Temperature probe capable of being quickly assembled and disassembled

Abstract

The utility model discloses a temperature probe capable of being quickly assembled and disassembled, which comprises an installation base and a temperature probe main body, and further comprises an electric connection structure, the electric connection structure comprises a conductive assembly and a contact assembly which are respectively arranged on the temperature probe main body and the installation base, the contact assembly comprises a first contact and a second contact, and the first contact and the second contact are arranged on the installation base. The conductive assembly comprises a first conductive sheet and a second conductive sheet, the first conductive sheet and the second conductive sheet are connected with the positive electrode and the negative electrode of the temperature probe main body, and the temperature probe main body is connected with the mounting base through a detachable structure. The first contact is in contact with the first conducting strip, and the second contact is in contact with the second conducting strip, so that the temperature probe body is electrically connected to the mounting base. According to the utility model, the structure is simple, the temperature probe main body is detachably connected with the mounting base, rapid disassembly and assembly are facilitated, the probe is convenient to replace, and the temperature probe can be electrically connected with an MCU after being mounted; and the split type design is adopted, so that the installation at any position can be met.

Description

Technical Field

[0001] The utility model relates to the field of detection devices, and specifically designs a temperature probe which can be quickly disassembled and assembled. Background Art

[0002] An outdoor grill is a food machine used by people to grill food outdoors using gas. To ensure the reliability and safety of the grill when used outdoors, a double-layer shell is generally used. Therefore, if the temperature probe of the outdoor grill is damaged and needs to be replaced or repaired, the inner shell needs to be removed or a separate inspection window needs to be reserved, which is complicated and increases the manufacturing cost. In addition, the temperature probe of the outdoor grill is often not placed in the best position due to installation interference. Therefore, it is very important to obtain a temperature probe that can be quickly disassembled and assembled to overcome the above defects. Utility Model Content

[0003] In order to solve at least one of the above-mentioned technical problems, the utility model provides a temperature probe that can be quickly disassembled and assembled, including a mounting base, a temperature probe body, and an electrical connection structure, the electrical connection structure including a conductive component and a contact component respectively arranged on the temperature probe body and the mounting base, the contact component including a first contact and a second contact, the conductive component including a first conductive sheet and a second conductive sheet, the first conductive sheet and the second conductive sheet connecting the positive and negative poles of the temperature probe body, the temperature probe body being connected to the mounting base via a detachable structure, so that the first contact contacts the first conductive sheet and the second contact contacts the second conductive sheet so that the temperature probe body is electrically connected to the mounting base.

[0004] The temperature probe body includes a temperature probe housing and a temperature sensing chip installed in the temperature probe housing. Two conductive wires extend from the chip, respectively connecting the first conductive sheet and the second conductive sheet, thus forming the positive and negative electrodes of the temperature probe body.

[0005] The second conductive sheet is a closed or open ring-shaped conductive sheet, and the first conductive sheet is disposed in a hollow portion of the ring-shaped conductive sheet.

[0006] As a preferred embodiment, the second conductive sheet is an annular conductive sheet, and the first conductive sheet is placed at the hollow center of the annular conductive sheet.

[0007] The first contact includes a first base, a first contact point and a first spring disposed in the first base, a first through hole is provided on the first base, and a first spring is provided between the first contact point and the first base so that the first contact point can pass through or retract from the first through hole. A third through hole is provided at the bottom of the first base, and a first wire electrically connected to the first contact point passes through the third through hole.

[0008] The second contact includes a second base, a second contact point, and a second spring. The second base has a second through hole. The second spring is disposed between the second contact point and the second base so that the second contact point can pass through or retract from the second through hole. A fourth through hole is disposed at the bottom of the second base. The second contact point is electrically connected to a second wire that passes through the fourth through hole.

[0009] The temperature probe body is connected to the mounting base via a detachable structure so that the first spring and / or the second spring are compressed to electrically connect the temperature probe body and the mounting base.

