler; 47. accommodating space one; 471. semi-spherical hole one; 472. cylindrical hole; 473. through hole; 5. second sliding electrode sleeve; 51. semi-circular table; 52. vertical table; 53. accommodating space two; 531. semi-spherical hole two; 532. groove; 6. bracket; 7. telescopic mechanism; 8. material to be tested. DETAILED DESCRIPTION

[0041] In order to make the purpose, technical solution and advantages of the present invention clearer, the technical solution in the embodiments of the present invention will be clearly and completely described below in conjunction with the embodiments of the present invention.

[0042] Embodiment 1:

[0043] The present embodiment provides a nondestructive testing fixture for high-temperature resistivity of materials, comprising a semicircular tube body 1, a plurality of brackets 6 are arranged on the lower side of the semicircular tube body 1, a fixed baffle 2 is fixedly arranged on one end of the semicircular tube body 1, a slidable baffle 3 is slidably arranged on the other end of the semicircular tube body 1, and a telescopic mechanism 7 is movably arranged on the fixed baffle 2 and the slidable baffle 3, and a sliding groove 12 is opened at the bottom of the semicircular tube body 1, and the sliding groove 12 is slidably connected with two first sliding electrode sleeves 4 and two second sliding electrode sleeves 5, the second sliding electrode sleeve 5 is located between the fixed baffle 2 and the slidable baffle 3, and the second sliding electrode sleeve 5 is located on both sides of the first sliding electrode sleeve 4, and the telescopic mechanism 7 can be a tightening bolt; by arranging the sliding groove 12 at the bottom of the semicircular tube body 1, the first sliding electrode sleeve 4 and the second sliding electrode sleeve 5 are slidably arranged in the sliding groove 12, and by arranging that both pairs of electrode sleeves can slide freely in the sliding groove 12, thereby driving the first sliding electrode and the second sliding electrode to move in the sliding groove 12, the position can be flexibly adjusted according to the size and length of the material 8 to be tested, and the telescopic mechanism 7 can be realized. The resistivity of any section on the material to be tested 8 is tested, which improves the measurement accuracy and reduces the detection cost; by setting two first sliding electrode sleeves 4, the positive and negative electrodes of the first sliding electrode are placed in the two first sliding electrode sleeves 4, and by setting two second sliding electrode sleeves 5, the positive and negative electrodes of the second sliding electrode are placed in the two second sliding electrode sleeves 5; by moving the slidable baffle 3 and the telescopic device and sliding the second sliding electrode sleeve 5, the two ends of the material to be tested 8 of different lengths are fixed to the second electrode in the second sliding electrode sleeve 5, and the test of the two ends of the material to be tested 8 is more accurate under the action of the tightening force; by the sliding connection between the first sliding electrode sleeve 4 and the semicircular tube body 1, the first electrode in the first sliding electrode sleeve 4 is placed below the material to be tested 8, and under the action of the pressure of the material to be tested 8, one end of the first electrode is in close contact with the material to be tested 8 for measurement, so that the measurement of the material to be tested 8 is more accurate, and it is avoided to punch holes on the material to be tested 8 to position the electrode, and any position and length of the material to be tested 8 of different lengths can be detected, and the operation is simple;

[0044] The first sliding electrode sleeve 4 includes a first detection part, a first sliding part is provided at the lower side of the first detection part, the first detection part slides in cooperation with the sliding groove 12, a receiving space 47 is provided inside the first sliding electrode sleeve 4, and the first detection part is provided with a first opening connected to the receiving space 47. By setting the first detection part to slide in cooperation with the sliding groove 12, the first detection part is provided with a first opening connected to the receiving space 47, so that the first electrode is placed in the receiving space 47, and the end of the first electrode leaks out from the first opening. The first detection part slides in cooperation with the sliding groove 12 to drive the first electrode to slide in the sliding groove 12, so that the first electrode can flexibly contact different positions at the bottom of the material 8 to be tested;

