Raman spectrum detection device suitable for transparent samples with different sizes

By designing a Raman spectral detection device suitable for transparent samples of different sizes, using adjustable fixing devices and silicon wafer substrates, the detection error problems caused by sample instability and over-focus are solved, and the accuracy of the detection results is improved.

CN222439365UActive Publication Date: 2025-02-07XIAMEN UNIV
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Patent Information

Application Number
CN202420922718.5
Authority / Receiving Office
CN · China
Patent Type
Utility models(China)
Current Assignee / Owner
Filing Date
2024-04-29
Publication Date
2025-02-07
Estimated Expiration
2034-04-29

AI Technical Summary

Technical Problem

When using transparent block samples, the existing Raman spectroscopy detection technology causes detection errors, and the transparency leads to overfocus and miscellaneous peak interference, affecting the accuracy of the detection results.

Method used

A Raman spectral detection device suitable for transparent samples of different sizes is designed, using adjustable fixtures and silicon wafers as substrates to ensure the sample is fixed and reduce impurity interference.

Benefits of technology

Through this device, it is possible to ensure that the sample is fixed, reduce errors, and eliminate impurity peaks through the silicon wafer substrate to improve the accuracy of the detection results without the need to process the sample size in advance.

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Abstract

A Raman spectrum detection device suitable for transparent samples with different sizes is characterized by comprising a fixing device and a substrate, the fixing device comprises a positioning butterfly bolt, a positioning butterfly bolt, an uncovered cubic outer cover and a rubber gasket, and the substrate is a silicon wafer with a proper size. The positioning butterfly bolt penetrates through the left baffle and the right baffle of the uncovered cubic outer cover, the positioning butterfly bolt penetrates through the front baffle and the rear baffle of the uncovered cubic outer cover, and the silicon wafer is placed at the bottom of the uncovered cubic outer cover. According to the utility model, the conditions of sample sliding and over-focusing during Raman spectrum detection can be prevented, the occurrence of miscellaneous peaks in a detection spectrum can be effectively shielded, and the detection accuracy is improved.
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Description

Technical Field

[0001] The utility model relates to the technical field of spectrum analysis and detection, in particular to a Raman spectrum detection device suitable for transparent samples of different sizes. Background Art

[0002] Raman spectroscopy is a type of scattering spectrum. Raman spectroscopy is an analytical method based on the Raman scattering effect. It analyzes the scattering spectrum with a different frequency from the incident light to obtain information on molecular vibration and rotation, and is applied to molecular structure research. By analyzing the Raman spectrum, the molecular vibration energy level (lattice vibration energy level) and rotation energy level structure can be obtained. Raman spectroscopy technology has the advantages of fast, simple, repeatable and non-destructive qualitative and quantitative analysis, and is widely used in the structural identification and detection research of organic matter, polymers, biomacromolecules, crystals and other materials.

[0003] At present, there are two problems when using Raman spectroscopy to detect transparent bulk samples including crystals.

[0004] First, when it comes to the composition and structure information of the sample surface, due to the different crystal plane orientations of the crystal, the Raman spectral information caused by the Raman incident laser irradiating different crystal plane orientations on the sample surface is different, so it is crucial to have a fixed and stable device for the sample. At present, the commonly used fixing method for Raman detection is to use a glass sheet with a groove (quartz glass crystal SiO2) as a carrier to load the sample. The size of the groove is fixed, so each time the sample is tested, the sample size needs to be cut to match the size of the groove. The size of the sample is difficult to match the groove, and the sample is easy to move during the test, resulting in information errors in the detection.

[0005] Second, due to the transparency of the sample, overfocusing and secondary focusing are likely to occur when the Raman eyepiece is focused, resulting in the actual laser focus position not being the surface information of the transparent sample during the sample focusing process, but focusing on the glass sheet, and the corresponding test results cannot be obtained. The glass slide is made of quartz glass, and its Raman spectrum signal has obvious interference at low wavenumbers, and the test results will also contain problems such as stray peaks.

[0006] In view of the above two problems, the utility model proposes a Raman spectrum detection device suitable for transparent samples of different sizes, which can adjust the space size and overcome the problem of sample instability. At the same time, a silicon wafer is used instead of a glass slide to avoid the influence of interference peaks when the Raman test is overfocused. This detection device improves the accuracy of Raman spectrum testing of transparent block samples. Summary of the invention

[0007] The purpose of the utility model is to solve the above problems and provide a Raman spectrum detection device suitable for transparent samples of different sizes, which replaces the original glass sheet, thereby improving the detection efficiency and accuracy.

[0008] In order to achieve the above purpose, the utility model adopts the following technical solutions:

[0009] A Raman spectrum detection device suitable for transparent samples of different sizes, comprising a fixing device and a base, wherein the fixing device comprises two positioning butterfly bolts, two adjusting butterfly bolts, a coverless cubic outer cover and a rubber gasket, and the base is a silicon wafer of appropriate size. The fixing device is used to fix transparent block samples of different sizes and reduce the influence of the surrounding environment on the detection; the base is used to prevent overfocusing during detection and shield unnecessary signals.

[0010] The two positioning butterfly bolts are arranged opposite to each other and penetrate through the middle of the bottom of the front baffle plate and the rear baffle plate of the U-shaped outer cover.

[0011] The two adjusting butterfly bolts penetrate through the middle of the bottom of the left baffle and the right baffle of the U-shaped outer cover, and the positioning butterfly bolt and the adjusting butterfly bolt are two bolts with completely identical sizes.

[0012] The material of the coverless cube outer cover is polytetrafluoroethylene, and screw holes for positioning butterfly bolts and adjusting butterfly bolts are reserved at the bottom of the four baffles at the front, back, left and right sides.