[0010] The first wire and the second wire are externally connected to the MCU controller of the outdoor oven to receive the information collected by the temperature probe.

[0011] The detachable structure includes threads that cooperate with each other and are arranged between the mounting base and the temperature probe body. The temperature probe body is threaded into the mounting base so that the first contact rubs against the first conductive sheet and / or the second contact rubs against the second conductive sheet to remove oxides on the first conductive sheet and / or the second conductive sheet.

[0012] When the temperature probe body is rotated into the mounting base, the second contact on the second spring of the mounting base contacts, rubs and compresses with the metal ring of the temperature probe body. The friction process can remove oxides on the second contact and the metal ring of the probe, and the compression process can ensure the contact pressure between the spring contact and the metal ring of the probe, thereby ensuring the reliability of the electrical connection.

[0013] If the first contact is not circular, it can also make circular motion within the range of the first conductive sheet. Then the first contact on the first spring of the mounting base contacts, rubs and compresses with the first conductive sheet of the temperature probe body. The friction process can remove the oxide on the first contact and the first conductive sheet of the probe, and the compression process can ensure the contact pressure between the spring contact and the conductive sheet of the probe, thereby ensuring the reliability of the electrical connection.

[0014] Compared with the prior art, the beneficial effects of the present invention are: the present invention has a simple structure, the temperature probe body and the mounting base are detachably connected, which is convenient for quick disassembly and assembly, convenient for replacing the probe, and can be electrically connected to the MCU after installation; the split design can meet the installation requirements at any position. BRIEF DESCRIPTION OF THE DRAWINGS

[0015] Figure 1 This is a schematic diagram of the cross section of the utility model Figure 1 ;

[0016] Figure 2 This is a schematic diagram of the cross section of the utility model Figure 2 ;

[0017] Figure 3 This is a stereoscopic diagram of the main body of the temperature probe of the utility model;

[0018] Reference numerals:

[0019] 1 mounting base; 101 thread; 102 seat body; 103 column body;

[0020] 2 temperature probe body; 201 temperature sensing chip; 202 temperature probe housing; 203 conductive wire; 204 perforation;

[0021] 3. Contact assembly;

[0022] 301 first contact; 3011 first seat; 3012 first contact point; 3013 first spring; 3014 first through hole; 3015 third through hole;

[0023] 302 second contact; 3021 second seat body; 3022 second contact point; 3023 second spring; 3024 second through hole; 3025 fourth through hole;

[0024] 4 conductive component; 401 first conductive sheet; 402 second conductive sheet. DETAILED DESCRIPTION

[0025] In order to enable those skilled in the art to better understand the present invention and to more clearly define the scope of protection claimed by the present invention, the present invention is described in detail below with respect to certain specific embodiments of the present invention. It should be noted that the following are only certain specific implementation methods of the present invention, which are only part of the embodiments of the present invention, and the specific and direct description of the relevant structures is only for the convenience of understanding the present invention, and the specific features do not naturally and directly limit the scope of implementation of the present invention.

[0026] Referring to the accompanying drawings, the utility model adopts the following technical scheme: a temperature probe that can be quickly disassembled and assembled, including a mounting base 1 and a temperature probe body 2, and also including an electrical connection structure, the electrical connection structure including a conductive component 4 and a contact component 3 respectively arranged on the temperature probe body 2 and the mounting base 1, the contact component 3 including a first contact 301 and a second seat 3021, the conductive component 4 including a first conductive sheet 401 and a second conductive sheet 402, the first conductive sheet 401 and the second conductive sheet 402 connecting the positive and negative poles of the temperature probe body 2, the temperature probe body 2 is connected to the mounting base 1 through a detachable structure, so that the first contact 301 contacts the first conductive sheet 401, and the second seat 3021 contacts the second conductive sheet 402 so that the temperature probe body 2 is electrically connected to the mounting base 1.