[0045] The first detection part includes an arc plate 41, and the first sliding part includes a vertical plate 44. The arc plate 41 slides with the shallow part 121 of the sliding groove, and the vertical plate 44 slides with the deep part 122 of the sliding groove. Preferably, the first sliding electrode sleeve 4 is T-shaped. By setting the first detection part as an arc plate 41, the first sliding electrode sleeve 4 can be fitted with the surface of the material to be tested 8, and close contact with the first electrode can be achieved under the action of the sample's own weight. By setting the first sliding part with a vertical plate 44, the first sliding electrode sleeve 4 can slide in the sliding groove 12, and the first sliding electrode sleeve can be flexibly adjusted. 4; more preferably, the accommodating space 47 is composed of a semi-spherical hole 471 and a cylindrical hole 472, the semi-spherical hole 471 is arranged in the middle of the upper part of the arc plate 41, and the cylindrical hole 472 is arranged in the middle of the interior of the vertical plate 44; by setting the semi-spherical hole 471 in the middle of the upper part of the arc plate 41 and the cylindrical hole 472 in the middle of the interior of the vertical plate 44, the first electrode head is placed in the semi-spherical hole 471, and the first electrode line is placed in the cylindrical hole 472, so that the first electrode is fixed as a whole in the interior of the accommodating space 47 to prevent the first electrode from falling off;

[0046] The second sliding electrode sleeve 5 includes a second detection part, a second sliding part is provided at the lower side of the second detection part, a second accommodating space 53 is provided inside the second sliding electrode sleeve 5, and the second detection part is provided with a second opening connected to the second accommodating space 53; a second sliding part is provided at the lower side of the second detection part, and the second detection part is provided with a second opening connected to the second accommodating space 53, so that the second electrode is placed in the accommodating space of the second detection part, and the end of the second electrode leaks out through the second opening and moves through the second sliding part, so that the second electrode contacts the two ends of the material 8 to be tested;

[0047] The second detection part includes a semicircular table 51, and the second sliding part includes a vertical table 52. The vertical table 52 is located at the lower side of the semicircular table 51. The semicircular table 51 is wider than the shallow part 121 of the sliding groove, and the vertical table 52 is slidably matched with the deep part 122 of the sliding groove. By setting the semicircular table 51, the telescopic device is pressed against the second sliding electrode sleeve 5, so that the second sliding electrode sleeve 5 is in closer contact with the material to be tested 8, so that the test of the two ends of the material to be tested 8 is more accurate. By setting the width of the semicircular table 51 to be wider than the shallow part 121 of the sliding groove, the second sliding electrode sleeve 5 is placed in the sliding groove 12 and will not fall. The movement of the second sliding electrode sleeve 5 can be controlled by pushing and pulling the extension of the vertical table 52. Preferably, the second accommodating space 53 is a combination of a semicircular spherical hole 531 and a groove 532. The second semi-spherical hole 531 is opened at the center of the semi-circular table 51, and the groove 532 is connected with the second semi-spherical hole 531 and is opened in the direction of the vertical table 52. By setting the second accommodating cavity, the second electrode can be placed in the second accommodating space 53, so that the second electrode and the material to be tested 8 are in close contact under the action of the top tightening force. The second accommodating space 53 is composed of the second semi-spherical hole 531 and the groove 532, so that the head of the second electrode is placed in the second semi-spherical hole 531, so that the second electrode line is placed in the groove 532, and the second electrode is fixed in the second accommodating space 53 as a whole under the action of the top tightening force. The two second sliding electrode sleeves 5 placed in the second electrode cooperate with each other to measure the current at both ends of the material to be tested 8, ensuring that the current signal can be read smoothly;

[0048] The sliding groove 12 includes a sliding groove deep portion 122, and the first sliding portion and the second sliding portion are slidably connected to the sliding groove deep portion 122; the first sliding portion and the second sliding portion are slidably connected to the sliding groove deep portion 122, thereby driving the first electrode and the second electrode to slide in the sliding groove 12, and by setting the sliding groove deep portion 122, the electrode wire placed in the first sliding portion and the second sliding portion passes through the sliding groove 12 and is connected to the current; the sliding groove 12 also includes a sliding groove shallow portion 121, and the first detection portion is slidably connected to the sliding groove shallow portion 121. Preferably, the sliding groove 12 is T-shaped, and more preferably, the top of the first detection portion matches the shape of the sliding groove shallow portion 121, and the second detection portion is wider than the sliding groove shallow portion 121; by setting the sliding groove shallow portion 121, the sliding groove shallow portion 121 is slidably connected to the first detection portion The first electrode is connected so that the first electrode moves in the sliding groove 12 and is located at the bottom of the material to be tested 8; by setting the sliding groove 12 to be T-shaped, the first sliding electrode sleeve 4 and the second sliding electrode sleeve 5 can be stably placed and slid, and the sliding groove 12 does not penetrate the semicircular tube body 1 along the length direction, thereby ensuring the integrity of the entire semicircular tube body 1 and ensuring that the entire test fixture is firm and stable; the top of the first detection part matches the shape of the shallow part 121 of the sliding groove, so that the material to be tested 8 is stably placed on the first detection part, so that the first electrode head of the first detection part contacts the bottom of the material to be tested 8, and the second detection part is wider than the shallow part 121 of the sliding groove, so that the second sliding electrode sleeve 5 is placed in the sliding groove 12 and will not fall, and the second detection part is located above the sliding groove 12 and contacts the two ends of the material to be tested 8, thereby facilitating detection.

