IV tester shielding device

By designing an IV tester cover device with adjustable light irradiation, the problem of poor measurement accuracy of the IV tester is solved, and the accuracy and product quality of photovoltaic components are improved.

CN222423633UActive Publication Date: 2025-01-28TANGSHAN HAITAI NEW ENERGY TECH CO LTD
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Patent Information

Application Number
CN202420535602.6
Authority / Receiving Office
CN · China
Patent Type
Utility models(China)
Current Assignee / Owner
Filing Date
2024-03-19
Publication Date
2025-01-28
Estimated Expiration
2034-03-19

AI Technical Summary

Technical Problem

The IV tester has poor measurement accuracy in photovoltaic module detection, which affects the product quality of photovoltaic modules.

Method used

The IV tester cover device is designed, including the first cover and the second cover. The bottom surface of the first cover is set with multiple first -side boards. There are multiple second -side plates, and the second cover and the first cover can be relative to rotate, adjusting the light of the light to improve the measurement accuracy.

Benefits of technology

By adjusting the amount of light, the measurement accuracy of the IV tester has been improved, the effect of light on the measurement data is reduced, and the quality of the photovoltaic component is ensured.

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Abstract

The utility model relates to the technical field of shielding equipment, in particular to an IV tester shielding device. In the IV tester shielding device provided by the embodiment of the invention, a plurality of first side plates are arranged on the bottom surface of a first cover plate, a plurality of second side plates are arranged on the top surface of a second cover plate, an annular groove is further formed in the top surface of the second cover plate, the annular groove is located outside the second side plates, and the first cover plate is slidably arranged in a sliding groove through the first side plates. In actual use, the IV tester can be placed in the cavity defined by the first cover plate, the first side plate, the second cover plate and the second side plate, so that the amount of light irradiated on the IV tester can be adjusted by rotating the first cover plate according to the field environment. By adopting the structural design, the amount of light irradiated by the IV tester can be adjusted, so that the influence of excessive illumination on the accuracy of measured data is avoided.
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Description

Technical Field

[0001] The utility model relates to the technical field of shielding equipment, in particular to a shielding device for an IV tester. Background Art

[0002] The principle of IV testing of photovoltaic modules is based on the photovoltaic effect and electrical principles: when light shines on a photovoltaic module, photons will stimulate electron transitions in the material. Under the action of the electric field, electrons and holes will move to the two ends respectively to form a current.

[0003] In the related art, an IV tester is generally used to test photovoltaic modules: the photovoltaic modules are connected to the circuit of the IV tester, and different current and voltage values ​​are applied using a current source and a voltage source to measure the output current and voltage of the photovoltaic modules. Ensure that the current and voltage in the measurement circuit do not exceed the rated value of the photovoltaic module to avoid damage to it. In the actual test process, the numerical accuracy of the output current and voltage measured by the IV tester is poor, which will affect the product quality of the photovoltaic module. Summary of the invention

[0004] In view of this, an embodiment of the present application provides an IV tester shielding device to solve the problem of poor measurement accuracy of IV testers in related technologies.

[0005] In order to solve the above technical problems, the embodiments of the present application provide the following technical solutions:

[0006] An IV tester shielding device, comprising:

[0007] A first cover plate, wherein a plurality of first side plates are disposed on the bottom surface of the first cover plate, the plurality of first side plates are equidistantly distributed on the bottom surface of the first cover plate, and a shape formed by the plurality of first side plates is a circle;

[0008] A second cover plate, wherein an annular groove is arranged on the top surface of the second cover plate, and a plurality of the first side plates are located in the annular groove, and the second cover plate and the first cover plate can rotate relative to each other; a plurality of second side plates are also arranged on the top surface of the second cover plate, and a plurality of the second side plates are located in the annular groove, and a shape formed by the plurality of the second side plates is a circle, and an outer diameter of the circle formed by the second side plates is smaller than an outer diameter of the circle formed by the first side plates; the second side plate contacts the bottom surface of the first cover plate.