[0027] The temperature probe body 2 includes a temperature probe housing 202 and a temperature sensing chip 201 installed in the temperature probe housing 202. Two conductive wires 203 extend from the chip, respectively connecting the first conductive sheet 401 and the second conductive sheet 402, thus forming the positive and negative electrodes of the temperature probe body 2. The first conductive sheet 401 and the second conductive sheet 402 are fixed to the bottom of the temperature probe housing 202, and two through holes 204 are provided on the inner wall of the bottom to accommodate the conductive wires 203 passing through.

[0028] The second conductive sheet 402 is a closed or open annular conductive sheet, and the first conductive sheet 401 is placed in the hollow of the annular conductive sheet. In this embodiment, a closed annular structure is adopted, and in other embodiments, an open structure may be adopted. However, after the threaded connection is stable, both contacts contact their respective conductive sheets.

[0029] Since the present embodiment adopts a closed ring structure, it can be ensured that after the assembly is completed, the second base body 3021 can always be in contact with the second conductive sheet 402 in the shape of a ring.

[0030] As a preferred embodiment, the second conductive sheet 402 is an annular conductive sheet, and the first conductive sheet 401 is placed at the hollow center of the annular conductive sheet.

[0031] The first contact 301 includes a first base 3011, a first contact 3012 and a first spring 3013. The first base 3011 is provided with a first through hole 3014. The first spring 3013 is disposed between the first contact 3012 and the first base 3011 so that the first contact 3012 can pass through or retract from the first through hole 3014. A third through hole 3015 is provided at the bottom of the first base 3011. The first contact 3012 is electrically connected to a first wire that passes through the third through hole 3015.

[0032] The second base 3021 includes a second base 3021, a second contact 3022, and a second spring 3023. The second base 3021 is provided with a second through hole 3024. The second spring 3023 is disposed between the second contact 3022 and the second base 3021 so that the second contact 3022 can pass through or retract from the second through hole 3024. A fourth through hole 3025 is provided at the bottom of the second base 3021. The second contact 3022 is electrically connected to a second wire that passes through the fourth through hole 3025.

[0033] The temperature probe body 2 is connected to the mounting base 1 via a detachable structure, so that the first spring 3013 and / or the second spring 3023 are compressed to electrically connect the temperature probe body 2 and the mounting base 1 .

[0034] The first wire and the second wire are externally connected to the MCU controller of the outdoor oven to receive the information collected by the temperature probe.

[0035] The detachable structure includes threads 101 that cooperate with each other and are disposed between the mounting base 1 and the temperature probe body 2. The threads 101 of the temperature probe body 2 rotate into the mounting base 1, so that the first contact 301 rubs against the first conductive sheet 401 and / or the second base 3021 rubs against the second conductive sheet 402, thereby removing oxides on the first conductive sheet 401 and / or the second conductive sheet 402.

[0036] When the temperature probe body 2 is rotated into the mounting base 1, the second contact 3022 on the second spring 3023 of the mounting base 1 contacts, rubs, and is compressed with the metal ring of the temperature probe body 2. The friction process can remove the oxide on the second contact 3022 and the metal ring of the probe, and the compression process can ensure the contact pressure between the spring contact and the metal ring of the probe, thereby ensuring the reliability of the electrical connection.

[0037] If the first contact 301 is not circular, it can also make circular motion within the range of the first conductive sheet 401. Then the first contact 3012 on the first spring 3013 of the mounting base 1 contacts and rubs with the first conductive sheet 401 of the temperature probe body 2 and is compressed. The friction process can remove the oxide on the first contact 3012 and the first conductive sheet 401 of the probe, and the compression process can ensure the contact pressure between the spring contact and the conductive sheet of the probe, thereby ensuring the reliability of the electrical connection.

[0038] The above-mentioned detachable structure can also be, for example, fixing sliders on both sides of the stable probe body, opening an L-shaped track on the inner wall of the mounting base 1, and the slider first enters the vertical part of the L-shaped track and then enters the horizontal part to rotate to achieve detachable telescopic and rotatable connection.

[0039] The mounting base 1 may be a base body 102 and a column 103 fixed on the base body 102 . The column 103 may be made of insulating material. The thread 101 is provided on the inner wall of the body.