[0013] The rubber gasket is placed between the positioning butterfly bolt or the adjusting butterfly bolt and the baffle.

[0014] The silicon chip is placed at the bottom of the uncovered cubic outer cover, and the size of the silicon chip matches the bottom baffle of the uncovered cubic outer cover.

[0015] Compared with the prior art, the utility model has the following beneficial effects:

[0016] The utility model fixes the test sample by using a fixing device. The four butterfly bolts of the fixing device can be flexibly adjusted to ensure that the sample is in close contact with the bolts to achieve a fixing effect. The bottom uses a silicon wafer as a substrate. The Raman spectrum of a standard silicon wafer has a strong Raman peak at a position of about 520cm -1 This Raman peak is one of the main characteristics of standard silicon wafers. When analyzing the results, the Raman peak of the silicon wafer is used as the basis to obtain the Raman spectrum of the sample, excluding the Raman peaks of other impurities. Therefore, the use of this device can ensure that the sample is fixed and will not move without processing the size of the sample in advance, thereby improving the test efficiency; at the same time, using the silicon wafer as the substrate can eliminate the interference of other material peaks and improve the accuracy of the test results. BRIEF DESCRIPTION OF THE DRAWINGS

[0017] Figure 1 It is a schematic diagram of the overall structure of the utility model;

[0018] Figure 2It is a side view schematic diagram of the utility model;

[0019] Figure 3 It is a top view schematic diagram of the utility model;

[0020] Figure numerals: 1 uncovered cubic outer cover, 2 positioning butterfly bolts, 3 adjusting butterfly bolts, 4 silicon wafer, 5 rubber gasket. DETAILED DESCRIPTION

[0021] In order to make the technical problems, technical solutions and beneficial effects to be solved by the present invention clearer and more understandable, the present invention is further described in detail below in conjunction with the accompanying drawings and embodiments.

[0022] See also Figures 1 to 3 The present embodiment provides a Raman spectrum detection device suitable for transparent samples of different sizes, including an uncovered cubic outer cover 1, a rubber gasket 5, a positioning butterfly bolt 2, an adjusting butterfly bolt 3, and a silicon wafer 4.

[0023] The material of the uncovered cubic outer cover 1 is polytetrafluoroethylene, and screw holes for positioning butterfly bolts and adjusting butterfly bolts are reserved in the middle of the bottom of the four baffles at the front, back, left and right sides;

[0024] Install two positioning butterfly bolts 2 and two adjusting butterfly bolts 3 into the screw holes, and add rubber gaskets 5 to the part of each bolt that contacts the baffle to prevent loosening when the bolts are tightened.

[0025] Specifically, two positioning butterfly bolts 2 are relatively arranged to pass through the bottom middle positions of the front baffle and the rear baffle of the uncovered cubic outer cover, and two adjusting butterfly bolts 3 are relatively arranged to pass through the bottom middle positions of the left baffle and the right baffle of the uncovered cubic outer cover.

[0026] The size of the silicon chip 4 matches the baffle at the bottom of the uncovered cubic outer cover, and the silicon chip 4 is placed at the bottom of the uncovered cubic outer cover 1 .

[0027] During the test, place the sample in the device, first rotate the positioning butterfly bolt 2 until the bolt fixes the sample, and then rotate the adjustment butterfly bolt 3 to ensure that the upper plane of the sample is in a horizontal state and does not deviate. When focusing, adjust the laser injection angle from the under-focus state to just focusing on the sample, with the focal spot located on the upper surface of the sample. Using the silicon wafer 4 as the substrate, the impurity peaks of other substances in the test results caused by over-focusing can be eliminated.

Claims

1. A Raman spectrum detection device suitable for transparent samples of different sizes, characterized by: It includes a fixing device, which includes a positioning butterfly bolt, an adjusting butterfly bolt, and a uncovered cube cover. The positioning butterfly bolt and the adjusting butterfly bolt are respectively provided with two. The two positioning butterfly bolts are relatively arranged to pass through the bottom middle position of the front baffle and the rear baffle of the uncovered cube cover. The two adjusting butterfly bolts are relatively arranged to pass through the bottom middle position of the left baffle and the right baffle of the uncovered cube cover. The fixing device is used to fix transparent block samples of different sizes and reduce the influence of the surrounding environment on the detection.

2. A Raman spectrum detection device suitable for transparent samples of different sizes as claimed in claim 1, characterized in that: It also includes a substrate, which is arranged at the bottom of the uncovered cubic outer cover and is used to prevent over-focusing during detection and shield unnecessary signals.

3. A Raman spectrum detection device suitable for transparent samples of different sizes as claimed in claim 2, characterized in that: The substrate is a silicon wafer whose dimensions match the baffle at the bottom of the uncovered cubic housing.

4. A Raman spectrum detection device suitable for transparent samples of different sizes as claimed in claim 1, characterized in that: The positioning butterfly bolt and the adjusting butterfly bolt are two bolts with completely identical sizes.

5. The Raman spectrum detection device suitable for transparent samples of different sizes as claimed in claim 1, characterized in that: The material of the coverless cube outer cover is polytetrafluoroethylene, and screw holes for positioning butterfly bolts and adjusting butterfly bolts are reserved in the middle of the bottom of the four baffles at the front, back, left and right sides.

6. A Raman spectrum detection device suitable for transparent samples of different sizes as claimed in claim 1, characterized in that: It also includes a rubber gasket, which is placed at the connection position between the positioning butterfly bolt or the adjusting butterfly bolt and the baffle to prevent loosening when the bolt is tightened.