[0009] To further optimize the technical solution, the width of each of the second side panels is equal to the spacing between adjacent first side panels.

[0010] To further optimize the technical solution, an elastic interlayer is provided at a position of the first side plate close to the second side plate, and the elastic interlayer is located between the adjacent first side plate and the second side plate to close a gap therebetween.

[0011] To further optimize the technical solution, the first side plate and the second side plate are respectively provided with wire holes.

[0012] To further optimize the technical solution, the width of each of the second side panels is greater than the spacing between adjacent first side panels.

[0013] The IV tester shielding device provided in the embodiment of the present application has at least the following beneficial effects:

[0014] In the IV tester shielding device provided in the embodiment of the present application, the bottom surface of the first cover plate is provided with a plurality of first side plates, the top surface of the second cover plate is provided with a plurality of second side plates, the top surface of the second cover plate is further provided with an annular groove, the annular groove is located outside the second side plate, and the first cover plate is slidably disposed in the sliding groove through the first side plate. In actual use, the IV tester can be placed in the cavity surrounded by the first cover plate, the first side plate and the second cover plate and the second side plate, so that the amount of light irradiated to the IV tester can be adjusted by rotating the first cover plate according to the on-site environment. With the above-mentioned structural design, the amount of light irradiated to the IV tester can be adjusted, thereby avoiding the accuracy of the measurement data being affected by excessive light. BRIEF DESCRIPTION OF THE DRAWINGS

[0015] In order to more clearly illustrate the embodiments of the utility model or the technical solutions in the prior art, the drawings required for use in the embodiments or the description of the prior art will be briefly introduced below. Obviously, the drawings described below are only some embodiments of the utility model. For ordinary technicians in this field, other drawings can be obtained based on these drawings without paying creative work.

[0016] Figure 1 This is a schematic diagram of the structure of the shielding device of the IV tester according to an embodiment of the present application;

[0017] Figure 2 This is a schematic diagram of the light leakage state of the shielding device of the IV tester according to an embodiment of the present application;

[0018] Figure 3 This is a schematic diagram of the explosion structure of the shielding device of the IV tester according to an embodiment of the present application.

[0019] In the figure:

[0020] 100, first cover plate; 110, first side plate; 200, second cover plate; 210, annular groove; 220, second side plate; 300, wire hole. DETAILED DESCRIPTION

[0021] In order to make the purpose, technical solution and advantages of the utility model clearer, the utility model is further described in detail below in combination with specific implementation methods and with reference to the accompanying drawings. It should be understood that these descriptions are only exemplary and are not intended to limit the scope of the utility model. In addition, in the following description, the description of well-known structures and technologies is omitted to avoid unnecessary confusion of the concept of the utility model.

[0022] An IV tester shielding device, comprising:

[0023] A first cover plate 100, wherein a plurality of first side plates 110 are disposed on the bottom surface of the first cover plate 100, wherein the plurality of first side plates 110 are equidistantly distributed on the bottom surface of the first cover plate 100, and a shape formed by the plurality of first side plates 110 is a circle;

[0024] A second cover plate 200, wherein an annular groove 210 is disposed on the top surface of the second cover plate 200, and a plurality of the first side plates 110 are located in the annular groove 210, and the second cover plate 200 and the first cover plate 100 can rotate relative to each other; a plurality of second side plates 220 are also disposed on the top surface of the second cover plate 200, and a plurality of the second side plates 220 are located in the annular groove 210, and a shape formed by the plurality of the second side plates 220 is a circle, and an outer diameter of the circle formed by the second side plates 220 is smaller than an outer diameter of the circle formed by the first side plates 110; the second side plate 220 contacts the bottom surface of the first cover plate 100.