[0049] The semicircular tube body 1, the first sliding electrode sleeve 4, the second sliding electrode sleeve 5 and the telescopic mechanism 7 are all made of high-temperature resistant insulating boron nitride materials, and the slidable baffle 3, the fixed baffle 2 and the bracket 6 are made of high-temperature resistant boron nitride or graphite materials. Boron nitride has good insulation and has thermal conductivity similar to that of metal at high temperatures. It is resistant to high temperatures of nearly 2000°C and is easy to process and shape, which well meets the test requirements;

[0050] The slidable baffle plate 3 is provided with a positioning hole 31, and the positioning hole 31 is located on the upper side of the side of the semicircular tube body 1; the upper side of the side of the semicircular tube body 1 is provided with a plurality of adjustment holes 11, and the adjustment holes 11 and the positioning holes 31 are used to cooperate with each other to realize the fixing of the slidable baffle plate 3 and the semicircular tube body 1 at different positions. By providing the positioning holes 31 on the slidable baffle plate 3, the slidable baffle plate 3 is fixed to the semicircular tube body 1 by means of bolts and nuts. By providing a plurality of adjustment holes 11 on the upper side of the side of the semicircular tube body 1, the placement space can be adjusted according to the length of the material to be tested 8; when in use, the material to be tested is placed The material to be tested 8 is placed at the bottom of the semicircular tube body 1, and then the position of the slidable baffle 3 is adjusted according to the size of the material to be tested 8. When the slidable baffle 3 is adjusted to be close to the end face of the material to be tested 8, the second sliding electrode sleeve 5 and the material to be tested 8 are fixed by the tightening screw 7 to ensure that the electrode inserted in the second sliding electrode sleeve 5 is in close contact with the end face of the material to be tested 8; at the same time, under the action of gravity, the bottom surface of the material to be tested 8 is in close contact with the electrode inserted in the first sliding electrode sleeve 4, and the four electrodes are respectively led outside the high temperature environment and connected to the room temperature resistivity test equipment, thereby realizing the high temperature resistivity test of the material to be tested 8.

[0051] Embodiment 2:

[0052] The same contents as those in the first embodiment are not described in detail here. The differences between the first embodiment and the present embodiment are as follows:

[0053] The first detection part includes an arc plate 1 41, a screw 43 is arranged on the lower side of the arc plate 1 41, the first sliding part includes an arc plate 2 42, a vertical plate 2 45 is arranged on the lower side of the arc plate 2 42, the screw 43 penetrates the arc plate 2 42 and is threadedly connected with the vertical plate 2 45, the lower surface of the arc plate 1 41 coincides with the upper surface of the arc plate 2 42, the arc plate 2 42 slides in cooperation with the shallow part 121 of the sliding groove, and the vertical plate 2 45 slides in cooperation with the deep part 122 of the sliding groove; preferably, a scale 46 is arranged on the arc plate 2 42; more preferably, the accommodating space 1 47 is a semi-spherical hole The arc plate 1 41 is composed of a cylindrical hole 472 and a through hole 473. The semi-spherical hole 471 is arranged in the middle of the upper part of the arc plate 1 41, the cylindrical hole 472 is arranged in the middle of the inner part of the screw 43, and the through hole 473 is arranged in the middle of the inner part of the vertical plate 2 45. The first detection part is the arc plate 1 41, the first sliding part includes the arc plate 2 42, and the lower side of the arc plate 2 42 is provided with a vertical plate 2 45. The screw 43 penetrates the arc plate 2 42 and is threadedly connected with the vertical plate 2 45. The arc plate 2 42 is provided with a ruler 46, which can adjust the upper and lower distances between the arc plate 1 41 and the arc plate 2 42 , before the material to be tested 8 is tightened by the telescopic mechanism 7, the position of the contact point between the two first electrode sleeves and the material to be tested 8 is on the same axis as the telescopic mechanism 7, so that the material to be tested 8 can be placed on the two first sliding electrode sleeves 4 first, so that the material to be tested 8 is in contact with the first electrodes in the two first sliding electrode sleeves 4, and the axis of the material to be tested 8 is the same as the axis of the telescopic mechanism 7, and then the material to be tested 8 is tightened by the telescopic mechanism 7, so that the material to be tested 8 is clamped in a horizontal state for testing, so that the detection accuracy is more accurate, and the lower surface of the arc plate 41 It is consistent with the upper surface of the arc plate 42, so that the starting point of the arc plate 41 is aligned with the ruler 46, so as to accurately measure the height of the arc plate 41. The semi-spherical hole 471 is set in the middle of the upper part of the arc plate 41, the cylindrical hole 472 is set in the middle of the screw 43, and the through hole 473 is set in the middle of the vertical plate 45. The first electrode head is placed in the semi-spherical hole 471, and the first electrode line is placed in the cylindrical hole 472 and the through hole 473. The first electrode is fixed as a whole in the accommodating space 47 to prevent the first electrode from falling off.

[0054] The above embodiments are only used to illustrate the technical solutions of the utility model, rather than to limit them; based on the embodiments of the utility model, all other embodiments obtained by ordinary technicians in this field without creative work are within the scope of protection of the utility model. Although the utility model is described in detail with reference to the above embodiments, ordinary technicians in this field should understand that they can still modify the technical solutions recorded in the above embodiments, or replace some of the technical features therein by equivalents; and these modifications or replacements do not make the essence of the corresponding technical solutions deviate from the spirit and scope of the technical solutions of the embodiments of the utility model.

Claims

1. A non-destructive test fixture for high temperature resistivity of a material, comprising a semi-circular tube (1), a plurality of brackets (6) being arranged on the lower side of the semi-circular tube (1), characterized in that: A fixed baffle (2) is fixedly provided at one end of the semi-circular tube (1), and a slidable baffle (3) is slidably provided at the other end of the semi-circular tube (1); a telescopic mechanism (7) is movably provided on the fixed baffle (2) and the slidable baffle (3); a sliding groove (12) is provided at the bottom of the semi-circular tube (1); at least two first sliding electrode sleeves (4) and at least two second sliding electrode sleeves (5) are slidably connected to the sliding groove (12); and the second sliding electrode sleeves (5) are located between the fixed baffle (2) and the slidable baffle (3).

2. A nondestructive test fixture for high temperature resistivity of a material according to claim 1, characterized in that: The first sliding electrode sleeve (4) comprises a first detection part, a first sliding part is arranged at the lower side of the first detection part, the first detection part slides in cooperation with the sliding groove (12), a receiving space (47) is arranged inside the first sliding electrode sleeve (4), and the first detection part is provided with a first opening connected to the receiving space (47).

3. A nondestructive test fixture for high temperature resistivity of a material according to claim 2, characterized in that: The second sliding electrode sleeve (5) comprises a second detection part, a second sliding part is arranged at the lower side of the second detection part, a second accommodating space (53) is arranged inside the second sliding electrode sleeve (5), and the second detection part is provided with a second opening connected to the second accommodating space (53).

4. A nondestructive test fixture for high temperature resistivity of a material according to claim 3, characterized in that: The sliding groove (12) comprises a sliding groove deep portion (122), and the first sliding portion and the second sliding portion are slidably connected to the sliding groove deep portion (122).

5. A nondestructive test fixture for high temperature resistivity of a material according to claim 4, characterized in that: The sliding groove (12) further comprises a sliding groove shallow portion (121), and the first detection portion is slidably connected to the sliding groove shallow portion (121).

6. A nondestructive test fixture for high temperature resistivity of materials according to claim 5, characterized in that: The sliding groove (12) is T-shaped.