[0040] Compared with the prior art, the beneficial effects of the present invention are: the present invention has a simple structure, the temperature probe body 2 is detachably connected to the mounting base 1, which is convenient for quick disassembly and assembly, convenient for replacing the probe, and can be electrically connected to the MCU after installation; the split design can meet the installation requirements at any position.

[0041] The above description is not a limitation of the present invention, and the present invention is not limited to the above examples. Changes, modifications, additions or substitutions made by technicians in this technical field within the essential scope of the present invention should also fall within the protection scope of the present invention.

Claims

1. A temperature probe that can be quickly disassembled and assembled, characterized in that: The invention comprises a mounting base (1), a temperature probe body (2) and an electrical connection structure, and also comprises the electrical connection structure, wherein the electrical connection structure comprises a conductive component (4) and a contact component (3) respectively arranged on the temperature probe body (2) and the mounting base (1), wherein the contact component (3) comprises a first contact (301) and a second seat body (3021), and the conductive component (4) comprises a first conductive sheet (401) and a second conductive sheet (402), wherein the first conductive sheet (401) and the second conductive sheet (402) are connected to the positive and negative poles of the temperature probe body (2), and the temperature probe body (2) is connected to the mounting base (1) via a detachable structure, and the first contact (301) contacts the first conductive sheet (401), and the second seat body (3021) contacts the second conductive sheet (402) so that the temperature probe body (2) is electrically connected to the mounting base (1).

2. The quickly detachable temperature probe according to claim 1, characterized in that: The second conductive sheet (402) is a closed or open ring-shaped conductive sheet, and the first conductive sheet (401) is placed in a hollow portion of the ring-shaped conductive sheet.

3. The quickly detachable temperature probe according to claim 2, characterized in that: The second conductive sheet (402) is an annular conductive sheet, and the first conductive sheet (401) is disposed at the hollow center of the annular conductive sheet.

4. The quickly detachable temperature probe according to claim 1, characterized in that: The first contact (301) comprises a first base (3011), and a first contact point (3012) and a first spring (3013) arranged in the first base (3011); a first through hole (3014) is provided on the first base (3011); and the first spring (3013) is arranged between the first contact point (3012) and the first base (3011) so that the first contact point (3012) can pass through or retract from the first through hole (3014).

5. The quickly detachable temperature probe according to claim 4, characterized in that: A third through hole (3015) is provided at the bottom of the first base body (3011), and the first contact point (3012) is electrically connected to a first wire passing through the third through hole (3015).

6. The quickly detachable temperature probe according to claim 1, 4 or 5, characterized in that: The second base (3021) comprises a second base (3021), a second contact (3022) and a second spring (3023); a second through hole (3024) is provided on the second base (3021); the second spring (3023) is arranged between the second contact (3022) and the second base (3021) so that the second contact (3022) can pass through or retract from the second through hole (3024).

7. The quickly detachable temperature probe according to claim 6, characterized in that: A fourth through hole (3025) is provided at the bottom of the second base body (3021), and the second contact point (3022) is electrically connected to a second wire passing through the fourth through hole (3025).

8. The quickly detachable temperature probe according to claim 4, characterized in that: The temperature probe body (2) is connected to the mounting base (1) via a detachable structure so that the first spring (3013) and / or the second spring (3023) are compressed to electrically connect the temperature probe body (2) and the mounting base (1).

9. The quickly detachable temperature probe according to claim 7, characterized in that: The detachable structure comprises threads (101) which are arranged between the mounting base (1) and the temperature probe body (2) and cooperate with each other.

10. The quickly detachable temperature probe according to claim 9, characterized in that: The temperature probe body (2) is threaded (101) into the mounting base (1) so that the first contact (301) rubs against the first conductive sheet (401) and / or the second base (3021) rubs against the second conductive sheet (402) to remove oxides on the first conductive sheet (401) and / or the second conductive sheet (402).

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