[0025] like Figure 1-Figure 3 As shown, the IV tester shielding device provided in the embodiment of the present application includes a first cover plate 100 and a second cover plate 200, wherein a plurality of first side plates 110 are arranged on the bottom surface of the first cover plate 100, and the plurality of first side plates 110 are equidistantly distributed on the bottom surface of the first cover plate 100, and each first side plate 110 may be an arc-shaped plate. In this embodiment, the figure surrounded by the plurality of first side plates 110 is a circle, and gaps are arranged between adjacent first side plates 110, and the distance of each gap is equal.

[0026] The top surface of the second cover plate 200 is provided with an annular groove 210, and the plurality of first side plates 110 of the first cover plate 100 are slidably arranged in the annular groove 210, so that the first cover plate 100 can rotate relative to the second cover plate 200. A plurality of second side plates 220 are also provided on the top surface of the second cover plate 200, and the plurality of second side plates 220 are located in the inner ring of the annular groove 210. The plurality of second side plates 220 are equidistantly distributed on the top surface of the second cover plate 200, and each second side plate 220 is an arc-shaped plate. The figure surrounded by the plurality of second side plates 220 is a circle. Since the second side plates 220 are located in the inner ring of the annular groove 210, the outer diameter of the circle surrounded by the second side plates 220 is smaller than the outer diameter of the circle surrounded by the first side plates 110. In addition, each second side plate 220 is in contact with the bottom surface of the first cover plate 100.

[0027] In this embodiment, the plurality of first side panels 110 and the plurality of second side panels 220 may be in a state of being attached to each other. In actual use, the IV tester may be placed in a cavity surrounded by the first cover plate 100, the second cover plate 200, the first side panel 110 and the second side panel 220, so that the first cover plate 100 and the first side panel 110 may be rotated so that the first side panel 110 can block the gap between the second side panels 220 to adjust the amount of light entering the cavity from the outside.

[0028] To further optimize the technical solution, the width of each of the second side panels 220 is equal to the spacing between adjacent first side panels 110 .

[0029] To further optimize the technical solution, an elastic interlayer is provided at a position of the first side plate 110 close to the second side plate 220 , and the elastic interlayer is located between the adjacent first side plate 110 and the second side plate 220 to close the gap therebetween.

[0030] To further optimize the technical solution, the first side plate 110 and the second side plate 220 are respectively provided with a wire hole 300 .

[0031] To further optimize the technical solution, the width of each second side plate 220 is greater than the spacing between adjacent first side plates 110, and each first side plate 110 and second side plate 220 is provided with a wire hole 300. In actual use, after placing the IV tester in the cavity, the wire can extend from the wire hole 300 to connect with the external photovoltaic assembly, and the relative position of the first side plate 110 and the second side plate 220 can be adjusted according to the thickness of the wire, so that the outer diameter of the wire hole 300 is adapted to the outer diameter of the wire, thereby realizing the function of further adjusting the amount of light.

[0032] The various embodiments or implementation methods in this specification are described in a progressive manner. Each embodiment focuses on the differences from other embodiments, and the same or similar parts between the various embodiments can be referenced to each other.

[0033] It should be noted that the phrases "one embodiment", "an embodiment", "an exemplary embodiment", "some embodiments", etc. mentioned in the specification indicate that the described embodiments may include certain features, structures or characteristics, but not every embodiment may include the certain features, structures or characteristics. In addition, such phrases do not necessarily refer to the same embodiment. In addition, when describing certain features, structures or characteristics in conjunction with an embodiment, it is within the knowledge of those skilled in the art to implement such features, structures or characteristics in conjunction with other embodiments, whether explicitly or not explicitly described.

[0034] In general, terms should be understood, at least in part, by the context in which they are used. For example, the term "one or more" as used herein may be used to describe any feature, structure, or characteristic in a singular sense, or may be used to describe a combination of features, structures, or characteristics in a plural sense, depending, at least in part, on the context. Similarly, terms such as "a," "an," or "the" may also be understood to convey singular usage or to convey plural usage, depending, at least in part, on the context.