7. A nondestructive test fixture for high temperature resistivity of a material according to claim 5, characterized in that: The top of the first detection portion matches the shape of the shallow portion (121) of the sliding groove, and the second detection portion is wider than the shallow portion (121) of the sliding groove.

8. A nondestructive test fixture for high temperature resistivity of a material according to claim 7, characterized in that: The first detection part includes an arc-shaped plate 1 (41), and the first sliding part includes a vertical plate 1 (44). The arc-shaped plate 1 (41) slides in cooperation with the shallow part (121) of the sliding groove, and the vertical plate 1 (44) slides in cooperation with the deep part (122) of the sliding groove.

9. A nondestructive test fixture for high temperature resistivity of a material according to claim 2, characterized in that: The first sliding electrode sleeve (4) is T-shaped.

10. A nondestructive test fixture for high temperature resistivity of a material according to claim 8, characterized in that: The accommodating space (47) is composed of a semi-spherical hole (471) and a cylindrical hole (472). The semi-spherical hole (471) is arranged in the middle of the upper part of the arc plate (41), and the cylindrical hole (472) is arranged in the middle of the interior of the vertical plate (44).

11. A nondestructive test fixture for high temperature resistivity of a material according to claim 7, characterized in that: The first detection part comprises an arc plate 1 (41), a screw rod (43) is arranged on the lower side of the arc plate 1 (41), the first sliding part comprises an arc plate 2 (42), a vertical plate 2 (45) is arranged on the lower side of the arc plate 2 (42), the screw rod (43) passes through the arc plate 2 (42) and is threadedly connected with the vertical plate 2 (45), the lower surface of the arc plate 1 (41) is consistent with the upper surface of the arc plate 2 (42), the arc plate 2 (42) slides in cooperation with the shallow part (121) of the sliding groove, and the vertical plate 2 (45) slides in cooperation with the deep part (122) of the sliding groove.

12. A nondestructive test fixture for high temperature resistivity of a material according to claim 11, characterized in that: A scale (46) is arranged on the second arc-shaped plate (42).

13. A nondestructive test fixture for high temperature resistivity of a material according to claim 11, characterized in that: The accommodating space 1 (47) is composed of a semi-spherical hole 1 (471), a cylindrical hole (472) and a through hole (473). The semi-spherical hole 1 (471) is arranged in the middle of the upper part of the arc plate 1 (41), the cylindrical hole (472) is arranged in the middle of the inner part of the screw rod (43), and the through hole (473) is arranged in the middle of the inner part of the vertical plate 2 (45).

14. A nondestructive test fixture for high temperature resistivity of a material according to claim 7, characterized in that: The second detection part comprises a semicircular table (51), and the second sliding part comprises a vertical table (52). The vertical table (52) is located at the lower side of the semicircular table (51). The semicircular table (51) is wider than the shallow part (121) of the sliding groove. The vertical table (52) is slidably matched with the deep part (122) of the sliding groove.

15. A nondestructive test fixture for high temperature resistivity of a material according to claim 14, characterized in that: The second accommodating space (53) is composed of a second semi-spherical hole (531) and a groove (532). The second semi-spherical hole (531) is opened at the center of the semi-circular platform (51), and the groove (532) is connected to the second semi-spherical hole (531) and opened along the direction of the vertical platform (52).

16. A nondestructive test fixture for high temperature resistivity of materials according to claim 1, characterized in that: The semicircular tube body (1), the first sliding electrode sleeve (4), the second sliding electrode sleeve (5) and the telescopic mechanism (7) are all made of high-temperature resistant insulating boron nitride materials, and the slidable baffle (3), the fixed baffle (2) and the bracket (6) are made of high-temperature resistant boron nitride or graphite materials.

17. A nondestructive test fixture for high temperature resistivity of materials according to claim 1, characterized in that: The slidable baffle (3) is provided with a positioning hole (31), and the positioning hole (31) is located on the upper side of the side of the semi-circular tube (1); the upper side of the side of the semi-circular tube (1) is provided with a plurality of adjustment holes (11), and the adjustment holes (11) and the positioning holes (31) are used to cooperate with each other to realize the fixing of the slidable baffle (3) and the semi-circular tube (1) at different positions.