[0035] It should be easily understood that “on,” “above,” and “over” in the present disclosure should be interpreted in the broadest manner, so that “on” not only means “directly on something,” but also includes the meaning of “on something” with intervening features or layers therebetween, and “above” or “over” not only includes the meaning of “above” or “over,” but also may include the meaning of “above” or “over something” with no intervening features or layers therebetween (i.e., directly on something).

[0036] In addition, spatially relative terms, such as "below," "below," "beneath," "above," "above," etc., may be used herein for ease of description to describe the relationship of one element or feature relative to other elements or features as shown in the figures. Spatially relative terms are intended to encompass different orientations of the device in use or operation in addition to the orientation shown in the figures. The device may have other orientations (rotated 90 degrees or at other orientations), and the spatially relative descriptors used herein may likewise be interpreted accordingly.

[0037] The term "substrate" as used herein refers to the material on which subsequent material layers are added. The substrate itself may be patterned. The material added on top of the substrate may be patterned, or may remain unpatterned. In addition, the substrate may include a wide range of materials, such as silicon, germanium, gallium arsenide, indium phosphide, etc. Alternatively, the substrate may be made of a non-conductive material (e.g., glass, plastic, or sapphire wafer, etc.).

[0038] The term "layer" used in the text may refer to a material portion including an area with a certain thickness. A layer may extend over the entire underlying structure or overlying structure, or may have a range smaller than the range of the underlying or overlying structure. In addition, a layer may be an area of ​​a homogeneous or inhomogeneous continuous structure, the thickness of which is less than the thickness of the continuous structure. For example, a layer may be located between the top surface and the bottom surface of the continuous structure or between any paired lateral planes at the top surface and the bottom surface. A layer may extend laterally, vertically and / or along a tapered surface. A substrate may be a layer, may include one or more layers therein, and / or may have one or more layers located thereon, above it and / or below it. A layer may include multiple layers. For example, an interconnect layer may include one or more conductors and a contact layer (forming contacts, interconnects and / or vias therein) and one or more dielectric layers.

[0039] Finally, it should be noted that the above embodiments are only used to illustrate the technical solutions of the present application, rather than to limit it. Although the present application has been described in detail with reference to the aforementioned embodiments, those skilled in the art should understand that they can still modify the technical solutions described in the aforementioned embodiments, or replace some or all of the technical features therein with equivalents. However, these modifications or replacements do not cause the essence of the corresponding technical solutions to deviate from the scope of the technical solutions of the embodiments of the present application.

Claims

1. A shielding device for an IV tester, characterized in that: include: A first cover plate, wherein a plurality of first side plates are disposed on the bottom surface of the first cover plate, the plurality of first side plates are equidistantly distributed on the bottom surface of the first cover plate, and a shape formed by the plurality of first side plates is a circle; A second cover plate, wherein an annular groove is arranged on the top surface of the second cover plate, and a plurality of the first side plates are located in the annular groove, and the second cover plate and the first cover plate can rotate relative to each other; a plurality of second side plates are also arranged on the top surface of the second cover plate, and a plurality of the second side plates are located in the annular groove, and a shape formed by the plurality of the second side plates is a circle, and an outer diameter of the circle formed by the second side plates is smaller than an outer diameter of the circle formed by the first side plates; the second side plate contacts the bottom surface of the first cover plate.

2. The IV tester shielding device according to claim 1, characterized in that: The width of each of the second side panels is equal to the distance between adjacent first side panels.

3. The IV tester shielding device according to claim 2, characterized in that: An elastic interlayer is disposed at a position of the first side plate close to the second side plate, and the elastic interlayer is located between the adjacent first side plate and the second side plate to close a gap therebetween.

4. The IV tester shielding device according to claim 1, characterized in that: The first side plate and the second side plate are respectively provided with wire holes.

5. The IV tester shielding device according to claim 4, characterized in that: The width of each of the second side panels is greater than the distance between adjacent first side panels.